---
_id: '13056'
author:
- first_name: Zhengfeng
full_name: Huang, Zhengfeng
last_name: Huang
- first_name: Huaguo
full_name: Liang, Huaguo
last_name: Liang
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: Huang Z, Liang H, Hellebrand S. A High Performance SEU Tolerant Latch. Journal
of Electronic Testing - Theory and Applications (JETTA). 2015;31(4):349-359.
apa: Huang, Z., Liang, H., & Hellebrand, S. (2015). A High Performance SEU Tolerant
Latch. Journal of Electronic Testing - Theory and Applications (JETTA),
31(4), 349–359.
bibtex: '@article{Huang_Liang_Hellebrand_2015, title={A High Performance SEU Tolerant
Latch}, volume={31}, number={4}, journal={Journal of Electronic Testing - Theory
and Applications (JETTA)}, publisher={Springer}, author={Huang, Zhengfeng and
Liang, Huaguo and Hellebrand, Sybille}, year={2015}, pages={349–359} }'
chicago: 'Huang, Zhengfeng, Huaguo Liang, and Sybille Hellebrand. “A High Performance
SEU Tolerant Latch.” Journal of Electronic Testing - Theory and Applications
(JETTA) 31, no. 4 (2015): 349–59.'
ieee: Z. Huang, H. Liang, and S. Hellebrand, “A High Performance SEU Tolerant Latch,”
Journal of Electronic Testing - Theory and Applications (JETTA), vol. 31,
no. 4, pp. 349–359, 2015.
mla: Huang, Zhengfeng, et al. “A High Performance SEU Tolerant Latch.” Journal
of Electronic Testing - Theory and Applications (JETTA), vol. 31, no. 4, Springer,
2015, pp. 349–59.
short: Z. Huang, H. Liang, S. Hellebrand, Journal of Electronic Testing - Theory
and Applications (JETTA) 31 (2015) 349–359.
date_created: 2019-08-28T11:48:55Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
intvolume: ' 31'
issue: '4'
language:
- iso: eng
page: 349-359
publication: Journal of Electronic Testing - Theory and Applications (JETTA)
publisher: Springer
status: public
title: A High Performance SEU Tolerant Latch
type: journal_article
user_id: '209'
volume: 31
year: '2015'
...
---
_id: '13077'
author:
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Thomas
full_name: Indlekofer, Thomas
last_name: Indlekofer
- first_name: Matthias
full_name: Kampmann, Matthias
id: '10935'
last_name: Kampmann
- first_name: Michael
full_name: Kochte, Michael
last_name: Kochte
- first_name: Chang
full_name: Liu, Chang
last_name: Liu
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: Hellebrand S, Indlekofer T, Kampmann M, Kochte M, Liu C, Wunderlich H-J. Effiziente
Auswahl von Testfrequenzen Für Den Test Kleiner Verzögerungsfehler. 27. Workshop
“Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad
Urach, Germany; 2015.
apa: Hellebrand, S., Indlekofer, T., Kampmann, M., Kochte, M., Liu, C., & Wunderlich,
H.-J. (2015). Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler.
27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15),
Bad Urach, Germany.
bibtex: '@book{Hellebrand_Indlekofer_Kampmann_Kochte_Liu_Wunderlich_2015, place={27.
Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15),
Bad Urach, Germany}, title={Effiziente Auswahl von Testfrequenzen für den Test
kleiner Verzögerungsfehler}, author={Hellebrand, Sybille and Indlekofer, Thomas
and Kampmann, Matthias and Kochte, Michael and Liu, Chang and Wunderlich, Hans-Joachim},
year={2015} }'
chicago: Hellebrand, Sybille, Thomas Indlekofer, Matthias Kampmann, Michael Kochte,
Chang Liu, and Hans-Joachim Wunderlich. Effiziente Auswahl von Testfrequenzen
Für Den Test Kleiner Verzögerungsfehler. 27. Workshop “Testmethoden und Zuverlässigkeit
von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany, 2015.
ieee: S. Hellebrand, T. Indlekofer, M. Kampmann, M. Kochte, C. Liu, and H.-J. Wunderlich,
Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler.
27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15),
Bad Urach, Germany, 2015.
mla: Hellebrand, Sybille, et al. Effiziente Auswahl von Testfrequenzen Für Den
Test Kleiner Verzögerungsfehler. 2015.
short: S. Hellebrand, T. Indlekofer, M. Kampmann, M. Kochte, C. Liu, H.-J. Wunderlich,
Effiziente Auswahl von Testfrequenzen Für Den Test Kleiner Verzögerungsfehler,
27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15),
Bad Urach, Germany, 2015.
date_created: 2019-08-28T12:05:44Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
keyword:
- Workshop
language:
- iso: eng
place: 27. Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen"
(TuZ'15), Bad Urach, Germany
status: public
title: Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler
type: misc
user_id: '659'
year: '2015'
...
---
_id: '29465'
abstract:
- lang: eng
text: Transistor and interconnect wearout is accelerated with transistor scaling
resulting in timing variations and consequently reliability challenges in digital
circuits. Age monitoring methods can be used to predict and deal with the aging
problem. Selecting appropriate locations for placement of hardware aging monitors
is an important issue. In this work we propose a procedure for selection of appropriate
internal nodes in combinational clouds between pipeline stages or combinational
parts of a sequential circuit to place hardware monitors that can effectively
provide aging information of various components of a modern digital system. In
order to implement the node selection procedure, we propose an object-oriented
model. Object-oriented model of a circuit along with a probabilistic and logical
simulation engine that we have developed can effectively be used for implementation
and also fast evaluation of the proposed node selection mechanism. The proposed
object-oriented C+ + models can be integrated into a SystemC RTL model making
it possible to perform mixed-level simulation, and integrated evaluation of a
complete system. We have applied our proposed scheme to several processors including
MIPS, ARM, ALPHA and MiniRISC and have looked at its effectiveness for these processors.
author:
- first_name: Somayeh
full_name: Sadeghi-Kohan, Somayeh
id: '78614'
last_name: Sadeghi-Kohan
orcid: https://orcid.org/0000-0001-7246-0610
- first_name: Arezoo
full_name: Kamran, Arezoo
last_name: Kamran
- first_name: Farnaz
full_name: Forooghifar, Farnaz
last_name: Forooghifar
- first_name: Zainalabedin
full_name: Navabi, Zainalabedin
last_name: Navabi
citation:
ama: 'Sadeghi-Kohan S, Kamran A, Forooghifar F, Navabi Z. Aging in digital circuits
and age monitoring: Object-oriented modeling and evaluation. In: 2015 10th
International Conference on Design & Technology of Integrated Systems in Nanoscale
Era (DTIS). IEEE; 2015. doi:10.1109/dtis.2015.7127373'
apa: 'Sadeghi-Kohan, S., Kamran, A., Forooghifar, F., & Navabi, Z. (2015). Aging
in digital circuits and age monitoring: Object-oriented modeling and evaluation.
