@article{13056,
  author       = {{Huang, Zhengfeng and Liang, Huaguo and Hellebrand, Sybille}},
  journal      = {{Journal of Electronic Testing - Theory and Applications (JETTA)}},
  number       = {{4}},
  pages        = {{349--359}},
  publisher    = {{Springer}},
  title        = {{{A High Performance SEU Tolerant Latch}}},
  volume       = {{31}},
  year         = {{2015}},
}

@misc{13077,
  author       = {{Hellebrand, Sybille and Indlekofer, Thomas and Kampmann, Matthias and Kochte, Michael and Liu, Chang and Wunderlich, Hans-Joachim}},
  keywords     = {{Workshop}},
  title        = {{{Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler}}},
  year         = {{2015}},
}

@inproceedings{29465,
  abstract     = {{Transistor and interconnect wearout is accelerated with transistor scaling resulting in timing variations and consequently reliability challenges in digital circuits. Age monitoring methods can be used to predict and deal with the aging problem. Selecting appropriate locations for placement of hardware aging monitors is an important issue. In this work we propose a procedure for selection of appropriate internal nodes in combinational clouds between pipeline stages or combinational parts of a sequential circuit to place hardware monitors that can effectively provide aging information of various components of a modern digital system. In order to implement the node selection procedure, we propose an object-oriented model. Object-oriented model of a circuit along with a probabilistic and logical simulation engine that we have developed can effectively be used for implementation and also fast evaluation of the proposed node selection mechanism. The proposed object-oriented C+ + models can be integrated into a SystemC RTL model making it possible to perform mixed-level simulation, and integrated evaluation of a complete system. We have applied our proposed scheme to several processors including MIPS, ARM, ALPHA and MiniRISC and have looked at its effectiveness for these processors.}},
  author       = {{Sadeghi-Kohan, Somayeh and Kamran, Arezoo and Forooghifar, Farnaz and Navabi, Zainalabedin}},
  booktitle    = {{2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)}},
  publisher    = {{IEEE}},
  title        = {{{Aging in digital circuits and age monitoring: Object-oriented modeling and evaluation}}},
  doi          = {{10.1109/dtis.2015.7127373}},
  year         = {{2015}},
}

@inproceedings{29466,
  abstract     = {{Transistor and interconnect wearout is accelerated with transistor scaling that results in timing variations. Progressive age measurement of a circuit can help a better prevention mechanism for reducing more aging. This requires age monitors that collect progressive age information of the circuit. This paper focuses on monitor structures for implementation of progressive age detection. The monitors are self-adjusting that they adjust themselves to detect progressive changes in the timing of a circuit. Furthermore, the monitors are designed for low hardware overhead, and certainty in reported timing changes.}},
  author       = {{Sadeghi-Kohan, Somayeh and Kamal, Mehdi and McNeil, John and Prinetto, Paolo and Navabi, Zain}},
  booktitle    = {{2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)}},
  publisher    = {{IEEE}},
  title        = {{{Online self adjusting progressive age monitoring of timing variations}}},
  doi          = {{10.1109/dtis.2015.7127368}},
  year         = {{2015}},
}

@inproceedings{12977,
  author       = {{Hellebrand, Sybille and Indlekofer, Thomas and Kampmann, Matthias and A. Kochte, Michael and Liu, Chang and Wunderlich, Hans-Joachim}},
  booktitle    = {{IEEE International Test Conference (ITC'14)}},
  publisher    = {{IEEE}},
  title        = {{{FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects}}},
  doi          = {{10.1109/test.2014.7035360}},
  year         = {{2014}},
}

@article{13054,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  journal      = {{DeGruyter Journal on Information Technology (it)}},
  number       = {{4}},
  pages        = {{165--172}},
  publisher    = {{DeGruyter}},
  title        = {{{SAT-Based ATPG beyond Stuck-at Fault Testing}}},
  volume       = {{56}},
  year         = {{2014}},
}

@article{13055,
  author       = {{Rodriguez Gomez, Laura and Cook, Alejandro and Indlekofer, Thomas and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  journal      = {{Journal of Electronic Testing - Theory and Applications (JETTA)}},
  number       = {{5}},
  pages        = {{527--540}},
  publisher    = {{Springer}},
  title        = {{{Adaptive Bayesian Diagnosis of Intermittent Faults}}},
  volume       = {{30}},
  year         = {{2014}},
}

@article{46266,
  author       = {{Alizadeh, Bijan and Behnam, Payman and Sadeghi-Kohan, Somayeh}},
  issn         = {{0018-9340}},
  journal      = {{IEEE Transactions on Computers}},
  keywords     = {{Computational Theory and Mathematics, Hardware and Architecture, Theoretical Computer Science, Software}},
  pages        = {{1--1}},
  publisher    = {{Institute of Electrical and Electronics Engineers (IEEE)}},
  title        = {{{A Scalable Formal Debugging Approach with Auto-Correction Capability based on Static Slicing and Dynamic Ranking for RTL Datapath Designs}}},
  doi          = {{10.1109/tc.2014.2329687}},
  year         = {{2014}},
}

