--- _id: '12980' author: - first_name: Alejandro full_name: Cook, Alejandro last_name: Cook - first_name: Sybille full_name: Hellebrand, Sybille id: '209' last_name: Hellebrand orcid: 0000-0002-3717-3939 - first_name: Michael full_name: E. Imhof, Michael last_name: E. Imhof - first_name: Abdullah full_name: Mumtaz, Abdullah last_name: Mumtaz - first_name: Hans-Joachim full_name: Wunderlich, Hans-Joachim last_name: Wunderlich citation: ama: 'Cook A, Hellebrand S, E. Imhof M, Mumtaz A, Wunderlich H-J. Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test. In: 13th IEEE Latin American Test Workshop (LATW’12). Quito, Ecuador: IEEE; 2012:1-4. doi:10.1109/latw.2012.6261229' apa: 'Cook, A., Hellebrand, S., E. Imhof, M., Mumtaz, A., & Wunderlich, H.-J. (2012). Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test. In 13th IEEE Latin American Test Workshop (LATW’12) (pp. 1–4). Quito, Ecuador: IEEE. https://doi.org/10.1109/latw.2012.6261229' bibtex: '@inproceedings{Cook_Hellebrand_E. Imhof_Mumtaz_Wunderlich_2012, place={Quito, Ecuador}, title={Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test}, DOI={10.1109/latw.2012.6261229}, booktitle={13th IEEE Latin American Test Workshop (LATW’12)}, publisher={IEEE}, author={Cook, Alejandro and Hellebrand, Sybille and E. Imhof, Michael and Mumtaz, Abdullah and Wunderlich, Hans-Joachim}, year={2012}, pages={1–4} }' chicago: 'Cook, Alejandro, Sybille Hellebrand, Michael E. Imhof, Abdullah Mumtaz, and Hans-Joachim Wunderlich. “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test.” In 13th IEEE Latin American Test Workshop (LATW’12), 1–4. Quito, Ecuador: IEEE, 2012. https://doi.org/10.1109/latw.2012.6261229.' ieee: A. Cook, S. Hellebrand, M. E. Imhof, A. Mumtaz, and H.-J. Wunderlich, “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test,” in 13th IEEE Latin American Test Workshop (LATW’12), 2012, pp. 1–4. mla: Cook, Alejandro, et al. “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test.” 13th IEEE Latin American Test Workshop (LATW’12), IEEE, 2012, pp. 1–4, doi:10.1109/latw.2012.6261229. short: 'A. Cook, S. Hellebrand, M. E. Imhof, A. Mumtaz, H.-J. Wunderlich, in: 13th IEEE Latin American Test Workshop (LATW’12), IEEE, Quito, Ecuador, 2012, pp. 1–4.' date_created: 2019-08-28T09:16:53Z date_updated: 2022-01-06T06:51:27Z department: - _id: '48' doi: 10.1109/latw.2012.6261229 language: - iso: eng page: 1-4 place: Quito, Ecuador publication: 13th IEEE Latin American Test Workshop (LATW'12) publisher: IEEE status: public title: Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test type: conference user_id: '209' year: '2012' ... --- _id: '12981' author: - first_name: Alejandro full_name: Cook, Alejandro last_name: Cook - first_name: Sybille full_name: Hellebrand, Sybille id: '209' last_name: Hellebrand orcid: 0000-0002-3717-3939 - first_name: Hans-Joachim full_name: Wunderlich, Hans-Joachim last_name: Wunderlich citation: ama: 'Cook A, Hellebrand S, Wunderlich H-J. Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test. In: 17th IEEE European Test Symposium (ETS’12). Annecy, France: IEEE; 2012:1-6. doi:10.1109/ets.2012.6233025' apa: 'Cook, A., Hellebrand, S., & Wunderlich, H.-J. (2012). Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test. In 17th IEEE European Test Symposium (ETS’12) (pp. 1–6). Annecy, France: IEEE. https://doi.org/10.1109/ets.2012.6233025' bibtex: '@inproceedings{Cook_Hellebrand_Wunderlich_2012, place={Annecy, France}, title={Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test}, DOI={10.1109/ets.2012.6233025}, booktitle={17th IEEE European Test Symposium (ETS’12)}, publisher={IEEE}, author={Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2012}, pages={1–6} }' chicago: 'Cook, Alejandro, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test.” In 17th IEEE European Test Symposium (ETS’12), 1–6. Annecy, France: IEEE, 2012. https://doi.org/10.1109/ets.2012.6233025.' ieee: A. Cook, S. Hellebrand, and H.-J. Wunderlich, “Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test,” in 17th IEEE European Test Symposium (ETS’12), 2012, pp. 1–6. mla: Cook, Alejandro, et al. “Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test.” 17th IEEE European Test Symposium (ETS’12), IEEE, 2012, pp. 1–6, doi:10.1109/ets.2012.6233025. short: 'A. Cook, S. Hellebrand, H.-J. Wunderlich, in: 17th IEEE European Test Symposium (ETS’12), IEEE, Annecy, France, 2012, pp. 1–6.' date_created: 2019-08-28T09:19:20Z date_updated: 2022-01-06T06:51:27Z department: - _id: '48' doi: 10.1109/ets.2012.6233025 language: - iso: eng page: 1-6 place: Annecy, France publication: 17th IEEE European Test Symposium (ETS'12) publisher: IEEE status: public title: Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test type: conference user_id: '209' year: '2012' ... --- _id: '13074' author: - first_name: Alejandro full_name: Cook, Alejandro last_name: Cook - first_name: Sybille full_name: Hellebrand, Sybille id: '209' last_name: Hellebrand orcid: 0000-0002-3717-3939 - first_name: Hans-Joachim full_name: Wunderlich, Hans-Joachim last_name: Wunderlich citation: ama: Cook A, Hellebrand S, Wunderlich H-J. Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern. 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany; 2012. apa: Cook, A., Hellebrand, S., & Wunderlich, H.-J. (2012). Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern. 