---
_id: '12998'
author:
- first_name: Muhammad
full_name: Ali, Muhammad
last_name: Ali
- first_name: Michael
full_name: Welzl, Michael
last_name: Welzl
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: 'Ali M, Welzl M, Hellebrand S. A Dynamic Routing Mechanism for Network on Chip.
In: 23rd IEEE NORCHIP Conference. IEEE; 2005:70-73. doi:10.1109/norchp.2005.1596991'
apa: Ali, M., Welzl, M., & Hellebrand, S. (2005). A Dynamic Routing Mechanism
for Network on Chip. 23rd IEEE NORCHIP Conference, 70–73. https://doi.org/10.1109/norchp.2005.1596991
bibtex: '@inproceedings{Ali_Welzl_Hellebrand_2005, place={Oulu, Finland}, title={A
Dynamic Routing Mechanism for Network on Chip}, DOI={10.1109/norchp.2005.1596991},
booktitle={23rd IEEE NORCHIP Conference}, publisher={IEEE}, author={Ali, Muhammad
and Welzl, Michael and Hellebrand, Sybille}, year={2005}, pages={70–73} }'
chicago: 'Ali, Muhammad, Michael Welzl, and Sybille Hellebrand. “A Dynamic Routing
Mechanism for Network on Chip.” In 23rd IEEE NORCHIP Conference, 70–73.
Oulu, Finland: IEEE, 2005. https://doi.org/10.1109/norchp.2005.1596991.'
ieee: 'M. Ali, M. Welzl, and S. Hellebrand, “A Dynamic Routing Mechanism for Network
on Chip,” in 23rd IEEE NORCHIP Conference, 2005, pp. 70–73, doi: 10.1109/norchp.2005.1596991.'
mla: Ali, Muhammad, et al. “A Dynamic Routing Mechanism for Network on Chip.” 23rd
IEEE NORCHIP Conference, IEEE, 2005, pp. 70–73, doi:10.1109/norchp.2005.1596991.
short: 'M. Ali, M. Welzl, S. Hellebrand, in: 23rd IEEE NORCHIP Conference, IEEE,
Oulu, Finland, 2005, pp. 70–73.'
date_created: 2019-08-28T10:19:55Z
date_updated: 2022-05-11T16:39:14Z
department:
- _id: '48'
doi: 10.1109/norchp.2005.1596991
language:
- iso: eng
page: 70-73
place: Oulu, Finland
publication: 23rd IEEE NORCHIP Conference
publisher: IEEE
status: public
title: A Dynamic Routing Mechanism for Network on Chip
type: conference
user_id: '209'
year: '2005'
...
---
_id: '13071'
author:
- first_name: Michelle
full_name: Liu Jing, Michelle
last_name: Liu Jing
- first_name: Stefan
full_name: Ruehrup, Stefan
last_name: Ruehrup
- first_name: Christian
full_name: Schindelhauer, Christian
last_name: Schindelhauer
- first_name: Klaus
full_name: Volbert, Klaus
last_name: Volbert
- first_name: Martin
full_name: Dierkes, Martin
last_name: Dierkes
- first_name: Andreas
full_name: Bellgardt, Andreas
last_name: Bellgardt
- first_name: Rüdiger
full_name: Ibers, Rüdiger
id: '659'
last_name: Ibers
- first_name: Ulrich
full_name: Hilleringmann, Ulrich
last_name: Hilleringmann
citation:
ama: 'Liu Jing M, Ruehrup S, Schindelhauer C, et al. Sensor Networks with More Features
Using Less Hardware. In: {GOR/NGB Conference Tilburg 2004}. Tilburg, Netherlands;
2004.'
apa: Liu Jing, M., Ruehrup, S., Schindelhauer, C., Volbert, K., Dierkes, M., Bellgardt,
A., … Hilleringmann, U. (2004). Sensor Networks with More Features Using Less
Hardware. In {GOR/NGB Conference Tilburg 2004}. Tilburg, Netherlands.
bibtex: '@inproceedings{Liu Jing_Ruehrup_Schindelhauer_Volbert_Dierkes_Bellgardt_Ibers_Hilleringmann_2004,
place={Tilburg, Netherlands}, title={Sensor Networks with More Features Using
Less Hardware}, booktitle={{GOR/NGB Conference Tilburg 2004}}, author={Liu Jing,
Michelle and Ruehrup, Stefan and Schindelhauer, Christian and Volbert, Klaus and
Dierkes, Martin and Bellgardt, Andreas and Ibers, Rüdiger and Hilleringmann, Ulrich},
year={2004} }'
chicago: Liu Jing, Michelle, Stefan Ruehrup, Christian Schindelhauer, Klaus Volbert,
Martin Dierkes, Andreas Bellgardt, Rüdiger Ibers, and Ulrich Hilleringmann. “Sensor
Networks with More Features Using Less Hardware.” In {GOR/NGB Conference Tilburg
2004}. Tilburg, Netherlands, 2004.
ieee: M. Liu Jing et al., “Sensor Networks with More Features Using Less
Hardware,” in {GOR/NGB Conference Tilburg 2004}, 2004.
mla: Liu Jing, Michelle, et al. “Sensor Networks with More Features Using Less Hardware.”
{GOR/NGB Conference Tilburg 2004}, 2004.
short: 'M. Liu Jing, S. Ruehrup, C. Schindelhauer, K. Volbert, M. Dierkes, A. Bellgardt,
R. Ibers, U. Hilleringmann, in: {GOR/NGB Conference Tilburg 2004}, Tilburg, Netherlands,
2004.'
date_created: 2019-08-28T11:58:24Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
- _id: '63'
language:
- iso: eng
place: Tilburg, Netherlands
publication: '{GOR/NGB Conference Tilburg 2004}'
status: public
title: Sensor Networks with More Features Using Less Hardware
type: conference
user_id: '14955'
year: '2004'
...
