---
_id: '8667'
author:
- first_name: Alexander
full_name: Sprenger, Alexander
id: '22707'
last_name: Sprenger
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: Sprenger A, Hellebrand S. Divide and Compact - Stochastic Space Compaction
for Faster-than-At-Speed Test. Journal of Circuits, Systems and Computers.
2019;28(1):1-23. doi:10.1142/s0218126619400012
apa: Sprenger, A., & Hellebrand, S. (2019). Divide and Compact - Stochastic
Space Compaction for Faster-than-At-Speed Test. Journal of Circuits, Systems
and Computers, 28(1), 1–23. https://doi.org/10.1142/s0218126619400012
bibtex: '@article{Sprenger_Hellebrand_2019, title={Divide and Compact - Stochastic
Space Compaction for Faster-than-At-Speed Test}, volume={28}, DOI={10.1142/s0218126619400012},
number={1}, journal={Journal of Circuits, Systems and Computers}, publisher={World
Scientific Publishing Company}, author={Sprenger, Alexander and Hellebrand, Sybille},
year={2019}, pages={1–23} }'
chicago: 'Sprenger, Alexander, and Sybille Hellebrand. “Divide and Compact - Stochastic
Space Compaction for Faster-than-At-Speed Test.” Journal of Circuits, Systems
and Computers 28, no. 1 (2019): 1–23. https://doi.org/10.1142/s0218126619400012.'
ieee: A. Sprenger and S. Hellebrand, “Divide and Compact - Stochastic Space Compaction
for Faster-than-At-Speed Test,” Journal of Circuits, Systems and Computers,
vol. 28, no. 1, pp. 1–23, 2019.
mla: Sprenger, Alexander, and Sybille Hellebrand. “Divide and Compact - Stochastic
Space Compaction for Faster-than-At-Speed Test.” Journal of Circuits, Systems
and Computers, vol. 28, no. 1, World Scientific Publishing Company, 2019,
pp. 1–23, doi:10.1142/s0218126619400012.
short: A. Sprenger, S. Hellebrand, Journal of Circuits, Systems and Computers 28
(2019) 1–23.
date_created: 2019-03-27T08:57:42Z
date_updated: 2022-01-06T07:03:58Z
department:
- _id: '48'
doi: 10.1142/s0218126619400012
intvolume: ' 28'
issue: '1'
language:
- iso: eng
page: 1-23
project:
- _id: '52'
name: Computing Resources Provided by the Paderborn Center for Parallel Computing
publication: Journal of Circuits, Systems and Computers
publication_identifier:
issn:
- 0218-1266
- 1793-6454
publication_status: published
publisher: World Scientific Publishing Company
status: public
title: Divide and Compact - Stochastic Space Compaction for Faster-than-At-Speed Test
type: journal_article
user_id: '59789'
volume: 28
year: '2019'
...
---
_id: '13048'
abstract:
- lang: eng
text: Marginal hardware introduces severe reliability threats throughout the life
cycle of a system. Although marginalities may not affect the functionality of
a circuit immediately after manufacturing, they can degrade into hard failures
and must be screened out during manufacturing test to prevent early life failures.
Furthermore, their evolution in the field must be proactively monitored by periodic
tests before actual failures occur. In recent years small delay faults have gained
increasing attention as possible indicators of marginal hardware. However, small
delay faults on short paths may be undetectable even with advanced timing aware
ATPG. Faster-than-at-speed test (FAST) can detect such hidden delay faults, but
so far FAST has mainly been restricted to manufacturing test.
author:
- first_name: Matthias
full_name: Kampmann, Matthias
id: '10935'
last_name: Kampmann
- first_name: Michael
full_name: A. Kochte, Michael
last_name: A. Kochte
- first_name: Chang
full_name: Liu, Chang
last_name: Liu
- first_name: Eric
full_name: Schneider, Eric
last_name: Schneider
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: Kampmann M, A. Kochte M, Liu C, Schneider E, Hellebrand S, Wunderlich H-J.
Built-in Test for Hidden Delay Faults. IEEE Transactions on Computer-Aided
Design of Integrated Circuits and Systems (TCAD). 2019;38(10):1956-1968.
apa: Kampmann, M., A. Kochte, M., Liu, C., Schneider, E., Hellebrand, S., &
Wunderlich, H.-J. (2019). Built-in Test for Hidden Delay Faults. IEEE Transactions
on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 38(10),
1956–1968.
bibtex: '@article{Kampmann_A. Kochte_Liu_Schneider_Hellebrand_Wunderlich_2019, title={Built-in
Test for Hidden Delay Faults}, volume={38}, number={10}, journal={IEEE Transactions
on Computer-Aided Design of Integrated Circuits and Systems (TCAD)}, publisher={IEEE},
author={Kampmann, Matthias and A. Kochte, Michael and Liu, Chang and Schneider,
Eric and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2019}, pages={1956–1968}
}'
chicago: 'Kampmann, Matthias, Michael A. Kochte, Chang Liu, Eric Schneider, Sybille
Hellebrand, and Hans-Joachim Wunderlich. “Built-in Test for Hidden Delay Faults.”
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
(TCAD) 38, no. 10 (2019): 1956–68.'
ieee: M. Kampmann, M. A. Kochte, C. Liu, E. Schneider, S. Hellebrand, and H.-J.
Wunderlich, “Built-in Test for Hidden Delay Faults,” IEEE Transactions on Computer-Aided
Design of Integrated Circuits and Systems (TCAD), vol. 38, no. 10, pp. 1956–1968,
2019.
mla: Kampmann, Matthias, et al. “Built-in Test for Hidden Delay Faults.” IEEE
Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD),
vol. 38, no. 10, IEEE, 2019, pp. 1956–68.
short: M. Kampmann, M. A. Kochte, C. Liu, E. Schneider, S. Hellebrand, H.-J. Wunderlich,
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
(TCAD) 38 (2019) 1956–1968.
date_created: 2019-08-28T11:44:25Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
intvolume: ' 38'
issue: '10'
language:
- iso: eng
page: 1956 - 1968
publication: IEEE Transactions on Computer-Aided Design of Integrated Circuits and
Systems (TCAD)
publication_identifier:
eissn:
- 1937-4151
publication_status: published
publisher: IEEE
status: public
title: Built-in Test for Hidden Delay Faults
type: journal_article
user_id: '209'
volume: 38
year: '2019'
...
