---
_id: '22535'
author:
- first_name: Steffen
  full_name: Knust, Steffen
  last_name: Knust
- first_name: Lukas
  full_name: Ruhm, Lukas
  last_name: Ruhm
- first_name: Andreas
  full_name: Kuhlmann, Andreas
  last_name: Kuhlmann
- first_name: Dennis
  full_name: Meinderink, Dennis
  last_name: Meinderink
- first_name: Julius
  full_name: Bürger, Julius
  last_name: Bürger
- first_name: Jörg K. N.
  full_name: Lindner, Jörg K. N.
  last_name: Lindner
- first_name: Maria Teresa
  full_name: de los Arcos de Pedro, Maria Teresa
  id: '54556'
  last_name: de los Arcos de Pedro
- first_name: Guido
  full_name: Grundmeier, Guido
  id: '194'
  last_name: Grundmeier
citation:
  ama: Knust S, Ruhm L, Kuhlmann A, et al. In situ backside Raman spectroscopy of
    zinc oxide nanorods in an atmospheric‐pressure dielectric barrier discharge plasma.
    <i>Journal of Raman Spectroscopy</i>. Published online 2021:1237-1245. doi:<a
    href="https://doi.org/10.1002/jrs.6123">10.1002/jrs.6123</a>
  apa: Knust, S., Ruhm, L., Kuhlmann, A., Meinderink, D., Bürger, J., Lindner, J.
    K. N., de los Arcos de Pedro, M. T., &#38; Grundmeier, G. (2021). In situ backside
    Raman spectroscopy of zinc oxide nanorods in an atmospheric‐pressure dielectric
    barrier discharge plasma. <i>Journal of Raman Spectroscopy</i>, 1237–1245. <a
    href="https://doi.org/10.1002/jrs.6123">https://doi.org/10.1002/jrs.6123</a>
  bibtex: '@article{Knust_Ruhm_Kuhlmann_Meinderink_Bürger_Lindner_de los Arcos de
    Pedro_Grundmeier_2021, title={In situ backside Raman spectroscopy of zinc oxide
    nanorods in an atmospheric‐pressure dielectric barrier discharge plasma}, DOI={<a
    href="https://doi.org/10.1002/jrs.6123">10.1002/jrs.6123</a>}, journal={Journal
    of Raman Spectroscopy}, author={Knust, Steffen and Ruhm, Lukas and Kuhlmann, Andreas
    and Meinderink, Dennis and Bürger, Julius and Lindner, Jörg K. N. and de los Arcos
    de Pedro, Maria Teresa and Grundmeier, Guido}, year={2021}, pages={1237–1245}
    }'
  chicago: Knust, Steffen, Lukas Ruhm, Andreas Kuhlmann, Dennis Meinderink, Julius
    Bürger, Jörg K. N. Lindner, Maria Teresa de los Arcos de Pedro, and Guido Grundmeier.
    “In Situ Backside Raman Spectroscopy of Zinc Oxide Nanorods in an Atmospheric‐pressure
    Dielectric Barrier Discharge Plasma.” <i>Journal of Raman Spectroscopy</i>, 2021,
    1237–45. <a href="https://doi.org/10.1002/jrs.6123">https://doi.org/10.1002/jrs.6123</a>.
  ieee: 'S. Knust <i>et al.</i>, “In situ backside Raman spectroscopy of zinc oxide
    nanorods in an atmospheric‐pressure dielectric barrier discharge plasma,” <i>Journal
    of Raman Spectroscopy</i>, pp. 1237–1245, 2021, doi: <a href="https://doi.org/10.1002/jrs.6123">10.1002/jrs.6123</a>.'
  mla: Knust, Steffen, et al. “In Situ Backside Raman Spectroscopy of Zinc Oxide Nanorods
    in an Atmospheric‐pressure Dielectric Barrier Discharge Plasma.” <i>Journal of
    Raman Spectroscopy</i>, 2021, pp. 1237–45, doi:<a href="https://doi.org/10.1002/jrs.6123">10.1002/jrs.6123</a>.
  short: S. Knust, L. Ruhm, A. Kuhlmann, D. Meinderink, J. Bürger, J.K.N. Lindner,
    M.T. de los Arcos de Pedro, G. Grundmeier, Journal of Raman Spectroscopy (2021)
    1237–1245.
date_created: 2021-07-07T08:34:37Z
date_updated: 2023-01-24T08:52:47Z
department:
- _id: '302'
doi: 10.1002/jrs.6123
language:
- iso: eng
page: 1237-1245
publication: Journal of Raman Spectroscopy
publication_identifier:
  issn:
  - 0377-0486
  - 1097-4555
publication_status: published
status: public
title: In situ backside Raman spectroscopy of zinc oxide nanorods in an atmospheric‐pressure
  dielectric barrier discharge plasma
type: journal_article
user_id: '54556'
year: '2021'
...
---
_id: '22534'
author:
- first_name: Sabrina
  full_name: Schwiderek, Sabrina
  last_name: Schwiderek
- first_name: Alejandro G.
  full_name: Orive, Alejandro G.
  last_name: Orive
- first_name: Soheil
  full_name: Karimi Aghda, Soheil
  last_name: Karimi Aghda
- first_name: Jochen M.
  full_name: Schneider, Jochen M.
  last_name: Schneider
- first_name: Maria Teresa
  full_name: de los Arcos de Pedro, Maria Teresa
  id: '54556'
  last_name: de los Arcos de Pedro
- first_name: Guido
  full_name: Grundmeier, Guido
  id: '194'
  last_name: Grundmeier
citation:
  ama: Schwiderek S, Orive AG, Karimi Aghda S, Schneider JM, de los Arcos de Pedro
    MT, Grundmeier G. Single-Molecule Desorption Studies of Poly(acrylic acid) at
    Electrolyte/Oxide/TiAlN Interfaces. <i>Langmuir</i>. Published online 2020:9489-9498.
    doi:<a href="https://doi.org/10.1021/acs.langmuir.0c00188">10.1021/acs.langmuir.0c00188</a>
  apa: Schwiderek, S., Orive, A. G., Karimi Aghda, S., Schneider, J. M., de los Arcos
    de Pedro, M. T., &#38; Grundmeier, G. (2020). Single-Molecule Desorption Studies
    of Poly(acrylic acid) at Electrolyte/Oxide/TiAlN Interfaces. <i>Langmuir</i>,
    9489–9498. <a href="https://doi.org/10.1021/acs.langmuir.0c00188">https://doi.org/10.1021/acs.langmuir.0c00188</a>
  bibtex: '@article{Schwiderek_Orive_Karimi Aghda_Schneider_de los Arcos de Pedro_Grundmeier_2020,
    title={Single-Molecule Desorption Studies of Poly(acrylic acid) at Electrolyte/Oxide/TiAlN
    Interfaces}, DOI={<a href="https://doi.org/10.1021/acs.langmuir.0c00188">10.1021/acs.langmuir.0c00188</a>},
    journal={Langmuir}, author={Schwiderek, Sabrina and Orive, Alejandro G. and Karimi
    Aghda, Soheil and Schneider, Jochen M. and de los Arcos de Pedro, Maria Teresa
    and Grundmeier, Guido}, year={2020}, pages={9489–9498} }'
  chicago: Schwiderek, Sabrina, Alejandro G. Orive, Soheil Karimi Aghda, Jochen M.
    Schneider, Maria Teresa de los Arcos de Pedro, and Guido Grundmeier. “Single-Molecule
    Desorption Studies of Poly(Acrylic Acid) at Electrolyte/Oxide/TiAlN Interfaces.”
    <i>Langmuir</i>, 2020, 9489–98. <a href="https://doi.org/10.1021/acs.langmuir.0c00188">https://doi.org/10.1021/acs.langmuir.0c00188</a>.
  ieee: 'S. Schwiderek, A. G. Orive, S. Karimi Aghda, J. M. Schneider, M. T. de los
    Arcos de Pedro, and G. Grundmeier, “Single-Molecule Desorption Studies of Poly(acrylic
    acid) at Electrolyte/Oxide/TiAlN Interfaces,” <i>Langmuir</i>, pp. 9489–9498,
    2020, doi: <a href="https://doi.org/10.1021/acs.langmuir.0c00188">10.1021/acs.langmuir.0c00188</a>.'
  mla: Schwiderek, Sabrina, et al. “Single-Molecule Desorption Studies of Poly(Acrylic
    Acid) at Electrolyte/Oxide/TiAlN Interfaces.” <i>Langmuir</i>, 2020, pp. 9489–98,
    doi:<a href="https://doi.org/10.1021/acs.langmuir.0c00188">10.1021/acs.langmuir.0c00188</a>.
  short: S. Schwiderek, A.G. Orive, S. Karimi Aghda, J.M. Schneider, M.T. de los Arcos
    de Pedro, G. Grundmeier, Langmuir (2020) 9489–9498.
date_created: 2021-07-07T08:32:03Z
date_updated: 2023-01-24T08:33:40Z
department:
- _id: '302'
doi: 10.1021/acs.langmuir.0c00188
language:
- iso: eng
page: 9489-9498
publication: Langmuir
publication_identifier:
  issn:
  - 0743-7463
  - 1520-5827
publication_status: published
status: public
title: Single-Molecule Desorption Studies of Poly(acrylic acid) at Electrolyte/Oxide/TiAlN
  Interfaces
type: journal_article
user_id: '54556'
year: '2020'
...
---
_id: '22537'
article_number: '475205'
author:
- first_name: C
  full_name: Hoppe, C
  last_name: Hoppe
- first_name: F
  full_name: Mitschker, F
  last_name: Mitschker
- first_name: M
  full_name: Butterling, M
  last_name: Butterling
- first_name: M O
  full_name: Liedke, M O
  last_name: Liedke
- first_name: Maria Teresa
  full_name: de los Arcos de Pedro, Maria Teresa
  id: '54556'
  last_name: de los Arcos de Pedro
- first_name: P
  full_name: Awakowicz, P
  last_name: Awakowicz
- first_name: A
  full_name: Wagner, A
  last_name: Wagner
- first_name: Guido
  full_name: Grundmeier, Guido
  id: '194'
  last_name: Grundmeier
citation:
  ama: 'Hoppe C, Mitschker F, Butterling M, et al. Characterisation of micropores
    in plasma deposited SiO x  films by means of positron annihilation lifetime spectroscopy.
    <i>Journal of Physics D: Applied Physics</i>. Published online 2020. doi:<a href="https://doi.org/10.1088/1361-6463/aba8ba">10.1088/1361-6463/aba8ba</a>'
  apa: 'Hoppe, C., Mitschker, F., Butterling, M., Liedke, M. O., de los Arcos de Pedro,
    M. T., Awakowicz, P., Wagner, A., &#38; Grundmeier, G. (2020). Characterisation
    of micropores in plasma deposited SiO x  films by means of positron annihilation
    lifetime spectroscopy. <i>Journal of Physics D: Applied Physics</i>, Article 475205.
    <a href="https://doi.org/10.1088/1361-6463/aba8ba">https://doi.org/10.1088/1361-6463/aba8ba</a>'
  bibtex: '@article{Hoppe_Mitschker_Butterling_Liedke_de los Arcos de Pedro_Awakowicz_Wagner_Grundmeier_2020,
    title={Characterisation of micropores in plasma deposited SiO x  films by means
    of positron annihilation lifetime spectroscopy}, DOI={<a href="https://doi.org/10.1088/1361-6463/aba8ba">10.1088/1361-6463/aba8ba</a>},
    number={475205}, journal={Journal of Physics D: Applied Physics}, author={Hoppe,
    C and Mitschker, F and Butterling, M and Liedke, M O and de los Arcos de Pedro,
    Maria Teresa and Awakowicz, P and Wagner, A and Grundmeier, Guido}, year={2020}
    }'
  chicago: 'Hoppe, C, F Mitschker, M Butterling, M O Liedke, Maria Teresa de los Arcos
    de Pedro, P Awakowicz, A Wagner, and Guido Grundmeier. “Characterisation of Micropores
    in Plasma Deposited SiO x  Films by Means of Positron Annihilation Lifetime Spectroscopy.”