---
_id: '13099'
author:
- first_name: Ruth
full_name: Breu, Ruth
last_name: Breu
- first_name: Thomas
full_name: Fahringer, Thomas
last_name: Fahringer
- first_name: Dieter
full_name: Fensel, Dieter
last_name: Fensel
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Aart
full_name: Middeldorp, Aart
last_name: Middeldorp
- first_name: Otmar
full_name: Scherzer, Otmar
last_name: Scherzer
citation:
ama: Breu R, Fahringer T, Fensel D, Hellebrand S, Middeldorp A, Scherzer O. Im
Westen Viel Neues - Informatik an Der Universität Innsbruck. OCG Journal,
pp. 28-29; 2004.
apa: Breu, R., Fahringer, T., Fensel, D., Hellebrand, S., Middeldorp, A., &
Scherzer, O. (2004). Im Westen viel Neues - Informatik an der Universität Innsbruck.
OCG Journal, pp. 28-29.
bibtex: '@book{Breu_Fahringer_Fensel_Hellebrand_Middeldorp_Scherzer_2004, place={OCG
Journal, pp. 28-29}, title={Im Westen viel Neues - Informatik an der Universität
Innsbruck}, author={Breu, Ruth and Fahringer, Thomas and Fensel, Dieter and Hellebrand,
Sybille and Middeldorp, Aart and Scherzer, Otmar}, year={2004} }'
chicago: Breu, Ruth, Thomas Fahringer, Dieter Fensel, Sybille Hellebrand, Aart Middeldorp,
and Otmar Scherzer. Im Westen Viel Neues - Informatik an Der Universität Innsbruck.
OCG Journal, pp. 28-29, 2004.
ieee: R. Breu, T. Fahringer, D. Fensel, S. Hellebrand, A. Middeldorp, and O. Scherzer,
Im Westen viel Neues - Informatik an der Universität Innsbruck. OCG Journal,
pp. 28-29, 2004.
mla: Breu, Ruth, et al. Im Westen Viel Neues - Informatik an Der Universität
Innsbruck. 2004.
short: R. Breu, T. Fahringer, D. Fensel, S. Hellebrand, A. Middeldorp, O. Scherzer,
Im Westen Viel Neues - Informatik an Der Universität Innsbruck, OCG Journal, pp.
28-29, 2004.
date_created: 2019-08-28T12:20:52Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
language:
- iso: eng
place: OCG Journal, pp. 28-29
status: public
title: Im Westen viel Neues - Informatik an der Universität Innsbruck
type: misc
user_id: '659'
year: '2004'
...
---
_id: '13100'
author:
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Armin
full_name: Wuertenberger, Armin
last_name: Wuertenberger
- first_name: Christofer
full_name: S. Tautermann, Christofer
last_name: S. Tautermann
citation:
ama: Hellebrand S, Wuertenberger A, S. Tautermann C. Data Compression for Multiple
Scan Chains Using Dictionaries with Corrections. 9th IEEE European Test Symposium,
Ajaccio, Corsica, France; 2004.
apa: Hellebrand, S., Wuertenberger, A., & S. Tautermann, C. (2004). Data
Compression for Multiple Scan Chains Using Dictionaries with Corrections.
9th IEEE European Test Symposium, Ajaccio, Corsica, France.
bibtex: '@book{Hellebrand_Wuertenberger_S. Tautermann_2004, place={9th IEEE European
Test Symposium, Ajaccio, Corsica, France}, title={Data Compression for Multiple
Scan Chains Using Dictionaries with Corrections}, author={Hellebrand, Sybille
and Wuertenberger, Armin and S. Tautermann, Christofer}, year={2004} }'
chicago: Hellebrand, Sybille, Armin Wuertenberger, and Christofer S. Tautermann.
Data Compression for Multiple Scan Chains Using Dictionaries with Corrections.
9th IEEE European Test Symposium, Ajaccio, Corsica, France, 2004.
ieee: S. Hellebrand, A. Wuertenberger, and C. S. Tautermann, Data Compression
for Multiple Scan Chains Using Dictionaries with Corrections. 9th IEEE European
Test Symposium, Ajaccio, Corsica, France, 2004.
mla: Hellebrand, Sybille, et al. Data Compression for Multiple Scan Chains Using
Dictionaries with Corrections. 2004.
short: S. Hellebrand, A. Wuertenberger, C. S. Tautermann, Data Compression for Multiple
Scan Chains Using Dictionaries with Corrections, 9th IEEE European Test Symposium,
Ajaccio, Corsica, France, 2004.
date_created: 2019-08-28T12:21:58Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: 9th IEEE European Test Symposium, Ajaccio, Corsica, France
status: public
title: Data Compression for Multiple Scan Chains Using Dictionaries with Corrections
type: misc
user_id: '659'
year: '2004'
...
---
_id: '13001'
author:
- first_name: Armin
full_name: Wuertenberger, Armin
last_name: Wuertenberger
- first_name: Christofer
full_name: S. Tautermann, Christofer
last_name: S. Tautermann
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: 'Wuertenberger A, S. Tautermann C, Hellebrand S. Data Compression for Multiple
Scan Chains Using Dictionaries with Corrections. In: IEEE International Test
Conference (ITC’04). IEEE; 2004:926-935. doi:10.1109/test.2004.1387357'
apa: Wuertenberger, A., S. Tautermann, C., & Hellebrand, S. (2004). Data Compression
for Multiple Scan Chains Using Dictionaries with Corrections. IEEE International
Test Conference (ITC’04), 926–935. https://doi.org/10.1109/test.2004.1387357
bibtex: '@inproceedings{Wuertenberger_S. Tautermann_Hellebrand_2004, place={Charlotte,
NC, USA}, title={Data Compression for Multiple Scan Chains Using Dictionaries
with Corrections}, DOI={10.1109/test.2004.1387357},
booktitle={IEEE International Test Conference (ITC’04)}, publisher={IEEE}, author={Wuertenberger,
Armin and S. Tautermann, Christofer and Hellebrand, Sybille}, year={2004}, pages={926–935}
}'
chicago: 'Wuertenberger, Armin, Christofer S. Tautermann, and Sybille Hellebrand.
“Data Compression for Multiple Scan Chains Using Dictionaries with Corrections.”
