[{"publication":"2021 IEEE Sensors","type":"conference","status":"public","department":[{"_id":"59"},{"_id":"977"}],"user_id":"8282","_id":"59774","language":[{"iso":"eng"}],"publication_status":"published","citation":{"ieee":"D. Petrov, K. Kroschewski, I. Mwammenywa, G. M. Kagarura, and U. Hilleringmann, “Low-Cost NB-IoT Microgrid Power Quality Monitoring System,” 2021, doi: <a href=\"https://doi.org/10.1109/sensors47087.2021.9639641\">10.1109/sensors47087.2021.9639641</a>.","chicago":"Petrov, Dmitry, Konstantin Kroschewski, Ibrahim Mwammenywa, Geoffrey Mark Kagarura, and Ulrich Hilleringmann. “Low-Cost NB-IoT Microgrid Power Quality Monitoring System.” In <i>2021 IEEE Sensors</i>. IEEE, 2021. <a href=\"https://doi.org/10.1109/sensors47087.2021.9639641\">https://doi.org/10.1109/sensors47087.2021.9639641</a>.","bibtex":"@inproceedings{Petrov_Kroschewski_Mwammenywa_Kagarura_Hilleringmann_2021, title={Low-Cost NB-IoT Microgrid Power Quality Monitoring System}, DOI={<a href=\"https://doi.org/10.1109/sensors47087.2021.9639641\">10.1109/sensors47087.2021.9639641</a>}, booktitle={2021 IEEE Sensors}, publisher={IEEE}, author={Petrov, Dmitry and Kroschewski, Konstantin and Mwammenywa, Ibrahim and Kagarura, Geoffrey Mark and Hilleringmann, Ulrich}, year={2021} }","short":"D. Petrov, K. Kroschewski, I. Mwammenywa, G.M. Kagarura, U. Hilleringmann, in: 2021 IEEE Sensors, IEEE, 2021.","mla":"Petrov, Dmitry, et al. “Low-Cost NB-IoT Microgrid Power Quality Monitoring System.” <i>2021 IEEE Sensors</i>, IEEE, 2021, doi:<a href=\"https://doi.org/10.1109/sensors47087.2021.9639641\">10.1109/sensors47087.2021.9639641</a>.","apa":"Petrov, D., Kroschewski, K., Mwammenywa, I., Kagarura, G. M., &#38; Hilleringmann, U. (2021). Low-Cost NB-IoT Microgrid Power Quality Monitoring System. <i>2021 IEEE Sensors</i>. <a href=\"https://doi.org/10.1109/sensors47087.2021.9639641\">https://doi.org/10.1109/sensors47087.2021.9639641</a>","ama":"Petrov D, Kroschewski K, Mwammenywa I, Kagarura GM, Hilleringmann U. Low-Cost NB-IoT Microgrid Power Quality Monitoring System. In: <i>2021 IEEE Sensors</i>. IEEE; 2021. doi:<a href=\"https://doi.org/10.1109/sensors47087.2021.9639641\">10.1109/sensors47087.2021.9639641</a>"},"year":"2021","author":[{"first_name":"Dmitry","last_name":"Petrov","id":"8282","full_name":"Petrov, Dmitry"},{"full_name":"Kroschewski, Konstantin","last_name":"Kroschewski","first_name":"Konstantin"},{"last_name":"Mwammenywa","full_name":"Mwammenywa, Ibrahim","first_name":"Ibrahim"},{"last_name":"Kagarura","full_name":"Kagarura, Geoffrey Mark","id":"88623","first_name":"Geoffrey Mark"},{"first_name":"Ulrich","id":"20179","full_name":"Hilleringmann, Ulrich","last_name":"Hilleringmann"}],"date_created":"2025-05-02T16:01:20Z","publisher":"IEEE","date_updated":"2026-02-24T19:17:43Z","doi":"10.1109/sensors47087.2021.9639641","title":"Low-Cost NB-IoT Microgrid Power Quality Monitoring System"},{"date_created":"2021-03-18T13:43:53Z","publisher":"IEEE","title":"Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000","year":"2020","language":[{"iso":"eng"}],"keyword":["Near-Field Scanner","Near-Field to Far-Field Transformation","Directivity","Surface Equivalence Theorem","Huygens’ Box"],"publication":"2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE","abstract":[{"text":"In this publication, the near-field to far-field transformation using the self-built near-field scanner NFS3000 is examined with regard to its geometry. This device allows to measure electric and magnetic fields in small distances to the DUT (Device under Test) with high geometric precision and high sensitivity. Leading to a fast examination of EMC (Electromagnetic Compatibility) problems, because the electromagnetic properties are better understandable and therefore easier to solve than e.g. measurements in a far-field chamber. In addition, it is possible to extrapolate the near-fields into the far-field and to determine the radiation pattern of antennas and emitting objects. For this purpose, this paper deals with the basis of this transformation, the so-called surface equivalence theorem. This principle is then adapted to the measurement of near-field scanners and implemented accordingly. Due to the non-ideal design of the near-field scanner, the effects on a far-field transformation are finally presented and discussed.","lang":"eng"}],"author":[{"first_name":"Sven","full_name":"Lange, Sven","id":"38240","last_name":"Lange"},{"first_name":"Dominik","last_name":"Schroder","full_name":"Schroder, Dominik"},{"last_name":"Hedayat","full_name":"Hedayat, Christian","first_name":"Christian"},{"first_name":"Christian","full_name":"Hangmann, Christian","last_name":"Hangmann"},{"first_name":"Thomas","last_name":"Otto","full_name":"Otto, Thomas"},{"full_name":"Hilleringmann, Ulrich","last_name":"Hilleringmann","first_name":"Ulrich"}],"date_updated":"2022-01-06T06:55:03Z","conference":{"start_date":"2020-09-23","name":"2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE","location":"Rome, Italy ","end_date":"2020-09-25"},"doi":"10.1109/emceurope48519.2020.9245697","main_file_link":[{"url":"https://ieeexplore.ieee.org/document/9245697"}],"related_material":{"record":[{"status":"public","id":"21541","relation":"original"}]},"publication_identifier":{"eisbn":["978-1-7281-5579-1"],"isbn":["978-1-7281-5580-7"],"issn":["2325-0364 "]},"publication_status":"published","citation":{"ama":"Lange S, Schroder D, Hedayat C, Hangmann C, Otto T, Hilleringmann U. Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000. In: <i>2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE</i>. IEEE; 2020. doi:<a href=\"https://doi.org/10.1109/emceurope48519.2020.9245697\">10.1109/emceurope48519.2020.9245697</a>","chicago":"Lange, Sven, Dominik Schroder, Christian Hedayat, Christian Hangmann, Thomas Otto, and Ulrich Hilleringmann. “Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000.” In <i>2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE</i>. IEEE, 2020. <a href=\"https://doi.org/10.1109/emceurope48519.2020.9245697\">https://doi.org/10.1109/emceurope48519.2020.9245697</a>.","ieee":"S. Lange, D. Schroder, C. Hedayat, C. Hangmann, T. Otto, and U. Hilleringmann, “Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000,” in <i>2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE</i>, Rome, Italy , 2020.","apa":"Lange, S., Schroder, D., Hedayat, C., Hangmann, C., Otto, T., &#38; Hilleringmann, U. (2020). Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000. In <i>2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE</i>. Rome, Italy : IEEE. <a href=\"https://doi.org/10.1109/emceurope48519.2020.9245697\">https://doi.org/10.1109/emceurope48519.2020.9245697</a>","short":"S. Lange, D. Schroder, C. Hedayat, C. Hangmann, T. Otto, U. Hilleringmann, in: 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, IEEE, 2020.","bibtex":"@inproceedings{Lange_Schroder_Hedayat_Hangmann_Otto_Hilleringmann_2020, title={Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000}, DOI={<a href=\"https://doi.org/10.1109/emceurope48519.2020.9245697\">10.1109/emceurope48519.2020.9245697</a>}, booktitle={2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE}, publisher={IEEE}, author={Lange, Sven and Schroder, Dominik and Hedayat, Christian and Hangmann, Christian and Otto, Thomas and Hilleringmann, Ulrich}, year={2020} }","mla":"Lange, Sven, et al. “Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000.” <i>2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE</i>, IEEE, 2020, doi:<a href=\"https://doi.org/10.1109/emceurope48519.2020.9245697\">10.1109/emceurope48519.2020.9245697</a>."},"department":[{"_id":"59"},{"_id":"485"}],"user_id":"38240","_id":"21541","project":[{"name":"Computing Resources Provided by the Paderborn Center for Parallel Computing","_id":"52"}],"type":"conference","status":"public"},{"department":[{"_id":"59"}],"user_id":"20179","_id":"39404","language":[{"iso":"eng"}],"publication":"2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE","type":"conference","status":"public","author":[{"full_name":"Lange, Sven","last_name":"Lange","first_name":"Sven"},{"full_name":"Schroder, Dominik","last_name":"Schroder","first_name":"Dominik"},{"last_name":"Hedayat","full_name":"Hedayat, Christian","first_name":"Christian"},{"first_name":"Christian","full_name":"Hangmann, Christian","last_name":"Hangmann"},{"first_name":"Thomas","full_name":"Otto, Thomas","last_name":"Otto"},{"id":"20179","full_name":"Hilleringmann, Ulrich","last_name":"Hilleringmann","first_name":"Ulrich"}],"date_created":"2023-01-24T10:21:48Z","date_updated":"2023-03-21T10:00:58Z","publisher":"IEEE","doi":"10.1109/emceurope48519.2020.9245697","title":"Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000","publication_status":"published","citation":{"apa":"Lange, S., Schroder, D., Hedayat, C., Hangmann, C., Otto, T., &#38; Hilleringmann, U. (2020). Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000. <i>2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE</i>. <a href=\"https://doi.org/10.1109/emceurope48519.2020.9245697\">https://doi.org/10.1109/emceurope48519.2020.9245697</a>","bibtex":"@inproceedings{Lange_Schroder_Hedayat_Hangmann_Otto_Hilleringmann_2020, title={Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000}, DOI={<a href=\"https://doi.org/10.1109/emceurope48519.2020.9245697\">10.1109/emceurope48519.2020.9245697</a>}, booktitle={2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE}, publisher={IEEE}, author={Lange, Sven and Schroder, Dominik and Hedayat, Christian and Hangmann, Christian and Otto, Thomas and Hilleringmann, Ulrich}, year={2020} }","short":"S. Lange, D. Schroder, C. Hedayat, C. Hangmann, T. Otto, U. Hilleringmann, in: 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, IEEE, 2020.","mla":"Lange, Sven, et al. “Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000.” <i>2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE</i>, IEEE, 2020, doi:<a href=\"https://doi.org/10.1109/emceurope48519.2020.9245697\">10.1109/emceurope48519.2020.9245697</a>.","chicago":"Lange, Sven, Dominik Schroder, Christian Hedayat, Christian Hangmann, Thomas Otto, and Ulrich Hilleringmann. “Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000.” In <i>2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE</i>. IEEE, 2020. <a href=\"https://doi.org/10.1109/emceurope48519.2020.9245697\">https://doi.org/10.1109/emceurope48519.2020.9245697</a>.","ieee":"S. Lange, D. Schroder, C. Hedayat, C. Hangmann, T. Otto, and U. Hilleringmann, “Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000,” 2020, doi: <a href=\"https://doi.org/10.1109/emceurope48519.2020.9245697\">10.1109/emceurope48519.2020.9245697</a>.","ama":"Lange S, Schroder D, Hedayat C, Hangmann C, Otto T, Hilleringmann U. Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000. In: <i>2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE</i>. IEEE; 2020. doi:<a href=\"https://doi.org/10.1109/emceurope48519.2020.9245697\">10.1109/emceurope48519.2020.9245697</a>"},"year":"2020"},{"language":[{"iso":"eng"}],"_id":"39897","user_id":"20179","department":[{"_id":"59"}],"status":"public","type":"conference","title":"27th European Solid-State Device Research Conference","doi":"10.1109/essderc.1997","publisher":"IEEE","date_updated":"2023-03-21T10:15:54Z","date_created":"2023-01-25T09:17:41Z","author":[{"last_name":"Hilleringmann","full_name":"Hilleringmann, Ulrich","id":"20179","first_name":"Ulrich"}],"year":"2020","citation":{"apa":"Hilleringmann, U. (2020). <i>27th European Solid-State Device Research Conference</i>. <a href=\"https://doi.org/10.1109/essderc.1997\">https://doi.org/10.1109/essderc.1997</a>","short":"U. Hilleringmann, in: IEEE, 2020.","bibtex":"@inproceedings{Hilleringmann_2020, title={27th European Solid-State Device Research Conference}, DOI={<a href=\"https://doi.org/10.1109/essderc.1997\">10.1109/essderc.1997</a>}, publisher={IEEE}, author={Hilleringmann, Ulrich}, year={2020} }","mla":"Hilleringmann, Ulrich. <i>27th European Solid-State Device Research Conference</i>. IEEE, 2020, doi:<a href=\"https://doi.org/10.1109/essderc.1997\">10.1109/essderc.1997</a>.","ama":"Hilleringmann U. 27th European Solid-State Device Research Conference. In: IEEE; 2020. doi:<a href=\"https://doi.org/10.1109/essderc.1997\">10.1109/essderc.1997</a>","chicago":"Hilleringmann, Ulrich. “27th European Solid-State Device Research Conference.” IEEE, 2020. <a href=\"https://doi.org/10.1109/essderc.1997\">https://doi.org/10.1109/essderc.1997</a>.","ieee":"U. Hilleringmann, “27th European Solid-State Device Research Conference,” 2020, doi: <a href=\"https://doi.org/10.1109/essderc.1997\">10.1109/essderc.1997</a>."},"publication_status":"published","publication_identifier":{"isbn":["2863322214"]}},{"_id":"39413","department":[{"_id":"59"}],"user_id":"20179","language":[{"iso":"eng"}],"publication":"2019 17th IEEE International New Circuits and Systems Conference (NEWCAS)","type":"conference","status":"public","date_updated":"2023-03-22T10:17:42Z","publisher":"IEEE","date_created":"2023-01-24T10:29:16Z","author":[{"last_name":"Hangmann","full_name":"Hangmann, Christian","first_name":"Christian"},{"last_name":"Hedayat","full_name":"Hedayat, Christian","first_name":"Christian"},{"last_name":"Hilleringmann","full_name":"Hilleringmann, Ulrich","id":"20179","first_name":"Ulrich"}],"title":"Designing Mixed-Signal PLLs regarding Multiple Requirements taking Non-Ideal Effects into Account","doi":"10.1109/newcas44328.2019.8961261","publication_status":"published","year":"2020","citation":{"ieee":"C. Hangmann, C. Hedayat, and U. Hilleringmann, “Designing Mixed-Signal PLLs regarding Multiple Requirements taking Non-Ideal Effects into Account,” 2020, doi: <a href=\"https://doi.org/10.1109/newcas44328.2019.8961261\">10.1109/newcas44328.2019.8961261</a>.","chicago":"Hangmann, Christian, Christian Hedayat, and Ulrich Hilleringmann. “Designing Mixed-Signal PLLs Regarding Multiple Requirements Taking Non-Ideal Effects into Account.” In <i>2019 17th IEEE International New Circuits and Systems Conference (NEWCAS)</i>. IEEE, 2020. <a href=\"https://doi.org/10.1109/newcas44328.2019.8961261\">https://doi.org/10.1109/newcas44328.2019.8961261</a>.","ama":"Hangmann C, Hedayat C, Hilleringmann U. Designing Mixed-Signal PLLs regarding Multiple Requirements taking Non-Ideal Effects into Account. In: <i>2019 17th IEEE International New Circuits and Systems Conference (NEWCAS)</i>. IEEE; 2020. doi:<a href=\"https://doi.org/10.1109/newcas44328.2019.8961261\">10.1109/newcas44328.2019.8961261</a>","mla":"Hangmann, Christian, et al. “Designing Mixed-Signal PLLs Regarding Multiple Requirements Taking Non-Ideal Effects into Account.” <i>2019 17th IEEE International New Circuits and Systems Conference (NEWCAS)</i>, IEEE, 2020, doi:<a href=\"https://doi.org/10.1109/newcas44328.2019.8961261\">10.1109/newcas44328.2019.8961261</a>.","short":"C. Hangmann, C. Hedayat, U. Hilleringmann, in: 2019 17th IEEE International New Circuits and Systems Conference (NEWCAS), IEEE, 