---
_id: '12918'
abstract:
- lang: eng
text: 'The test for small delay faults is of major importance for predicting potential
early life failures or wearout problems. Typically, a faster-than-at-speed test
(FAST) with sev¬eral different frequencies is used to detect also hidden small
delays, which can only be propagated over short paths. But then the outputs at
the end of long paths may no longer reach their stable values at the nominal observation
time and must be considered as unknown (X-values). Thus, test response compaction
for FAST must be extremely flexible to cope with high X-rates, which also vary
with the test frequencies. Stochastic compaction introduced by Mitra et al. is
controlled by weighted pseudo-random signals allowing for easy adaptation to varying
conditions. As demonstrated in previous work, the pseudo-random control can be
optimized for high fault efficiency or X-reduction, but a given target in fault
efficiency cannot be guaranteed. To close this gap, a hybrid space compactor is
introduced in this paper. It is based on the observation that many faults are
lost in the compaction of relatively few critical test patterns. For these critical
patterns a deterministic compaction phase is added to the test, where the existing
compactor structure is re-used, but controlled by specifically determined control
vectors. '
author:
- first_name: Mohammad Urf
full_name: Maaz, Mohammad Urf
id: '49274'
last_name: Maaz
- first_name: Alexander
full_name: Sprenger, Alexander
id: '22707'
last_name: Sprenger
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: 'Maaz MU, Sprenger A, Hellebrand S. A Hybrid Space Compactor for Adaptive X-Handling.
In: 50th IEEE International Test Conference (ITC). IEEE; 2019:1-8.'
apa: Maaz, M. U., Sprenger, A., & Hellebrand, S. (2019). A Hybrid Space Compactor
for Adaptive X-Handling. 50th IEEE International Test Conference (ITC),
1–8.
bibtex: '@inproceedings{Maaz_Sprenger_Hellebrand_2019, place={Washington, DC, USA},
title={A Hybrid Space Compactor for Adaptive X-Handling}, booktitle={50th IEEE
International Test Conference (ITC)}, publisher={IEEE}, author={Maaz, Mohammad
Urf and Sprenger, Alexander and Hellebrand, Sybille}, year={2019}, pages={1–8}
}'
chicago: 'Maaz, Mohammad Urf, Alexander Sprenger, and Sybille Hellebrand. “A Hybrid
Space Compactor for Adaptive X-Handling.” In 50th IEEE International Test Conference
(ITC), 1–8. Washington, DC, USA: IEEE, 2019.'
ieee: M. U. Maaz, A. Sprenger, and S. Hellebrand, “A Hybrid Space Compactor for
Adaptive X-Handling,” in 50th IEEE International Test Conference (ITC),
Washington, DC, USA, 2019, pp. 1–8.
mla: Maaz, Mohammad Urf, et al. “A Hybrid Space Compactor for Adaptive X-Handling.”
50th IEEE International Test Conference (ITC), IEEE, 2019, pp. 1–8.
short: 'M.U. Maaz, A. Sprenger, S. Hellebrand, in: 50th IEEE International Test
Conference (ITC), IEEE, Washington, DC, USA, 2019, pp. 1–8.'
conference:
end_date: 2019-11-14
location: Washington, DC, USA
name: 50th IEEE International Test Conference (ITC)
start_date: 2019-11-12
date_created: 2019-08-14T06:59:04Z
date_updated: 2022-05-11T17:09:35Z
department:
- _id: '48'
keyword:
- Faster-than-at-speed test
- BIST
- DFT
- Test response compaction
- Stochastic compactor
- X-handling
language:
- iso: eng
page: 1-8
place: Washington, DC, USA
publication: 50th IEEE International Test Conference (ITC)
publication_status: published
publisher: IEEE
quality_controlled: '1'
status: public
title: A Hybrid Space Compactor for Adaptive X-Handling
type: conference
user_id: '209'
year: '2019'
...
---
_id: '4576'
author:
- first_name: Alexander
full_name: Sprenger, Alexander
id: '22707'
last_name: Sprenger
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: 'Sprenger A, Hellebrand S. Stochastische Kompaktierung für den Hochgeschwindigkeitstest.
Freiburg, Germany: 30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen
und Systemen” (TuZ’18); 2018.'
apa: 'Sprenger, A., & Hellebrand, S. (2018). Stochastische Kompaktierung
für den Hochgeschwindigkeitstest. Freiburg, Germany: 30. Workshop “Testmethoden
und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18).'
bibtex: '@book{Sprenger_Hellebrand_2018, place={Freiburg, Germany}, title={Stochastische
Kompaktierung für den Hochgeschwindigkeitstest}, publisher={30. Workshop “Testmethoden
und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18)}, author={Sprenger,
Alexander and Hellebrand, Sybille}, year={2018} }'
chicago: 'Sprenger, Alexander, and Sybille Hellebrand. Stochastische Kompaktierung
für den Hochgeschwindigkeitstest. Freiburg, Germany: 30. Workshop “Testmethoden
und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18), 2018.'
ieee: 'A. Sprenger and S. Hellebrand, Stochastische Kompaktierung für den Hochgeschwindigkeitstest.
Freiburg, Germany: 30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen
und Systemen” (TuZ’18), 2018.'
mla: Sprenger, Alexander, and Sybille Hellebrand. Stochastische Kompaktierung
für den Hochgeschwindigkeitstest. 30. Workshop “Testmethoden und Zuverlässigkeit
von Schaltungen und Systemen” (TuZ’18), 2018.
short: A. Sprenger, S. Hellebrand, Stochastische Kompaktierung für den Hochgeschwindigkeitstest,
30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18),
Freiburg, Germany, 2018.
date_created: 2018-10-02T12:29:44Z
date_updated: 2022-01-06T07:01:13Z
department:
- _id: '48'
keyword:
- WORKSHOP
language:
- iso: ger
place: Freiburg, Germany
publisher: 30. Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen"
(TuZ'18)
status: public
title: Stochastische Kompaktierung für den Hochgeschwindigkeitstest
type: misc
user_id: '22707'
year: '2018'
...
---
_id: '12974'
author:
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Joerg
full_name: Henkel, Joerg
last_name: Henkel
- first_name: Anand
full_name: Raghunathan, Anand
last_name: Raghunathan
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: Hellebrand S, Henkel J, Raghunathan A, Wunderlich H-J. Guest Editors’ Introduction
- Special Issue on Approximate Computing. IEEE Embedded Systems Letters.
2018;10(1):1-1. doi:10.1109/les.2018.2789942
apa: Hellebrand, S., Henkel, J., Raghunathan, A., & Wunderlich, H.-J. (2018).
Guest Editors’ Introduction - Special Issue on Approximate Computing. IEEE
Embedded Systems Letters, 10(1), 1–1. https://doi.org/10.1109/les.2018.2789942
bibtex: '@article{Hellebrand_Henkel_Raghunathan_Wunderlich_2018, title={Guest Editors’
Introduction - Special Issue on Approximate Computing}, volume={10}, DOI={10.1109/les.2018.2789942},
number={1}, journal={IEEE Embedded Systems Letters}, publisher={IEEE}, author={Hellebrand,
Sybille and Henkel, Joerg and Raghunathan, Anand and Wunderlich, Hans-Joachim},
year={2018}, pages={1–1} }'
chicago: 'Hellebrand, Sybille, Joerg Henkel, Anand Raghunathan, and Hans-Joachim
Wunderlich. “Guest Editors’ Introduction - Special Issue on Approximate Computing.”