In IEEE International Test Conference (ITC’04), 926–35. Charlotte, NC,
USA: IEEE, 2004. https://doi.org/10.1109/test.2004.1387357.'
ieee: 'A. Wuertenberger, C. S. Tautermann, and S. Hellebrand, “Data Compression
for Multiple Scan Chains Using Dictionaries with Corrections,” in IEEE International
Test Conference (ITC’04), 2004, pp. 926–935, doi: 10.1109/test.2004.1387357.'
mla: Wuertenberger, Armin, et al. “Data Compression for Multiple Scan Chains Using
Dictionaries with Corrections.” IEEE International Test Conference (ITC’04),
IEEE, 2004, pp. 926–35, doi:10.1109/test.2004.1387357.
short: 'A. Wuertenberger, C. S. Tautermann, S. Hellebrand, in: IEEE International
Test Conference (ITC’04), IEEE, Charlotte, NC, USA, 2004, pp. 926–935.'
date_created: 2019-08-28T10:20:57Z
date_updated: 2022-05-11T16:41:16Z
department:
- _id: '48'
doi: 10.1109/test.2004.1387357
extern: '1'
language:
- iso: eng
page: 926-935
place: Charlotte, NC, USA
publication: IEEE International Test Conference (ITC'04)
publisher: IEEE
status: public
title: Data Compression for Multiple Scan Chains Using Dictionaries with Corrections
type: conference
user_id: '209'
year: '2004'
...
---
_id: '13098'
author:
- first_name: Ruth
full_name: Breu, Ruth
last_name: Breu
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Michael
full_name: Welzl, Michael
last_name: Welzl
citation:
ama: Breu R, Hellebrand S, Welzl M. Experiences from Teaching Software Development
in a Java Environment. Handouts ACS/IEEE Workshop on Practice and Experience
with Java in Education, Tunis, Tunisia; 2003.
apa: Breu, R., Hellebrand, S., & Welzl, M. (2003). Experiences from Teaching
Software Development in a Java Environment. Handouts ACS/IEEE Workshop on
Practice and Experience with Java in Education, Tunis, Tunisia.
bibtex: '@book{Breu_Hellebrand_Welzl_2003, place={Handouts ACS/IEEE Workshop on
Practice and Experience with Java in Education, Tunis, Tunisia}, title={Experiences
from Teaching Software Development in a Java Environment}, author={Breu, Ruth
and Hellebrand, Sybille and Welzl, Michael}, year={2003} }'
chicago: Breu, Ruth, Sybille Hellebrand, and Michael Welzl. Experiences from
Teaching Software Development in a Java Environment. Handouts ACS/IEEE Workshop
on Practice and Experience with Java in Education, Tunis, Tunisia, 2003.
ieee: R. Breu, S. Hellebrand, and M. Welzl, Experiences from Teaching Software
Development in a Java Environment. Handouts ACS/IEEE Workshop on Practice
and Experience with Java in Education, Tunis, Tunisia, 2003.
mla: Breu, Ruth, et al. Experiences from Teaching Software Development in a Java
Environment. 2003.
short: R. Breu, S. Hellebrand, M. Welzl, Experiences from Teaching Software Development
in a Java Environment, Handouts ACS/IEEE Workshop on Practice and Experience with
Java in Education, Tunis, Tunisia, 2003.
date_created: 2019-08-28T12:20:20Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
language:
- iso: eng
place: Handouts ACS/IEEE Workshop on Practice and Experience with Java in Education,
Tunis, Tunisia
status: public
title: Experiences from Teaching Software Development in a Java Environment
type: misc
user_id: '659'
year: '2003'
...
---
_id: '13002'
author:
- first_name: Armin
full_name: Wuertenberger, Armin
last_name: Wuertenberger
- first_name: Christofer
full_name: S. Tautermann, Christofer
last_name: S. Tautermann
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: 'Wuertenberger A, S. Tautermann C, Hellebrand S. A Hybrid Coding Strategy for
Optimized Test Data Compression. In: IEEE International Test Conference (ITC’03).
IEEE; 2003:451-459. doi:10.1109/test.2003.1270870'
apa: Wuertenberger, A., S. Tautermann, C., & Hellebrand, S. (2003). A Hybrid
Coding Strategy for Optimized Test Data Compression. IEEE International Test
Conference (ITC’03), 451–459. https://doi.org/10.1109/test.2003.1270870
bibtex: '@inproceedings{Wuertenberger_S. Tautermann_Hellebrand_2003, place={Charlotte,
NC, USA}, title={A Hybrid Coding Strategy for Optimized Test Data Compression},
DOI={10.1109/test.2003.1270870},
booktitle={IEEE International Test Conference (ITC’03)}, publisher={IEEE}, author={Wuertenberger,
Armin and S. Tautermann, Christofer and Hellebrand, Sybille}, year={2003}, pages={451–459}
}'
chicago: 'Wuertenberger, Armin, Christofer S. Tautermann, and Sybille Hellebrand.
“A Hybrid Coding Strategy for Optimized Test Data Compression.” In IEEE International
Test Conference (ITC’03), 451–59. Charlotte, NC, USA: IEEE, 2003. https://doi.org/10.1109/test.2003.1270870.'
ieee: 'A. Wuertenberger, C. S. Tautermann, and S. Hellebrand, “A Hybrid Coding Strategy
for Optimized Test Data Compression,” in IEEE International Test Conference
(ITC’03), 2003, pp. 451–459, doi: 10.1109/test.2003.1270870.'
mla: Wuertenberger, Armin, et al. “A Hybrid Coding Strategy for Optimized Test Data
Compression.” IEEE International Test Conference (ITC’03), IEEE, 2003,
pp. 451–59, doi:10.1109/test.2003.1270870.
short: 'A. Wuertenberger, C. S. Tautermann, S. Hellebrand, in: IEEE International
Test Conference (ITC’03), IEEE, Charlotte, NC, USA, 2003, pp. 451–459.'
date_created: 2019-08-28T10:23:18Z
date_updated: 2022-05-11T16:41:56Z
department:
- _id: '48'
doi: 10.1109/test.2003.1270870
extern: '1'
language:
- iso: eng
page: 451-459
place: Charlotte, NC, USA
publication: IEEE International Test Conference (ITC'03)
publisher: IEEE
status: public
title: A Hybrid Coding Strategy for Optimized Test Data Compression
type: conference
user_id: '209'
year: '2003'
...
