[{"keyword":["WORKSHOP"],"extern":"1","language":[{"iso":"eng"}],"_id":"13080","user_id":"659","department":[{"_id":"48"}],"status":"public","type":"misc","title":"Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs","date_updated":"2022-01-06T06:51:28Z","author":[{"first_name":"Sybille","orcid":"0000-0002-3717-3939","last_name":"Hellebrand","id":"209","full_name":"Hellebrand, Sybille"},{"first_name":"Steffen","full_name":"Tarnick, Steffen","last_name":"Tarnick"},{"full_name":"Rajski, Janusz","last_name":"Rajski","first_name":"Janusz"},{"first_name":"Bernard","full_name":"Courtois, Bernard","last_name":"Courtois"}],"date_created":"2019-08-28T12:09:07Z","year":"1992","place":"Workshop on New Directions for Testing, Montreal, Canada","citation":{"ama":"Hellebrand S, Tarnick S, Rajski J, Courtois B. <i>Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. Workshop on New Directions for Testing, Montreal, Canada; 1992.","ieee":"S. Hellebrand, S. Tarnick, J. Rajski, and B. Courtois, <i>Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. Workshop on New Directions for Testing, Montreal, Canada, 1992.","chicago":"Hellebrand, Sybille, Steffen Tarnick, Janusz Rajski, and Bernard Courtois. <i>Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. Workshop on New Directions for Testing, Montreal, Canada, 1992.","apa":"Hellebrand, S., Tarnick, S., Rajski, J., &#38; Courtois, B. (1992). <i>Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. Workshop on New Directions for Testing, Montreal, Canada.","mla":"Hellebrand, Sybille, et al. <i>Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. 1992.","short":"S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs, Workshop on New Directions for Testing, Montreal, Canada, 1992.","bibtex":"@book{Hellebrand_Tarnick_Rajski_Courtois_1992, place={Workshop on New Directions for Testing, Montreal, Canada}, title={Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs}, author={Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard}, year={1992} }"}},{"year":"1992","citation":{"apa":"Wunderlich, H.-J., &#38; Hellebrand, S. (1992). The Pseudoexhaustive Test of Sequential Circuits. <i>IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)</i>, <i>11</i>(1), 26–33. <a href=\"https://doi.org/10.1109/43.108616\">https://doi.org/10.1109/43.108616</a>","mla":"Wunderlich, Hans-Joachim, and Sybille Hellebrand. “The Pseudoexhaustive Test of Sequential Circuits.” <i>IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)</i>, vol. 11, no. 1, Institute of Electrical and Electronics Engineers (IEEE), 1992, pp. 26–33, doi:<a href=\"https://doi.org/10.1109/43.108616\">10.1109/43.108616</a>.","short":"H.-J. Wunderlich, S. Hellebrand, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD) 11 (1992) 26–33.","bibtex":"@article{Wunderlich_Hellebrand_1992, title={The Pseudoexhaustive Test of Sequential Circuits}, volume={11}, DOI={<a href=\"https://doi.org/10.1109/43.108616\">10.1109/43.108616</a>}, number={1}, journal={IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Wunderlich, Hans-Joachim and Hellebrand, Sybille}, year={1992}, pages={26–33} }","ama":"Wunderlich H-J, Hellebrand S. The Pseudoexhaustive Test of Sequential Circuits. <i>IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)</i>. 1992;11(1):26-33. doi:<a href=\"https://doi.org/10.1109/43.108616\">10.1109/43.108616</a>","chicago":"Wunderlich, Hans-Joachim, and Sybille Hellebrand. “The Pseudoexhaustive Test of Sequential Circuits.” <i>IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)</i> 11, no. 1 (1992): 26–33. <a href=\"https://doi.org/10.1109/43.108616\">https://doi.org/10.1109/43.108616</a>.","ieee":"H.