---
_id: '58493'
article_number: '3815'
author:
- first_name: Christian
  full_name: Zietlow, Christian
  last_name: Zietlow
- first_name: Jörg K. N.
  full_name: Lindner, Jörg K. N.
  id: '20797'
  last_name: Lindner
citation:
  ama: Zietlow C, Lindner JKN. An applied noise model for scintillation-based CCD
    detectors in transmission electron microscopy. <i>Scientific Reports</i>. 2025;15(1).
    doi:<a href="https://doi.org/10.1038/s41598-025-85982-4">10.1038/s41598-025-85982-4</a>
  apa: Zietlow, C., &#38; Lindner, J. K. N. (2025). An applied noise model for scintillation-based
    CCD detectors in transmission electron microscopy. <i>Scientific Reports</i>,
    <i>15</i>(1), Article 3815. <a href="https://doi.org/10.1038/s41598-025-85982-4">https://doi.org/10.1038/s41598-025-85982-4</a>
  bibtex: '@article{Zietlow_Lindner_2025, title={An applied noise model for scintillation-based
    CCD detectors in transmission electron microscopy}, volume={15}, DOI={<a href="https://doi.org/10.1038/s41598-025-85982-4">10.1038/s41598-025-85982-4</a>},
    number={13815}, journal={Scientific Reports}, publisher={Springer Science and
    Business Media LLC}, author={Zietlow, Christian and Lindner, Jörg K. N.}, year={2025}
    }'
  chicago: Zietlow, Christian, and Jörg K. N. Lindner. “An Applied Noise Model for
    Scintillation-Based CCD Detectors in Transmission Electron Microscopy.” <i>Scientific
    Reports</i> 15, no. 1 (2025). <a href="https://doi.org/10.1038/s41598-025-85982-4">https://doi.org/10.1038/s41598-025-85982-4</a>.
  ieee: 'C. Zietlow and J. K. N. Lindner, “An applied noise model for scintillation-based
    CCD detectors in transmission electron microscopy,” <i>Scientific Reports</i>,
    vol. 15, no. 1, Art. no. 3815, 2025, doi: <a href="https://doi.org/10.1038/s41598-025-85982-4">10.1038/s41598-025-85982-4</a>.'
  mla: Zietlow, Christian, and Jörg K. N. Lindner. “An Applied Noise Model for Scintillation-Based
    CCD Detectors in Transmission Electron Microscopy.” <i>Scientific Reports</i>,
    vol. 15, no. 1, 3815, Springer Science and Business Media LLC, 2025, doi:<a href="https://doi.org/10.1038/s41598-025-85982-4">10.1038/s41598-025-85982-4</a>.
  short: C. Zietlow, J.K.N. Lindner, Scientific Reports 15 (2025).
date_created: 2025-02-03T09:05:02Z
date_updated: 2025-02-03T09:06:28Z
department:
- _id: '286'
- _id: '15'
doi: 10.1038/s41598-025-85982-4
intvolume: '        15'
issue: '1'
language:
- iso: eng
publication: Scientific Reports
publication_identifier:
  issn:
  - 2045-2322
publication_status: published
publisher: Springer Science and Business Media LLC
status: public
title: An applied noise model for scintillation-based CCD detectors in transmission
  electron microscopy
type: journal_article
user_id: '77496'
volume: 15
year: '2025'
...
---
_id: '58178'
article_number: '114101'
author:
- first_name: Jörg K. N.
  full_name: Lindner, Jörg K. N.
  id: '20797'
  last_name: Lindner
- first_name: Christian
  full_name: Zietlow, Christian
  last_name: Zietlow
citation:
  ama: Lindner JKN, Zietlow C. An applied noise model for low-loss EELS maps. <i>Ultramicroscopy</i>.
    Published online 2025. doi:<a href="https://doi.org/10.1016/j.ultramic.2024.114101">10.1016/j.ultramic.2024.114101</a>
  apa: Lindner, J. K. N., &#38; Zietlow, C. (2025). An applied noise model for low-loss
    EELS maps. <i>Ultramicroscopy</i>, Article 114101. <a href="https://doi.org/10.1016/j.ultramic.2024.114101">https://doi.org/10.1016/j.ultramic.2024.114101</a>
  bibtex: '@article{Lindner_Zietlow_2025, title={An applied noise model for low-loss
    EELS maps}, DOI={<a href="https://doi.org/10.1016/j.ultramic.2024.114101">10.1016/j.ultramic.2024.114101</a>},
    number={114101}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Lindner,
    Jörg K. N. and Zietlow, Christian}, year={2025} }'
  chicago: Lindner, Jörg K. N., and Christian Zietlow. “An Applied Noise Model for
    Low-Loss EELS Maps.” <i>Ultramicroscopy</i>, 2025. <a href="https://doi.org/10.1016/j.ultramic.2024.114101">https://doi.org/10.1016/j.ultramic.2024.114101</a>.
  ieee: 'J. K. N. Lindner and C. Zietlow, “An applied noise model for low-loss EELS
    maps,” <i>Ultramicroscopy</i>, Art. no. 114101, 2025, doi: <a href="https://doi.org/10.1016/j.ultramic.2024.114101">10.1016/j.ultramic.2024.114101</a>.'
  mla: Lindner, Jörg K. N., and Christian Zietlow. “An Applied Noise Model for Low-Loss
    EELS Maps.” <i>Ultramicroscopy</i>, 114101, Elsevier BV, 2025, doi:<a href="https://doi.org/10.1016/j.ultramic.2024.114101">10.1016/j.ultramic.2024.114101</a>.
  short: J.K.N. Lindner, C. Zietlow, Ultramicroscopy (2025).
date_created: 2025-01-14T09:41:23Z
date_updated: 2025-02-03T08:23:19Z
department:
- _id: '286'
- _id: '15'
doi: 10.1016/j.ultramic.2024.114101
language:
- iso: eng
publication: Ultramicroscopy
publication_identifier:
  issn:
  - 0304-3991
publication_status: published
publisher: Elsevier BV
status: public
title: An applied noise model for low-loss EELS maps
type: journal_article
user_id: '77496'
year: '2025'
...
---
_id: '59177'
article_number: '114101'
article_type: original
author:
- first_name: Christian
  full_name: Zietlow, Christian
  id: '77368'
  last_name: Zietlow
  orcid: https://orcid.org/0000-0001-9696-619X
- first_name: Jörg
  full_name: Lindner, Jörg
  id: '20797'
  last_name: Lindner
citation:
  ama: Zietlow C, Lindner J. An applied noise model for low-loss EELS maps. <i>Ultramicroscopy</i>.
    2025;270. doi:<a href="https://doi.org/10.1016/j.ultramic.2024.114101">10.1016/j.ultramic.2024.114101</a>
  apa: Zietlow, C., &#38; Lindner, J. (2025). An applied noise model for low-loss
    EELS maps. <i>Ultramicroscopy</i>, <i>270</i>, Article 114101. <a href="https://doi.org/10.1016/j.ultramic.2024.114101">https://doi.org/10.1016/j.ultramic.2024.114101</a>
  bibtex: '@article{Zietlow_Lindner_2025, title={An applied noise model for low-loss
    EELS maps}, volume={270}, DOI={<a href="https://doi.org/10.1016/j.ultramic.2024.114101">10.1016/j.ultramic.2024.114101</a>},
    number={114101}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Zietlow,
    Christian and Lindner, Jörg}, year={2025} }'
  chicago: Zietlow, Christian, and Jörg Lindner. “An Applied Noise Model for Low-Loss
    EELS Maps.” <i>Ultramicroscopy</i> 270 (2025). <a href="https://doi.org/10.1016/j.ultramic.2024.114101">https://doi.org/10.1016/j.ultramic.2024.114101</a>.
  ieee: 'C. Zietlow and J. Lindner, “An applied noise model for low-loss EELS maps,”
    <i>Ultramicroscopy</i>, vol. 270, Art. no. 114101, 2025, doi: <a href="https://doi.org/10.1016/j.ultramic.2024.114101">10.1016/j.ultramic.2024.114101</a>.'
  mla: Zietlow, Christian, and Jörg Lindner. “An Applied Noise Model for Low-Loss
    EELS Maps.” <i>Ultramicroscopy</i>, vol. 270, 114101, Elsevier BV, 2025, doi:<a
    href="https://doi.org/10.1016/j.ultramic.2024.114101">10.1016/j.ultramic.2024.114101</a>.
  short: C. Zietlow, J. Lindner, Ultramicroscopy 270 (2025).
date_created: 2025-03-28T06:58:55Z
date_updated: 2026-02-04T07:02:20Z
doi: 10.1016/j.ultramic.2024.114101
external_id:
  pmid:
  - '39823700'
intvolume: '       270'
language:
- iso: eng
main_file_link:
- open_access: '1'
oa: '1'
pmid: '1'
publication: Ultramicroscopy
publication_identifier:
  issn:
  - 0304-3991
publication_status: published
publisher: Elsevier BV
quality_controlled: '1'
status: public
title: An applied noise model for low-loss EELS maps
type: journal_article
user_id: '77368'
volume: 270
year: '2025'
...
---
_id: '59178'
article_type: original
author:
- first_name: Christian
  full_name: Zietlow, Christian
  id: '77368'
  last_name: Zietlow
  orcid: https://orcid.org/0000-0001-9696-619X
- first_name: Jörg
  full_name: Lindner, Jörg
  id: '20797'
  last_name: Lindner
citation:
  ama: Zietlow C, Lindner J. An applied noise model for scintillation-based CCD detectors
    in transmission electron microscopy. <i>Sci Rep</i>. 2025;15(1):3815. doi:<a href="https://doi.org/10.1038/s41598-025-85982-4">10.1038/s41598-025-85982-4</a>
  apa: Zietlow, C., &#38; Lindner, J. (2025). An applied noise model for scintillation-based
    CCD detectors in transmission electron microscopy. <i>Sci Rep</i>, <i>15</i>(1),
    3815. <a href="https://doi.org/10.1038/s41598-025-85982-4">https://doi.org/10.1038/s41598-025-85982-4</a>
  bibtex: '@article{Zietlow_Lindner_2025, title={An applied noise model for scintillation-based
    CCD detectors in transmission electron microscopy.}, volume={15}, DOI={<a href="https://doi.org/10.1038/s41598-025-85982-4">10.1038/s41598-025-85982-4</a>},
    number={1}, journal={Sci Rep}, author={Zietlow, Christian and Lindner, Jörg},
    year={2025}, pages={3815} }'
  chicago: 'Zietlow, Christian, and Jörg Lindner. “An Applied Noise Model for Scintillation-Based
    CCD Detectors in Transmission Electron Microscopy.” <i>Sci Rep</i> 15, no. 1 (2025):
    3815. <a href="https://doi.org/10.1038/s41598-025-85982-4">https://doi.org/10.1038/s41598-025-85982-4</a>.'
  ieee: 'C. Zietlow and J. Lindner, “An applied noise model for scintillation-based
    CCD detectors in transmission electron microscopy.,” <i>Sci Rep</i>, vol. 15,
    no. 1, p. 3815, 2025, doi: <a href="https://doi.org/10.1038/s41598-025-85982-4">10.1038/s41598-025-85982-4</a>.'
  mla: Zietlow, Christian, and Jörg Lindner. “An Applied Noise Model for Scintillation-Based
    CCD Detectors in Transmission Electron Microscopy.” <i>Sci Rep</i>, vol. 15, no.