---
_id: '13097'
author:
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Armin
full_name: Wuertenberger, Armin
last_name: Wuertenberger
citation:
ama: 'Hellebrand S, Wuertenberger A. Alternating Run-Length Coding: A Technique
for Improved Test Data Compression. IEEE International Workshop on Test Resource
Partitioning, Baltimore, MD, USA; 2002.'
apa: 'Hellebrand, S., & Wuertenberger, A. (2002). Alternating Run-Length
Coding: A Technique for Improved Test Data Compression. IEEE International
Workshop on Test Resource Partitioning, Baltimore, MD, USA.'
bibtex: '@book{Hellebrand_Wuertenberger_2002, place={IEEE International Workshop
on Test Resource Partitioning, Baltimore, MD, USA}, title={Alternating Run-Length
Coding: A Technique for Improved Test Data Compression}, author={Hellebrand, Sybille
and Wuertenberger, Armin}, year={2002} }'
chicago: 'Hellebrand, Sybille, and Armin Wuertenberger. Alternating Run-Length
Coding: A Technique for Improved Test Data Compression. IEEE International
Workshop on Test Resource Partitioning, Baltimore, MD, USA, 2002.'
ieee: 'S. Hellebrand and A. Wuertenberger, Alternating Run-Length Coding: A Technique
for Improved Test Data Compression. IEEE International Workshop on Test Resource
Partitioning, Baltimore, MD, USA, 2002.'
mla: 'Hellebrand, Sybille, and Armin Wuertenberger. Alternating Run-Length Coding:
A Technique for Improved Test Data Compression. 2002.'
short: 'S. Hellebrand, A. Wuertenberger, Alternating Run-Length Coding: A Technique
for Improved Test Data Compression, IEEE International Workshop on Test Resource
Partitioning, Baltimore, MD, USA, 2002.'
date_created: 2019-08-28T12:19:54Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: IEEE International Workshop on Test Resource Partitioning, Baltimore, MD, USA
status: public
title: 'Alternating Run-Length Coding: A Technique for Improved Test Data Compression'
type: misc
user_id: '659'
year: '2002'
...
---
_id: '13003'
author:
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
- first_name: Alexander
full_name: A. Ivaniuk, Alexander
last_name: A. Ivaniuk
- first_name: Yuri
full_name: V. Klimets, Yuri
last_name: V. Klimets
- first_name: Vyacheslav
full_name: N. Yarmolik, Vyacheslav
last_name: N. Yarmolik
citation:
ama: Hellebrand S, Wunderlich H-J, A. Ivaniuk A, V. Klimets Y, N. Yarmolik V. Efficient
Online and Offline Testing of Embedded DRAMs. IEEE Transactions on Computers.
2002;51(7):801-809. doi:10.1109/tc.2002.1017700
apa: Hellebrand, S., Wunderlich, H.-J., A. Ivaniuk, A., V. Klimets, Y., & N.
Yarmolik, V. (2002). Efficient Online and Offline Testing of Embedded DRAMs. IEEE
Transactions on Computers, 51(7), 801–809. https://doi.org/10.1109/tc.2002.1017700
bibtex: '@article{Hellebrand_Wunderlich_A. Ivaniuk_V. Klimets_N. Yarmolik_2002,
title={Efficient Online and Offline Testing of Embedded DRAMs}, volume={51}, DOI={10.1109/tc.2002.1017700}, number={7},
journal={IEEE Transactions on Computers}, publisher={IEEE}, author={Hellebrand,
Sybille and Wunderlich, Hans-Joachim and A. Ivaniuk, Alexander and V. Klimets,
Yuri and N. Yarmolik, Vyacheslav}, year={2002}, pages={801–809} }'
chicago: 'Hellebrand, Sybille, Hans-Joachim Wunderlich, Alexander A. Ivaniuk, Yuri
V. Klimets, and Vyacheslav N. Yarmolik. “Efficient Online and Offline Testing
of Embedded DRAMs.” IEEE Transactions on Computers 51, no. 7 (2002): 801–9.
https://doi.org/10.1109/tc.2002.1017700.'
ieee: 'S. Hellebrand, H.-J. Wunderlich, A. A. Ivaniuk, Y. V. Klimets, and V. N.
Yarmolik, “Efficient Online and Offline Testing of Embedded DRAMs,” IEEE Transactions
on Computers, vol. 51, no. 7, pp. 801–809, 2002, doi: 10.1109/tc.2002.1017700.'
mla: Hellebrand, Sybille, et al. “Efficient Online and Offline Testing of Embedded
DRAMs.” IEEE Transactions on Computers, vol. 51, no. 7, IEEE, 2002, pp.
801–09, doi:10.1109/tc.2002.1017700.
short: S. Hellebrand, H.-J. Wunderlich, A. A. Ivaniuk, Y. V. Klimets, V. N. Yarmolik,
IEEE Transactions on Computers 51 (2002) 801–809.
date_created: 2019-08-28T10:23:19Z
date_updated: 2022-05-11T16:42:52Z
department:
- _id: '48'
doi: 10.1109/tc.2002.1017700
extern: '1'
intvolume: ' 51'
issue: '7'
language:
- iso: eng
page: 801-809
publication: IEEE Transactions on Computers
publisher: IEEE
status: public
title: Efficient Online and Offline Testing of Embedded DRAMs
type: journal_article
user_id: '209'
volume: 51
year: '2002'
...
