---
_id: '13080'
author:
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Steffen
  full_name: Tarnick, Steffen
  last_name: Tarnick
- first_name: Janusz
  full_name: Rajski, Janusz
  last_name: Rajski
- first_name: Bernard
  full_name: Courtois, Bernard
  last_name: Courtois
citation:
  ama: Hellebrand S, Tarnick S, Rajski J, Courtois B. <i>Generation of Vector Patterns
    through Reseeding of Multiple-Polynomial LFSRs</i>. Workshop on New Directions
    for Testing, Montreal, Canada; 1992.
  apa: Hellebrand, S., Tarnick, S., Rajski, J., &#38; Courtois, B. (1992). <i>Generation
    of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. Workshop
    on New Directions for Testing, Montreal, Canada.
  bibtex: '@book{Hellebrand_Tarnick_Rajski_Courtois_1992, place={Workshop on New Directions
    for Testing, Montreal, Canada}, title={Generation of Vector Patterns through Reseeding
    of Multiple-Polynomial LFSRs}, author={Hellebrand, Sybille and Tarnick, Steffen
    and Rajski, Janusz and Courtois, Bernard}, year={1992} }'
  chicago: Hellebrand, Sybille, Steffen Tarnick, Janusz Rajski, and Bernard Courtois.
    <i>Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs</i>.
    Workshop on New Directions for Testing, Montreal, Canada, 1992.
  ieee: S. Hellebrand, S. Tarnick, J. Rajski, and B. Courtois, <i>Generation of Vector
    Patterns through Reseeding of Multiple-Polynomial LFSRs</i>. Workshop on New Directions
    for Testing, Montreal, Canada, 1992.
  mla: Hellebrand, Sybille, et al. <i>Generation of Vector Patterns through Reseeding
    of Multiple-Polynomial LFSRs</i>. 1992.
  short: S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, Generation of Vector Patterns
    through Reseeding of Multiple-Polynomial LFSRs, Workshop on New Directions for
    Testing, Montreal, Canada, 1992.
date_created: 2019-08-28T12:09:07Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: Workshop on New Directions for Testing, Montreal, Canada
status: public
title: Generation of Vector Patterns through Reseeding of Multiple-Polynomial LFSRs
type: misc
user_id: '659'
year: '1992'
...
---
_id: '13017'
author:
- first_name: Hans-Joachim
  full_name: Wunderlich, Hans-Joachim
  last_name: Wunderlich
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
citation:
  ama: Wunderlich H-J, Hellebrand S. The Pseudoexhaustive Test of Sequential Circuits.
    <i>IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
    (TCAD)</i>. 1992;11(1):26-33. doi:<a href="https://doi.org/10.1109/43.108616">10.1109/43.108616</a>
  apa: Wunderlich, H.-J., &#38; Hellebrand, S. (1992). The Pseudoexhaustive Test of
    Sequential Circuits. <i>IEEE Transactions on Computer-Aided Design of Integrated
    Circuits and Systems (TCAD)</i>, <i>11</i>(1), 26–33. <a href="https://doi.org/10.1109/43.108616">https://doi.org/10.1109/43.108616</a>
  bibtex: '@article{Wunderlich_Hellebrand_1992, title={The Pseudoexhaustive Test of
    Sequential Circuits}, volume={11}, DOI={<a href="https://doi.org/10.1109/43.108616">10.1109/43.108616</a>},
    number={1}, journal={IEEE Transactions on Computer-Aided Design of Integrated
    Circuits and Systems (TCAD)}, publisher={Institute of Electrical and Electronics
    Engineers (IEEE)}, author={Wunderlich, Hans-Joachim and Hellebrand, Sybille},
    year={1992}, pages={26–33} }'
  chicago: 'Wunderlich, Hans-Joachim, and Sybille Hellebrand. “The Pseudoexhaustive
    Test of Sequential Circuits.” <i>IEEE Transactions on Computer-Aided Design of
    Integrated Circuits and Systems (TCAD)</i> 11, no. 1 (1992): 26–33. <a href="https://doi.org/10.1109/43.108616">https://doi.org/10.1109/43.108616</a>.'
  ieee: 'H.-J. Wunderlich and S. Hellebrand, “The Pseudoexhaustive Test of Sequential
    Circuits,” <i>IEEE Transactions on Computer-Aided Design of Integrated Circuits
    and Systems (TCAD)</i>, vol. 11, no. 1, pp. 26–33, 1992, doi: <a href="https://doi.org/10.1109/43.108616">10.1109/43.108616</a>.'