    1, 2025, p. 3815, doi:<a href="https://doi.org/10.1038/s41598-025-85982-4">10.1038/s41598-025-85982-4</a>.
  short: C. Zietlow, J. Lindner, Sci Rep 15 (2025) 3815.
date_created: 2025-03-28T07:03:45Z
date_updated: 2026-02-04T07:49:19Z
department:
- _id: '15'
doi: 10.1038/s41598-025-85982-4
external_id:
  pmid:
  - '39885260'
intvolume: '        15'
issue: '1'
language:
- iso: eng
main_file_link:
- open_access: '1'
oa: '1'
page: '3815'
pmid: '1'
publication: Sci Rep
publication_identifier:
  issn:
  - 2045-2322
publication_status: published
quality_controlled: '1'
status: public
title: An applied noise model for scintillation-based CCD detectors in transmission
  electron microscopy.
type: journal_article
user_id: '77368'
volume: 15
year: '2025'
...
---
_id: '60001'
article_type: original
author:
- first_name: Christian
  full_name: Zietlow, Christian
  id: '77368'
  last_name: Zietlow
  orcid: https://orcid.org/0000-0001-9696-619X
- first_name: Jörg
  full_name: Lindner, Jörg
  id: '20797'
  last_name: Lindner
citation:
  ama: Zietlow C, Lindner J. An unbiased ADMM-TGV algorithm for the deconvolution
    of STEM-EELS maps. <i>Ultramicroscopy</i>. 2025;(275). doi:<a href="https://doi.org/10.1016/j.ultramic.2025.114159">10.1016/j.ultramic.2025.114159</a>
  apa: Zietlow, C., &#38; Lindner, J. (2025). An unbiased ADMM-TGV algorithm for the
    deconvolution of STEM-EELS maps. <i>Ultramicroscopy</i>, <i>275</i>. <a href="https://doi.org/10.1016/j.ultramic.2025.114159">https://doi.org/10.1016/j.ultramic.2025.114159</a>
  bibtex: '@article{Zietlow_Lindner_2025, title={An unbiased ADMM-TGV algorithm for
    the deconvolution of STEM-EELS maps}, DOI={<a href="https://doi.org/10.1016/j.ultramic.2025.114159">10.1016/j.ultramic.2025.114159</a>},
    number={275}, journal={Ultramicroscopy}, publisher={Elsevier}, author={Zietlow,
    Christian and Lindner, Jörg}, year={2025} }'
  chicago: Zietlow, Christian, and Jörg Lindner. “An Unbiased ADMM-TGV Algorithm for
    the Deconvolution of STEM-EELS Maps.” <i>Ultramicroscopy</i>, no. 275 (2025).
    <a href="https://doi.org/10.1016/j.ultramic.2025.114159">https://doi.org/10.1016/j.ultramic.2025.114159</a>.
  ieee: 'C. Zietlow and J. Lindner, “An unbiased ADMM-TGV algorithm for the deconvolution
    of STEM-EELS maps,” <i>Ultramicroscopy</i>, no. 275, 2025, doi: <a href="https://doi.org/10.1016/j.ultramic.2025.114159">10.1016/j.ultramic.2025.114159</a>.'
  mla: Zietlow, Christian, and Jörg Lindner. “An Unbiased ADMM-TGV Algorithm for the
    Deconvolution of STEM-EELS Maps.” <i>Ultramicroscopy</i>, no. 275, Elsevier, 2025,
    doi:<a href="https://doi.org/10.1016/j.ultramic.2025.114159">10.1016/j.ultramic.2025.114159</a>.
  short: C. Zietlow, J. Lindner, Ultramicroscopy (2025).
date_created: 2025-05-20T11:33:24Z
date_updated: 2026-02-04T07:50:40Z
department:
- _id: '286'
- _id: '15'
doi: 10.1016/j.ultramic.2025.114159
external_id:
  pmid:
  - '40398071'
issue: '275'
language:
- iso: eng
main_file_link:
- open_access: '1'
oa: '1'
pmid: '1'
publication: Ultramicroscopy
publication_status: published
publisher: Elsevier
quality_controlled: '1'
status: public
title: An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps
type: journal_article
user_id: '77368'
year: '2025'
...
---
_id: '59179'
article_type: original
author:
- first_name: Christian
  full_name: Zietlow, Christian
  id: '77368'
  last_name: Zietlow
  orcid: https://orcid.org/0000-0001-9696-619X
- first_name: Jörg
  full_name: Lindner, Jörg
  id: '20797'
  last_name: Lindner
citation:
  ama: Zietlow C, Lindner J. ADMM-TGV image restoration for scientific applications
    with unbiased parameter choice. <i>Numerical Algorithms</i>. 2024;97(4):1481-1512.
    doi:<a href="https://doi.org/10.1007/s11075-024-01759-2">10.1007/s11075-024-01759-2</a>
  apa: Zietlow, C., &#38; Lindner, J. (2024). ADMM-TGV image restoration for scientific
    applications with unbiased parameter choice. <i>Numerical Algorithms</i>, <i>97</i>(4),
    1481–1512. <a href="https://doi.org/10.1007/s11075-024-01759-2">https://doi.org/10.1007/s11075-024-01759-2</a>
  bibtex: '@article{Zietlow_Lindner_2024, title={ADMM-TGV image restoration for scientific
    applications with unbiased parameter choice}, volume={97}, DOI={<a href="https://doi.org/10.1007/s11075-024-01759-2">10.1007/s11075-024-01759-2</a>},
    number={4}, journal={Numerical Algorithms}, publisher={Springer Science and Business
    Media LLC}, author={Zietlow, Christian and Lindner, Jörg}, year={2024}, pages={1481–1512}
    }'
  chicago: 'Zietlow, Christian, and Jörg Lindner. “ADMM-TGV Image Restoration for
    Scientific Applications with Unbiased Parameter Choice.” <i>Numerical Algorithms</i>
    97, no. 4 (2024): 1481–1512. <a href="https://doi.org/10.1007/s11075-024-01759-2">https://doi.org/10.1007/s11075-024-01759-2</a>.'
  ieee: 'C. Zietlow and J. Lindner, “ADMM-TGV image restoration for scientific applications
    with unbiased parameter choice,” <i>Numerical Algorithms</i>, vol. 97, no. 4,
    pp. 1481–1512, 2024, doi: <a href="https://doi.org/10.1007/s11075-024-01759-2">10.1007/s11075-024-01759-2</a>.'
  mla: Zietlow, Christian, and Jörg Lindner. “ADMM-TGV Image Restoration for Scientific
    Applications with Unbiased Parameter Choice.” <i>Numerical Algorithms</i>, vol.
    97, no. 4, Springer Science and Business Media LLC, 2024, pp. 1481–512, doi:<a
    href="https://doi.org/10.1007/s11075-024-01759-2">10.1007/s11075-024-01759-2</a>.
  short: C. Zietlow, J. Lindner, Numerical Algorithms 97 (2024) 1481–1512.
date_created: 2025-03-28T07:10:05Z
date_updated: 2026-02-04T07:54:06Z
doi: 10.1007/s11075-024-01759-2
intvolume: '        97'
issue: '4'
language:
- iso: eng
main_file_link:
- open_access: '1'
oa: '1'
page: 1481-1512
publication: Numerical Algorithms
publication_identifier:
  issn:
  - 1017-1398
  - 1572-9265
publication_status: published
publisher: Springer Science and Business Media LLC
quality_controlled: '1'
status: public
title: ADMM-TGV image restoration for scientific applications with unbiased parameter
  choice
type: journal_article
user_id: '77368'
volume: 97
year: '2024'
...
---
_id: '54868'
abstract:
- lang: eng
  text: <jats:title>Abstract</jats:title><jats:p>Most properties of solid materials
    are defined by their internal electric field and charge density distributions
    which so far are difficult to measure with high spatial resolution. Especially
    for 2D materials, the atomic electric fields influence the optoelectronic properties.
    In this study, the atomic‐scale electric field and charge density distribution
    of WSe<jats:sub>2</jats:sub> bi‐ and trilayers are revealed using an emerging
    microscopy technique, differential phase contrast (DPC) imaging in scanning transmission
    electron microscopy (STEM). For pristine material, a higher positive charge density
    located at the selenium atomic columns compared to the tungsten atomic columns
    is obtained and tentatively explained by a coherent scattering effect. Furthermore,
    the change in the electric field distribution induced by a missing selenium atomic
    column is investigated. A characteristic electric field distribution in the vicinity
    of the defect with locally reduced magnitudes compared to the pristine lattice
    is observed. This effect is accompanied by a considerable inward relaxation of
    the surrounding lattice, which according to first principles DFT calculation is
    fully compatible with a missing column of Se atoms. This shows that DPC imaging,
    as an electric field sensitive technique, provides additional and remarkable information
    to the otherwise only structural analysis obtained with conventional STEM imaging.</jats:p>
article_type: original
author:
- first_name: Maja
  full_name: Groll, Maja
  last_name: Groll
- first_name: Julius
  full_name: Bürger, Julius
  id: '46952'
  last_name: Bürger
- first_name: Ioannis
  full_name: Caltzidis, Ioannis
  id: '87911'
  last_name: Caltzidis
- first_name: Klaus D.
  full_name: Jöns, Klaus D.
  id: '85353'
  last_name: Jöns
- first_name: Wolf Gero
  full_name: Schmidt, Wolf Gero
  id: '468'
  last_name: Schmidt
  orcid: 0000-0002-2717-5076
- first_name: Uwe
  full_name: Gerstmann, Uwe
  id: '171'
  last_name: Gerstmann
  orcid: 0000-0002-4476-223X
- first_name: Jörg K. N.
  full_name: Lindner, Jörg K. N.