---
_id: '13069'
author:
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hua-Guo
full_name: Liang, Hua-Guo
last_name: Liang
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: Hellebrand S, Liang H-G, Wunderlich H-J. Two-Dimensional Test Data Compression
for Scan-Based Deterministic BIST. Journal of Electronic Testing - Theory and
Applications (JETTA). 2002;18(2):157-168.
apa: Hellebrand, S., Liang, H.-G., & Wunderlich, H.-J. (2002). Two-Dimensional
Test Data Compression for Scan-Based Deterministic BIST. Journal of Electronic
Testing - Theory and Applications (JETTA), 18(2), 157–168.
bibtex: '@article{Hellebrand_Liang_Wunderlich_2002, title={Two-Dimensional Test
Data Compression for Scan-Based Deterministic BIST}, volume={18}, number={2},
journal={Journal of Electronic Testing - Theory and Applications (JETTA)}, author={Hellebrand,
Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim}, year={2002}, pages={157–168}
}'
chicago: 'Hellebrand, Sybille, Hua-Guo Liang, and Hans-Joachim Wunderlich. “Two-Dimensional
Test Data Compression for Scan-Based Deterministic BIST.” Journal of Electronic
Testing - Theory and Applications (JETTA) 18, no. 2 (2002): 157–68.'
ieee: S. Hellebrand, H.-G. Liang, and H.-J. Wunderlich, “Two-Dimensional Test Data
Compression for Scan-Based Deterministic BIST,” Journal of Electronic Testing
- Theory and Applications (JETTA), vol. 18, no. 2, pp. 157–168, 2002.
mla: Hellebrand, Sybille, et al. “Two-Dimensional Test Data Compression for Scan-Based
Deterministic BIST.” Journal of Electronic Testing - Theory and Applications
(JETTA), vol. 18, no. 2, 2002, pp. 157–68.
short: S. Hellebrand, H.-G. Liang, H.-J. Wunderlich, Journal of Electronic Testing
- Theory and Applications (JETTA) 18 (2002) 157–168.
date_created: 2019-08-28T11:57:39Z
date_updated: 2022-05-11T16:43:32Z
department:
- _id: '48'
extern: '1'
intvolume: ' 18'
issue: '2'
language:
- iso: eng
page: 157-168
publication: Journal of Electronic Testing - Theory and Applications (JETTA)
status: public
title: Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST
type: journal_article
user_id: '209'
volume: 18
year: '2002'
...
---
_id: '13070'
author:
- first_name: Huaguo
full_name: Liang, Huaguo
last_name: Liang
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: Liang H, Hellebrand S, Wunderlich H-J. A Mixed-Mode BIST Scheme Based on Folding
Compression. Journal on Computer Science and Technology. 2002;17(2):203-212.
apa: Liang, H., Hellebrand, S., & Wunderlich, H.-J. (2002). A Mixed-Mode BIST
Scheme Based on Folding Compression. Journal on Computer Science and Technology,
17(2), 203–212.
bibtex: '@article{Liang_Hellebrand_Wunderlich_2002, title={A Mixed-Mode BIST Scheme
Based on Folding Compression}, volume={17}, number={2}, journal={Journal on Computer
Science and Technology}, author={Liang, Huaguo and Hellebrand, Sybille and Wunderlich,
Hans-Joachim}, year={2002}, pages={203–212} }'
chicago: 'Liang, Huaguo, Sybille Hellebrand, and Hans-Joachim Wunderlich. “A Mixed-Mode
BIST Scheme Based on Folding Compression.” Journal on Computer Science and
Technology 17, no. 2 (2002): 203–12.'
ieee: H. Liang, S. Hellebrand, and H.-J. Wunderlich, “A Mixed-Mode BIST Scheme Based
on Folding Compression,” Journal on Computer Science and Technology, vol.
17, no. 2, pp. 203–212, 2002.
mla: Liang, Huaguo, et al. “A Mixed-Mode BIST Scheme Based on Folding Compression.”
Journal on Computer Science and Technology, vol. 17, no. 2, 2002, pp. 203–12.
short: H. Liang, S. Hellebrand, H.-J. Wunderlich, Journal on Computer Science and
Technology 17 (2002) 203–212.
date_created: 2019-08-28T11:57:41Z
date_updated: 2022-05-11T16:45:18Z
department:
- _id: '48'
extern: '1'
intvolume: ' 17'
issue: '2'
language:
- iso: eng
page: 203-212
publication: Journal on Computer Science and Technology
status: public
title: A Mixed-Mode BIST Scheme Based on Folding Compression
type: journal_article
user_id: '209'
volume: 17
year: '2002'
...
---
_id: '13096'
author:
- first_name: Hua-Guo
full_name: Liang, Hua-Guo
last_name: Liang
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: Liang H-G, Hellebrand S, Wunderlich H-J. Two-Dimensional Test Data Compression
for Scan-Based Deterministic BIST. IEEE European Test Workshop, Stockholm,
Sweden; 2001.
apa: Liang, H.-G., Hellebrand, S., & Wunderlich, H.-J. (2001). Two-Dimensional
Test Data Compression for Scan-Based Deterministic BIST. IEEE European Test
Workshop, Stockholm, Sweden.
bibtex: '@book{Liang_Hellebrand_Wunderlich_2001, place={IEEE European Test Workshop,
Stockholm, Sweden}, title={Two-Dimensional Test Data Compression for Scan-Based
Deterministic BIST}, author={Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich,
Hans-Joachim}, year={2001} }'
chicago: Liang, Hua-Guo, Sybille Hellebrand, and Hans-Joachim Wunderlich. Two-Dimensional
Test Data Compression for Scan-Based Deterministic BIST. IEEE European Test
Workshop, Stockholm, Sweden, 2001.
ieee: H.-G. Liang, S. Hellebrand, and H.-J. Wunderlich, Two-Dimensional Test
Data Compression for Scan-Based Deterministic BIST. IEEE European Test Workshop,
Stockholm, Sweden, 2001.
mla: Liang, Hua-Guo, et al. Two-Dimensional Test Data Compression for Scan-Based
Deterministic BIST. 2001.
short: H.-G. Liang, S. Hellebrand, H.-J. Wunderlich, Two-Dimensional Test Data Compression
for Scan-Based Deterministic BIST, IEEE European Test Workshop, Stockholm, Sweden,
2001.
date_created: 2019-08-28T12:19:25Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: IEEE European Test Workshop, Stockholm, Sweden
status: public
title: Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST
type: misc
user_id: '659'
year: '2001'
...