2015 10th International Conference on Design & Technology of Integrated
Systems in Nanoscale Era (DTIS). https://doi.org/10.1109/dtis.2015.7127373'
bibtex: '@inproceedings{Sadeghi-Kohan_Kamran_Forooghifar_Navabi_2015, title={Aging
in digital circuits and age monitoring: Object-oriented modeling and evaluation},
DOI={10.1109/dtis.2015.7127373},
booktitle={2015 10th International Conference on Design & Technology of Integrated
Systems in Nanoscale Era (DTIS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh
and Kamran, Arezoo and Forooghifar, Farnaz and Navabi, Zainalabedin}, year={2015}
}'
chicago: 'Sadeghi-Kohan, Somayeh, Arezoo Kamran, Farnaz Forooghifar, and Zainalabedin
Navabi. “Aging in Digital Circuits and Age Monitoring: Object-Oriented Modeling
and Evaluation.” In 2015 10th International Conference on Design & Technology
of Integrated Systems in Nanoscale Era (DTIS). IEEE, 2015. https://doi.org/10.1109/dtis.2015.7127373.'
ieee: 'S. Sadeghi-Kohan, A. Kamran, F. Forooghifar, and Z. Navabi, “Aging in digital
circuits and age monitoring: Object-oriented modeling and evaluation,” 2015, doi:
10.1109/dtis.2015.7127373.'
mla: 'Sadeghi-Kohan, Somayeh, et al. “Aging in Digital Circuits and Age Monitoring:
Object-Oriented Modeling and Evaluation.” 2015 10th International Conference
on Design & Technology of Integrated Systems in Nanoscale Era (DTIS),
IEEE, 2015, doi:10.1109/dtis.2015.7127373.'
short: 'S. Sadeghi-Kohan, A. Kamran, F. Forooghifar, Z. Navabi, in: 2015 10th International
Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS),
IEEE, 2015.'
date_created: 2022-01-19T13:51:35Z
date_updated: 2023-08-02T11:35:56Z
department:
- _id: '48'
doi: 10.1109/dtis.2015.7127373
extern: '1'
language:
- iso: eng
publication: 2015 10th International Conference on Design & Technology of Integrated
Systems in Nanoscale Era (DTIS)
publication_status: published
publisher: IEEE
status: public
title: 'Aging in digital circuits and age monitoring: Object-oriented modeling and
evaluation'
type: conference
user_id: '78614'
year: '2015'
...
---
_id: '29466'
abstract:
- lang: eng
text: Transistor and interconnect wearout is accelerated with transistor scaling
that results in timing variations. Progressive age measurement of a circuit can
help a better prevention mechanism for reducing more aging. This requires age
monitors that collect progressive age information of the circuit. This paper focuses
on monitor structures for implementation of progressive age detection. The monitors
are self-adjusting that they adjust themselves to detect progressive changes in
the timing of a circuit. Furthermore, the monitors are designed for low hardware
overhead, and certainty in reported timing changes.
author:
- first_name: Somayeh
full_name: Sadeghi-Kohan, Somayeh
id: '78614'
last_name: Sadeghi-Kohan
orcid: https://orcid.org/0000-0001-7246-0610
- first_name: Mehdi
full_name: Kamal, Mehdi
last_name: Kamal
- first_name: John
full_name: McNeil, John
last_name: McNeil
- first_name: Paolo
full_name: Prinetto, Paolo
last_name: Prinetto
- first_name: Zain
full_name: Navabi, Zain
last_name: Navabi
citation:
ama: 'Sadeghi-Kohan S, Kamal M, McNeil J, Prinetto P, Navabi Z. Online self adjusting
progressive age monitoring of timing variations. In: 2015 10th International
Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS).
IEEE; 2015. doi:10.1109/dtis.2015.7127368'
apa: Sadeghi-Kohan, S., Kamal, M., McNeil, J., Prinetto, P., & Navabi, Z. (2015).
Online self adjusting progressive age monitoring of timing variations. 2015
10th International Conference on Design & Technology of Integrated Systems
in Nanoscale Era (DTIS). https://doi.org/10.1109/dtis.2015.7127368
bibtex: '@inproceedings{Sadeghi-Kohan_Kamal_McNeil_Prinetto_Navabi_2015, title={Online
self adjusting progressive age monitoring of timing variations}, DOI={10.1109/dtis.2015.7127368},
booktitle={2015 10th International Conference on Design & Technology of Integrated
Systems in Nanoscale Era (DTIS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh
and Kamal, Mehdi and McNeil, John and Prinetto, Paolo and Navabi, Zain}, year={2015}
}'
chicago: Sadeghi-Kohan, Somayeh, Mehdi Kamal, John McNeil, Paolo Prinetto, and Zain
Navabi. “Online Self Adjusting Progressive Age Monitoring of Timing Variations.”
In 2015 10th International Conference on Design & Technology of Integrated
Systems in Nanoscale Era (DTIS). IEEE, 2015. https://doi.org/10.1109/dtis.2015.7127368.
ieee: 'S. Sadeghi-Kohan, M. Kamal, J. McNeil, P. Prinetto, and Z. Navabi, “Online
self adjusting progressive age monitoring of timing variations,” 2015, doi: 10.1109/dtis.2015.7127368.'
mla: Sadeghi-Kohan, Somayeh, et al. “Online Self Adjusting Progressive Age Monitoring
of Timing Variations.” 2015 10th International Conference on Design & Technology
of Integrated Systems in Nanoscale Era (DTIS), IEEE, 2015, doi:10.1109/dtis.2015.7127368.
short: 'S. Sadeghi-Kohan, M. Kamal, J. McNeil, P. Prinetto, Z. Navabi, in: 2015
10th International Conference on Design & Technology of Integrated Systems
in Nanoscale Era (DTIS), IEEE, 2015.'
date_created: 2022-01-19T13:52:32Z
date_updated: 2023-08-02T11:36:58Z
department:
- _id: '48'
doi: 10.1109/dtis.2015.7127368
extern: '1'
language:
- iso: eng
publication: 2015 10th International Conference on Design & Technology of Integrated
Systems in Nanoscale Era (DTIS)
publication_status: published
publisher: IEEE
status: public
title: Online self adjusting progressive age monitoring of timing variations
type: conference
user_id: '78614'
year: '2015'
...
---
_id: '12977'
author:
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Thomas
full_name: Indlekofer, Thomas
last_name: Indlekofer
- first_name: Matthias
full_name: Kampmann, Matthias
id: '10935'
last_name: Kampmann
- first_name: Michael
full_name: A. Kochte, Michael
last_name: A. Kochte
- first_name: Chang
full_name: Liu, Chang
last_name: Liu
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: 'Hellebrand S, Indlekofer T, Kampmann M, A. Kochte M, Liu C, Wunderlich H-J.
FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects. In: IEEE
International Test Conference (ITC’14). Seattle, Washington, USA: IEEE; 2014.
doi:10.1109/test.2014.7035360'
apa: 'Hellebrand, S., Indlekofer, T., Kampmann, M., A. Kochte, M., Liu, C., &
Wunderlich, H.-J. (2014). FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden
Delay Defects. In IEEE International Test Conference (ITC’14). Seattle,
Washington, USA: IEEE. https://doi.org/10.1109/test.2014.7035360'
bibtex: '@inproceedings{Hellebrand_Indlekofer_Kampmann_A. Kochte_Liu_Wunderlich_2014,
place={Seattle, Washington, USA}, title={FAST-BIST: Faster-than-at-Speed BIST
Targeting Hidden Delay Defects}, DOI={10.1109/test.2014.7035360},
booktitle={IEEE International Test Conference (ITC’14)}, publisher={IEEE}, author={Hellebrand,
Sybille and Indlekofer, Thomas and Kampmann, Matthias and A. Kochte, Michael and
Liu, Chang and Wunderlich, Hans-Joachim}, year={2014} }'
chicago: 'Hellebrand, Sybille, Thomas Indlekofer, Matthias Kampmann, Michael A.