  id: '20797'
  last_name: Lindner
citation:
  ama: Groll M, Bürger J, Caltzidis I, et al. DFT‐Assisted Investigation of the Electric
    Field and Charge Density Distribution of Pristine and Defective 2D WSe<sub>2</sub>
    by Differential Phase Contrast Imaging. <i>Small</i>. Published online 2024. doi:<a
    href="https://doi.org/10.1002/smll.202311635">10.1002/smll.202311635</a>
  apa: Groll, M., Bürger, J., Caltzidis, I., Jöns, K. D., Schmidt, W. G., Gerstmann,
    U., &#38; Lindner, J. K. N. (2024). DFT‐Assisted Investigation of the Electric
    Field and Charge Density Distribution of Pristine and Defective 2D WSe<sub>2</sub>
    by Differential Phase Contrast Imaging. <i>Small</i>. <a href="https://doi.org/10.1002/smll.202311635">https://doi.org/10.1002/smll.202311635</a>
  bibtex: '@article{Groll_Bürger_Caltzidis_Jöns_Schmidt_Gerstmann_Lindner_2024, title={DFT‐Assisted
    Investigation of the Electric Field and Charge Density Distribution of Pristine
    and Defective 2D WSe<sub>2</sub> by Differential Phase Contrast Imaging}, DOI={<a
    href="https://doi.org/10.1002/smll.202311635">10.1002/smll.202311635</a>}, journal={Small},
    publisher={Wiley}, author={Groll, Maja and Bürger, Julius and Caltzidis, Ioannis
    and Jöns, Klaus D. and Schmidt, Wolf Gero and Gerstmann, Uwe and Lindner, Jörg
    K. N.}, year={2024} }'
  chicago: Groll, Maja, Julius Bürger, Ioannis Caltzidis, Klaus D. Jöns, Wolf Gero
    Schmidt, Uwe Gerstmann, and Jörg K. N. Lindner. “DFT‐Assisted Investigation of
    the Electric Field and Charge Density Distribution of Pristine and Defective 2D
    WSe<sub>2</sub> by Differential Phase Contrast Imaging.” <i>Small</i>, 2024. <a
    href="https://doi.org/10.1002/smll.202311635">https://doi.org/10.1002/smll.202311635</a>.
  ieee: 'M. Groll <i>et al.</i>, “DFT‐Assisted Investigation of the Electric Field
    and Charge Density Distribution of Pristine and Defective 2D WSe<sub>2</sub> by
    Differential Phase Contrast Imaging,” <i>Small</i>, 2024, doi: <a href="https://doi.org/10.1002/smll.202311635">10.1002/smll.202311635</a>.'
  mla: Groll, Maja, et al. “DFT‐Assisted Investigation of the Electric Field and Charge
    Density Distribution of Pristine and Defective 2D WSe<sub>2</sub> by Differential
    Phase Contrast Imaging.” <i>Small</i>, Wiley, 2024, doi:<a href="https://doi.org/10.1002/smll.202311635">10.1002/smll.202311635</a>.
  short: M. Groll, J. Bürger, I. Caltzidis, K.D. Jöns, W.G. Schmidt, U. Gerstmann,
    J.K.N. Lindner, Small (2024).
date_created: 2024-06-24T09:46:25Z
date_updated: 2025-12-05T13:39:01Z
department:
- _id: '15'
- _id: '170'
- _id: '295'
- _id: '790'
- _id: '642'
- _id: '286'
- _id: '429'
- _id: '230'
- _id: '27'
- _id: '35'
- _id: '169'
doi: 10.1002/smll.202311635
language:
- iso: eng
project:
- _id: '53'
  name: 'TRR 142: TRR 142 - Maßgeschneiderte nichtlineare Photonik: Von grundlegenden
    Konzepten zu funktionellen Strukturen'
- _id: '54'
  name: 'TRR 142 - A: TRR 142 - Project Area A'
- _id: '55'
  name: 'TRR 142 - B: TRR 142 - Project Area B'
- _id: '166'
  name: 'TRR 142 - A11: TRR 142 - Subproject A11'
- _id: '168'
  name: 'TRR 142 - B07: TRR 142 - Polaronen-Einfluss auf die optischen Eigenschaften
    von Lithiumniobat (B07*)'
- _id: '52'
  name: 'PC2: Computing Resources Provided by the Paderborn Center for Parallel Computing'
publication: Small
publication_identifier:
  issn:
  - 1613-6810
  - 1613-6829
publication_status: published
publisher: Wiley
status: public
title: DFT‐Assisted Investigation of the Electric Field and Charge Density Distribution
  of Pristine and Defective 2D WSe<sub>2</sub> by Differential Phase Contrast Imaging
type: journal_article
user_id: '16199'
year: '2024'
...
---
_id: '47133'
author:
- first_name: Julius
  full_name: Bürger, Julius
  id: '46952'
  last_name: Bürger
- first_name: Jörg K. N.
  full_name: Lindner, Jörg K. N.
  id: '20797'
  last_name: Lindner
citation:
  ama: 'Bürger J, Lindner JKN. Transmission electron microscopy and transdisciplinary
    research. In: <i>Climate Protection, Resource Efficiency, and Sustainable Mobility
    - Transdisciplinary Approaches to Design and Manufacturing Technology</i>. ; 2023:61-86.'
  apa: Bürger, J., &#38; Lindner, J. K. N. (2023). Transmission electron microscopy
    and transdisciplinary research. In <i>Climate Protection, Resource Efficiency,
    and Sustainable Mobility - Transdisciplinary Approaches to Design and Manufacturing
    Technology</i> (pp. 61–86).
  bibtex: '@inbook{Bürger_Lindner_2023, title={Transmission electron microscopy and
    transdisciplinary research}, booktitle={Climate Protection, Resource Efficiency,
    and Sustainable Mobility - Transdisciplinary Approaches to Design and Manufacturing
    Technology}, author={Bürger, Julius and Lindner, Jörg K. N.}, year={2023}, pages={61–86}
    }'
  chicago: Bürger, Julius, and Jörg K. N. Lindner. “Transmission Electron Microscopy
    and Transdisciplinary Research.” In <i>Climate Protection, Resource Efficiency,
    and Sustainable Mobility - Transdisciplinary Approaches to Design and Manufacturing
    Technology</i>, 61–86, 2023.
  ieee: J. Bürger and J. K. N. Lindner, “Transmission electron microscopy and transdisciplinary
    research,” in <i>Climate Protection, Resource Efficiency, and Sustainable Mobility
    - Transdisciplinary Approaches to Design and Manufacturing Technology</i>, 2023,
    pp. 61–86.
  mla: Bürger, Julius, and Jörg K. N. Lindner. “Transmission Electron Microscopy and
    Transdisciplinary Research.” <i>Climate Protection, Resource Efficiency, and Sustainable
    Mobility - Transdisciplinary Approaches to Design and Manufacturing Technology</i>,
    2023, pp. 61–86.
  short: 'J. Bürger, J.K.N. Lindner, in: Climate Protection, Resource Efficiency,
    and Sustainable Mobility - Transdisciplinary Approaches to Design and Manufacturing
    Technology, 2023, pp. 61–86.'
date_created: 2023-09-20T07:48:55Z
date_updated: 2023-12-05T13:38:00Z
department:
- _id: '286'
language:
- iso: eng
page: 61-86
publication: Climate Protection, Resource Efficiency, and Sustainable Mobility - Transdisciplinary
  Approaches to Design and Manufacturing Technology
publication_identifier:
  isbn:
  - 978-3-8376-6377-8
publication_status: published
status: public
title: Transmission electron microscopy and transdisciplinary research
type: book_chapter
user_id: '77496'
year: '2023'
...
---
_id: '42953'
author:
- first_name: Eleonora
  full_name: Cara, Eleonora
  last_name: Cara
- first_name: Philipp
  full_name: Hönicke, Philipp
  last_name: Hönicke
- first_name: Yves
  full_name: Kayser, Yves
  last_name: Kayser
- first_name: Jörg K. N.
  full_name: Lindner, Jörg K. N.
  id: '20797'
  last_name: Lindner
- first_name: Micaela
  full_name: Castellino, Micaela
  last_name: Castellino
- first_name: Irdi
  full_name: Murataj, Irdi
  last_name: Murataj
- first_name: Samuele
  full_name: Porro, Samuele
  last_name: Porro
- first_name: Angelo
  full_name: Angelini, Angelo
  last_name: Angelini
- first_name: Natascia
  full_name: De Leo, Natascia
  last_name: De Leo
- first_name: Candido Fabrizio
  full_name: Pirri, Candido Fabrizio
  last_name: Pirri
- first_name: Burkhard
  full_name: Beckhoff, Burkhard
  last_name: Beckhoff
- first_name: Luca
  full_name: Boarino, Luca
  last_name: Boarino
- first_name: Federico
  full_name: Ferrarese Lupi, Federico
  last_name: Ferrarese Lupi
citation:
  ama: 'Cara E, Hönicke P, Kayser Y, et al. Developing Quantitative Nondestructive
    Characterization of Nanomaterials: A Case Study on Sequential Infiltration Synthesis
    of Block Copolymers. <i>ACS Applied Polymer Materials</i>. 2023;5(3):2079-2087.
    doi:<a href="https://doi.org/10.1021/acsapm.2c02094">10.1021/acsapm.2c02094</a>'
  apa: 'Cara, E., Hönicke, P., Kayser, Y., Lindner, J. K. N., Castellino, M., Murataj,
    I., Porro, S., Angelini, A., De Leo, N., Pirri, C. F., Beckhoff, B., Boarino,
    L., &#38; Ferrarese Lupi, F. (2023). Developing Quantitative Nondestructive Characterization
    of Nanomaterials: A Case Study on Sequential Infiltration Synthesis of Block Copolymers.
    <i>ACS Applied Polymer Materials</i>, <i>5</i>(3), 2079–2087. <a href="https://doi.org/10.1021/acsapm.2c02094">https://doi.org/10.1021/acsapm.2c02094</a>'
  bibtex: '@article{Cara_Hönicke_Kayser_Lindner_Castellino_Murataj_Porro_Angelini_De
    Leo_Pirri_et al._2023, title={Developing Quantitative Nondestructive Characterization
    of Nanomaterials: A Case Study on Sequential Infiltration Synthesis of Block Copolymers},
    volume={5}, DOI={<a href="https://doi.org/10.1021/acsapm.2c02094">10.1021/acsapm.2c02094</a>},
    number={3}, journal={ACS Applied Polymer Materials}, publisher={American Chemical
    Society (ACS)}, author={Cara, Eleonora and Hönicke, Philipp and Kayser, Yves and
    Lindner, Jörg K. N. and Castellino, Micaela and Murataj, Irdi and Porro, Samuele
    and Angelini, Angelo and De Leo, Natascia and Pirri, Candido Fabrizio and et al.},
    year={2023}, pages={2079–2087} }'
  chicago: 'Cara, Eleonora, Philipp Hönicke, Yves Kayser, Jörg K. N. Lindner, Micaela
    Castellino, Irdi Murataj, Samuele Porro, et al. “Developing Quantitative Nondestructive
    Characterization of Nanomaterials: A Case Study on Sequential Infiltration Synthesis
    of Block Copolymers.” <i>ACS Applied Polymer Materials</i> 5, no. 3 (2023): 2079–87.
    <a href="https://doi.org/10.1021/acsapm.2c02094">https://doi.org/10.1021/acsapm.2c02094</a>.'
  ieee: 'E. Cara <i>et al.</i>, “Developing Quantitative Nondestructive Characterization
    of Nanomaterials: A Case Study on Sequential Infiltration Synthesis of Block Copolymers,”
    <i>ACS Applied Polymer Materials</i>, vol. 5, no. 3, pp. 2079–2087, 2023, doi:
    <a href="https://doi.org/10.1021/acsapm.2c02094">10.1021/acsapm.2c02094</a>.'
  mla: 'Cara, Eleonora, et al. “Developing Quantitative Nondestructive Characterization
    of Nanomaterials: A Case Study on Sequential Infiltration Synthesis of Block Copolymers.”
