@article{58493,
  author       = {{Zietlow, Christian and Lindner, Jörg K. N.}},
  issn         = {{2045-2322}},
  journal      = {{Scientific Reports}},
  number       = {{1}},
  publisher    = {{Springer Science and Business Media LLC}},
  title        = {{{An applied noise model for scintillation-based CCD detectors in transmission electron microscopy}}},
  doi          = {{10.1038/s41598-025-85982-4}},
  volume       = {{15}},
  year         = {{2025}},
}

@article{58178,
  author       = {{Lindner, Jörg K. N. and Zietlow, Christian}},
  issn         = {{0304-3991}},
  journal      = {{Ultramicroscopy}},
  publisher    = {{Elsevier BV}},
  title        = {{{An applied noise model for low-loss EELS maps}}},
  doi          = {{10.1016/j.ultramic.2024.114101}},
  year         = {{2025}},
}

@article{59177,
  author       = {{Zietlow, Christian and Lindner, Jörg}},
  issn         = {{0304-3991}},
  journal      = {{Ultramicroscopy}},
  publisher    = {{Elsevier BV}},
  title        = {{{An applied noise model for low-loss EELS maps}}},
  doi          = {{10.1016/j.ultramic.2024.114101}},
  volume       = {{270}},
  year         = {{2025}},
}

@article{59178,
  author       = {{Zietlow, Christian and Lindner, Jörg}},
  issn         = {{2045-2322}},
  journal      = {{Sci Rep}},
  number       = {{1}},
  pages        = {{3815}},
  title        = {{{An applied noise model for scintillation-based CCD detectors in transmission electron microscopy.}}},
  doi          = {{10.1038/s41598-025-85982-4}},
  volume       = {{15}},
  year         = {{2025}},
}

@article{60001,
  author       = {{Zietlow, Christian and Lindner, Jörg}},
  journal      = {{Ultramicroscopy}},
  number       = {{275}},
  publisher    = {{Elsevier}},
  title        = {{{An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps}}},
  doi          = {{10.1016/j.ultramic.2025.114159}},
  year         = {{2025}},
}

@article{59179,
  author       = {{Zietlow, Christian and Lindner, Jörg}},
  issn         = {{1017-1398}},
  journal      = {{Numerical Algorithms}},
  number       = {{4}},
  pages        = {{1481--1512}},
  publisher    = {{Springer Science and Business Media LLC}},
  title        = {{{ADMM-TGV image restoration for scientific applications with unbiased parameter choice}}},
  doi          = {{10.1007/s11075-024-01759-2}},
  volume       = {{97}},
  year         = {{2024}},
}

@article{54868,
  abstract     = {{<jats:title>Abstract</jats:title><jats:p>Most properties of solid materials are defined by their internal electric field and charge density distributions which so far are difficult to measure with high spatial resolution. Especially for 2D materials, the atomic electric fields influence the optoelectronic properties. In this study, the atomic‐scale electric field and charge density distribution of WSe<jats:sub>2</jats:sub> bi‐ and trilayers are revealed using an emerging microscopy technique, differential phase contrast (DPC) imaging in scanning transmission electron microscopy (STEM). For pristine material, a higher positive charge density located at the selenium atomic columns compared to the tungsten atomic columns is obtained and tentatively explained by a coherent scattering effect. Furthermore, the change in the electric field distribution induced by a missing selenium atomic column is investigated. A characteristic electric field distribution in the vicinity of the defect with locally reduced magnitudes compared to the pristine lattice is observed. This effect is accompanied by a considerable inward relaxation of the surrounding lattice, which according to first principles DFT calculation is fully compatible with a missing column of Se atoms. This shows that DPC imaging, as an electric field sensitive technique, provides additional and remarkable information to the otherwise only structural analysis obtained with conventional STEM imaging.</jats:p>}},
  author       = {{Groll, Maja and Bürger, Julius and Caltzidis, Ioannis and Jöns, Klaus D. and Schmidt, Wolf Gero and Gerstmann, Uwe and Lindner, Jörg K. N.}},
  issn         = {{1613-6810}},
  journal      = {{Small}},
  publisher    = {{Wiley}},
  title        = {{{DFT‐Assisted Investigation of the Electric Field and Charge Density Distribution of Pristine and Defective 2D WSe<sub>2</sub> by Differential Phase Contrast Imaging}}},
  doi          = {{10.1002/smll.202311635}},
  year         = {{2024}},
}

@inbook{47133,
  author       = {{Bürger, Julius and Lindner, Jörg K. N.}},
  booktitle    = {{Climate Protection, Resource Efficiency, and Sustainable Mobility - Transdisciplinary Approaches to Design and Manufacturing Technology}},
  isbn         = {{978-3-8376-6377-8}},
  pages        = {{61--86}},
  title        = {{{Transmission electron microscopy and transdisciplinary research}}},
  year         = {{2023}},
}