-J. Wunderlich and S. Hellebrand, “The Pseudoexhaustive Test of Sequential Circuits,” <i>IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)</i>, vol. 11, no. 1, pp. 26–33, 1992, doi: <a href=\"https://doi.org/10.1109/43.108616\">10.1109/43.108616</a>."},"page":"26-33","intvolume":"        11","issue":"1","title":"The Pseudoexhaustive Test of Sequential Circuits","doi":"10.1109/43.108616","date_updated":"2022-05-11T16:12:45Z","publisher":"Institute of Electrical and Electronics Engineers (IEEE)","author":[{"last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim","first_name":"Hans-Joachim"},{"first_name":"Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","id":"209","full_name":"Hellebrand, Sybille"}],"date_created":"2019-08-28T10:29:15Z","volume":11,"status":"public","type":"journal_article","publication":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)","language":[{"iso":"eng"}],"extern":"1","_id":"13017","user_id":"209","department":[{"_id":"48"}]},{"date_created":"2019-08-28T10:27:45Z","author":[{"first_name":"Sybille","orcid":"0000-0002-3717-3939","last_name":"Hellebrand","full_name":"Hellebrand, Sybille","id":"209"},{"last_name":"Tarnick","full_name":"Tarnick, Steffen","first_name":"Steffen"},{"last_name":"Rajski","full_name":"Rajski, Janusz","first_name":"Janusz"},{"last_name":"Courtois","full_name":"Courtois, Bernard","first_name":"Bernard"}],"date_updated":"2022-05-11T16:23:33Z","publisher":"IEEE","doi":"10.1109/test.1992.527812","title":"Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers","citation":{"ama":"Hellebrand S, Tarnick S, Rajski J, Courtois B. Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. In: <i>IEEE International Test Conference (ITC’92)</i>. IEEE; 1992:120-129. doi:<a href=\"https://doi.org/10.1109/test.1992.527812\">10.1109/test.1992.527812</a>","ieee":"S. Hellebrand, S. Tarnick, J. Rajski, and B. Courtois, “Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers,” in <i>IEEE International Test Conference (ITC’92)</i>, 1992, pp. 120–129, doi: <a href=\"https://doi.org/10.1109/test.1992.527812\">10.1109/test.1992.527812</a>.","chicago":"Hellebrand, Sybille, Steffen Tarnick, Janusz Rajski, and Bernard Courtois. “Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers.” In <i>IEEE International Test Conference (ITC’92)</i>, 120–29. Baltimore, MD, USA: IEEE, 1992. <a href=\"https://doi.org/10.1109/test.1992.527812\">https://doi.org/10.1109/test.1992.527812</a>.","short":"S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, in: IEEE International Test Conference (ITC’92), IEEE, Baltimore, MD, USA, 1992, pp. 120–129.","bibtex":"@inproceedings{Hellebrand_Tarnick_Rajski_Courtois_1992, place={Baltimore, MD, USA}, title={Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers}, DOI={<a href=\"https://doi.org/10.1109/test.1992.527812\">10.1109/test.1992.527812</a>}, booktitle={IEEE International Test Conference (ITC’92)}, publisher={IEEE}, author={Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard}, year={1992}, pages={120–129} }","mla":"Hellebrand, Sybille, et al. “Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers.” <i>IEEE International Test Conference (ITC’92)</i>, IEEE, 1992, pp. 120–29, doi:<a href=\"https://doi.org/10.1109/test.1992.527812\">10.1109/test.1992.527812</a>.","apa":"Hellebrand, S., Tarnick, S., Rajski, J., &#38; Courtois, B. (1992). Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. <i>IEEE International Test Conference (ITC’92)</i>, 120–129. <a href=\"https://doi.org/10.1109/test.1992.527812\">https://doi.org/10.1109/test.1992.527812</a>"},"page":"120-129","place":"Baltimore, MD, USA","year":"1992","user_id":"209","department":[{"_id":"48"}],"_id":"13016","language":[{"iso":"eng"}],"extern":"1","type":"conference","publication":"IEEE International Test Conference (ITC'92)","status":"public"},{"title":"Synthese vollständig testbarer Schaltungen","date_updated":"2022-01-06T06:51:27Z","publisher":"Verlag Düsseldorf: VDI Verlag","author":[{"first_name":"Sybille","id":"209","full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","last_name":"Hellebrand"}],"date_created":"2019-08-28T10:37:07Z","year":"1991","place":"Verlag Düsseldorf: VDI Verlag","citation":{"ama":"Hellebrand S. <i>Synthese Vollständig Testbarer Schaltungen</i>. Verlag Düsseldorf: VDI Verlag: Verlag Düsseldorf: VDI Verlag; 1991.","chicago":"Hellebrand, Sybille. <i>Synthese Vollständig Testbarer Schaltungen</i>. 10. Verlag Düsseldorf: VDI Verlag: Verlag Düsseldorf: VDI Verlag, 1991.","ieee":"S. Hellebrand, <i>Synthese vollständig testbarer Schaltungen</i>. Verlag Düsseldorf: VDI Verlag: Verlag Düsseldorf: VDI Verlag, 1991.","short":"S. Hellebrand, Synthese Vollständig Testbarer Schaltungen, Verlag Düsseldorf: VDI Verlag, Verlag Düsseldorf: VDI Verlag, 1991.","bibtex":"@book{Hellebrand_1991, place={Verlag Düsseldorf: VDI Verlag}, series={10}, title={Synthese vollständig testbarer Schaltungen}, publisher={Verlag Düsseldorf: VDI Verlag}, author={Hellebrand, Sybille}, year={1991}, collection={10} }","mla":"Hellebrand, Sybille. <i>Synthese Vollständig Testbarer Schaltungen</i>. Verlag Düsseldorf: VDI Verlag, 1991.","apa":"Hellebrand, S. (1991). <i>Synthese vollständig testbarer Schaltungen</i>. Verlag Düsseldorf: VDI Verlag: Verlag Düsseldorf: VDI Verlag."},"publication_identifier":{"isbn":["3257227892"]},"language":[{"iso":"eng"}],"extern":"1","_id":"13034","department":[{"_id":"48"}],"user_id":"659","series_title":"10","status":"public","type":"book"},{"department":[{"_id":"48"}],"user_id":"659","_id":"13103","extern":"1","language":[{"iso":"eng"}],"keyword":["WORKSHOP"],"type":"misc","status":"public","author":[{"first_name":"Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","id":"209","full_name":"Hellebrand, Sybille"},{"first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich"},{"full_name":"F. Haberl, Oliver","last_name":"F. Haberl","first_name":"Oliver"}],"date_created":"2019-08-28T12:23:40Z","date_updated":"2022-01-06T06:51:28Z","title":"Generating Pseudo-Exhaustive Vectors for External Testing","citation":{"apa":"Hellebrand, S., Wunderlich, H.-J., &#38; F. Haberl, O. (1990). <i>Generating Pseudo-Exhaustive Vectors for External Testing</i>. IEEE Design for Testability Workshop, Vail, CO, USA.","mla":"Hellebrand, Sybille, et al. <i>Generating Pseudo-Exhaustive Vectors for External Testing</i>. 1990.","bibtex":"@book{Hellebrand_Wunderlich_F. Haberl_1990, place={IEEE Design for Testability Workshop, Vail, CO, USA}, title={Generating Pseudo-Exhaustive Vectors for External Testing}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and F. Haberl, Oliver}, year={1990} }","short":"S. Hellebrand, H.-J. Wunderlich, O. F. Haberl, Generating Pseudo-Exhaustive Vectors for External Testing, IEEE Design for Testability Workshop, Vail, CO, USA, 1990.","ieee":"S. Hellebrand, H.-J. Wunderlich, and O. F. Haberl, <i>Generating Pseudo-Exhaustive Vectors for External Testing</i>. IEEE Design for Testability Workshop, Vail, CO, USA, 1990.","chicago":"Hellebrand, Sybille, Hans-Joachim Wunderlich, and Oliver F. Haberl. <i>Generating Pseudo-Exhaustive Vectors for External Testing</i>. IEEE Design for Testability Workshop, Vail, CO, USA, 1990.","ama":"Hellebrand S, Wunderlich H-J, F. Haberl O. <i>Generating Pseudo-Exhaustive Vectors for External Testing</i>. IEEE Design for Testability Workshop, Vail, CO, USA; 1990."