    <i>ACS Applied Polymer Materials</i>, vol. 5, no. 3, American Chemical Society
    (ACS), 2023, pp. 2079–87, doi:<a href="https://doi.org/10.1021/acsapm.2c02094">10.1021/acsapm.2c02094</a>.'
  short: E. Cara, P. Hönicke, Y. Kayser, J.K.N. Lindner, M. Castellino, I. Murataj,
    S. Porro, A. Angelini, N. De Leo, C.F. Pirri, B. Beckhoff, L. Boarino, F. Ferrarese
    Lupi, ACS Applied Polymer Materials 5 (2023) 2079–2087.
date_created: 2023-03-13T12:37:25Z
date_updated: 2023-03-13T12:39:28Z
department:
- _id: '15'
doi: 10.1021/acsapm.2c02094
intvolume: '         5'
issue: '3'
keyword:
- Organic Chemistry
- Polymers and Plastics
- Process Chemistry and Technology
language:
- iso: eng
page: 2079-2087
publication: ACS Applied Polymer Materials
publication_identifier:
  issn:
  - 2637-6105
  - 2637-6105
publication_status: published
publisher: American Chemical Society (ACS)
status: public
title: 'Developing Quantitative Nondestructive Characterization of Nanomaterials:
  A Case Study on Sequential Infiltration Synthesis of Block Copolymers'
type: journal_article
user_id: '77496'
volume: 5
year: '2023'
...
---
_id: '35232'
article_number: '2200508'
author:
- first_name: Falco
  full_name: Meier, Falco
  last_name: Meier
- first_name: Mario
  full_name: Littmann, Mario
  last_name: Littmann
- first_name: Julius
  full_name: Bürger, Julius
  id: '46952'
  last_name: Bürger
- first_name: Thomas
  full_name: Riedl, Thomas
  id: '36950'
  last_name: Riedl
- first_name: Daniel
  full_name: Kool, Daniel
  id: '44586'
  last_name: Kool
- first_name: Jörg
  full_name: Lindner, Jörg
  id: '20797'
  last_name: Lindner
- first_name: Dirk
  full_name: Reuter, Dirk
  id: '37763'
  last_name: Reuter
- first_name: Donat Josef
  full_name: As, Donat Josef
  id: '14'
  last_name: As
  orcid: 0000-0003-1121-3565
citation:
  ama: Meier F, Littmann M, Bürger J, et al. Selective Area Growth of Cubic Gallium
    Nitride in Nanoscopic Silicon Dioxide Masks. <i>physica status solidi (b)</i>.
    Published online 2022. doi:<a href="https://doi.org/10.1002/pssb.202200508">10.1002/pssb.202200508</a>
  apa: Meier, F., Littmann, M., Bürger, J., Riedl, T., Kool, D., Lindner, J., Reuter,
    D., &#38; As, D. J. (2022). Selective Area Growth of Cubic Gallium Nitride in
    Nanoscopic Silicon Dioxide Masks. <i>Physica Status Solidi (b)</i>, Article 2200508.
    <a href="https://doi.org/10.1002/pssb.202200508">https://doi.org/10.1002/pssb.202200508</a>
  bibtex: '@article{Meier_Littmann_Bürger_Riedl_Kool_Lindner_Reuter_As_2022, title={Selective
    Area Growth of Cubic Gallium Nitride in Nanoscopic Silicon Dioxide Masks}, DOI={<a
    href="https://doi.org/10.1002/pssb.202200508">10.1002/pssb.202200508</a>}, number={2200508},
    journal={physica status solidi (b)}, publisher={Wiley}, author={Meier, Falco and
    Littmann, Mario and Bürger, Julius and Riedl, Thomas and Kool, Daniel and Lindner,
    Jörg and Reuter, Dirk and As, Donat Josef}, year={2022} }'
  chicago: Meier, Falco, Mario Littmann, Julius Bürger, Thomas Riedl, Daniel Kool,
    Jörg Lindner, Dirk Reuter, and Donat Josef As. “Selective Area Growth of Cubic
    Gallium Nitride in Nanoscopic Silicon Dioxide Masks.” <i>Physica Status Solidi
    (b)</i>, 2022. <a href="https://doi.org/10.1002/pssb.202200508">https://doi.org/10.1002/pssb.202200508</a>.
  ieee: 'F. Meier <i>et al.</i>, “Selective Area Growth of Cubic Gallium Nitride in
    Nanoscopic Silicon Dioxide Masks,” <i>physica status solidi (b)</i>, Art. no.
    2200508, 2022, doi: <a href="https://doi.org/10.1002/pssb.202200508">10.1002/pssb.202200508</a>.'
  mla: Meier, Falco, et al. “Selective Area Growth of Cubic Gallium Nitride in Nanoscopic
    Silicon Dioxide Masks.” <i>Physica Status Solidi (b)</i>, 2200508, Wiley, 2022,
    doi:<a href="https://doi.org/10.1002/pssb.202200508">10.1002/pssb.202200508</a>.
  short: F. Meier, M. Littmann, J. Bürger, T. Riedl, D. Kool, J. Lindner, D. Reuter,
    D.J. As, Physica Status Solidi (b) (2022).
date_created: 2023-01-04T14:51:51Z
date_updated: 2023-01-04T14:53:24Z
department:
- _id: '15'
doi: 10.1002/pssb.202200508
keyword:
- Condensed Matter Physics
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
publication: physica status solidi (b)
publication_identifier:
  issn:
  - 0370-1972
  - 1521-3951
publication_status: published
publisher: Wiley
status: public
title: Selective Area Growth of Cubic Gallium Nitride in Nanoscopic Silicon Dioxide
  Masks
type: journal_article
user_id: '77496'
year: '2022'
...
---
_id: '34056'
abstract:
- lang: eng
  text: '<jats:p> A process sequence enabling the large-area fabrication of nanopillar-patterned
    semiconductor templates for selective-area heteroepitaxy is developed. Herein,
    the nanopillar tops surrounded by a SiN<jats:sub>x</jats:sub> mask film serve
    as nanoscale growth areas. The molecular beam epitaxial growth of InAs on such
    patterned GaAs[Formula: see text]A templates is investigated by means of electron
    microscopy. It is found that defect-free nanoscale InAs islands grow selectively
    on the nanopillar tops at a substrate temperature of 425 °C. High-angle annular
    dark-field scanning transmission electron microscopy imaging reveals that for
    a growth temperature of 400 °C, the InAs islands show a tendency to form wurtzite
    phase arms extending along the lateral [Formula: see text] directions from the
    central zinc blende region of the islands. This is ascribed to a temporary self-catalyzed
    vapor–liquid–solid growth on [Formula: see text] B facets, which leads to a kinetically
    induced preference for the nucleation of the wurtzite phase driven by the local,
    instantaneous V/III ratio, and to a concomitant reduction of surface energy of
    the nanoscale diameter arms. </jats:p>'
article_number: '185701'
author:
- first_name: Thomas
  full_name: Riedl, Thomas
  id: '36950'
  last_name: Riedl
- first_name: Vinay S.
  full_name: Kunnathully, Vinay S.
  last_name: Kunnathully
- first_name: Akshay Kumar
  full_name: Verma, Akshay Kumar
  id: '72998'
  last_name: Verma
- first_name: Timo
  full_name: Langer, Timo
  last_name: Langer
- first_name: Dirk
  full_name: Reuter, Dirk
  id: '37763'
  last_name: Reuter
- first_name: Björn
  full_name: Büker, Björn
  last_name: Büker
- first_name: Andreas
  full_name: Hütten, Andreas
  last_name: Hütten
- first_name: Jörg
  full_name: Lindner, Jörg
  id: '20797'
  last_name: Lindner
citation:
  ama: Riedl T, Kunnathully VS, Verma AK, et al. Selective area heteroepitaxy of InAs
    nanostructures on nanopillar-patterned GaAs(111)A. <i>Journal of Applied Physics</i>.
    2022;132(18). doi:<a href="https://doi.org/10.1063/5.0121559">10.1063/5.0121559</a>
  apa: Riedl, T., Kunnathully, V. S., Verma, A. K., Langer, T., Reuter, D., Büker,
    B., Hütten, A., &#38; Lindner, J. (2022). Selective area heteroepitaxy of InAs
    nanostructures on nanopillar-patterned GaAs(111)A. <i>Journal of Applied Physics</i>,
    <i>132</i>(18), Article 185701. <a href="https://doi.org/10.1063/5.0121559">https://doi.org/10.1063/5.0121559</a>
  bibtex: '@article{Riedl_Kunnathully_Verma_Langer_Reuter_Büker_Hütten_Lindner_2022,
    title={Selective area heteroepitaxy of InAs nanostructures on nanopillar-patterned
    GaAs(111)A}, volume={132}, DOI={<a href="https://doi.org/10.1063/5.0121559">10.1063/5.0121559</a>},
    number={18185701}, journal={Journal of Applied Physics}, publisher={AIP Publishing},
    author={Riedl, Thomas and Kunnathully, Vinay S. and Verma, Akshay Kumar and Langer,
    Timo and Reuter, Dirk and Büker, Björn and Hütten, Andreas and Lindner, Jörg},
    year={2022} }'
  chicago: Riedl, Thomas, Vinay S. Kunnathully, Akshay Kumar Verma, Timo Langer, Dirk
    Reuter, Björn Büker, Andreas Hütten, and Jörg Lindner. “Selective Area Heteroepitaxy
    of InAs Nanostructures on Nanopillar-Patterned GaAs(111)A.” <i>Journal of Applied
    Physics</i> 132, no. 18 (2022). <a href="https://doi.org/10.1063/5.0121559">https://doi.org/10.1063/5.0121559</a>.
  ieee: 'T. Riedl <i>et al.</i>, “Selective area heteroepitaxy of InAs nanostructures
    on nanopillar-patterned GaAs(111)A,” <i>Journal of Applied Physics</i>, vol. 132,
    no. 18, Art. no. 185701, 2022, doi: <a href="https://doi.org/10.1063/5.0121559">10.1063/5.0121559</a>.'
  mla: Riedl, Thomas, et al. “Selective Area Heteroepitaxy of InAs Nanostructures
    on Nanopillar-Patterned GaAs(111)A.” <i>Journal of Applied Physics</i>, vol. 132,
    no. 18, 185701, AIP Publishing, 2022, doi:<a href="https://doi.org/10.1063/5.0121559">10.1063/5.0121559</a>.
  short: T. Riedl, V.S. Kunnathully, A.K. Verma, T. Langer, D. Reuter, B. Büker, A.
