---
_id: '4379'
abstract:
- lang: eng
text: Uniform mesoporous Si double layers are formed on 4 inch p-type < 100> wafers
with an off orientation of 6º towards < 111> by means of electrochemical etching
in ethanoic-based HF electrolytes. These substrates are of interest for the epitaxial
growth of III–V compound semiconductor stacks on their top for the production
of multi-junction solar cells and very thin electronic devices. We demonstrate
transfer of porous layers after an annealing process in hydrogen atmosphere. Electron
Back-Scatter Diffraction analysis confirms that the substrate orientation is conserved
during the etching and annealing steps. Confocal μ-Raman spectroscopy analysis
shows a decrease in the Raman signal intensity after etching and a subsequent
increase after annealing while no shift is observed. By means of Atomic Force
Microscopy, analysis the surface appearance after the etching and annealing steps
can be visualized. The mean surface roughness varies during the process from 0.55
nm for the unprocessed wafers to 0.27 nm after etching and 0.78 nm after annealing.
The decrease of average roughness after etching is caused by an electropolishing
step prior to porous formation. Despite of slight increase of mean surface roughness
after annealing the samples are still appropriate for high quality epitaxial growth
and subsequent lift-off.
article_type: original
author:
- first_name: E.
full_name: Garralaga Rojas, E.
last_name: Garralaga Rojas
- first_name: B.
full_name: Terheiden, B.
last_name: Terheiden
- first_name: H.
full_name: Plagwitz, H.
last_name: Plagwitz
- first_name: J.
full_name: Hensen, J.
last_name: Hensen
- first_name: V.
full_name: Wiedemeier, V.
last_name: Wiedemeier
- first_name: Gerhard
full_name: Berth, Gerhard
id: '53'
last_name: Berth
- first_name: Artur
full_name: Zrenner, Artur
id: '606'
last_name: Zrenner
orcid: 0000-0002-5190-0944
- first_name: R.
full_name: Brendel, R.
last_name: Brendel
citation:
ama: Garralaga Rojas E, Terheiden B, Plagwitz H, et al. Lift-off of mesoporous layers
by electrochemical etching on Si (100) substrates with miscut of 6° off towards
(111). Thin Solid Films. 2011;520(1):606-609. doi:10.1016/j.tsf.2011.07.063
apa: Garralaga Rojas, E., Terheiden, B., Plagwitz, H., Hensen, J., Wiedemeier, V.,
Berth, G., … Brendel, R. (2011). Lift-off of mesoporous layers by electrochemical
etching on Si (100) substrates with miscut of 6° off towards (111). Thin Solid
Films, 520(1), 606–609. https://doi.org/10.1016/j.tsf.2011.07.063
bibtex: '@article{Garralaga Rojas_Terheiden_Plagwitz_Hensen_Wiedemeier_Berth_Zrenner_Brendel_2011,
title={Lift-off of mesoporous layers by electrochemical etching on Si (100) substrates
with miscut of 6° off towards (111)}, volume={520}, DOI={10.1016/j.tsf.2011.07.063},
number={1}, journal={Thin Solid Films}, publisher={Elsevier BV}, author={Garralaga
Rojas, E. and Terheiden, B. and Plagwitz, H. and Hensen, J. and Wiedemeier, V.
and Berth, Gerhard and Zrenner, Artur and Brendel, R.}, year={2011}, pages={606–609}
}'
chicago: 'Garralaga Rojas, E., B. Terheiden, H. Plagwitz, J. Hensen, V. Wiedemeier,
Gerhard Berth, Artur Zrenner, and R. Brendel. “Lift-off of Mesoporous Layers by
Electrochemical Etching on Si (100) Substrates with Miscut of 6° off towards (111).”
Thin Solid Films 520, no. 1 (2011): 606–9. https://doi.org/10.1016/j.tsf.2011.07.063.'
ieee: E. Garralaga Rojas et al., “Lift-off of mesoporous layers by electrochemical
etching on Si (100) substrates with miscut of 6° off towards (111),” Thin Solid
Films, vol. 520, no. 1, pp. 606–609, 2011.
mla: Garralaga Rojas, E., et al. “Lift-off of Mesoporous Layers by Electrochemical
Etching on Si (100) Substrates with Miscut of 6° off towards (111).” Thin Solid
Films, vol. 520, no. 1, Elsevier BV, 2011, pp. 606–09, doi:10.1016/j.tsf.2011.07.063.
short: E. Garralaga Rojas, B. Terheiden, H. Plagwitz, J. Hensen, V. Wiedemeier,
G. Berth, A. Zrenner, R. Brendel, Thin Solid Films 520 (2011) 606–609.
date_created: 2018-09-11T14:21:12Z
date_updated: 2022-01-06T07:01:00Z
department:
- _id: '15'
- _id: '230'
- _id: '35'
doi: 10.1016/j.tsf.2011.07.063
intvolume: ' 520'
issue: '1'
keyword:
- Porous Si
- Layer transfer
- Thin-film
- Photovoltaics
language:
- iso: eng
page: 606-609
publication: Thin Solid Films
publication_identifier:
issn:
- 0040-6090
publication_status: published
publisher: Elsevier BV
status: public
title: Lift-off of mesoporous layers by electrochemical etching on Si (100) substrates
with miscut of 6° off towards (111)
type: journal_article
user_id: '49428'
volume: 520
year: '2011'
...