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany. bibtex: '@book{Cook_Hellebrand_Wunderlich_2012, place={24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany}, title={Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern}, author={Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2012} }' chicago: Cook, Alejandro, Sybille Hellebrand, and Hans-Joachim Wunderlich. Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern. 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany, 2012. ieee: A. Cook, S. Hellebrand, and H.-J. Wunderlich, Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern. 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany, 2012. mla: Cook, Alejandro, et al. Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern. 2012. short: A. Cook, S. Hellebrand, H.-J. Wunderlich, Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern, 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany, 2012. date_created: 2019-08-28T12:02:54Z date_updated: 2022-01-06T06:51:28Z department: - _id: '48' keyword: - WORKSHOP language: - iso: eng place: 24. Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen" (TuZ'12), Cottbus, Germany status: public title: Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern type: misc user_id: '659' year: '2012' ... --- _id: '12982' author: - first_name: Alejandro full_name: Cook, Alejandro last_name: Cook - first_name: Sybille full_name: Hellebrand, Sybille id: '209' last_name: Hellebrand orcid: 0000-0002-3717-3939 - first_name: Thomas full_name: Indlekofer, Thomas last_name: Indlekofer - first_name: Hans-Joachim full_name: Wunderlich, Hans-Joachim last_name: Wunderlich citation: ama: 'Cook A, Hellebrand S, Indlekofer T, Wunderlich H-J. Diagnostic Test of Robust Circuits. In: 20th IEEE Asian Test Symposium (ATS’11). New Delhi, India: IEEE; 2011:285-290. doi:10.1109/ats.2011.55' apa: 'Cook, A., Hellebrand, S., Indlekofer, T., & Wunderlich, H.-J. (2011). Diagnostic Test of Robust Circuits. In 20th IEEE Asian Test Symposium (ATS’11) (pp. 285–290). New Delhi, India: IEEE. https://doi.org/10.1109/ats.2011.55' bibtex: '@inproceedings{Cook_Hellebrand_Indlekofer_Wunderlich_2011, place={New Delhi, India}, title={Diagnostic Test of Robust Circuits}, DOI={10.1109/ats.2011.55}, booktitle={20th IEEE Asian Test Symposium (ATS’11)}, publisher={IEEE}, author={Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}, year={2011}, pages={285–290} }' chicago: 'Cook, Alejandro, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. “Diagnostic Test of Robust Circuits.” In 20th IEEE Asian Test Symposium (ATS’11), 285–90. New Delhi, India: IEEE, 2011. https://doi.org/10.1109/ats.2011.55.' ieee: A. Cook, S. Hellebrand, T. Indlekofer, and H.-J. Wunderlich, “Diagnostic Test of Robust Circuits,” in 20th IEEE Asian Test Symposium (ATS’11), 2011, pp. 285–290. mla: Cook, Alejandro, et al. “Diagnostic Test of Robust Circuits.” 20th IEEE Asian Test Symposium (ATS’11), IEEE, 2011, pp. 285–90, doi:10.1109/ats.2011.55. short: 'A. Cook, S. Hellebrand, T. Indlekofer, H.-J. Wunderlich, in: 20th IEEE Asian Test Symposium (ATS’11), IEEE, New Delhi, India, 2011, pp. 285–290.' date_created: 2019-08-28T09:19:22Z date_updated: 2022-01-06T06:51:27Z department: - _id: '48' doi: 10.1109/ats.2011.55 language: - iso: eng page: 285-290 place: New Delhi, India publication: 20th IEEE Asian Test Symposium (ATS'11) publisher: IEEE status: public title: Diagnostic Test of Robust Circuits type: conference user_id: '209' year: '2011' ... --- _id: '12984' alternative_title: - Embedded Tutorial author: - first_name: Ilia full_name: Polian, Ilia last_name: Polian - first_name: Bernd full_name: Becker, Bernd last_name: Becker - first_name: Sybille full_name: Hellebrand, Sybille id: '209' last_name: Hellebrand orcid: 0000-0002-3717-3939 - first_name: Hans-Joachim full_name: Wunderlich, Hans-Joachim last_name: Wunderlich - first_name: Peter full_name: Maxwell, Peter last_name: Maxwell citation: ama: 'Polian I, Becker B, Hellebrand S, Wunderlich H-J, Maxwell P. Towards Variation-Aware Test Methods. In: 16th IEEE European Test Symposium Trondheim (ETS’11). Trondheim, Norway: IEEE; 2011. doi:10.1109/ets.2011.51' apa: 'Polian, I., Becker, B., Hellebrand, S., Wunderlich, H.-J., & Maxwell, P. (2011). Towards Variation-Aware Test Methods. In 16th IEEE European Test Symposium Trondheim (ETS’11). Trondheim, Norway: IEEE. https://doi.org/10.1109/ets.2011.51' bibtex: '@inproceedings{Polian_Becker_Hellebrand_Wunderlich_Maxwell_2011, place={Trondheim, Norway}, title={Towards Variation-Aware Test Methods}, DOI={10.1109/ets.2011.51}, booktitle={16th IEEE European Test Symposium Trondheim (ETS’11)}, publisher={IEEE}, author={Polian, Ilia and Becker, Bernd and Hellebrand, Sybille and Wunderlich, Hans-Joachim and Maxwell, Peter}, year={2011} }' chicago: 'Polian, Ilia, Bernd Becker, Sybille Hellebrand, Hans-Joachim Wunderlich, and Peter Maxwell. “Towards Variation-Aware Test Methods.” In 16th IEEE European Test Symposium Trondheim (ETS’11). Trondheim, Norway: IEEE, 2011. https://doi.org/10.1109/ets.2011.51.' ieee: I. Polian, B. Becker, S. Hellebrand, H.-J. Wunderlich, and P. Maxwell, “Towards Variation-Aware Test Methods,” in 16th IEEE European Test Symposium Trondheim (ETS’11), 2011. mla: Polian, Ilia, et al. “Towards Variation-Aware Test Methods.” 16th IEEE European Test Symposium Trondheim (ETS’11), IEEE, 2011, doi:10.1109/ets.2011.51. short: 'I. Polian, B. Becker, S. Hellebrand, H.