---
_id: '10670'
author:
- first_name: Viktor
  full_name: Fröse, Viktor
  last_name: Fröse
- first_name: Rüdiger
  full_name: Ibers, Rüdiger
  id: '659'
  last_name: Ibers
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
citation:
  ama: Fröse V, Ibers R, Hellebrand S. <i>Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur</i>.
    22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10),
    Paderborn, Germany; 2010.
  apa: Fröse, V., Ibers, R., &#38; Hellebrand, S. (2010). <i>Testdatenkompression
    mit Hilfe der Netzwerkinfrastruktur</i>. 22. Workshop “Testmethoden und Zuverlässigkeit
    von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany.
  bibtex: '@book{Fröse_Ibers_Hellebrand_2010, place={22. Workshop “Testmethoden und
    Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany}, title={Testdatenkompression
    mit Hilfe der Netzwerkinfrastruktur}, author={Fröse, Viktor and Ibers, Rüdiger
    and Hellebrand, Sybille}, year={2010} }'
  chicago: Fröse, Viktor, Rüdiger Ibers, and Sybille Hellebrand. <i>Testdatenkompression
    Mit Hilfe Der Netzwerkinfrastruktur</i>. 22. Workshop “Testmethoden und Zuverlässigkeit
    von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, 2010.
  ieee: V. Fröse, R. Ibers, and S. Hellebrand, <i>Testdatenkompression mit Hilfe der
    Netzwerkinfrastruktur</i>. 22. Workshop “Testmethoden und Zuverlässigkeit von
    Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, 2010.
  mla: Fröse, Viktor, et al. <i>Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur</i>.
    2010.
  short: V. Fröse, R. Ibers, S. Hellebrand, Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur,
    22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10),
    Paderborn, Germany, 2010.
date_created: 2019-07-10T11:17:36Z
date_updated: 2022-01-06T06:50:49Z
department:
- _id: '48'
keyword:
- WORKSHOP
language:
- iso: eng
place: 22. Workshop "Testmethoden und Zuverlässigkeit von Schaltungen und Systemen"
  (TuZ'10), Paderborn, Germany
status: public
title: Testdatenkompression mit Hilfe der Netzwerkinfrastruktur
type: misc
user_id: '659'
year: '2010'
...
---
_id: '12988'
author:
- first_name: Viktor
  full_name: Froese, Viktor
  last_name: Froese
- first_name: Rüdiger
  full_name: Ibers, Rüdiger
  id: '659'
  last_name: Ibers
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
citation:
  ama: 'Froese V, Ibers R, Hellebrand S. Reusing NoC-Infrastructure for Test Data
    Compression. In: <i>28th IEEE VLSI Test Symposium (VTS’10)</i>. IEEE; 2010:227-231.
    doi:<a href="https://doi.org/10.1109/vts.2010.5469570">10.1109/vts.2010.5469570</a>'
  apa: Froese, V., Ibers, R., &#38; Hellebrand, S. (2010). Reusing NoC-Infrastructure
    for Test Data Compression. <i>28th IEEE VLSI Test Symposium (VTS’10)</i>, 227–231.
    <a href="https://doi.org/10.1109/vts.2010.5469570">https://doi.org/10.1109/vts.2010.5469570</a>
  bibtex: '@inproceedings{Froese_Ibers_Hellebrand_2010, place={Santa Cruz, CA, USA},
    title={Reusing NoC-Infrastructure for Test Data Compression}, DOI={<a href="https://doi.org/10.1109/vts.2010.5469570">10.1109/vts.2010.5469570</a>},
    booktitle={28th IEEE VLSI Test Symposium (VTS’10)}, publisher={IEEE}, author={Froese,
    Viktor and Ibers, Rüdiger and Hellebrand, Sybille}, year={2010}, pages={227–231}
    }'
  chicago: 'Froese, Viktor, Rüdiger Ibers, and Sybille Hellebrand. “Reusing NoC-Infrastructure
    for Test Data Compression.” In <i>28th IEEE VLSI Test Symposium (VTS’10)</i>,
    227–31. Santa Cruz, CA, USA: IEEE, 2010. <a href="https://doi.org/10.1109/vts.2010.5469570">https://doi.org/10.1109/vts.2010.5469570</a>.'
  ieee: 'V. Froese, R. Ibers, and S. Hellebrand, “Reusing NoC-Infrastructure for Test
    Data Compression,” in <i>28th IEEE VLSI Test Symposium (VTS’10)</i>, 2010, pp.
    227–231, doi: <a href="https://doi.org/10.1109/vts.2010.5469570">10.1109/vts.2010.5469570</a>.'
  mla: Froese, Viktor, et al. “Reusing NoC-Infrastructure for Test Data Compression.”