    <i>Journal of Physics D: Applied Physics</i>, 2020. <a href="https://doi.org/10.1088/1361-6463/aba8ba">https://doi.org/10.1088/1361-6463/aba8ba</a>.'
  ieee: 'C. Hoppe <i>et al.</i>, “Characterisation of micropores in plasma deposited
    SiO x  films by means of positron annihilation lifetime spectroscopy,” <i>Journal
    of Physics D: Applied Physics</i>, Art. no. 475205, 2020, doi: <a href="https://doi.org/10.1088/1361-6463/aba8ba">10.1088/1361-6463/aba8ba</a>.'
  mla: 'Hoppe, C., et al. “Characterisation of Micropores in Plasma Deposited SiO
    x  Films by Means of Positron Annihilation Lifetime Spectroscopy.” <i>Journal
    of Physics D: Applied Physics</i>, 475205, 2020, doi:<a href="https://doi.org/10.1088/1361-6463/aba8ba">10.1088/1361-6463/aba8ba</a>.'
  short: 'C. Hoppe, F. Mitschker, M. Butterling, M.O. Liedke, M.T. de los Arcos de
    Pedro, P. Awakowicz, A. Wagner, G. Grundmeier, Journal of Physics D: Applied Physics
    (2020).'
date_created: 2021-07-07T08:37:16Z
date_updated: 2023-01-24T08:34:17Z
department:
- _id: '302'
doi: 10.1088/1361-6463/aba8ba
language:
- iso: eng
publication: 'Journal of Physics D: Applied Physics'
publication_identifier:
  issn:
  - 0022-3727
  - 1361-6463
publication_status: published
status: public
title: Characterisation of micropores in plasma deposited SiO x  films by means of
  positron annihilation lifetime spectroscopy
type: journal_article
user_id: '54556'
year: '2020'
...
---
_id: '22536'
author:
- first_name: Steffen
  full_name: Knust, Steffen
  last_name: Knust
- first_name: Andreas
  full_name: Kuhlmann, Andreas
  last_name: Kuhlmann
- first_name: Alejandro G.
  full_name: Orive, Alejandro G.
  last_name: Orive
- first_name: Maria Teresa
  full_name: de los Arcos de Pedro, Maria Teresa
  id: '54556'
  last_name: de los Arcos de Pedro
- first_name: Guido
  full_name: Grundmeier, Guido
  id: '194'
  last_name: Grundmeier
citation:
  ama: Knust S, Kuhlmann A, Orive AG, de los Arcos de Pedro MT, Grundmeier G. Influence
    of dielectric barrier plasma treatment of ZnMgAl alloy‐coated steel on the adsorption
    of organophosphonic acid monolayers. <i>Surface and Interface Analysis</i>. Published
    online 2020:1077-1082. doi:<a href="https://doi.org/10.1002/sia.6782">10.1002/sia.6782</a>
  apa: Knust, S., Kuhlmann, A., Orive, A. G., de los Arcos de Pedro, M. T., &#38;
    Grundmeier, G. (2020). Influence of dielectric barrier plasma treatment of ZnMgAl
    alloy‐coated steel on the adsorption of organophosphonic acid monolayers. <i>Surface
    and Interface Analysis</i>, 1077–1082. <a href="https://doi.org/10.1002/sia.6782">https://doi.org/10.1002/sia.6782</a>
  bibtex: '@article{Knust_Kuhlmann_Orive_de los Arcos de Pedro_Grundmeier_2020, title={Influence
    of dielectric barrier plasma treatment of ZnMgAl alloy‐coated steel on the adsorption
    of organophosphonic acid monolayers}, DOI={<a href="https://doi.org/10.1002/sia.6782">10.1002/sia.6782</a>},
    journal={Surface and Interface Analysis}, author={Knust, Steffen and Kuhlmann,
    Andreas and Orive, Alejandro G. and de los Arcos de Pedro, Maria Teresa and Grundmeier,
    Guido}, year={2020}, pages={1077–1082} }'
  chicago: Knust, Steffen, Andreas Kuhlmann, Alejandro G. Orive, Maria Teresa de los
    Arcos de Pedro, and Guido Grundmeier. “Influence of Dielectric Barrier Plasma
    Treatment of ZnMgAl Alloy‐coated Steel on the Adsorption of Organophosphonic Acid
    Monolayers.” <i>Surface and Interface Analysis</i>, 2020, 1077–82. <a href="https://doi.org/10.1002/sia.6782">https://doi.org/10.1002/sia.6782</a>.
  ieee: 'S. Knust, A. Kuhlmann, A. G. Orive, M. T. de los Arcos de Pedro, and G. Grundmeier,
    “Influence of dielectric barrier plasma treatment of ZnMgAl alloy‐coated steel
    on the adsorption of organophosphonic acid monolayers,” <i>Surface and Interface
    Analysis</i>, pp. 1077–1082, 2020, doi: <a href="https://doi.org/10.1002/sia.6782">10.1002/sia.6782</a>.'
  mla: Knust, Steffen, et al. “Influence of Dielectric Barrier Plasma Treatment of
    ZnMgAl Alloy‐coated Steel on the Adsorption of Organophosphonic Acid Monolayers.”
    <i>Surface and Interface Analysis</i>, 2020, pp. 1077–82, doi:<a href="https://doi.org/10.1002/sia.6782">10.1002/sia.6782</a>.
  short: S. Knust, A. Kuhlmann, A.G. Orive, M.T. de los Arcos de Pedro, G. Grundmeier,
    Surface and Interface Analysis (2020) 1077–1082.
date_created: 2021-07-07T08:35:55Z
date_updated: 2023-01-24T08:33:58Z
department:
- _id: '302'
doi: 10.1002/sia.6782
language:
- iso: eng
page: 1077-1082
publication: Surface and Interface Analysis
publication_identifier:
  issn:
  - 0142-2421
  - 1096-9918
publication_status: published
status: public
title: Influence of dielectric barrier plasma treatment of ZnMgAl alloy‐coated steel
  on the adsorption of organophosphonic acid monolayers
type: journal_article
user_id: '54556'
year: '2020'
...
---
_id: '22545'
author:
- first_name: Lukas
  full_name: Mai, Lukas
  last_name: Mai
- first_name: David
  full_name: Zanders, David
  last_name: Zanders
- first_name: Ersoy
  full_name: Subaşı, Ersoy
  last_name: Subaşı
- first_name: Engin
  full_name: Ciftyurek, Engin
  last_name: Ciftyurek
- first_name: Christian
  full_name: Hoppe, Christian
  last_name: Hoppe
- first_name: Detlef
  full_name: Rogalla, Detlef
  last_name: Rogalla
- first_name: Wolfram
  full_name: Gilbert, Wolfram
  last_name: Gilbert
- first_name: Maria Teresa
  full_name: de los Arcos de Pedro, Maria Teresa
  id: '54556'
  last_name: de los Arcos de Pedro
- first_name: Klaus
  full_name: Schierbaum, Klaus
  last_name: Schierbaum
- first_name: Guido
  full_name: Grundmeier, Guido
  id: '194'
  last_name: Grundmeier
- first_name: Claudia
  full_name: Bock, Claudia
  last_name: Bock
- first_name: Anjana
  full_name: Devi, Anjana
  last_name: Devi
citation:
  ama: 'Mai L, Zanders D, Subaşı E, et al. Low-Temperature Plasma-Enhanced Atomic
    Layer Deposition of Tin(IV) Oxide from a Functionalized Alkyl Precursor: Fabrication
    and Evaluation of SnO2-Based Thin-Film Transistor Devices. <i>ACS Applied Materials
    &#38; Interfaces</i>. Published online 2019:3169-3180. doi:<a href="https://doi.org/10.1021/acsami.8b16443">10.1021/acsami.8b16443</a>'
  apa: 'Mai, L., Zanders, D., Subaşı, E., Ciftyurek, E., Hoppe, C., Rogalla, D., Gilbert,
    W., de los Arcos de Pedro, M. T., Schierbaum, K., Grundmeier, G., Bock, C., &#38;
    Devi, A. (2019). Low-Temperature Plasma-Enhanced Atomic Layer Deposition of Tin(IV)
    Oxide from a Functionalized Alkyl Precursor: Fabrication and Evaluation of SnO2-Based
    Thin-Film Transistor Devices. <i>ACS Applied Materials &#38; Interfaces</i>, 3169–3180.
    <a href="https://doi.org/10.1021/acsami.8b16443">https://doi.org/10.1021/acsami.8b16443</a>'
  bibtex: '@article{Mai_Zanders_Subaşı_Ciftyurek_Hoppe_Rogalla_Gilbert_de los Arcos
    de Pedro_Schierbaum_Grundmeier_et al._2019, title={Low-Temperature Plasma-Enhanced
    Atomic Layer Deposition of Tin(IV) Oxide from a Functionalized Alkyl Precursor:
    Fabrication and Evaluation of SnO2-Based Thin-Film Transistor Devices}, DOI={<a
    href="https://doi.org/10.1021/acsami.8b16443">10.1021/acsami.8b16443</a>}, journal={ACS
    Applied Materials &#38; Interfaces}, author={Mai, Lukas and Zanders, David and
    Subaşı, Ersoy and Ciftyurek, Engin and Hoppe, Christian and Rogalla, Detlef and
    Gilbert, Wolfram and de los Arcos de Pedro, Maria Teresa and Schierbaum, Klaus
    and Grundmeier, Guido and et al.}, year={2019}, pages={3169–3180} }'
  chicago: 'Mai, Lukas, David Zanders, Ersoy Subaşı, Engin Ciftyurek, Christian Hoppe,
    Detlef Rogalla, Wolfram Gilbert, et al. “Low-Temperature Plasma-Enhanced Atomic
    Layer Deposition of Tin(IV) Oxide from a Functionalized Alkyl Precursor: Fabrication
    and Evaluation of SnO2-Based Thin-Film Transistor Devices.” <i>ACS Applied Materials
    &#38; Interfaces</i>, 2019, 3169–80. <a href="https://doi.org/10.1021/acsami.8b16443">https://doi.org/10.1021/acsami.8b16443</a>.'
  ieee: 'L. Mai <i>et al.</i>, “Low-Temperature Plasma-Enhanced Atomic Layer Deposition
    of Tin(IV) Oxide from a Functionalized Alkyl Precursor: Fabrication and Evaluation
    of SnO2-Based Thin-Film Transistor Devices,” <i>ACS Applied Materials &#38; Interfaces</i>,
    pp. 3169–3180, 2019, doi: <a href="https://doi.org/10.1021/acsami.8b16443">10.1021/acsami.8b16443</a>.'
  mla: 'Mai, Lukas, et al. “Low-Temperature Plasma-Enhanced Atomic Layer Deposition
    of Tin(IV) Oxide from a Functionalized Alkyl Precursor: Fabrication and Evaluation
    of SnO2-Based Thin-Film Transistor Devices.” <i>ACS Applied Materials &#38; Interfaces</i>,
    2019, pp. 3169–80, doi:<a href="https://doi.org/10.1021/acsami.8b16443">10.1021/acsami.8b16443</a>.'
  short: L. Mai, D. Zanders, E. Subaşı, E. Ciftyurek, C. Hoppe, D. Rogalla, W. Gilbert,
    M.T. de los Arcos de Pedro, K. Schierbaum, G. Grundmeier, C. Bock, A. Devi, ACS
    Applied Materials &#38; Interfaces (2019) 3169–3180.
date_created: 2021-07-07T08:49:23Z
date_updated: 2023-01-24T08:35:14Z
department:
- _id: '302'
doi: 10.1021/acsami.8b16443
language:
- iso: eng
page: 3169-3180
publication: ACS Applied Materials & Interfaces
publication_identifier:
  issn:
  - 1944-8244
  - 1944-8252
publication_status: published
status: public
title: 'Low-Temperature Plasma-Enhanced Atomic Layer Deposition of Tin(IV) Oxide from
  a Functionalized Alkyl Precursor: Fabrication and Evaluation of SnO2-Based Thin-Film
  Transistor Devices'
type: journal_article
user_id: '54556'
year: '2019'
...
---
_id: '22544'
author:
- first_name: Lukas
  full_name: Mai, Lukas
  last_name: Mai
- first_name: Nils
  full_name: Boysen, Nils
  last_name: Boysen
- first_name: David
  full_name: Zanders, David
  last_name: Zanders
- first_name: Maria Teresa
  full_name: de los Arcos de Pedro, Maria Teresa
  id: '54556'
  last_name: de los Arcos de Pedro
- first_name: Felix
  full_name: Mitschker, Felix
  last_name: Mitschker
- first_name: Bert
  full_name: Mallick, Bert
  last_name: Mallick
- first_name: Guido
  full_name: Grundmeier, Guido
  last_name: Grundmeier
- first_name: Peter
  full_name: Awakowicz, Peter
  last_name: Awakowicz
- first_name: Anjana
  full_name: Devi, Anjana
  last_name: Devi
citation:
  ama: Mai L, Boysen N, Zanders D, et al. Potential Precursor Alternatives to the
    Pyrophoric Trimethylaluminium for the Atomic Layer Deposition of Aluminium Oxide.
