@article{8667,
  author       = {{Sprenger, Alexander and Hellebrand, Sybille}},
  issn         = {{0218-1266}},
  journal      = {{Journal of Circuits, Systems and Computers}},
  number       = {{1}},
  pages        = {{1--23}},
  publisher    = {{World Scientific Publishing Company}},
  title        = {{{Divide and Compact - Stochastic Space Compaction for Faster-than-At-Speed Test}}},
  doi          = {{10.1142/s0218126619400012}},
  volume       = {{28}},
  year         = {{2019}},
}

@article{13048,
  abstract     = {{Marginal hardware introduces severe reliability threats throughout the life cycle of a system. Although marginalities may not affect the functionality of a circuit immediately after manufacturing, they can degrade into hard failures and must be screened out during manufacturing test to prevent early life failures. Furthermore, their evolution in the field must be proactively monitored by periodic tests before actual failures occur. In recent years small delay faults have gained increasing attention as possible indicators of marginal hardware. However, small delay faults on short paths may be undetectable even with advanced timing aware ATPG. Faster-than-at-speed test (FAST) can detect such hidden delay faults, but so far FAST has mainly been restricted to manufacturing test.}},
  author       = {{Kampmann, Matthias and A. Kochte, Michael and Liu, Chang and Schneider, Eric and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  issn         = {{1937-4151}},
  journal      = {{IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)}},
  number       = {{10}},
  pages        = {{1956 -- 1968}},
  publisher    = {{IEEE}},
  title        = {{{Built-in Test for Hidden Delay Faults}}},
  volume       = {{38}},
  year         = {{2019}},
}

@inproceedings{12918,
  abstract     = {{The test for small delay faults is of major importance for predicting potential early life failures or wearout problems. Typically, a faster-than-at-speed test (FAST) with sev¬eral different frequencies is used to detect also hidden small delays, which can only be propagated over short paths. But then the outputs at the end of long paths may no longer reach their stable values at the nominal observation time and must be considered as unknown (X-values). Thus, test response compaction for FAST must be extremely flexible to cope with high X-rates, which also vary with the test frequencies. Stochastic compaction introduced by Mitra et al. is controlled by weighted pseudo-random signals allowing for easy adaptation to varying conditions. As demonstrated in previous work, the pseudo-random control can be optimized for high fault efficiency or X-reduction, but a given target in fault efficiency cannot be guaranteed. To close this gap, a hybrid space compactor is introduced in this paper. It is based on the observation that many faults are lost in the compaction of relatively few critical test patterns. For these critical patterns a deterministic compaction phase is added to the test, where the existing compactor structure is re-used, but controlled by specifically determined control vectors. }},
  author       = {{Maaz, Mohammad Urf and Sprenger, Alexander and Hellebrand, Sybille}},
  booktitle    = {{50th IEEE International Test Conference (ITC)}},
  keywords     = {{Faster-than-at-speed test, BIST, DFT, Test response compaction, Stochastic compactor, X-handling}},
  location     = {{Washington, DC, USA}},
  pages        = {{1--8}},
  publisher    = {{IEEE}},
  title        = {{{A Hybrid Space Compactor for Adaptive X-Handling}}},
  year         = {{2019}},
}

@misc{4576,
  author       = {{Sprenger, Alexander and Hellebrand, Sybille}},
  keywords     = {{WORKSHOP}},
  publisher    = {{30. Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen" (TuZ'18)}},
  title        = {{{Stochastische Kompaktierung für den Hochgeschwindigkeitstest}}},
  year         = {{2018}},
}

@article{12974,
  author       = {{Hellebrand, Sybille and Henkel, Joerg and Raghunathan, Anand and Wunderlich, Hans-Joachim}},
  journal      = {{IEEE Embedded Systems Letters}},
  number       = {{1}},
  pages        = {{1--1}},
  publisher    = {{IEEE}},
  title        = {{{Guest Editors' Introduction - Special Issue on Approximate Computing}}},
  doi          = {{10.1109/les.2018.2789942}},
  volume       = {{10}},
  year         = {{2018}},
}

@article{13057,
  author       = {{Kampmann, Matthias and Hellebrand, Sybille}},
  journal      = {{Microelectronics Reliability}},
  pages        = {{124--133}},
  title        = {{{Design For Small Delay Test - A Simulation Study}}},
  volume       = {{80}},
  year         = {{2018}},
}

@inproceedings{4575,
  author       = {{Sprenger, Alexander and Hellebrand, Sybille}},
  booktitle    = {{2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)}},
  isbn         = {{9781538657546}},
  publisher    = {{IEEE}},
  title        = {{{Tuning Stochastic Space Compaction to Faster-than-at-Speed Test}}},
  doi          = {{10.1109/ddecs.2018.00020}},
  year         = {{2018}},
}