  mla: Wunderlich, Hans-Joachim, and Sybille Hellebrand. “The Pseudoexhaustive Test
    of Sequential Circuits.” <i>IEEE Transactions on Computer-Aided Design of Integrated
    Circuits and Systems (TCAD)</i>, vol. 11, no. 1, Institute of Electrical and Electronics
    Engineers (IEEE), 1992, pp. 26–33, doi:<a href="https://doi.org/10.1109/43.108616">10.1109/43.108616</a>.
  short: H.-J. Wunderlich, S. Hellebrand, IEEE Transactions on Computer-Aided Design
    of Integrated Circuits and Systems (TCAD) 11 (1992) 26–33.
date_created: 2019-08-28T10:29:15Z
date_updated: 2022-05-11T16:12:45Z
department:
- _id: '48'
doi: 10.1109/43.108616
extern: '1'
intvolume: '        11'
issue: '1'
language:
- iso: eng
page: 26-33
publication: IEEE Transactions on Computer-Aided Design of Integrated Circuits and
  Systems (TCAD)
publisher: Institute of Electrical and Electronics Engineers (IEEE)
status: public
title: The Pseudoexhaustive Test of Sequential Circuits
type: journal_article
user_id: '209'
volume: 11
year: '1992'
...
---
_id: '13016'
author:
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Steffen
  full_name: Tarnick, Steffen
  last_name: Tarnick
- first_name: Janusz
  full_name: Rajski, Janusz
  last_name: Rajski
- first_name: Bernard
  full_name: Courtois, Bernard
  last_name: Courtois
citation:
  ama: 'Hellebrand S, Tarnick S, Rajski J, Courtois B. Generation of Vector Patterns
    through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers. In:
    <i>IEEE International Test Conference (ITC’92)</i>. IEEE; 1992:120-129. doi:<a
    href="https://doi.org/10.1109/test.1992.527812">10.1109/test.1992.527812</a>'
  apa: Hellebrand, S., Tarnick, S., Rajski, J., &#38; Courtois, B. (1992). Generation
    of Vector Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift
    Registers. <i>IEEE International Test Conference (ITC’92)</i>, 120–129. <a href="https://doi.org/10.1109/test.1992.527812">https://doi.org/10.1109/test.1992.527812</a>
  bibtex: '@inproceedings{Hellebrand_Tarnick_Rajski_Courtois_1992, place={Baltimore,
    MD, USA}, title={Generation of Vector Patterns through Reseeding of Multiple-Polynomial
    Linear Feedback Shift Registers}, DOI={<a href="https://doi.org/10.1109/test.1992.527812">10.1109/test.1992.527812</a>},
    booktitle={IEEE International Test Conference (ITC’92)}, publisher={IEEE}, author={Hellebrand,
    Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard}, year={1992},
    pages={120–129} }'
  chicago: 'Hellebrand, Sybille, Steffen Tarnick, Janusz Rajski, and Bernard Courtois.
    “Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear
    Feedback Shift Registers.” In <i>IEEE International Test Conference (ITC’92)</i>,
    120–29. Baltimore, MD, USA: IEEE, 1992. <a href="https://doi.org/10.1109/test.1992.527812">https://doi.org/10.1109/test.1992.527812</a>.'
  ieee: 'S. Hellebrand, S. Tarnick, J. Rajski, and B. Courtois, “Generation of Vector
    Patterns through Reseeding of Multiple-Polynomial Linear Feedback Shift Registers,”
    in <i>IEEE International Test Conference (ITC’92)</i>, 1992, pp. 120–129, doi:
    <a href="https://doi.org/10.1109/test.1992.527812">10.1109/test.1992.527812</a>.'
  mla: Hellebrand, Sybille, et al. “Generation of Vector Patterns through Reseeding
    of Multiple-Polynomial Linear Feedback Shift Registers.” <i>IEEE International
    Test Conference (ITC’92)</i>, IEEE, 1992, pp. 120–29, doi:<a href="https://doi.org/10.1109/test.1992.527812">10.1109/test.1992.527812</a>.
  short: 'S. Hellebrand, S. Tarnick, J. Rajski, B. Courtois, in: IEEE International
    Test Conference (ITC’92), IEEE, Baltimore, MD, USA, 1992, pp. 120–129.'
date_created: 2019-08-28T10:27:45Z
date_updated: 2022-05-11T16:23:33Z
department:
- _id: '48'
doi: 10.1109/test.1992.527812
extern: '1'
language:
- iso: eng
page: 120-129
place: Baltimore, MD, USA
publication: IEEE International Test Conference (ITC'92)
publisher: IEEE
status: public
title: Generation of Vector Patterns through Reseeding of Multiple-Polynomial Linear
  Feedback Shift Registers
type: conference
user_id: '209'
year: '1992'
...