    <i>Chemistry – A European Journal</i>. Published online 2019:7489-7500. doi:<a
    href="https://doi.org/10.1002/chem.201900475">10.1002/chem.201900475</a>
  apa: Mai, L., Boysen, N., Zanders, D., de los Arcos de Pedro, M. T., Mitschker,
    F., Mallick, B., Grundmeier, G., Awakowicz, P., &#38; Devi, A. (2019). Potential
    Precursor Alternatives to the Pyrophoric Trimethylaluminium for the Atomic Layer
    Deposition of Aluminium Oxide. <i>Chemistry – A European Journal</i>, 7489–7500.
    <a href="https://doi.org/10.1002/chem.201900475">https://doi.org/10.1002/chem.201900475</a>
  bibtex: '@article{Mai_Boysen_Zanders_de los Arcos de Pedro_Mitschker_Mallick_Grundmeier_Awakowicz_Devi_2019,
    title={Potential Precursor Alternatives to the Pyrophoric Trimethylaluminium for
    the Atomic Layer Deposition of Aluminium Oxide}, DOI={<a href="https://doi.org/10.1002/chem.201900475">10.1002/chem.201900475</a>},
    journal={Chemistry – A European Journal}, author={Mai, Lukas and Boysen, Nils
    and Zanders, David and de los Arcos de Pedro, Maria Teresa and Mitschker, Felix
    and Mallick, Bert and Grundmeier, Guido and Awakowicz, Peter and Devi, Anjana},
    year={2019}, pages={7489–7500} }'
  chicago: Mai, Lukas, Nils Boysen, David Zanders, Maria Teresa de los Arcos de Pedro,
    Felix Mitschker, Bert Mallick, Guido Grundmeier, Peter Awakowicz, and Anjana Devi.
    “Potential Precursor Alternatives to the Pyrophoric Trimethylaluminium for the
    Atomic Layer Deposition of Aluminium Oxide.” <i>Chemistry – A European Journal</i>,
    2019, 7489–7500. <a href="https://doi.org/10.1002/chem.201900475">https://doi.org/10.1002/chem.201900475</a>.
  ieee: 'L. Mai <i>et al.</i>, “Potential Precursor Alternatives to the Pyrophoric
    Trimethylaluminium for the Atomic Layer Deposition of Aluminium Oxide,” <i>Chemistry
    – A European Journal</i>, pp. 7489–7500, 2019, doi: <a href="https://doi.org/10.1002/chem.201900475">10.1002/chem.201900475</a>.'
  mla: Mai, Lukas, et al. “Potential Precursor Alternatives to the Pyrophoric Trimethylaluminium
    for the Atomic Layer Deposition of Aluminium Oxide.” <i>Chemistry – A European
    Journal</i>, 2019, pp. 7489–500, doi:<a href="https://doi.org/10.1002/chem.201900475">10.1002/chem.201900475</a>.
  short: L. Mai, N. Boysen, D. Zanders, M.T. de los Arcos de Pedro, F. Mitschker,
    B. Mallick, G. Grundmeier, P. Awakowicz, A. Devi, Chemistry – A European Journal
    (2019) 7489–7500.
date_created: 2021-07-07T08:47:25Z
date_updated: 2023-01-24T08:34:51Z
department:
- _id: '302'
doi: 10.1002/chem.201900475
language:
- iso: eng
page: 7489-7500
publication: Chemistry – A European Journal
publication_identifier:
  issn:
  - 0947-6539
  - 1521-3765
publication_status: published
status: public
title: Potential Precursor Alternatives to the Pyrophoric Trimethylaluminium for the
  Atomic Layer Deposition of Aluminium Oxide
type: journal_article
user_id: '54556'
year: '2019'
...
---
_id: '22543'
abstract:
- lang: eng
  text: <p>Correlation between atmospheric DBD plasma-induced surface chemical changes
    on a ZnMgAl alloy coating and the resulting adhesive properties.</p>
author:
- first_name: Steffen
  full_name: Knust, Steffen
  last_name: Knust
- first_name: Andreas
  full_name: Kuhlmann, Andreas
  last_name: Kuhlmann
- first_name: Maria Teresa
  full_name: de los Arcos de Pedro, Maria Teresa
  id: '54556'
  last_name: de los Arcos de Pedro
- first_name: Guido
  full_name: Grundmeier, Guido
  id: '194'
  last_name: Grundmeier
citation:
  ama: Knust S, Kuhlmann A, de los Arcos de Pedro MT, Grundmeier G. Surface modification
    of ZnMgAl-coated steel by dielectric-barrier discharge plasma. <i>RSC Advances</i>.
    Published online 2019:35077-35088. doi:<a href="https://doi.org/10.1039/c9ra07378g">10.1039/c9ra07378g</a>
  apa: Knust, S., Kuhlmann, A., de los Arcos de Pedro, M. T., &#38; Grundmeier, G.
    (2019). Surface modification of ZnMgAl-coated steel by dielectric-barrier discharge
    plasma. <i>RSC Advances</i>, 35077–35088. <a href="https://doi.org/10.1039/c9ra07378g">https://doi.org/10.1039/c9ra07378g</a>
  bibtex: '@article{Knust_Kuhlmann_de los Arcos de Pedro_Grundmeier_2019, title={Surface
    modification of ZnMgAl-coated steel by dielectric-barrier discharge plasma}, DOI={<a
    href="https://doi.org/10.1039/c9ra07378g">10.1039/c9ra07378g</a>}, journal={RSC
    Advances}, author={Knust, Steffen and Kuhlmann, Andreas and de los Arcos de Pedro,
    Maria Teresa and Grundmeier, Guido}, year={2019}, pages={35077–35088} }'
  chicago: Knust, Steffen, Andreas Kuhlmann, Maria Teresa de los Arcos de Pedro, and
    Guido Grundmeier. “Surface Modification of ZnMgAl-Coated Steel by Dielectric-Barrier
    Discharge Plasma.” <i>RSC Advances</i>, 2019, 35077–88. <a href="https://doi.org/10.1039/c9ra07378g">https://doi.org/10.1039/c9ra07378g</a>.
  ieee: 'S. Knust, A. Kuhlmann, M. T. de los Arcos de Pedro, and G. Grundmeier, “Surface
    modification of ZnMgAl-coated steel by dielectric-barrier discharge plasma,” <i>RSC
    Advances</i>, pp. 35077–35088, 2019, doi: <a href="https://doi.org/10.1039/c9ra07378g">10.1039/c9ra07378g</a>.'
  mla: Knust, Steffen, et al. “Surface Modification of ZnMgAl-Coated Steel by Dielectric-Barrier
    Discharge Plasma.” <i>RSC Advances</i>, 2019, pp. 35077–88, doi:<a href="https://doi.org/10.1039/c9ra07378g">10.1039/c9ra07378g</a>.
  short: S. Knust, A. Kuhlmann, M.T. de los Arcos de Pedro, G. Grundmeier, RSC Advances
    (2019) 35077–35088.
date_created: 2021-07-07T08:45:19Z
date_updated: 2023-01-24T08:34:36Z
department:
- _id: '302'
doi: 10.1039/c9ra07378g
language:
- iso: eng
page: 35077-35088
publication: RSC Advances
publication_identifier:
  issn:
  - 2046-2069
publication_status: published
status: public
title: Surface modification of ZnMgAl-coated steel by dielectric-barrier discharge
  plasma
type: journal_article
user_id: '54556'
year: '2019'
...
---
_id: '22541'
abstract:
- lang: eng
  text: Monodisperse micron-sized silica particle monolayers deposited onto plasma-grown
    SiOx-ultra-thin films have been used as reference systems to investigate wetting,
    water adsorption and capillary bridge formation as a function of silica surface
    functionalization. 1H,1H, 2H,2H perfluorooctyltriethoxysil (FOTS) monolayers,
    have been deposited on the respective surfaces by means of chemical vapor deposition
    resulting in macroscopically low energy surfaces. X-ray photoelectron spectroscopy
    (XPS) and Fourier transform infrared (FTIR) reflection absorption spectroscopy
    confirmed the monolayer formation. Water adsorption isotherms were studied by
    a combination of in-situ FTIR reflection spectroscopy and quartz crystal microbalance
    (QCM) while macroscopic wetting was analysed by contact angle measurements. The
    comparative data evaluation indicates that the macroscopic wetting behaviour was
    changed as expected, however, that water nanodroplets formed both at intrinsic
    defects of the FOTS monolayer and at the FOTS/SiOx interface. Capillary bridges
    of liquid water are dominantly formed in the confined particle contact areas and
    between surface asperities on the particles. The comparison of wetting, adsorption
    and capillary bridge formation shows that the hydrophobization of porous materials
    by organosilane monolayers leads to the formation of morphology dependent nanoscopic
    defects that act as sites for preferential capillary bridge formation.
author:
- first_name: Ignacio
  full_name: Giner, Ignacio
  last_name: Giner
- first_name: Boray
  full_name: Torun, Boray
  last_name: Torun
- first_name: Yan
  full_name: Han, Yan
  last_name: Han
- first_name: Belma
  full_name: Duderija, Belma
  id: '54863'
  last_name: Duderija
- first_name: Dennis
  full_name: Meinderink, Dennis
  last_name: Meinderink
- first_name: Alejandro González
  full_name: Orive, Alejandro González
  last_name: Orive
- first_name: Maria Teresa
  full_name: de los Arcos de Pedro, Maria Teresa
  id: '54556'
  last_name: de los Arcos de Pedro
- first_name: Christian
  full_name: Weinberger, Christian
  last_name: Weinberger
- first_name: Michael
  full_name: Tiemann, Michael
  id: '23547'
  last_name: Tiemann
  orcid: 0000-0003-1711-2722
- first_name: Hans-Joachim
  full_name: Schmid, Hans-Joachim
  id: '464'
  last_name: Schmid
  orcid: 000-0001-8590-1921
- first_name: Guido
  full_name: Grundmeier, Guido
  id: '194'
  last_name: Grundmeier
citation:
  ama: Giner I, Torun B, Han Y, et al. Water adsorption and capillary bridge formation
    on silica micro-particle layers modified with perfluorinated organosilane monolayers.
    <i>Applied Surface Science</i>. Published online 2019:873-879. doi:<a href="https://doi.org/10.1016/j.apsusc.2018.12.221">10.1016/j.apsusc.2018.12.221</a>
  apa: Giner, I., Torun, B., Han, Y., Duderija, B., Meinderink, D., Orive, A. G.,
    de los Arcos de Pedro, M. T., Weinberger, C., Tiemann, M., Schmid, H.-J., &#38;
    Grundmeier, G. (2019). Water adsorption and capillary bridge formation on silica
    micro-particle layers modified with perfluorinated organosilane monolayers. <i>Applied
    Surface Science</i>, 873–879. <a href="https://doi.org/10.1016/j.apsusc.2018.12.221">https://doi.org/10.1016/j.apsusc.2018.12.221</a>
  bibtex: '@article{Giner_Torun_Han_Duderija_Meinderink_Orive_de los Arcos de Pedro_Weinberger_Tiemann_Schmid_et
    al._2019, title={Water adsorption and capillary bridge formation on silica micro-particle
    layers modified with perfluorinated organosilane monolayers}, DOI={<a href="https://doi.org/10.1016/j.apsusc.2018.12.221">10.1016/j.apsusc.2018.12.221</a>},
    journal={Applied Surface Science}, author={Giner, Ignacio and Torun, Boray and
    Han, Yan and Duderija, Belma and Meinderink, Dennis and Orive, Alejandro González
    and de los Arcos de Pedro, Maria Teresa and Weinberger, Christian and Tiemann,
    Michael and Schmid, Hans-Joachim and et al.}, year={2019}, pages={873–879} }'
  chicago: Giner, Ignacio, Boray Torun, Yan Han, Belma Duderija, Dennis Meinderink,
    Alejandro González Orive, Maria Teresa de los Arcos de Pedro, et al. “Water Adsorption
    and Capillary Bridge Formation on Silica Micro-Particle Layers Modified with Perfluorinated
    Organosilane Monolayers.” <i>Applied Surface Science</i>, 2019, 873–79. <a href="https://doi.org/10.1016/j.apsusc.2018.12.221">https://doi.org/10.1016/j.apsusc.2018.12.221</a>.
  ieee: 'I. Giner <i>et al.</i>, “Water adsorption and capillary bridge formation
    on silica micro-particle layers modified with perfluorinated organosilane monolayers,”
    <i>Applied Surface Science</i>, pp. 873–879, 2019, doi: <a href="https://doi.org/10.1016/j.apsusc.2018.12.221">10.1016/j.apsusc.2018.12.221</a>.'
  mla: Giner, Ignacio, et al. “Water Adsorption and Capillary Bridge Formation on
    Silica Micro-Particle Layers Modified with Perfluorinated Organosilane Monolayers.”