2020.","bibtex":"@inproceedings{Hangmann_Hedayat_Hilleringmann_2020, title={Designing Mixed-Signal PLLs regarding Multiple Requirements taking Non-Ideal Effects into Account}, DOI={<a href=\"https://doi.org/10.1109/newcas44328.2019.8961261\">10.1109/newcas44328.2019.8961261</a>}, booktitle={2019 17th IEEE International New Circuits and Systems Conference (NEWCAS)}, publisher={IEEE}, author={Hangmann, Christian and Hedayat, Christian and Hilleringmann, Ulrich}, year={2020} }","apa":"Hangmann, C., Hedayat, C., &#38; Hilleringmann, U. (2020). Designing Mixed-Signal PLLs regarding Multiple Requirements taking Non-Ideal Effects into Account. <i>2019 17th IEEE International New Circuits and Systems Conference (NEWCAS)</i>. <a href=\"https://doi.org/10.1109/newcas44328.2019.8961261\">https://doi.org/10.1109/newcas44328.2019.8961261</a>"}},{"language":[{"iso":"eng"}],"_id":"39410","department":[{"_id":"59"}],"user_id":"20179","status":"public","publication":"2019 17th IEEE International New Circuits and Systems Conference (NEWCAS)","type":"conference","title":"Inductive Locating Method to Locate Miniaturized Wireless Sensors within Inhomogeneous Dielectrics","doi":"10.1109/newcas44328.2019.8961227","publisher":"IEEE","date_updated":"2023-03-23T08:11:10Z","author":[{"full_name":"Lange, Sven","last_name":"Lange","first_name":"Sven"},{"first_name":"Dominik","full_name":"Schroder, Dominik","last_name":"Schroder"},{"first_name":"Christian","last_name":"Hedayat","full_name":"Hedayat, Christian"},{"full_name":"Otto, Thomas","last_name":"Otto","first_name":"Thomas"},{"first_name":"Ulrich","full_name":"Hilleringmann, Ulrich","id":"20179","last_name":"Hilleringmann"}],"date_created":"2023-01-24T10:28:20Z","year":"2020","citation":{"apa":"Lange, S., Schroder, D., Hedayat, C., Otto, T., &#38; Hilleringmann, U. (2020). Inductive Locating Method to Locate Miniaturized Wireless Sensors within Inhomogeneous Dielectrics. <i>2019 17th IEEE International New Circuits and Systems Conference (NEWCAS)</i>. <a href=\"https://doi.org/10.1109/newcas44328.2019.8961227\">https://doi.org/10.1109/newcas44328.2019.8961227</a>","bibtex":"@inproceedings{Lange_Schroder_Hedayat_Otto_Hilleringmann_2020, title={Inductive Locating Method to Locate Miniaturized Wireless Sensors within Inhomogeneous Dielectrics}, DOI={<a href=\"https://doi.org/10.1109/newcas44328.2019.8961227\">10.1109/newcas44328.2019.8961227</a>}, booktitle={2019 17th IEEE International New Circuits and Systems Conference (NEWCAS)}, publisher={IEEE}, author={Lange, Sven and Schroder, Dominik and Hedayat, Christian and Otto, Thomas and Hilleringmann, Ulrich}, year={2020} }","short":"S. Lange, D. Schroder, C. Hedayat, T. Otto, U. Hilleringmann, in: 2019 17th IEEE International New Circuits and Systems Conference (NEWCAS), IEEE, 2020.","mla":"Lange, Sven, et al. “Inductive Locating Method to Locate Miniaturized Wireless Sensors within Inhomogeneous Dielectrics.” <i>2019 17th IEEE International New Circuits and Systems Conference (NEWCAS)</i>, IEEE, 2020, doi:<a href=\"https://doi.org/10.1109/newcas44328.2019.8961227\">10.1109/newcas44328.2019.8961227</a>.","ama":"Lange S, Schroder D, Hedayat C, Otto T, Hilleringmann U. Inductive Locating Method to Locate Miniaturized Wireless Sensors within Inhomogeneous Dielectrics. In: <i>2019 17th IEEE International New Circuits and Systems Conference (NEWCAS)</i>. IEEE; 2020. doi:<a href=\"https://doi.org/10.1109/newcas44328.2019.8961227\">10.1109/newcas44328.2019.8961227</a>","chicago":"Lange, Sven, Dominik Schroder, Christian Hedayat, Thomas Otto, and Ulrich Hilleringmann. “Inductive Locating Method to Locate Miniaturized Wireless Sensors within Inhomogeneous Dielectrics.” In <i>2019 17th IEEE International New Circuits and Systems Conference (NEWCAS)</i>. IEEE, 2020. <a href=\"https://doi.org/10.1109/newcas44328.2019.8961227\">https://doi.org/10.1109/newcas44328.2019.8961227</a>.","ieee":"S. Lange, D. Schroder, C. Hedayat, T. Otto, and U. Hilleringmann, “Inductive Locating Method to Locate Miniaturized Wireless Sensors within Inhomogeneous Dielectrics,” 2020, doi: <a href=\"https://doi.org/10.1109/newcas44328.2019.8961227\">10.1109/newcas44328.2019.8961227</a>."},"publication_status":"published"},{"publication_status":"published","year":"2020","citation":{"ieee":"D. Petrov and U. Hilleringmann, “Water-based primary cell for powering of wireless sensors,” 2020, doi: <a href=\"https://doi.org/10.1109/sensors47125.2020.9278891\">10.1109/sensors47125.2020.9278891</a>.","chicago":"Petrov, Dmitry, and Ulrich Hilleringmann. “Water-Based Primary Cell for Powering of Wireless Sensors.” In <i>2020 IEEE SENSORS</i>. IEEE, 2020. <a href=\"https://doi.org/10.1109/sensors47125.2020.9278891\">https://doi.org/10.1109/sensors47125.2020.9278891</a>.","ama":"Petrov D, Hilleringmann U. Water-based primary cell for powering of wireless sensors. In: <i>2020 IEEE SENSORS</i>. IEEE; 2020. doi:<a href=\"https://doi.org/10.1109/sensors47125.2020.9278891\">10.1109/sensors47125.2020.9278891</a>","apa":"Petrov, D., &#38; Hilleringmann, U. (2020). Water-based