-J. Wunderlich, P. Maxwell, in: 16th IEEE European Test Symposium Trondheim (ETS’11), IEEE, Trondheim, Norway, 2011.' date_created: 2019-08-28T09:20:52Z date_updated: 2022-01-06T06:51:27Z department: - _id: '48' doi: 10.1109/ets.2011.51 language: - iso: eng place: Trondheim, Norway publication: 16th IEEE European Test Symposium Trondheim (ETS'11) publisher: IEEE status: public title: Towards Variation-Aware Test Methods type: conference user_id: '209' year: '2011' ... --- _id: '13053' author: - first_name: Alejandro full_name: Cook, Alejandro last_name: Cook - first_name: Sybille full_name: Hellebrand, Sybille id: '209' last_name: Hellebrand orcid: 0000-0002-3717-3939 - first_name: Thomas full_name: Indlekofer, Thomas last_name: Indlekofer - first_name: Hans-Joachim full_name: Wunderlich, Hans-Joachim last_name: Wunderlich citation: ama: 'Cook A, Hellebrand S, Indlekofer T, Wunderlich H-J. Robuster Selbsttest mit Diagnose. In: 5. GMM/GI/ITG Fachtagung “Zuverlässigkeit Und Entwurf.” Hamburg, Germany; 2011:48-53.' apa: Cook, A., Hellebrand, S., Indlekofer, T., & Wunderlich, H.-J. (2011). Robuster Selbsttest mit Diagnose. In 5. GMM/GI/ITG Fachtagung “Zuverlässigkeit und Entwurf” (pp. 48–53). Hamburg, Germany. bibtex: '@inproceedings{Cook_Hellebrand_Indlekofer_Wunderlich_2011, place={Hamburg, Germany}, title={Robuster Selbsttest mit Diagnose}, booktitle={5. GMM/GI/ITG Fachtagung “Zuverlässigkeit und Entwurf”}, author={Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}, year={2011}, pages={48–53} }' chicago: Cook, Alejandro, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. “Robuster Selbsttest Mit Diagnose.” In 5. GMM/GI/ITG Fachtagung “Zuverlässigkeit Und Entwurf,” 48–53. Hamburg, Germany, 2011. ieee: A. Cook, S. Hellebrand, T. Indlekofer, and H.-J. Wunderlich, “Robuster Selbsttest mit Diagnose,” in 5. GMM/GI/ITG Fachtagung “Zuverlässigkeit und Entwurf,” 2011, pp. 48–53. mla: Cook, Alejandro, et al. “Robuster Selbsttest Mit Diagnose.” 5. GMM/GI/ITG Fachtagung “Zuverlässigkeit Und Entwurf,” 2011, pp. 48–53. short: 'A. Cook, S. Hellebrand, T. Indlekofer, H.-J. Wunderlich, in: 5. GMM/GI/ITG Fachtagung “Zuverlässigkeit Und Entwurf,” Hamburg, Germany, 2011, pp. 48–53.' date_created: 2019-08-28T11:47:35Z date_updated: 2022-01-06T06:51:27Z department: - _id: '48' language: - iso: eng page: 48-53 place: Hamburg, Germany publication: 5. GMM/GI/ITG Fachtagung "Zuverlässigkeit und Entwurf" status: public title: Robuster Selbsttest mit Diagnose type: conference user_id: '209' year: '2011' ... --- _id: '13052' author: - first_name: Fabian full_name: Hopsch, Fabian last_name: Hopsch - first_name: Bernd full_name: Becker, Bernd last_name: Becker - first_name: Sybille full_name: Hellebrand, Sybille id: '209' last_name: Hellebrand orcid: 0000-0002-3717-3939 - first_name: Ilia full_name: Polian, Ilia last_name: Polian - first_name: Bernd full_name: Straube, Bernd last_name: Straube - first_name: Wolfgang full_name: Vermeiren, Wolfgang last_name: Vermeiren - first_name: Hans-Joachim full_name: Wunderlich, Hans-Joachim last_name: Wunderlich citation: ama: Hopsch F, Becker B, Hellebrand S, et al. Variation-Aware Fault Modeling. SCIENCE CHINA Information Sciences, Science China Press, co-published with Springer. 2011;54(4):1813-1826. apa: Hopsch, F., Becker, B., Hellebrand, S., Polian, I., Straube, B., Vermeiren, W., & Wunderlich, H.-J. (2011). Variation-Aware Fault Modeling. SCIENCE CHINA Information Sciences, Science China Press, Co-Published with Springer, 54(4), 1813–1826. bibtex: '@article{Hopsch_Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2011, title={Variation-Aware Fault Modeling}, volume={54}, number={4}, journal={SCIENCE CHINA Information Sciences, Science China Press, co-published with Springer}, author={Hopsch, Fabian and Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2011}, pages={1813–1826} }' chicago: 'Hopsch, Fabian, Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Variation-Aware Fault Modeling.” SCIENCE CHINA Information Sciences, Science China Press, Co-Published with Springer 54, no. 4 (2011): 1813–26.' ieee: F. Hopsch et al., “Variation-Aware Fault Modeling,” SCIENCE CHINA Information Sciences, Science China Press, co-published with Springer, vol. 54, no. 4, pp. 1813–1826, 2011. mla: Hopsch, Fabian, et al. “Variation-Aware Fault Modeling.” SCIENCE CHINA Information Sciences, Science China Press, Co-Published with Springer, vol. 54, no. 4, 2011, pp. 1813–26. short: F. Hopsch, B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H.-J. Wunderlich, SCIENCE CHINA Information Sciences, Science China Press, Co-Published with Springer 54 (2011) 1813–1826. date_created: 2019-08-28T11:47:14Z date_updated: 2022-05-11T16:19:14Z department: - _id: '48' intvolume: ' 54' issue: '4' language: - iso: eng page: 1813-1826 publication: SCIENCE CHINA Information Sciences, Science China Press, co-published with Springer status: public title: Variation-Aware Fault Modeling type: journal_article user_id: '209' volume: 54 year: '2011' ... --- _id: '10670' author: - first_name: Viktor full_name: Fröse, Viktor last_name: Fröse - first_name: Rüdiger full_name: Ibers, Rüdiger id: '659' last_name: Ibers - first_name: Sybille full_name: Hellebrand, Sybille id: '209' last_name: Hellebrand orcid: 0000-0002-3717-3939 citation: ama: Fröse V, Ibers R, Hellebrand S. Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany; 2010. apa: Fröse, V., Ibers, R., & Hellebrand, S. (2010). Testdatenkompression mit Hilfe der Netzwerkinfrastruktur. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany. bibtex: '@book{Fröse_Ibers_Hellebrand_2010, place={22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany}, title={Testdatenkompression mit Hilfe der Netzwerkinfrastruktur}, author={Fröse, Viktor and Ibers, Rüdiger and Hellebrand, Sybille}, year={2010} }' chicago: Fröse, Viktor, Rüdiger Ibers, and Sybille Hellebrand. Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, 2010. ieee: V. Fröse, R. Ibers, and S. Hellebrand, Testdatenkompression mit Hilfe der Netzwerkinfrastruktur. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, 2010. mla: Fröse, Viktor, et al. Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur. 2010. short: V. Fröse, R. Ibers, S. Hellebrand, Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur, 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, 2010. date_created: 2019-07-10T11:17:36Z date_updated: 2022-01-06T06:50:49Z department: - _id: '48' keyword: - WORKSHOP language: - iso: eng place: 22. Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen" (TuZ'10), Paderborn, Germany status: public title: Testdatenkompression mit Hilfe der Netzwerkinfrastruktur type: misc user_id: '659' year: '2010' ... --- _id: '12987' author: - first_name: Bernd full_name: Becker, Bernd last_name: Becker - first_name: Sybille full_name: Hellebrand, Sybille id: '209' last_name: Hellebrand orcid: 0000-0002-3717-3939 - first_name: Ilia full_name: Polian, Ilia last_name: Polian - first_name: Bernd full_name: Straube, Bernd last_name: Straube - first_name: Wolfgang full_name: Vermeiren, Wolfgang last_name: Vermeiren - first_name: Hans-Joachim full_name: Wunderlich, Hans-Joachim last_name: Wunderlich citation: ama: 'Becker B, Hellebrand S, Polian I, Straube B, Vermeiren W, Wunderlich H-J. Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits. In: 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10). Chicago, IL, USA: IEEE; 2010. doi:10.1109/dsnw.2010.5542612' apa: 'Becker, B., Hellebrand, S., Polian, I., Straube, B., Vermeiren, W., & Wunderlich, H.-J. (2010). Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits. In 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10). Chicago, IL, USA: IEEE. https://doi.org/10.1109/dsnw.2010.5542612' bibtex: '@inproceedings{Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place={Chicago, IL, USA}, title={Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits}, DOI={10.1109/dsnw.2010.5542612}, booktitle={40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10)}, publisher={IEEE}, author={Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2010} }' chicago: 'Becker, Bernd, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” In 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10). Chicago, IL, USA: IEEE, 2010. https://doi.org/10.1109/dsnw.2010.5542612.' ieee: B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, and H.-J. Wunderlich, “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits,” in 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10), 2010. mla: Becker, Bernd, et al. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10), IEEE, 2010, doi:10.1109/dsnw.2010.5542612. short: 'B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H.-J. Wunderlich, in: 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10), IEEE, Chicago, IL, USA, 2010.' date_created: 2019-08-28T09:22:53Z date_updated: 2022-01-06T06:51:27Z department: - _id: '48' doi: 10.1109/dsnw.2010.5542612 language: - iso: eng place: Chicago, IL, USA publication: 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W'10) publisher: IEEE status: public title: Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits type: conference user_id: '209' year: '2010' ... --- _id: '13051' author: - first_name: Marc full_name: Hunger, Marc last_name: Hunger - first_name: Sybille full_name: Hellebrand, Sybille id: '209' last_name: Hellebrand orcid: 0000-0002-3717-3939 citation: ama: 'Hunger M, Hellebrand S. Ausbeute und Fehlertoleranz bei dreifach modularer Redundanz. In: 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” Wildbad Kreuth, Germany; 2010:81-88.' apa: Hunger, M., & Hellebrand, S. (2010). Ausbeute und Fehlertoleranz bei dreifach modularer Redundanz. In 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf” (pp. 81–88). Wildbad Kreuth, Germany. bibtex: '@inproceedings{Hunger_Hellebrand_2010, place={Wildbad Kreuth, Germany}, title={Ausbeute und Fehlertoleranz bei dreifach modularer Redundanz}, booktitle={4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, author={Hunger, Marc and Hellebrand, Sybille}, year={2010}, pages={81–88} }' chicago: Hunger, Marc, and Sybille Hellebrand. “Ausbeute Und Fehlertoleranz Bei Dreifach Modularer Redundanz.” In 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 81–88. Wildbad Kreuth, Germany, 2010. ieee: M. Hunger and S. Hellebrand, “Ausbeute und Fehlertoleranz bei dreifach modularer Redundanz,” in 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf,” 2010, pp. 81–88. mla: Hunger, Marc, and Sybille Hellebrand. “Ausbeute Und Fehlertoleranz Bei Dreifach Modularer Redundanz.” 