[{"publication":"Ultramicroscopy","language":[{"iso":"eng"}],"external_id":{"pmid":["39823700"]},"year":"2025","quality_controlled":"1","title":"An applied noise model for low-loss EELS maps","date_created":"2025-03-28T06:58:55Z","publisher":"Elsevier BV","status":"public","type":"journal_article","article_type":"original","article_number":"114101","user_id":"77368","_id":"59177","citation":{"chicago":"Zietlow, Christian, and Jörg Lindner. “An Applied Noise Model for Low-Loss EELS Maps.” <i>Ultramicroscopy</i> 270 (2025). <a href=\"https://doi.org/10.1016/j.ultramic.2024.114101\">https://doi.org/10.1016/j.ultramic.2024.114101</a>.","ieee":"C. Zietlow and J. Lindner, “An applied noise model for low-loss EELS maps,” <i>Ultramicroscopy</i>, vol. 270, Art. no. 114101, 2025, doi: <a href=\"https://doi.org/10.1016/j.ultramic.2024.114101\">10.1016/j.ultramic.2024.114101</a>.","ama":"Zietlow C, Lindner J. An applied noise model for low-loss EELS maps. <i>Ultramicroscopy</i>. 2025;270. doi:<a href=\"https://doi.org/10.1016/j.ultramic.2024.114101\">10.1016/j.ultramic.2024.114101</a>","bibtex":"@article{Zietlow_Lindner_2025, title={An applied noise model for low-loss EELS maps}, volume={270}, DOI={<a href=\"https://doi.org/10.1016/j.ultramic.2024.114101\">10.1016/j.ultramic.2024.114101</a>}, number={114101}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Zietlow, Christian and Lindner, Jörg}, year={2025} }","short":"C. Zietlow, J. Lindner, Ultramicroscopy 270 (2025).","mla":"Zietlow, Christian, and Jörg Lindner. “An Applied Noise Model for Low-Loss EELS Maps.” <i>Ultramicroscopy</i>, vol. 270, 114101, Elsevier BV, 2025, doi:<a href=\"https://doi.org/10.1016/j.ultramic.2024.114101\">10.1016/j.ultramic.2024.114101</a>.","apa":"Zietlow, C., &#38; Lindner, J. (2025). An applied noise model for low-loss EELS maps. <i>Ultramicroscopy</i>, <i>270</i>, Article 114101. <a href=\"https://doi.org/10.1016/j.ultramic.2024.114101\">https://doi.org/10.1016/j.ultramic.2024.114101</a>"},"intvolume":"       270","publication_status":"published","publication_identifier":{"issn":["0304-3991"]},"pmid":"1","main_file_link":[{"open_access":"1"}],"doi":"10.1016/j.ultramic.2024.114101","author":[{"id":"77368","full_name":"Zietlow, Christian","orcid":"https://orcid.org/0000-0001-9696-619X","last_name":"Zietlow","first_name":"Christian"},{"first_name":"Jörg","last_name":"Lindner","id":"20797","full_name":"Lindner, Jörg"}],"volume":270,"date_updated":"2026-02-04T07:02:20Z","oa":"1"},{"_id":"63855","user_id":"77368","department":[{"_id":"15"}],"type":"research_data","abstract":[{"text":"Elektronenenergieverlustspektroskopie (engl. EELS) ist eine fortgeschrittene Analysemethode der Transmissionselektronenmikroskopie, die auf atomarer Ebene Einblicke in Materialcharakteristika wie bspw. Eigenschaften des Elektronensystems oder der Materialzusammensetzung erlaubt. Die Genauigkeit jeder EELS-Analyse ist jedoch fundamental durch Rauschen und Unschärfe begrenzt. Diese Thesis beschreibt solche Rauschphänomene im Detail. Vor allem bei strahlempfindlichen Materialien, die kurze Bestrahlzeiten erfordern, aber auch bei Elektron-Materie-Wechselwirkungen mit geringer Auftrittshäufigkeit, ist eine solche Beschreibung notwendig, da das Rauschen solche Messungen dominiert. Zusätzlich spielen Korrelationen des Rauschens eine Rolle, die durch Faltung des verrauschten Signals mit der Punktspreizfunktion des Detektors entstehen und die sowohl theoretisch als auch experimentell beschrieben werden. Methoden zur Messung der wichtigsten Rauschparameter bei typischen Detektorsystemen werden vorgestellt und erlauben es, das Rauschmodel auf jeden beliebigen EELS-Detektor anzupassen. Eine neue Entfaltungsmethode wird vorgeschlagen, die EELS-Messungen schärft und entrauscht. Die Wirksamkeit dieser Methode wird an Simulations- und Experimentaldaten dargelegt. Hierbei wird gezeigt, dass die neue Methode signifikant bessere