primary cell for powering of wireless sensors. <i>2020 IEEE SENSORS</i>. <a href=\"https://doi.org/10.1109/sensors47125.2020.9278891\">https://doi.org/10.1109/sensors47125.2020.9278891</a>","bibtex":"@inproceedings{Petrov_Hilleringmann_2020, title={Water-based primary cell for powering of wireless sensors}, DOI={<a href=\"https://doi.org/10.1109/sensors47125.2020.9278891\">10.1109/sensors47125.2020.9278891</a>}, booktitle={2020 IEEE SENSORS}, publisher={IEEE}, author={Petrov, Dmitry and Hilleringmann, Ulrich}, year={2020} }","mla":"Petrov, Dmitry, and Ulrich Hilleringmann. “Water-Based Primary Cell for Powering of Wireless Sensors.” <i>2020 IEEE SENSORS</i>, IEEE, 2020, doi:<a href=\"https://doi.org/10.1109/sensors47125.2020.9278891\">10.1109/sensors47125.2020.9278891</a>.","short":"D. Petrov, U. Hilleringmann, in: 2020 IEEE SENSORS, IEEE, 2020."},"publisher":"IEEE","date_updated":"2026-02-24T19:12:28Z","date_created":"2023-01-24T10:22:29Z","author":[{"full_name":"Petrov, Dmitry","id":"8282","last_name":"Petrov","first_name":"Dmitry"},{"first_name":"Ulrich","id":"20179","full_name":"Hilleringmann, Ulrich","last_name":"Hilleringmann"}],"title":"Water-based primary cell for powering of wireless sensors","doi":"10.1109/sensors47125.2020.9278891","type":"conference","publication":"2020 IEEE SENSORS","status":"public","_id":"39405","user_id":"8282","department":[{"_id":"59"},{"_id":"977"}],"language":[{"iso":"eng"}]},{"publication_identifier":{"isbn":["9781728110318"]},"publication_status":"published","related_material":{"record":[{"id":"21524","relation":"earlier_version","status":"public"}]},"year":"2019","citation":{"ama":"Lange S, Schröder D, Hedayat C, Otto T, Hilleringmann U. Inductive Locating Method to Locate Miniaturized Wireless Sensors within Inhomogeneous Dielectrics. In: <i>2019 17th IEEE International New Circuits and Systems Conference (NEWCAS)</i>. ; 2019. doi:<a href=\"https://doi.org/10.1109/newcas44328.2019.8961227\">10.1109/newcas44328.2019.8961227</a>","chicago":"Lange, Sven, Dominik Schröder, Christian Hedayat, Thomas Otto, and Ulrich Hilleringmann. “Inductive Locating Method to Locate Miniaturized Wireless Sensors within Inhomogeneous Dielectrics.” In <i>2019 17th IEEE International New Circuits and Systems Conference (NEWCAS)</i>, 2019. <a href=\"https://doi.org/10.1109/newcas44328.2019.8961227\">https://doi.org/10.1109/newcas44328.2019.8961227</a>.","ieee":"S. Lange, D. Schröder, C. Hedayat, T. Otto, and U. Hilleringmann, “Inductive Locating Method to Locate Miniaturized Wireless Sensors within Inhomogeneous Dielectrics,” in <i>2019 17th IEEE International New Circuits and Systems Conference (NEWCAS)</i>, Munich, Germany, 2019.","apa":"Lange, S., Schröder, D., Hedayat, C., Otto, T., &#38; Hilleringmann, U. (2019). Inductive Locating Method to Locate Miniaturized Wireless Sensors within Inhomogeneous Dielectrics. In <i>2019 17th IEEE International New Circuits and Systems Conference (NEWCAS)</i>. Munich, Germany. <a href=\"https://doi.org/10.1109/newcas44328.2019.8961227\">https://doi.org/10.1109/newcas44328.2019.8961227</a>","short":"S. Lange, D. Schröder, C. Hedayat, T. Otto, U. Hilleringmann, in: 2019 17th IEEE International New Circuits and Systems Conference (NEWCAS), 2019.","bibtex":"@inproceedings{Lange_Schröder_Hedayat_Otto_Hilleringmann_2019, title={Inductive Locating Method to Locate Miniaturized Wireless Sensors within Inhomogeneous Dielectrics}, DOI={<a href=\"https://doi.org/10.1109/newcas44328.2019.8961227\">10.1109/newcas44328.2019.8961227</a>}, booktitle={2019 17th IEEE International New Circuits and Systems Conference (NEWCAS)}, author={Lange, Sven and Schröder, Dominik and Hedayat, Christian and Otto, Thomas and Hilleringmann, Ulrich}, year={2019} }","mla":"Lange, Sven, et al. “Inductive Locating Method to Locate Miniaturized Wireless Sensors within Inhomogeneous Dielectrics.” <i>2019 17th IEEE International New Circuits and Systems Conference (NEWCAS)</i>, 2019, doi:<a href=\"https://doi.org/10.1109/newcas44328.2019.8961227\">10.1109/newcas44328.2019.8961227</a>."},"date_updated":"2022-01-06T06:55:03Z","date_created":"2021-03-17T09:52:41Z","author":[{"first_name":"Sven","full_name":"Lange, Sven","id":"38240","last_name":"Lange"},{"first_name":"Dominik","full_name":"Schröder, Dominik","last_name":"Schröder"},{"first_name":"Christian","full_name":"Hedayat, Christian","last_name":"Hedayat"},{"first_name":"Thomas","last_name":"Otto","full_name":"Otto, Thomas"},{"first_name":"Ulrich","last_name":"Hilleringmann","full_name":"Hilleringmann, Ulrich"}],"title":"Inductive Locating Method to Locate Miniaturized Wireless Sensors within Inhomogeneous Dielectrics","doi":"10.1109/newcas44328.2019.8961227","conference":{"end_date":"2019-06-26","location":"Munich, Germany","name":"2019 17th IEEE International New Circuits and Systems Conference (NEWCAS)","start_date":"2019-06-23"},"main_file_link":[{"url":"https://ieeexplore.ieee.org/document/8961227"}],"publication":"2019 17th IEEE International New