@article{42953,
  author       = {{Cara, Eleonora and Hönicke, Philipp and Kayser, Yves and Lindner, Jörg K. N. and Castellino, Micaela and Murataj, Irdi and Porro, Samuele and Angelini, Angelo and De Leo, Natascia and Pirri, Candido Fabrizio and Beckhoff, Burkhard and Boarino, Luca and Ferrarese Lupi, Federico}},
  issn         = {{2637-6105}},
  journal      = {{ACS Applied Polymer Materials}},
  keywords     = {{Organic Chemistry, Polymers and Plastics, Process Chemistry and Technology}},
  number       = {{3}},
  pages        = {{2079--2087}},
  publisher    = {{American Chemical Society (ACS)}},
  title        = {{{Developing Quantitative Nondestructive Characterization of Nanomaterials: A Case Study on Sequential Infiltration Synthesis of Block Copolymers}}},
  doi          = {{10.1021/acsapm.2c02094}},
  volume       = {{5}},
  year         = {{2023}},
}

@article{35232,
  author       = {{Meier, Falco and Littmann, Mario and Bürger, Julius and Riedl, Thomas and Kool, Daniel and Lindner, Jörg and Reuter, Dirk and As, Donat Josef}},
  issn         = {{0370-1972}},
  journal      = {{physica status solidi (b)}},
  keywords     = {{Condensed Matter Physics, Electronic, Optical and Magnetic Materials}},
  publisher    = {{Wiley}},
  title        = {{{Selective Area Growth of Cubic Gallium Nitride in Nanoscopic Silicon Dioxide Masks}}},
  doi          = {{10.1002/pssb.202200508}},
  year         = {{2022}},
}

@article{34056,
  abstract     = {{<jats:p> A process sequence enabling the large-area fabrication of nanopillar-patterned semiconductor templates for selective-area heteroepitaxy is developed. Herein, the nanopillar tops surrounded by a SiN<jats:sub>x</jats:sub> mask film serve as nanoscale growth areas. The molecular beam epitaxial growth of InAs on such patterned GaAs[Formula: see text]A templates is investigated by means of electron microscopy. It is found that defect-free nanoscale InAs islands grow selectively on the nanopillar tops at a substrate temperature of 425 °C. High-angle annular dark-field scanning transmission electron microscopy imaging reveals that for a growth temperature of 400 °C, the InAs islands show a tendency to form wurtzite phase arms extending along the lateral [Formula: see text] directions from the central zinc blende region of the islands. This is ascribed to a temporary self-catalyzed vapor–liquid–solid growth on [Formula: see text] B facets, which leads to a kinetically induced preference for the nucleation of the wurtzite phase driven by the local, instantaneous V/III ratio, and to a concomitant reduction of surface energy of the nanoscale diameter arms. </jats:p>}},
  author       = {{Riedl, Thomas and Kunnathully, Vinay S. and Verma, Akshay Kumar and Langer, Timo and Reuter, Dirk and Büker, Björn and Hütten, Andreas and Lindner, Jörg}},
  issn         = {{0021-8979}},
  journal      = {{Journal of Applied Physics}},
  keywords     = {{General Physics and Astronomy}},
  number       = {{18}},
  publisher    = {{AIP Publishing}},
  title        = {{{Selective area heteroepitaxy of InAs nanostructures on nanopillar-patterned GaAs(111)A}}},
  doi          = {{10.1063/5.0121559}},
  volume       = {{132}},
  year         = {{2022}},
}

@article{34053,
  author       = {{Riedl, Thomas and Kunnathully, Vinay and Trapp, Alexander and Langer, Timo and Reuter, Dirk and Lindner, Jörg}},
  issn         = {{2196-7350}},
  journal      = {{Advanced Materials Interfaces}},
  keywords     = {{Mechanical Engineering, Mechanics of Materials}},
  number       = {{11}},
  publisher    = {{Wiley}},
  title        = {{{Size‐Dependent Strain Relaxation in InAs Quantum Dots on Top of GaAs(111)A Nanopillars}}},
  doi          = {{10.1002/admi.202102159}},
  volume       = {{9}},
  year         = {{2022}},
}