    Hütten, J. Lindner, Journal of Applied Physics 132 (2022).
date_created: 2022-11-10T14:19:21Z
date_updated: 2023-01-10T12:08:26Z
department:
- _id: '15'
- _id: '230'
doi: 10.1063/5.0121559
intvolume: '       132'
issue: '18'
keyword:
- General Physics and Astronomy
language:
- iso: eng
publication: Journal of Applied Physics
publication_identifier:
  issn:
  - 0021-8979
  - 1089-7550
publication_status: published
publisher: AIP Publishing
status: public
title: Selective area heteroepitaxy of InAs nanostructures on nanopillar-patterned
  GaAs(111)A
type: journal_article
user_id: '77496'
volume: 132
year: '2022'
...
---
_id: '34053'
article_number: '2102159'
author:
- first_name: Thomas
  full_name: Riedl, Thomas
  id: '36950'
  last_name: Riedl
- first_name: Vinay
  full_name: Kunnathully, Vinay
  last_name: Kunnathully
- first_name: Alexander
  full_name: Trapp, Alexander
  last_name: Trapp
- first_name: Timo
  full_name: Langer, Timo
  last_name: Langer
- first_name: Dirk
  full_name: Reuter, Dirk
  id: '37763'
  last_name: Reuter
- first_name: Jörg
  full_name: Lindner, Jörg
  id: '20797'
  last_name: Lindner
citation:
  ama: Riedl T, Kunnathully V, Trapp A, Langer T, Reuter D, Lindner J. Size‐Dependent
    Strain Relaxation in InAs Quantum Dots on Top of GaAs(111)A Nanopillars. <i>Advanced
    Materials Interfaces</i>. 2022;9(11). doi:<a href="https://doi.org/10.1002/admi.202102159">10.1002/admi.202102159</a>
  apa: Riedl, T., Kunnathully, V., Trapp, A., Langer, T., Reuter, D., &#38; Lindner,
    J. (2022). Size‐Dependent Strain Relaxation in InAs Quantum Dots on Top of GaAs(111)A
    Nanopillars. <i>Advanced Materials Interfaces</i>, <i>9</i>(11), Article 2102159.
    <a href="https://doi.org/10.1002/admi.202102159">https://doi.org/10.1002/admi.202102159</a>
  bibtex: '@article{Riedl_Kunnathully_Trapp_Langer_Reuter_Lindner_2022, title={Size‐Dependent
    Strain Relaxation in InAs Quantum Dots on Top of GaAs(111)A Nanopillars}, volume={9},
    DOI={<a href="https://doi.org/10.1002/admi.202102159">10.1002/admi.202102159</a>},
    number={112102159}, journal={Advanced Materials Interfaces}, publisher={Wiley},
    author={Riedl, Thomas and Kunnathully, Vinay and Trapp, Alexander and Langer,
    Timo and Reuter, Dirk and Lindner, Jörg}, year={2022} }'
  chicago: Riedl, Thomas, Vinay Kunnathully, Alexander Trapp, Timo Langer, Dirk Reuter,
    and Jörg Lindner. “Size‐Dependent Strain Relaxation in InAs Quantum Dots on Top
    of GaAs(111)A Nanopillars.” <i>Advanced Materials Interfaces</i> 9, no. 11 (2022).
    <a href="https://doi.org/10.1002/admi.202102159">https://doi.org/10.1002/admi.202102159</a>.
  ieee: 'T. Riedl, V. Kunnathully, A. Trapp, T. Langer, D. Reuter, and J. Lindner,
    “Size‐Dependent Strain Relaxation in InAs Quantum Dots on Top of GaAs(111)A Nanopillars,”
    <i>Advanced Materials Interfaces</i>, vol. 9, no. 11, Art. no. 2102159, 2022,
    doi: <a href="https://doi.org/10.1002/admi.202102159">10.1002/admi.202102159</a>.'
  mla: Riedl, Thomas, et al. “Size‐Dependent Strain Relaxation in InAs Quantum Dots
    on Top of GaAs(111)A Nanopillars.” <i>Advanced Materials Interfaces</i>, vol.
    9, no. 11, 2102159, Wiley, 2022, doi:<a href="https://doi.org/10.1002/admi.202102159">10.1002/admi.202102159</a>.
  short: T. Riedl, V. Kunnathully, A. Trapp, T. Langer, D. Reuter, J. Lindner, Advanced
    Materials Interfaces 9 (2022).
date_created: 2022-11-10T14:11:18Z
date_updated: 2023-01-10T12:09:09Z
department:
- _id: '15'
- _id: '230'
doi: 10.1002/admi.202102159
intvolume: '         9'
issue: '11'
keyword:
- Mechanical Engineering
- Mechanics of Materials
language:
- iso: eng
publication: Advanced Materials Interfaces
publication_identifier:
  issn:
  - 2196-7350
  - 2196-7350
publication_status: published
publisher: Wiley
status: public
title: Size‐Dependent Strain Relaxation in InAs Quantum Dots on Top of GaAs(111)A
  Nanopillars
type: journal_article
user_id: '77496'
volume: 9
year: '2022'
...
---
_id: '34086'
article_number: '2200962'
author:
- first_name: Julius
  full_name: Bürger, Julius
  id: '46952'
  last_name: Bürger
- first_name: Harikrishnan
  full_name: Venugopal, Harikrishnan
  last_name: Venugopal
- first_name: Daniel
  full_name: Kool, Daniel
  id: '44586'
  last_name: Kool
- first_name: Maria Teresa
  full_name: de los Arcos de Pedro, Maria Teresa
  id: '54556'
  last_name: de los Arcos de Pedro
- first_name: Alejandro
  full_name: Gonzalez Orive, Alejandro
  last_name: Gonzalez Orive
- first_name: Guido
  full_name: Grundmeier, Guido
  id: '194'
  last_name: Grundmeier
- first_name: Katharina
  full_name: Brassat, Katharina
  id: '11305'
  last_name: Brassat
- first_name: Jörg
  full_name: Lindner, Jörg
  id: '20797'
  last_name: Lindner
citation:
  ama: Bürger J, Venugopal H, Kool D, et al. High‐Resolution Study of Changes in Morphology
    and Chemistry of Cylindrical PS‐            <i>b</i>            ‐PMMA Block Copolymer
    Nanomasks during Mask Development. <i>Advanced Materials Interfaces</i>. 2022;9(26).
    doi:<a href="https://doi.org/10.1002/admi.202200962">10.1002/admi.202200962</a>
  apa: Bürger, J., Venugopal, H., Kool, D., de los Arcos de Pedro, M. T., Gonzalez
    Orive, A., Grundmeier, G., Brassat, K., &#38; Lindner, J. (2022). High‐Resolution
    Study of Changes in Morphology and Chemistry of Cylindrical PS‐            <i>b</i> 
              ‐PMMA Block Copolymer Nanomasks during Mask Development. <i>Advanced
    Materials Interfaces</i>, <i>9</i>(26), Article 2200962. <a href="https://doi.org/10.1002/admi.202200962">https://doi.org/10.1002/admi.202200962</a>
  bibtex: '@article{Bürger_Venugopal_Kool_de los Arcos de Pedro_Gonzalez Orive_Grundmeier_Brassat_Lindner_2022,
    title={High‐Resolution Study of Changes in Morphology and Chemistry of Cylindrical
    PS‐            <i>b</i>            ‐PMMA Block Copolymer Nanomasks during Mask
    Development}, volume={9}, DOI={<a href="https://doi.org/10.1002/admi.202200962">10.1002/admi.202200962</a>},
    number={262200962}, journal={Advanced Materials Interfaces}, publisher={Wiley},
    author={Bürger, Julius and Venugopal, Harikrishnan and Kool, Daniel and de los
    Arcos de Pedro, Maria Teresa and Gonzalez Orive, Alejandro and Grundmeier, Guido
    and Brassat, Katharina and Lindner, Jörg}, year={2022} }'
  chicago: Bürger, Julius, Harikrishnan Venugopal, Daniel Kool, Maria Teresa de los
    Arcos de Pedro, Alejandro Gonzalez Orive, Guido Grundmeier, Katharina Brassat,
    and Jörg Lindner. “High‐Resolution Study of Changes in Morphology and Chemistry
    of Cylindrical PS‐            <i>b</i>            ‐PMMA Block Copolymer Nanomasks
    during Mask Development.” <i>Advanced Materials Interfaces</i> 9, no. 26 (2022).
    <a href="https://doi.org/10.1002/admi.202200962">https://doi.org/10.1002/admi.202200962</a>.
  ieee: 'J. Bürger <i>et al.</i>, “High‐Resolution Study of Changes in Morphology
    and Chemistry of Cylindrical PS‐            <i>b</i>            ‐PMMA Block Copolymer
    Nanomasks during Mask Development,” <i>Advanced Materials Interfaces</i>, vol.
    9, no. 26, Art. no. 2200962, 2022, doi: <a href="https://doi.org/10.1002/admi.202200962">10.1002/admi.202200962</a>.'
  mla: Bürger, Julius, et al. “High‐Resolution Study of Changes in Morphology and
    Chemistry of Cylindrical PS‐            <i>b</i>            ‐PMMA Block Copolymer
    Nanomasks during Mask Development.” <i>Advanced Materials Interfaces</i>, vol.
    9, no. 26, 2200962, Wiley, 2022, doi:<a href="https://doi.org/10.1002/admi.202200962">10.1002/admi.202200962</a>.
  short: J. Bürger, H. Venugopal, D. Kool, M.T. de los Arcos de Pedro, A. Gonzalez
    Orive, G. Grundmeier, K. Brassat, J. Lindner, Advanced Materials Interfaces 9
    (2022).
date_created: 2022-11-15T14:00:19Z
date_updated: 2023-01-11T10:10:59Z
department:
- _id: '15'
- _id: '230'
doi: 10.1002/admi.202200962
intvolume: '         9'
issue: '26'
keyword:
- General Medicine
language:
- iso: eng
publication: Advanced Materials Interfaces
publication_identifier:
  issn:
  - 2196-7350
  - 2196-7350
publication_status: published
publisher: Wiley
status: public
title: High‐Resolution Study of Changes in Morphology and Chemistry of Cylindrical
  PS‐            <i>b</i>            ‐PMMA Block Copolymer Nanomasks during Mask Development
type: journal_article
user_id: '54556'
volume: 9
year: '2022'
...
---
_id: '40987'
abstract:
- lang: eng
  text: <The replacement of noble metal catalysts by abundant iron as an active compound
    in CO oxidation is of ecologic and economic interest. However, improvement of
    their catalytic performance to the same level as state-of-the-art noble metal
    catalysts requires an in depth understanding of their working principle on an
    atomic level. As a contribution to this aim, a series of iron oxide catalysts
    with varying Fe loadings from 1 to 20 wt% immobilized on a γ-Al2O3 support is
    presented here, and a multidimensional structure–activity correlation is established.