@inproceedings{46268,
  author       = {{Mohammadi, Marzieh and Sadeghi-Kohan, Somayeh and Masoumi, Nasser and Navabi, Zainalabedin}},
  booktitle    = {{2014 19th IEEE European Test Symposium (ETS)}},
  publisher    = {{IEEE}},
  title        = {{{An off-line MDSI interconnect BIST incorporated in BS 1149.1}}},
  doi          = {{10.1109/ets.2014.6847847}},
  year         = {{2014}},
}

@inproceedings{46267,
  author       = {{Sadeghi-Kohan, Somayeh and Behnam, Payman and Alizadeh, Bijan and Fujita, Masahiro and Navabi, Zainalabedin}},
  booktitle    = {{2014 19th IEEE European Test Symposium (ETS)}},
  publisher    = {{IEEE}},
  title        = {{{Improving polynomial datapath debugging with HEDs}}},
  doi          = {{10.1109/ets.2014.6847797}},
  year         = {{2014}},
}

@inproceedings{12979,
  author       = {{Hellebrand, Sybille}},
  booktitle    = {{14th IEEE Latin American Test Workshop - (LATW'13)}},
  publisher    = {{IEEE}},
  title        = {{{Analyzing and Quantifying Fault Tolerance Properties}}},
  doi          = {{10.1109/latw.2013.6562662}},
  year         = {{2013}},
}

@misc{13075,
  author       = {{Cook, Alejandro and Rodriguez Gomez, Laura and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}},
  keywords     = {{WORKSHOP}},
  title        = {{{Adaptive Test and Diagnosis of Intermittent Faults}}},
  year         = {{2013}},
}

@inproceedings{46271,
  author       = {{Sadeghi-Kohan, Somayeh and Namaki-Shoushtari, Majid and Javaheri, Fatemeh and Navabi, Zainalabedin}},
  booktitle    = {{2012 IEEE International Test Conference}},
  publisher    = {{IEEE}},
  title        = {{{BS 1149.1 extensions for an online interconnect fault detection and recovery}}},
  doi          = {{10.1109/test.2012.6401583}},
  year         = {{2013}},
}

@inproceedings{46270,
  author       = {{Sadeghi-Kohan, Somayeh and Keshavarz, Shahrzad and Zokaee, Farzaneh and Farahmandi, Farimah and Navabi, Zainalabedin}},
  booktitle    = {{East-West Design & Test Symposium (EWDTS 2013)}},
  publisher    = {{IEEE}},
  title        = {{{A new structure for interconnect offline testing}}},
  doi          = {{10.1109/ewdts.2013.6673207}},
  year         = {{2013}},
}

@inproceedings{12980,
  author       = {{Cook, Alejandro and Hellebrand, Sybille and E. Imhof, Michael and Mumtaz, Abdullah and Wunderlich, Hans-Joachim}},
  booktitle    = {{13th IEEE Latin American Test Workshop (LATW'12)}},
  pages        = {{1--4}},
  publisher    = {{IEEE}},
  title        = {{{Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test}}},
  doi          = {{10.1109/latw.2012.6261229}},
  year         = {{2012}},
}

@inproceedings{12981,
  author       = {{Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  booktitle    = {{17th IEEE European Test Symposium (ETS'12)}},
  pages        = {{1--6}},
  publisher    = {{IEEE}},
  title        = {{{Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test}}},
  doi          = {{10.1109/ets.2012.6233025}},
  year         = {{2012}},
}

@misc{13074,
  author       = {{Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  keywords     = {{WORKSHOP}},
  title        = {{{Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern}}},
  year         = {{2012}},
}

@inproceedings{12982,
  author       = {{Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}},
  booktitle    = {{20th IEEE Asian Test Symposium (ATS'11)}},
  pages        = {{285--290}},
  publisher    = {{IEEE}},
  title        = {{{Diagnostic Test of Robust Circuits}}},
  doi          = {{10.1109/ats.2011.55}},
  year         = {{2011}},
}

@inproceedings{12984,
  author       = {{Polian, Ilia and Becker, Bernd and Hellebrand, Sybille and Wunderlich, Hans-Joachim and Maxwell, Peter}},
  booktitle    = {{16th IEEE European Test Symposium Trondheim (ETS'11)}},
  publisher    = {{IEEE}},
  title        = {{{Towards Variation-Aware Test Methods}}},
  doi          = {{10.1109/ets.2011.51}},
  year         = {{2011}},
}

@inproceedings{13053,
  author       = {{Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}},
  booktitle    = {{5. GMM/GI/ITG Fachtagung "Zuverlässigkeit und Entwurf"}},
  pages        = {{48--53}},
  title        = {{{Robuster Selbsttest mit Diagnose}}},
  year         = {{2011}},
}