Kochte, Chang Liu, and Hans-Joachim Wunderlich. “FAST-BIST: Faster-than-at-Speed
BIST Targeting Hidden Delay Defects.” In IEEE International Test Conference
(ITC’14). Seattle, Washington, USA: IEEE, 2014. https://doi.org/10.1109/test.2014.7035360.'
ieee: 'S. Hellebrand, T. Indlekofer, M. Kampmann, M. A. Kochte, C. Liu, and H.-J.
Wunderlich, “FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects,”
in IEEE International Test Conference (ITC’14), 2014.'
mla: 'Hellebrand, Sybille, et al. “FAST-BIST: Faster-than-at-Speed BIST Targeting
Hidden Delay Defects.” IEEE International Test Conference (ITC’14), IEEE,
2014, doi:10.1109/test.2014.7035360.'
short: 'S. Hellebrand, T. Indlekofer, M. Kampmann, M. A. Kochte, C. Liu, H.-J. Wunderlich,
in: IEEE International Test Conference (ITC’14), IEEE, Seattle, Washington, USA,
2014.'
date_created: 2019-08-28T09:04:45Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
doi: 10.1109/test.2014.7035360
language:
- iso: eng
place: Seattle, Washington, USA
publication: IEEE International Test Conference (ITC'14)
publisher: IEEE
status: public
title: 'FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects'
type: conference
user_id: '209'
year: '2014'
...
---
_id: '13054'
author:
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: Hellebrand S, Wunderlich H-J. SAT-Based ATPG beyond Stuck-at Fault Testing.
DeGruyter Journal on Information Technology (it). 2014;56(4):165-172.
apa: Hellebrand, S., & Wunderlich, H.-J. (2014). SAT-Based ATPG beyond Stuck-at
Fault Testing. DeGruyter Journal on Information Technology (It), 56(4),
165–172.
bibtex: '@article{Hellebrand_Wunderlich_2014, title={SAT-Based ATPG beyond Stuck-at
Fault Testing}, volume={56}, number={4}, journal={DeGruyter Journal on Information
Technology (it)}, publisher={DeGruyter}, author={Hellebrand, Sybille and Wunderlich,
Hans-Joachim}, year={2014}, pages={165–172} }'
chicago: 'Hellebrand, Sybille, and Hans-Joachim Wunderlich. “SAT-Based ATPG beyond
Stuck-at Fault Testing.” DeGruyter Journal on Information Technology (It)
56, no. 4 (2014): 165–72.'
ieee: S. Hellebrand and H.-J. Wunderlich, “SAT-Based ATPG beyond Stuck-at Fault
Testing,” DeGruyter Journal on Information Technology (it), vol. 56, no.
4, pp. 165–172, 2014.
mla: Hellebrand, Sybille, and Hans-Joachim Wunderlich. “SAT-Based ATPG beyond Stuck-at
Fault Testing.” DeGruyter Journal on Information Technology (It), vol.
56, no. 4, DeGruyter, 2014, pp. 165–72.
short: S. Hellebrand, H.-J. Wunderlich, DeGruyter Journal on Information Technology
(It) 56 (2014) 165–172.
date_created: 2019-08-28T11:48:13Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
intvolume: ' 56'
issue: '4'
language:
- iso: eng
page: 165-172
publication: DeGruyter Journal on Information Technology (it)
publisher: DeGruyter
status: public
title: SAT-Based ATPG beyond Stuck-at Fault Testing
type: journal_article
user_id: '209'
volume: 56
year: '2014'
...
---
_id: '13055'
author:
- first_name: Laura
full_name: Rodriguez Gomez, Laura
last_name: Rodriguez Gomez
- first_name: Alejandro
full_name: Cook, Alejandro
last_name: Cook
- first_name: Thomas
full_name: Indlekofer, Thomas
last_name: Indlekofer
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: Rodriguez Gomez L, Cook A, Indlekofer T, Hellebrand S, Wunderlich H-J. Adaptive
Bayesian Diagnosis of Intermittent Faults. Journal of Electronic Testing -
Theory and Applications (JETTA). 2014;30(5):527-540.
apa: Rodriguez Gomez, L., Cook, A., Indlekofer, T., Hellebrand, S., & Wunderlich,
H.-J. (2014). Adaptive Bayesian Diagnosis of Intermittent Faults. Journal of
Electronic Testing - Theory and Applications (JETTA), 30(5), 527–540.
bibtex: '@article{Rodriguez Gomez_Cook_Indlekofer_Hellebrand_Wunderlich_2014, title={Adaptive
Bayesian Diagnosis of Intermittent Faults}, volume={30}, number={5}, journal={Journal
of Electronic Testing - Theory and Applications (JETTA)}, publisher={Springer},
author={Rodriguez Gomez, Laura and Cook, Alejandro and Indlekofer, Thomas and
Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2014}, pages={527–540}
}'
chicago: 'Rodriguez Gomez, Laura, Alejandro Cook, Thomas Indlekofer, Sybille Hellebrand,
and Hans-Joachim Wunderlich. “Adaptive Bayesian Diagnosis of Intermittent Faults.”
Journal of Electronic Testing - Theory and Applications (JETTA) 30, no.
5 (2014): 527–40.'
ieee: L. Rodriguez Gomez, A. Cook, T. Indlekofer, S. Hellebrand, and H.-J. Wunderlich,
“Adaptive Bayesian Diagnosis of Intermittent Faults,” Journal of Electronic
Testing - Theory and Applications (JETTA), vol. 30, no. 5, pp. 527–540, 2014.
mla: Rodriguez Gomez, Laura, et al. “Adaptive Bayesian Diagnosis of Intermittent
Faults.” Journal of Electronic Testing - Theory and Applications (JETTA),
vol. 30, no. 5, Springer, 2014, pp. 527–40.
short: L. Rodriguez Gomez, A. Cook, T. Indlekofer, S. Hellebrand, H.-J. Wunderlich,
Journal of Electronic Testing - Theory and Applications (JETTA) 30 (2014) 527–540.
date_created: 2019-08-28T11:48:33Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
intvolume: ' 30'
issue: '5'
language:
- iso: eng
page: 527-540
publication: Journal of Electronic Testing - Theory and Applications (JETTA)
publisher: Springer
status: public
title: Adaptive Bayesian Diagnosis of Intermittent Faults
type: journal_article
user_id: '209'
volume: 30
year: '2014'
...