---
_id: '13561'
author:
- first_name: Gerhard
full_name: Berth, Gerhard
id: '53'
last_name: Berth
- first_name: Wjatscheslaw
full_name: Hahn, Wjatscheslaw
last_name: Hahn
- first_name: Volker
full_name: Wiedemeier, Volker
last_name: Wiedemeier
- first_name: Artur
full_name: Zrenner, Artur
id: '606'
last_name: Zrenner
orcid: 0000-0002-5190-0944
- first_name: Simone
full_name: Sanna, Simone
last_name: Sanna
- first_name: Wolf Gero
full_name: Schmidt, Wolf Gero
id: '468'
last_name: Schmidt
orcid: 0000-0002-2717-5076
citation:
ama: Berth G, Hahn W, Wiedemeier V, Zrenner A, Sanna S, Schmidt WG. Imaging of the
Ferroelectric Domain Structures by Confocal Raman Spectroscopy. Ferroelectrics.
2011;420:44-48. doi:10.1080/00150193.2011.594774
apa: Berth, G., Hahn, W., Wiedemeier, V., Zrenner, A., Sanna, S., & Schmidt,
W. G. (2011). Imaging of the Ferroelectric Domain Structures by Confocal Raman
Spectroscopy. Ferroelectrics, 420, 44–48. https://doi.org/10.1080/00150193.2011.594774
bibtex: '@article{Berth_Hahn_Wiedemeier_Zrenner_Sanna_Schmidt_2011, title={Imaging
of the Ferroelectric Domain Structures by Confocal Raman Spectroscopy}, volume={420},
DOI={10.1080/00150193.2011.594774},
journal={Ferroelectrics}, author={Berth, Gerhard and Hahn, Wjatscheslaw and Wiedemeier,
Volker and Zrenner, Artur and Sanna, Simone and Schmidt, Wolf Gero}, year={2011},
pages={44–48} }'
chicago: 'Berth, Gerhard, Wjatscheslaw Hahn, Volker Wiedemeier, Artur Zrenner, Simone
Sanna, and Wolf Gero Schmidt. “Imaging of the Ferroelectric Domain Structures
by Confocal Raman Spectroscopy.” Ferroelectrics 420 (2011): 44–48. https://doi.org/10.1080/00150193.2011.594774.'
ieee: 'G. Berth, W. Hahn, V. Wiedemeier, A. Zrenner, S. Sanna, and W. G. Schmidt,
“Imaging of the Ferroelectric Domain Structures by Confocal Raman Spectroscopy,”
Ferroelectrics, vol. 420, pp. 44–48, 2011, doi: 10.1080/00150193.2011.594774.'
mla: Berth, Gerhard, et al. “Imaging of the Ferroelectric Domain Structures by Confocal
Raman Spectroscopy.” Ferroelectrics, vol. 420, 2011, pp. 44–48, doi:10.1080/00150193.2011.594774.
short: G. Berth, W. Hahn, V. Wiedemeier, A. Zrenner, S. Sanna, W.G. Schmidt, Ferroelectrics
420 (2011) 44–48.
date_created: 2019-10-01T08:48:15Z
date_updated: 2025-12-05T10:43:51Z
department:
- _id: '15'
- _id: '170'
- _id: '295'
- _id: '290'
- _id: '35'
- _id: '230'
doi: 10.1080/00150193.2011.594774
funded_apc: '1'
intvolume: ' 420'
language:
- iso: eng
page: 44-48
publication: Ferroelectrics
publication_identifier:
issn:
- 0015-0193
- 1563-5112
publication_status: published
status: public
title: Imaging of the Ferroelectric Domain Structures by Confocal Raman Spectroscopy
type: journal_article
user_id: '16199'
volume: 420
year: '2011'
...
---
_id: '13823'
author:
- first_name: S.
full_name: Sanna, S.
last_name: Sanna
- first_name: Gerhard
full_name: Berth, Gerhard
id: '53'
last_name: Berth
- first_name: W.
full_name: Hahn, W.
last_name: Hahn
- first_name: A.
full_name: Widhalm, A.
last_name: Widhalm
- first_name: Artur
full_name: Zrenner, Artur
id: '606'
last_name: Zrenner
orcid: 0000-0002-5190-0944
- first_name: Wolf Gero
full_name: Schmidt, Wolf Gero
id: '468'
last_name: Schmidt
orcid: 0000-0002-2717-5076
citation:
ama: Sanna S, Berth G, Hahn W, Widhalm A, Zrenner A, Schmidt WG. Vibrational properties
of the LiNbO3 z-surfaces. IEEE Transactions on Ultrasonics, Ferroelectrics
and Frequency Control. 2011;58(9):1751-1756. doi:10.1109/tuffc.2011.2012
apa: Sanna, S., Berth, G., Hahn, W., Widhalm, A., Zrenner, A., & Schmidt, W.