Ergebnisse liefert, als bisherige und somit eine Analyse von Messdaten auf einem Level ermöglicht, das die Möglichkeiten der Elektronenmikroskopie deutlich erweitert.","lang":"eng"},{"lang":"eng","text":"Electron energy-loss spectroscopy (EELS) is an advanced analytical technique in transmission electron microscopy, as it provides insights into material characteristics, such as electronic properties or elemental composition, at the atomic scale. The precision of every EELS analysis, however, is inherently limited by noises and blur. This thesis offers a comprehensive understanding of the noise, which is particularly valuable at low dwell times necessary for beam sensitive materials and for electron-matter interactions with low frequency of occurrence, where the noise dominates the measurement. Additionally, correlations encountered in the noise of an EELS measurement are described from both a theoretical and experimental perspective. These correlations are caused by a convolution of the noisy signal with the detector point spread function. Methods for characterizing key noise parameters of typical detectors are described, allowing the noise model to be tailored to any EELS detector. Ultimately, a novel deconvolution method enabling significant sharpening and denoising of EELS measurements is introduced and demonstrated. Its efficiency is further validated on both simulation and experimental data. The described advancement offered by the proposed deconvolution method enables the extension of current electron microscope capabilities, facilitating analysis that would be unfeasible with existing deconvolution techniques."}],"status":"public","publisher":"Universitätsbibliothek Paderborn","date_updated":"2026-02-04T08:21:39Z","date_created":"2026-02-04T06:54:14Z","author":[{"first_name":"Christian","orcid":"https://orcid.org/0000-0001-9696-619X","last_name":"Zietlow","id":"77368","full_name":"Zietlow, Christian"}],"title":"A novel Lagrangian-based method for the deconvolution of electron energy-loss spectra","doi":"10.17619/UNIPB/1-2438","year":"2025","citation":{"bibtex":"@book{Zietlow_2025, title={A novel Lagrangian-based method for the deconvolution of electron energy-loss spectra}, DOI={<a href=\"https://doi.org/10.17619/UNIPB/1-2438\">10.17619/UNIPB/1-2438</a>}, publisher={Universitätsbibliothek Paderborn}, author={Zietlow, Christian}, year={2025} }","short":"C. Zietlow, A Novel Lagrangian-Based Method for the Deconvolution of Electron Energy-Loss Spectra, Universitätsbibliothek Paderborn, 2025.","mla":"Zietlow, Christian. <i>A Novel Lagrangian-Based Method for the Deconvolution of Electron Energy-Loss Spectra</i>. Universitätsbibliothek Paderborn, 2025, doi:<a href=\"https://doi.org/10.17619/UNIPB/1-2438\">10.17619/UNIPB/1-2438</a>.","apa":"Zietlow, C. (2025). <i>A novel Lagrangian-based method for the deconvolution of electron energy-loss spectra</i>. Universitätsbibliothek Paderborn. <a href=\"https://doi.org/10.17619/UNIPB/1-2438\">https://doi.org/10.17619/UNIPB/1-2438</a>","chicago":"Zietlow, Christian. <i>A Novel Lagrangian-Based Method for the Deconvolution of Electron Energy-Loss Spectra</i>. Universitätsbibliothek Paderborn, 2025. <a href=\"https://doi.org/10.17619/UNIPB/1-2438\">https://doi.org/10.17619/UNIPB/1-2438</a>.","ieee":"C. Zietlow, <i>A novel Lagrangian-based method for the deconvolution of electron energy-loss spectra</i>. Universitätsbibliothek Paderborn, 2025.","ama":"Zietlow C. <i>A Novel Lagrangian-Based Method for the Deconvolution of Electron Energy-Loss Spectra</i>. Universitätsbibliothek Paderborn; 2025. doi:<a href=\"https://doi.org/10.17619/UNIPB/1-2438\">10.17619/UNIPB/1-2438</a>"}},{"type":"journal_article","status":"public","_id":"59178","user_id":"77368","department":[{"_id":"15"}],"article_type":"original","publication_status":"published","pmid":"1","publication_identifier":{"issn":["2045-2322"]},"citation":{"ama":"Zietlow C, Lindner J. An applied noise model for scintillation-based CCD detectors in transmission electron microscopy. <i>Sci Rep</i>. 