---
_id: '46266'
author:
- first_name: Bijan
full_name: Alizadeh, Bijan
last_name: Alizadeh
- first_name: Payman
full_name: Behnam, Payman
last_name: Behnam
- first_name: Somayeh
full_name: Sadeghi-Kohan, Somayeh
id: '78614'
last_name: Sadeghi-Kohan
orcid: https://orcid.org/0000-0001-7246-0610
citation:
ama: Alizadeh B, Behnam P, Sadeghi-Kohan S. A Scalable Formal Debugging Approach
with Auto-Correction Capability based on Static Slicing and Dynamic Ranking for
RTL Datapath Designs. IEEE Transactions on Computers. Published online
2014:1-1. doi:10.1109/tc.2014.2329687
apa: Alizadeh, B., Behnam, P., & Sadeghi-Kohan, S. (2014). A Scalable Formal
Debugging Approach with Auto-Correction Capability based on Static Slicing and
Dynamic Ranking for RTL Datapath Designs. IEEE Transactions on Computers,
1–1. https://doi.org/10.1109/tc.2014.2329687
bibtex: '@article{Alizadeh_Behnam_Sadeghi-Kohan_2014, title={A Scalable Formal Debugging
Approach with Auto-Correction Capability based on Static Slicing and Dynamic Ranking
for RTL Datapath Designs}, DOI={10.1109/tc.2014.2329687},
journal={IEEE Transactions on Computers}, publisher={Institute of Electrical and
Electronics Engineers (IEEE)}, author={Alizadeh, Bijan and Behnam, Payman and
Sadeghi-Kohan, Somayeh}, year={2014}, pages={1–1} }'
chicago: Alizadeh, Bijan, Payman Behnam, and Somayeh Sadeghi-Kohan. “A Scalable
Formal Debugging Approach with Auto-Correction Capability Based on Static Slicing
and Dynamic Ranking for RTL Datapath Designs.” IEEE Transactions on Computers,
2014, 1–1. https://doi.org/10.1109/tc.2014.2329687.
ieee: 'B. Alizadeh, P. Behnam, and S. Sadeghi-Kohan, “A Scalable Formal Debugging
Approach with Auto-Correction Capability based on Static Slicing and Dynamic Ranking
for RTL Datapath Designs,” IEEE Transactions on Computers, pp. 1–1, 2014,
doi: 10.1109/tc.2014.2329687.'
mla: Alizadeh, Bijan, et al. “A Scalable Formal Debugging Approach with Auto-Correction
Capability Based on Static Slicing and Dynamic Ranking for RTL Datapath Designs.”
IEEE Transactions on Computers, Institute of Electrical and Electronics
Engineers (IEEE), 2014, pp. 1–1, doi:10.1109/tc.2014.2329687.
short: B. Alizadeh, P. Behnam, S. Sadeghi-Kohan, IEEE Transactions on Computers
(2014) 1–1.
date_created: 2023-08-02T11:15:22Z
date_updated: 2023-08-02T11:32:37Z
department:
- _id: '48'
doi: 10.1109/tc.2014.2329687
extern: '1'
keyword:
- Computational Theory and Mathematics
- Hardware and Architecture
- Theoretical Computer Science
- Software
language:
- iso: eng
page: 1-1
publication: IEEE Transactions on Computers
publication_identifier:
issn:
- 0018-9340
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
status: public
title: A Scalable Formal Debugging Approach with Auto-Correction Capability based
on Static Slicing and Dynamic Ranking for RTL Datapath Designs
type: journal_article
user_id: '78614'
year: '2014'
...
---
_id: '46268'
author:
- first_name: Marzieh
full_name: Mohammadi, Marzieh
last_name: Mohammadi
- first_name: Somayeh
full_name: Sadeghi-Kohan, Somayeh
id: '78614'
last_name: Sadeghi-Kohan
orcid: https://orcid.org/0000-0001-7246-0610
- first_name: Nasser
full_name: Masoumi, Nasser
last_name: Masoumi
- first_name: Zainalabedin
full_name: Navabi, Zainalabedin
last_name: Navabi
citation:
ama: 'Mohammadi M, Sadeghi-Kohan S, Masoumi N, Navabi Z. An off-line MDSI interconnect
BIST incorporated in BS 1149.1. In: 2014 19th IEEE European Test Symposium
(ETS). IEEE; 2014. doi:10.1109/ets.2014.6847847'
apa: Mohammadi, M., Sadeghi-Kohan, S., Masoumi, N., & Navabi, Z. (2014). An
off-line MDSI interconnect BIST incorporated in BS 1149.1. 2014 19th IEEE European
Test Symposium (ETS). https://doi.org/10.1109/ets.2014.6847847
bibtex: '@inproceedings{Mohammadi_Sadeghi-Kohan_Masoumi_Navabi_2014, title={An off-line
MDSI interconnect BIST incorporated in BS 1149.1}, DOI={10.1109/ets.2014.6847847},
booktitle={2014 19th IEEE European Test Symposium (ETS)}, publisher={IEEE}, author={Mohammadi,
Marzieh and Sadeghi-Kohan, Somayeh and Masoumi, Nasser and Navabi, Zainalabedin},
year={2014} }'
chicago: Mohammadi, Marzieh, Somayeh Sadeghi-Kohan, Nasser Masoumi, and Zainalabedin
Navabi. “An Off-Line MDSI Interconnect BIST Incorporated in BS 1149.1.” In 2014
19th IEEE European Test Symposium (ETS). IEEE, 2014. https://doi.org/10.1109/ets.2014.6847847.
ieee: 'M. Mohammadi, S. Sadeghi-Kohan, N. Masoumi, and Z. Navabi, “An off-line MDSI
interconnect BIST incorporated in BS 1149.1,” 2014, doi: 10.1109/ets.2014.6847847.'
mla: Mohammadi, Marzieh, et al. “An Off-Line MDSI Interconnect BIST Incorporated
in BS 1149.1.” 2014 19th IEEE European Test Symposium (ETS), IEEE, 2014,
doi:10.1109/ets.2014.6847847.
short: 'M. Mohammadi, S. Sadeghi-Kohan, N. Masoumi, Z. Navabi, in: 2014 19th IEEE
European Test Symposium (ETS), IEEE, 2014.'
date_created: 2023-08-02T11:18:26Z
date_updated: 2023-08-02T11:32:48Z
department:
- _id: '48'
doi: 10.1109/ets.2014.6847847
extern: '1'
language:
- iso: eng
publication: 2014 19th IEEE European Test Symposium (ETS)
publication_status: published
publisher: IEEE
status: public
title: An off-line MDSI interconnect BIST incorporated in BS 1149.1
type: conference
user_id: '78614'
year: '2014'
...
---
_id: '46267'
author:
- first_name: Somayeh
full_name: Sadeghi-Kohan, Somayeh
id: '78614'
last_name: Sadeghi-Kohan
orcid: https://orcid.org/0000-0001-7246-0610
- first_name: Payman
full_name: Behnam, Payman
last_name: Behnam
- first_name: Bijan
full_name: Alizadeh, Bijan
last_name: Alizadeh
- first_name: Masahiro
full_name: Fujita, Masahiro
last_name: Fujita
- first_name: Zainalabedin
full_name: Navabi, Zainalabedin
last_name: Navabi
citation:
ama: 'Sadeghi-Kohan S, Behnam P, Alizadeh B, Fujita M, Navabi Z. Improving polynomial
datapath debugging with HEDs. In: 2014 19th IEEE European Test Symposium (ETS).