G. (2011). Vibrational properties of the LiNbO3 z-surfaces. IEEE Transactions
on Ultrasonics, Ferroelectrics and Frequency Control, 58(9), 1751–1756.
https://doi.org/10.1109/tuffc.2011.2012
bibtex: '@article{Sanna_Berth_Hahn_Widhalm_Zrenner_Schmidt_2011, title={Vibrational
properties of the LiNbO3 z-surfaces}, volume={58}, DOI={10.1109/tuffc.2011.2012},
number={9}, journal={IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency
Control}, author={Sanna, S. and Berth, Gerhard and Hahn, W. and Widhalm, A. and
Zrenner, Artur and Schmidt, Wolf Gero}, year={2011}, pages={1751–1756} }'
chicago: 'Sanna, S., Gerhard Berth, W. Hahn, A. Widhalm, Artur Zrenner, and Wolf
Gero Schmidt. “Vibrational Properties of the LiNbO3 Z-Surfaces.” IEEE Transactions
on Ultrasonics, Ferroelectrics and Frequency Control 58, no. 9 (2011): 1751–56.
https://doi.org/10.1109/tuffc.2011.2012.'
ieee: 'S. Sanna, G. Berth, W. Hahn, A. Widhalm, A. Zrenner, and W. G. Schmidt, “Vibrational
properties of the LiNbO3 z-surfaces,” IEEE Transactions on Ultrasonics, Ferroelectrics
and Frequency Control, vol. 58, no. 9, pp. 1751–1756, 2011, doi: 10.1109/tuffc.2011.2012.'
mla: Sanna, S., et al. “Vibrational Properties of the LiNbO3 Z-Surfaces.” IEEE
Transactions on Ultrasonics, Ferroelectrics and Frequency Control, vol. 58,
no. 9, 2011, pp. 1751–56, doi:10.1109/tuffc.2011.2012.
short: S. Sanna, G. Berth, W. Hahn, A. Widhalm, A. Zrenner, W.G. Schmidt, IEEE Transactions
on Ultrasonics, Ferroelectrics and Frequency Control 58 (2011) 1751–1756.
date_created: 2019-10-15T07:12:33Z
date_updated: 2025-12-16T07:51:55Z
department:
- _id: '15'
- _id: '170'
- _id: '295'
- _id: '35'
- _id: '290'
- _id: '230'
- _id: '27'
doi: 10.1109/tuffc.2011.2012
funded_apc: '1'
intvolume: ' 58'
issue: '9'
language:
- iso: eng
page: 1751-1756
project:
- _id: '52'
name: Computing Resources Provided by the Paderborn Center for Parallel Computing
publication: IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control
publication_identifier:
issn:
- 0885-3010
publication_status: published
status: public
title: Vibrational properties of the LiNbO3 z-surfaces
type: journal_article
user_id: '16199'
volume: 58
year: '2011'
...
---
_id: '4543'
abstract:
- lang: eng
text: The vibrational properties of the LiNbO3 (0001) surfaces have been investigated
both from first principles and with Raman spectroscopy measurements. Firstly,
the phonon modes of bulk and of the (0001) surface are calculated by means of
the density functional theory. Our calculations reveal the existence of localised
vibrational modes both at the positive and at the negative surface. The surface
vibrations are found at energies above and within the bulk bands. Phonon modes
localised at the positive and at the negative surface differ substantially. In
a second step, the Raman spectra of LiNbO3 bulk and of the two surfaces have been
measured. Raman spectroscopy is shown to be sensitive to differences between bulk
and surface and between positive and negative surface. The calculated and measured
frequencies are in agreement within the error of the method.
article_type: original
author:
- first_name: S.
full_name: Sanna, S.
last_name: Sanna
- first_name: Gerhard
full_name: Berth, Gerhard
id: '53'
last_name: Berth
- first_name: W.
full_name: Hahn, W.
last_name: Hahn
- first_name: A.
full_name: Widhalm, A.
last_name: Widhalm
- first_name: Artur
full_name: Zrenner, Artur
id: '606'
last_name: Zrenner
orcid: 0000-0002-5190-0944
- first_name: Wolf Gero
full_name: Schmidt, Wolf Gero
id: '468'
last_name: Schmidt
orcid: 0000-0002-2717-5076
citation:
ama: Sanna S, Berth G, Hahn W, Widhalm A, Zrenner A, Schmidt WG. Localised Phonon
Modes at LiNbO3(0001) Surfaces. Ferroelectrics. 2011;419(1):1-8. doi:10.1080/00150193.2011.594396
apa: Sanna, S., Berth, G., Hahn, W., Widhalm, A., Zrenner, A., & Schmidt, W.