---
_id: '13034'
author:
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
citation:
  ama: 'Hellebrand S. <i>Synthese Vollständig Testbarer Schaltungen</i>. Verlag Düsseldorf:
    VDI Verlag: Verlag Düsseldorf: VDI Verlag; 1991.'
  apa: 'Hellebrand, S. (1991). <i>Synthese vollständig testbarer Schaltungen</i>.
    Verlag Düsseldorf: VDI Verlag: Verlag Düsseldorf: VDI Verlag.'
  bibtex: '@book{Hellebrand_1991, place={Verlag Düsseldorf: VDI Verlag}, series={10},
    title={Synthese vollständig testbarer Schaltungen}, publisher={Verlag Düsseldorf:
    VDI Verlag}, author={Hellebrand, Sybille}, year={1991}, collection={10} }'
  chicago: 'Hellebrand, Sybille. <i>Synthese Vollständig Testbarer Schaltungen</i>.
    10. Verlag Düsseldorf: VDI Verlag: Verlag Düsseldorf: VDI Verlag, 1991.'
  ieee: 'S. Hellebrand, <i>Synthese vollständig testbarer Schaltungen</i>. Verlag
    Düsseldorf: VDI Verlag: Verlag Düsseldorf: VDI Verlag, 1991.'
  mla: 'Hellebrand, Sybille. <i>Synthese Vollständig Testbarer Schaltungen</i>. Verlag
    Düsseldorf: VDI Verlag, 1991.'
  short: 'S. Hellebrand, Synthese Vollständig Testbarer Schaltungen, Verlag Düsseldorf:
    VDI Verlag, Verlag Düsseldorf: VDI Verlag, 1991.'
date_created: 2019-08-28T10:37:07Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
extern: '1'
language:
- iso: eng
place: 'Verlag Düsseldorf: VDI Verlag'
publication_identifier:
  isbn:
  - '3257227892'
publisher: 'Verlag Düsseldorf: VDI Verlag'
series_title: '10'
status: public
title: Synthese vollständig testbarer Schaltungen
type: book
user_id: '659'
year: '1991'
...
---
_id: '13103'
author:
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
  full_name: Wunderlich, Hans-Joachim
  last_name: Wunderlich
- first_name: Oliver
  full_name: F. Haberl, Oliver
  last_name: F. Haberl
citation:
  ama: Hellebrand S, Wunderlich H-J, F. Haberl O. <i>Generating Pseudo-Exhaustive
    Vectors for External Testing</i>. IEEE Design for Testability Workshop, Vail,
    CO, USA; 1990.
  apa: Hellebrand, S., Wunderlich, H.-J., &#38; F. Haberl, O. (1990). <i>Generating
    Pseudo-Exhaustive Vectors for External Testing</i>. IEEE Design for Testability
    Workshop, Vail, CO, USA.
  bibtex: '@book{Hellebrand_Wunderlich_F. Haberl_1990, place={IEEE Design for Testability
    Workshop, Vail, CO, USA}, title={Generating Pseudo-Exhaustive Vectors for External
    Testing}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and F. Haberl,
    Oliver}, year={1990} }'
  chicago: Hellebrand, Sybille, Hans-Joachim Wunderlich, and Oliver F. Haberl. <i>Generating
    Pseudo-Exhaustive Vectors for External Testing</i>. IEEE Design for Testability
    Workshop, Vail, CO, USA, 1990.
  ieee: S. Hellebrand, H.-J. Wunderlich, and O. F. Haberl, <i>Generating Pseudo-Exhaustive
    Vectors for External Testing</i>. IEEE Design for Testability Workshop, Vail,
    CO, USA, 1990.
  mla: Hellebrand, Sybille, et al. <i>Generating Pseudo-Exhaustive Vectors for External
    Testing</i>. 1990.
  short: S. Hellebrand, H.-J. Wunderlich, O. F. Haberl, Generating Pseudo-Exhaustive
    Vectors for External Testing, IEEE Design for Testability Workshop, Vail, CO,
    USA, 1990.
date_created: 2019-08-28T12:23:40Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
extern: '1'
keyword:
- WORKSHOP
language:
- iso: eng
place: IEEE Design for Testability Workshop, Vail, CO, USA
status: public
title: Generating Pseudo-Exhaustive Vectors for External Testing
type: misc
user_id: '659'
year: '1990'
...