IEEE; 2014. doi:10.1109/ets.2014.6847797'
apa: Sadeghi-Kohan, S., Behnam, P., Alizadeh, B., Fujita, M., & Navabi, Z. (2014).
Improving polynomial datapath debugging with HEDs. 2014 19th IEEE European
Test Symposium (ETS). https://doi.org/10.1109/ets.2014.6847797
bibtex: '@inproceedings{Sadeghi-Kohan_Behnam_Alizadeh_Fujita_Navabi_2014, title={Improving
polynomial datapath debugging with HEDs}, DOI={10.1109/ets.2014.6847797},
booktitle={2014 19th IEEE European Test Symposium (ETS)}, publisher={IEEE}, author={Sadeghi-Kohan,
Somayeh and Behnam, Payman and Alizadeh, Bijan and Fujita, Masahiro and Navabi,
Zainalabedin}, year={2014} }'
chicago: Sadeghi-Kohan, Somayeh, Payman Behnam, Bijan Alizadeh, Masahiro Fujita,
and Zainalabedin Navabi. “Improving Polynomial Datapath Debugging with HEDs.”
In 2014 19th IEEE European Test Symposium (ETS). IEEE, 2014. https://doi.org/10.1109/ets.2014.6847797.
ieee: 'S. Sadeghi-Kohan, P. Behnam, B. Alizadeh, M. Fujita, and Z. Navabi, “Improving
polynomial datapath debugging with HEDs,” 2014, doi: 10.1109/ets.2014.6847797.'
mla: Sadeghi-Kohan, Somayeh, et al. “Improving Polynomial Datapath Debugging with
HEDs.” 2014 19th IEEE European Test Symposium (ETS), IEEE, 2014, doi:10.1109/ets.2014.6847797.
short: 'S. Sadeghi-Kohan, P. Behnam, B. Alizadeh, M. Fujita, Z. Navabi, in: 2014
19th IEEE European Test Symposium (ETS), IEEE, 2014.'
date_created: 2023-08-02T11:17:08Z
date_updated: 2023-08-02T11:34:10Z
department:
- _id: '48'
doi: 10.1109/ets.2014.6847797
extern: '1'
language:
- iso: eng
publication: 2014 19th IEEE European Test Symposium (ETS)
publication_status: published
publisher: IEEE
status: public
title: Improving polynomial datapath debugging with HEDs
type: conference
user_id: '78614'
year: '2014'
...
---
_id: '12979'
author:
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: 'Hellebrand S. Analyzing and Quantifying Fault Tolerance Properties. In: 14th
IEEE Latin American Test Workshop - (LATW’13). Cordoba, Argentina: IEEE; 2013.
doi:10.1109/latw.2013.6562662'
apa: 'Hellebrand, S. (2013). Analyzing and Quantifying Fault Tolerance Properties.
In 14th IEEE Latin American Test Workshop - (LATW’13). Cordoba, Argentina:
IEEE. https://doi.org/10.1109/latw.2013.6562662'
bibtex: '@inproceedings{Hellebrand_2013, place={Cordoba, Argentina}, title={Analyzing
and Quantifying Fault Tolerance Properties}, DOI={10.1109/latw.2013.6562662},
booktitle={14th IEEE Latin American Test Workshop - (LATW’13)}, publisher={IEEE},
author={Hellebrand, Sybille}, year={2013} }'
chicago: 'Hellebrand, Sybille. “Analyzing and Quantifying Fault Tolerance Properties.”
In 14th IEEE Latin American Test Workshop - (LATW’13). Cordoba, Argentina:
IEEE, 2013. https://doi.org/10.1109/latw.2013.6562662.'
ieee: S. Hellebrand, “Analyzing and Quantifying Fault Tolerance Properties,” in
14th IEEE Latin American Test Workshop - (LATW’13), 2013.
mla: Hellebrand, Sybille. “Analyzing and Quantifying Fault Tolerance Properties.”
14th IEEE Latin American Test Workshop - (LATW’13), IEEE, 2013, doi:10.1109/latw.2013.6562662.
short: 'S. Hellebrand, in: 14th IEEE Latin American Test Workshop - (LATW’13), IEEE,
Cordoba, Argentina, 2013.'
date_created: 2019-08-28T09:16:51Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
doi: 10.1109/latw.2013.6562662
language:
- iso: eng
place: Cordoba, Argentina
publication: 14th IEEE Latin American Test Workshop - (LATW'13)
publisher: IEEE
status: public
title: Analyzing and Quantifying Fault Tolerance Properties
type: conference
user_id: '209'
year: '2013'
...
---
_id: '13075'
author:
- first_name: Alejandro
full_name: Cook, Alejandro
last_name: Cook
- first_name: Laura
full_name: Rodriguez Gomez, Laura
last_name: Rodriguez Gomez
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Thomas
full_name: Indlekofer, Thomas
last_name: Indlekofer
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: Cook A, Rodriguez Gomez L, Hellebrand S, Indlekofer T, Wunderlich H-J. Adaptive
Test and Diagnosis of Intermittent Faults. 14th Latin American Test Workshop,
Cordoba, Argentina; 2013.
apa: Cook, A., Rodriguez Gomez, L., Hellebrand, S., Indlekofer, T., & Wunderlich,
H.-J. (2013). Adaptive Test and Diagnosis of Intermittent Faults. 14th
Latin American Test Workshop, Cordoba, Argentina.
bibtex: '@book{Cook_Rodriguez Gomez_Hellebrand_Indlekofer_Wunderlich_2013, place={14th
Latin American Test Workshop, Cordoba, Argentina}, title={Adaptive Test and Diagnosis
of Intermittent Faults}, author={Cook, Alejandro and Rodriguez Gomez, Laura and
Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}, year={2013}
}'
chicago: Cook, Alejandro, Laura Rodriguez Gomez, Sybille Hellebrand, Thomas Indlekofer,
and Hans-Joachim Wunderlich. Adaptive Test and Diagnosis of Intermittent Faults.
14th Latin American Test Workshop, Cordoba, Argentina, 2013.
ieee: A. Cook, L. Rodriguez Gomez, S. Hellebrand, T. Indlekofer, and H.-J. Wunderlich,
Adaptive Test and Diagnosis of Intermittent Faults. 14th Latin American
Test Workshop, Cordoba, Argentina, 2013.
mla: Cook, Alejandro, et al. Adaptive Test and Diagnosis of Intermittent Faults.
2013.
short: A. Cook, L. Rodriguez Gomez, S. Hellebrand, T. Indlekofer, H.-J. Wunderlich,
Adaptive Test and Diagnosis of Intermittent Faults, 14th Latin American Test Workshop,
Cordoba, Argentina, 2013.
date_created: 2019-08-28T12:04:38Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
keyword:
- WORKSHOP
language:
- iso: eng
place: 14th Latin American Test Workshop, Cordoba, Argentina
status: public
title: Adaptive Test and Diagnosis of Intermittent Faults
type: misc
user_id: '659'
year: '2013'
...