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 2010, pp. 81–88. short: 'M. Hunger, S. Hellebrand, in: 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” Wildbad Kreuth, Germany, 2010, pp. 81–88.' date_created: 2019-08-28T11:46:41Z date_updated: 2022-01-06T06:51:27Z department: - _id: '48' language: - iso: eng page: 81-88 place: Wildbad Kreuth, Germany publication: 4. GMM/GI/ITG-Fachtagung "Zuverlässigkeit und Entwurf" status: public title: Ausbeute und Fehlertoleranz bei dreifach modularer Redundanz type: conference user_id: '659' year: '2010' ... --- _id: '13073' author: - first_name: Sybille full_name: Hellebrand, Sybille id: '209' last_name: Hellebrand orcid: 0000-0002-3717-3939 citation: ama: Hellebrand S. Nano-Electronic Systems. Editorial, it 4/2010, pp. 179-180; 2010. apa: Hellebrand, S. (2010). Nano-Electronic Systems. Editorial, it 4/2010, pp. 179-180. bibtex: '@book{Hellebrand_2010, place={Editorial, it 4/2010, pp. 179-180}, title={Nano-Electronic Systems}, author={Hellebrand, Sybille}, year={2010} }' chicago: Hellebrand, Sybille. Nano-Electronic Systems. Editorial, it 4/2010, pp. 179-180, 2010. ieee: S. Hellebrand, Nano-Electronic Systems. Editorial, it 4/2010, pp. 179-180, 2010. mla: Hellebrand, Sybille. Nano-Electronic Systems. 2010. short: S. Hellebrand, Nano-Electronic Systems, Editorial, it 4/2010, pp. 179-180, 2010. date_created: 2019-08-28T12:01:06Z date_updated: 2022-01-06T06:51:28Z department: - _id: '48' language: - iso: eng place: Editorial, it 4/2010, pp. 179-180 status: public title: Nano-Electronic Systems type: misc user_id: '659' year: '2010' ... --- _id: '12983' author: - first_name: Fabian full_name: Hopsch, Fabian last_name: Hopsch - first_name: Bernd full_name: Becker, Bernd last_name: Becker - first_name: Sybille full_name: Hellebrand, Sybille id: '209' last_name: Hellebrand orcid: 0000-0002-3717-3939 - first_name: Ilia full_name: Polian, Ilia last_name: Polian - first_name: Bernd full_name: Straube, Bernd last_name: Straube - first_name: Wolfgang full_name: Vermeiren, Wolfgang last_name: Vermeiren - first_name: Hans-Joachim full_name: Wunderlich, Hans-Joachim last_name: Wunderlich citation: ama: 'Hopsch F, Becker B, Hellebrand S, et al. Variation-Aware Fault Modeling. In: 19th IEEE Asian Test Symposium (ATS’10). IEEE; 2010:87-93. doi:10.1109/ats.2010.24' apa: Hopsch, F., Becker, B., Hellebrand, S., Polian, I., Straube, B., Vermeiren, W., & Wunderlich, H.-J. (2010). Variation-Aware Fault Modeling. 19th IEEE Asian Test Symposium (ATS’10), 87–93. https://doi.org/10.1109/ats.2010.24 bibtex: '@inproceedings{Hopsch_Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place={Shanghai, China}, title={Variation-Aware Fault Modeling}, DOI={10.1109/ats.2010.24}, booktitle={19th IEEE Asian Test Symposium (ATS’10)}, publisher={IEEE}, author={Hopsch, Fabian and Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2010}, pages={87–93} }' chicago: 'Hopsch, Fabian, Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Variation-Aware Fault Modeling.” In 19th IEEE Asian Test Symposium (ATS’10), 87–93. Shanghai, China: IEEE, 2010. https://doi.org/10.1109/ats.2010.24.' ieee: 'F. Hopsch et al., “Variation-Aware Fault Modeling,” in 19th IEEE Asian Test Symposium (ATS’10), 2010, pp. 87–93, doi: 10.1109/ats.2010.24.' mla: Hopsch, Fabian, et al. “Variation-Aware Fault Modeling.” 19th IEEE Asian Test Symposium (ATS’10), IEEE, 2010, pp. 87–93, doi:10.1109/ats.2010.24. short: 'F. Hopsch, B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H.-J. Wunderlich, in: 19th IEEE Asian Test Symposium (ATS’10), IEEE, Shanghai, China, 2010, pp. 87–93.' date_created: 2019-08-28T09:20:51Z date_updated: 2022-05-11T16:20:07Z department: - _id: '48' doi: 10.1109/ats.2010.24 language: - iso: eng page: 87-93 place: Shanghai, China publication: 19th IEEE Asian Test Symposium (ATS'10) publisher: IEEE status: public title: Variation-Aware Fault Modeling type: conference user_id: '209' year: '2010' ... --- _id: '12985' author: - first_name: Thomas full_name: Indlekofer, Thomas last_name: Indlekofer - first_name: Michael full_name: Schnittger, Michael last_name: Schnittger - first_name: Sybille full_name: Hellebrand, Sybille id: '209' last_name: Hellebrand orcid: 0000-0002-3717-3939 citation: ama: 'Indlekofer T, Schnittger M, Hellebrand S. Efficient Test Response Compaction for Robust BIST Using Parity Sequences. In: 28th IEEE International Conference on Computer Design (ICCD’10). IEEE; 2010:480-485. doi:10.1109/iccd.2010.5647648' apa: Indlekofer, T., Schnittger, M., & Hellebrand, S. (2010). Efficient Test Response Compaction for Robust BIST Using Parity Sequences. 28th IEEE International Conference on Computer Design (ICCD’10), 480–485. https://doi.org/10.1109/iccd.2010.5647648 bibtex: '@inproceedings{Indlekofer_Schnittger_Hellebrand_2010, place={Amsterdam, The Netherlands}, title={Efficient Test Response Compaction for Robust BIST Using Parity Sequences}, DOI={10.1109/iccd.2010.5647648}, booktitle={28th IEEE International Conference on Computer Design (ICCD’10)}, publisher={IEEE}, author={Indlekofer, Thomas and Schnittger, Michael and Hellebrand, Sybille}, year={2010}, pages={480–485} }' chicago: 'Indlekofer, Thomas, Michael Schnittger, and Sybille Hellebrand. “Efficient Test Response Compaction for Robust BIST Using Parity Sequences.” In 28th IEEE International Conference on Computer Design (ICCD’10), 480–85. Amsterdam, The Netherlands: IEEE, 2010. https://doi.org/10.1109/iccd.2010.5647648.' ieee: 'T. Indlekofer, M. Schnittger, and S. Hellebrand, “Efficient Test Response Compaction for Robust BIST Using Parity Sequences,” in 28th IEEE International Conference on Computer Design (ICCD’10), 2010, pp. 480–485, doi: 10.1109/iccd.2010.5647648.' mla: Indlekofer, Thomas, et al. “Efficient Test Response Compaction for Robust BIST Using Parity Sequences.” 