---
_id: '13004'
author:
- first_name: Hua-Guo
full_name: Liang, Hua-Guo
last_name: Liang
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: 'Liang H-G, Hellebrand S, Wunderlich H-J. Two-Dimensional Test Data Compression
for Scan-Based Deterministic BIST. In: IEEE International Test Conference (ITC’01).
IEEE; 2001:894-902. doi:10.1109/test.2001.966712'
apa: Liang, H.-G., Hellebrand, S., & Wunderlich, H.-J. (2001). Two-Dimensional
Test Data Compression for Scan-Based Deterministic BIST. IEEE International
Test Conference (ITC’01), 894–902. https://doi.org/10.1109/test.2001.966712
bibtex: '@inproceedings{Liang_Hellebrand_Wunderlich_2001, place={Baltimore, MD,
USA}, title={Two-Dimensional Test Data Compression for Scan-Based Deterministic
BIST}, DOI={10.1109/test.2001.966712},
booktitle={IEEE International Test Conference (ITC’01)}, publisher={IEEE}, author={Liang,
Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2001}, pages={894–902}
}'
chicago: 'Liang, Hua-Guo, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Two-Dimensional
Test Data Compression for Scan-Based Deterministic BIST.” In IEEE International
Test Conference (ITC’01), 894–902. Baltimore, MD, USA: IEEE, 2001. https://doi.org/10.1109/test.2001.966712.'
ieee: 'H.-G. Liang, S. Hellebrand, and H.-J. Wunderlich, “Two-Dimensional Test Data
Compression for Scan-Based Deterministic BIST,” in IEEE International Test
Conference (ITC’01), 2001, pp. 894–902, doi: 10.1109/test.2001.966712.'
mla: Liang, Hua-Guo, et al. “Two-Dimensional Test Data Compression for Scan-Based
Deterministic BIST.” IEEE International Test Conference (ITC’01), IEEE,
2001, pp. 894–902, doi:10.1109/test.2001.966712.
short: 'H.-G. Liang, S. Hellebrand, H.-J. Wunderlich, in: IEEE International Test
Conference (ITC’01), IEEE, Baltimore, MD, USA, 2001, pp. 894–902.'
date_created: 2019-08-28T10:23:20Z
date_updated: 2022-05-11T16:44:35Z
department:
- _id: '48'
doi: 10.1109/test.2001.966712
extern: '1'
language:
- iso: eng
page: 894-902
place: Baltimore, MD, USA
publication: IEEE International Test Conference (ITC'01)
publisher: IEEE
status: public
title: Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST
type: conference
user_id: '209'
year: '2001'
...
---
_id: '13047'
author:
- first_name: Hua-Guo
full_name: Liang, Hua-Guo
last_name: Liang
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: Liang H-G, Hellebrand S, Wunderlich H-J. Deterministic BIST Scheme Based on
Reseeding of Folding Counters. Journal of Computer Research and Development,
(Jisuanji Yanjiu yu Fazhan). 2001;38(8):931.
apa: Liang, H.-G., Hellebrand, S., & Wunderlich, H.-J. (2001). Deterministic
BIST Scheme Based on Reseeding of Folding Counters. Journal of Computer Research
and Development, (Jisuanji Yanjiu Yu Fazhan), 38(8), 931.
bibtex: '@article{Liang_Hellebrand_Wunderlich_2001, title={Deterministic BIST Scheme
Based on Reseeding of Folding Counters}, volume={38}, number={8}, journal={Journal
of Computer Research and Development, (Jisuanji Yanjiu yu Fazhan)}, author={Liang,
Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2001}, pages={931}
}'
chicago: 'Liang, Hua-Guo, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Deterministic
BIST Scheme Based on Reseeding of Folding Counters.” Journal of Computer Research
and Development, (Jisuanji Yanjiu Yu Fazhan) 38, no. 8 (2001): 931.'
ieee: H.-G. Liang, S. Hellebrand, and H.-J. Wunderlich, “Deterministic BIST Scheme
Based on Reseeding of Folding Counters,” Journal of Computer Research and Development,
(Jisuanji Yanjiu yu Fazhan), vol. 38, no. 8, p. 931, 2001.
mla: Liang, Hua-Guo, et al. “Deterministic BIST Scheme Based on Reseeding of Folding
Counters.” Journal of Computer Research and Development, (Jisuanji Yanjiu Yu
Fazhan), vol. 38, no. 8, 2001, p. 931.
short: H.-G. Liang, S. Hellebrand, H.-J. Wunderlich, Journal of Computer Research
and Development, (Jisuanji Yanjiu Yu Fazhan) 38 (2001) 931.
date_created: 2019-08-28T11:44:01Z
date_updated: 2022-05-11T16:46:02Z
department:
- _id: '48'
extern: '1'
intvolume: ' 38'
issue: '8'
language:
- iso: eng
page: '931'
publication: Journal of Computer Research and Development, (Jisuanji Yanjiu yu Fazhan)
status: public
title: Deterministic BIST Scheme Based on Reseeding of Folding Counters
type: journal_article
user_id: '209'
volume: 38
year: '2001'
...