},"year":"1990","place":"IEEE Design for Testability Workshop, Vail, CO, USA"},{"author":[{"first_name":"Sybille","full_name":"Hellebrand, Sybille","id":"209","orcid":"0000-0002-3717-3939","last_name":"Hellebrand"},{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"}],"date_created":"2019-08-28T10:29:16Z","publisher":"IEEE","date_updated":"2022-05-11T16:24:46Z","doi":"10.1109/edac.1990.136612","title":"Tools and Devices Supporting the Pseudo-Exhaustive Test","page":"13-17","citation":{"bibtex":"@inproceedings{Hellebrand_Wunderlich_1990, place={Glasgow, UK}, title={Tools and Devices Supporting the Pseudo-Exhaustive Test}, DOI={<a href=\"https://doi.org/10.1109/edac.1990.136612\">10.1109/edac.1990.136612</a>}, booktitle={European Design Automation Conference (EDAC’90)}, publisher={IEEE}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1990}, pages={13–17} }","mla":"Hellebrand, Sybille, and Hans-Joachim Wunderlich. “Tools and Devices Supporting the Pseudo-Exhaustive Test.” <i>European Design Automation Conference (EDAC’90)</i>, IEEE, 1990, pp. 13–17, doi:<a href=\"https://doi.org/10.1109/edac.1990.136612\">10.1109/edac.1990.136612</a>.","short":"S. Hellebrand, H.-J. Wunderlich, in: European Design Automation Conference (EDAC’90), IEEE, Glasgow, UK, 1990, pp. 13–17.","apa":"Hellebrand, S., &#38; Wunderlich, H.-J. (1990). Tools and Devices Supporting the Pseudo-Exhaustive Test. <i>European Design Automation Conference (EDAC’90)</i>, 13–17. <a href=\"https://doi.org/10.1109/edac.1990.136612\">https://doi.org/10.1109/edac.1990.136612</a>","ieee":"S. Hellebrand and H.-J. Wunderlich, “Tools and Devices Supporting the Pseudo-Exhaustive Test,” in <i>European Design Automation Conference (EDAC’90)</i>, 1990, pp. 13–17, doi: <a href=\"https://doi.org/10.1109/edac.1990.136612\">10.1109/edac.1990.136612</a>.","chicago":"Hellebrand, Sybille, and Hans-Joachim Wunderlich. “Tools and Devices Supporting the Pseudo-Exhaustive Test.” In <i>European Design Automation Conference (EDAC’90)</i>, 13–17. Glasgow, UK: IEEE, 1990. <a href=\"https://doi.org/10.1109/edac.1990.136612\">https://doi.org/10.1109/edac.1990.136612</a>.","ama":"Hellebrand S, Wunderlich H-J. Tools and Devices Supporting the Pseudo-Exhaustive Test. In: <i>European Design Automation Conference (EDAC’90)</i>. IEEE; 1990:13-17. doi:<a href=\"https://doi.org/10.1109/edac.1990.136612\">10.1109/edac.1990.136612</a>"},"place":"Glasgow, UK","year":"1990","department":[{"_id":"48"}],"user_id":"209","_id":"13018","language":[{"iso":"eng"}],"extern":"1","publication":"European Design Automation Conference (EDAC'90)","type":"conference","status":"public"},{"year":"1990","place":"Washington, DC, USA","page":"670-679","citation":{"apa":"Hellebrand, S., Wunderlich, H.-J., &#38; F. Haberl, O. (1990). Generating Pseudo-Exhaustive Vectors for External Testing. <i>IEEE International Test Conference (ITC’90)</i>, 670–679. <a href=\"https://doi.org/10.1109/test.1990.114082\">https://doi.org/10.1109/test.1990.114082</a>","bibtex":"@inproceedings{Hellebrand_Wunderlich_F. Haberl_1990, place={Washington, DC, USA}, title={Generating Pseudo-Exhaustive Vectors for External Testing}, DOI={<a href=\"https://doi.org/10.1109/test.1990.114082\">10.1109/test.1990.114082</a>}, booktitle={IEEE International Test Conference (ITC’90)}, publisher={IEEE}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and F. Haberl, Oliver}, year={1990}, pages={670–679} }","short":"S. Hellebrand, H.