    The CO oxidation activity is correlated to structural details obtained by various
    spectroscopic, diffraction, and microscopic methods, such as PXRD, PDF analysis,
    DRUVS, Mössbauer spectroscopy, STEM-EDX, and XAS. Low Fe loadings lead to less
    agglomerated but high percentual amounts of isolated, tetrahedrally coordinated
    iron oxide species, while the absolute amount of isolated species reaches its
    maximum at high Fe loadings. Consequently, the highest CO oxidation activity in
    terms of turnover frequencies can be correlated to small, finely dispersed iron
    oxide species with a large amount of tetrahedrally oxygen coordinated iron sites,
    while the overall amount of isolated iron oxide species correlates with a lower
    light-off temperature.
article_number: '675'
author:
- first_name: Steffen
  full_name: Schlicher, Steffen
  last_name: Schlicher
- first_name: Nils
  full_name: Prinz, Nils
  last_name: Prinz
- first_name: Julius
  full_name: Bürger, Julius
  id: '46952'
  last_name: Bürger
- first_name: Andreas
  full_name: Omlor, Andreas
  last_name: Omlor
- first_name: Christian
  full_name: Singer, Christian
  last_name: Singer
- first_name: Mirijam
  full_name: Zobel, Mirijam
  last_name: Zobel
- first_name: Roland
  full_name: Schoch, Roland
  id: '48467'
  last_name: Schoch
  orcid: 0000-0003-2061-7289
- first_name: Jörg K. N.
  full_name: Lindner, Jörg K. N.
  id: '20797'
  last_name: Lindner
- first_name: Volker
  full_name: Schünemann, Volker
  last_name: Schünemann
- first_name: Sven
  full_name: Kureti, Sven
  last_name: Kureti
- first_name: Matthias
  full_name: Bauer, Matthias
  id: '47241'
  last_name: Bauer
  orcid: 0000-0002-9294-6076
citation:
  ama: Schlicher S, Prinz N, Bürger J, et al. Quality or Quantity? How Structural
    Parameters Affect Catalytic Activity of Iron Oxides for CO Oxidation. <i>Catalysts</i>.
    2022;12(6). doi:<a href="https://doi.org/10.3390/catal12060675">10.3390/catal12060675</a>
  apa: Schlicher, S., Prinz, N., Bürger, J., Omlor, A., Singer, C., Zobel, M., Schoch,
    R., Lindner, J. K. N., Schünemann, V., Kureti, S., &#38; Bauer, M. (2022). Quality
    or Quantity? How Structural Parameters Affect Catalytic Activity of Iron Oxides
    for CO Oxidation. <i>Catalysts</i>, <i>12</i>(6), Article 675. <a href="https://doi.org/10.3390/catal12060675">https://doi.org/10.3390/catal12060675</a>
  bibtex: '@article{Schlicher_Prinz_Bürger_Omlor_Singer_Zobel_Schoch_Lindner_Schünemann_Kureti_et
    al._2022, title={Quality or Quantity? How Structural Parameters Affect Catalytic
    Activity of Iron Oxides for CO Oxidation}, volume={12}, DOI={<a href="https://doi.org/10.3390/catal12060675">10.3390/catal12060675</a>},
    number={6675}, journal={Catalysts}, publisher={MDPI AG}, author={Schlicher, Steffen
    and Prinz, Nils and Bürger, Julius and Omlor, Andreas and Singer, Christian and
    Zobel, Mirijam and Schoch, Roland and Lindner, Jörg K. N. and Schünemann, Volker
    and Kureti, Sven and et al.}, year={2022} }'
  chicago: Schlicher, Steffen, Nils Prinz, Julius Bürger, Andreas Omlor, Christian
    Singer, Mirijam Zobel, Roland Schoch, et al. “Quality or Quantity? How Structural
    Parameters Affect Catalytic Activity of Iron Oxides for CO Oxidation.” <i>Catalysts</i>
    12, no. 6 (2022). <a href="https://doi.org/10.3390/catal12060675">https://doi.org/10.3390/catal12060675</a>.
  ieee: 'S. Schlicher <i>et al.</i>, “Quality or Quantity? How Structural Parameters
    Affect Catalytic Activity of Iron Oxides for CO Oxidation,” <i>Catalysts</i>,
    vol. 12, no. 6, Art. no. 675, 2022, doi: <a href="https://doi.org/10.3390/catal12060675">10.3390/catal12060675</a>.'
  mla: Schlicher, Steffen, et al. “Quality or Quantity? How Structural Parameters
    Affect Catalytic Activity of Iron Oxides for CO Oxidation.” <i>Catalysts</i>,
    vol. 12, no. 6, 675, MDPI AG, 2022, doi:<a href="https://doi.org/10.3390/catal12060675">10.3390/catal12060675</a>.
  short: S. Schlicher, N. Prinz, J. Bürger, A. Omlor, C. Singer, M. Zobel, R. Schoch,
    J.K.N. Lindner, V. Schünemann, S. Kureti, M. Bauer, Catalysts 12 (2022).
date_created: 2023-01-30T16:24:41Z
date_updated: 2023-08-17T06:57:31Z
department:
- _id: '35'
- _id: '306'
- _id: '15'
doi: 10.3390/catal12060675
intvolume: '        12'
issue: '6'
keyword:
- Physical and Theoretical Chemistry
- Catalysis
- General Environmental Science
- Key
language:
- iso: eng
publication: Catalysts
publication_identifier:
  issn:
  - 2073-4344
publication_status: published
publisher: MDPI AG
status: public
title: Quality or Quantity? How Structural Parameters Affect Catalytic Activity of
  Iron Oxides for CO Oxidation
type: journal_article
user_id: '14931'
volume: 12
year: '2022'
...
---
_id: '21374'
abstract:
- lang: eng
  text: <jats:p>A dark-field scanning transmission ion microscopy detector was designed
    for the helium ion microscope. The detection principle is based on a secondary
    electron conversion holder with an exchangeable aperture strip allowing its acceptance
    angle to be tuned from 3 to 98 mrad. The contrast mechanism and performance were
    investigated using freestanding nanometer-thin carbon membranes. The results demonstrate
    that the detector can be optimized either for most efficient signal collection
    or for maximum image contrast. The designed setup allows for the imaging of thin
    low-density materials that otherwise provide little signal or contrast and for
    a clear end-point detection in the fabrication of nanopores. In addition, the
    detector is able to determine the thickness of membranes with sub-nanometer precision
    by quantitatively evaluating the image signal and comparing the results with Monte
    Carlo simulations. The thickness determined by the dark-field transmission detector
    is compared to X-ray photoelectron spectroscopy and energy-filtered transmission
    electron microscopy measurements.</jats:p>
author:
- first_name: Daniel
  full_name: Emmrich, Daniel
  last_name: Emmrich
- first_name: Annalena
  full_name: Wolff, Annalena
  last_name: Wolff
- first_name: Nikolaus
  full_name: Meyerbröker, Nikolaus
  last_name: Meyerbröker
- first_name: Jörg
  full_name: Lindner, Jörg
  id: '20797'
  last_name: Lindner
- first_name: André
  full_name: Beyer, André
  last_name: Beyer
- first_name: Armin
  full_name: Gölzhäuser, Armin
  last_name: Gölzhäuser
citation:
  ama: Emmrich D, Wolff A, Meyerbröker N, Lindner J, Beyer A, Gölzhäuser A. Scanning
    transmission helium ion microscopy on carbon nanomembranes. <i>Beilstein Journal
    of Nanotechnology</i>. 2021:222-231. doi:<a href="https://doi.org/10.3762/bjnano.12.18">10.3762/bjnano.12.18</a>
  apa: Emmrich, D., Wolff, A., Meyerbröker, N., Lindner, J., Beyer, A., &#38; Gölzhäuser,
    A. (2021). Scanning transmission helium ion microscopy on carbon nanomembranes.
    <i>Beilstein Journal of Nanotechnology</i>, 222–231. <a href="https://doi.org/10.3762/bjnano.12.18">https://doi.org/10.3762/bjnano.12.18</a>
  bibtex: '@article{Emmrich_Wolff_Meyerbröker_Lindner_Beyer_Gölzhäuser_2021, title={Scanning
    transmission helium ion microscopy on carbon nanomembranes}, DOI={<a href="https://doi.org/10.3762/bjnano.12.18">10.3762/bjnano.12.18</a>},
    journal={Beilstein Journal of Nanotechnology}, author={Emmrich, Daniel and Wolff,
    Annalena and Meyerbröker, Nikolaus and Lindner, Jörg and Beyer, André and Gölzhäuser,
    Armin}, year={2021}, pages={222–231} }'
  chicago: Emmrich, Daniel, Annalena Wolff, Nikolaus Meyerbröker, Jörg Lindner, André
    Beyer, and Armin Gölzhäuser. “Scanning Transmission Helium Ion Microscopy on Carbon
    Nanomembranes.” <i>Beilstein Journal of Nanotechnology</i>, 2021, 222–31. <a href="https://doi.org/10.3762/bjnano.12.18">https://doi.org/10.3762/bjnano.12.18</a>.
  ieee: D. Emmrich, A. Wolff, N. Meyerbröker, J. Lindner, A. Beyer, and A. Gölzhäuser,
    “Scanning transmission helium ion microscopy on carbon nanomembranes,” <i>Beilstein
    Journal of Nanotechnology</i>, pp. 222–231, 2021.
  mla: Emmrich, Daniel, et al. “Scanning Transmission Helium Ion Microscopy on Carbon
    Nanomembranes.” <i>Beilstein Journal of Nanotechnology</i>, 2021, pp. 222–31,
    doi:<a href="https://doi.org/10.3762/bjnano.12.18">10.3762/bjnano.12.18</a>.
  short: D. Emmrich, A. Wolff, N. Meyerbröker, J. Lindner, A. Beyer, A. Gölzhäuser,
    Beilstein Journal of Nanotechnology (2021) 222–231.
date_created: 2021-03-04T10:12:59Z
date_updated: 2022-01-06T06:54:57Z
department:
- _id: '286'
- _id: '321'
- _id: '15'
- _id: '9'
doi: 10.3762/bjnano.12.18
language:
- iso: eng
page: 222-231
publication: Beilstein Journal of Nanotechnology
publication_identifier:
  issn:
  - 2190-4286
publication_status: published
status: public
title: Scanning transmission helium ion microscopy on carbon nanomembranes
type: journal_article
user_id: '77496'
year: '2021'
...
---
_id: '34087'
author:
- first_name: Steffen
  full_name: Knust, Steffen
  last_name: Knust
- first_name: Lukas
  full_name: Ruhm, Lukas
  last_name: Ruhm
- first_name: Andreas
  full_name: Kuhlmann, Andreas
  last_name: Kuhlmann
- first_name: Dennis
  full_name: Meinderink, Dennis
  id: '32378'
  last_name: Meinderink
  orcid: 0000-0002-2755-6514
- first_name: Julius
  full_name: Bürger, Julius
  id: '46952'
  last_name: Bürger
- first_name: Jörg
  full_name: Lindner, Jörg
  id: '20797'
  last_name: Lindner
- first_name: Maria Teresa
  full_name: de los Arcos de Pedro, Maria Teresa
  id: '54556'
  last_name: de los Arcos de Pedro
- first_name: Guido
  full_name: Grundmeier, Guido
  id: '194'
  last_name: Grundmeier
citation:
  ama: Knust S, Ruhm L, Kuhlmann A, et al. In situ backside Raman spectroscopy of
    zinc oxide nanorods in an atmospheric‐pressure dielectric barrier discharge plasma.