IEEE Embedded Systems Letters 10, no. 1 (2018): 1–1. https://doi.org/10.1109/les.2018.2789942.'
ieee: S. Hellebrand, J. Henkel, A. Raghunathan, and H.-J. Wunderlich, “Guest Editors’
Introduction - Special Issue on Approximate Computing,” IEEE Embedded Systems
Letters, vol. 10, no. 1, pp. 1–1, 2018.
mla: Hellebrand, Sybille, et al. “Guest Editors’ Introduction - Special Issue on
Approximate Computing.” IEEE Embedded Systems Letters, vol. 10, no. 1,
IEEE, 2018, pp. 1–1, doi:10.1109/les.2018.2789942.
short: S. Hellebrand, J. Henkel, A. Raghunathan, H.-J. Wunderlich, IEEE Embedded
Systems Letters 10 (2018) 1–1.
date_created: 2019-08-28T08:40:58Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
doi: 10.1109/les.2018.2789942
intvolume: ' 10'
issue: '1'
language:
- iso: eng
page: 1-1
publication: IEEE Embedded Systems Letters
publisher: IEEE
status: public
title: Guest Editors' Introduction - Special Issue on Approximate Computing
type: journal_article
user_id: '209'
volume: 10
year: '2018'
...
---
_id: '13057'
author:
- first_name: Matthias
full_name: Kampmann, Matthias
id: '10935'
last_name: Kampmann
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: Kampmann M, Hellebrand S. Design For Small Delay Test - A Simulation Study.
Microelectronics Reliability. 2018;80:124-133.
apa: Kampmann, M., & Hellebrand, S. (2018). Design For Small Delay Test - A
Simulation Study. Microelectronics Reliability, 80, 124–133.
bibtex: '@article{Kampmann_Hellebrand_2018, title={Design For Small Delay Test -
A Simulation Study}, volume={80}, journal={Microelectronics Reliability}, author={Kampmann,
Matthias and Hellebrand, Sybille}, year={2018}, pages={124–133} }'
chicago: 'Kampmann, Matthias, and Sybille Hellebrand. “Design For Small Delay Test
- A Simulation Study.” Microelectronics Reliability 80 (2018): 124–33.'
ieee: M. Kampmann and S. Hellebrand, “Design For Small Delay Test - A Simulation
Study,” Microelectronics Reliability, vol. 80, pp. 124–133, 2018.
mla: Kampmann, Matthias, and Sybille Hellebrand. “Design For Small Delay Test -
A Simulation Study.” Microelectronics Reliability, vol. 80, 2018, pp. 124–33.
short: M. Kampmann, S. Hellebrand, Microelectronics Reliability 80 (2018) 124–133.
date_created: 2019-08-28T11:49:25Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
intvolume: ' 80'
language:
- iso: eng
page: 124-133
publication: Microelectronics Reliability
status: public
title: Design For Small Delay Test - A Simulation Study
type: journal_article
user_id: '659'
volume: 80
year: '2018'
...
---
_id: '4575'
author:
- first_name: Alexander
full_name: Sprenger, Alexander
id: '22707'
last_name: Sprenger
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: 'Sprenger A, Hellebrand S. Tuning Stochastic Space Compaction to Faster-than-at-Speed
Test. In: 2018 IEEE 21st International Symposium on Design and Diagnostics
of Electronic Circuits & Systems (DDECS). IEEE; 2018. doi:10.1109/ddecs.2018.00020'
apa: Sprenger, A., & Hellebrand, S. (2018). Tuning Stochastic Space Compaction
to Faster-than-at-Speed Test. 2018 IEEE 21st International Symposium on Design
and Diagnostics of Electronic Circuits & Systems (DDECS). https://doi.org/10.1109/ddecs.2018.00020
bibtex: '@inproceedings{Sprenger_Hellebrand_2018, place={Budapest, Hungary}, title={Tuning
Stochastic Space Compaction to Faster-than-at-Speed Test}, DOI={10.1109/ddecs.2018.00020},
booktitle={2018 IEEE 21st International Symposium on Design and Diagnostics of
Electronic Circuits & Systems (DDECS)}, publisher={IEEE}, author={Sprenger,
Alexander and Hellebrand, Sybille}, year={2018} }'
chicago: 'Sprenger, Alexander, and Sybille Hellebrand. “Tuning Stochastic Space
Compaction to Faster-than-at-Speed Test.” In 2018 IEEE 21st International Symposium
on Design and Diagnostics of Electronic Circuits & Systems (DDECS). Budapest,
Hungary: IEEE, 2018. https://doi.org/10.1109/ddecs.2018.00020.'
ieee: 'A. Sprenger and S. Hellebrand, “Tuning Stochastic Space Compaction to Faster-than-at-Speed
Test,” 2018, doi: 10.1109/ddecs.2018.00020.'
mla: Sprenger, Alexander, and Sybille Hellebrand. “Tuning Stochastic Space Compaction
to Faster-than-at-Speed Test.” 2018 IEEE 21st International Symposium on Design
and Diagnostics of Electronic Circuits & Systems (DDECS), IEEE, 2018,
doi:10.1109/ddecs.2018.00020.
short: 'A. Sprenger, S. Hellebrand, in: 2018 IEEE 21st International Symposium on
Design and Diagnostics of Electronic Circuits & Systems (DDECS), IEEE, Budapest,
Hungary, 2018.'
date_created: 2018-10-02T12:18:46Z
date_updated: 2022-05-11T17:10:37Z
department:
- _id: '48'
doi: 10.1109/ddecs.2018.00020
language:
- iso: eng
place: Budapest, Hungary
project:
- _id: '52'
name: Computing Resources Provided by the Paderborn Center for Parallel Computing
publication: 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic
Circuits & Systems (DDECS)
publication_identifier:
isbn:
- '9781538657546'
publication_status: published
publisher: IEEE
status: public
title: Tuning Stochastic Space Compaction to Faster-than-at-Speed Test
type: conference
user_id: '209'
year: '2018'
...
---
_id: '10575'
author:
- first_name: Chang
full_name: Liu, Chang
last_name: Liu
- first_name: Eric
full_name: Schneider, Eric
last_name: Schneider
- first_name: Matthias
full_name: Kampmann, Matthias
id: '10935'
last_name: Kampmann
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: 'Liu C, Schneider E, Kampmann M, Hellebrand S, Wunderlich H-J. Extending Aging
Monitors for Early Life and Wear-Out Failure Prevention. In: 27th IEEE Asian
Test Symposium (ATS’18). ; 2018. doi:10.1109/ats.2018.00028'
apa: Liu, C., Schneider, E., Kampmann, M., Hellebrand, S., & Wunderlich, H.-J.