Circuits and Systems Conference (NEWCAS)","type":"conference","abstract":[{"lang":"eng","text":"For the measurement of process data in bioreactors, very small wireless sensors are currently under development to replace the conventional rod probes. The so-called Sens-o-Spheres measure the temperature and in future the oxygen content and the pH of fluids. In order to evaluate the distribution of the measured values within the process, it is necessary to locate the wireless sensors. Because of the small size of the sphere (diameter 8 mm), inhomogeneous ambient media and the size of the reactor (less than 2 m), an inductive locating by magnetic fields with a frequency of f = 13.56 MHz is necessary. Since the behaviour of the magnetic field is very different from that of the electromagnetic wave, new locating methods are required, which are presented in this paper."}],"status":"public","_id":"21524","project":[{"name":"Computing Resources Provided by the Paderborn Center for Parallel Computing","_id":"52"}],"department":[{"_id":"59"},{"_id":"485"}],"user_id":"38240","keyword":["oxygen content","inhomogeneous ambient media","magnetic field","inductive locating method","miniaturized wireless sensors","inhomogeneous dielectrics","conventional rod probes","Sens-o-Spheres measure","frequency 13.56 MHz"],"language":[{"iso":"eng"}]},{"language":[{"iso":"eng"}],"_id":"39409","department":[{"_id":"59"}],"user_id":"20179","editor":[{"first_name":"Monuko","last_name":"du Plessis","full_name":"du Plessis, Monuko"}],"status":"public","publication":"Fifth Conference on Sensors, MEMS, and Electro-Optic Systems","type":"conference","title":"Self-aligned organic thin-film transistors for flexible electronics","doi":"10.1117/12.2500673","publisher":"SPIE","date_updated":"2023-03-21T10:01:31Z","author":[{"first_name":"Thorsten","last_name":"Meyers","full_name":"Meyers, Thorsten"},{"first_name":"Julia","full_name":"Reker, Julia","last_name":"Reker"},{"full_name":"Temme, Julian","last_name":"Temme","first_name":"Julian"},{"first_name":"Fábio F.","full_name":"Vidor, Fábio F.","last_name":"Vidor"},{"id":"20179","full_name":"Hilleringmann, Ulrich","last_name":"Hilleringmann","first_name":"Ulrich"}],"date_created":"2023-01-24T10:27:33Z","year":"2019","citation":{"ama":"Meyers T, Reker J, Temme J, Vidor FF, Hilleringmann U. Self-aligned organic thin-film transistors for flexible electronics. In: du Plessis M, ed. <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>. SPIE; 2019. doi:<a href=\"https://doi.org/10.1117/12.2500673\">10.1117/12.2500673</a>","chicago":"Meyers, Thorsten, Julia Reker, Julian Temme, Fábio F. Vidor, and Ulrich Hilleringmann. “Self-Aligned Organic Thin-Film Transistors for Flexible Electronics.” In <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>, edited by Monuko du Plessis. SPIE, 2019. <a href=\"https://doi.org/10.1117/12.2500673\">https://doi.org/10.1117/12.2500673</a>.","ieee":"T. Meyers, J. Reker, J. Temme, F. F. Vidor, and U. Hilleringmann, “Self-aligned organic thin-film transistors for flexible electronics,” in <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>, 2019, doi: <a href=\"https://doi.org/10.1117/12.2500673\">10.1117/12.2500673</a>.","apa":"Meyers, T., Reker, J., Temme, J., Vidor, F. F., &#38; Hilleringmann, U. (2019). Self-aligned organic thin-film transistors for flexible electronics. In M. du Plessis (Ed.), <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>. SPIE. <a href=\"https://doi.org/10.1117/12.2500673\">https://doi.org/10.1117/12.2500673</a>","bibtex":"@inproceedings{Meyers_Reker_Temme_Vidor_Hilleringmann_2019, title={Self-aligned organic thin-film transistors for flexible electronics}, DOI={<a href=\"https://doi.org/10.1117/12.2500673\">10.1117/12.2500673</a>}, booktitle={Fifth Conference on Sensors, MEMS, and Electro-Optic Systems}, publisher={SPIE}, author={Meyers, Thorsten and Reker, Julia and Temme, Julian and Vidor, Fábio F. and Hilleringmann, Ulrich}, editor={du Plessis, Monuko}, year={2019} }","mla":"Meyers, Thorsten, et al. “Self-Aligned Organic Thin-Film Transistors for Flexible Electronics.” <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>, edited by Monuko du Plessis, SPIE, 2019, doi:<a href=\"https://doi.org/10.1117/12.2500673\">10.1117/12.2500673</a>.","short":"T. Meyers, J. Reker, J. Temme, F.F. Vidor, U. Hilleringmann, in: M. du Plessis (Ed.), Fifth Conference on Sensors, MEMS, and Electro-Optic Systems, SPIE, 2019."