    <i>Journal of Raman Spectroscopy</i>. 2021;52(7):1237-1245. doi:<a href="https://doi.org/10.1002/jrs.6123">10.1002/jrs.6123</a>
  apa: Knust, S., Ruhm, L., Kuhlmann, A., Meinderink, D., Bürger, J., Lindner, J.,
    de los Arcos de Pedro, M. T., &#38; Grundmeier, G. (2021). In situ backside Raman
    spectroscopy of zinc oxide nanorods in an atmospheric‐pressure dielectric barrier
    discharge plasma. <i>Journal of Raman Spectroscopy</i>, <i>52</i>(7), 1237–1245.
    <a href="https://doi.org/10.1002/jrs.6123">https://doi.org/10.1002/jrs.6123</a>
  bibtex: '@article{Knust_Ruhm_Kuhlmann_Meinderink_Bürger_Lindner_de los Arcos de
    Pedro_Grundmeier_2021, title={In situ backside Raman spectroscopy of zinc oxide
    nanorods in an atmospheric‐pressure dielectric barrier discharge plasma}, volume={52},
    DOI={<a href="https://doi.org/10.1002/jrs.6123">10.1002/jrs.6123</a>}, number={7},
    journal={Journal of Raman Spectroscopy}, publisher={Wiley}, author={Knust, Steffen
    and Ruhm, Lukas and Kuhlmann, Andreas and Meinderink, Dennis and Bürger, Julius
    and Lindner, Jörg and de los Arcos de Pedro, Maria Teresa and Grundmeier, Guido},
    year={2021}, pages={1237–1245} }'
  chicago: 'Knust, Steffen, Lukas Ruhm, Andreas Kuhlmann, Dennis Meinderink, Julius
    Bürger, Jörg Lindner, Maria Teresa de los Arcos de Pedro, and Guido Grundmeier.
    “In Situ Backside Raman Spectroscopy of Zinc Oxide Nanorods in an Atmospheric‐pressure
    Dielectric Barrier Discharge Plasma.” <i>Journal of Raman Spectroscopy</i> 52,
    no. 7 (2021): 1237–45. <a href="https://doi.org/10.1002/jrs.6123">https://doi.org/10.1002/jrs.6123</a>.'
  ieee: 'S. Knust <i>et al.</i>, “In situ backside Raman spectroscopy of zinc oxide
    nanorods in an atmospheric‐pressure dielectric barrier discharge plasma,” <i>Journal
    of Raman Spectroscopy</i>, vol. 52, no. 7, pp. 1237–1245, 2021, doi: <a href="https://doi.org/10.1002/jrs.6123">10.1002/jrs.6123</a>.'
  mla: Knust, Steffen, et al. “In Situ Backside Raman Spectroscopy of Zinc Oxide Nanorods
    in an Atmospheric‐pressure Dielectric Barrier Discharge Plasma.” <i>Journal of
    Raman Spectroscopy</i>, vol. 52, no. 7, Wiley, 2021, pp. 1237–45, doi:<a href="https://doi.org/10.1002/jrs.6123">10.1002/jrs.6123</a>.
  short: S. Knust, L. Ruhm, A. Kuhlmann, D. Meinderink, J. Bürger, J. Lindner, M.T.
    de los Arcos de Pedro, G. Grundmeier, Journal of Raman Spectroscopy 52 (2021)
    1237–1245.
date_created: 2022-11-15T14:08:53Z
date_updated: 2023-01-04T14:51:10Z
department:
- _id: '15'
doi: 10.1002/jrs.6123
intvolume: '        52'
issue: '7'
keyword:
- Spectroscopy
- General Materials Science
language:
- iso: eng
page: 1237-1245
publication: Journal of Raman Spectroscopy
publication_identifier:
  issn:
  - 0377-0486
  - 1097-4555
publication_status: published
publisher: Wiley
status: public
title: In situ backside Raman spectroscopy of zinc oxide nanorods in an atmospheric‐pressure
  dielectric barrier discharge plasma
type: journal_article
user_id: '77496'
volume: 52
year: '2021'
...
---
_id: '34054'
abstract:
- lang: eng
  text: <jats:title>Abstract</jats:title><jats:p>Colloidal nanosphere monolayers—used
    as a lithography mask for site-controlled material deposition or removal—offer
    the possibility of cost-effective patterning of large surface areas. In the present
    study, an automated analysis of scanning electron microscopy (SEM) images is described,
    which enables the recognition of the individual nanospheres in densely packed
    monolayers in order to perform a statistical quantification of the sphere size,
    mask opening size, and sphere-sphere separation distributions. Search algorithms
    based on Fourier transformation, cross-correlation, multiple-angle intensity profiling,
    and sphere edge point detection techniques allow for a sphere detection efficiency
    of at least 99.8%, even in the case of considerable sphere size variations. While
    the sphere positions and diameters are determined by fitting circles to the spheres
    edge points, the openings between sphere triples are detected by intensity thresholding.
    For the analyzed polystyrene sphere monolayers with sphere sizes between 220 and
    600 nm and a diameter spread of around 3% coefficients of variation of 6.8–8.1%
    for the opening size are found. By correlating the mentioned size distributions,
    it is shown that, in this case, the dominant contribution to the opening size
    variation stems from nanometer-scale positional variations of the spheres.</jats:p>
author:
- first_name: Thomas
  full_name: Riedl, Thomas
  id: '36950'
  last_name: Riedl
- first_name: Jörg
  full_name: Lindner, Jörg
  id: '20797'
  last_name: Lindner
citation:
  ama: Riedl T, Lindner J. Automated SEM Image Analysis of the Sphere Diameter, Sphere-Sphere
    Separation, and Opening Size Distributions of Nanosphere Lithography Masks. <i>Microscopy
    and Microanalysis</i>. 2021;28(1):185-195. doi:<a href="https://doi.org/10.1017/s1431927621013866">10.1017/s1431927621013866</a>
  apa: Riedl, T., &#38; Lindner, J. (2021). Automated SEM Image Analysis of the Sphere
    Diameter, Sphere-Sphere Separation, and Opening Size Distributions of Nanosphere
    Lithography Masks. <i>Microscopy and Microanalysis</i>, <i>28</i>(1), 185–195.
    <a href="https://doi.org/10.1017/s1431927621013866">https://doi.org/10.1017/s1431927621013866</a>
  bibtex: '@article{Riedl_Lindner_2021, title={Automated SEM Image Analysis of the
    Sphere Diameter, Sphere-Sphere Separation, and Opening Size Distributions of Nanosphere
    Lithography Masks}, volume={28}, DOI={<a href="https://doi.org/10.1017/s1431927621013866">10.1017/s1431927621013866</a>},
    number={1}, journal={Microscopy and Microanalysis}, publisher={Cambridge University
    Press (CUP)}, author={Riedl, Thomas and Lindner, Jörg}, year={2021}, pages={185–195}
    }'
  chicago: 'Riedl, Thomas, and Jörg Lindner. “Automated SEM Image Analysis of the
    Sphere Diameter, Sphere-Sphere Separation, and Opening Size Distributions of Nanosphere
    Lithography Masks.” <i>Microscopy and Microanalysis</i> 28, no. 1 (2021): 185–95.
    <a href="https://doi.org/10.1017/s1431927621013866">https://doi.org/10.1017/s1431927621013866</a>.'
  ieee: 'T. Riedl and J. Lindner, “Automated SEM Image Analysis of the Sphere Diameter,
    Sphere-Sphere Separation, and Opening Size Distributions of Nanosphere Lithography
    Masks,” <i>Microscopy and Microanalysis</i>, vol. 28, no. 1, pp. 185–195, 2021,
    doi: <a href="https://doi.org/10.1017/s1431927621013866">10.1017/s1431927621013866</a>.'
  mla: Riedl, Thomas, and Jörg Lindner. “Automated SEM Image Analysis of the Sphere
    Diameter, Sphere-Sphere Separation, and Opening Size Distributions of Nanosphere
    Lithography Masks.” <i>Microscopy and Microanalysis</i>, vol. 28, no. 1, Cambridge
    University Press (CUP), 2021, pp. 185–95, doi:<a href="https://doi.org/10.1017/s1431927621013866">10.1017/s1431927621013866</a>.
  short: T. Riedl, J. Lindner, Microscopy and Microanalysis 28 (2021) 185–195.
date_created: 2022-11-10T14:13:19Z
date_updated: 2023-01-10T12:11:24Z
department:
- _id: '15'
- _id: '230'
doi: 10.1017/s1431927621013866
intvolume: '        28'
issue: '1'
keyword:
- Instrumentation
language:
- iso: eng
page: 185-195
publication: Microscopy and Microanalysis
publication_identifier:
  issn:
  - 1431-9276
  - 1435-8115
publication_status: published
publisher: Cambridge University Press (CUP)
status: public
title: Automated SEM Image Analysis of the Sphere Diameter, Sphere-Sphere Separation,
  and Opening Size Distributions of Nanosphere Lithography Masks
type: journal_article
user_id: '77496'
volume: 28
year: '2021'
...
---
_id: '34092'
abstract:
- lang: eng
  text: <jats:p>Block copolymer (BCP) self-assembly is a promising tool for next generation
    lithography as microphase separated polymer domains in thin films can act as templates
    for surface nanopatterning with sub-20 nm features. The replicated patterns can,
    however, only be as precise as their templates. Thus, the investigation of the
    morphology of polymer domains is of great importance. Commonly used analytical
    techniques (neutron scattering, scanning force microscopy) either lack spatial
    information or nanoscale resolution. Using advanced analytical (scanning) transmission
    electron microscopy ((S)TEM), we provide real space information on polymer domain
    morphology and interfaces between polystyrene (PS) and polymethylmethacrylate
    (PMMA) in cylinder- and lamellae-forming BCPs at highest resolution. This allows
    us to correlate the internal structure of polymer domains with line edge roughnesses,
    interface widths and domain sizes. STEM is employed for high-resolution imaging,
    electron energy loss spectroscopy and energy filtered TEM (EFTEM) spectroscopic
    imaging for material identification and EFTEM thickness mapping for visualisation
    of material densities at defects. The volume fraction of non-phase separated polymer
    species can be analysed by EFTEM. These methods give new insights into the morphology
    of polymer domains the exact knowledge of which will allow to improve pattern
    quality for nanolithography.</jats:p>
article_number: '141'
author:
- first_name: Julius
  full_name: Bürger, Julius
  id: '46952'
  last_name: Bürger
- first_name: Vinay
  full_name: Kunnathully, Vinay
  last_name: Kunnathully
- first_name: Daniel
  full_name: Kool, Daniel
  id: '44586'
  last_name: Kool
- first_name: Jörg
  full_name: Lindner, Jörg
  id: '20797'
  last_name: Lindner
- first_name: Katharina
  full_name: Brassat, Katharina
  id: '11305'
  last_name: Brassat
citation:
  ama: Bürger J, Kunnathully V, Kool D, Lindner J, Brassat K. Characterisation of
    the PS-PMMA Interfaces in Microphase Separated Block Copolymer Thin Films by Analytical
    (S)TEM. <i>Nanomaterials</i>. 2020;10(1). doi:<a href="https://doi.org/10.3390/nano10010141">10.3390/nano10010141</a>
  apa: Bürger, J., Kunnathully, V., Kool, D., Lindner, J., &#38; Brassat, K. (2020).