2025;15(1):3815. doi:<a href=\"https://doi.org/10.1038/s41598-025-85982-4\">10.1038/s41598-025-85982-4</a>","chicago":"Zietlow, Christian, and Jörg Lindner. “An Applied Noise Model for Scintillation-Based CCD Detectors in Transmission Electron Microscopy.” <i>Sci Rep</i> 15, no. 1 (2025): 3815. <a href=\"https://doi.org/10.1038/s41598-025-85982-4\">https://doi.org/10.1038/s41598-025-85982-4</a>.","ieee":"C. Zietlow and J. Lindner, “An applied noise model for scintillation-based CCD detectors in transmission electron microscopy.,” <i>Sci Rep</i>, vol. 15, no. 1, p. 3815, 2025, doi: <a href=\"https://doi.org/10.1038/s41598-025-85982-4\">10.1038/s41598-025-85982-4</a>.","short":"C. Zietlow, J. Lindner, Sci Rep 15 (2025) 3815.","mla":"Zietlow, Christian, and Jörg Lindner. “An Applied Noise Model for Scintillation-Based CCD Detectors in Transmission Electron Microscopy.” <i>Sci Rep</i>, vol. 15, no. 1, 2025, p. 3815, doi:<a href=\"https://doi.org/10.1038/s41598-025-85982-4\">10.1038/s41598-025-85982-4</a>.","bibtex":"@article{Zietlow_Lindner_2025, title={An applied noise model for scintillation-based CCD detectors in transmission electron microscopy.}, volume={15}, DOI={<a href=\"https://doi.org/10.1038/s41598-025-85982-4\">10.1038/s41598-025-85982-4</a>}, number={1}, journal={Sci Rep}, author={Zietlow, Christian and Lindner, Jörg}, year={2025}, pages={3815} }","apa":"Zietlow, C., &#38; Lindner, J. (2025). An applied noise model for scintillation-based CCD detectors in transmission electron microscopy. <i>Sci Rep</i>, <i>15</i>(1), 3815. <a href=\"https://doi.org/10.1038/s41598-025-85982-4\">https://doi.org/10.1038/s41598-025-85982-4</a>"},"intvolume":"        15","page":"3815","oa":"1","date_updated":"2026-02-04T07:49:19Z","author":[{"first_name":"Christian","full_name":"Zietlow, Christian","id":"77368","orcid":"https://orcid.org/0000-0001-9696-619X","last_name":"Zietlow"},{"first_name":"Jörg","last_name":"Lindner","full_name":"Lindner, Jörg","id":"20797"}],"volume":15,"main_file_link":[{"open_access":"1"}],"doi":"10.1038/s41598-025-85982-4","publication":"Sci Rep","external_id":{"pmid":["39885260"]},"language":[{"iso":"eng"}],"quality_controlled":"1","issue":"1","year":"2025","date_created":"2025-03-28T07:03:45Z","title":"An applied noise model for scintillation-based CCD detectors in transmission electron microscopy."},{"type":"journal_article","status":"public","department":[{"_id":"286"},{"_id":"15"}],"user_id":"77368","_id":"60001","article_type":"original","pmid":"1","publication_status":"published","citation":{"ama":"Zietlow C, Lindner J. An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps. <i>Ultramicroscopy</i>. 2025;(275). doi:<a href=\"https://doi.org/10.1016/j.ultramic.2025.114159\">10.1016/j.ultramic.2025.114159</a>","ieee":"C. Zietlow and J. Lindner, “An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps,” <i>Ultramicroscopy</i>, no. 275, 2025, doi: <a href=\"https://doi.org/10.1016/j.ultramic.2025.114159\">10.1016/j.ultramic.2025.114159</a>.","chicago":"Zietlow, Christian, and Jörg Lindner. “An Unbiased ADMM-TGV Algorithm for the Deconvolution of STEM-EELS Maps.” <i>Ultramicroscopy</i>, no. 275 (2025). <a href=\"https://doi.org/10.1016/j.ultramic.2025.114159\">https://doi.org/10.1016/j.ultramic.2025.114159</a>.","bibtex":"@article{Zietlow_Lindner_2025, title={An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps}, DOI={<a href=\"https://doi.org/10.1016/j.ultramic.2025.114159\">10.1016/j.ultramic.2025.114159</a>}, number={275}, journal={Ultramicroscopy}, publisher={Elsevier}, author={Zietlow, Christian and Lindner, Jörg}, year={2025} }","mla":"Zietlow, Christian, and Jörg Lindner. “An Unbiased ADMM-TGV Algorithm for the Deconvolution of STEM-EELS Maps.” <i>Ultramicroscopy</i>, no. 275, Elsevier, 