G. (2011). Localised Phonon Modes at LiNbO3(0001) Surfaces. Ferroelectrics,
419(1), 1–8. https://doi.org/10.1080/00150193.2011.594396
bibtex: '@article{Sanna_Berth_Hahn_Widhalm_Zrenner_Schmidt_2011, title={Localised
Phonon Modes at LiNbO3(0001) Surfaces}, volume={419}, DOI={10.1080/00150193.2011.594396},
number={1}, journal={Ferroelectrics}, publisher={Informa UK Limited}, author={Sanna,
S. and Berth, Gerhard and Hahn, W. and Widhalm, A. and Zrenner, Artur and Schmidt,
Wolf Gero}, year={2011}, pages={1–8} }'
chicago: 'Sanna, S., Gerhard Berth, W. Hahn, A. Widhalm, Artur Zrenner, and Wolf
Gero Schmidt. “Localised Phonon Modes at LiNbO3(0001) Surfaces.” Ferroelectrics
419, no. 1 (2011): 1–8. https://doi.org/10.1080/00150193.2011.594396.'
ieee: 'S. Sanna, G. Berth, W. Hahn, A. Widhalm, A. Zrenner, and W. G. Schmidt, “Localised
Phonon Modes at LiNbO3(0001) Surfaces,” Ferroelectrics, vol. 419, no. 1,
pp. 1–8, 2011, doi: 10.1080/00150193.2011.594396.'
mla: Sanna, S., et al. “Localised Phonon Modes at LiNbO3(0001) Surfaces.” Ferroelectrics,
vol. 419, no. 1, Informa UK Limited, 2011, pp. 1–8, doi:10.1080/00150193.2011.594396.
short: S. Sanna, G. Berth, W. Hahn, A. Widhalm, A. Zrenner, W.G. Schmidt, Ferroelectrics
419 (2011) 1–8.
date_created: 2018-09-20T11:26:53Z
date_updated: 2025-12-16T11:29:20Z
department:
- _id: '15'
- _id: '230'
- _id: '35'
- _id: '170'
- _id: '295'
- _id: '35'
- _id: '27'
doi: 10.1080/00150193.2011.594396
intvolume: ' 419'
issue: '1'
language:
- iso: eng
page: 1-8
project:
- _id: '52'
name: 'PC2: Computing Resources Provided by the Paderborn Center for Parallel Computing'
publication: Ferroelectrics
publication_identifier:
issn:
- 0015-0193
- 1563-5112
publication_status: published
publisher: Informa UK Limited
status: public
title: Localised Phonon Modes at LiNbO3(0001) Surfaces
type: journal_article
user_id: '16199'
volume: 419
year: '2011'
...
---
_id: '4548'
abstract:
- lang: eng
text: "A fluorescence study of acetonitrile solutions of bis(tetramethylguanidine)propane,
copper(I)-iodide and [Cu(btmgp)I] was performed and the chemical reaction of the
latter species with O2 was investigated at room temperature. The actual quenching
process via O2 gassing was studied and an exponential dependence of the fluorescence
intensity with respect to the complex concentration was observed.\r\nFurthermore
the survey was deepened on time resolved fluorescence properties of solved [Cu(btmgp)I]
in a wider concentration range. The applicability of this complex for O2 sensing
inside a microreactor system was proven by confocal fluorescence measurements.
It was shown that the investigated system can be used for oxygen sensing in the
copper concentration range from 10−2 to 10−9 mol/l."
article_type: original
author:
- first_name: Sonja
full_name: Herres-Pawlis, Sonja
last_name: Herres-Pawlis
- first_name: Gerhard
full_name: Berth, Gerhard
id: '53'
last_name: Berth
- first_name: Volker
full_name: Wiedemeier, Volker
last_name: Wiedemeier
- first_name: Ludger
full_name: Schmidt, Ludger
last_name: Schmidt
- first_name: Artur
full_name: Zrenner, Artur
id: '606'
last_name: Zrenner
orcid: 0000-0002-5190-0944
- first_name: Hans-Joachim
full_name: Warnecke, Hans-Joachim
last_name: Warnecke
citation:
ama: Herres-Pawlis S, Berth G, Wiedemeier V, Schmidt L, Zrenner A, Warnecke H-J.
Oxygen sensing by fluorescence quenching of [Cu(btmgp)I]. Journal of Luminescence.
2010;130(10):1958-1962. doi:10.1016/j.jlumin.2010.05.012
apa: Herres-Pawlis, S., Berth, G., Wiedemeier, V., Schmidt, L., Zrenner, A., &
Warnecke, H.-J. (2010). Oxygen sensing by fluorescence quenching of [Cu(btmgp)I].
Journal of Luminescence, 130(10), 1958–1962. https://doi.org/10.1016/j.jlumin.2010.05.012
bibtex: '@article{Herres-Pawlis_Berth_Wiedemeier_Schmidt_Zrenner_Warnecke_2010,
title={Oxygen sensing by fluorescence quenching of [Cu(btmgp)I]}, volume={130},
DOI={10.1016/j.jlumin.2010.05.012},
number={10}, journal={Journal of Luminescence}, publisher={Elsevier BV}, author={Herres-Pawlis,
Sonja and Berth, Gerhard and Wiedemeier, Volker and Schmidt, Ludger and Zrenner,
Artur and Warnecke, Hans-Joachim}, year={2010}, pages={1958–1962} }'
chicago: 'Herres-Pawlis, Sonja, Gerhard Berth, Volker Wiedemeier, Ludger Schmidt,
Artur Zrenner, and Hans-Joachim Warnecke. “Oxygen Sensing by Fluorescence Quenching
of [Cu(Btmgp)I].” Journal of Luminescence 130, no. 10 (2010): 1958–62.
https://doi.org/10.1016/j.jlumin.2010.05.012.'
ieee: S. Herres-Pawlis, G. Berth, V. Wiedemeier, L. Schmidt, A. Zrenner, and H.-J.