@article{34086,
  author       = {{Bürger, Julius and Venugopal, Harikrishnan and Kool, Daniel and de los Arcos de Pedro, Maria Teresa and Gonzalez Orive, Alejandro and Grundmeier, Guido and Brassat, Katharina and Lindner, Jörg}},
  issn         = {{2196-7350}},
  journal      = {{Advanced Materials Interfaces}},
  keywords     = {{General Medicine}},
  number       = {{26}},
  publisher    = {{Wiley}},
  title        = {{{High‐Resolution Study of Changes in Morphology and Chemistry of Cylindrical PS‐            <i>b</i>            ‐PMMA Block Copolymer Nanomasks during Mask Development}}},
  doi          = {{10.1002/admi.202200962}},
  volume       = {{9}},
  year         = {{2022}},
}

@article{40987,
  abstract     = {{<The replacement of noble metal catalysts by abundant iron as an active compound in CO oxidation is of ecologic and economic interest. However, improvement of their catalytic performance to the same level as state-of-the-art noble metal catalysts requires an in depth understanding of their working principle on an atomic level. As a contribution to this aim, a series of iron oxide catalysts with varying Fe loadings from 1 to 20 wt% immobilized on a γ-Al2O3 support is presented here, and a multidimensional structure–activity correlation is established. The CO oxidation activity is correlated to structural details obtained by various spectroscopic, diffraction, and microscopic methods, such as PXRD, PDF analysis, DRUVS, Mössbauer spectroscopy, STEM-EDX, and XAS. Low Fe loadings lead to less agglomerated but high percentual amounts of isolated, tetrahedrally coordinated iron oxide species, while the absolute amount of isolated species reaches its maximum at high Fe loadings. Consequently, the highest CO oxidation activity in terms of turnover frequencies can be correlated to small, finely dispersed iron oxide species with a large amount of tetrahedrally oxygen coordinated iron sites, while the overall amount of isolated iron oxide species correlates with a lower light-off temperature.}},
  author       = {{Schlicher, Steffen and Prinz, Nils and Bürger, Julius and Omlor, Andreas and Singer, Christian and Zobel, Mirijam and Schoch, Roland and Lindner, Jörg K. N. and Schünemann, Volker and Kureti, Sven and Bauer, Matthias}},
  issn         = {{2073-4344}},
  journal      = {{Catalysts}},
  keywords     = {{Physical and Theoretical Chemistry, Catalysis, General Environmental Science, Key}},
  number       = {{6}},
  publisher    = {{MDPI AG}},
  title        = {{{Quality or Quantity? How Structural Parameters Affect Catalytic Activity of Iron Oxides for CO Oxidation}}},
  doi          = {{10.3390/catal12060675}},
  volume       = {{12}},
  year         = {{2022}},
}

@article{21374,
  abstract     = {{<jats:p>A dark-field scanning transmission ion microscopy detector was designed for the helium ion microscope. The detection principle is based on a secondary electron conversion holder with an exchangeable aperture strip allowing its acceptance angle to be tuned from 3 to 98 mrad. The contrast mechanism and performance were investigated using freestanding nanometer-thin carbon membranes. The results demonstrate that the detector can be optimized either for most efficient signal collection or for maximum image contrast. The designed setup allows for the imaging of thin low-density materials that otherwise provide little signal or contrast and for a clear end-point detection in the fabrication of nanopores. In addition, the detector is able to determine the thickness of membranes with sub-nanometer precision by quantitatively evaluating the image signal and comparing the results with Monte Carlo simulations. The thickness determined by the dark-field transmission detector is compared to X-ray photoelectron spectroscopy and energy-filtered transmission electron microscopy measurements.</jats:p>}},
  author       = {{Emmrich, Daniel and Wolff, Annalena and Meyerbröker, Nikolaus and Lindner, Jörg and Beyer, André and Gölzhäuser, Armin}},
  issn         = {{2190-4286}},
  journal      = {{Beilstein Journal of Nanotechnology}},
  pages        = {{222--231}},
  title        = {{{Scanning transmission helium ion microscopy on carbon nanomembranes}}},
  doi          = {{10.3762/bjnano.12.18}},
  year         = {{2021}},
}

@article{34087,
  author       = {{Knust, Steffen and Ruhm, Lukas and Kuhlmann, Andreas and Meinderink, Dennis and Bürger, Julius and Lindner, Jörg and de los Arcos de Pedro, Maria Teresa and Grundmeier, Guido}},
  issn         = {{0377-0486}},
  journal      = {{Journal of Raman Spectroscopy}},
  keywords     = {{Spectroscopy, General Materials Science}},
  number       = {{7}},
  pages        = {{1237--1245}},
  publisher    = {{Wiley}},
  title        = {{{In situ backside Raman spectroscopy of zinc oxide nanorods in an atmospheric‐pressure dielectric barrier discharge plasma}}},
  doi          = {{10.1002/jrs.6123}},
  volume       = {{52}},
  year         = {{2021}},
}

