@inproceedings{12980,
  author       = {{Cook, Alejandro and Hellebrand, Sybille and E. Imhof, Michael and Mumtaz, Abdullah and Wunderlich, Hans-Joachim}},
  booktitle    = {{13th IEEE Latin American Test Workshop (LATW'12)}},
  pages        = {{1--4}},
  publisher    = {{IEEE}},
  title        = {{{Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test}}},
  doi          = {{10.1109/latw.2012.6261229}},
  year         = {{2012}},
}

@inproceedings{12981,
  author       = {{Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  booktitle    = {{17th IEEE European Test Symposium (ETS'12)}},
  pages        = {{1--6}},
  publisher    = {{IEEE}},
  title        = {{{Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test}}},
  doi          = {{10.1109/ets.2012.6233025}},
  year         = {{2012}},
}

@misc{13074,
  author       = {{Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  keywords     = {{WORKSHOP}},
  title        = {{{Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern}}},
  year         = {{2012}},
}

@inproceedings{12982,
  author       = {{Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}},
  booktitle    = {{20th IEEE Asian Test Symposium (ATS'11)}},
  pages        = {{285--290}},
  publisher    = {{IEEE}},
  title        = {{{Diagnostic Test of Robust Circuits}}},
  doi          = {{10.1109/ats.2011.55}},
  year         = {{2011}},
}

@inproceedings{12984,
  author       = {{Polian, Ilia and Becker, Bernd and Hellebrand, Sybille and Wunderlich, Hans-Joachim and Maxwell, Peter}},
  booktitle    = {{16th IEEE European Test Symposium Trondheim (ETS'11)}},
  publisher    = {{IEEE}},
  title        = {{{Towards Variation-Aware Test Methods}}},
  doi          = {{10.1109/ets.2011.51}},
  year         = {{2011}},
}

@inproceedings{13053,
  author       = {{Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}},
  booktitle    = {{5. GMM/GI/ITG Fachtagung "Zuverlässigkeit und Entwurf"}},
  pages        = {{48--53}},
  title        = {{{Robuster Selbsttest mit Diagnose}}},
  year         = {{2011}},
}

@article{13052,
  author       = {{Hopsch, Fabian and Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}},
  journal      = {{SCIENCE CHINA Information Sciences, Science China Press, co-published with Springer}},
  number       = {{4}},
  pages        = {{1813--1826}},
  title        = {{{Variation-Aware Fault Modeling}}},
  volume       = {{54}},
  year         = {{2011}},
}

@misc{10670,
  author       = {{Fröse, Viktor and Ibers, Rüdiger and Hellebrand, Sybille}},
  keywords     = {{WORKSHOP}},
  title        = {{{Testdatenkompression mit Hilfe der Netzwerkinfrastruktur}}},
  year         = {{2010}},
}

@inproceedings{12987,
  author       = {{Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}},
  booktitle    = {{40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W'10)}},
  publisher    = {{IEEE}},
  title        = {{{Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits}}},
  doi          = {{10.1109/dsnw.2010.5542612}},
  year         = {{2010}},
}

@inproceedings{13051,
  author       = {{Hunger, Marc and Hellebrand, Sybille}},
  booktitle    = {{4. GMM/GI/ITG-Fachtagung "Zuverlässigkeit und Entwurf"}},
  pages        = {{81--88}},
  title        = {{{Ausbeute und Fehlertoleranz bei dreifach modularer Redundanz}}},
  year         = {{2010}},
}

@misc{13073,
  author       = {{Hellebrand, Sybille}},
  title        = {{{Nano-Electronic Systems}}},
  year         = {{2010}},
}

@inproceedings{12983,
  author       = {{Hopsch, Fabian and Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}},
  booktitle    = {{19th IEEE Asian Test Symposium (ATS'10)}},
  pages        = {{87--93}},
  publisher    = {{IEEE}},
  title        = {{{Variation-Aware Fault Modeling}}},
  doi          = {{10.1109/ats.2010.24}},
  year         = {{2010}},
}

@inproceedings{12985,
  author       = {{Indlekofer, Thomas and Schnittger, Michael and Hellebrand, Sybille}},
  booktitle    = {{28th IEEE International Conference on Computer Design (ICCD'10)}},
  pages        = {{480--485}},
  publisher    = {{IEEE}},
  title        = {{{Efficient Test Response Compaction for Robust BIST Using Parity Sequences}}},
  doi          = {{10.1109/iccd.2010.5647648}},
  year         = {{2010}},
}

@inproceedings{12986,
  author       = {{Hunger, Marc and Hellebrand, Sybille}},
  booktitle    = {{25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'10)}},
  pages        = {{101--108}},
  publisher    = {{IEEE}},
  title        = {{{The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems}}},
  doi          = {{10.1109/dft.2010.19}},
  year         = {{2010}},
}

@inproceedings{12988,
  author       = {{Froese, Viktor and Ibers, Rüdiger and Hellebrand, Sybille}},
  booktitle    = {{28th IEEE VLSI Test Symposium (VTS'10)}},
  pages        = {{227--231}},
  publisher    = {{IEEE}},
  title        = {{{Reusing NoC-Infrastructure for Test Data Compression}}},
  doi          = {{10.1109/vts.2010.5469570}},
  year         = {{2010}},
}

@inproceedings{13049,
  author       = {{Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}},
  booktitle    = {{4th Workshop on Dependable and Secure Nanocomputing (WDSN'10), (Invited Paper)}},
  title        = {{{Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits}}},
  year         = {{2010}},
}

@inproceedings{13050,
  author       = {{Indlekofer, Thomas and Schnittger, Michael and Hellebrand, Sybille}},
  booktitle    = {{4. GMM/GI/ITG-Fachtagung "Zuverlässigkeit und Entwurf"}},
  pages        = {{17--24}},
  title        = {{{Robuster Selbsttest mit extremer Kompaktierung}}},
  year         = {{2010}},
}

@inproceedings{12991,
  author       = {{Hunger, Marc and Hellebrand, Sybille and Czutro, Alejandro and Polian, Ilia and Becker, Bernd}},
  booktitle    = {{15th IEEE International On-Line Testing Symposium (IOLTS'09}},
  publisher    = {{IEEE}},
  title        = {{{ATPG-Based Grading of Strong Fault-Secureness}}},
  doi          = {{10.1109/iolts.2009.5196027}},
  year         = {{2009}},
}

@inproceedings{12990,
  author       = {{Hellebrand, Sybille and Hunger, Marc}},
  booktitle    = {{24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'09), (Invited Talk)}},
  pages        = {{77}},
  publisher    = {{IEEE}},
  title        = {{{Are Robust Circuits Really Robust?}}},
  doi          = {{10.1109/dft.2009.28}},
  year         = {{2009}},
}

@inproceedings{13030,
  author       = {{Hunger, Marc and Hellebrand, Sybille and Czutro, Alexander and Polian, Ilia and Becker, Bernd}},
  booktitle    = {{3. GMM/GI/ITG-Fachtagung "Zuverlässigkeit und Entwurf"}},
  title        = {{{Robustheitsanalyse stark fehlersicherer Schaltungen mit SAT-basierter Testmustererzeugung}}},
  year         = {{2009}},
}