2025, doi:<a href=\"https://doi.org/10.1016/j.ultramic.2025.114159\">10.1016/j.ultramic.2025.114159</a>.","short":"C. Zietlow, J. Lindner, Ultramicroscopy (2025).","apa":"Zietlow, C., &#38; Lindner, J. (2025). An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps. <i>Ultramicroscopy</i>, <i>275</i>. <a href=\"https://doi.org/10.1016/j.ultramic.2025.114159\">https://doi.org/10.1016/j.ultramic.2025.114159</a>"},"author":[{"first_name":"Christian","full_name":"Zietlow, Christian","id":"77368","last_name":"Zietlow","orcid":"https://orcid.org/0000-0001-9696-619X"},{"last_name":"Lindner","full_name":"Lindner, Jörg","id":"20797","first_name":"Jörg"}],"oa":"1","date_updated":"2026-02-04T07:50:40Z","doi":"10.1016/j.ultramic.2025.114159","main_file_link":[{"open_access":"1"}],"publication":"Ultramicroscopy","external_id":{"pmid":["40398071"]},"language":[{"iso":"eng"}],"issue":"275","quality_controlled":"1","year":"2025","date_created":"2025-05-20T11:33:24Z","publisher":"Elsevier","title":"An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps"},{"related_material":{"link":[{"url":"https://doi.org/10.17619/UNIPB/1-2438","relation":"software"}]},"publication_status":"published","citation":{"mla":"Zietlow, Christian. <i>A Novel Lagrangian-Based Method for the Deconvolution of Electron Energy-Loss Spectra</i>. Universitätsbibliothek Paderborn, 2025, doi:<a href=\"https://doi.org/10.17619/UNIPB/1-2438\">10.17619/UNIPB/1-2438</a>.","short":"C. Zietlow, A Novel Lagrangian-Based Method for the Deconvolution of Electron Energy-Loss Spectra, Universitätsbibliothek Paderborn, 2025.","bibtex":"@book{Zietlow_2025, title={A novel Lagrangian-based method for the deconvolution of electron energy-loss spectra}, DOI={<a href=\"https://doi.org/10.17619/UNIPB/1-2438\">10.17619/UNIPB/1-2438</a>}, publisher={Universitätsbibliothek Paderborn}, author={Zietlow, Christian}, year={2025} }","apa":"Zietlow, C. (2025). <i>A novel Lagrangian-based method for the deconvolution of electron energy-loss spectra</i>. Universitätsbibliothek Paderborn. <a href=\"https://doi.org/10.17619/UNIPB/1-2438\">https://doi.org/10.17619/UNIPB/1-2438</a>","ama":"Zietlow C. <i>A Novel Lagrangian-Based Method for the Deconvolution of Electron Energy-Loss Spectra</i>. Universitätsbibliothek Paderborn; 2025. doi:<a href=\"https://doi.org/10.17619/UNIPB/1-2438\">10.17619/UNIPB/1-2438</a>","ieee":"C. Zietlow, <i>A novel Lagrangian-based method for the deconvolution of electron energy-loss spectra</i>. Universitätsbibliothek Paderborn, 2025.","chicago":"Zietlow, Christian. <i>A Novel Lagrangian-Based Method for the Deconvolution of Electron Energy-Loss Spectra</i>. Universitätsbibliothek Paderborn, 2025. <a href=\"https://doi.org/10.17619/UNIPB/1-2438\">https://doi.org/10.17619/UNIPB/1-2438</a>."},"year":"2025","author":[{"first_name":"Christian","last_name":"Zietlow","orcid":"https://orcid.org/0000-0001-9696-619X","id":"77368","full_name":"Zietlow, Christian"}],"supervisor":[{"last_name":"Lindner","id":"20797","full_name":"Lindner, Jörg K. N.","first_name":"Jörg K. N."}],"date_created":"2026-02-04T06:57:14Z","date_updated":"2026-02-04T12:28:17Z","oa":"1","publisher":"Universitätsbibliothek Paderborn","doi":"10.17619/UNIPB/1-2438","main_file_link":[{"open_access":"1"}],"title":"A novel Lagrangian-based method for the deconvolution of electron energy-loss spectra","type":"dissertation","status":"public","abstract":[{"text":"Electron energy-loss spectroscopy (EELS) is an advanced analytical technique in transmission electron microscopy, as it provides insights into material characteristics, such as electronic properties or elemental composition, at the atomic scale. The precision of every EELS analysis, however, is inherently limited by noises and blur. This thesis offers a comprehensive understanding of the noise, which is particularly valuable at low dwell times necessary for beam sensitive materials and for electron-matter