    <i>Applied Surface Science</i>, 2019, pp. 873–79, doi:<a href="https://doi.org/10.1016/j.apsusc.2018.12.221">10.1016/j.apsusc.2018.12.221</a>.
  short: I. Giner, B. Torun, Y. Han, B. Duderija, D. Meinderink, A.G. Orive, M.T.
    de los Arcos de Pedro, C. Weinberger, M. Tiemann, H.-J. Schmid, G. Grundmeier,
    Applied Surface Science (2019) 873–879.
date_created: 2021-07-07T08:40:38Z
date_updated: 2023-07-12T07:58:00Z
department:
- _id: '302'
doi: 10.1016/j.apsusc.2018.12.221
language:
- iso: eng
page: 873-879
publication: Applied Surface Science
publication_identifier:
  issn:
  - 0169-4332
publication_status: published
status: public
title: Water adsorption and capillary bridge formation on silica micro-particle layers
  modified with perfluorinated organosilane monolayers
type: journal_article
user_id: '54863'
year: '2019'
...
---
_id: '22562'
article_number: '9215'
author:
- first_name: Xia
  full_name: Wu, Xia
  last_name: Wu
- first_name: Maren
  full_name: Muntzeck, Maren
  last_name: Muntzeck
- first_name: Maria Teresa
  full_name: de los Arcos de Pedro, Maria Teresa
  id: '54556'
  last_name: de los Arcos de Pedro
- first_name: Guido
  full_name: Grundmeier, Guido
  id: '194'
  last_name: Grundmeier
- first_name: René
  full_name: Wilhelm, René
  last_name: Wilhelm
- first_name: Thorsten
  full_name: Wagner, Thorsten
  last_name: Wagner
citation:
  ama: Wu X, Muntzeck M, de los Arcos de Pedro MT, Grundmeier G, Wilhelm R, Wagner
    T. Determination of the refractive indices of ionic liquids by ellipsometry, and
    their application as immersion liquids. <i>Applied Optics</i>. Published online
    2018. doi:<a href="https://doi.org/10.1364/ao.57.009215">10.1364/ao.57.009215</a>
  apa: Wu, X., Muntzeck, M., de los Arcos de Pedro, M. T., Grundmeier, G., Wilhelm,
    R., &#38; Wagner, T. (2018). Determination of the refractive indices of ionic
    liquids by ellipsometry, and their application as immersion liquids. <i>Applied
    Optics</i>, Article 9215. <a href="https://doi.org/10.1364/ao.57.009215">https://doi.org/10.1364/ao.57.009215</a>
  bibtex: '@article{Wu_Muntzeck_de los Arcos de Pedro_Grundmeier_Wilhelm_Wagner_2018,
    title={Determination of the refractive indices of ionic liquids by ellipsometry,
    and their application as immersion liquids}, DOI={<a href="https://doi.org/10.1364/ao.57.009215">10.1364/ao.57.009215</a>},
    number={9215}, journal={Applied Optics}, author={Wu, Xia and Muntzeck, Maren and
    de los Arcos de Pedro, Maria Teresa and Grundmeier, Guido and Wilhelm, René and
    Wagner, Thorsten}, year={2018} }'
  chicago: Wu, Xia, Maren Muntzeck, Maria Teresa de los Arcos de Pedro, Guido Grundmeier,
    René Wilhelm, and Thorsten Wagner. “Determination of the Refractive Indices of
    Ionic Liquids by Ellipsometry, and Their Application as Immersion Liquids.” <i>Applied
    Optics</i>, 2018. <a href="https://doi.org/10.1364/ao.57.009215">https://doi.org/10.1364/ao.57.009215</a>.
  ieee: 'X. Wu, M. Muntzeck, M. T. de los Arcos de Pedro, G. Grundmeier, R. Wilhelm,
    and T. Wagner, “Determination of the refractive indices of ionic liquids by ellipsometry,
    and their application as immersion liquids,” <i>Applied Optics</i>, Art. no. 9215,
    2018, doi: <a href="https://doi.org/10.1364/ao.57.009215">10.1364/ao.57.009215</a>.'
  mla: Wu, Xia, et al. “Determination of the Refractive Indices of Ionic Liquids by
    Ellipsometry, and Their Application as Immersion Liquids.” <i>Applied Optics</i>,
    9215, 2018, doi:<a href="https://doi.org/10.1364/ao.57.009215">10.1364/ao.57.009215</a>.
  short: X. Wu, M. Muntzeck, M.T. de los Arcos de Pedro, G. Grundmeier, R. Wilhelm,
    T. Wagner, Applied Optics (2018).
date_created: 2021-07-07T09:05:36Z
date_updated: 2023-01-24T08:11:01Z
department:
- _id: '302'
doi: 10.1364/ao.57.009215
language:
- iso: eng
publication: Applied Optics
publication_identifier:
  issn:
  - 1559-128X
  - 2155-3165
publication_status: published
status: public
title: Determination of the refractive indices of ionic liquids by ellipsometry, and
  their application as immersion liquids
type: journal_article
user_id: '54556'
year: '2018'
...
---
_id: '22540'
abstract:
- lang: eng
  text: <p>Development of two new neodymium containing precursors and their successful
    implementation in the MOCVD of luminescent Nd<sub>2</sub>S<sub>3</sub> thin films.</p>
author:
- first_name: Stefan
  full_name: Cwik, Stefan
  last_name: Cwik
- first_name: Sebastian M. J.
  full_name: Beer, Sebastian M. J.
  last_name: Beer
- first_name: Marcel
  full_name: Schmidt, Marcel
  last_name: Schmidt
- first_name: Nils C.
  full_name: Gerhardt, Nils C.
  last_name: Gerhardt
- first_name: Maria Teresa
  full_name: de los Arcos de Pedro, Maria Teresa
  id: '54556'
  last_name: de los Arcos de Pedro
- first_name: Detlef
  full_name: Rogalla, Detlef
  last_name: Rogalla
- first_name: Jana
  full_name: Weßing, Jana
  last_name: Weßing
- first_name: Ignacio
  full_name: Giner, Ignacio
  last_name: Giner
- first_name: Martin
  full_name: Hofmann, Martin
  last_name: Hofmann
- first_name: Guido
  full_name: Grundmeier, Guido
  id: '194'
  last_name: Grundmeier
- first_name: Andreas D.
  full_name: Wieck, Andreas D.
  last_name: Wieck
- first_name: Anjana
  full_name: Devi, Anjana
  last_name: Devi
citation:
  ama: 'Cwik S, Beer SMJ, Schmidt M, et al. Luminescent Nd2S3 thin films: a new chemical
    vapour deposition route towards rare-earth sulphides. <i>Dalton Transactions</i>.
    Published online 2018:2926-2938. doi:<a href="https://doi.org/10.1039/c8dt04317e">10.1039/c8dt04317e</a>'
  apa: 'Cwik, S., Beer, S. M. J., Schmidt, M., Gerhardt, N. C., de los Arcos de Pedro,
    M. T., Rogalla, D., Weßing, J., Giner, I., Hofmann, M., Grundmeier, G., Wieck,
    A. D., &#38; Devi, A. (2018). Luminescent Nd2S3 thin films: a new chemical vapour
    deposition route towards rare-earth sulphides. <i>Dalton Transactions</i>, 2926–2938.
    <a href="https://doi.org/10.1039/c8dt04317e">https://doi.org/10.1039/c8dt04317e</a>'
  bibtex: '@article{Cwik_Beer_Schmidt_Gerhardt_de los Arcos de Pedro_Rogalla_Weßing_Giner_Hofmann_Grundmeier_et
    al._2018, title={Luminescent Nd2S3 thin films: a new chemical vapour deposition
    route towards rare-earth sulphides}, DOI={<a href="https://doi.org/10.1039/c8dt04317e">10.1039/c8dt04317e</a>},
    journal={Dalton Transactions}, author={Cwik, Stefan and Beer, Sebastian M. J.
    and Schmidt, Marcel and Gerhardt, Nils C. and de los Arcos de Pedro, Maria Teresa
    and Rogalla, Detlef and Weßing, Jana and Giner, Ignacio and Hofmann, Martin and
    Grundmeier, Guido and et al.}, year={2018}, pages={2926–2938} }'
  chicago: 'Cwik, Stefan, Sebastian M. J. Beer, Marcel Schmidt, Nils C. Gerhardt,
    Maria Teresa de los Arcos de Pedro, Detlef Rogalla, Jana Weßing, et al. “Luminescent
    Nd2S3 Thin Films: A New Chemical Vapour Deposition Route towards Rare-Earth Sulphides.”
    <i>Dalton Transactions</i>, 2018, 2926–38. <a href="https://doi.org/10.1039/c8dt04317e">https://doi.org/10.1039/c8dt04317e</a>.'
  ieee: 'S. Cwik <i>et al.</i>, “Luminescent Nd2S3 thin films: a new chemical vapour
    deposition route towards rare-earth sulphides,” <i>Dalton Transactions</i>, pp.
    2926–2938, 2018, doi: <a href="https://doi.org/10.1039/c8dt04317e">10.1039/c8dt04317e</a>.'
  mla: 'Cwik, Stefan, et al. “Luminescent Nd2S3 Thin Films: A New Chemical Vapour
    Deposition Route towards Rare-Earth Sulphides.” <i>Dalton Transactions</i>, 2018,
    pp. 2926–38, doi:<a href="https://doi.org/10.1039/c8dt04317e">10.1039/c8dt04317e</a>.'
  short: S. Cwik, S.M.J. Beer, M. Schmidt, N.C. Gerhardt, M.T. de los Arcos de Pedro,
    D. Rogalla, J. Weßing, I. Giner, M. Hofmann, G. Grundmeier, A.D. Wieck, A. Devi,
    Dalton Transactions (2018) 2926–2938.
date_created: 2021-07-07T08:40:12Z
date_updated: 2023-01-24T08:35:36Z
department:
- _id: '302'
doi: 10.1039/c8dt04317e
language:
- iso: eng
page: 2926-2938
publication: Dalton Transactions
publication_identifier:
  issn:
  - 1477-9226
  - 1477-9234
publication_status: published
status: public
title: 'Luminescent Nd2S3 thin films: a new chemical vapour deposition route towards
  rare-earth sulphides'
type: journal_article
user_id: '54556'
year: '2018'
...
---
_id: '22542'
author:
- first_name: Dennis
  full_name: Kirchheim, Dennis
  last_name: Kirchheim
- first_name: Stefan
  full_name: Wilski, Stefan
  last_name: Wilski
- first_name: Montgomery
  full_name: Jaritz, Montgomery
  last_name: Jaritz
- first_name: Felix
  full_name: Mitschker, Felix
  last_name: Mitschker
- first_name: Moritz
  full_name: Oberberg, Moritz
  last_name: Oberberg
- first_name: Jan
  full_name: Trieschmann, Jan
  last_name: Trieschmann
- first_name: Lars
  full_name: Banko, Lars
  last_name: Banko
- first_name: Markus
  full_name: Brochhagen, Markus
  last_name: Brochhagen
- first_name: Rabea
  full_name: Schreckenberg, Rabea
  last_name: Schreckenberg
- first_name: Christian
  full_name: Hopmann, Christian
  last_name: Hopmann
- first_name: Marc
  full_name: Böke, Marc
  last_name: Böke
- first_name: Jan
  full_name: Benedikt, Jan
  last_name: Benedikt
- first_name: Maria Teresa
  full_name: de los Arcos de Pedro, Maria Teresa
  id: '54556'
  last_name: de los Arcos de Pedro
- first_name: Guido
  full_name: Grundmeier, Guido
  id: '194'
  last_name: Grundmeier
- first_name: Dario
  full_name: Grochla, Dario
  last_name: Grochla
- first_name: Alfred
  full_name: Ludwig, Alfred
  last_name: Ludwig
- first_name: Thomas
  full_name: Mussenbrock, Thomas
  last_name: Mussenbrock
- first_name: Ralf Peter
  full_name: Brinkmann, Ralf Peter
  last_name: Brinkmann
- first_name: Peter
  full_name: Awakowicz, Peter
  last_name: Awakowicz
- first_name: Rainer
  full_name: Dahlmann, Rainer
  last_name: Dahlmann
citation:
  ama: Kirchheim D, Wilski S, Jaritz M, et al. Improved homogeneity of plasma and
    coating properties using a lance matrix gas distribution in MW-PECVD. <i>Journal
    of Coatings Technology and Research</i>. Published online 2018:573-583. doi:<a
    href="https://doi.org/10.1007/s11998-018-0138-4">10.1007/s11998-018-0138-4</a>
  apa: Kirchheim, D., Wilski, S., Jaritz, M., Mitschker, F., Oberberg, M., Trieschmann,
    J., Banko, L., Brochhagen, M., Schreckenberg, R., Hopmann, C., Böke, M., Benedikt,
    J., de los Arcos de Pedro, M. T., Grundmeier, G., Grochla, D., Ludwig, A., Mussenbrock,
    T., Brinkmann, R. P., Awakowicz, P., &#38; Dahlmann, R. (2018). Improved homogeneity
    of plasma and coating properties using a lance matrix gas distribution in MW-PECVD.