28th IEEE International Conference on Computer Design (ICCD’10), IEEE, 2010, pp. 480–85, doi:10.1109/iccd.2010.5647648. short: 'T. Indlekofer, M. Schnittger, S. Hellebrand, in: 28th IEEE International Conference on Computer Design (ICCD’10), IEEE, Amsterdam, The Netherlands, 2010, pp. 480–485.' date_created: 2019-08-28T09:21:55Z date_updated: 2022-05-11T16:21:12Z department: - _id: '48' doi: 10.1109/iccd.2010.5647648 language: - iso: eng page: 480-485 place: Amsterdam, The Netherlands publication: 28th IEEE International Conference on Computer Design (ICCD'10) publisher: IEEE status: public title: Efficient Test Response Compaction for Robust BIST Using Parity Sequences type: conference user_id: '209' year: '2010' ... --- _id: '12986' author: - first_name: Marc full_name: Hunger, Marc last_name: Hunger - first_name: Sybille full_name: Hellebrand, Sybille id: '209' last_name: Hellebrand orcid: 0000-0002-3717-3939 citation: ama: 'Hunger M, Hellebrand S. The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems. In: 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10). IEEE; 2010:101-108. doi:10.1109/dft.2010.19' apa: Hunger, M., & Hellebrand, S. (2010). The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems. 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), 101–108. https://doi.org/10.1109/dft.2010.19 bibtex: '@inproceedings{Hunger_Hellebrand_2010, place={Kyoto, Japan}, title={The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems}, DOI={10.1109/dft.2010.19}, booktitle={25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10)}, publisher={IEEE}, author={Hunger, Marc and Hellebrand, Sybille}, year={2010}, pages={101–108} }' chicago: 'Hunger, Marc, and Sybille Hellebrand. “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems.” In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), 101–8. Kyoto, Japan: IEEE, 2010. https://doi.org/10.1109/dft.2010.19.' ieee: 'M. Hunger and S. Hellebrand, “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems,” in 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), 2010, pp. 101–108, doi: 10.1109/dft.2010.19.' mla: Hunger, Marc, and Sybille Hellebrand. “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems.” 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), IEEE, 2010, pp. 101–08, doi:10.1109/dft.2010.19. short: 'M. Hunger, S. Hellebrand, in: 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), IEEE, Kyoto, Japan, 2010, pp. 101–108.' date_created: 2019-08-28T09:21:57Z date_updated: 2022-05-11T16:21:52Z department: - _id: '48' doi: 10.1109/dft.2010.19 language: - iso: eng page: 101-108 place: Kyoto, Japan publication: 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'10) publisher: IEEE status: public title: The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems type: conference user_id: '209' year: '2010' ... --- _id: '12988' author: - first_name: Viktor full_name: Froese, Viktor last_name: Froese - first_name: Rüdiger full_name: Ibers, Rüdiger id: '659' last_name: Ibers - first_name: Sybille full_name: Hellebrand, Sybille id: '209' last_name: Hellebrand orcid: 0000-0002-3717-3939 citation: ama: 'Froese V, Ibers R, Hellebrand S. Reusing NoC-Infrastructure for Test Data Compression. In: 28th IEEE VLSI Test Symposium (VTS’10). IEEE; 2010:227-231. doi:10.1109/vts.2010.5469570' apa: Froese, V., Ibers, R., & Hellebrand, S. (2010). Reusing NoC-Infrastructure for Test Data Compression. 28th IEEE VLSI Test Symposium (VTS’10), 227–231. https://doi.org/10.1109/vts.2010.5469570 bibtex: '@inproceedings{Froese_Ibers_Hellebrand_2010, place={Santa Cruz, CA, USA}, title={Reusing NoC-Infrastructure for Test Data Compression}, DOI={10.1109/vts.2010.5469570}, booktitle={28th IEEE VLSI Test Symposium (VTS’10)}, publisher={IEEE}, author={Froese, Viktor and Ibers, Rüdiger and Hellebrand, Sybille}, year={2010}, pages={227–231} }' chicago: 'Froese, Viktor, Rüdiger Ibers, and Sybille Hellebrand. “Reusing NoC-Infrastructure for Test Data Compression.” In 28th IEEE VLSI Test Symposium (VTS’10), 227–31. Santa Cruz, CA, USA: IEEE, 2010. https://doi.org/10.1109/vts.2010.5469570.' ieee: 'V. Froese, R. Ibers, and S. Hellebrand, “Reusing NoC-Infrastructure for Test Data Compression,” in 28th IEEE VLSI Test Symposium (VTS’10), 2010, pp. 227–231, doi: 10.1109/vts.2010.5469570.' mla: Froese, Viktor, et al. “Reusing NoC-Infrastructure for Test Data Compression.” 28th IEEE VLSI Test Symposium (VTS’10), IEEE, 2010, pp. 227–31, doi:10.1109/vts.2010.5469570. short: 'V. Froese, R. Ibers, S. Hellebrand, in: 28th IEEE VLSI Test Symposium (VTS’10), IEEE, Santa Cruz, CA, USA, 2010, pp. 227–231.' date_created: 2019-08-28T09:22:54Z date_updated: 2022-05-11T16:22:36Z department: - _id: '48' doi: 10.1109/vts.2010.5469570 language: - iso: eng page: 227-231 place: Santa Cruz, CA, USA publication: 28th IEEE VLSI Test Symposium (VTS'10) publisher: IEEE status: public title: Reusing NoC-Infrastructure for Test Data Compression type: conference user_id: '209' year: '2010' ... --- _id: '13049' author: - first_name: Bernd full_name: Becker, Bernd last_name: Becker - first_name: Sybille full_name: Hellebrand, Sybille id: '209' last_name: Hellebrand orcid: 0000-0002-3717-3939 - first_name: Ilia full_name: Polian, Ilia last_name: Polian - first_name: Bernd full_name: Straube, Bernd last_name: Straube - first_name: Wolfgang full_name: Vermeiren, Wolfgang last_name: Vermeiren - first_name: Hans-Joachim full_name: Wunderlich, Hans-Joachim last_name: Wunderlich citation: ama: 'Becker B, Hellebrand S, Polian I, Straube B, Vermeiren W, Wunderlich H-J. Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits. In: 4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper). ; 2010.' apa: Becker, B., Hellebrand, S., Polian, I., Straube, B., Vermeiren, W., & Wunderlich, H.-J. (2010). Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits. 4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper). bibtex: '@inproceedings{Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place={Chicago, IL, USA}, title={Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits}, booktitle={4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper)}, author={Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2010} }' chicago: Becker, Bernd, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” In 4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper). Chicago, IL, USA, 2010. ieee: B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, and H.-J. Wunderlich, “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits,” 2010. mla: Becker, Bernd, et al. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” 4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper), 2010. short: 'B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H.-J. Wunderlich, in: 4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper), Chicago, IL, USA, 2010.' date_created: 2019-08-28T11:45:36Z date_updated: 2022-05-11T16:26:18Z department: - _id: '48' language: - iso: eng place: Chicago, IL, USA publication: 4th Workshop on Dependable and Secure Nanocomputing (WDSN'10), (Invited Paper) status: public title: Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits type: conference user_id: '209' year: '2010' ... --- _id: '13050' author: - first_name: Thomas full_name: Indlekofer, Thomas last_name: Indlekofer - first_name: Michael full_name: Schnittger, Michael last_name: Schnittger - first_name: Sybille full_name: Hellebrand, Sybille id: '209' last_name: Hellebrand orcid: 0000-0002-3717-3939 citation: ama: 'Indlekofer T, Schnittger M, Hellebrand S. Robuster Selbsttest mit extremer Kompaktierung. In: 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” ; 2010:17-24.' apa: Indlekofer, T., Schnittger, M., & Hellebrand, S. (2010). Robuster Selbsttest mit extremer Kompaktierung. 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 17–24. bibtex: '@inproceedings{Indlekofer_Schnittger_Hellebrand_2010, place={Wildbad Kreuth, Germany}, title={Robuster Selbsttest mit extremer Kompaktierung}, booktitle={4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, author={Indlekofer, Thomas and Schnittger, Michael and Hellebrand, Sybille}, year={2010}, pages={17–24} }' chicago: Indlekofer, Thomas, Michael Schnittger, and Sybille Hellebrand. “Robuster Selbsttest Mit Extremer Kompaktierung.” In 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 17–24. Wildbad Kreuth, Germany, 2010. ieee: T. Indlekofer, M. Schnittger, and S. Hellebrand, “Robuster Selbsttest mit extremer Kompaktierung,” in 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf,” 2010, pp. 17–24. mla: Indlekofer, Thomas, et al. “Robuster Selbsttest Mit Extremer Kompaktierung.” 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 2010, pp. 17–24. short: 'T. Indlekofer, M. Schnittger, S. Hellebrand, in: 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” Wildbad Kreuth, Germany, 2010, pp. 17–24.' date_created: 2019-08-28T11:46:13Z date_updated: 2022-05-11T16:25:34Z department: - _id: '48' language: - iso: eng page: 17-24 place: Wildbad Kreuth, Germany publication: 4. GMM/GI/ITG-Fachtagung "Zuverlässigkeit und Entwurf" status: public title: Robuster Selbsttest mit extremer Kompaktierung type: conference user_id: '209' year: '2010' ... --- _id: '12991' author: - first_name: Marc full_name: Hunger, Marc last_name: Hunger - first_name: Sybille full_name: Hellebrand, Sybille id: '209' last_name: Hellebrand orcid: 0000-0002-3717-3939 - first_name: Alejandro full_name: Czutro, Alejandro last_name: Czutro - first_name: Ilia full_name: Polian, Ilia last_name: Polian - first_name: Bernd full_name: Becker, Bernd last_name: Becker citation: ama: 'Hunger M, Hellebrand S, Czutro A, Polian I, Becker B. ATPG-Based Grading of Strong Fault-Secureness. In: 15th IEEE International On-Line Testing Symposium (IOLTS’09. IEEE; 2009. doi:10.1109/iolts.2009.5196027' apa: Hunger, M., Hellebrand, S., Czutro, A., Polian, I., & Becker, B. (2009). ATPG-Based Grading of Strong Fault-Secureness. 15th IEEE International On-Line Testing Symposium (IOLTS’09. https://doi.org/10.1109/iolts.2009.5196027 bibtex: '@inproceedings{Hunger_Hellebrand_Czutro_Polian_Becker_2009, place={Sesimbra-Lisbon, Portugal}, title={ATPG-Based Grading of Strong Fault-Secureness}, DOI={10.1109/iolts.2009.5196027}, booktitle={15th IEEE International On-Line Testing Symposium (IOLTS’09}, publisher={IEEE}, author={Hunger, Marc and Hellebrand, Sybille and Czutro, Alejandro and Polian, Ilia and Becker, Bernd}, year={2009} }' chicago: 'Hunger, Marc, Sybille Hellebrand, Alejandro Czutro, Ilia Polian, and Bernd Becker. “ATPG-Based Grading of Strong Fault-Secureness.” In 15th IEEE International On-Line Testing Symposium (IOLTS’09. Sesimbra-Lisbon, Portugal: IEEE, 2009. https://doi.org/10.1109/iolts.2009.5196027.' ieee: 'M. Hunger, S. Hellebrand, A. Czutro, I. Polian, and B. Becker, “ATPG-Based Grading of Strong Fault-Secureness,” 2009, doi: 10.1109/iolts.2009.5196027.' mla: Hunger, Marc, et al. “ATPG-Based Grading of Strong Fault-Secureness.” 