(2018). Extending Aging Monitors for Early Life and Wear-Out Failure Prevention.
27th IEEE Asian Test Symposium (ATS’18). https://doi.org/10.1109/ats.2018.00028
bibtex: '@inproceedings{Liu_Schneider_Kampmann_Hellebrand_Wunderlich_2018, title={Extending
Aging Monitors for Early Life and Wear-Out Failure Prevention}, DOI={10.1109/ats.2018.00028},
booktitle={27th IEEE Asian Test Symposium (ATS’18)}, author={Liu, Chang and Schneider,
Eric and Kampmann, Matthias and Hellebrand, Sybille and Wunderlich, Hans-Joachim},
year={2018} }'
chicago: Liu, Chang, Eric Schneider, Matthias Kampmann, Sybille Hellebrand, and
Hans-Joachim Wunderlich. “Extending Aging Monitors for Early Life and Wear-Out
Failure Prevention.” In 27th IEEE Asian Test Symposium (ATS’18), 2018.
https://doi.org/10.1109/ats.2018.00028.
ieee: 'C. Liu, E. Schneider, M. Kampmann, S. Hellebrand, and H.-J. Wunderlich, “Extending
Aging Monitors for Early Life and Wear-Out Failure Prevention,” 2018, doi: 10.1109/ats.2018.00028.'
mla: Liu, Chang, et al. “Extending Aging Monitors for Early Life and Wear-Out Failure
Prevention.” 27th IEEE Asian Test Symposium (ATS’18), 2018, doi:10.1109/ats.2018.00028.
short: 'C. Liu, E. Schneider, M. Kampmann, S. Hellebrand, H.-J. Wunderlich, in:
27th IEEE Asian Test Symposium (ATS’18), 2018.'
date_created: 2019-07-05T08:14:58Z
date_updated: 2022-05-11T17:11:53Z
department:
- _id: '48'
doi: 10.1109/ats.2018.00028
language:
- iso: eng
publication: 27th IEEE Asian Test Symposium (ATS'18)
publication_identifier:
isbn:
- '9781538694664'
publication_status: published
status: public
title: Extending Aging Monitors for Early Life and Wear-Out Failure Prevention
type: conference
user_id: '209'
year: '2018'
...
---
_id: '12973'
author:
- first_name: Jyotirmoy
full_name: Deshmukh, Jyotirmoy
last_name: Deshmukh
- first_name: Wolfgang
full_name: Kunz, Wolfgang
last_name: Kunz
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: 'Deshmukh J, Kunz W, Wunderlich H-J, Hellebrand S. Special Session on Early
Life Failures. In: 35th IEEE VLSI Test Symposium (VTS’17). Caesars Palace,
Las Vegas, Nevada, USA: IEEE; 2017. doi:10.1109/vts.2017.7928933'
apa: 'Deshmukh, J., Kunz, W., Wunderlich, H.-J., & Hellebrand, S. (2017). Special
Session on Early Life Failures. In 35th IEEE VLSI Test Symposium (VTS’17).
Caesars Palace, Las Vegas, Nevada, USA: IEEE. https://doi.org/10.1109/vts.2017.7928933'
bibtex: '@inproceedings{Deshmukh_Kunz_Wunderlich_Hellebrand_2017, place={Caesars
Palace, Las Vegas, Nevada, USA}, title={Special Session on Early Life Failures},
DOI={10.1109/vts.2017.7928933},
booktitle={35th IEEE VLSI Test Symposium (VTS’17)}, publisher={IEEE}, author={Deshmukh,
Jyotirmoy and Kunz, Wolfgang and Wunderlich, Hans-Joachim and Hellebrand, Sybille},
year={2017} }'
chicago: 'Deshmukh, Jyotirmoy, Wolfgang Kunz, Hans-Joachim Wunderlich, and Sybille
Hellebrand. “Special Session on Early Life Failures.” In 35th IEEE VLSI Test
Symposium (VTS’17). Caesars Palace, Las Vegas, Nevada, USA: IEEE, 2017. https://doi.org/10.1109/vts.2017.7928933.'
ieee: J. Deshmukh, W. Kunz, H.-J. Wunderlich, and S. Hellebrand, “Special Session
on Early Life Failures,” in 35th IEEE VLSI Test Symposium (VTS’17), 2017.
mla: Deshmukh, Jyotirmoy, et al. “Special Session on Early Life Failures.” 35th
IEEE VLSI Test Symposium (VTS’17), IEEE, 2017, doi:10.1109/vts.2017.7928933.
short: 'J. Deshmukh, W. Kunz, H.-J. Wunderlich, S. Hellebrand, in: 35th IEEE VLSI
Test Symposium (VTS’17), IEEE, Caesars Palace, Las Vegas, Nevada, USA, 2017.'
date_created: 2019-08-28T08:37:58Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
doi: 10.1109/vts.2017.7928933
language:
- iso: eng
place: Caesars Palace, Las Vegas, Nevada, USA
publication: 35th IEEE VLSI Test Symposium (VTS'17)
publisher: IEEE
status: public
title: Special Session on Early Life Failures
type: conference
user_id: '209'
year: '2017'
...
---
_id: '13078'
author:
- first_name: Matthias
full_name: Kampmann, Matthias
id: '10935'
last_name: Kampmann
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: Kampmann M, Hellebrand S. X-Tolerante Prüfzellengruppierung Für Den Test
Mit Erhöhter Betriebsfrequenz.; 2017.
apa: Kampmann, M., & Hellebrand, S. (2017). X-tolerante Prüfzellengruppierung
für den Test mit erhöhter Betriebsfrequenz.
bibtex: '@book{Kampmann_Hellebrand_2017, place={29. Workshop “Testmethoden und Zuverlässigkeit
von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany}, title={X-tolerante Prüfzellengruppierung
für den Test mit erhöhter Betriebsfrequenz}, author={Kampmann, Matthias and Hellebrand,
Sybille}, year={2017} }'
chicago: Kampmann, Matthias, and Sybille Hellebrand. X-Tolerante Prüfzellengruppierung
Für Den Test Mit Erhöhter Betriebsfrequenz. 29. Workshop “Testmethoden und
Zuverlässigkeit von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany, 2017.
ieee: M. Kampmann and S. Hellebrand, X-tolerante Prüfzellengruppierung für den
Test mit erhöhter Betriebsfrequenz. 29. Workshop “Testmethoden und Zuverlässigkeit
von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany, 2017.
mla: Kampmann, Matthias, and Sybille Hellebrand. X-Tolerante Prüfzellengruppierung
Für Den Test Mit Erhöhter Betriebsfrequenz. 2017.
short: M. Kampmann, S. Hellebrand, X-Tolerante Prüfzellengruppierung Für Den Test
Mit Erhöhter Betriebsfrequenz, 29. Workshop “Testmethoden und Zuverlässigkeit
von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany, 2017.
date_created: 2019-08-28T12:06:26Z
date_updated: 2022-05-11T16:17:41Z
department:
- _id: '48'
keyword:
- WORKSHOP
language:
- iso: eng
place: 29. Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen"
(TuZ'17), Lübeck, Germany
status: public
title: X-tolerante Prüfzellengruppierung für den Test mit erhöhter Betriebsfrequenz
type: misc
user_id: '209'
year: '2017'
...