---
_id: '13068'
author:
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hua-Guo
full_name: Liang, Hua-Guo
last_name: Liang
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: Hellebrand S, Liang H-G, Wunderlich H-J. A Mixed Mode BIST Scheme Based on
Reseeding of Folding Counters. Journal of Electronic Testing - Theory and Applications
(JETTA). 2001;17(3/4):341-349.
apa: Hellebrand, S., Liang, H.-G., & Wunderlich, H.-J. (2001). A Mixed Mode
BIST Scheme Based on Reseeding of Folding Counters. Journal of Electronic Testing
- Theory and Applications (JETTA), 17(3/4), 341–349.
bibtex: '@article{Hellebrand_Liang_Wunderlich_2001, title={A Mixed Mode BIST Scheme
Based on Reseeding of Folding Counters}, volume={17}, number={3/4}, journal={Journal
of Electronic Testing - Theory and Applications (JETTA)}, author={Hellebrand,
Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim}, year={2001}, pages={341–349}
}'
chicago: 'Hellebrand, Sybille, Hua-Guo Liang, and Hans-Joachim Wunderlich. “A Mixed
Mode BIST Scheme Based on Reseeding of Folding Counters.” Journal of Electronic
Testing - Theory and Applications (JETTA) 17, no. 3/4 (2001): 341–49.'
ieee: S. Hellebrand, H.-G. Liang, and H.-J. Wunderlich, “A Mixed Mode BIST Scheme
Based on Reseeding of Folding Counters,” Journal of Electronic Testing - Theory
and Applications (JETTA), vol. 17, no. 3/4, pp. 341–349, 2001.
mla: Hellebrand, Sybille, et al. “A Mixed Mode BIST Scheme Based on Reseeding of
Folding Counters.” Journal of Electronic Testing - Theory and Applications
(JETTA), vol. 17, no. 3/4, 2001, pp. 341–49.
short: S. Hellebrand, H.-G. Liang, H.-J. Wunderlich, Journal of Electronic Testing
- Theory and Applications (JETTA) 17 (2001) 341–349.
date_created: 2019-08-28T11:57:18Z
date_updated: 2022-05-11T16:46:43Z
department:
- _id: '48'
extern: '1'
intvolume: ' 17'
issue: 3/4
language:
- iso: eng
page: 341-349
publication: Journal of Electronic Testing - Theory and Applications (JETTA)
status: public
title: A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters
type: journal_article
user_id: '209'
volume: 17
year: '2001'
...
---
_id: '13094'
author:
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: Hellebrand S, Wunderlich H-J. Hardwarepraktikum Im Diplomstudiengang Informatik.
Handbuch Lehre, Berlin, Raabe Verlag; 2000.
apa: Hellebrand, S., & Wunderlich, H.-J. (2000). Hardwarepraktikum im Diplomstudiengang
Informatik. Handbuch Lehre, Berlin, Raabe Verlag.
bibtex: '@book{Hellebrand_Wunderlich_2000, place={Handbuch Lehre, Berlin, Raabe
Verlag}, title={Hardwarepraktikum im Diplomstudiengang Informatik}, author={Hellebrand,
Sybille and Wunderlich, Hans-Joachim}, year={2000} }'
chicago: Hellebrand, Sybille, and Hans-Joachim Wunderlich. Hardwarepraktikum
Im Diplomstudiengang Informatik. Handbuch Lehre, Berlin, Raabe Verlag, 2000.
ieee: S. Hellebrand and H.-J. Wunderlich, Hardwarepraktikum im Diplomstudiengang
Informatik. Handbuch Lehre, Berlin, Raabe Verlag, 2000.
mla: Hellebrand, Sybille, and Hans-Joachim Wunderlich. Hardwarepraktikum Im Diplomstudiengang
Informatik. 2000.
short: S. Hellebrand, H.-J. Wunderlich, Hardwarepraktikum Im Diplomstudiengang Informatik,
Handbuch Lehre, Berlin, Raabe Verlag, 2000.
date_created: 2019-08-28T12:17:39Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
language:
- iso: eng
place: Handbuch Lehre, Berlin, Raabe Verlag
status: public
title: Hardwarepraktikum im Diplomstudiengang Informatik
type: misc
user_id: '659'
year: '2000'
...
---
_id: '13095'
author:
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hua-Guo
full_name: Liang, Hua-Guo
last_name: Liang
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: Hellebrand S, Liang H-G, Wunderlich H-J. A Mixed Mode BIST Scheme Based
on Reseeding of Folding Counters. IEEE European Test Workshop, Cascais, Portugal;
2000.
apa: Hellebrand, S., Liang, H.-G., & Wunderlich, H.-J. (2000). A Mixed Mode
BIST Scheme Based on Reseeding of Folding Counters. IEEE European Test Workshop,
Cascais, Portugal.
bibtex: '@book{Hellebrand_Liang_Wunderlich_2000, place={IEEE European Test Workshop,
Cascais, Portugal}, title={A Mixed Mode BIST Scheme Based on Reseeding of Folding
Counters}, author={Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim},
year={2000} }'
chicago: Hellebrand, Sybille, Hua-Guo Liang, and Hans-Joachim Wunderlich. A Mixed
Mode BIST Scheme Based on Reseeding of Folding Counters. IEEE European Test
Workshop, Cascais, Portugal, 2000.
ieee: S. Hellebrand, H.-G. Liang, and H.-J. Wunderlich, A Mixed Mode BIST Scheme
Based on Reseeding of Folding Counters. IEEE European Test Workshop, Cascais,
Portugal, 2000.
mla: Hellebrand, Sybille, et al. A Mixed Mode BIST Scheme Based on Reseeding
of Folding Counters. 2000.
short: S. Hellebrand, H.-G. Liang, H.-J. Wunderlich, A Mixed Mode BIST Scheme Based
on Reseeding of Folding Counters, IEEE European Test Workshop, Cascais, Portugal,
2000.
date_created: 2019-08-28T12:18:56Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: IEEE European Test Workshop, Cascais, Portugal
status: public
title: A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters
type: misc
user_id: '659'
year: '2000'
...
---
_id: '13005'
author:
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hua-Guo
full_name: Liang, Hua-Guo
last_name: Liang
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: 'Hellebrand S, Liang H-G, Wunderlich H-J. A Mixed Mode BIST Scheme Based on
Reseeding of Folding Counters. In: IEEE International Test Conference (ITC’00).