---
_id: '46271'
author:
- first_name: Somayeh
full_name: Sadeghi-Kohan, Somayeh
id: '78614'
last_name: Sadeghi-Kohan
orcid: https://orcid.org/0000-0001-7246-0610
- first_name: Majid
full_name: Namaki-Shoushtari, Majid
last_name: Namaki-Shoushtari
- first_name: Fatemeh
full_name: Javaheri, Fatemeh
last_name: Javaheri
- first_name: Zainalabedin
full_name: Navabi, Zainalabedin
last_name: Navabi
citation:
ama: 'Sadeghi-Kohan S, Namaki-Shoushtari M, Javaheri F, Navabi Z. BS 1149.1 extensions
for an online interconnect fault detection and recovery. In: 2012 IEEE International
Test Conference. IEEE; 2013. doi:10.1109/test.2012.6401583'
apa: Sadeghi-Kohan, S., Namaki-Shoushtari, M., Javaheri, F., & Navabi, Z. (2013).
BS 1149.1 extensions for an online interconnect fault detection and recovery.
2012 IEEE International Test Conference. https://doi.org/10.1109/test.2012.6401583
bibtex: '@inproceedings{Sadeghi-Kohan_Namaki-Shoushtari_Javaheri_Navabi_2013, title={BS
1149.1 extensions for an online interconnect fault detection and recovery}, DOI={10.1109/test.2012.6401583},
booktitle={2012 IEEE International Test Conference}, publisher={IEEE}, author={Sadeghi-Kohan,
Somayeh and Namaki-Shoushtari, Majid and Javaheri, Fatemeh and Navabi, Zainalabedin},
year={2013} }'
chicago: Sadeghi-Kohan, Somayeh, Majid Namaki-Shoushtari, Fatemeh Javaheri, and
Zainalabedin Navabi. “BS 1149.1 Extensions for an Online Interconnect Fault Detection
and Recovery.” In 2012 IEEE International Test Conference. IEEE, 2013.
https://doi.org/10.1109/test.2012.6401583.
ieee: 'S. Sadeghi-Kohan, M. Namaki-Shoushtari, F. Javaheri, and Z. Navabi, “BS 1149.1
extensions for an online interconnect fault detection and recovery,” 2013, doi:
10.1109/test.2012.6401583.'
mla: Sadeghi-Kohan, Somayeh, et al. “BS 1149.1 Extensions for an Online Interconnect
Fault Detection and Recovery.” 2012 IEEE International Test Conference,
IEEE, 2013, doi:10.1109/test.2012.6401583.
short: 'S. Sadeghi-Kohan, M. Namaki-Shoushtari, F. Javaheri, Z. Navabi, in: 2012
IEEE International Test Conference, IEEE, 2013.'
date_created: 2023-08-02T11:20:19Z
date_updated: 2023-08-02T11:33:26Z
department:
- _id: '48'
doi: 10.1109/test.2012.6401583
extern: '1'
language:
- iso: eng
publication: 2012 IEEE International Test Conference
publication_status: published
publisher: IEEE
status: public
title: BS 1149.1 extensions for an online interconnect fault detection and recovery
type: conference
user_id: '78614'
year: '2013'
...
---
_id: '46270'
author:
- first_name: Somayeh
full_name: Sadeghi-Kohan, Somayeh
id: '78614'
last_name: Sadeghi-Kohan
orcid: https://orcid.org/0000-0001-7246-0610
- first_name: Shahrzad
full_name: Keshavarz, Shahrzad
last_name: Keshavarz
- first_name: Farzaneh
full_name: Zokaee, Farzaneh
last_name: Zokaee
- first_name: Farimah
full_name: Farahmandi, Farimah
last_name: Farahmandi
- first_name: Zainalabedin
full_name: Navabi, Zainalabedin
last_name: Navabi
citation:
ama: 'Sadeghi-Kohan S, Keshavarz S, Zokaee F, Farahmandi F, Navabi Z. A new structure
for interconnect offline testing. In: East-West Design & Test Symposium
(EWDTS 2013). IEEE; 2013. doi:10.1109/ewdts.2013.6673207'
apa: Sadeghi-Kohan, S., Keshavarz, S., Zokaee, F., Farahmandi, F., & Navabi,
Z. (2013). A new structure for interconnect offline testing. East-West Design
& Test Symposium (EWDTS 2013). https://doi.org/10.1109/ewdts.2013.6673207
bibtex: '@inproceedings{Sadeghi-Kohan_Keshavarz_Zokaee_Farahmandi_Navabi_2013, title={A
new structure for interconnect offline testing}, DOI={10.1109/ewdts.2013.6673207},
booktitle={East-West Design & Test Symposium (EWDTS 2013)}, publisher={IEEE},
author={Sadeghi-Kohan, Somayeh and Keshavarz, Shahrzad and Zokaee, Farzaneh and
Farahmandi, Farimah and Navabi, Zainalabedin}, year={2013} }'
chicago: Sadeghi-Kohan, Somayeh, Shahrzad Keshavarz, Farzaneh Zokaee, Farimah Farahmandi,
and Zainalabedin Navabi. “A New Structure for Interconnect Offline Testing.” In
East-West Design & Test Symposium (EWDTS 2013). IEEE, 2013. https://doi.org/10.1109/ewdts.2013.6673207.
ieee: 'S. Sadeghi-Kohan, S. Keshavarz, F. Zokaee, F. Farahmandi, and Z. Navabi,
“A new structure for interconnect offline testing,” 2013, doi: 10.1109/ewdts.2013.6673207.'
mla: Sadeghi-Kohan, Somayeh, et al. “A New Structure for Interconnect Offline Testing.”
East-West Design & Test Symposium (EWDTS 2013), IEEE, 2013, doi:10.1109/ewdts.2013.6673207.
short: 'S. Sadeghi-Kohan, S. Keshavarz, F. Zokaee, F. Farahmandi, Z. Navabi, in:
East-West Design & Test Symposium (EWDTS 2013), IEEE, 2013.'
date_created: 2023-08-02T11:19:36Z
date_updated: 2023-08-02T11:33:58Z
department:
- _id: '48'
doi: 10.1109/ewdts.2013.6673207
extern: '1'
language:
- iso: eng
publication: East-West Design & Test Symposium (EWDTS 2013)
publication_status: published
publisher: IEEE
status: public
title: A new structure for interconnect offline testing
type: conference
user_id: '78614'
year: '2013'
...
---
_id: '12980'
author:
- first_name: Alejandro
full_name: Cook, Alejandro
last_name: Cook
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Michael
full_name: E. Imhof, Michael
last_name: E. Imhof
- first_name: Abdullah
full_name: Mumtaz, Abdullah
last_name: Mumtaz
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: 'Cook A, Hellebrand S, E. Imhof M, Mumtaz A, Wunderlich H-J. Built-in Self-Diagnosis
Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test. In: 13th IEEE
Latin American Test Workshop (LATW’12). Quito, Ecuador: IEEE; 2012:1-4. doi:10.1109/latw.2012.6261229'
apa: 'Cook, A., Hellebrand, S., E. Imhof, M., Mumtaz, A., & Wunderlich, H.-J.