---
_id: '13018'
author:
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
  full_name: Wunderlich, Hans-Joachim
  last_name: Wunderlich
citation:
  ama: 'Hellebrand S, Wunderlich H-J. Tools and Devices Supporting the Pseudo-Exhaustive
    Test. In: <i>European Design Automation Conference (EDAC’90)</i>. IEEE; 1990:13-17.
    doi:<a href="https://doi.org/10.1109/edac.1990.136612">10.1109/edac.1990.136612</a>'
  apa: Hellebrand, S., &#38; Wunderlich, H.-J. (1990). Tools and Devices Supporting
    the Pseudo-Exhaustive Test. <i>European Design Automation Conference (EDAC’90)</i>,
    13–17. <a href="https://doi.org/10.1109/edac.1990.136612">https://doi.org/10.1109/edac.1990.136612</a>
  bibtex: '@inproceedings{Hellebrand_Wunderlich_1990, place={Glasgow, UK}, title={Tools
    and Devices Supporting the Pseudo-Exhaustive Test}, DOI={<a href="https://doi.org/10.1109/edac.1990.136612">10.1109/edac.1990.136612</a>},
    booktitle={European Design Automation Conference (EDAC’90)}, publisher={IEEE},
    author={Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1990}, pages={13–17}
    }'
  chicago: 'Hellebrand, Sybille, and Hans-Joachim Wunderlich. “Tools and Devices Supporting
    the Pseudo-Exhaustive Test.” In <i>European Design Automation Conference (EDAC’90)</i>,
    13–17. Glasgow, UK: IEEE, 1990. <a href="https://doi.org/10.1109/edac.1990.136612">https://doi.org/10.1109/edac.1990.136612</a>.'
  ieee: 'S. Hellebrand and H.-J. Wunderlich, “Tools and Devices Supporting the Pseudo-Exhaustive
    Test,” in <i>European Design Automation Conference (EDAC’90)</i>, 1990, pp. 13–17,
    doi: <a href="https://doi.org/10.1109/edac.1990.136612">10.1109/edac.1990.136612</a>.'
  mla: Hellebrand, Sybille, and Hans-Joachim Wunderlich. “Tools and Devices Supporting
    the Pseudo-Exhaustive Test.” <i>European Design Automation Conference (EDAC’90)</i>,
    IEEE, 1990, pp. 13–17, doi:<a href="https://doi.org/10.1109/edac.1990.136612">10.1109/edac.1990.136612</a>.
  short: 'S. Hellebrand, H.-J. Wunderlich, in: European Design Automation Conference
    (EDAC’90), IEEE, Glasgow, UK, 1990, pp. 13–17.'
date_created: 2019-08-28T10:29:16Z
date_updated: 2022-05-11T16:24:46Z
department:
- _id: '48'
doi: 10.1109/edac.1990.136612
extern: '1'
language:
- iso: eng
page: 13-17
place: Glasgow, UK
publication: European Design Automation Conference (EDAC'90)
publisher: IEEE
status: public
title: Tools and Devices Supporting the Pseudo-Exhaustive Test
type: conference
user_id: '209'
year: '1990'
...
---
_id: '13019'
author:
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
  full_name: Wunderlich, Hans-Joachim
  last_name: Wunderlich
- first_name: Oliver
  full_name: F. Haberl, Oliver
  last_name: F. Haberl
citation:
  ama: 'Hellebrand S, Wunderlich H-J, F. Haberl O. Generating Pseudo-Exhaustive Vectors
    for External Testing. In: <i>IEEE International Test Conference (ITC’90)</i>.