    <i>28th IEEE VLSI Test Symposium (VTS’10)</i>, IEEE, 2010, pp. 227–31, doi:<a
    href="https://doi.org/10.1109/vts.2010.5469570">10.1109/vts.2010.5469570</a>.
  short: 'V. Froese, R. Ibers, S. Hellebrand, in: 28th IEEE VLSI Test Symposium (VTS’10),
    IEEE, Santa Cruz, CA, USA, 2010, pp. 227–231.'
date_created: 2019-08-28T09:22:54Z
date_updated: 2022-05-11T16:22:36Z
department:
- _id: '48'
doi: 10.1109/vts.2010.5469570
language:
- iso: eng
page: 227-231
place: Santa Cruz, CA, USA
publication: 28th IEEE VLSI Test Symposium (VTS'10)
publisher: IEEE
status: public
title: Reusing NoC-Infrastructure for Test Data Compression
type: conference
user_id: '209'
year: '2010'
...
---
_id: '13071'
author:
- first_name: Michelle
  full_name: Liu Jing, Michelle
  last_name: Liu Jing
- first_name: Stefan
  full_name: Ruehrup, Stefan
  last_name: Ruehrup
- first_name: Christian
  full_name: Schindelhauer, Christian
  last_name: Schindelhauer
- first_name: Klaus
  full_name: Volbert, Klaus
  last_name: Volbert
- first_name: Martin
  full_name: Dierkes, Martin
  last_name: Dierkes
- first_name: Andreas
  full_name: Bellgardt, Andreas
  last_name: Bellgardt
- first_name: Rüdiger
  full_name: Ibers, Rüdiger
  id: '659'
  last_name: Ibers
- first_name: Ulrich
  full_name: Hilleringmann, Ulrich
  last_name: Hilleringmann
citation:
  ama: 'Liu Jing M, Ruehrup S, Schindelhauer C, et al. Sensor Networks with More Features
    Using Less Hardware. In: <i>{GOR/NGB Conference Tilburg 2004}</i>. Tilburg, Netherlands;
    2004.'
  apa: Liu Jing, M., Ruehrup, S., Schindelhauer, C., Volbert, K., Dierkes, M., Bellgardt,
    A., … Hilleringmann, U. (2004). Sensor Networks with More Features Using Less
    Hardware. In <i>{GOR/NGB Conference Tilburg 2004}</i>. Tilburg, Netherlands.
  bibtex: '@inproceedings{Liu Jing_Ruehrup_Schindelhauer_Volbert_Dierkes_Bellgardt_Ibers_Hilleringmann_2004,
    place={Tilburg, Netherlands}, title={Sensor Networks with More Features Using
    Less Hardware}, booktitle={{GOR/NGB Conference Tilburg 2004}}, author={Liu Jing,
    Michelle and Ruehrup, Stefan and Schindelhauer, Christian and Volbert, Klaus and
    Dierkes, Martin and Bellgardt, Andreas and Ibers, Rüdiger and Hilleringmann, Ulrich},
    year={2004} }'
  chicago: Liu Jing, Michelle, Stefan Ruehrup, Christian Schindelhauer, Klaus Volbert,
    Martin Dierkes, Andreas Bellgardt, Rüdiger Ibers, and Ulrich Hilleringmann. “Sensor
    Networks with More Features Using Less Hardware.” In <i>{GOR/NGB Conference Tilburg
    2004}</i>. Tilburg, Netherlands, 2004.
  ieee: M. Liu Jing <i>et al.</i>, “Sensor Networks with More Features Using Less
    Hardware,” in <i>{GOR/NGB Conference Tilburg 2004}</i>, 2004.
  mla: Liu Jing, Michelle, et al. “Sensor Networks with More Features Using Less Hardware.”
    <i>{GOR/NGB Conference Tilburg 2004}</i>, 2004.
  short: 'M. Liu Jing, S. Ruehrup, C. Schindelhauer, K. Volbert, M. Dierkes, A. Bellgardt,
    R. Ibers, U. Hilleringmann, in: {GOR/NGB Conference Tilburg 2004}, Tilburg, Netherlands,
    2004.'
date_created: 2019-08-28T11:58:24Z
date_updated: 2022-01-06T06:51:28Z
department:
- _id: '48'
- _id: '63'
language:
- iso: eng
place: Tilburg, Netherlands
publication: '{GOR/NGB Conference Tilburg 2004}'
status: public
title: Sensor Networks with More Features Using Less Hardware
type: conference
user_id: '14955'
year: '2004'
...