    Characterisation of the PS-PMMA Interfaces in Microphase Separated Block Copolymer
    Thin Films by Analytical (S)TEM. <i>Nanomaterials</i>, <i>10</i>(1), Article 141.
    <a href="https://doi.org/10.3390/nano10010141">https://doi.org/10.3390/nano10010141</a>
  bibtex: '@article{Bürger_Kunnathully_Kool_Lindner_Brassat_2020, title={Characterisation
    of the PS-PMMA Interfaces in Microphase Separated Block Copolymer Thin Films by
    Analytical (S)TEM}, volume={10}, DOI={<a href="https://doi.org/10.3390/nano10010141">10.3390/nano10010141</a>},
    number={1141}, journal={Nanomaterials}, publisher={MDPI AG}, author={Bürger, Julius
    and Kunnathully, Vinay and Kool, Daniel and Lindner, Jörg and Brassat, Katharina},
    year={2020} }'
  chicago: Bürger, Julius, Vinay Kunnathully, Daniel Kool, Jörg Lindner, and Katharina
    Brassat. “Characterisation of the PS-PMMA Interfaces in Microphase Separated Block
    Copolymer Thin Films by Analytical (S)TEM.” <i>Nanomaterials</i> 10, no. 1 (2020).
    <a href="https://doi.org/10.3390/nano10010141">https://doi.org/10.3390/nano10010141</a>.
  ieee: 'J. Bürger, V. Kunnathully, D. Kool, J. Lindner, and K. Brassat, “Characterisation
    of the PS-PMMA Interfaces in Microphase Separated Block Copolymer Thin Films by
    Analytical (S)TEM,” <i>Nanomaterials</i>, vol. 10, no. 1, Art. no. 141, 2020,
    doi: <a href="https://doi.org/10.3390/nano10010141">10.3390/nano10010141</a>.'
  mla: Bürger, Julius, et al. “Characterisation of the PS-PMMA Interfaces in Microphase
    Separated Block Copolymer Thin Films by Analytical (S)TEM.” <i>Nanomaterials</i>,
    vol. 10, no. 1, 141, MDPI AG, 2020, doi:<a href="https://doi.org/10.3390/nano10010141">10.3390/nano10010141</a>.
  short: J. Bürger, V. Kunnathully, D. Kool, J. Lindner, K. Brassat, Nanomaterials
    10 (2020).
date_created: 2022-11-15T14:20:33Z
date_updated: 2023-01-10T12:11:57Z
department:
- _id: '15'
- _id: '230'
doi: 10.3390/nano10010141
intvolume: '        10'
issue: '1'
keyword:
- General Materials Science
- General Chemical Engineering
language:
- iso: eng
publication: Nanomaterials
publication_identifier:
  issn:
  - 2079-4991
publication_status: published
publisher: MDPI AG
status: public
title: Characterisation of the PS-PMMA Interfaces in Microphase Separated Block Copolymer
  Thin Films by Analytical (S)TEM
type: journal_article
user_id: '77496'
volume: 10
year: '2020'
...
---
_id: '34093'
article_number: '014602'
author:
- first_name: Thomas
  full_name: Riedl, Thomas
  id: '36950'
  last_name: Riedl
- first_name: V. S.
  full_name: Kunnathully, V. S.
  last_name: Kunnathully
- first_name: A.
  full_name: Trapp, A.
  last_name: Trapp
- first_name: T.
  full_name: Langer, T.
  last_name: Langer
- first_name: Dirk
  full_name: Reuter, Dirk
  id: '37763'
  last_name: Reuter
- first_name: Jörg
  full_name: Lindner, Jörg
  id: '20797'
  last_name: Lindner
citation:
  ama: Riedl T, Kunnathully VS, Trapp A, Langer T, Reuter D, Lindner J. Strain-driven
    InAs island growth on top of GaAs(111) nanopillars. <i>Physical Review Materials</i>.
    2020;4(1). doi:<a href="https://doi.org/10.1103/physrevmaterials.4.014602">10.1103/physrevmaterials.4.014602</a>
  apa: Riedl, T., Kunnathully, V. S., Trapp, A., Langer, T., Reuter, D., &#38; Lindner,
    J. (2020). Strain-driven InAs island growth on top of GaAs(111) nanopillars. <i>Physical
    Review Materials</i>, <i>4</i>(1), Article 014602. <a href="https://doi.org/10.1103/physrevmaterials.4.014602">https://doi.org/10.1103/physrevmaterials.4.014602</a>
  bibtex: '@article{Riedl_Kunnathully_Trapp_Langer_Reuter_Lindner_2020, title={Strain-driven
    InAs island growth on top of GaAs(111) nanopillars}, volume={4}, DOI={<a href="https://doi.org/10.1103/physrevmaterials.4.014602">10.1103/physrevmaterials.4.014602</a>},
    number={1014602}, journal={Physical Review Materials}, publisher={American Physical
    Society (APS)}, author={Riedl, Thomas and Kunnathully, V. S. and Trapp, A. and
    Langer, T. and Reuter, Dirk and Lindner, Jörg}, year={2020} }'
  chicago: Riedl, Thomas, V. S. Kunnathully, A. Trapp, T. Langer, Dirk Reuter, and
    Jörg Lindner. “Strain-Driven InAs Island Growth on Top of GaAs(111) Nanopillars.”
    <i>Physical Review Materials</i> 4, no. 1 (2020). <a href="https://doi.org/10.1103/physrevmaterials.4.014602">https://doi.org/10.1103/physrevmaterials.4.014602</a>.
  ieee: 'T. Riedl, V. S. Kunnathully, A. Trapp, T. Langer, D. Reuter, and J. Lindner,
    “Strain-driven InAs island growth on top of GaAs(111) nanopillars,” <i>Physical
    Review Materials</i>, vol. 4, no. 1, Art. no. 014602, 2020, doi: <a href="https://doi.org/10.1103/physrevmaterials.4.014602">10.1103/physrevmaterials.4.014602</a>.'
  mla: Riedl, Thomas, et al. “Strain-Driven InAs Island Growth on Top of GaAs(111)
    Nanopillars.” <i>Physical Review Materials</i>, vol. 4, no. 1, 014602, American
    Physical Society (APS), 2020, doi:<a href="https://doi.org/10.1103/physrevmaterials.4.014602">10.1103/physrevmaterials.4.014602</a>.
  short: T. Riedl, V.S. Kunnathully, A. Trapp, T. Langer, D. Reuter, J. Lindner, Physical
    Review Materials 4 (2020).
date_created: 2022-11-15T14:21:41Z
date_updated: 2023-01-10T12:12:13Z
department:
- _id: '15'
- _id: '230'
doi: 10.1103/physrevmaterials.4.014602
intvolume: '         4'
issue: '1'
keyword:
- Physics and Astronomy (miscellaneous)
- General Materials Science
language:
- iso: eng
publication: Physical Review Materials
publication_identifier:
  issn:
  - 2475-9953
publication_status: published
publisher: American Physical Society (APS)
status: public
title: Strain-driven InAs island growth on top of GaAs(111) nanopillars
type: journal_article
user_id: '77496'
volume: 4
year: '2020'
...
---
_id: '34088'
article_number: '113118'
author:
- first_name: Julius
  full_name: Bürger, Julius
  id: '46952'
  last_name: Bürger
- first_name: Thomas
  full_name: Riedl, Thomas
  id: '36950'
  last_name: Riedl
- first_name: Jörg
  full_name: Lindner, Jörg
  id: '20797'
  last_name: Lindner
citation:
  ama: Bürger J, Riedl T, Lindner J. Influence of lens aberrations, specimen thickness
    and tilt on differential phase contrast STEM images. <i>Ultramicroscopy</i>. 2020;219.
    doi:<a href="https://doi.org/10.1016/j.ultramic.2020.113118">10.1016/j.ultramic.2020.113118</a>
  apa: Bürger, J., Riedl, T., &#38; Lindner, J. (2020). Influence of lens aberrations,
    specimen thickness and tilt on differential phase contrast STEM images. <i>Ultramicroscopy</i>,
    <i>219</i>, Article 113118. <a href="https://doi.org/10.1016/j.ultramic.2020.113118">https://doi.org/10.1016/j.ultramic.2020.113118</a>
  bibtex: '@article{Bürger_Riedl_Lindner_2020, title={Influence of lens aberrations,
    specimen thickness and tilt on differential phase contrast STEM images}, volume={219},
    DOI={<a href="https://doi.org/10.1016/j.ultramic.2020.113118">10.1016/j.ultramic.2020.113118</a>},
    number={113118}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Bürger,
    Julius and Riedl, Thomas and Lindner, Jörg}, year={2020} }'
  chicago: Bürger, Julius, Thomas Riedl, and Jörg Lindner. “Influence of Lens Aberrations,
    Specimen Thickness and Tilt on Differential Phase Contrast STEM Images.” <i>Ultramicroscopy</i>
    219 (2020). <a href="https://doi.org/10.1016/j.ultramic.2020.113118">https://doi.org/10.1016/j.ultramic.2020.113118</a>.
  ieee: 'J. Bürger, T. Riedl, and J. Lindner, “Influence of lens aberrations, specimen
    thickness and tilt on differential phase contrast STEM images,” <i>Ultramicroscopy</i>,
    vol. 219, Art. no. 113118, 2020, doi: <a href="https://doi.org/10.1016/j.ultramic.2020.113118">10.1016/j.ultramic.2020.113118</a>.'
  mla: Bürger, Julius, et al. “Influence of Lens Aberrations, Specimen Thickness and
    Tilt on Differential Phase Contrast STEM Images.” <i>Ultramicroscopy</i>, vol.
    219, 113118, Elsevier BV, 2020, doi:<a href="https://doi.org/10.1016/j.ultramic.2020.113118">10.1016/j.ultramic.2020.113118</a>.
  short: J. Bürger, T. Riedl, J. Lindner, Ultramicroscopy 219 (2020).
date_created: 2022-11-15T14:15:16Z
date_updated: 2023-01-10T12:12:40Z
department:
- _id: '15'
- _id: '230'
doi: 10.1016/j.ultramic.2020.113118
intvolume: '       219'
keyword:
- Instrumentation
- Atomic and Molecular Physics
- and Optics
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
publication: Ultramicroscopy
publication_identifier:
  issn:
  - 0304-3991
publication_status: published
publisher: Elsevier BV
status: public
title: Influence of lens aberrations, specimen thickness and tilt on differential
  phase contrast STEM images
type: journal_article
user_id: '77496'
volume: 219
year: '2020'
...