Warnecke, “Oxygen sensing by fluorescence quenching of [Cu(btmgp)I],” Journal
of Luminescence, vol. 130, no. 10, pp. 1958–1962, 2010.
mla: Herres-Pawlis, Sonja, et al. “Oxygen Sensing by Fluorescence Quenching of [Cu(Btmgp)I].”
Journal of Luminescence, vol. 130, no. 10, Elsevier BV, 2010, pp. 1958–62,
doi:10.1016/j.jlumin.2010.05.012.
short: S. Herres-Pawlis, G. Berth, V. Wiedemeier, L. Schmidt, A. Zrenner, H.-J.
Warnecke, Journal of Luminescence 130 (2010) 1958–1962.
date_created: 2018-09-20T12:31:16Z
date_updated: 2022-01-06T07:01:09Z
department:
- _id: '15'
- _id: '230'
- _id: '35'
doi: 10.1016/j.jlumin.2010.05.012
intvolume: ' 130'
issue: '10'
keyword:
- Copper Oxygen Fluorescence quenching N donor ligands
language:
- iso: eng
page: 1958-1962
publication: Journal of Luminescence
publication_identifier:
issn:
- 0022-2313
publication_status: published
publisher: Elsevier BV
status: public
title: Oxygen sensing by fluorescence quenching of [Cu(btmgp)I]
type: journal_article
user_id: '49428'
volume: 130
year: '2010'
...
---
_id: '4549'
abstract:
- lang: eng
text: Damage caused by laser irradiation on the surface of ZnTe epilayers was studied
by micro-Raman and atomic force microscopy (AFM). ZnTe LO-phonon overtones up
to four order and TO + (n − 1)LO zone-center phonons were observed in the resonant
micro-Raman spectra at room temperature. Discrepancies in the literature regarding
the origin of two features observed at low frequencies around 120 and 140 cm−1
in the Raman spectrum of ZnTe are discussed and resolved. These Raman peaks were
not detected by using a low excitation laser power density on a Zn-terminated
ZnTe surface; however, with the increase of the laser power density they were
found to arise irreversibly. The correspondence of these peaks in a wave number
with the strongest Raman peaks of the crystalline tellurium phase and the intensity
enhancement behavior with the laser power in a similar way as for CdTe strongly
suggests the formation of crystalline tellurium aggregates on the layer surface
due to laser irradiation damage. AFM data reveal the occurrence of laser ablation
on the ZnTe surface even though the surface temperature of the sample is below
the melting point.
article_number: '075003'
article_type: original
author:
- first_name: E M
full_name: Larramendi, E M
last_name: Larramendi
- first_name: Gerhard
full_name: Berth, Gerhard
id: '53'
last_name: Berth
- first_name: V
full_name: Wiedemeier, V
last_name: Wiedemeier
- first_name: K-P
full_name: Hüsch, K-P
last_name: Hüsch
- first_name: Artur
full_name: Zrenner, Artur
id: '606'
last_name: Zrenner
orcid: 0000-0002-5190-0944
- first_name: U
full_name: Woggon, U
last_name: Woggon
- first_name: E
full_name: Tschumak, E
last_name: Tschumak
- first_name: K
full_name: Lischka, K
last_name: Lischka
- first_name: D
full_name: Schikora, D
last_name: Schikora
citation:
ama: Larramendi EM, Berth G, Wiedemeier V, et al. Intensity enhancement of Te Raman
modes by laser damage in ZnTe epilayers. Semiconductor Science and Technology.
2010;25(7). doi:10.1088/0268-1242/25/7/075003
apa: Larramendi, E. M., Berth, G., Wiedemeier, V., Hüsch, K.-P., Zrenner, A., Woggon,
U., … Schikora, D. (2010). Intensity enhancement of Te Raman modes by laser damage
in ZnTe epilayers. Semiconductor Science and Technology, 25(7).
https://doi.org/10.1088/0268-1242/25/7/075003
bibtex: '@article{Larramendi_Berth_Wiedemeier_Hüsch_Zrenner_Woggon_Tschumak_Lischka_Schikora_2010,
title={Intensity enhancement of Te Raman modes by laser damage in ZnTe epilayers},
volume={25}, DOI={10.1088/0268-1242/25/7/075003},
number={7075003}, journal={Semiconductor Science and Technology}, publisher={IOP
Publishing}, author={Larramendi, E M and Berth, Gerhard and Wiedemeier, V and
Hüsch, K-P and Zrenner, Artur and Woggon, U and Tschumak, E and Lischka, K and
Schikora, D}, year={2010} }'
chicago: Larramendi, E M, Gerhard Berth, V Wiedemeier, K-P Hüsch, Artur Zrenner,
U Woggon, E Tschumak, K Lischka, and D Schikora. “Intensity Enhancement of Te
Raman Modes by Laser Damage in ZnTe Epilayers.” Semiconductor Science and Technology
25, no. 7 (2010). https://doi.org/10.1088/0268-1242/25/7/075003.
ieee: E. M. Larramendi et al., “Intensity enhancement of Te Raman modes by
laser damage in ZnTe epilayers,” Semiconductor Science and Technology,
vol. 25, no. 7, 2010.