---
_id: '10576'
author:
- first_name: Matthias
full_name: Kampmann, Matthias
id: '10935'
last_name: Kampmann
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: 'Kampmann M, Hellebrand S. Design-for-FAST: Supporting X-tolerant compaction
during Faster-than-at-Speed Test. In: 20th IEEE International Symposium on
Design & Diagnostics of Electronic Circuits & Systems (DDECS’17).
IEEE; 2017. doi:10.1109/ddecs.2017.7934564'
apa: 'Kampmann, M., & Hellebrand, S. (2017). Design-for-FAST: Supporting X-tolerant
compaction during Faster-than-at-Speed Test. 20th IEEE International Symposium
on Design & Diagnostics of Electronic Circuits & Systems (DDECS’17).
https://doi.org/10.1109/ddecs.2017.7934564'
bibtex: '@inproceedings{Kampmann_Hellebrand_2017, title={Design-for-FAST: Supporting
X-tolerant compaction during Faster-than-at-Speed Test}, DOI={10.1109/ddecs.2017.7934564},
booktitle={20th IEEE International Symposium on Design & Diagnostics of Electronic
Circuits & Systems (DDECS’17)}, publisher={IEEE}, author={Kampmann, Matthias
and Hellebrand, Sybille}, year={2017} }'
chicago: 'Kampmann, Matthias, and Sybille Hellebrand. “Design-for-FAST: Supporting
X-Tolerant Compaction during Faster-than-at-Speed Test.” In 20th IEEE International
Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS’17).
IEEE, 2017. https://doi.org/10.1109/ddecs.2017.7934564.'
ieee: 'M. Kampmann and S. Hellebrand, “Design-for-FAST: Supporting X-tolerant compaction
during Faster-than-at-Speed Test,” 2017, doi: 10.1109/ddecs.2017.7934564.'
mla: 'Kampmann, Matthias, and Sybille Hellebrand. “Design-for-FAST: Supporting X-Tolerant
Compaction during Faster-than-at-Speed Test.” 20th IEEE International Symposium
on Design & Diagnostics of Electronic Circuits & Systems (DDECS’17),
IEEE, 2017, doi:10.1109/ddecs.2017.7934564.'
short: 'M. Kampmann, S. Hellebrand, in: 20th IEEE International Symposium on Design
& Diagnostics of Electronic Circuits & Systems (DDECS’17), IEEE, 2017.'
date_created: 2019-07-05T08:23:56Z
date_updated: 2022-05-11T17:14:51Z
department:
- _id: '48'
doi: 10.1109/ddecs.2017.7934564
language:
- iso: eng
publication: 20th IEEE International Symposium on Design & Diagnostics of Electronic
Circuits & Systems (DDECS'17)
publication_identifier:
isbn:
- '9781538604724'
publication_status: published
publisher: IEEE
status: public
title: 'Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed
Test'
type: conference
user_id: '209'
year: '2017'
...
---
_id: '12975'
author:
- first_name: Matthias
full_name: Kampmann, Matthias
id: '10935'
last_name: Kampmann
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: 'Kampmann M, Hellebrand S. X Marks the Spot: Scan-Flip-Flop Clustering for
Faster-than-at-Speed Test. In: 25th IEEE Asian Test Symposium (ATS’16).
Hiroshima, Japan: IEEE; 2016:1-6. doi:10.1109/ats.2016.20'
apa: 'Kampmann, M., & Hellebrand, S. (2016). X Marks the Spot: Scan-Flip-Flop
Clustering for Faster-than-at-Speed Test. In 25th IEEE Asian Test Symposium
(ATS’16) (pp. 1–6). Hiroshima, Japan: IEEE. https://doi.org/10.1109/ats.2016.20'
bibtex: '@inproceedings{Kampmann_Hellebrand_2016, place={Hiroshima, Japan}, title={X
Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test}, DOI={10.1109/ats.2016.20}, booktitle={25th
IEEE Asian Test Symposium (ATS’16)}, publisher={IEEE}, author={Kampmann, Matthias
and Hellebrand, Sybille}, year={2016}, pages={1–6} }'
chicago: 'Kampmann, Matthias, and Sybille Hellebrand. “X Marks the Spot: Scan-Flip-Flop
Clustering for Faster-than-at-Speed Test.” In 25th IEEE Asian Test Symposium
(ATS’16), 1–6. Hiroshima, Japan: IEEE, 2016. https://doi.org/10.1109/ats.2016.20.'
ieee: 'M. Kampmann and S. Hellebrand, “X Marks the Spot: Scan-Flip-Flop Clustering
for Faster-than-at-Speed Test,” in 25th IEEE Asian Test Symposium (ATS’16),
2016, pp. 1–6.'
mla: 'Kampmann, Matthias, and Sybille Hellebrand. “X Marks the Spot: Scan-Flip-Flop
Clustering for Faster-than-at-Speed Test.” 25th IEEE Asian Test Symposium (ATS’16),
IEEE, 2016, pp. 1–6, doi:10.1109/ats.2016.20.'
short: 'M. Kampmann, S. Hellebrand, in: 25th IEEE Asian Test Symposium (ATS’16),
IEEE, Hiroshima, Japan, 2016, pp. 1–6.'
date_created: 2019-08-28T08:53:04Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
doi: 10.1109/ats.2016.20
language:
- iso: eng
page: 1-6
place: Hiroshima, Japan
publication: 25th IEEE Asian Test Symposium (ATS'16)
publisher: IEEE
status: public
title: 'X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test'
type: conference
user_id: '209'
year: '2016'
...