-J. Wunderlich, O. F. Haberl, in: IEEE International Test Conference (ITC’90), IEEE, Washington, DC, USA, 1990, pp. 670–679.","mla":"Hellebrand, Sybille, et al. “Generating Pseudo-Exhaustive Vectors for External Testing.” <i>IEEE International Test Conference (ITC’90)</i>, IEEE, 1990, pp. 670–79, doi:<a href=\"https://doi.org/10.1109/test.1990.114082\">10.1109/test.1990.114082</a>.","ama":"Hellebrand S, Wunderlich H-J, F. Haberl O. Generating Pseudo-Exhaustive Vectors for External Testing. In: <i>IEEE International Test Conference (ITC’90)</i>. IEEE; 1990:670-679. doi:<a href=\"https://doi.org/10.1109/test.1990.114082\">10.1109/test.1990.114082</a>","chicago":"Hellebrand, Sybille, Hans-Joachim Wunderlich, and Oliver F. Haberl. “Generating Pseudo-Exhaustive Vectors for External Testing.” In <i>IEEE International Test Conference (ITC’90)</i>, 670–79. Washington, DC, USA: IEEE, 1990. <a href=\"https://doi.org/10.1109/test.1990.114082\">https://doi.org/10.1109/test.1990.114082</a>.","ieee":"S. Hellebrand, H.-J. Wunderlich, and O. F. Haberl, “Generating Pseudo-Exhaustive Vectors for External Testing,” in <i>IEEE International Test Conference (ITC’90)</i>, 1990, pp. 670–679, doi: <a href=\"https://doi.org/10.1109/test.1990.114082\">10.1109/test.1990.114082</a>."},"title":"Generating Pseudo-Exhaustive Vectors for External Testing","doi":"10.1109/test.1990.114082","date_updated":"2022-05-11T16:59:33Z","publisher":"IEEE","date_created":"2019-08-28T10:29:17Z","author":[{"first_name":"Sybille","id":"209","full_name":"Hellebrand, Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939"},{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"},{"last_name":"F. Haberl","full_name":"F. Haberl, Oliver","first_name":"Oliver"}],"status":"public","publication":"IEEE International Test Conference (ITC'90)","type":"conference","language":[{"iso":"eng"}],"extern":"1","_id":"13019","department":[{"_id":"48"}],"user_id":"209"},{"doi":"10.1109/test.1989.82273","title":"The Pseudo-Exhaustive Test of Sequential Circuits","date_created":"2019-08-28T10:30:16Z","author":[{"first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich"},{"first_name":"Sybille","orcid":"0000-0002-3717-3939","last_name":"Hellebrand","id":"209","full_name":"Hellebrand, Sybille"}],"date_updated":"2022-05-11T17:00:08Z","publisher":"IEEE","page":"19-27","citation":{"apa":"Wunderlich, H.-J., &#38; Hellebrand, S. (1989). The Pseudo-Exhaustive Test of Sequential Circuits. <i>IEEE International Test Conference (ITC’89)</i>, 19–27. <a href=\"https://doi.org/10.1109/test.1989.82273\">https://doi.org/10.1109/test.1989.82273</a>","bibtex":"@inproceedings{Wunderlich_Hellebrand_1989, place={Washington, DC, USA}, title={The Pseudo-Exhaustive Test of Sequential Circuits}, DOI={<a href=\"https://doi.org/10.1109/test.1989.82273\">10.1109/test.1989.82273</a>}, booktitle={IEEE International Test Conference (ITC’89)}, publisher={IEEE}, author={Wunderlich, Hans-Joachim and Hellebrand, Sybille}, year={1989}, pages={19–27} }","mla":"Wunderlich, Hans-Joachim, and Sybille Hellebrand. “The Pseudo-Exhaustive Test of Sequential Circuits.” <i>IEEE International Test Conference (ITC’89)</i>, IEEE, 1989, pp. 19–27, doi:<a href=\"https://doi.org/10.1109/test.1989.82273\">10.1109/test.1989.82273</a>.","short":"H.