mla: Larramendi, E. M., et al. “Intensity Enhancement of Te Raman Modes by Laser
Damage in ZnTe Epilayers.” Semiconductor Science and Technology, vol. 25,
no. 7, 075003, IOP Publishing, 2010, doi:10.1088/0268-1242/25/7/075003.
short: E.M. Larramendi, G. Berth, V. Wiedemeier, K.-P. Hüsch, A. Zrenner, U. Woggon,
E. Tschumak, K. Lischka, D. Schikora, Semiconductor Science and Technology 25
(2010).
date_created: 2018-09-20T12:35:35Z
date_updated: 2022-01-06T07:01:09Z
department:
- _id: '15'
- _id: '230'
- _id: '35'
doi: 10.1088/0268-1242/25/7/075003
intvolume: ' 25'
issue: '7'
language:
- iso: eng
publication: Semiconductor Science and Technology
publication_identifier:
issn:
- 0268-1242
- 1361-6641
publication_status: published
publisher: IOP Publishing
status: public
title: Intensity enhancement of Te Raman modes by laser damage in ZnTe epilayers
type: journal_article
user_id: '49428'
volume: 25
year: '2010'
...
---
_id: '6619'
abstract:
- lang: ger
text: Strömungsbasierte Mischprozesse sind grundlegender Bestandteil vieler chemischer
Prozesse. Realisierbare Mischzeiten reichen von einigen Millisekunden bis zu Sekunden,
wobei die vollständige Homogenisierung oft nicht sichergestellt ist. Werden kinetische
Parameter chemischer Reaktionen dieses Zeitskalenbereichs ohne Berücksichtigung
der Mischprozesse bestimmt, sind sie mischungsmaskiert und geben die inhärente
chemische Kinetik nicht wieder. In dieser Arbeit wird die Validierung und Anwendung
einer Methode zur Bestimmung inhärenter chemischer Kinetiken von in Flüssigphase
ablaufenden chemischen Reaktionen im stationären, laminaren Flachbettmikroreaktor
vorgestellt. Der verfolgte Ansatz basiert auf der mechanistischen Modellierung
der Molmengen unter Berücksichtigung von Konvektion, Diffusion und Reaktion und
der Bestimmung der unbekannten Parameter durch Anpassung des Modells an experimentell
ermittelte Konzentrationsverläufe.
article_type: original
author:
- first_name: H.-J.
full_name: Warnecke, H.-J.
last_name: Warnecke
- first_name: D.
full_name: Bothe, D.
last_name: Bothe
- first_name: Artur
full_name: Zrenner, Artur
id: '606'
last_name: Zrenner
orcid: 0000-0002-5190-0944
- first_name: Gerhard
full_name: Berth, Gerhard
id: '53'
last_name: Berth
- first_name: K.-P.
full_name: Hüsch, K.-P.
last_name: Hüsch
citation:
ama: Warnecke H-J, Bothe D, Zrenner A, Berth G, Hüsch K-P. Modellbasierte Bestimmung
lokal gültiger Kinetiken chemischer Reaktionen in Flüssigphase mittels Flachbettmikroreaktor*.
Chemie Ingenieur Technik. 2010;82(3):251-258. doi:10.1002/cite.200900169
apa: Warnecke, H.-J., Bothe, D., Zrenner, A., Berth, G., & Hüsch, K.-P. (2010).
Modellbasierte Bestimmung lokal gültiger Kinetiken chemischer Reaktionen in Flüssigphase
mittels Flachbettmikroreaktor*. Chemie Ingenieur Technik, 82(3),
251–258. https://doi.org/10.1002/cite.200900169
bibtex: '@article{Warnecke_Bothe_Zrenner_Berth_Hüsch_2010, title={Modellbasierte
Bestimmung lokal gültiger Kinetiken chemischer Reaktionen in Flüssigphase mittels
Flachbettmikroreaktor*}, volume={82}, DOI={10.1002/cite.200900169},
number={3}, journal={Chemie Ingenieur Technik}, publisher={Wiley}, author={Warnecke,
H.-J. and Bothe, D. and Zrenner, Artur and Berth, Gerhard and Hüsch, K.-P.}, year={2010},
pages={251–258} }'
chicago: 'Warnecke, H.-J., D. Bothe, Artur Zrenner, Gerhard Berth, and K.-P. Hüsch.
“Modellbasierte Bestimmung lokal gültiger Kinetiken chemischer Reaktionen in Flüssigphase
mittels Flachbettmikroreaktor*.” Chemie Ingenieur Technik 82, no. 3 (2010):
251–58. https://doi.org/10.1002/cite.200900169.'
ieee: H.-J. Warnecke, D. Bothe, A. Zrenner, G. Berth, and K.-P. Hüsch, “Modellbasierte
Bestimmung lokal gültiger Kinetiken chemischer Reaktionen in Flüssigphase mittels
Flachbettmikroreaktor*,” Chemie Ingenieur Technik, vol. 82, no. 3, pp.