---
_id: '12976'
author:
- first_name: Matthias
full_name: Kampmann, Matthias
id: '10935'
last_name: Kampmann
- first_name: Michael
full_name: A. Kochte, Michael
last_name: A. Kochte
- first_name: Eric
full_name: Schneider, Eric
last_name: Schneider
- first_name: Thomas
full_name: Indlekofer, Thomas
last_name: Indlekofer
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: 'Kampmann M, A. Kochte M, Schneider E, Indlekofer T, Hellebrand S, Wunderlich
H-J. Optimized Selection of Frequencies for Faster-Than-at-Speed Test. In: 24th
IEEE Asian Test Symposium (ATS’15). Mumbai, India: IEEE; 2015:109-114. doi:10.1109/ats.2015.26'
apa: 'Kampmann, M., A. Kochte, M., Schneider, E., Indlekofer, T., Hellebrand, S.,
& Wunderlich, H.-J. (2015). Optimized Selection of Frequencies for Faster-Than-at-Speed
Test. In 24th IEEE Asian Test Symposium (ATS’15) (pp. 109–114). Mumbai,
India: IEEE. https://doi.org/10.1109/ats.2015.26'
bibtex: '@inproceedings{Kampmann_A. Kochte_Schneider_Indlekofer_Hellebrand_Wunderlich_2015,
place={Mumbai, India}, title={Optimized Selection of Frequencies for Faster-Than-at-Speed
Test}, DOI={10.1109/ats.2015.26},
booktitle={24th IEEE Asian Test Symposium (ATS’15)}, publisher={IEEE}, author={Kampmann,
Matthias and A. Kochte, Michael and Schneider, Eric and Indlekofer, Thomas and
Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2015}, pages={109–114}
}'
chicago: 'Kampmann, Matthias, Michael A. Kochte, Eric Schneider, Thomas Indlekofer,
Sybille Hellebrand, and Hans-Joachim Wunderlich. “Optimized Selection of Frequencies
for Faster-Than-at-Speed Test.” In 24th IEEE Asian Test Symposium (ATS’15),
109–14. Mumbai, India: IEEE, 2015. https://doi.org/10.1109/ats.2015.26.'
ieee: M. Kampmann, M. A. Kochte, E. Schneider, T. Indlekofer, S. Hellebrand, and
H.-J. Wunderlich, “Optimized Selection of Frequencies for Faster-Than-at-Speed
Test,” in 24th IEEE Asian Test Symposium (ATS’15), 2015, pp. 109–114.
mla: Kampmann, Matthias, et al. “Optimized Selection of Frequencies for Faster-Than-at-Speed
Test.” 24th IEEE Asian Test Symposium (ATS’15), IEEE, 2015, pp. 109–14,
doi:10.1109/ats.2015.26.
short: 'M. Kampmann, M. A. Kochte, E. Schneider, T. Indlekofer, S. Hellebrand, H.-J.
Wunderlich, in: 24th IEEE Asian Test Symposium (ATS’15), IEEE, Mumbai, India,
2015, pp. 109–114.'
date_created: 2019-08-28T09:03:08Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
doi: 10.1109/ats.2015.26
language:
- iso: eng
page: 109-114
place: Mumbai, India
publication: 24th IEEE Asian Test Symposium (ATS'15)
publisher: IEEE
status: public
title: Optimized Selection of Frequencies for Faster-Than-at-Speed Test
type: conference
user_id: '209'
year: '2015'
...
---
_id: '13056'
author:
- first_name: Zhengfeng
full_name: Huang, Zhengfeng
last_name: Huang
- first_name: Huaguo
full_name: Liang, Huaguo
last_name: Liang
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: Huang Z, Liang H, Hellebrand S. A High Performance SEU Tolerant Latch. Journal
of Electronic Testing - Theory and Applications (JETTA). 2015;31(4):349-359.
apa: Huang, Z., Liang, H., & Hellebrand, S. (2015). A High Performance SEU Tolerant
Latch. Journal of Electronic Testing - Theory and Applications (JETTA),
31(4), 349–359.
bibtex: '@article{Huang_Liang_Hellebrand_2015, title={A High Performance SEU Tolerant
Latch}, volume={31}, number={4}, journal={Journal of Electronic Testing - Theory
and Applications (JETTA)}, publisher={Springer}, author={Huang, Zhengfeng and
Liang, Huaguo and Hellebrand, Sybille}, year={2015}, pages={349–359} }'
chicago: 'Huang, Zhengfeng, Huaguo Liang, and Sybille Hellebrand. “A High Performance
SEU Tolerant Latch.” Journal of Electronic Testing - Theory and Applications
(JETTA) 31, no. 4 (2015): 349–59.'
ieee: Z. Huang, H. Liang, and S. Hellebrand, “A High Performance SEU Tolerant Latch,”
Journal of Electronic Testing - Theory and Applications (JETTA), vol. 31,
no. 4, pp. 349–359, 2015.
mla: Huang, Zhengfeng, et al. “A High Performance SEU Tolerant Latch.” Journal
of Electronic Testing - Theory and Applications (JETTA), vol. 31, no. 4, Springer,
2015, pp. 349–59.
short: Z. Huang, H. Liang, S. Hellebrand, Journal of Electronic Testing - Theory
and Applications (JETTA) 31 (2015) 349–359.
date_created: 2019-08-28T11:48:55Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
intvolume: ' 31'
issue: '4'
language:
- iso: eng
page: 349-359
publication: Journal of Electronic Testing - Theory and Applications (JETTA)
publisher: Springer
status: public
title: A High Performance SEU Tolerant Latch
type: journal_article
user_id: '209'
volume: 31
year: '2015'
...
---
_id: '13077'
author:
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Thomas
full_name: Indlekofer, Thomas
last_name: Indlekofer
- first_name: Matthias
full_name: Kampmann, Matthias
id: '10935'
last_name: Kampmann
- first_name: Michael
full_name: Kochte, Michael
last_name: Kochte
- first_name: Chang
full_name: Liu, Chang
last_name: Liu
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: Hellebrand S, Indlekofer T, Kampmann M, Kochte M, Liu C, Wunderlich H-J. Effiziente
Auswahl von Testfrequenzen Für Den Test Kleiner Verzögerungsfehler. 27. Workshop
“Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad
Urach, Germany; 2015.
apa: Hellebrand, S., Indlekofer, T., Kampmann, M., Kochte, M., Liu, C., & Wunderlich,
H.-J. (2015). Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler.
27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15),
Bad Urach, Germany.
bibtex: '@book{Hellebrand_Indlekofer_Kampmann_Kochte_Liu_Wunderlich_2015, place={27.
Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15),
Bad Urach, Germany}, title={Effiziente Auswahl von Testfrequenzen für den Test
kleiner Verzögerungsfehler}, author={Hellebrand, Sybille and Indlekofer, Thomas
and Kampmann, Matthias and Kochte, Michael and Liu, Chang and Wunderlich, Hans-Joachim},
year={2015} }'
chicago: Hellebrand, Sybille, Thomas Indlekofer, Matthias Kampmann, Michael Kochte,
Chang Liu, and Hans-Joachim Wunderlich. Effiziente Auswahl von Testfrequenzen
Für Den Test Kleiner Verzögerungsfehler. 27. Workshop “Testmethoden und Zuverlässigkeit
von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany, 2015.
ieee: S. Hellebrand, T. Indlekofer, M. Kampmann, M. Kochte, C. Liu, and H.-J. Wunderlich,
Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler.