-J. Wunderlich, S. Hellebrand, in: IEEE International Test Conference (ITC’89), IEEE, Washington, DC, USA, 1989, pp. 19–27.","ama":"Wunderlich H-J, Hellebrand S. The Pseudo-Exhaustive Test of Sequential Circuits. In: <i>IEEE International Test Conference (ITC’89)</i>. IEEE; 1989:19-27. doi:<a href=\"https://doi.org/10.1109/test.1989.82273\">10.1109/test.1989.82273</a>","ieee":"H.-J. Wunderlich and S. Hellebrand, “The Pseudo-Exhaustive Test of Sequential Circuits,” in <i>IEEE International Test Conference (ITC’89)</i>, 1989, pp. 19–27, doi: <a href=\"https://doi.org/10.1109/test.1989.82273\">10.1109/test.1989.82273</a>.","chicago":"Wunderlich, Hans-Joachim, and Sybille Hellebrand. “The Pseudo-Exhaustive Test of Sequential Circuits.” In <i>IEEE International Test Conference (ITC’89)</i>, 19–27. Washington, DC, USA: IEEE, 1989. <a href=\"https://doi.org/10.1109/test.1989.82273\">https://doi.org/10.1109/test.1989.82273</a>."},"year":"1989","place":"Washington, DC, USA","language":[{"iso":"eng"}],"extern":"1","department":[{"_id":"48"}],"user_id":"209","_id":"13020","status":"public","publication":"IEEE International Test Conference (ITC'89)","type":"conference"},{"year":"1988","place":"Tokyo, Japan","citation":{"apa":"Wunderlich, H.-J., &#38; Hellebrand, S. (1988). Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits. <i>18th International Symposium on Fault-Tolerant Computing, FTCS-18</i>, 36–45. <a href=\"https://doi.org/10.1109/ftcs.1988.5294\">https://doi.org/10.1109/ftcs.1988.5294</a>","mla":"Wunderlich, Hans-Joachim, and Sybille Hellebrand. “Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits.” <i>18th International Symposium on Fault-Tolerant Computing, FTCS-18</i>, 1988, pp. 36–45, doi:<a href=\"https://doi.org/10.1109/ftcs.1988.5294\">10.1109/ftcs.1988.5294</a>.","short":"H.-J. Wunderlich, S. Hellebrand, in: 18th International Symposium on Fault-Tolerant Computing, FTCS-18, Tokyo, Japan, 1988, pp. 36–45.","bibtex":"@inproceedings{Wunderlich_Hellebrand_1988, place={Tokyo, Japan}, title={Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits}, DOI={<a href=\"https://doi.org/10.1109/ftcs.1988.5294\">10.1109/ftcs.1988.5294</a>}, booktitle={18th International Symposium on Fault-Tolerant Computing, FTCS-18}, author={Wunderlich, Hans-Joachim and Hellebrand, Sybille}, year={1988}, pages={36–45} }","ama":"Wunderlich H-J, Hellebrand S. Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits. In: <i>18th International Symposium on Fault-Tolerant Computing, FTCS-18</i>. ; 1988:36-45. doi:<a href=\"https://doi.org/10.1109/ftcs.1988.5294\">10.1109/ftcs.1988.5294</a>","ieee":"H.-J. Wunderlich and S. Hellebrand, “Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits,” in <i>18th International Symposium on Fault-Tolerant Computing, FTCS-18</i>, 1988, pp. 36–45, doi: <a href=\"https://doi.org/10.1109/ftcs.1988.5294\">10.1109/ftcs.1988.5294</a>.","chicago":"Wunderlich, Hans-Joachim, and Sybille Hellebrand. “Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits.” In <i>18th International Symposium on Fault-Tolerant Computing, FTCS-18</i>, 36–45. Tokyo, Japan, 1988. <a href=\"https://doi.org/10.1109/ftcs.1988.5294\">https://doi.org/10.1109/ftcs.1988.5294</a>."},"page":"36-45","date_updated":"2022-05-11T17:01:49Z","author":[{"first_name":"Hans-Joachim","last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim"},{"first_name":"Sybille","full_name":"Hellebrand, Sybille","id":"209","orcid":"0000-0002-3717-3939","last_name":"Hellebrand"}],"date_created":"2019-08-28T10:30:18Z","title":"Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits","doi":"10.1109/ftcs.1988.5294","type":"conference","publication":"18th International Symposium on Fault-Tolerant Computing, FTCS-18","status":"public","_id":"13021","user_id":"209","department":[{"_id":"48"}],"language":[{"iso":"eng"}],"extern":"1"},{"language":[{"iso":"eng"}],"_id":"13058","department":[{"_id":"48"}],"user_id":"209","status":"public","publication":"Tool Integration and Design Environments, F.J. Rammig (Editor)","type":"conference","title":"Integrated Tools for Automatic Design for Testability","date_updated":"2022-05-11T17:02:35Z","publisher":"Amsterdam: Elsevier Science Publishers B.V.