(2012). Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive
Test. In 13th IEEE Latin American Test Workshop (LATW’12) (pp. 1–4). Quito,
Ecuador: IEEE. https://doi.org/10.1109/latw.2012.6261229'
bibtex: '@inproceedings{Cook_Hellebrand_E. Imhof_Mumtaz_Wunderlich_2012, place={Quito,
Ecuador}, title={Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial
Pseudo-Exhaustive Test}, DOI={10.1109/latw.2012.6261229},
booktitle={13th IEEE Latin American Test Workshop (LATW’12)}, publisher={IEEE},
author={Cook, Alejandro and Hellebrand, Sybille and E. Imhof, Michael and Mumtaz,
Abdullah and Wunderlich, Hans-Joachim}, year={2012}, pages={1–4} }'
chicago: 'Cook, Alejandro, Sybille Hellebrand, Michael E. Imhof, Abdullah Mumtaz,
and Hans-Joachim Wunderlich. “Built-in Self-Diagnosis Targeting Arbitrary Defects
with Partial Pseudo-Exhaustive Test.” In 13th IEEE Latin American Test Workshop
(LATW’12), 1–4. Quito, Ecuador: IEEE, 2012. https://doi.org/10.1109/latw.2012.6261229.'
ieee: A. Cook, S. Hellebrand, M. E. Imhof, A. Mumtaz, and H.-J. Wunderlich, “Built-in
Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test,”
in 13th IEEE Latin American Test Workshop (LATW’12), 2012, pp. 1–4.
mla: Cook, Alejandro, et al. “Built-in Self-Diagnosis Targeting Arbitrary Defects
with Partial Pseudo-Exhaustive Test.” 13th IEEE Latin American Test Workshop
(LATW’12), IEEE, 2012, pp. 1–4, doi:10.1109/latw.2012.6261229.
short: 'A. Cook, S. Hellebrand, M. E. Imhof, A. Mumtaz, H.-J. Wunderlich, in: 13th
IEEE Latin American Test Workshop (LATW’12), IEEE, Quito, Ecuador, 2012, pp. 1–4.'
date_created: 2019-08-28T09:16:53Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
doi: 10.1109/latw.2012.6261229
language:
- iso: eng
page: 1-4
place: Quito, Ecuador
publication: 13th IEEE Latin American Test Workshop (LATW'12)
publisher: IEEE
status: public
title: Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive
Test
type: conference
user_id: '209'
year: '2012'
...
---
_id: '12981'
author:
- first_name: Alejandro
full_name: Cook, Alejandro
last_name: Cook
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: 'Cook A, Hellebrand S, Wunderlich H-J. Built-in Self-Diagnosis Exploiting Strong
Diagnostic Windows in Mixed-Mode Test. In: 17th IEEE European Test Symposium
(ETS’12). Annecy, France: IEEE; 2012:1-6. doi:10.1109/ets.2012.6233025'
apa: 'Cook, A., Hellebrand, S., & Wunderlich, H.-J. (2012). Built-in Self-Diagnosis
Exploiting Strong Diagnostic Windows in Mixed-Mode Test. In 17th IEEE European
Test Symposium (ETS’12) (pp. 1–6). Annecy, France: IEEE. https://doi.org/10.1109/ets.2012.6233025'
bibtex: '@inproceedings{Cook_Hellebrand_Wunderlich_2012, place={Annecy, France},
title={Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode
Test}, DOI={10.1109/ets.2012.6233025},
booktitle={17th IEEE European Test Symposium (ETS’12)}, publisher={IEEE}, author={Cook,
Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2012},
pages={1–6} }'
chicago: 'Cook, Alejandro, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Built-in
Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test.” In 17th
IEEE European Test Symposium (ETS’12), 1–6. Annecy, France: IEEE, 2012. https://doi.org/10.1109/ets.2012.6233025.'
ieee: A. Cook, S. Hellebrand, and H.-J. Wunderlich, “Built-in Self-Diagnosis Exploiting
Strong Diagnostic Windows in Mixed-Mode Test,” in 17th IEEE European Test Symposium
(ETS’12), 2012, pp. 1–6.
mla: Cook, Alejandro, et al. “Built-in Self-Diagnosis Exploiting Strong Diagnostic
Windows in Mixed-Mode Test.” 17th IEEE European Test Symposium (ETS’12),
IEEE, 2012, pp. 1–6, doi:10.1109/ets.2012.6233025.
short: 'A. Cook, S. Hellebrand, H.-J. Wunderlich, in: 17th IEEE European Test Symposium
(ETS’12), IEEE, Annecy, France, 2012, pp. 1–6.'
date_created: 2019-08-28T09:19:20Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
doi: 10.1109/ets.2012.6233025
language:
- iso: eng
page: 1-6
place: Annecy, France
publication: 17th IEEE European Test Symposium (ETS'12)
publisher: IEEE
status: public
title: Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode
Test
type: conference
user_id: '209'
year: '2012'
...
---
_id: '13074'
author:
- first_name: Alejandro
full_name: Cook, Alejandro
last_name: Cook
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: Cook A, Hellebrand S, Wunderlich H-J. Eingebaute Selbstdiagnose Mit Zufälligen
Und Deterministischen Mustern. 24. Workshop “Testmethoden und Zuverlässigkeit
von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany; 2012.
apa: Cook, A., Hellebrand, S., & Wunderlich, H.-J. (2012). Eingebaute Selbstdiagnose
mit zufälligen und deterministischen Mustern. 24. Workshop “Testmethoden und
Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany.
bibtex: '@book{Cook_Hellebrand_Wunderlich_2012, place={24. Workshop “Testmethoden
und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany},
title={Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern},
author={Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim},
year={2012} }'
chicago: Cook, Alejandro, Sybille Hellebrand, and Hans-Joachim Wunderlich. Eingebaute
Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern. 24. Workshop
“Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus,
Germany, 2012.
ieee: A. Cook, S. Hellebrand, and H.-J. Wunderlich, Eingebaute Selbstdiagnose
mit zufälligen und deterministischen Mustern. 24. Workshop “Testmethoden und
Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany, 2012.
mla: Cook, Alejandro, et al. Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen
Mustern. 2012.
short: A. Cook, S. Hellebrand, H.-J. Wunderlich, Eingebaute Selbstdiagnose Mit Zufälligen
Und Deterministischen Mustern, 24. Workshop “Testmethoden und Zuverlässigkeit
von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany, 2012.
date_created: 2019-08-28T12:02:54Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
keyword:
- WORKSHOP
language:
- iso: eng
place: 24. Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen"
(TuZ'12), Cottbus, Germany
status: public
title: Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern
type: misc
user_id: '659'
year: '2012'
...
---
_id: '12982'
author:
- first_name: Alejandro
full_name: Cook, Alejandro
last_name: Cook
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Thomas
full_name: Indlekofer, Thomas
last_name: Indlekofer
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: 'Cook A, Hellebrand S, Indlekofer T, Wunderlich H-J. Diagnostic Test of Robust
Circuits. In: 20th IEEE Asian Test Symposium (ATS’11). New Delhi, India:
IEEE; 2011:285-290. doi:10.1109/ats.2011.55'
apa: 'Cook, A., Hellebrand, S., Indlekofer, T., & Wunderlich, H.-J. (2011).