27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15),
Bad Urach, Germany, 2015.
mla: Hellebrand, Sybille, et al. Effiziente Auswahl von Testfrequenzen Für Den
Test Kleiner Verzögerungsfehler. 2015.
short: S. Hellebrand, T. Indlekofer, M. Kampmann, M. Kochte, C. Liu, H.-J. Wunderlich,
Effiziente Auswahl von Testfrequenzen Für Den Test Kleiner Verzögerungsfehler,
27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15),
Bad Urach, Germany, 2015.
date_created: 2019-08-28T12:05:44Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
keyword:
- Workshop
language:
- iso: eng
place: 27. Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen"
(TuZ'15), Bad Urach, Germany
status: public
title: Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler
type: misc
user_id: '659'
year: '2015'
...
---
_id: '12977'
author:
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Thomas
full_name: Indlekofer, Thomas
last_name: Indlekofer
- first_name: Matthias
full_name: Kampmann, Matthias
id: '10935'
last_name: Kampmann
- first_name: Michael
full_name: A. Kochte, Michael
last_name: A. Kochte
- first_name: Chang
full_name: Liu, Chang
last_name: Liu
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: 'Hellebrand S, Indlekofer T, Kampmann M, A. Kochte M, Liu C, Wunderlich H-J.
FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects. In: IEEE
International Test Conference (ITC’14). Seattle, Washington, USA: IEEE; 2014.
doi:10.1109/test.2014.7035360'
apa: 'Hellebrand, S., Indlekofer, T., Kampmann, M., A. Kochte, M., Liu, C., &
Wunderlich, H.-J. (2014). FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden
Delay Defects. In IEEE International Test Conference (ITC’14). Seattle,
Washington, USA: IEEE. https://doi.org/10.1109/test.2014.7035360'
bibtex: '@inproceedings{Hellebrand_Indlekofer_Kampmann_A. Kochte_Liu_Wunderlich_2014,
place={Seattle, Washington, USA}, title={FAST-BIST: Faster-than-at-Speed BIST
Targeting Hidden Delay Defects}, DOI={10.1109/test.2014.7035360},
booktitle={IEEE International Test Conference (ITC’14)}, publisher={IEEE}, author={Hellebrand,
Sybille and Indlekofer, Thomas and Kampmann, Matthias and A. Kochte, Michael and
Liu, Chang and Wunderlich, Hans-Joachim}, year={2014} }'
chicago: 'Hellebrand, Sybille, Thomas Indlekofer, Matthias Kampmann, Michael A.
Kochte, Chang Liu, and Hans-Joachim Wunderlich. “FAST-BIST: Faster-than-at-Speed
BIST Targeting Hidden Delay Defects.” In IEEE International Test Conference
(ITC’14). Seattle, Washington, USA: IEEE, 2014. https://doi.org/10.1109/test.2014.7035360.'
ieee: 'S. Hellebrand, T. Indlekofer, M. Kampmann, M. A. Kochte, C. Liu, and H.-J.
Wunderlich, “FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects,”
in IEEE International Test Conference (ITC’14), 2014.'
mla: 'Hellebrand, Sybille, et al. “FAST-BIST: Faster-than-at-Speed BIST Targeting
Hidden Delay Defects.” IEEE International Test Conference (ITC’14), IEEE,
2014, doi:10.1109/test.2014.7035360.'
short: 'S. Hellebrand, T. Indlekofer, M. Kampmann, M. A. Kochte, C. Liu, H.-J. Wunderlich,
in: IEEE International Test Conference (ITC’14), IEEE, Seattle, Washington, USA,
2014.'
date_created: 2019-08-28T09:04:45Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
doi: 10.1109/test.2014.7035360
language:
- iso: eng
place: Seattle, Washington, USA
publication: IEEE International Test Conference (ITC'14)
publisher: IEEE
status: public
title: 'FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects'
type: conference
user_id: '209'
year: '2014'
...
---
_id: '13054'
author:
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: Hellebrand S, Wunderlich H-J. SAT-Based ATPG beyond Stuck-at Fault Testing.
DeGruyter Journal on Information Technology (it). 2014;56(4):165-172.
apa: Hellebrand, S., & Wunderlich, H.-J. (2014). SAT-Based ATPG beyond Stuck-at
Fault Testing. DeGruyter Journal on Information Technology (It), 56(4),
165–172.
bibtex: '@article{Hellebrand_Wunderlich_2014, title={SAT-Based ATPG beyond Stuck-at
Fault Testing}, volume={56}, number={4}, journal={DeGruyter Journal on Information
Technology (it)}, publisher={DeGruyter}, author={Hellebrand, Sybille and Wunderlich,
Hans-Joachim}, year={2014}, pages={165–172} }'
chicago: 'Hellebrand, Sybille, and Hans-Joachim Wunderlich. “SAT-Based ATPG beyond
Stuck-at Fault Testing.” DeGruyter Journal on Information Technology (It)
56, no. 4 (2014): 165–72.'
ieee: S. Hellebrand and H.-J. Wunderlich, “SAT-Based ATPG beyond Stuck-at Fault
Testing,” DeGruyter Journal on Information Technology (it), vol. 56, no.
4, pp. 165–172, 2014.
mla: Hellebrand, Sybille, and Hans-Joachim Wunderlich. “SAT-Based ATPG beyond Stuck-at
Fault Testing.” DeGruyter Journal on Information Technology (It), vol.
56, no. 4, DeGruyter, 2014, pp. 165–72.
short: S. Hellebrand, H.-J. Wunderlich, DeGruyter Journal on Information Technology
(It) 56 (2014) 165–172.
date_created: 2019-08-28T11:48:13Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
intvolume: ' 56'
issue: '4'
language:
- iso: eng
page: 165-172
publication: DeGruyter Journal on Information Technology (it)
publisher: DeGruyter
status: public
title: SAT-Based ATPG beyond Stuck-at Fault Testing
type: journal_article
user_id: '209'
volume: 56
year: '2014'
...
---
_id: '13055'
author:
- first_name: Laura
full_name: Rodriguez Gomez, Laura
last_name: Rodriguez Gomez
- first_name: Alejandro
full_name: Cook, Alejandro
last_name: Cook
- first_name: Thomas
full_name: Indlekofer, Thomas
last_name: Indlekofer
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: Rodriguez Gomez L, Cook A, Indlekofer T, Hellebrand S, Wunderlich H-J. Adaptive
Bayesian Diagnosis of Intermittent Faults. Journal of Electronic Testing -
Theory and Applications (JETTA). 2014;30(5):527-540.
apa: Rodriguez Gomez, L., Cook, A., Indlekofer, T., Hellebrand, S., & Wunderlich,
H.-J. (2014). Adaptive Bayesian Diagnosis of Intermittent Faults. Journal of
Electronic Testing - Theory and Applications (JETTA), 30(5), 527–540.
bibtex: '@article{Rodriguez Gomez_Cook_Indlekofer_Hellebrand_Wunderlich_2014, title={Adaptive
Bayesian Diagnosis of Intermittent Faults}, volume={30}, number={5}, journal={Journal
of Electronic Testing - Theory and Applications (JETTA)}, publisher={Springer},
author={Rodriguez Gomez, Laura and Cook, Alejandro and Indlekofer, Thomas and
Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2014}, pages={527–540}
}'
chicago: 'Rodriguez Gomez, Laura, Alejandro Cook, Thomas Indlekofer, Sybille Hellebrand,
and Hans-Joachim Wunderlich. “Adaptive Bayesian Diagnosis of Intermittent Faults.”