    IEEE; 1990:670-679. doi:<a href="https://doi.org/10.1109/test.1990.114082">10.1109/test.1990.114082</a>'
  apa: Hellebrand, S., Wunderlich, H.-J., &#38; F. Haberl, O. (1990). Generating Pseudo-Exhaustive
    Vectors for External Testing. <i>IEEE International Test Conference (ITC’90)</i>,
    670–679. <a href="https://doi.org/10.1109/test.1990.114082">https://doi.org/10.1109/test.1990.114082</a>
  bibtex: '@inproceedings{Hellebrand_Wunderlich_F. Haberl_1990, place={Washington,
    DC, USA}, title={Generating Pseudo-Exhaustive Vectors for External Testing}, DOI={<a
    href="https://doi.org/10.1109/test.1990.114082">10.1109/test.1990.114082</a>},
    booktitle={IEEE International Test Conference (ITC’90)}, publisher={IEEE}, author={Hellebrand,
    Sybille and Wunderlich, Hans-Joachim and F. Haberl, Oliver}, year={1990}, pages={670–679}
    }'
  chicago: 'Hellebrand, Sybille, Hans-Joachim Wunderlich, and Oliver F. Haberl. “Generating
    Pseudo-Exhaustive Vectors for External Testing.” In <i>IEEE International Test
    Conference (ITC’90)</i>, 670–79. Washington, DC, USA: IEEE, 1990. <a href="https://doi.org/10.1109/test.1990.114082">https://doi.org/10.1109/test.1990.114082</a>.'
  ieee: 'S. Hellebrand, H.-J. Wunderlich, and O. F. Haberl, “Generating Pseudo-Exhaustive
    Vectors for External Testing,” in <i>IEEE International Test Conference (ITC’90)</i>,
    1990, pp. 670–679, doi: <a href="https://doi.org/10.1109/test.1990.114082">10.1109/test.1990.114082</a>.'
  mla: Hellebrand, Sybille, et al. “Generating Pseudo-Exhaustive Vectors for External
    Testing.” <i>IEEE International Test Conference (ITC’90)</i>, IEEE, 1990, pp.
    670–79, doi:<a href="https://doi.org/10.1109/test.1990.114082">10.1109/test.1990.114082</a>.
  short: 'S. Hellebrand, H.-J. Wunderlich, O. F. Haberl, in: IEEE International Test
    Conference (ITC’90), IEEE, Washington, DC, USA, 1990, pp. 670–679.'
date_created: 2019-08-28T10:29:17Z
date_updated: 2022-05-11T16:59:33Z
department:
- _id: '48'
doi: 10.1109/test.1990.114082
extern: '1'
language:
- iso: eng
page: 670-679
place: Washington, DC, USA
publication: IEEE International Test Conference (ITC'90)
publisher: IEEE
status: public
title: Generating Pseudo-Exhaustive Vectors for External Testing
type: conference
user_id: '209'
year: '1990'
...
---
_id: '13020'
author:
- first_name: Hans-Joachim
  full_name: Wunderlich, Hans-Joachim
  last_name: Wunderlich
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
citation:
  ama: 'Wunderlich H-J, Hellebrand S. The Pseudo-Exhaustive Test of Sequential Circuits.
    In: <i>IEEE International Test Conference (ITC’89)</i>. IEEE; 1989:19-27. doi:<a
    href="https://doi.org/10.1109/test.1989.82273">10.1109/test.1989.82273</a>'
  apa: Wunderlich, H.-J., &#38; Hellebrand, S. (1989). The Pseudo-Exhaustive Test
    of Sequential Circuits. <i>IEEE International Test Conference (ITC’89)</i>, 19–27.
    <a href="https://doi.org/10.1109/test.1989.82273">https://doi.org/10.1109/test.1989.82273</a>
  bibtex: '@inproceedings{Wunderlich_Hellebrand_1989, place={Washington, DC, USA},
    title={The Pseudo-Exhaustive Test of Sequential Circuits}, DOI={<a href="https://doi.org/10.1109/test.1989.82273">10.1109/test.1989.82273</a>},
    booktitle={IEEE International Test Conference (ITC’89)}, publisher={IEEE}, author={Wunderlich,
    Hans-Joachim and Hellebrand, Sybille}, year={1989}, pages={19–27} }'
  chicago: 'Wunderlich, Hans-Joachim, and Sybille Hellebrand. “The Pseudo-Exhaustive
    Test of Sequential Circuits.” In <i>IEEE International Test Conference (ITC’89)</i>,
    19–27. Washington, DC, USA: IEEE, 1989. <a href="https://doi.org/10.1109/test.1989.82273">https://doi.org/10.1109/test.1989.82273</a>.'