251–258, 2010.
mla: Warnecke, H. J., et al. “Modellbasierte Bestimmung lokal gültiger Kinetiken
chemischer Reaktionen in Flüssigphase mittels Flachbettmikroreaktor*.” Chemie
Ingenieur Technik, vol. 82, no. 3, Wiley, 2010, pp. 251–58, doi:10.1002/cite.200900169.
short: H.-J. Warnecke, D. Bothe, A. Zrenner, G. Berth, K.-P. Hüsch, Chemie Ingenieur
Technik 82 (2010) 251–258.
date_created: 2019-01-10T10:13:09Z
date_updated: 2022-01-06T07:03:13Z
department:
- _id: '15'
- _id: '230'
- _id: '35'
doi: 10.1002/cite.200900169
intvolume: ' 82'
issue: '3'
language:
- iso: ger
page: 251-258
publication: Chemie Ingenieur Technik
publication_identifier:
issn:
- 0009-286X
- 1522-2640
publication_status: published
publisher: Wiley
status: public
title: Modellbasierte Bestimmung lokal gültiger Kinetiken chemischer Reaktionen in
Flüssigphase mittels Flachbettmikroreaktor*
type: journal_article
user_id: '49428'
volume: 82
year: '2010'
...
---
_id: '4553'
abstract:
- lang: eng
text: We present results on ferroelectric micro-domains obtained by confocal second
harmonic microscopy. The high potential of this technique is demonstrated by imaging
periodic ferroelectric domain structures in the surface of planar X-cut lithium
niobate (LN) and in the body of ridges fabricated by plasma etching on X-cut LN
as well. In both cases the measured second harmonic signal reveals a strong contrast
between inverted and non-inverted domain sections. This enabled a depth-resolved
non-destructive tomography of micro-domains in ridge structures in all three dimensions.
article_type: original
author:
- first_name: Gerhard
full_name: Berth, Gerhard
id: '53'
last_name: Berth
- first_name: Volker
full_name: Wiedemeier, Volker
last_name: Wiedemeier
- first_name: Klaus-Peter
full_name: Hüsch, Klaus-Peter
last_name: Hüsch
- first_name: Li
full_name: Gui, Li
last_name: Gui
- first_name: Hui
full_name: Hu, Hui
last_name: Hu
- first_name: Wolfgang
full_name: Sohler, Wolfgang
last_name: Sohler
- first_name: Artur
full_name: Zrenner, Artur
id: '606'
last_name: Zrenner
orcid: 0000-0002-5190-0944
citation:
ama: Berth G, Wiedemeier V, Hüsch K-P, et al. Imaging of Ferroelectric Micro-Domains
in X-Cut Lithium Niobate by Confocal Second Harmonic Microscopy. Ferroelectrics.
2009;389(1):132-141. doi:10.1080/00150190902993267
apa: Berth, G., Wiedemeier, V., Hüsch, K.-P., Gui, L., Hu, H., Sohler, W., &
Zrenner, A. (2009). Imaging of Ferroelectric Micro-Domains in X-Cut Lithium Niobate
by Confocal Second Harmonic Microscopy. Ferroelectrics, 389(1),
132–141. https://doi.org/10.1080/00150190902993267
bibtex: '@article{Berth_Wiedemeier_Hüsch_Gui_Hu_Sohler_Zrenner_2009, title={Imaging
of Ferroelectric Micro-Domains in X-Cut Lithium Niobate by Confocal Second Harmonic
Microscopy}, volume={389}, DOI={10.1080/00150190902993267},
number={1}, journal={Ferroelectrics}, publisher={Informa UK Limited}, author={Berth,
Gerhard and Wiedemeier, Volker and Hüsch, Klaus-Peter and Gui, Li and Hu, Hui
and Sohler, Wolfgang and Zrenner, Artur}, year={2009}, pages={132–141} }'
chicago: 'Berth, Gerhard, Volker Wiedemeier, Klaus-Peter Hüsch, Li Gui, Hui Hu,
Wolfgang Sohler, and Artur Zrenner. “Imaging of Ferroelectric Micro-Domains in
X-Cut Lithium Niobate by Confocal Second Harmonic Microscopy.” Ferroelectrics
389, no. 1 (2009): 132–41. https://doi.org/10.1080/00150190902993267.'
ieee: G. Berth et al., “Imaging of Ferroelectric Micro-Domains in X-Cut Lithium
Niobate by Confocal Second Harmonic Microscopy,” Ferroelectrics, vol. 389,
no. 1, pp. 132–141, 2009.
mla: Berth, Gerhard, et al. “Imaging of Ferroelectric Micro-Domains in X-Cut Lithium
Niobate by Confocal Second Harmonic Microscopy.” Ferroelectrics, vol. 389,
no. 1, Informa UK Limited, 2009, pp. 132–41, doi:10.1080/00150190902993267.
short: G. Berth, V. Wiedemeier, K.-P. Hüsch, L. Gui, H. Hu, W. Sohler, A. Zrenner,
Ferroelectrics 389 (2009) 132–141.
date_created: 2018-09-20T12:54:14Z
date_updated: 2022-01-06T07:01:09Z
department:
- _id: '15'
- _id: '230'
- _id: '35'
doi: 10.1080/00150190902993267
intvolume: ' 389'
issue: '1'
keyword:
- Nonlinear microscopy
- ferroelectric micro-domains
- confocal imaging
- LiNbO3
language:
- iso: eng
page: 132-141
publication: Ferroelectrics
publication_identifier:
issn:
- 0015-0193
- 1563-5112
publication_status: published
publisher: Informa UK Limited
status: public
title: Imaging of Ferroelectric Micro-Domains in X-Cut Lithium Niobate by Confocal
Second Harmonic Microscopy
type: journal_article
user_id: '49428'
volume: 389
year: '2009'
...