},"publication_status":"published"},{"citation":{"apa":"Reker, J., Meyers, T., Vidor, F. F., &#38; Hilleringmann, U. (2019). Inorganic p-channel thin-film transistors using CuO nanoparticles. In M. du Plessis (Ed.), <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>. SPIE. <a href=\"https://doi.org/10.1117/12.2500644\">https://doi.org/10.1117/12.2500644</a>","mla":"Reker, Julia, et al. “Inorganic P-Channel Thin-Film Transistors Using CuO Nanoparticles.” <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>, edited by Monuko du Plessis, SPIE, 2019, doi:<a href=\"https://doi.org/10.1117/12.2500644\">10.1117/12.2500644</a>.","bibtex":"@inproceedings{Reker_Meyers_Vidor_Hilleringmann_2019, title={Inorganic p-channel thin-film transistors using CuO nanoparticles}, DOI={<a href=\"https://doi.org/10.1117/12.2500644\">10.1117/12.2500644</a>}, booktitle={Fifth Conference on Sensors, MEMS, and Electro-Optic Systems}, publisher={SPIE}, author={Reker, Julia and Meyers, Thorsten and Vidor, Fábio  F. and Hilleringmann, Ulrich}, editor={du Plessis, Monuko}, year={2019} }","short":"J. Reker, T. Meyers, F.F. Vidor, U. Hilleringmann, in: M. du Plessis (Ed.), Fifth Conference on Sensors, MEMS, and Electro-Optic Systems, SPIE, 2019.","ama":"Reker J, Meyers T, Vidor FF, Hilleringmann U. Inorganic p-channel thin-film transistors using CuO nanoparticles. In: du Plessis M, ed. <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>. SPIE; 2019. doi:<a href=\"https://doi.org/10.1117/12.2500644\">10.1117/12.2500644</a>","chicago":"Reker, Julia, Thorsten Meyers, Fábio  F. Vidor, and Ulrich Hilleringmann. “Inorganic P-Channel Thin-Film Transistors Using CuO Nanoparticles.” In <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>, edited by Monuko du Plessis. SPIE, 2019. <a href=\"https://doi.org/10.1117/12.2500644\">https://doi.org/10.1117/12.2500644</a>.","ieee":"J. Reker, T. Meyers, F. F. Vidor, and U. Hilleringmann, “Inorganic p-channel thin-film transistors using CuO nanoparticles,” in <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>, 2019, doi: <a href=\"https://doi.org/10.1117/12.2500644\">10.1117/12.2500644</a>."},"year":"2019","publication_status":"published","doi":"10.1117/12.2500644","title":"Inorganic p-channel thin-film transistors using CuO nanoparticles","author":[{"last_name":"Reker","full_name":"Reker, Julia","first_name":"Julia"},{"last_name":"Meyers","full_name":"Meyers, Thorsten","first_name":"Thorsten"},{"first_name":"Fábio  F.","full_name":"Vidor, Fábio  F.","last_name":"Vidor"},{"last_name":"Hilleringmann","id":"20179","full_name":"Hilleringmann, Ulrich","first_name":"Ulrich"}],"date_created":"2023-01-24T10:26:31Z","publisher":"SPIE","date_updated":"2023-03-21T10:01:17Z","status":"public","editor":[{"full_name":"du Plessis, Monuko","last_name":"du Plessis","first_name":"Monuko"}],"type":"conference","publication":"Fifth Conference on Sensors, MEMS, and Electro-Optic Systems","language":[{"iso":"eng"}],"user_id":"20179","department":[{"_id":"59"}],"_id":"39408"},{"department":[{"_id":"59"}],"user_id":"20179","_id":"39415","language":[{"iso":"eng"}],"publication":"Fifth Conference on Sensors, MEMS, and Electro-Optic Systems","type":"conference","status":"public","editor":[{"full_name":"du Plessis, Monuko","last_name":"du Plessis","first_name":"Monuko"}],"date_created":"2023-01-24T10:31:19Z","author":[{"first_name":"Ulrich","id":"20179","full_name":"Hilleringmann, Ulrich","last_name":"Hilleringmann"},{"last_name":"Reker","full_name":"Reker, Julia","first_name":"Julia"},{"full_name":"Vidor, Fábio F.","last_name":"Vidor","first_name":"Fábio F."},{"first_name":"Thorsten","last_name":"Meyers","full_name":"Meyers, Thorsten"},{"full_name":"Joubert, Trudi  H.","last_name":"Joubert","first_name":"Trudi  H."},{"first_name":"Petroné","last_name":"Bezuidenhout","full_name":"Bezuidenhout, Petroné"}],"date_updated":"2023-03-22T10:17:26Z","publisher":"SPIE","doi":"10.1117/12.2500218","title":"Nanoparticles and organic semiconductors for flexible electronics","publication_status":"published","citation":{"ieee":"U. Hilleringmann, J. Reker, F. F. Vidor, T. Meyers, T. H. Joubert, and P. Bezuidenhout, “Nanoparticles and organic semiconductors for flexible electronics,” in <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>, 2019, doi: <a href=\"https://doi.org/10.1117/12.2500218\">10.1117/12.2500218</a>.","chicago":"Hilleringmann, Ulrich, Julia Reker, Fábio F. Vidor, Thorsten Meyers, Trudi  H. Joubert, and Petroné Bezuidenhout. “Nanoparticles and Organic Semiconductors for Flexible Electronics.” In <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>, edited by Monuko du Plessis. SPIE, 2019. <a href=\"https://doi.org/10.1117/12.2500218\">https://doi.org/10.1117/12.2500218</a>.","ama":"Hilleringmann U, Reker J, Vidor FF, Meyers T, Joubert TH, Bezuidenhout P. Nanoparticles and organic semiconductors for flexible electronics. In: du Plessis M, ed. <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>. SPIE; 2019. doi:<a href=\"https://doi.org/10.1117/12.2500218\">10.1117/12.2500218</a>","bibtex":"@inproceedings{Hilleringmann_Reker_Vidor_Meyers_Joubert_Bezuidenhout_2019, title={Nanoparticles and organic semiconductors for flexible electronics}, DOI={<a href=\"https://doi.org/10.1117/12.2500218\">10.1117/12.2500218</a>}, booktitle={Fifth Conference on Sensors, MEMS, and Electro-Optic Systems}, publisher={SPIE}, author={Hilleringmann, Ulrich and Reker, Julia and Vidor, Fábio F. and Meyers, Thorsten and Joubert, Trudi  H. and Bezuidenhout, Petroné}, editor={du Plessis, Monuko}, year={2019} }","short":"U. Hilleringmann, J. Reker, F.F. Vidor, T. Meyers, T.H. Joubert, P. 