  ieee: 'H.-J. Wunderlich and S. Hellebrand, “The Pseudo-Exhaustive Test of Sequential
    Circuits,” in <i>IEEE International Test Conference (ITC’89)</i>, 1989, pp. 19–27,
    doi: <a href="https://doi.org/10.1109/test.1989.82273">10.1109/test.1989.82273</a>.'
  mla: Wunderlich, Hans-Joachim, and Sybille Hellebrand. “The Pseudo-Exhaustive Test
    of Sequential Circuits.” <i>IEEE International Test Conference (ITC’89)</i>, IEEE,
    1989, pp. 19–27, doi:<a href="https://doi.org/10.1109/test.1989.82273">10.1109/test.1989.82273</a>.
  short: 'H.-J. Wunderlich, S. Hellebrand, in: IEEE International Test Conference
    (ITC’89), IEEE, Washington, DC, USA, 1989, pp. 19–27.'
date_created: 2019-08-28T10:30:16Z
date_updated: 2022-05-11T17:00:08Z
department:
- _id: '48'
doi: 10.1109/test.1989.82273
extern: '1'
language:
- iso: eng
page: 19-27
place: Washington, DC, USA
publication: IEEE International Test Conference (ITC'89)
publisher: IEEE
status: public
title: The Pseudo-Exhaustive Test of Sequential Circuits
type: conference
user_id: '209'
year: '1989'
...
---
_id: '13021'
author:
- first_name: Hans-Joachim
  full_name: Wunderlich, Hans-Joachim
  last_name: Wunderlich
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
citation:
  ama: 'Wunderlich H-J, Hellebrand S. Generating Pattern Sequences for the Pseudo-Exhaustive
    Test of MOS-Circuits. In: <i>18th International Symposium on Fault-Tolerant Computing,
    FTCS-18</i>. ; 1988:36-45. doi:<a href="https://doi.org/10.1109/ftcs.1988.5294">10.1109/ftcs.1988.5294</a>'
  apa: Wunderlich, H.-J., &#38; Hellebrand, S. (1988). Generating Pattern Sequences
    for the Pseudo-Exhaustive Test of MOS-Circuits. <i>18th International Symposium
    on Fault-Tolerant Computing, FTCS-18</i>, 36–45. <a href="https://doi.org/10.1109/ftcs.1988.5294">https://doi.org/10.1109/ftcs.1988.5294</a>
  bibtex: '@inproceedings{Wunderlich_Hellebrand_1988, place={Tokyo, Japan}, title={Generating
    Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits}, DOI={<a href="https://doi.org/10.1109/ftcs.1988.5294">10.1109/ftcs.1988.5294</a>},
    booktitle={18th International Symposium on Fault-Tolerant Computing, FTCS-18},
    author={Wunderlich, Hans-Joachim and Hellebrand, Sybille}, year={1988}, pages={36–45}
    }'
  chicago: Wunderlich, Hans-Joachim, and Sybille Hellebrand. “Generating Pattern Sequences
    for the Pseudo-Exhaustive Test of MOS-Circuits.” In <i>18th International Symposium
    on Fault-Tolerant Computing, FTCS-18</i>, 36–45. Tokyo, Japan, 1988. <a href="https://doi.org/10.1109/ftcs.1988.5294">https://doi.org/10.1109/ftcs.1988.5294</a>.
  ieee: 'H.-J. Wunderlich and S. Hellebrand, “Generating Pattern Sequences for the
    Pseudo-Exhaustive Test of MOS-Circuits,” in <i>18th International Symposium on
    Fault-Tolerant Computing, FTCS-18</i>, 1988, pp. 36–45, doi: <a href="https://doi.org/10.1109/ftcs.1988.5294">10.1109/ftcs.1988.5294</a>.'
  mla: Wunderlich, Hans-Joachim, and Sybille Hellebrand. “Generating Pattern Sequences
    for the Pseudo-Exhaustive Test of MOS-Circuits.” <i>18th International Symposium
    on Fault-Tolerant Computing, FTCS-18</i>, 1988, pp. 36–45, doi:<a href="https://doi.org/10.1109/ftcs.1988.5294">10.1109/ftcs.1988.5294</a>.
  short: 'H.-J. Wunderlich, S. Hellebrand, in: 18th International Symposium on Fault-Tolerant
    Computing, FTCS-18, Tokyo, Japan, 1988, pp. 36–45.'
date_created: 2019-08-28T10:30:18Z
date_updated: 2022-05-11T17:01:49Z
department:
- _id: '48'
doi: 10.1109/ftcs.1988.5294
extern: '1'
language:
- iso: eng
page: 36-45
place: Tokyo, Japan
publication: 18th International Symposium on Fault-Tolerant Computing, FTCS-18
status: public
title: Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits
type: conference
user_id: '209'
year: '1988'
...