---
_id: '4555'
abstract:
- lang: eng
text: Semiconductor microdiscs are promising for applications in photonics and quantum-information
processing, such as efficient solid-state-based single-photon emitters. Strain
in the multilayer structure of those devices has an important influence on their
optical properties. We present measurements of the strain distribution in ZnMgSe/ZnSe
microdiscs by means of micro-photoluminescence and micro-Raman imaging. Photoluminescence
measurements of microdiscs reveal substantially broadened emission lines with
a shift to lower energy at the undercut part of microdiscs, indicating local relaxation
in this area. The distribution of the strain in the microdiscs is obtained from
an imaging micro-Raman analysis, revealing that the freestanding part of the microdiscs
is free of defects.
article_type: original
author:
- first_name: M.
full_name: Panfilova, M.
last_name: Panfilova
- first_name: A.
full_name: Pawlis, A.
last_name: Pawlis
- first_name: C.
full_name: Arens, C.
last_name: Arens
- first_name: S. Michaelis
full_name: de Vasconcellos, S. Michaelis
last_name: de Vasconcellos
- first_name: Gerhard
full_name: Berth, Gerhard
id: '53'
last_name: Berth
- first_name: K.P.
full_name: Hüsch, K.P.
last_name: Hüsch
- first_name: V.
full_name: Wiedemeier, V.
last_name: Wiedemeier
- first_name: Artur
full_name: Zrenner, Artur
id: '606'
last_name: Zrenner
orcid: 0000-0002-5190-0944
- first_name: K.
full_name: Lischka, K.
last_name: Lischka
citation:
ama: Panfilova M, Pawlis A, Arens C, et al. Micro-Raman imaging and micro-photoluminescence
measurements of strain in ZnMgSe/ZnSe microdiscs. Microelectronics Journal.
2008;40(2):221-223. doi:10.1016/j.mejo.2008.07.056
apa: Panfilova, M., Pawlis, A., Arens, C., de Vasconcellos, S. M., Berth, G., Hüsch,
K. P., … Lischka, K. (2008). Micro-Raman imaging and micro-photoluminescence measurements
of strain in ZnMgSe/ZnSe microdiscs. Microelectronics Journal, 40(2),
221–223. https://doi.org/10.1016/j.mejo.2008.07.056
bibtex: '@article{Panfilova_Pawlis_Arens_de Vasconcellos_Berth_Hüsch_Wiedemeier_Zrenner_Lischka_2008,
title={Micro-Raman imaging and micro-photoluminescence measurements of strain
in ZnMgSe/ZnSe microdiscs}, volume={40}, DOI={10.1016/j.mejo.2008.07.056},
number={2}, journal={Microelectronics Journal}, publisher={Elsevier BV}, author={Panfilova,
M. and Pawlis, A. and Arens, C. and de Vasconcellos, S. Michaelis and Berth, Gerhard
and Hüsch, K.P. and Wiedemeier, V. and Zrenner, Artur and Lischka, K.}, year={2008},
pages={221–223} }'
chicago: 'Panfilova, M., A. Pawlis, C. Arens, S. Michaelis de Vasconcellos, Gerhard
Berth, K.P. Hüsch, V. Wiedemeier, Artur Zrenner, and K. Lischka. “Micro-Raman
Imaging and Micro-Photoluminescence Measurements of Strain in ZnMgSe/ZnSe Microdiscs.”
Microelectronics Journal 40, no. 2 (2008): 221–23. https://doi.org/10.1016/j.mejo.2008.07.056.'
ieee: M. Panfilova et al., “Micro-Raman imaging and micro-photoluminescence
measurements of strain in ZnMgSe/ZnSe microdiscs,” Microelectronics Journal,
vol. 40, no. 2, pp. 221–223, 2008.
mla: Panfilova, M., et al. “Micro-Raman Imaging and Micro-Photoluminescence Measurements
of Strain in ZnMgSe/ZnSe Microdiscs.” Microelectronics Journal, vol. 40,
no. 2, Elsevier BV, 2008, pp. 221–23, doi:10.1016/j.mejo.2008.07.056.
short: M. Panfilova, A. Pawlis, C. Arens, S.M. de Vasconcellos, G. Berth, K.P. Hüsch,
V. Wiedemeier, A. Zrenner, K. Lischka, Microelectronics Journal 40 (2008) 221–223.
date_created: 2018-09-20T13:39:35Z
date_updated: 2022-01-06T07:01:09Z
department:
- _id: '15'
- _id: '230'
- _id: '35'
doi: 10.1016/j.mejo.2008.07.056
intvolume: ' 40'
issue: '2'
keyword:
- Raman
- Photoluminescence
- Microdisc
- ZnSe
language:
- iso: eng
page: 221-223
publication: Microelectronics Journal
publication_identifier:
issn:
- 0026-2692
publication_status: published
publisher: Elsevier BV
status: public
title: Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe
microdiscs
type: journal_article
user_id: '49428'
volume: 40
year: '2008'
...