15th IEEE International On-Line Testing Symposium (IOLTS’09, IEEE, 2009, doi:10.1109/iolts.2009.5196027. short: 'M. Hunger, S. Hellebrand, A. Czutro, I. Polian, B. Becker, in: 15th IEEE International On-Line Testing Symposium (IOLTS’09, IEEE, Sesimbra-Lisbon, Portugal, 2009.' date_created: 2019-08-28T10:17:16Z date_updated: 2022-05-11T16:27:48Z department: - _id: '48' doi: 10.1109/iolts.2009.5196027 language: - iso: eng place: Sesimbra-Lisbon, Portugal publication: 15th IEEE International On-Line Testing Symposium (IOLTS'09 publisher: IEEE status: public title: ATPG-Based Grading of Strong Fault-Secureness type: conference user_id: '209' year: '2009' ... --- _id: '12990' author: - first_name: Sybille full_name: Hellebrand, Sybille id: '209' last_name: Hellebrand orcid: 0000-0002-3717-3939 - first_name: Marc full_name: Hunger, Marc last_name: Hunger citation: ama: 'Hellebrand S, Hunger M. Are Robust Circuits Really Robust? In: 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk). IEEE; 2009:77. doi:10.1109/dft.2009.28' apa: Hellebrand, S., & Hunger, M. (2009). Are Robust Circuits Really Robust? 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk), 77. https://doi.org/10.1109/dft.2009.28 bibtex: '@inproceedings{Hellebrand_Hunger_2009, place={Chicago, IL, USA}, title={Are Robust Circuits Really Robust?}, DOI={10.1109/dft.2009.28}, booktitle={24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk)}, publisher={IEEE}, author={Hellebrand, Sybille and Hunger, Marc}, year={2009}, pages={77} }' chicago: 'Hellebrand, Sybille, and Marc Hunger. “Are Robust Circuits Really Robust?” In 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk), 77. Chicago, IL, USA: IEEE, 2009. https://doi.org/10.1109/dft.2009.28.' ieee: 'S. Hellebrand and M. Hunger, “Are Robust Circuits Really Robust?,” in 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk), 2009, p. 77, doi: 10.1109/dft.2009.28.' mla: Hellebrand, Sybille, and Marc Hunger. “Are Robust Circuits Really Robust?” 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk), IEEE, 2009, p. 77, doi:10.1109/dft.2009.28. short: 'S. Hellebrand, M. Hunger, in: 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk), IEEE, Chicago, IL, USA, 2009, p. 77.' date_created: 2019-08-28T10:17:14Z date_updated: 2022-05-11T16:27:03Z department: - _id: '48' doi: 10.1109/dft.2009.28 language: - iso: eng page: '77' place: Chicago, IL, USA publication: 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'09), (Invited Talk) publisher: IEEE status: public title: Are Robust Circuits Really Robust? type: conference user_id: '209' year: '2009' ... --- _id: '13030' author: - first_name: Marc full_name: Hunger, Marc last_name: Hunger - first_name: Sybille full_name: Hellebrand, Sybille id: '209' last_name: Hellebrand orcid: 0000-0002-3717-3939 - first_name: Alexander full_name: Czutro, Alexander last_name: Czutro - first_name: Ilia full_name: Polian, Ilia last_name: Polian - first_name: Bernd full_name: Becker, Bernd last_name: Becker citation: ama: 'Hunger M, Hellebrand S, Czutro A, Polian I, Becker B. Robustheitsanalyse stark fehlersicherer Schaltungen mit SAT-basierter Testmustererzeugung. In: 3. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” ; 2009.' apa: Hunger, M., Hellebrand, S., Czutro, A., Polian, I., & Becker, B. (2009). Robustheitsanalyse stark fehlersicherer Schaltungen mit SAT-basierter Testmustererzeugung. 3. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” bibtex: '@inproceedings{Hunger_Hellebrand_Czutro_Polian_Becker_2009, place={Stuttgart, Germany}, title={Robustheitsanalyse stark fehlersicherer Schaltungen mit SAT-basierter Testmustererzeugung}, booktitle={3. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, author={Hunger, Marc and Hellebrand, Sybille and Czutro, Alexander and Polian, Ilia and Becker, Bernd}, year={2009} }' chicago: Hunger, Marc, Sybille Hellebrand, Alexander Czutro, Ilia Polian, and Bernd Becker. “Robustheitsanalyse Stark Fehlersicherer Schaltungen Mit SAT-Basierter Testmustererzeugung.” In 3. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.” Stuttgart, Germany, 2009. ieee: M. Hunger, S. Hellebrand, A. Czutro, I. Polian, and B. Becker, “Robustheitsanalyse stark fehlersicherer Schaltungen mit SAT-basierter Testmustererzeugung,” 2009. mla: Hunger, Marc, et al. “Robustheitsanalyse Stark Fehlersicherer Schaltungen Mit SAT-Basierter Testmustererzeugung.” 3. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 2009. short: 'M. Hunger, S. Hellebrand, A. Czutro, I. Polian, B. Becker, in: 3. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” Stuttgart, Germany, 2009.' date_created: 2019-08-28T10:35:48Z date_updated: 2022-05-11T16:28:31Z department: - _id: '48' language: - iso: eng place: Stuttgart, Germany publication: 3. GMM/GI/ITG-Fachtagung "Zuverlässigkeit und Entwurf" status: public title: Robustheitsanalyse stark fehlersicherer Schaltungen mit SAT-basierter Testmustererzeugung type: conference user_id: '209' year: '2009' ...