---
_id: '13058'
author:
- first_name: Detlef
  full_name: Schmid, Detlef
  last_name: Schmid
- first_name: Hans-Joachim
  full_name: Wunderlich, Hans-Joachim
  last_name: Wunderlich
- first_name: Fridtjof
  full_name: Feldbusch, Fridtjof
  last_name: Feldbusch
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Juergen
  full_name: Holzinger, Juergen
  last_name: Holzinger
- first_name: Arno
  full_name: Kunzmann, Arno
  last_name: Kunzmann
citation:
  ama: 'Schmid D, Wunderlich H-J, Feldbusch F, Hellebrand S, Holzinger J, Kunzmann
    A. Integrated Tools for Automatic Design for Testability. In: <i>Tool Integration
    and Design Environments, F.J. Rammig (Editor)</i>. Amsterdam: Elsevier Science
    Publishers B.V.(North Holland), IFIP; 1988:233-258.'
  apa: Schmid, D., Wunderlich, H.-J., Feldbusch, F., Hellebrand, S., Holzinger, J.,
    &#38; Kunzmann, A. (1988). Integrated Tools for Automatic Design for Testability.
    <i>Tool Integration and Design Environments, F.J. Rammig (Editor)</i>, 233–258.
  bibtex: '@inproceedings{Schmid_Wunderlich_Feldbusch_Hellebrand_Holzinger_Kunzmann_1988,
    place={Amsterdam, The Netherlands}, title={Integrated Tools for Automatic Design
    for Testability}, booktitle={Tool Integration and Design Environments, F.J. Rammig
    (Editor)}, publisher={Amsterdam: Elsevier Science Publishers B.V.(North Holland),
    IFIP}, author={Schmid, Detlef and Wunderlich, Hans-Joachim and Feldbusch, Fridtjof
    and Hellebrand, Sybille and Holzinger, Juergen and Kunzmann, Arno}, year={1988},
    pages={233–258} }'
  chicago: 'Schmid, Detlef, Hans-Joachim Wunderlich, Fridtjof Feldbusch, Sybille Hellebrand,
    Juergen Holzinger, and Arno Kunzmann. “Integrated Tools for Automatic Design for
    Testability.” In <i>Tool Integration and Design Environments, F.J. Rammig (Editor)</i>,
    233–58. Amsterdam, The Netherlands: Amsterdam: Elsevier Science Publishers B.V.(North
    Holland), IFIP, 1988.'
  ieee: D. Schmid, H.-J. Wunderlich, F. Feldbusch, S. Hellebrand, J. Holzinger, and
    A. Kunzmann, “Integrated Tools for Automatic Design for Testability,” in <i>Tool
    Integration and Design Environments, F.J. Rammig (Editor)</i>, 1988, pp. 233–258.
  mla: 'Schmid, Detlef, et al. “Integrated Tools for Automatic Design for Testability.”
    <i>Tool Integration and Design Environments, F.J. Rammig (Editor)</i>, Amsterdam:
    Elsevier Science Publishers B.V.(North Holland), IFIP, 1988, pp. 233–58.'
  short: 'D. Schmid, H.-J. Wunderlich, F. Feldbusch, S. Hellebrand, J. Holzinger,
    A. Kunzmann, in: Tool Integration and Design Environments, F.J. Rammig (Editor),
    Amsterdam: Elsevier Science Publishers B.V.(North Holland), IFIP, Amsterdam, The
    Netherlands, 1988, pp. 233–258.'
date_created: 2019-08-28T11:49:46Z
date_updated: 2022-05-11T17:02:35Z
department:
- _id: '48'
language:
- iso: eng
page: 233-258
place: Amsterdam, The Netherlands
publication: Tool Integration and Design Environments, F.J. Rammig (Editor)
publisher: 'Amsterdam: Elsevier Science Publishers B.V.(North Holland), IFIP'
status: public
title: Integrated Tools for Automatic Design for Testability
type: conference
user_id: '209'
year: '1988'
...