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Vidor, Joachim Vollbrecht, Heinz Kitzerow, Jan Paradies, and Ulrich Hilleringmann. “Improved Organic Thin-Film Transistor Performance by Dielectric Layer Patterning.” In <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>, edited by Monuko du Plessis. SPIE, 2019. <a href=\"https://doi.org/10.1117/12.2500286\">https://doi.org/10.1117/12.2500286</a>.","ieee":"J. Temme <i>et al.</i>, “Improved organic thin-film transistor performance by dielectric layer patterning,” in <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>, 2019, doi: <a href=\"https://doi.org/10.1117/12.2500286\">10.1117/12.2500286</a>.","ama":"Temme J, Meyers T, Reker J, et al. Improved organic thin-film transistor performance by dielectric layer patterning. In: du Plessis M, ed. <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>. SPIE; 2019. doi:<a href=\"https://doi.org/10.1117/12.2500286\">10.1117/12.2500286</a>","apa":"Temme, J., Meyers, T., Reker, J., Vidor, F. F., Vollbrecht, J., Kitzerow, H., Paradies, J., &#38; Hilleringmann, U. (2019). Improved organic thin-film transistor performance by dielectric layer patterning. In M. du Plessis (Ed.), <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>. 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Reker, F.F. Vidor, J. Vollbrecht, H. Kitzerow, J. Paradies, U. 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F., Meyers, T., Reker, J., Müller, K., Wirth, G. I., &#38; Hilleringmann, U. (2019). Mechanical deformation on nanoparticle-based thin-film transistors. In M. du Plessis (Ed.), <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>. SPIE. <a href=\"https://doi.org/10.1117/12.2502393\">https://doi.org/10.1117/12.2502393</a>","mla":"Vidor, Fabio Fedrizzi, et al. “Mechanical Deformation on Nanoparticle-Based Thin-Film Transistors.” <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>, edited by Monuko du Plessis, SPIE, 2019, doi:<a href=\"https://doi.org/10.1117/12.2502393\">10.1117/12.2502393</a>.","short":"F.F. Vidor, T. Meyers, J. Reker, K. Müller, G.I. Wirth, U. Hilleringmann, in: M. du Plessis (Ed.), Fifth Conference on Sensors, MEMS, and Electro-Optic Systems, SPIE, 2019.","bibtex":"@inproceedings{Vidor_Meyers_Reker_Müller_Wirth_Hilleringmann_2019, title={Mechanical deformation on nanoparticle-based thin-film transistors}, DOI={<a href=\"https://doi.org/10.1117/12.2502393\">10.1117/12.2502393</a>}, booktitle={Fifth Conference on Sensors, MEMS, and Electro-Optic Systems}, publisher={SPIE}, author={Vidor, Fabio Fedrizzi and Meyers, Thorsten and Reker, Julia and Müller, Kathrin and Wirth, Gilson I. and Hilleringmann, Ulrich}, editor={du Plessis, Monuko}, year={2019} }","chicago":"Vidor, Fabio Fedrizzi, Thorsten Meyers, Julia Reker, Kathrin Müller, Gilson I. Wirth, and Ulrich Hilleringmann. “Mechanical Deformation on Nanoparticle-Based Thin-Film Transistors.” In <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>, edited by Monuko du Plessis. SPIE, 2019. <a href=\"https://doi.org/10.1117/12.2502393\">https://doi.org/10.1117/12.2502393</a>.","ieee":"F. F. Vidor, T. Meyers, J. Reker, K. Müller, G. I. Wirth, and U. Hilleringmann, “Mechanical deformation on nanoparticle-based thin-film transistors,” in <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>, 2019, doi: <a href=\"https://doi.org/10.1117/12.2502393\">10.1117/12.2502393</a>.","ama":"Vidor FF, Meyers T, Reker J, Müller K, Wirth GI, Hilleringmann U. Mechanical deformation on nanoparticle-based thin-film transistors. In: du Plessis M, ed. <i>Fifth Conference on Sensors, MEMS, and Electro-Optic Systems</i>. SPIE; 2019. doi:<a href=\"https://doi.org/10.1117/12.2502393\">10.1117/12.2502393</a>"},"publication_status":"published","language":[{"iso":"eng"}],"_id":"39419","department":[{"_id":"59"}],"user_id":"20179","editor":[{"last_name":"du Plessis","full_name":"du Plessis, Monuko","first_name":"Monuko"}],"status":"public","publication":"Fifth Conference on Sensors, MEMS, and Electro-Optic Systems","type":"conference"},{"date_updated":"2023-03-22T10:31:13Z","publisher":"SPIE","author":[{"first_name":"Tobias","last_name":"Schwabe","full_name":"Schwabe, Tobias"},{"first_name":"Axel","last_name":"Balke","full_name":"Balke, Axel"},{"full_name":"Bezuidenhout, Petrone","last_name":"Bezuidenhout","first_name":"Petrone"},{"first_name":"Julia","full_name":"Reker, Julia","last_name":"Reker"},{"full_name":"Meyers, Thorsten","last_name":"Meyers","first_name":"Thorsten"},{"last_name":"Joubert","full_name":"Joubert, Trudi-Heleen","first_name":"Trudi-Heleen"},{"first_name":"Ulrich","last_name":"Hilleringmann","full_name":"Hilleringmann, Ulrich","id":"20179"}],"date_created":"2023-01-24T10:40:45Z","title":"Oxygen detection with zinc oxide nanoparticle structures","doi":"10.1117/12.2501507","publication_status":"published","year":"2019","citation":{"ama":"Schwabe T, Balke A, Bezuidenhout P, et al. 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