    <i>Journal of Coatings Technology and Research</i>, 573–583. <a href="https://doi.org/10.1007/s11998-018-0138-4">https://doi.org/10.1007/s11998-018-0138-4</a>
  bibtex: '@article{Kirchheim_Wilski_Jaritz_Mitschker_Oberberg_Trieschmann_Banko_Brochhagen_Schreckenberg_Hopmann_et
    al._2018, title={Improved homogeneity of plasma and coating properties using a
    lance matrix gas distribution in MW-PECVD}, DOI={<a href="https://doi.org/10.1007/s11998-018-0138-4">10.1007/s11998-018-0138-4</a>},
    journal={Journal of Coatings Technology and Research}, author={Kirchheim, Dennis
    and Wilski, Stefan and Jaritz, Montgomery and Mitschker, Felix and Oberberg, Moritz
    and Trieschmann, Jan and Banko, Lars and Brochhagen, Markus and Schreckenberg,
    Rabea and Hopmann, Christian and et al.}, year={2018}, pages={573–583} }'
  chicago: Kirchheim, Dennis, Stefan Wilski, Montgomery Jaritz, Felix Mitschker, Moritz
    Oberberg, Jan Trieschmann, Lars Banko, et al. “Improved Homogeneity of Plasma
    and Coating Properties Using a Lance Matrix Gas Distribution in MW-PECVD.” <i>Journal
    of Coatings Technology and Research</i>, 2018, 573–83. <a href="https://doi.org/10.1007/s11998-018-0138-4">https://doi.org/10.1007/s11998-018-0138-4</a>.
  ieee: 'D. Kirchheim <i>et al.</i>, “Improved homogeneity of plasma and coating properties
    using a lance matrix gas distribution in MW-PECVD,” <i>Journal of Coatings Technology
    and Research</i>, pp. 573–583, 2018, doi: <a href="https://doi.org/10.1007/s11998-018-0138-4">10.1007/s11998-018-0138-4</a>.'
  mla: Kirchheim, Dennis, et al. “Improved Homogeneity of Plasma and Coating Properties
    Using a Lance Matrix Gas Distribution in MW-PECVD.” <i>Journal of Coatings Technology
    and Research</i>, 2018, pp. 573–83, doi:<a href="https://doi.org/10.1007/s11998-018-0138-4">10.1007/s11998-018-0138-4</a>.
  short: D. Kirchheim, S. Wilski, M. Jaritz, F. Mitschker, M. Oberberg, J. Trieschmann,
    L. Banko, M. Brochhagen, R. Schreckenberg, C. Hopmann, M. Böke, J. Benedikt, M.T.
    de los Arcos de Pedro, G. Grundmeier, D. Grochla, A. Ludwig, T. Mussenbrock, R.P.
    Brinkmann, P. Awakowicz, R. Dahlmann, Journal of Coatings Technology and Research
    (2018) 573–583.
date_created: 2021-07-07T08:41:15Z
date_updated: 2023-01-24T08:36:23Z
department:
- _id: '302'
doi: 10.1007/s11998-018-0138-4
language:
- iso: eng
page: 573-583
publication: Journal of Coatings Technology and Research
publication_identifier:
  issn:
  - 1547-0091
  - 1935-3804
publication_status: published
status: public
title: Improved homogeneity of plasma and coating properties using a lance matrix
  gas distribution in MW-PECVD
type: journal_article
user_id: '54556'
year: '2018'
...
---
_id: '22546'
article_number: '1801540'
author:
- first_name: David
  full_name: Zanders, David
  last_name: Zanders
- first_name: Engin
  full_name: Ciftyurek, Engin
  last_name: Ciftyurek
- first_name: Christian
  full_name: Hoppe, Christian
  last_name: Hoppe
- first_name: Maria Teresa
  full_name: de los Arcos de Pedro, Maria Teresa
  id: '54556'
  last_name: de los Arcos de Pedro
- first_name: Aleksander
  full_name: Kostka, Aleksander
  last_name: Kostka
- first_name: Detlef
  full_name: Rogalla, Detlef
  last_name: Rogalla
- first_name: Guido
  full_name: Grundmeier, Guido
  id: '194'
  last_name: Grundmeier
- first_name: Klaus Dieter
  full_name: Schierbaum, Klaus Dieter
  last_name: Schierbaum
- first_name: Anjana
  full_name: Devi, Anjana
  last_name: Devi
citation:
  ama: 'Zanders D, Ciftyurek E, Hoppe C, et al. Validation of a Terminally Amino Functionalized
    Tetra‐Alkyl Sn(IV) Precursor in Metal–Organic Chemical Vapor Deposition of SnO 
              2            Thin Films: Study of Film Growth Characteristics, Optical,
    and Electrical Properties. <i>Advanced Materials Interfaces</i>. Published online
    2018. doi:<a href="https://doi.org/10.1002/admi.201801540">10.1002/admi.201801540</a>'
  apa: 'Zanders, D., Ciftyurek, E., Hoppe, C., de los Arcos de Pedro, M. T., Kostka,
    A., Rogalla, D., Grundmeier, G., Schierbaum, K. D., &#38; Devi, A. (2018). Validation
    of a Terminally Amino Functionalized Tetra‐Alkyl Sn(IV) Precursor in Metal–Organic
    Chemical Vapor Deposition of SnO            2            Thin Films: Study of
    Film Growth Characteristics, Optical, and Electrical Properties. <i>Advanced Materials
    Interfaces</i>, Article 1801540. <a href="https://doi.org/10.1002/admi.201801540">https://doi.org/10.1002/admi.201801540</a>'
  bibtex: '@article{Zanders_Ciftyurek_Hoppe_de los Arcos de Pedro_Kostka_Rogalla_Grundmeier_Schierbaum_Devi_2018,
    title={Validation of a Terminally Amino Functionalized Tetra‐Alkyl Sn(IV) Precursor
    in Metal–Organic Chemical Vapor Deposition of SnO            2            Thin
    Films: Study of Film Growth Characteristics, Optical, and Electrical Properties},
    DOI={<a href="https://doi.org/10.1002/admi.201801540">10.1002/admi.201801540</a>},
    number={1801540}, journal={Advanced Materials Interfaces}, author={Zanders, David
    and Ciftyurek, Engin and Hoppe, Christian and de los Arcos de Pedro, Maria Teresa
    and Kostka, Aleksander and Rogalla, Detlef and Grundmeier, Guido and Schierbaum,
    Klaus Dieter and Devi, Anjana}, year={2018} }'
  chicago: 'Zanders, David, Engin Ciftyurek, Christian Hoppe, Maria Teresa de los
    Arcos de Pedro, Aleksander Kostka, Detlef Rogalla, Guido Grundmeier, Klaus Dieter
    Schierbaum, and Anjana Devi. “Validation of a Terminally Amino Functionalized
    Tetra‐Alkyl Sn(IV) Precursor in Metal–Organic Chemical Vapor Deposition of SnO 
              2            Thin Films: Study of Film Growth Characteristics, Optical,
    and Electrical Properties.” <i>Advanced Materials Interfaces</i>, 2018. <a href="https://doi.org/10.1002/admi.201801540">https://doi.org/10.1002/admi.201801540</a>.'
  ieee: 'D. Zanders <i>et al.</i>, “Validation of a Terminally Amino Functionalized
    Tetra‐Alkyl Sn(IV) Precursor in Metal–Organic Chemical Vapor Deposition of SnO 
              2            Thin Films: Study of Film Growth Characteristics, Optical,
    and Electrical Properties,” <i>Advanced Materials Interfaces</i>, Art. no. 1801540,
    2018, doi: <a href="https://doi.org/10.1002/admi.201801540">10.1002/admi.201801540</a>.'
  mla: 'Zanders, David, et al. “Validation of a Terminally Amino Functionalized Tetra‐Alkyl
    Sn(IV) Precursor in Metal–Organic Chemical Vapor Deposition of SnO           
    2            Thin Films: Study of Film Growth Characteristics, Optical, and Electrical
    Properties.” <i>Advanced Materials Interfaces</i>, 1801540, 2018, doi:<a href="https://doi.org/10.1002/admi.201801540">10.1002/admi.201801540</a>.'
  short: D. Zanders, E. Ciftyurek, C. Hoppe, M.T. de los Arcos de Pedro, A. Kostka,
    D. Rogalla, G. Grundmeier, K.D. Schierbaum, A. Devi, Advanced Materials Interfaces
    (2018).
date_created: 2021-07-07T08:50:07Z
date_updated: 2023-01-24T08:36:44Z
department:
- _id: '302'
doi: 10.1002/admi.201801540
language:
- iso: eng
publication: Advanced Materials Interfaces
publication_identifier:
  issn:
  - 2196-7350
  - 2196-7350
publication_status: published
status: public
title: 'Validation of a Terminally Amino Functionalized Tetra‐Alkyl Sn(IV) Precursor
  in Metal–Organic Chemical Vapor Deposition of SnO            2            Thin Films:
  Study of Film Growth Characteristics, Optical, and Electrical Properties'
type: journal_article
user_id: '54556'
year: '2018'
...
---
_id: '22550'
author:
- first_name: Maximilian
  full_name: Gebhard, Maximilian
  last_name: Gebhard
- first_name: Lukas
  full_name: Mai, Lukas
  last_name: Mai
- first_name: Lars
  full_name: Banko, Lars
  last_name: Banko
- first_name: Felix
  full_name: Mitschker, Felix
  last_name: Mitschker
- first_name: Christian
  full_name: Hoppe, Christian
  last_name: Hoppe
- first_name: Montgomery
  full_name: Jaritz, Montgomery
  last_name: Jaritz
- first_name: Dennis
  full_name: Kirchheim, Dennis
  last_name: Kirchheim
- first_name: Christoph
  full_name: Zekorn, Christoph
  last_name: Zekorn
- first_name: Maria Teresa
  full_name: de los Arcos de Pedro, Maria Teresa
  id: '54556'
  last_name: de los Arcos de Pedro
- first_name: Dario
  full_name: Grochla, Dario
  last_name: Grochla
- first_name: Rainer
  full_name: Dahlmann, Rainer
  last_name: Dahlmann
- first_name: Guido
  full_name: Grundmeier, Guido
  id: '194'
  last_name: Grundmeier
- first_name: Peter
  full_name: Awakowicz, Peter
  last_name: Awakowicz
- first_name: Alfred
  full_name: Ludwig, Alfred
  last_name: Ludwig
- first_name: Anjana
  full_name: Devi, Anjana
  last_name: Devi
citation:
  ama: 'Gebhard M, Mai L, Banko L, et al. PEALD of SiO2 and Al2O3 Thin Films on Polypropylene:
    Investigations of the Film Growth at the Interface, Stress, and Gas Barrier Properties
    of Dyads. <i>ACS Applied Materials &#38; Interfaces</i>. Published online 2018:7422-7434.
    doi:<a href="https://doi.org/10.1021/acsami.7b14916">10.1021/acsami.7b14916</a>'
  apa: 'Gebhard, M., Mai, L., Banko, L., Mitschker, F., Hoppe, C., Jaritz, M., Kirchheim,
    D., Zekorn, C., de los Arcos de Pedro, M. T., Grochla, D., Dahlmann, R., Grundmeier,
    G., Awakowicz, P., Ludwig, A., &#38; Devi, A. (2018). PEALD of SiO2 and Al2O3
    Thin Films on Polypropylene: Investigations of the Film Growth at the Interface,
    Stress, and Gas Barrier Properties of Dyads. <i>ACS Applied Materials &#38; Interfaces</i>,
    7422–7434. <a href="https://doi.org/10.1021/acsami.7b14916">https://doi.org/10.1021/acsami.7b14916</a>'
  bibtex: '@article{Gebhard_Mai_Banko_Mitschker_Hoppe_Jaritz_Kirchheim_Zekorn_de los
    Arcos de Pedro_Grochla_et al._2018, title={PEALD of SiO2 and Al2O3 Thin Films
    on Polypropylene: Investigations of the Film Growth at the Interface, Stress,
    and Gas Barrier Properties of Dyads}, DOI={<a href="https://doi.org/10.1021/acsami.7b14916">10.1021/acsami.7b14916</a>},
    journal={ACS Applied Materials &#38; Interfaces}, author={Gebhard, Maximilian
    and Mai, Lukas and Banko, Lars and Mitschker, Felix and Hoppe, Christian and Jaritz,
    Montgomery and Kirchheim, Dennis and Zekorn, Christoph and de los Arcos de Pedro,
    Maria Teresa and Grochla, Dario and et al.}, year={2018}, pages={7422–7434} }'
  chicago: 'Gebhard, Maximilian, Lukas Mai, Lars Banko, Felix Mitschker, Christian
    Hoppe, Montgomery Jaritz, Dennis Kirchheim, et al. “PEALD of SiO2 and Al2O3 Thin
    Films on Polypropylene: Investigations of the Film Growth at the Interface, Stress,
    and Gas Barrier Properties of Dyads.” <i>ACS Applied Materials &#38; Interfaces</i>,
    2018, 7422–34. <a href="https://doi.org/10.1021/acsami.7b14916">https://doi.org/10.1021/acsami.7b14916</a>.'