IEEE; 2000:778-784. doi:10.1109/test.2000.894274'
apa: Hellebrand, S., Liang, H.-G., & Wunderlich, H.-J. (2000). A Mixed Mode
BIST Scheme Based on Reseeding of Folding Counters. IEEE International Test
Conference (ITC’00), 778–784. https://doi.org/10.1109/test.2000.894274
bibtex: '@inproceedings{Hellebrand_Liang_Wunderlich_2000, place={Atlantic City,
NJ, USA}, title={A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters},
DOI={10.1109/test.2000.894274},
booktitle={IEEE International Test Conference (ITC’00)}, publisher={IEEE}, author={Hellebrand,
Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim}, year={2000}, pages={778–784}
}'
chicago: 'Hellebrand, Sybille, Hua-Guo Liang, and Hans-Joachim Wunderlich. “A Mixed
Mode BIST Scheme Based on Reseeding of Folding Counters.” In IEEE International
Test Conference (ITC’00), 778–84. Atlantic City, NJ, USA: IEEE, 2000. https://doi.org/10.1109/test.2000.894274.'
ieee: 'S. Hellebrand, H.-G. Liang, and H.-J. Wunderlich, “A Mixed Mode BIST Scheme
Based on Reseeding of Folding Counters,” in IEEE International Test Conference
(ITC’00), 2000, pp. 778–784, doi: 10.1109/test.2000.894274.'
mla: Hellebrand, Sybille, et al. “A Mixed Mode BIST Scheme Based on Reseeding of
Folding Counters.” IEEE International Test Conference (ITC’00), IEEE, 2000,
pp. 778–84, doi:10.1109/test.2000.894274.
short: 'S. Hellebrand, H.-G. Liang, H.-J. Wunderlich, in: IEEE International Test
Conference (ITC’00), IEEE, Atlantic City, NJ, USA, 2000, pp. 778–784.'
date_created: 2019-08-28T10:24:38Z
date_updated: 2022-05-11T16:47:22Z
department:
- _id: '48'
doi: 10.1109/test.2000.894274
extern: '1'
language:
- iso: eng
page: 778-784
place: Atlantic City, NJ, USA
publication: IEEE International Test Conference (ITC'00)
publisher: IEEE
status: public
title: A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters
type: conference
user_id: '209'
year: '2000'
...
---
_id: '13065'
author:
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: 'Hellebrand S. Selbsttestbare Steuerwerke - Strukturen Und Syntheseverfahren.
Verlag Dr. Kovac, Hamburg: Verlag Dr. Kovac, Hamburg; 1999.'
apa: 'Hellebrand, S. (1999). Selbsttestbare Steuerwerke - Strukturen und Syntheseverfahren.
Verlag Dr. Kovac, Hamburg: Verlag Dr. Kovac, Hamburg.'
bibtex: '@book{Hellebrand_1999, place={Verlag Dr. Kovac, Hamburg}, series={10},
title={Selbsttestbare Steuerwerke - Strukturen und Syntheseverfahren}, publisher={Verlag
Dr. Kovac, Hamburg}, author={Hellebrand, Sybille}, year={1999}, collection={10}
}'
chicago: 'Hellebrand, Sybille. Selbsttestbare Steuerwerke - Strukturen Und Syntheseverfahren.
10. Verlag Dr. Kovac, Hamburg: Verlag Dr. Kovac, Hamburg, 1999.'
ieee: 'S. Hellebrand, Selbsttestbare Steuerwerke - Strukturen und Syntheseverfahren.
Verlag Dr. Kovac, Hamburg: Verlag Dr. Kovac, Hamburg, 1999.'
mla: Hellebrand, Sybille. Selbsttestbare Steuerwerke - Strukturen Und Syntheseverfahren.
Verlag Dr. Kovac, Hamburg, 1999.
short: S. Hellebrand, Selbsttestbare Steuerwerke - Strukturen Und Syntheseverfahren,
Verlag Dr. Kovac, Hamburg, Verlag Dr. Kovac, Hamburg, 1999.
date_created: 2019-08-28T11:55:59Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
extern: '1'
language:
- iso: eng
place: Verlag Dr. Kovac, Hamburg
publication_identifier:
isbn:
- '3257227892'
publisher: Verlag Dr. Kovac, Hamburg
series_title: '10'
status: public
title: Selbsttestbare Steuerwerke - Strukturen und Syntheseverfahren
type: book
user_id: '659'
year: '1999'
...
---
_id: '13093'
author:
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
- first_name: Vyacheslav
full_name: N. Yarmolik, Vyacheslav
last_name: N. Yarmolik
citation:
ama: Hellebrand S, Wunderlich H-J, N. Yarmolik V. Exploiting Symmetries to Speed
Up Transparent BIST. 11th GI/ITG/GMM/IEEE Workshop; 1999.
apa: Hellebrand, S., Wunderlich, H.-J., & N. Yarmolik, V. (1999). Exploiting
Symmetries to Speed Up Transparent BIST. 11th GI/ITG/GMM/IEEE Workshop.
bibtex: '@book{Hellebrand_Wunderlich_N. Yarmolik_1999, place={11th GI/ITG/GMM/IEEE
Workshop}, title={Exploiting Symmetries to Speed Up Transparent BIST}, author={Hellebrand,
Sybille and Wunderlich, Hans-Joachim and N. Yarmolik, Vyacheslav}, year={1999}
}'
chicago: Hellebrand, Sybille, Hans-Joachim Wunderlich, and Vyacheslav N. Yarmolik.
Exploiting Symmetries to Speed Up Transparent BIST. 11th GI/ITG/GMM/IEEE
Workshop, 1999.
ieee: S. Hellebrand, H.-J. Wunderlich, and V. N. Yarmolik, Exploiting Symmetries
to Speed Up Transparent BIST. 11th GI/ITG/GMM/IEEE Workshop, 1999.
mla: Hellebrand, Sybille, et al. Exploiting Symmetries to Speed Up Transparent
BIST. 1999.
short: S. Hellebrand, H.-J. Wunderlich, V. N. Yarmolik, Exploiting Symmetries to
Speed Up Transparent BIST, 11th GI/ITG/GMM/IEEE Workshop, 1999.
date_created: 2019-08-28T12:17:07Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: 11th GI/ITG/GMM/IEEE Workshop
status: public
title: Exploiting Symmetries to Speed Up Transparent BIST
type: misc
user_id: '659'
year: '1999'
...