[{"place":"22. Workshop \"Testmethoden und Zuverlässigkeit von Schaltungen und Systemen\" (TuZ'10), Paderborn, Germany","year":"2010","citation":{"ama":"Fröse V, Ibers R, Hellebrand S. <i>Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur</i>. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany; 2010.","ieee":"V. Fröse, R. Ibers, and S. Hellebrand, <i>Testdatenkompression mit Hilfe der Netzwerkinfrastruktur</i>. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, 2010.","chicago":"Fröse, Viktor, Rüdiger Ibers, and Sybille Hellebrand. <i>Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur</i>. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, 2010.","apa":"Fröse, V., Ibers, R., &#38; Hellebrand, S. (2010). <i>Testdatenkompression mit Hilfe der Netzwerkinfrastruktur</i>. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany.","mla":"Fröse, Viktor, et al. <i>Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur</i>. 2010.","bibtex":"@book{Fröse_Ibers_Hellebrand_2010, place={22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany}, title={Testdatenkompression mit Hilfe der Netzwerkinfrastruktur}, author={Fröse, Viktor and Ibers, Rüdiger and Hellebrand, Sybille}, year={2010} }","short":"V. Fröse, R. Ibers, S. Hellebrand, Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur, 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, 2010."},"title":"Testdatenkompression mit Hilfe der Netzwerkinfrastruktur","date_updated":"2022-01-06T06:50:49Z","author":[{"first_name":"Viktor","last_name":"Fröse","full_name":"Fröse, Viktor"},{"first_name":"Rüdiger","last_name":"Ibers","id":"659","full_name":"Ibers, Rüdiger"},{"first_name":"Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","id":"209"}],"date_created":"2019-07-10T11:17:36Z","status":"public","type":"misc","keyword":["WORKSHOP"],"language":[{"iso":"eng"}],"_id":"10670","user_id":"659","department":[{"_id":"48"}]},{"author":[{"last_name":"Froese","full_name":"Froese, Viktor","first_name":"Viktor"},{"first_name":"Rüdiger","id":"659","full_name":"Ibers, Rüdiger","last_name":"Ibers"},{"id":"209","full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","last_name":"Hellebrand","first_name":"Sybille"}],"date_created":"2019-08-28T09:22:54Z","publisher":"IEEE","date_updated":"2022-05-11T16:22:36Z","doi":"10.1109/vts.2010.5469570","title":"Reusing NoC-Infrastructure for Test Data Compression","page":"227-231","citation":{"short":"V. Froese, R. Ibers, S. Hellebrand, in: 28th IEEE VLSI Test Symposium (VTS’10), IEEE, Santa Cruz, CA, USA, 2010, pp. 227–231.","mla":"Froese, Viktor, et al. “Reusing NoC-Infrastructure for Test Data Compression.” <i>28th IEEE VLSI Test Symposium (VTS’10)</i>, IEEE, 2010, pp. 227–31, doi:<a href=\"https://doi.org/10.1109/vts.2010.5469570\">10.1109/vts.2010.5469570</a>.","bibtex":"@inproceedings{Froese_Ibers_Hellebrand_2010, place={Santa Cruz, CA, USA}, title={Reusing NoC-Infrastructure for Test Data Compression}, DOI={<a href=\"https://doi.org/10.1109/vts.2010.5469570\">10.1109/vts.2010.5469570</a>}, booktitle={28th IEEE VLSI Test Symposium (VTS’10)}, publisher={IEEE}, author={Froese, Viktor and Ibers, Rüdiger and Hellebrand, Sybille}, year={2010}, pages={227–231} }","apa":"Froese, V., Ibers, R., &#38; Hellebrand, S. (2010). Reusing NoC-Infrastructure for Test Data Compression. <i>28th IEEE VLSI Test Symposium (VTS’10)</i>, 227–231. <a href=\"https://doi.org/10.1109/vts.2010.5469570\">https://doi.org/10.1109/vts.2010.5469570</a>","ama":"Froese V, Ibers R, Hellebrand S. Reusing NoC-Infrastructure for Test Data Compression. In: <i>28th IEEE VLSI Test Symposium (VTS’10)</i>. IEEE; 2010:227-231. doi:<a href=\"https://doi.org/10.1109/vts.2010.5469570\">10.1109/vts.2010.5469570</a>","ieee":"V. Froese, R. Ibers, and S. Hellebrand, “Reusing NoC-Infrastructure for Test Data Compression,” in <i>28th IEEE VLSI Test Symposium (VTS’10)</i>, 2010, pp. 227–231, doi: <a href=\"https://doi.org/10.1109/vts.2010.5469570\">10.1109/vts.2010.5469570</a>.","chicago":"Froese, Viktor, Rüdiger Ibers, and Sybille Hellebrand. “Reusing NoC-Infrastructure for Test Data Compression.” In <i>28th IEEE VLSI Test Symposium (VTS’10)</i>, 227–31. Santa Cruz, CA, USA: IEEE, 2010. <a href=\"https://doi.org/10.1109/vts.2010.5469570\">https://doi.org/10.1109/vts.2010.5469570</a>."},"year":"2010","place":"Santa Cruz, CA, USA","department":[{"_id":"48"}],"user_id":"209","_id":"12988","language":[{"iso":"eng"}],"publication":"28th IEEE VLSI Test Symposium (VTS'10)","type":"conference","status":"public"},{"language":[{"iso":"eng"}],"user_id":"14955","department":[{"_id":"48"},{"_id":"63"}],"_id":"13071","status":"public","type":"conference","publication":"{GOR/NGB Conference Tilburg 2004}","title":"Sensor Networks with More Features Using Less Hardware","author":[{"full_name":"Liu Jing, Michelle","last_name":"Liu Jing","first_name":"Michelle"},{"full_name":"Ruehrup, Stefan","last_name":"Ruehrup","first_name":"Stefan"},{"first_name":"Christian","last_name":"Schindelhauer","full_name":"Schindelhauer, Christian"},{"full_name":"Volbert, Klaus","last_name":"Volbert","first_name":"Klaus"},{"first_name":"Martin","full_name":"Dierkes, Martin","last_name":"Dierkes"},{"first_name":"Andreas","last_name":"Bellgardt","full_name":"Bellgardt, Andreas"},{"first_name":"Rüdiger","last_name":"Ibers","full_name":"Ibers, Rüdiger","id":"659"},{"full_name":"Hilleringmann, Ulrich","last_name":"Hilleringmann","first_name":"Ulrich"}],"date_created":"2019-08-28T11:58:24Z","date_updated":"2022-01-06T06:51:28Z","citation":{"chicago":"Liu Jing, Michelle, Stefan Ruehrup, Christian Schindelhauer, Klaus Volbert, Martin Dierkes, Andreas Bellgardt, Rüdiger Ibers, and Ulrich Hilleringmann. “Sensor Networks with More Features Using Less Hardware.” In <i>{GOR/NGB Conference Tilburg 2004}</i>. Tilburg, Netherlands, 2004.","ieee":"M. Liu Jing <i>et al.</i>, “Sensor Networks with More Features Using Less Hardware,” in <i>{GOR/NGB Conference Tilburg 2004}</i>, 2004.","ama":"Liu Jing M, Ruehrup S, Schindelhauer C, et al. Sensor Networks with More Features Using Less Hardware. In: <i>{GOR/NGB Conference Tilburg 2004}</i>. Tilburg, Netherlands; 2004.","mla":"Liu Jing, Michelle, et al. “Sensor Networks with More Features Using Less Hardware.” <i>{GOR/NGB Conference Tilburg 2004}</i>, 2004.","bibtex":"@inproceedings{Liu Jing_Ruehrup_Schindelhauer_Volbert_Dierkes_Bellgardt_Ibers_Hilleringmann_2004, place={Tilburg, Netherlands}, title={Sensor Networks with More Features Using Less Hardware}, booktitle={{GOR/NGB Conference Tilburg 2004}}, author={Liu Jing, Michelle and Ruehrup, Stefan and Schindelhauer, Christian and Volbert, Klaus and Dierkes, Martin and Bellgardt, Andreas and Ibers, Rüdiger and Hilleringmann, Ulrich}, year={2004} }","short":"M. Liu Jing, S. Ruehrup, C. Schindelhauer, K. Volbert, M. Dierkes, A. Bellgardt, R. Ibers, U. Hilleringmann, in: {GOR/NGB Conference Tilburg 2004}, Tilburg, Netherlands, 2004.","apa":"Liu Jing, M., Ruehrup, S., Schindelhauer, C., Volbert, K., Dierkes, M., Bellgardt, A., … Hilleringmann, U. (2004). Sensor Networks with More Features Using Less Hardware. In <i>{GOR/NGB Conference Tilburg 2004}</i>. Tilburg, Netherlands."},"year":"2004","place":"Tilburg, Netherlands"}]