Journal of Electronic Testing - Theory and Applications (JETTA) 30, no.
5 (2014): 527–40.'
ieee: L. Rodriguez Gomez, A. Cook, T. Indlekofer, S. Hellebrand, and H.-J. Wunderlich,
“Adaptive Bayesian Diagnosis of Intermittent Faults,” Journal of Electronic
Testing - Theory and Applications (JETTA), vol. 30, no. 5, pp. 527–540, 2014.
mla: Rodriguez Gomez, Laura, et al. “Adaptive Bayesian Diagnosis of Intermittent
Faults.” Journal of Electronic Testing - Theory and Applications (JETTA),
vol. 30, no. 5, Springer, 2014, pp. 527–40.
short: L. Rodriguez Gomez, A. Cook, T. Indlekofer, S. Hellebrand, H.-J. Wunderlich,
Journal of Electronic Testing - Theory and Applications (JETTA) 30 (2014) 527–540.
date_created: 2019-08-28T11:48:33Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
intvolume: ' 30'
issue: '5'
language:
- iso: eng
page: 527-540
publication: Journal of Electronic Testing - Theory and Applications (JETTA)
publisher: Springer
status: public
title: Adaptive Bayesian Diagnosis of Intermittent Faults
type: journal_article
user_id: '209'
volume: 30
year: '2014'
...
---
_id: '12979'
author:
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
citation:
ama: 'Hellebrand S. Analyzing and Quantifying Fault Tolerance Properties. In: 14th
IEEE Latin American Test Workshop - (LATW’13). Cordoba, Argentina: IEEE; 2013.
doi:10.1109/latw.2013.6562662'
apa: 'Hellebrand, S. (2013). Analyzing and Quantifying Fault Tolerance Properties.
In 14th IEEE Latin American Test Workshop - (LATW’13). Cordoba, Argentina:
IEEE. https://doi.org/10.1109/latw.2013.6562662'
bibtex: '@inproceedings{Hellebrand_2013, place={Cordoba, Argentina}, title={Analyzing
and Quantifying Fault Tolerance Properties}, DOI={10.1109/latw.2013.6562662},
booktitle={14th IEEE Latin American Test Workshop - (LATW’13)}, publisher={IEEE},
author={Hellebrand, Sybille}, year={2013} }'
chicago: 'Hellebrand, Sybille. “Analyzing and Quantifying Fault Tolerance Properties.”
In 14th IEEE Latin American Test Workshop - (LATW’13). Cordoba, Argentina:
IEEE, 2013. https://doi.org/10.1109/latw.2013.6562662.'
ieee: S. Hellebrand, “Analyzing and Quantifying Fault Tolerance Properties,” in
14th IEEE Latin American Test Workshop - (LATW’13), 2013.
mla: Hellebrand, Sybille. “Analyzing and Quantifying Fault Tolerance Properties.”
14th IEEE Latin American Test Workshop - (LATW’13), IEEE, 2013, doi:10.1109/latw.2013.6562662.
short: 'S. Hellebrand, in: 14th IEEE Latin American Test Workshop - (LATW’13), IEEE,
Cordoba, Argentina, 2013.'
date_created: 2019-08-28T09:16:51Z
date_updated: 2022-01-06T06:51:27Z
department:
- _id: '48'
doi: 10.1109/latw.2013.6562662
language:
- iso: eng
place: Cordoba, Argentina
publication: 14th IEEE Latin American Test Workshop - (LATW'13)
publisher: IEEE
status: public
title: Analyzing and Quantifying Fault Tolerance Properties
type: conference
user_id: '209'
year: '2013'
...
---
_id: '13075'
author:
- first_name: Alejandro
full_name: Cook, Alejandro
last_name: Cook
- first_name: Laura
full_name: Rodriguez Gomez, Laura
last_name: Rodriguez Gomez
- first_name: Sybille
full_name: Hellebrand, Sybille
id: '209'
last_name: Hellebrand
orcid: 0000-0002-3717-3939
- first_name: Thomas
full_name: Indlekofer, Thomas
last_name: Indlekofer
- first_name: Hans-Joachim
full_name: Wunderlich, Hans-Joachim
last_name: Wunderlich
citation:
ama: Cook A, Rodriguez Gomez L, Hellebrand S, Indlekofer T, Wunderlich H-J. Adaptive
Test and Diagnosis of Intermittent Faults. 14th Latin American Test Workshop,
Cordoba, Argentina; 2013.
apa: Cook, A., Rodriguez Gomez, L., Hellebrand, S., Indlekofer, T., & Wunderlich,
H.-J. (2013). Adaptive Test and Diagnosis of Intermittent Faults. 14th
Latin American Test Workshop, Cordoba, Argentina.
bibtex: '@book{Cook_Rodriguez Gomez_Hellebrand_Indlekofer_Wunderlich_2013, place={14th
Latin American Test Workshop, Cordoba, Argentina}, title={Adaptive Test and Diagnosis
of Intermittent Faults}, author={Cook, Alejandro and Rodriguez Gomez, Laura and
Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}, year={2013}
}'
chicago: Cook, Alejandro, Laura Rodriguez Gomez, Sybille Hellebrand, Thomas Indlekofer,
and Hans-Joachim Wunderlich. Adaptive Test and Diagnosis of Intermittent Faults.
14th Latin American Test Workshop, Cordoba, Argentina, 2013.
ieee: A. Cook, L. Rodriguez Gomez, S. Hellebrand, T. Indlekofer, and H.-J. Wunderlich,
Adaptive Test and Diagnosis of Intermittent Faults. 14th Latin American
Test Workshop, Cordoba, Argentina, 2013.
mla: Cook, Alejandro, et al. Adaptive Test and Diagnosis of Intermittent Faults.
2013.
short: A. Cook, L. Rodriguez Gomez, S. Hellebrand, T. Indlekofer, H.-J. Wunderlich,
Adaptive Test and Diagnosis of Intermittent Faults, 14th Latin American Test Workshop,
Cordoba, Argentina, 2013.
date_created: 2019-08-28T12:04:38Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
keyword:
- WORKSHOP
language:
- iso: eng
place: 14th Latin American Test Workshop, Cordoba, Argentina
status: public
title: Adaptive Test and Diagnosis of Intermittent Faults
type: misc
user_id: '659'
year: '2013'
...