(North Holland), IFIP","author":[{"first_name":"Detlef","full_name":"Schmid, Detlef","last_name":"Schmid"},{"first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich"},{"full_name":"Feldbusch, Fridtjof","last_name":"Feldbusch","first_name":"Fridtjof"},{"id":"209","full_name":"Hellebrand, Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","first_name":"Sybille"},{"full_name":"Holzinger, Juergen","last_name":"Holzinger","first_name":"Juergen"},{"last_name":"Kunzmann","full_name":"Kunzmann, Arno","first_name":"Arno"}],"date_created":"2019-08-28T11:49:46Z","place":"Amsterdam, The Netherlands","year":"1988","page":"233-258","citation":{"chicago":"Schmid, Detlef, Hans-Joachim Wunderlich, Fridtjof Feldbusch, Sybille Hellebrand, Juergen Holzinger, and Arno Kunzmann. “Integrated Tools for Automatic Design for Testability.” In <i>Tool Integration and Design Environments, F.J. Rammig (Editor)</i>, 233–58. Amsterdam, The Netherlands: Amsterdam: Elsevier Science Publishers B.V.(North Holland), IFIP, 1988.","ieee":"D. Schmid, H.-J. Wunderlich, F. Feldbusch, S. Hellebrand, J. Holzinger, and A. Kunzmann, “Integrated Tools for Automatic Design for Testability,” in <i>Tool Integration and Design Environments, F.J. Rammig (Editor)</i>, 1988, pp. 233–258.","ama":"Schmid D, Wunderlich H-J, Feldbusch F, Hellebrand S, Holzinger J, Kunzmann A. Integrated Tools for Automatic Design for Testability. In: <i>Tool Integration and Design Environments, F.J. Rammig (Editor)</i>. Amsterdam: Elsevier Science Publishers B.V.(North Holland), IFIP; 1988:233-258.","short":"D. Schmid, H.-J. Wunderlich, F. Feldbusch, S. Hellebrand, J. Holzinger, A. Kunzmann, in: Tool Integration and Design Environments, F.J. Rammig (Editor), Amsterdam: Elsevier Science Publishers B.V.(North Holland), IFIP, Amsterdam, The Netherlands, 1988, pp. 233–258.","bibtex":"@inproceedings{Schmid_Wunderlich_Feldbusch_Hellebrand_Holzinger_Kunzmann_1988, place={Amsterdam, The Netherlands}, title={Integrated Tools for Automatic Design for Testability}, booktitle={Tool Integration and Design Environments, F.J. Rammig (Editor)}, publisher={Amsterdam: Elsevier Science Publishers B.V.(North Holland), IFIP}, author={Schmid, Detlef and Wunderlich, Hans-Joachim and Feldbusch, Fridtjof and Hellebrand, Sybille and Holzinger, Juergen and Kunzmann, Arno}, year={1988}, pages={233–258} }","mla":"Schmid, Detlef, et al. “Integrated Tools for Automatic Design for Testability.” <i>Tool Integration and Design Environments, F.J. Rammig (Editor)</i>, Amsterdam: Elsevier Science Publishers B.V.(North Holland), IFIP, 1988, pp. 233–58.","apa":"Schmid, D., Wunderlich, H.-J., Feldbusch, F., Hellebrand, S., Holzinger, J., &#38; Kunzmann, A. (1988). Integrated Tools for Automatic Design for Testability. <i>Tool Integration and Design Environments, F.J. Rammig (Editor)</i>, 233–258."