  ieee: 'M. Gebhard <i>et al.</i>, “PEALD of SiO2 and Al2O3 Thin Films on Polypropylene:
    Investigations of the Film Growth at the Interface, Stress, and Gas Barrier Properties
    of Dyads,” <i>ACS Applied Materials &#38; Interfaces</i>, pp. 7422–7434, 2018,
    doi: <a href="https://doi.org/10.1021/acsami.7b14916">10.1021/acsami.7b14916</a>.'
  mla: 'Gebhard, Maximilian, et al. “PEALD of SiO2 and Al2O3 Thin Films on Polypropylene:
    Investigations of the Film Growth at the Interface, Stress, and Gas Barrier Properties
    of Dyads.” <i>ACS Applied Materials &#38; Interfaces</i>, 2018, pp. 7422–34, doi:<a
    href="https://doi.org/10.1021/acsami.7b14916">10.1021/acsami.7b14916</a>.'
  short: M. Gebhard, L. Mai, L. Banko, F. Mitschker, C. Hoppe, M. Jaritz, D. Kirchheim,
    C. Zekorn, M.T. de los Arcos de Pedro, D. Grochla, R. Dahlmann, G. Grundmeier,
    P. Awakowicz, A. Ludwig, A. Devi, ACS Applied Materials &#38; Interfaces (2018)
    7422–7434.
date_created: 2021-07-07T08:59:20Z
date_updated: 2023-01-24T08:38:00Z
department:
- _id: '302'
doi: 10.1021/acsami.7b14916
language:
- iso: eng
page: 7422-7434
publication: ACS Applied Materials & Interfaces
publication_identifier:
  issn:
  - 1944-8244
  - 1944-8252
publication_status: published
status: public
title: 'PEALD of SiO2 and Al2O3 Thin Films on Polypropylene: Investigations of the
  Film Growth at the Interface, Stress, and Gas Barrier Properties of Dyads'
type: journal_article
user_id: '54556'
year: '2018'
...
---
_id: '22549'
author:
- first_name: Maximilian
  full_name: Gebhard, Maximilian
  last_name: Gebhard
- first_name: Lukas
  full_name: Mai, Lukas
  last_name: Mai
- first_name: Lars
  full_name: Banko, Lars
  last_name: Banko
- first_name: Felix
  full_name: Mitschker, Felix
  last_name: Mitschker
- first_name: Christian
  full_name: Hoppe, Christian
  last_name: Hoppe
- first_name: Montgomery
  full_name: Jaritz, Montgomery
  last_name: Jaritz
- first_name: Dennis
  full_name: Kirchheim, Dennis
  last_name: Kirchheim
- first_name: Christoph
  full_name: Zekorn, Christoph
  last_name: Zekorn
- first_name: Maria Teresa
  full_name: de los Arcos de Pedro, Maria Teresa
  id: '54556'
  last_name: de los Arcos de Pedro
- first_name: Dario
  full_name: Grochla, Dario
  last_name: Grochla
- first_name: Rainer
  full_name: Dahlmann, Rainer
  last_name: Dahlmann
- first_name: Guido
  full_name: Grundmeier, Guido
  id: '194'
  last_name: Grundmeier
- first_name: Peter
  full_name: Awakowicz, Peter
  last_name: Awakowicz
- first_name: Alfred
  full_name: Ludwig, Alfred
  last_name: Ludwig
- first_name: Anjana
  full_name: Devi, Anjana
  last_name: Devi
citation:
  ama: 'Gebhard M, Mai L, Banko L, et al. PEALD of SiO2 and Al2O3 Thin Films on Polypropylene:
    Investigations of the Film Growth at the Interface, Stress, and Gas Barrier Properties
    of Dyads. <i>ACS Applied Materials &#38; Interfaces</i>. Published online 2018:7422-7434.
    doi:<a href="https://doi.org/10.1021/acsami.7b14916">10.1021/acsami.7b14916</a>'
  apa: 'Gebhard, M., Mai, L., Banko, L., Mitschker, F., Hoppe, C., Jaritz, M., Kirchheim,
    D., Zekorn, C., de los Arcos de Pedro, M. T., Grochla, D., Dahlmann, R., Grundmeier,
    G., Awakowicz, P., Ludwig, A., &#38; Devi, A. (2018). PEALD of SiO2 and Al2O3
    Thin Films on Polypropylene: Investigations of the Film Growth at the Interface,
    Stress, and Gas Barrier Properties of Dyads. <i>ACS Applied Materials &#38; Interfaces</i>,
    7422–7434. <a href="https://doi.org/10.1021/acsami.7b14916">https://doi.org/10.1021/acsami.7b14916</a>'
  bibtex: '@article{Gebhard_Mai_Banko_Mitschker_Hoppe_Jaritz_Kirchheim_Zekorn_de los
    Arcos de Pedro_Grochla_et al._2018, title={PEALD of SiO2 and Al2O3 Thin Films
    on Polypropylene: Investigations of the Film Growth at the Interface, Stress,
    and Gas Barrier Properties of Dyads}, DOI={<a href="https://doi.org/10.1021/acsami.7b14916">10.1021/acsami.7b14916</a>},
    journal={ACS Applied Materials &#38; Interfaces}, author={Gebhard, Maximilian
    and Mai, Lukas and Banko, Lars and Mitschker, Felix and Hoppe, Christian and Jaritz,
    Montgomery and Kirchheim, Dennis and Zekorn, Christoph and de los Arcos de Pedro,
    Maria Teresa and Grochla, Dario and et al.}, year={2018}, pages={7422–7434} }'
  chicago: 'Gebhard, Maximilian, Lukas Mai, Lars Banko, Felix Mitschker, Christian
    Hoppe, Montgomery Jaritz, Dennis Kirchheim, et al. “PEALD of SiO2 and Al2O3 Thin
    Films on Polypropylene: Investigations of the Film Growth at the Interface, Stress,
    and Gas Barrier Properties of Dyads.” <i>ACS Applied Materials &#38; Interfaces</i>,
    2018, 7422–34. <a href="https://doi.org/10.1021/acsami.7b14916">https://doi.org/10.1021/acsami.7b14916</a>.'
  ieee: 'M. Gebhard <i>et al.</i>, “PEALD of SiO2 and Al2O3 Thin Films on Polypropylene:
    Investigations of the Film Growth at the Interface, Stress, and Gas Barrier Properties
    of Dyads,” <i>ACS Applied Materials &#38; Interfaces</i>, pp. 7422–7434, 2018,
    doi: <a href="https://doi.org/10.1021/acsami.7b14916">10.1021/acsami.7b14916</a>.'
  mla: 'Gebhard, Maximilian, et al. “PEALD of SiO2 and Al2O3 Thin Films on Polypropylene:
    Investigations of the Film Growth at the Interface, Stress, and Gas Barrier Properties
    of Dyads.” <i>ACS Applied Materials &#38; Interfaces</i>, 2018, pp. 7422–34, doi:<a
    href="https://doi.org/10.1021/acsami.7b14916">10.1021/acsami.7b14916</a>.'
  short: M. Gebhard, L. Mai, L. Banko, F. Mitschker, C. Hoppe, M. Jaritz, D. Kirchheim,
    C. Zekorn, M.T. de los Arcos de Pedro, D. Grochla, R. Dahlmann, G. Grundmeier,
    P. Awakowicz, A. Ludwig, A. Devi, ACS Applied Materials &#38; Interfaces (2018)
    7422–7434.
date_created: 2021-07-07T08:59:10Z
date_updated: 2023-01-24T08:37:41Z
department:
- _id: '302'
doi: 10.1021/acsami.7b14916
language:
- iso: eng
page: 7422-7434
publication: ACS Applied Materials & Interfaces
publication_identifier:
  issn:
  - 1944-8244
  - 1944-8252
publication_status: published
status: public
title: 'PEALD of SiO2 and Al2O3 Thin Films on Polypropylene: Investigations of the
  Film Growth at the Interface, Stress, and Gas Barrier Properties of Dyads'
type: journal_article
user_id: '54556'
year: '2018'
...
---
_id: '22551'
author:
- first_name: Maximilian
  full_name: Gebhard, Maximilian
  last_name: Gebhard
- first_name: Lukas
  full_name: Mai, Lukas
  last_name: Mai
- first_name: Lars
  full_name: Banko, Lars
  last_name: Banko
- first_name: Felix
  full_name: Mitschker, Felix
  last_name: Mitschker
- first_name: Christian
  full_name: Hoppe, Christian
  last_name: Hoppe
- first_name: Montgomery
  full_name: Jaritz, Montgomery
  last_name: Jaritz
- first_name: Dennis
  full_name: Kirchheim, Dennis
  last_name: Kirchheim
- first_name: Christoph
  full_name: Zekorn, Christoph
  last_name: Zekorn
- first_name: Maria Teresa
  full_name: de los Arcos de Pedro, Maria Teresa
  id: '54556'
  last_name: de los Arcos de Pedro
- first_name: Dario
  full_name: Grochla, Dario
  last_name: Grochla
- first_name: Rainer
  full_name: Dahlmann, Rainer
  last_name: Dahlmann
- first_name: Guido
  full_name: Grundmeier, Guido
  id: '194'
  last_name: Grundmeier
- first_name: Peter
  full_name: Awakowicz, Peter
  last_name: Awakowicz
- first_name: Alfred
  full_name: Ludwig, Alfred
  last_name: Ludwig
- first_name: Anjana
  full_name: Devi, Anjana
  last_name: Devi
citation:
  ama: 'Gebhard M, Mai L, Banko L, et al. PEALD of SiO2 and Al2O3 Thin Films on Polypropylene:
    Investigations of the Film Growth at the Interface, Stress, and Gas Barrier Properties
    of Dyads. <i>ACS Applied Materials &#38; Interfaces</i>. Published online 2018:7422-7434.
    doi:<a href="https://doi.org/10.1021/acsami.7b14916">10.1021/acsami.7b14916</a>'
  apa: 'Gebhard, M., Mai, L., Banko, L., Mitschker, F., Hoppe, C., Jaritz, M., Kirchheim,
    D., Zekorn, C., de los Arcos de Pedro, M. T., Grochla, D., Dahlmann, R., Grundmeier,
    G., Awakowicz, P., Ludwig, A., &#38; Devi, A. (2018). PEALD of SiO2 and Al2O3
    Thin Films on Polypropylene: Investigations of the Film Growth at the Interface,
    Stress, and Gas Barrier Properties of Dyads. <i>ACS Applied Materials &#38; Interfaces</i>,
    7422–7434. <a href="https://doi.org/10.1021/acsami.7b14916">https://doi.org/10.1021/acsami.7b14916</a>'
  bibtex: '@article{Gebhard_Mai_Banko_Mitschker_Hoppe_Jaritz_Kirchheim_Zekorn_de los
    Arcos de Pedro_Grochla_et al._2018, title={PEALD of SiO2 and Al2O3 Thin Films
    on Polypropylene: Investigations of the Film Growth at the Interface, Stress,
    and Gas Barrier Properties of Dyads}, DOI={<a href="https://doi.org/10.1021/acsami.7b14916">10.1021/acsami.7b14916</a>},
    journal={ACS Applied Materials &#38; Interfaces}, author={Gebhard, Maximilian
    and Mai, Lukas and Banko, Lars and Mitschker, Felix and Hoppe, Christian and Jaritz,
    Montgomery and Kirchheim, Dennis and Zekorn, Christoph and de los Arcos de Pedro,
    Maria Teresa and Grochla, Dario and et al.}, year={2018}, pages={7422–7434} }'
  chicago: 'Gebhard, Maximilian, Lukas Mai, Lars Banko, Felix Mitschker, Christian
    Hoppe, Montgomery Jaritz, Dennis Kirchheim, et al. “PEALD of SiO2 and Al2O3 Thin
    Films on Polypropylene: Investigations of the Film Growth at the Interface, Stress,
    and Gas Barrier Properties of Dyads.” <i>ACS Applied Materials &#38; Interfaces</i>,
    2018, 7422–34. <a href="https://doi.org/10.1021/acsami.7b14916">https://doi.org/10.1021/acsami.7b14916</a>.'