Diagnostic Test of Robust Circuits. In 20th IEEE Asian Test Symposium (ATS’11)
(pp. 285–290). New Delhi, India: IEEE. https://doi.org/10.1109/ats.2011.55'
bibtex: '@inproceedings{Cook_Hellebrand_Indlekofer_Wunderlich_2011, place={New Delhi,
India}, title={Diagnostic Test of Robust Circuits}, DOI={10.1109/ats.2011.55},
booktitle={20th IEEE Asian Test Symposium (ATS’11)}, publisher={IEEE}, author={Cook,
Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim},
year={2011}, pages={285–290} }'
chicago: 'Cook, Alejandro, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim
Wunderlich. “Diagnostic Test of Robust Circuits.” In 20th IEEE Asian Test Symposium
(ATS’11), 285–90. New Delhi, India: IEEE, 2011. https://doi.org/10.1109/ats.2011.55.'
ieee: A. Cook, S. Hellebrand, T. Indlekofer, and H.-J. Wunderlich, “Diagnostic Test
of Robust Circuits,” in 20th IEEE Asian Test Symposium (ATS’11), 2011,
pp. 285–290.
mla: Cook, Alejandro, et al. “Diagnostic Test of Robust Circuits.” 20th IEEE
Asian Test Symposium (ATS’11), IEEE, 2011, pp. 285–90, doi:10.1109/ats.2011.55.
short: 'A. Cook, S. Hellebrand, T. Indlekofer, H.-J. Wunderlich, in: 20th IEEE Asian
Test Symposium (ATS’11), IEEE, New Delhi, India, 2011, pp. 285–290.'
date_created: 2019-08-28T09:19:22Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
doi: 10.1109/ats.2011.55
language:
- iso: eng
page: 285-290
place: New Delhi, India
publication: 20th IEEE Asian Test Symposium (ATS'11)
publisher: IEEE
status: public
title: Diagnostic Test of Robust Circuits
type: conference
user_id: '209'
year: '2011'
...
---
_id: '12984'
alternative_title:
- Embedded Tutorial
author:
- first_name: Ilia
full_name: Polian, Ilia
last_name: Polian
- first_name: Bernd
full_name: Becker, Bernd
last_name: Becker
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
- first_name: Peter
full_name: Maxwell, Peter
last_name: Maxwell
citation:
ama: 'Polian I, Becker B, Hellebrand S, Wunderlich H-J, Maxwell P. Towards Variation-Aware
Test Methods. In: 16th IEEE European Test Symposium Trondheim (ETS’11).
Trondheim, Norway: IEEE; 2011. doi:10.1109/ets.2011.51'
apa: 'Polian, I., Becker, B., Hellebrand, S., Wunderlich, H.-J., & Maxwell,
P. (2011). Towards Variation-Aware Test Methods. In 16th IEEE European Test
Symposium Trondheim (ETS’11). Trondheim, Norway: IEEE. https://doi.org/10.1109/ets.2011.51'
bibtex: '@inproceedings{Polian_Becker_Hellebrand_Wunderlich_Maxwell_2011, place={Trondheim,
Norway}, title={Towards Variation-Aware Test Methods}, DOI={10.1109/ets.2011.51},
booktitle={16th IEEE European Test Symposium Trondheim (ETS’11)}, publisher={IEEE},
author={Polian, Ilia and Becker, Bernd and Hellebrand, Sybille and Wunderlich,
Hans-Joachim and Maxwell, Peter}, year={2011} }'
chicago: 'Polian, Ilia, Bernd Becker, Sybille Hellebrand, Hans-Joachim Wunderlich,
and Peter Maxwell. “Towards Variation-Aware Test Methods.” In 16th IEEE European
Test Symposium Trondheim (ETS’11). Trondheim, Norway: IEEE, 2011. https://doi.org/10.1109/ets.2011.51.'
ieee: I. Polian, B. Becker, S. Hellebrand, H.-J. Wunderlich, and P. Maxwell, “Towards
Variation-Aware Test Methods,” in 16th IEEE European Test Symposium Trondheim
(ETS’11), 2011.
mla: Polian, Ilia, et al. “Towards Variation-Aware Test Methods.” 16th IEEE European
Test Symposium Trondheim (ETS’11), IEEE, 2011, doi:10.1109/ets.2011.51.
short: 'I. Polian, B. Becker, S. Hellebrand, H.-J. Wunderlich, P. Maxwell, in: 16th
IEEE European Test Symposium Trondheim (ETS’11), IEEE, Trondheim, Norway, 2011.'
date_created: 2019-08-28T09:20:52Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
doi: 10.1109/ets.2011.51
language:
- iso: eng
place: Trondheim, Norway
publication: 16th IEEE European Test Symposium Trondheim (ETS'11)
publisher: IEEE
status: public
title: Towards Variation-Aware Test Methods
type: conference
user_id: '209'
year: '2011'
...
---
_id: '13053'
author:
- first_name: Alejandro
full_name: Cook, Alejandro
last_name: Cook
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Thomas
full_name: Indlekofer, Thomas
last_name: Indlekofer
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: 'Cook A, Hellebrand S, Indlekofer T, Wunderlich H-J. Robuster Selbsttest mit
Diagnose. In: 5. GMM/GI/ITG Fachtagung “Zuverlässigkeit Und Entwurf.” Hamburg,
Germany; 2011:48-53.'
apa: Cook, A., Hellebrand, S., Indlekofer, T., & Wunderlich, H.-J. (2011). Robuster
Selbsttest mit Diagnose. In 5. GMM/GI/ITG Fachtagung “Zuverlässigkeit und Entwurf”
(pp. 48–53). Hamburg, Germany.
bibtex: '@inproceedings{Cook_Hellebrand_Indlekofer_Wunderlich_2011, place={Hamburg,
Germany}, title={Robuster Selbsttest mit Diagnose}, booktitle={5. GMM/GI/ITG Fachtagung
“Zuverlässigkeit und Entwurf”}, author={Cook, Alejandro and Hellebrand, Sybille
and Indlekofer, Thomas and Wunderlich, Hans-Joachim}, year={2011}, pages={48–53}
}'
chicago: Cook, Alejandro, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim
Wunderlich. “Robuster Selbsttest Mit Diagnose.” In 5. GMM/GI/ITG Fachtagung
“Zuverlässigkeit Und Entwurf,” 48–53. Hamburg, Germany, 2011.
ieee: A. Cook, S. Hellebrand, T. Indlekofer, and H.-J. Wunderlich, “Robuster Selbsttest
mit Diagnose,” in 5. GMM/GI/ITG Fachtagung “Zuverlässigkeit und Entwurf,”
2011, pp. 48–53.
mla: Cook, Alejandro, et al. “Robuster Selbsttest Mit Diagnose.” 5. GMM/GI/ITG
Fachtagung “Zuverlässigkeit Und Entwurf,” 2011, pp. 48–53.
short: 'A. Cook, S. Hellebrand, T. Indlekofer, H.-J. Wunderlich, in: 5. GMM/GI/ITG
Fachtagung “Zuverlässigkeit Und Entwurf,” Hamburg, Germany, 2011, pp. 48–53.'
date_created: 2019-08-28T11:47:35Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
language:
- iso: eng
page: 48-53
place: Hamburg, Germany
publication: 5. GMM/GI/ITG Fachtagung "Zuverlässigkeit und Entwurf"
status: public
title: Robuster Selbsttest mit Diagnose
type: conference
user_id: '209'
year: '2011'
...