}},{"type":"conference","publication":"GI - 18. Jahrestagung II, Hamburg, 1988, Informatik-Fachberichte 188","status":"public","user_id":"209","department":[{"_id":"48"}],"_id":"13062","language":[{"iso":"eng"}],"extern":"1","citation":{"ama":"Hellebrand S, Wunderlich H-J. Automatisierung des Entwurfs vollständig testbarer Schaltungen. In: <i>GI - 18. Jahrestagung II, Hamburg, 1988, Informatik-Fachberichte 188</i>. Springer Verlag; 1988:145-159.","chicago":"Hellebrand, Sybille, and Hans-Joachim Wunderlich. “Automatisierung Des Entwurfs Vollständig Testbarer Schaltungen.” In <i>GI - 18. Jahrestagung II, Hamburg, 1988, Informatik-Fachberichte 188</i>, 145–59. Hamburg, Germany: Springer Verlag, 1988.","ieee":"S. Hellebrand and H.-J. Wunderlich, “Automatisierung des Entwurfs vollständig testbarer Schaltungen,” in <i>GI - 18. Jahrestagung II, Hamburg, 1988, Informatik-Fachberichte 188</i>, 1988, pp. 145–159.","mla":"Hellebrand, Sybille, and Hans-Joachim Wunderlich. “Automatisierung Des Entwurfs Vollständig Testbarer Schaltungen.” <i>GI - 18. Jahrestagung II, Hamburg, 1988, Informatik-Fachberichte 188</i>, Springer Verlag, 1988, pp. 145–59.","short":"S. Hellebrand, H.-J. Wunderlich, in: GI - 18. Jahrestagung II, Hamburg, 1988, Informatik-Fachberichte 188, Springer Verlag, Hamburg, Germany, 1988, pp. 145–159.","bibtex":"@inproceedings{Hellebrand_Wunderlich_1988, place={Hamburg, Germany}, title={Automatisierung des Entwurfs vollständig testbarer Schaltungen}, booktitle={GI - 18. Jahrestagung II, Hamburg, 1988, Informatik-Fachberichte 188}, publisher={Springer Verlag}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1988}, pages={145–159} }","apa":"Hellebrand, S., &#38; Wunderlich, H.-J. (1988). Automatisierung des Entwurfs vollständig testbarer Schaltungen. <i>GI - 18. Jahrestagung II, Hamburg, 1988, Informatik-Fachberichte 188</i>, 145–159."},"page":"145-159","place":"Hamburg, Germany","year":"1988","author":[{"first_name":"Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","id":"209"},{"last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim","first_name":"Hans-Joachim"}],"date_created":"2019-08-28T11:54:29Z","date_updated":"2022-05-11T17:03:06Z","publisher":"Springer Verlag","title":"Automatisierung des Entwurfs vollständig testbarer Schaltungen"},{"_id":"13022","department":[{"_id":"48"}],"user_id":"659","extern":"1","language":[{"iso":"eng"}],"type":"report","status":"public","date_updated":"2022-01-06T06:51:27Z","date_created":"2019-08-28T10:30:19Z","author":[{"first_name":"Sybille","orcid":"0000-0002-3717-3939","last_name":"Hellebrand","full_name":"Hellebrand, Sybille","id":"209"}],"title":"Deformation dicker Punkte und Netze von Quadriken","year":"1986","place":"Universität Regensburg, Fakultät für Mathematik, Regensburg, Germany","citation":{"short":"S. Hellebrand, Deformation Dicker Punkte Und Netze von Quadriken, Universität Regensburg, Fakultät für Mathematik, Regensburg, Germany, 1986.","bibtex":"@book{Hellebrand_1986, place={Universität Regensburg, Fakultät für Mathematik, Regensburg, Germany}, title={Deformation dicker Punkte und Netze von Quadriken}, author={Hellebrand, Sybille}, year={1986} }","mla":"Hellebrand, Sybille. <i>Deformation Dicker Punkte Und Netze von Quadriken</i>. 1986.","apa":"Hellebrand, S. (1986). <i>Deformation dicker Punkte und Netze von Quadriken</i>. Universität Regensburg, Fakultät für Mathematik, Regensburg, Germany.","ama":"Hellebrand S. <i>Deformation Dicker Punkte Und Netze von Quadriken</i>. Universität Regensburg, Fakultät für Mathematik, Regensburg, Germany; 1986.","chicago":"Hellebrand, Sybille. <i>Deformation Dicker Punkte Und Netze von Quadriken</i>. Universität Regensburg, Fakultät für Mathematik, Regensburg, Germany, 1986.","ieee":"S. Hellebrand, <i>Deformation dicker Punkte und Netze von Quadriken</i>. Universität Regensburg, Fakultät für Mathematik, Regensburg, Germany, 1986."}}]