---
_id: '13062'
author:
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
  full_name: Wunderlich, Hans-Joachim
  last_name: Wunderlich
citation:
  ama: 'Hellebrand S, Wunderlich H-J. Automatisierung des Entwurfs vollständig testbarer
    Schaltungen. In: <i>GI - 18. Jahrestagung II, Hamburg, 1988, Informatik-Fachberichte
    188</i>. Springer Verlag; 1988:145-159.'
  apa: Hellebrand, S., &#38; Wunderlich, H.-J. (1988). Automatisierung des Entwurfs
    vollständig testbarer Schaltungen. <i>GI - 18. Jahrestagung II, Hamburg, 1988,
    Informatik-Fachberichte 188</i>, 145–159.
  bibtex: '@inproceedings{Hellebrand_Wunderlich_1988, place={Hamburg, Germany}, title={Automatisierung
    des Entwurfs vollständig testbarer Schaltungen}, booktitle={GI - 18. Jahrestagung
    II, Hamburg, 1988, Informatik-Fachberichte 188}, publisher={Springer Verlag},
    author={Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1988}, pages={145–159}
    }'
  chicago: 'Hellebrand, Sybille, and Hans-Joachim Wunderlich. “Automatisierung Des
    Entwurfs Vollständig Testbarer Schaltungen.” In <i>GI - 18. Jahrestagung II, Hamburg,
    1988, Informatik-Fachberichte 188</i>, 145–59. Hamburg, Germany: Springer Verlag,
    1988.'
  ieee: S. Hellebrand and H.-J. Wunderlich, “Automatisierung des Entwurfs vollständig
    testbarer Schaltungen,” in <i>GI - 18. Jahrestagung II, Hamburg, 1988, Informatik-Fachberichte
    188</i>, 1988, pp. 145–159.
  mla: Hellebrand, Sybille, and Hans-Joachim Wunderlich. “Automatisierung Des Entwurfs
    Vollständig Testbarer Schaltungen.” <i>GI - 18. Jahrestagung II, Hamburg, 1988,
    Informatik-Fachberichte 188</i>, Springer Verlag, 1988, pp. 145–59.
  short: 'S. Hellebrand, H.-J. Wunderlich, in: GI - 18. Jahrestagung II, Hamburg,
    1988, Informatik-Fachberichte 188, Springer Verlag, Hamburg, Germany, 1988, pp.
    145–159.'
date_created: 2019-08-28T11:54:29Z
date_updated: 2022-05-11T17:03:06Z
department:
- _id: '48'
extern: '1'
language:
- iso: eng
page: 145-159
place: Hamburg, Germany
publication: GI - 18. Jahrestagung II, Hamburg, 1988, Informatik-Fachberichte 188
publisher: Springer Verlag
status: public
title: Automatisierung des Entwurfs vollständig testbarer Schaltungen
type: conference
user_id: '209'
year: '1988'
...
---
_id: '13022'
author:
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
citation:
  ama: Hellebrand S. <i>Deformation Dicker Punkte Und Netze von Quadriken</i>. Universität
    Regensburg, Fakultät für Mathematik, Regensburg, Germany; 1986.
  apa: Hellebrand, S. (1986). <i>Deformation dicker Punkte und Netze von Quadriken</i>.
    Universität Regensburg, Fakultät für Mathematik, Regensburg, Germany.
  bibtex: '@book{Hellebrand_1986, place={Universität Regensburg, Fakultät für Mathematik,
    Regensburg, Germany}, title={Deformation dicker Punkte und Netze von Quadriken},
    author={Hellebrand, Sybille}, year={1986} }'
  chicago: Hellebrand, Sybille. <i>Deformation Dicker Punkte Und Netze von Quadriken</i>.
    Universität Regensburg, Fakultät für Mathematik, Regensburg, Germany, 1986.
  ieee: S. Hellebrand, <i>Deformation dicker Punkte und Netze von Quadriken</i>. Universität
    Regensburg, Fakultät für Mathematik, Regensburg, Germany, 1986.
  mla: Hellebrand, Sybille. <i>Deformation Dicker Punkte Und Netze von Quadriken</i>.
    1986.
  short: S. Hellebrand, Deformation Dicker Punkte Und Netze von Quadriken, Universität
    Regensburg, Fakultät für Mathematik, Regensburg, Germany, 1986.
date_created: 2019-08-28T10:30:19Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
extern: '1'
language:
- iso: eng
place: Universität Regensburg, Fakultät für Mathematik, Regensburg, Germany
status: public
title: Deformation dicker Punkte und Netze von Quadriken
type: report
user_id: '659'
year: '1986'
...