  ieee: 'M. Gebhard <i>et al.</i>, “PEALD of SiO2 and Al2O3 Thin Films on Polypropylene:
    Investigations of the Film Growth at the Interface, Stress, and Gas Barrier Properties
    of Dyads,” <i>ACS Applied Materials &#38; Interfaces</i>, pp. 7422–7434, 2018,
    doi: <a href="https://doi.org/10.1021/acsami.7b14916">10.1021/acsami.7b14916</a>.'
  mla: 'Gebhard, Maximilian, et al. “PEALD of SiO2 and Al2O3 Thin Films on Polypropylene:
    Investigations of the Film Growth at the Interface, Stress, and Gas Barrier Properties
    of Dyads.” <i>ACS Applied Materials &#38; Interfaces</i>, 2018, pp. 7422–34, doi:<a
    href="https://doi.org/10.1021/acsami.7b14916">10.1021/acsami.7b14916</a>.'
  short: M. Gebhard, L. Mai, L. Banko, F. Mitschker, C. Hoppe, M. Jaritz, D. Kirchheim,
    C. Zekorn, M.T. de los Arcos de Pedro, D. Grochla, R. Dahlmann, G. Grundmeier,
    P. Awakowicz, A. Ludwig, A. Devi, ACS Applied Materials &#38; Interfaces (2018)
    7422–7434.
date_created: 2021-07-07T08:59:35Z
date_updated: 2023-01-24T08:38:19Z
department:
- _id: '302'
doi: 10.1021/acsami.7b14916
language:
- iso: eng
page: 7422-7434
publication: ACS Applied Materials & Interfaces
publication_identifier:
  issn:
  - 1944-8244
  - 1944-8252
publication_status: published
status: public
title: 'PEALD of SiO2 and Al2O3 Thin Films on Polypropylene: Investigations of the
  Film Growth at the Interface, Stress, and Gas Barrier Properties of Dyads'
type: journal_article
user_id: '54556'
year: '2018'
...
---
_id: '22548'
author:
- first_name: J.
  full_name: Dietrich, J.
  last_name: Dietrich
- first_name: C.
  full_name: Hoppe, C.
  last_name: Hoppe
- first_name: Maria Teresa
  full_name: de los Arcos de Pedro, Maria Teresa
  id: '54556'
  last_name: de los Arcos de Pedro
- first_name: Guido
  full_name: Grundmeier, Guido
  id: '194'
  last_name: Grundmeier
citation:
  ama: Dietrich J, Hoppe C, de los Arcos de Pedro MT, Grundmeier G. Combined in situ
    infrared reflection absorption spectroscopy-quartz crystal microbalance investigation
    of the initial growth stages of plasma-deposited SiO                         
      x                         on polypropylene. <i>Contributions to Plasma Physics</i>.
    Published online 2018:377-383. doi:<a href="https://doi.org/10.1002/ctpp.201700036">10.1002/ctpp.201700036</a>
  apa: Dietrich, J., Hoppe, C., de los Arcos de Pedro, M. T., &#38; Grundmeier, G.
    (2018). Combined in situ infrared reflection absorption spectroscopy-quartz crystal
    microbalance investigation of the initial growth stages of plasma-deposited SiO 
                              x                         on polypropylene. <i>Contributions
    to Plasma Physics</i>, 377–383. <a href="https://doi.org/10.1002/ctpp.201700036">https://doi.org/10.1002/ctpp.201700036</a>
  bibtex: '@article{Dietrich_Hoppe_de los Arcos de Pedro_Grundmeier_2018, title={Combined
    in situ infrared reflection absorption spectroscopy-quartz crystal microbalance
    investigation of the initial growth stages of plasma-deposited SiO           
                    x                         on polypropylene}, DOI={<a href="https://doi.org/10.1002/ctpp.201700036">10.1002/ctpp.201700036</a>},
    journal={Contributions to Plasma Physics}, author={Dietrich, J. and Hoppe, C.
    and de los Arcos de Pedro, Maria Teresa and Grundmeier, Guido}, year={2018}, pages={377–383}
    }'
  chicago: Dietrich, J., C. Hoppe, Maria Teresa de los Arcos de Pedro, and Guido Grundmeier.
    “Combined in Situ Infrared Reflection Absorption Spectroscopy-Quartz Crystal Microbalance
    Investigation of the Initial Growth Stages of Plasma-Deposited SiO           
                    x                         on Polypropylene.” <i>Contributions
    to Plasma Physics</i>, 2018, 377–83. <a href="https://doi.org/10.1002/ctpp.201700036">https://doi.org/10.1002/ctpp.201700036</a>.
  ieee: 'J. Dietrich, C. Hoppe, M. T. de los Arcos de Pedro, and G. Grundmeier, “Combined
    in situ infrared reflection absorption spectroscopy-quartz crystal microbalance
    investigation of the initial growth stages of plasma-deposited SiO           
                    x                         on polypropylene,” <i>Contributions
    to Plasma Physics</i>, pp. 377–383, 2018, doi: <a href="https://doi.org/10.1002/ctpp.201700036">10.1002/ctpp.201700036</a>.'
  mla: Dietrich, J., et al. “Combined in Situ Infrared Reflection Absorption Spectroscopy-Quartz
    Crystal Microbalance Investigation of the Initial Growth Stages of Plasma-Deposited
    SiO                            x                         on Polypropylene.” <i>Contributions
    to Plasma Physics</i>, 2018, pp. 377–83, doi:<a href="https://doi.org/10.1002/ctpp.201700036">10.1002/ctpp.201700036</a>.
  short: J. Dietrich, C. Hoppe, M.T. de los Arcos de Pedro, G. Grundmeier, Contributions
    to Plasma Physics (2018) 377–383.
date_created: 2021-07-07T08:57:20Z
date_updated: 2023-01-24T08:37:20Z
department:
- _id: '302'
doi: 10.1002/ctpp.201700036
language:
- iso: eng
page: 377-383
publication: Contributions to Plasma Physics
publication_identifier:
  issn:
  - 0863-1042
publication_status: published
status: public
title: Combined in situ infrared reflection absorption spectroscopy-quartz crystal
  microbalance investigation of the initial growth stages of plasma-deposited SiO                            x                         on
  polypropylene
type: journal_article
user_id: '54556'
year: '2018'
...
---
_id: '22547'
article_number: '1700230'
author:
- first_name: Maik
  full_name: Budde, Maik
  last_name: Budde
- first_name: Carles
  full_name: Corbella, Carles
  last_name: Corbella
- first_name: Simon
  full_name: Große-Kreul, Simon
  last_name: Große-Kreul
- first_name: Maria Teresa
  full_name: de los Arcos de Pedro, Maria Teresa
  id: '54556'
  last_name: de los Arcos de Pedro
- first_name: Guido
  full_name: Grundmeier, Guido
  id: '194'
  last_name: Grundmeier
- first_name: Achim
  full_name: von Keudell, Achim
  last_name: von Keudell
citation:
  ama: Budde M, Corbella C, Große-Kreul S, de los Arcos de Pedro MT, Grundmeier G,
    von Keudell A. Decoupling of ion- and photon-activation mechanisms in polymer
    surfaces exposed to low-temperature plasmas. <i>Plasma Processes and Polymers</i>.
    Published online 2018. doi:<a href="https://doi.org/10.1002/ppap.201700230">10.1002/ppap.201700230</a>
  apa: Budde, M., Corbella, C., Große-Kreul, S., de los Arcos de Pedro, M. T., Grundmeier,
    G., &#38; von Keudell, A. (2018). Decoupling of ion- and photon-activation mechanisms
    in polymer surfaces exposed to low-temperature plasmas. <i>Plasma Processes and
    Polymers</i>, Article 1700230. <a href="https://doi.org/10.1002/ppap.201700230">https://doi.org/10.1002/ppap.201700230</a>
  bibtex: '@article{Budde_Corbella_Große-Kreul_de los Arcos de Pedro_Grundmeier_von
    Keudell_2018, title={Decoupling of ion- and photon-activation mechanisms in polymer
    surfaces exposed to low-temperature plasmas}, DOI={<a href="https://doi.org/10.1002/ppap.201700230">10.1002/ppap.201700230</a>},
    number={1700230}, journal={Plasma Processes and Polymers}, author={Budde, Maik
    and Corbella, Carles and Große-Kreul, Simon and de los Arcos de Pedro, Maria Teresa
    and Grundmeier, Guido and von Keudell, Achim}, year={2018} }'
  chicago: Budde, Maik, Carles Corbella, Simon Große-Kreul, Maria Teresa de los Arcos
    de Pedro, Guido Grundmeier, and Achim von Keudell. “Decoupling of Ion- and Photon-Activation
    Mechanisms in Polymer Surfaces Exposed to Low-Temperature Plasmas.” <i>Plasma
    Processes and Polymers</i>, 2018. <a href="https://doi.org/10.1002/ppap.201700230">https://doi.org/10.1002/ppap.201700230</a>.
  ieee: 'M. Budde, C. Corbella, S. Große-Kreul, M. T. de los Arcos de Pedro, G. Grundmeier,
    and A. von Keudell, “Decoupling of ion- and photon-activation mechanisms in polymer
    surfaces exposed to low-temperature plasmas,” <i>Plasma Processes and Polymers</i>,
    Art. no. 1700230, 2018, doi: <a href="https://doi.org/10.1002/ppap.201700230">10.1002/ppap.201700230</a>.'
  mla: Budde, Maik, et al. “Decoupling of Ion- and Photon-Activation Mechanisms in
    Polymer Surfaces Exposed to Low-Temperature Plasmas.” <i>Plasma Processes and
    Polymers</i>, 1700230, 2018, doi:<a href="https://doi.org/10.1002/ppap.201700230">10.1002/ppap.201700230</a>.
  short: M. Budde, C. Corbella, S. Große-Kreul, M.T. de los Arcos de Pedro, G. Grundmeier,
    A. von Keudell, Plasma Processes and Polymers (2018).
date_created: 2021-07-07T08:50:38Z
date_updated: 2023-01-24T08:37:01Z
department:
- _id: '302'
doi: 10.1002/ppap.201700230
language:
- iso: eng
publication: Plasma Processes and Polymers
publication_identifier:
  issn:
  - 1612-8850
publication_status: published
status: public
title: Decoupling of ion- and photon-activation mechanisms in polymer surfaces exposed
  to low-temperature plasmas
type: journal_article
user_id: '54556'
year: '2018'
...
---
_id: '22557'
abstract:
- lang: eng
  text: <p>A new water assisted atomic layer deposition (ALD) process was developed
    using the yttrium tris-guanidinate precursor which resulted in device quality
    thin films.</p>
author:
- first_name: Lukas
  full_name: Mai, Lukas
  last_name: Mai
- first_name: Nils
  full_name: Boysen, Nils
  last_name: Boysen
- first_name: Ersoy
  full_name: Subaşı, Ersoy
  last_name: Subaşı
- first_name: Maria Teresa
  full_name: de los Arcos de Pedro, Maria Teresa
  id: '54556'
  last_name: de los Arcos de Pedro
- first_name: Detlef
  full_name: Rogalla, Detlef
  last_name: Rogalla
- first_name: Guido
  full_name: Grundmeier, Guido
  id: '194'
  last_name: Grundmeier
- first_name: Claudia
  full_name: Bock, Claudia
  last_name: Bock
- first_name: Hong-Liang
  full_name: Lu, Hong-Liang
  last_name: Lu
- first_name: Anjana
  full_name: Devi, Anjana
  last_name: Devi
citation:
  ama: 'Mai L, Boysen N, Subaşı E, et al. Water assisted atomic layer deposition of
    yttrium oxide using tris(N,N′-diisopropyl-2-dimethylamido-guanidinato) yttrium(iii):
    process development, film characterization and functional properties. <i>RSC Advances</i>.
    Published online 2018:4987-4994. doi:<a href="https://doi.org/10.1039/c7ra13417g">10.1039/c7ra13417g</a>'
  apa: 'Mai, L., Boysen, N., Subaşı, E., de los Arcos de Pedro, M. T., Rogalla, D.,
    Grundmeier, G., Bock, C., Lu, H.-L., &#38; Devi, A. (2018). Water assisted atomic
    layer deposition of yttrium oxide using tris(N,N′-diisopropyl-2-dimethylamido-guanidinato)
    yttrium(iii): process development, film characterization and functional properties.