@article{34054,
  abstract     = {{<jats:title>Abstract</jats:title><jats:p>Colloidal nanosphere monolayers—used as a lithography mask for site-controlled material deposition or removal—offer the possibility of cost-effective patterning of large surface areas. In the present study, an automated analysis of scanning electron microscopy (SEM) images is described, which enables the recognition of the individual nanospheres in densely packed monolayers in order to perform a statistical quantification of the sphere size, mask opening size, and sphere-sphere separation distributions. Search algorithms based on Fourier transformation, cross-correlation, multiple-angle intensity profiling, and sphere edge point detection techniques allow for a sphere detection efficiency of at least 99.8%, even in the case of considerable sphere size variations. While the sphere positions and diameters are determined by fitting circles to the spheres edge points, the openings between sphere triples are detected by intensity thresholding. For the analyzed polystyrene sphere monolayers with sphere sizes between 220 and 600 nm and a diameter spread of around 3% coefficients of variation of 6.8–8.1% for the opening size are found. By correlating the mentioned size distributions, it is shown that, in this case, the dominant contribution to the opening size variation stems from nanometer-scale positional variations of the spheres.</jats:p>}},
  author       = {{Riedl, Thomas and Lindner, Jörg}},
  issn         = {{1431-9276}},
  journal      = {{Microscopy and Microanalysis}},
  keywords     = {{Instrumentation}},
  number       = {{1}},
  pages        = {{185--195}},
  publisher    = {{Cambridge University Press (CUP)}},
  title        = {{{Automated SEM Image Analysis of the Sphere Diameter, Sphere-Sphere Separation, and Opening Size Distributions of Nanosphere Lithography Masks}}},
  doi          = {{10.1017/s1431927621013866}},
  volume       = {{28}},
  year         = {{2021}},
}

@article{34092,
  abstract     = {{<jats:p>Block copolymer (BCP) self-assembly is a promising tool for next generation lithography as microphase separated polymer domains in thin films can act as templates for surface nanopatterning with sub-20 nm features. The replicated patterns can, however, only be as precise as their templates. Thus, the investigation of the morphology of polymer domains is of great importance. Commonly used analytical techniques (neutron scattering, scanning force microscopy) either lack spatial information or nanoscale resolution. Using advanced analytical (scanning) transmission electron microscopy ((S)TEM), we provide real space information on polymer domain morphology and interfaces between polystyrene (PS) and polymethylmethacrylate (PMMA) in cylinder- and lamellae-forming BCPs at highest resolution. This allows us to correlate the internal structure of polymer domains with line edge roughnesses, interface widths and domain sizes. STEM is employed for high-resolution imaging, electron energy loss spectroscopy and energy filtered TEM (EFTEM) spectroscopic imaging for material identification and EFTEM thickness mapping for visualisation of material densities at defects. The volume fraction of non-phase separated polymer species can be analysed by EFTEM. These methods give new insights into the morphology of polymer domains the exact knowledge of which will allow to improve pattern quality for nanolithography.</jats:p>}},
  author       = {{Bürger, Julius and Kunnathully, Vinay and Kool, Daniel and Lindner, Jörg and Brassat, Katharina}},
  issn         = {{2079-4991}},
  journal      = {{Nanomaterials}},
  keywords     = {{General Materials Science, General Chemical Engineering}},
  number       = {{1}},
  publisher    = {{MDPI AG}},
  title        = {{{Characterisation of the PS-PMMA Interfaces in Microphase Separated Block Copolymer Thin Films by Analytical (S)TEM}}},
  doi          = {{10.3390/nano10010141}},
  volume       = {{10}},
  year         = {{2020}},
}

@article{34093,
  author       = {{Riedl, Thomas and Kunnathully, V. S. and Trapp, A. and Langer, T. and Reuter, Dirk and Lindner, Jörg}},
  issn         = {{2475-9953}},
  journal      = {{Physical Review Materials}},
  keywords     = {{Physics and Astronomy (miscellaneous), General Materials Science}},
  number       = {{1}},
  publisher    = {{American Physical Society (APS)}},
  title        = {{{Strain-driven InAs island growth on top of GaAs(111) nanopillars}}},
  doi          = {{10.1103/physrevmaterials.4.014602}},
  volume       = {{4}},
  year         = {{2020}},
}

@article{34088,
  author       = {{Bürger, Julius and Riedl, Thomas and Lindner, Jörg}},
  issn         = {{0304-3991}},
  journal      = {{Ultramicroscopy}},
  keywords     = {{Instrumentation, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials}},
  publisher    = {{Elsevier BV}},
  title        = {{{Influence of lens aberrations, specimen thickness and tilt on differential phase contrast STEM images}}},
  doi          = {{10.1016/j.ultramic.2020.113118}},
  volume       = {{219}},
  year         = {{2020}},
}