@inproceedings{13010,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre}},
  booktitle    = {{IEEE International Test Conference (ITC'96)}},
  pages        = {{195--204}},
  publisher    = {{IEEE}},
  title        = {{{Mixed-Mode BIST Using Embedded Processors}}},
  doi          = {{10.1109/test.1996.556962}},
  year         = {{1996}},
}

@techreport{13026,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  title        = {{{Synthesis Procedures for Self-Testable Controllers}}},
  year         = {{1995}},
}

@techreport{13027,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim and Goncalves, F. and Paulo Teixeira, Joao}},
  title        = {{{Evaluation of Self-Testable Controller Architectures Based on Realistic Fault Analysis}}},
  year         = {{1995}},
}

@techreport{13028,
  author       = {{Hellebrand, Sybille and Herzog, Maik and Wunderlich, Hans-Joachim}},
  title        = {{{Partitioning of CMOS-Circuits for On-Chip IDDQ-Testing}}},
  year         = {{1995}},
}

@misc{13086,
  author       = {{Hellebrand, Sybille and Reeb, Birgit and Tarnick, Steffen and Wunderlich, Hans-Joachim}},
  keywords     = {{WORKSHOP}},
  title        = {{{Pattern Generation for a Deterministic BIST Scheme}}},
  year         = {{1995}},
}

@article{13011,
  author       = {{Hellebrand, Sybille and Rajski, Janusz and Tarnick, Steffen and Venkataraman, Srikanth and Courtois, B.}},
  journal      = {{IEEE Transactions on Computers}},
  number       = {{2}},
  pages        = {{223--233}},
  publisher    = {{IEEE}},
  title        = {{{Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers}}},
  doi          = {{10.1109/12.364534}},
  volume       = {{44}},
  year         = {{1995}},
}

@inproceedings{13012,
  author       = {{Hellebrand, Sybille and Reeb, Birgit and Tarnick, Steffen and Wunderlich, Hans-Joachim}},
  booktitle    = {{ACM/IEEE International Conference on Computer Aided Design (ICCAD'95)}},
  pages        = {{88--94}},
  publisher    = {{IEEE}},
  title        = {{{Pattern Generation for a Deterministic BIST Scheme}}},
  doi          = {{10.1109/iccad.1995.479997}},
  year         = {{1995}},
}

@techreport{13024,
  author       = {{Hellebrand, Sybille and Juergensen, Arne and Wunderlich, Hans-Joachim}},
  title        = {{{Synthesis for Off-line Testability}}},
  year         = {{1994}},
}

@techreport{13025,
  author       = {{Hellebrand, Sybille and Juergensen, Arne and Stroele, Albrecht and Wunderlich, Hans-Joachim}},
  title        = {{{Chip Level Test Planning for Controlling the Tradeoff between Hardware Overhead and Test Time}}},
  year         = {{1994}},
}

@misc{13083,
  author       = {{Venkataraman, Srikanth and Rajski, Janusz and Hellebrand, Sybille and Tarnick, Steffen}},
  keywords     = {{WORKSHOP}},
  title        = {{{Effiziente Testsatzkodierung für Prüfpfad-basierte Selbsttestarchitekturen}}},
  year         = {{1994}},
}

@misc{13084,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  keywords     = {{WORKSHOP}},
  title        = {{{Ein Verfahren zur testfreundlichen Steuerwerkssynthese}}},
  year         = {{1994}},
}

@misc{13085,
  author       = {{Hellebrand, Sybille and Paulo Teixeira, Joao and Wunderlich, Hans-Joachim}},
  keywords     = {{WORKSHOP}},
  title        = {{{Synthesis for Testability - the ARCHIMEDES Approach}}},
  year         = {{1994}},
}

@inproceedings{13014,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  booktitle    = {{ACM/IEEE International Conference on Computer-Aided Design (ICCAD'94)}},
  pages        = {{110--116}},
  publisher    = {{IEEE}},
  title        = {{{An Efficient Procedure for the Synthesis of Fast Self-Testable Controller Structures}}},
  doi          = {{10.1109/iccad.1994.629752}},
  year         = {{1994}},
}

@inproceedings{13059,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  booktitle    = {{Tagungsband der GI/GME/ITG-Fachtagung \& Rechnergestützter Entwurf und Architektur mikroelektronischer Systeme}},
  pages        = {{3--11}},
  title        = {{{Synthese schneller selbsttestbarer Steuerwerke}}},
  year         = {{1994}},
}

@inproceedings{13013,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  booktitle    = {{European Design and Test Conference (EDAC/ETC/EUROASIC)}},
  pages        = {{580--585}},
  title        = {{{Synthesis of Self-Testable Controllers}}},
  doi          = {{10.1109/edtc.1994.326815}},
  year         = {{1994}},
}

@misc{13081,
  author       = {{Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard}},
  keywords     = {{WORKSHOP}},
  title        = {{{Effiziente Erzeugung deterministischer Muster im Selbsttest}}},
  year         = {{1993}},
}

@misc{13082,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  keywords     = {{WORKSHOP}},
  title        = {{{Synthesis of Self-Testable Controllers}}},
  year         = {{1993}},
}

@inproceedings{13015,
  author       = {{Venkataraman, Srikanth and Rajski, Janusz and Hellebrand, Sybille and Tarnick, Steffen}},
  booktitle    = {{ACM/IEEE International Conference on Computer Aided Design (ICCAD'93)}},
  publisher    = {{IEEE}},
  title        = {{{An Efficient Bist Scheme Based On Reseeding Of Multiple Polynomial Linear Feedback Shift Registers}}},
  doi          = {{10.1109/iccad.1993.580117}},
  year         = {{1993}},
}

@techreport{13023,
  author       = {{Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard}},
  title        = {{{Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs}}},
  year         = {{1992}},
}

@misc{13076,
  author       = {{Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard}},
  keywords     = {{WORKSHOP}},
  title        = {{{Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs}}},
  year         = {{1992}},
}