    <i>RSC Advances</i>, 4987–4994. <a href="https://doi.org/10.1039/c7ra13417g">https://doi.org/10.1039/c7ra13417g</a>'
  bibtex: '@article{Mai_Boysen_Subaşı_de los Arcos de Pedro_Rogalla_Grundmeier_Bock_Lu_Devi_2018,
    title={Water assisted atomic layer deposition of yttrium oxide using tris(N,N′-diisopropyl-2-dimethylamido-guanidinato)
    yttrium(iii): process development, film characterization and functional properties},
    DOI={<a href="https://doi.org/10.1039/c7ra13417g">10.1039/c7ra13417g</a>}, journal={RSC
    Advances}, author={Mai, Lukas and Boysen, Nils and Subaşı, Ersoy and de los Arcos
    de Pedro, Maria Teresa and Rogalla, Detlef and Grundmeier, Guido and Bock, Claudia
    and Lu, Hong-Liang and Devi, Anjana}, year={2018}, pages={4987–4994} }'
  chicago: 'Mai, Lukas, Nils Boysen, Ersoy Subaşı, Maria Teresa de los Arcos de Pedro,
    Detlef Rogalla, Guido Grundmeier, Claudia Bock, Hong-Liang Lu, and Anjana Devi.
    “Water Assisted Atomic Layer Deposition of Yttrium Oxide Using Tris(N,N′-Diisopropyl-2-Dimethylamido-Guanidinato)
    Yttrium(Iii): Process Development, Film Characterization and Functional Properties.”
    <i>RSC Advances</i>, 2018, 4987–94. <a href="https://doi.org/10.1039/c7ra13417g">https://doi.org/10.1039/c7ra13417g</a>.'
  ieee: 'L. Mai <i>et al.</i>, “Water assisted atomic layer deposition of yttrium
    oxide using tris(N,N′-diisopropyl-2-dimethylamido-guanidinato) yttrium(iii): process
    development, film characterization and functional properties,” <i>RSC Advances</i>,
    pp. 4987–4994, 2018, doi: <a href="https://doi.org/10.1039/c7ra13417g">10.1039/c7ra13417g</a>.'
  mla: 'Mai, Lukas, et al. “Water Assisted Atomic Layer Deposition of Yttrium Oxide
    Using Tris(N,N′-Diisopropyl-2-Dimethylamido-Guanidinato) Yttrium(Iii): Process
    Development, Film Characterization and Functional Properties.” <i>RSC Advances</i>,
    2018, pp. 4987–94, doi:<a href="https://doi.org/10.1039/c7ra13417g">10.1039/c7ra13417g</a>.'
  short: L. Mai, N. Boysen, E. Subaşı, M.T. de los Arcos de Pedro, D. Rogalla, G.
    Grundmeier, C. Bock, H.-L. Lu, A. Devi, RSC Advances (2018) 4987–4994.
date_created: 2021-07-07T09:02:26Z
date_updated: 2023-01-24T08:39:45Z
department:
- _id: '302'
doi: 10.1039/c7ra13417g
language:
- iso: eng
page: 4987-4994
publication: RSC Advances
publication_identifier:
  issn:
  - 2046-2069
publication_status: published
status: public
title: 'Water assisted atomic layer deposition of yttrium oxide using tris(N,N′-diisopropyl-2-dimethylamido-guanidinato)
  yttrium(iii): process development, film characterization and functional properties'
type: journal_article
user_id: '54556'
year: '2018'
...
---
_id: '22558'
article_number: '235201'
author:
- first_name: F
  full_name: Mitschker, F
  last_name: Mitschker
- first_name: L
  full_name: Schücke, L
  last_name: Schücke
- first_name: Ch
  full_name: Hoppe, Ch
  last_name: Hoppe
- first_name: M
  full_name: Jaritz, M
  last_name: Jaritz
- first_name: R
  full_name: Dahlmann, R
  last_name: Dahlmann
- first_name: Maria Teresa
  full_name: de los Arcos de Pedro, Maria Teresa
  id: '54556'
  last_name: de los Arcos de Pedro
- first_name: Ch
  full_name: Hopmann, Ch
  last_name: Hopmann
- first_name: Guido
  full_name: Grundmeier, Guido
  id: '194'
  last_name: Grundmeier
- first_name: P
  full_name: Awakowicz, P
  last_name: Awakowicz
citation:
  ama: 'Mitschker F, Schücke L, Hoppe C, et al. Comparative study on the deposition
    of silicon oxide permeation barrier coatings for polymers using hexamethyldisilazane
    (HMDSN) and hexamethyldisiloxane (HMDSO). <i>Journal of Physics D: Applied Physics</i>.
    Published online 2018. doi:<a href="https://doi.org/10.1088/1361-6463/aac0ab">10.1088/1361-6463/aac0ab</a>'
  apa: 'Mitschker, F., Schücke, L., Hoppe, C., Jaritz, M., Dahlmann, R., de los Arcos
    de Pedro, M. T., Hopmann, C., Grundmeier, G., &#38; Awakowicz, P. (2018). Comparative
    study on the deposition of silicon oxide permeation barrier coatings for polymers
    using hexamethyldisilazane (HMDSN) and hexamethyldisiloxane (HMDSO). <i>Journal
    of Physics D: Applied Physics</i>, Article 235201. <a href="https://doi.org/10.1088/1361-6463/aac0ab">https://doi.org/10.1088/1361-6463/aac0ab</a>'
  bibtex: '@article{Mitschker_Schücke_Hoppe_Jaritz_Dahlmann_de los Arcos de Pedro_Hopmann_Grundmeier_Awakowicz_2018,
    title={Comparative study on the deposition of silicon oxide permeation barrier
    coatings for polymers using hexamethyldisilazane (HMDSN) and hexamethyldisiloxane
    (HMDSO)}, DOI={<a href="https://doi.org/10.1088/1361-6463/aac0ab">10.1088/1361-6463/aac0ab</a>},
    number={235201}, journal={Journal of Physics D: Applied Physics}, author={Mitschker,
    F and Schücke, L and Hoppe, Ch and Jaritz, M and Dahlmann, R and de los Arcos
    de Pedro, Maria Teresa and Hopmann, Ch and Grundmeier, Guido and Awakowicz, P},
    year={2018} }'
  chicago: 'Mitschker, F, L Schücke, Ch Hoppe, M Jaritz, R Dahlmann, Maria Teresa
    de los Arcos de Pedro, Ch Hopmann, Guido Grundmeier, and P Awakowicz. “Comparative
    Study on the Deposition of Silicon Oxide Permeation Barrier Coatings for Polymers
    Using Hexamethyldisilazane (HMDSN) and Hexamethyldisiloxane (HMDSO).” <i>Journal
    of Physics D: Applied Physics</i>, 2018. <a href="https://doi.org/10.1088/1361-6463/aac0ab">https://doi.org/10.1088/1361-6463/aac0ab</a>.'
  ieee: 'F. Mitschker <i>et al.</i>, “Comparative study on the deposition of silicon
    oxide permeation barrier coatings for polymers using hexamethyldisilazane (HMDSN)
    and hexamethyldisiloxane (HMDSO),” <i>Journal of Physics D: Applied Physics</i>,
    Art. no. 235201, 2018, doi: <a href="https://doi.org/10.1088/1361-6463/aac0ab">10.1088/1361-6463/aac0ab</a>.'
  mla: 'Mitschker, F., et al. “Comparative Study on the Deposition of Silicon Oxide
    Permeation Barrier Coatings for Polymers Using Hexamethyldisilazane (HMDSN) and
    Hexamethyldisiloxane (HMDSO).” <i>Journal of Physics D: Applied Physics</i>, 235201,
    2018, doi:<a href="https://doi.org/10.1088/1361-6463/aac0ab">10.1088/1361-6463/aac0ab</a>.'
  short: 'F. Mitschker, L. Schücke, C. Hoppe, M. Jaritz, R. Dahlmann, M.T. de los
    Arcos de Pedro, C. Hopmann, G. Grundmeier, P. Awakowicz, Journal of Physics D:
    Applied Physics (2018).'
date_created: 2021-07-07T09:02:43Z
date_updated: 2023-01-24T08:40:05Z
department:
- _id: '302'
doi: 10.1088/1361-6463/aac0ab
language:
- iso: eng
publication: 'Journal of Physics D: Applied Physics'
publication_identifier:
  issn:
  - 0022-3727
  - 1361-6463
publication_status: published
status: public
title: Comparative study on the deposition of silicon oxide permeation barrier coatings
  for polymers using hexamethyldisilazane (HMDSN) and hexamethyldisiloxane (HMDSO)
type: journal_article
user_id: '54556'
year: '2018'
...
---
_id: '22559'
article_number: '145201'
author:
- first_name: F
  full_name: Mitschker, F
  last_name: Mitschker
- first_name: J
  full_name: Wißing, J
  last_name: Wißing
- first_name: Ch
  full_name: Hoppe, Ch
  last_name: Hoppe
- first_name: Maria Teresa
  full_name: de los Arcos de Pedro, Maria Teresa
  id: '54556'
  last_name: de los Arcos de Pedro
- first_name: Guido
  full_name: Grundmeier, Guido
  id: '194'
  last_name: Grundmeier
- first_name: P
  full_name: Awakowicz, P
  last_name: Awakowicz
citation:
  ama: 'Mitschker F, Wißing J, Hoppe C, de los Arcos de Pedro MT, Grundmeier G, Awakowicz
    P. Influence of average ion energy and atomic oxygen flux per Si atom on the formation
    of silicon oxide permeation barrier coatings on PET. <i>Journal of Physics D:
    Applied Physics</i>. Published online 2018. doi:<a href="https://doi.org/10.1088/1361-6463/aab1dd">10.1088/1361-6463/aab1dd</a>'
  apa: 'Mitschker, F., Wißing, J., Hoppe, C., de los Arcos de Pedro, M. T., Grundmeier,
    G., &#38; Awakowicz, P. (2018). Influence of average ion energy and atomic oxygen
    flux per Si atom on the formation of silicon oxide permeation barrier coatings
    on PET. <i>Journal of Physics D: Applied Physics</i>, Article 145201. <a href="https://doi.org/10.1088/1361-6463/aab1dd">https://doi.org/10.1088/1361-6463/aab1dd</a>'
  bibtex: '@article{Mitschker_Wißing_Hoppe_de los Arcos de Pedro_Grundmeier_Awakowicz_2018,
    title={Influence of average ion energy and atomic oxygen flux per Si atom on the
    formation of silicon oxide permeation barrier coatings on PET}, DOI={<a href="https://doi.org/10.1088/1361-6463/aab1dd">10.1088/1361-6463/aab1dd</a>},
    number={145201}, journal={Journal of Physics D: Applied Physics}, author={Mitschker,
    F and Wißing, J and Hoppe, Ch and de los Arcos de Pedro, Maria Teresa and Grundmeier,
    Guido and Awakowicz, P}, year={2018} }'
  chicago: 'Mitschker, F, J Wißing, Ch Hoppe, Maria Teresa de los Arcos de Pedro,
    Guido Grundmeier, and P Awakowicz. “Influence of Average Ion Energy and Atomic
    Oxygen Flux per Si Atom on the Formation of Silicon Oxide Permeation Barrier Coatings
    on PET.” <i>Journal of Physics D: Applied Physics</i>, 2018. <a href="https://doi.org/10.1088/1361-6463/aab1dd">https://doi.org/10.1088/1361-6463/aab1dd</a>.'
  ieee: 'F. Mitschker, J. Wißing, C. Hoppe, M. T. de los Arcos de Pedro, G. Grundmeier,
    and P. Awakowicz, “Influence of average ion energy and atomic oxygen flux per
    Si atom on the formation of silicon oxide permeation barrier coatings on PET,”
    <i>Journal of Physics D: Applied Physics</i>, Art. no. 145201, 2018, doi: <a href="https://doi.org/10.1088/1361-6463/aab1dd">10.1088/1361-6463/aab1dd</a>.'
  mla: 'Mitschker, F., et al. “Influence of Average Ion Energy and Atomic Oxygen Flux
    per Si Atom on the Formation of Silicon Oxide Permeation Barrier Coatings on PET.”
    <i>Journal of Physics D: Applied Physics</i>, 145201, 2018, doi:<a href="https://doi.org/10.1088/1361-6463/aab1dd">10.1088/1361-6463/aab1dd</a>.'
  short: 'F. Mitschker, J. Wißing, C. Hoppe, M.T. de los Arcos de Pedro, G. Grundmeier,
    P. Awakowicz, Journal of Physics D: Applied Physics (2018).'
date_created: 2021-07-07T09:03:03Z
date_updated: 2023-01-24T08:40:21Z
department:
- _id: '302'
doi: 10.1088/1361-6463/aab1dd
language:
- iso: eng
publication: 'Journal of Physics D: Applied Physics'
publication_identifier:
  issn:
  - 0022-3727
  - 1361-6463
publication_status: published
status: public
title: Influence of average ion energy and atomic oxygen flux per Si atom on the formation
  of silicon oxide permeation barrier coatings on PET
type: journal_article
user_id: '54556'
year: '2018'
...