@inproceedings{10575,
  author       = {{Liu, Chang and Schneider, Eric and Kampmann, Matthias and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  booktitle    = {{27th IEEE Asian Test Symposium (ATS'18)}},
  isbn         = {{9781538694664}},
  title        = {{{Extending Aging Monitors for Early Life and Wear-Out Failure Prevention}}},
  doi          = {{10.1109/ats.2018.00028}},
  year         = {{2018}},
}

@inproceedings{12973,
  author       = {{Deshmukh, Jyotirmoy and Kunz, Wolfgang and Wunderlich, Hans-Joachim and Hellebrand, Sybille}},
  booktitle    = {{35th IEEE VLSI Test Symposium (VTS'17)}},
  publisher    = {{IEEE}},
  title        = {{{Special Session on Early Life Failures}}},
  doi          = {{10.1109/vts.2017.7928933}},
  year         = {{2017}},
}

@misc{13078,
  author       = {{Kampmann, Matthias and Hellebrand, Sybille}},
  keywords     = {{WORKSHOP}},
  title        = {{{X-tolerante Prüfzellengruppierung für den Test mit erhöhter Betriebsfrequenz}}},
  year         = {{2017}},
}

@inproceedings{10576,
  author       = {{Kampmann, Matthias and Hellebrand, Sybille}},
  booktitle    = {{20th IEEE International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS'17)}},
  isbn         = {{9781538604724}},
  publisher    = {{IEEE}},
  title        = {{{Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test}}},
  doi          = {{10.1109/ddecs.2017.7934564}},
  year         = {{2017}},
}

@inproceedings{12975,
  author       = {{Kampmann, Matthias and Hellebrand, Sybille}},
  booktitle    = {{25th IEEE Asian Test Symposium (ATS'16)}},
  pages        = {{1--6}},
  publisher    = {{IEEE}},
  title        = {{{X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test}}},
  doi          = {{10.1109/ats.2016.20}},
  year         = {{2016}},
}

@inproceedings{12976,
  author       = {{Kampmann, Matthias and A. Kochte, Michael and Schneider, Eric and Indlekofer, Thomas and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  booktitle    = {{24th IEEE Asian Test Symposium (ATS'15)}},
  pages        = {{109--114}},
  publisher    = {{IEEE}},
  title        = {{{Optimized Selection of Frequencies for Faster-Than-at-Speed Test}}},
  doi          = {{10.1109/ats.2015.26}},
  year         = {{2015}},
}

@article{13056,
  author       = {{Huang, Zhengfeng and Liang, Huaguo and Hellebrand, Sybille}},
  journal      = {{Journal of Electronic Testing - Theory and Applications (JETTA)}},
  number       = {{4}},
  pages        = {{349--359}},
  publisher    = {{Springer}},
  title        = {{{A High Performance SEU Tolerant Latch}}},
  volume       = {{31}},
  year         = {{2015}},
}

@misc{13077,
  author       = {{Hellebrand, Sybille and Indlekofer, Thomas and Kampmann, Matthias and Kochte, Michael and Liu, Chang and Wunderlich, Hans-Joachim}},
  keywords     = {{Workshop}},
  title        = {{{Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler}}},
  year         = {{2015}},
}

@inproceedings{12977,
  author       = {{Hellebrand, Sybille and Indlekofer, Thomas and Kampmann, Matthias and A. Kochte, Michael and Liu, Chang and Wunderlich, Hans-Joachim}},
  booktitle    = {{IEEE International Test Conference (ITC'14)}},
  publisher    = {{IEEE}},
  title        = {{{FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects}}},
  doi          = {{10.1109/test.2014.7035360}},
  year         = {{2014}},
}

@article{13054,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  journal      = {{DeGruyter Journal on Information Technology (it)}},
  number       = {{4}},
  pages        = {{165--172}},
  publisher    = {{DeGruyter}},
  title        = {{{SAT-Based ATPG beyond Stuck-at Fault Testing}}},
  volume       = {{56}},
  year         = {{2014}},
}

@article{13055,
  author       = {{Rodriguez Gomez, Laura and Cook, Alejandro and Indlekofer, Thomas and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  journal      = {{Journal of Electronic Testing - Theory and Applications (JETTA)}},
  number       = {{5}},
  pages        = {{527--540}},
  publisher    = {{Springer}},
  title        = {{{Adaptive Bayesian Diagnosis of Intermittent Faults}}},
  volume       = {{30}},
  year         = {{2014}},
}

@inproceedings{12979,
  author       = {{Hellebrand, Sybille}},
  booktitle    = {{14th IEEE Latin American Test Workshop - (LATW'13)}},
  publisher    = {{IEEE}},
  title        = {{{Analyzing and Quantifying Fault Tolerance Properties}}},
  doi          = {{10.1109/latw.2013.6562662}},
  year         = {{2013}},
}

@misc{13075,
  author       = {{Cook, Alejandro and Rodriguez Gomez, Laura and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}},
  keywords     = {{WORKSHOP}},
  title        = {{{Adaptive Test and Diagnosis of Intermittent Faults}}},
  year         = {{2013}},
}