interactions with low frequency of occurrence, where the noise dominates the measurement. Additionally, correlations encountered in the noise of an EELS measurement are described from both a theoretical and experimental perspective. These correlations are caused by a convolution of the noisy signal with the detector point spread function. Methods for characterizing key noise parameters of typical detectors are described, allowing the noise model to be tailored to any EELS detector. Ultimately, a novel deconvolution method enabling significant sharpening and denoising of EELS measurements is introduced and demonstrated. Its efficiency is further validated on both simulation and experimental data. The described advancement offered by the proposed deconvolution method enables the extension of current electron microscope capabilities, facilitating analysis that would be unfeasible with existing deconvolution techniques.","lang":"eng"}],"department":[{"_id":"15"}],"user_id":"77368","_id":"63856","language":[{"iso":"eng"}]},{"quality_controlled":"1","issue":"4","year":"2024","publisher":"Springer Science and Business Media LLC","date_created":"2025-03-28T07:10:05Z","title":"ADMM-TGV image restoration for scientific applications with unbiased parameter choice","publication":"Numerical Algorithms","language":[{"iso":"eng"}],"publication_status":"published","publication_identifier":{"issn":["1017-1398","1572-9265"]},"citation":{"ama":"Zietlow C, Lindner J. ADMM-TGV image restoration for scientific applications with unbiased parameter choice. <i>Numerical Algorithms</i>. 2024;97(4):1481-1512. doi:<a href=\"https://doi.org/10.1007/s11075-024-01759-2\">10.1007/s11075-024-01759-2</a>","chicago":"Zietlow, Christian, and Jörg Lindner. “ADMM-TGV Image Restoration for Scientific Applications with Unbiased Parameter Choice.” <i>Numerical Algorithms</i> 97, no. 4 (2024): 1481–1512. <a href=\"https://doi.org/10.1007/s11075-024-01759-2\">https://doi.org/10.1007/s11075-024-01759-2</a>.","ieee":"C. Zietlow and J. Lindner, “ADMM-TGV image restoration for scientific applications with unbiased parameter choice,” <i>Numerical Algorithms</i>, vol. 97, no. 4, pp. 1481–1512, 2024, doi: <a href=\"https://doi.org/10.1007/s11075-024-01759-2\">10.1007/s11075-024-01759-2</a>.","short":"C. Zietlow, J. Lindner, Numerical Algorithms 97 (2024) 1481–1512.","mla":"Zietlow, Christian, and Jörg Lindner. “ADMM-TGV Image Restoration for Scientific Applications with Unbiased Parameter Choice.” <i>Numerical Algorithms</i>, vol. 97, no. 4, Springer Science and Business Media LLC, 2024, pp. 1481–512, doi:<a href=\"https://doi.org/10.1007/s11075-024-01759-2\">10.1007/s11075-024-01759-2</a>.","bibtex":"@article{Zietlow_Lindner_2024, title={ADMM-TGV image restoration for scientific applications with unbiased parameter choice}, volume={97}, DOI={<a href=\"https://doi.org/10.1007/s11075-024-01759-2\">10.1007/s11075-024-01759-2</a>}, number={4}, journal={Numerical Algorithms}, publisher={Springer Science and Business Media LLC}, author={Zietlow, Christian and Lindner, Jörg}, year={2024}, pages={1481–1512} }","apa":"Zietlow, C., &#38; Lindner, J. (2024). ADMM-TGV image restoration for scientific applications with unbiased parameter choice. <i>Numerical Algorithms</i>, <i>97</i>(4), 1481–1512. <a href=\"https://doi.org/10.1007/s11075-024-01759-2\">https://doi.org/10.1007/s11075-024-01759-2</a>"},"intvolume":"        97","page":"1481-1512","oa":"1","date_updated":"2026-02-04T07:54:06Z","author":[{"first_name":"Christian","orcid":"https://orcid.org/0000-0001-9696-619X","last_name":"Zietlow","id":"77368","full_name":"Zietlow, Christian"},{"first_name":"Jörg","last_name":"Lindner","id":"20797","full_name":"Lindner, Jörg"}],"volume":97,"main_file_link":[{"open_access":"1"}],"doi":"10.1007/s11075-024-01759-2","type":"journal_article","status":"public","_id":"59179","user_id":"77368","article_type":"original"}]