---
_id: '59177'
article_number: '114101'
article_type: original
author:
- first_name: Christian
  full_name: Zietlow, Christian
  id: '77368'
  last_name: Zietlow
  orcid: https://orcid.org/0000-0001-9696-619X
- first_name: Jörg
  full_name: Lindner, Jörg
  id: '20797'
  last_name: Lindner
citation:
  ama: Zietlow C, Lindner J. An applied noise model for low-loss EELS maps. <i>Ultramicroscopy</i>.
    2025;270. doi:<a href="https://doi.org/10.1016/j.ultramic.2024.114101">10.1016/j.ultramic.2024.114101</a>
  apa: Zietlow, C., &#38; Lindner, J. (2025). An applied noise model for low-loss
    EELS maps. <i>Ultramicroscopy</i>, <i>270</i>, Article 114101. <a href="https://doi.org/10.1016/j.ultramic.2024.114101">https://doi.org/10.1016/j.ultramic.2024.114101</a>
  bibtex: '@article{Zietlow_Lindner_2025, title={An applied noise model for low-loss
    EELS maps}, volume={270}, DOI={<a href="https://doi.org/10.1016/j.ultramic.2024.114101">10.1016/j.ultramic.2024.114101</a>},
    number={114101}, journal={Ultramicroscopy}, publisher={Elsevier BV}, author={Zietlow,
    Christian and Lindner, Jörg}, year={2025} }'
  chicago: Zietlow, Christian, and Jörg Lindner. “An Applied Noise Model for Low-Loss
    EELS Maps.” <i>Ultramicroscopy</i> 270 (2025). <a href="https://doi.org/10.1016/j.ultramic.2024.114101">https://doi.org/10.1016/j.ultramic.2024.114101</a>.
  ieee: 'C. Zietlow and J. Lindner, “An applied noise model for low-loss EELS maps,”
    <i>Ultramicroscopy</i>, vol. 270, Art. no. 114101, 2025, doi: <a href="https://doi.org/10.1016/j.ultramic.2024.114101">10.1016/j.ultramic.2024.114101</a>.'
  mla: Zietlow, Christian, and Jörg Lindner. “An Applied Noise Model for Low-Loss
    EELS Maps.” <i>Ultramicroscopy</i>, vol. 270, 114101, Elsevier BV, 2025, doi:<a
    href="https://doi.org/10.1016/j.ultramic.2024.114101">10.1016/j.ultramic.2024.114101</a>.
  short: C. Zietlow, J. Lindner, Ultramicroscopy 270 (2025).
date_created: 2025-03-28T06:58:55Z
date_updated: 2026-02-04T07:02:20Z
doi: 10.1016/j.ultramic.2024.114101
external_id:
  pmid:
  - '39823700'
intvolume: '       270'
language:
- iso: eng
main_file_link:
- open_access: '1'
oa: '1'
pmid: '1'
publication: Ultramicroscopy
publication_identifier:
  issn:
  - 0304-3991
publication_status: published
publisher: Elsevier BV
quality_controlled: '1'
status: public
title: An applied noise model for low-loss EELS maps
type: journal_article
user_id: '77368'
volume: 270
year: '2025'
...
---
_id: '63855'
abstract:
- lang: eng
  text: Elektronenenergieverlustspektroskopie (engl. EELS) ist eine fortgeschrittene
    Analysemethode der Transmissionselektronenmikroskopie, die auf atomarer Ebene
    Einblicke in Materialcharakteristika wie bspw. Eigenschaften des Elektronensystems
    oder der Materialzusammensetzung erlaubt. Die Genauigkeit jeder EELS-Analyse ist
    jedoch fundamental durch Rauschen und Unschärfe begrenzt. Diese Thesis beschreibt
    solche Rauschphänomene im Detail. Vor allem bei strahlempfindlichen Materialien,
    die kurze Bestrahlzeiten erfordern, aber auch bei Elektron-Materie-Wechselwirkungen
    mit geringer Auftrittshäufigkeit, ist eine solche Beschreibung notwendig, da das
    Rauschen solche Messungen dominiert. Zusätzlich spielen Korrelationen des Rauschens
    eine Rolle, die durch Faltung des verrauschten Signals mit der Punktspreizfunktion
    des Detektors entstehen und die sowohl theoretisch als auch experimentell beschrieben
    werden. Methoden zur Messung der wichtigsten Rauschparameter bei typischen Detektorsystemen
    werden vorgestellt und erlauben es, das Rauschmodel auf jeden beliebigen EELS-Detektor
    anzupassen. Eine neue Entfaltungsmethode wird vorgeschlagen, die EELS-Messungen
    schärft und entrauscht. Die Wirksamkeit dieser Methode wird an Simulations- und
    Experimentaldaten dargelegt. Hierbei wird gezeigt, dass die neue Methode signifikant
    bessere Ergebnisse liefert, als bisherige und somit eine Analyse von Messdaten
    auf einem Level ermöglicht, das die Möglichkeiten der Elektronenmikroskopie deutlich
    erweitert.
- lang: eng
  text: Electron energy-loss spectroscopy (EELS) is an advanced analytical technique
    in transmission electron microscopy, as it provides insights into material characteristics,
    such as electronic properties or elemental composition, at the atomic scale. The
    precision of every EELS analysis, however, is inherently limited by noises and
    blur. This thesis offers a comprehensive understanding of the noise, which is
    particularly valuable at low dwell times necessary for beam sensitive materials
    and for electron-matter interactions with low frequency of occurrence, where the
    noise dominates the measurement. Additionally, correlations encountered in the
    noise of an EELS measurement are described from both a theoretical and experimental
    perspective. These correlations are caused by a convolution of the noisy signal
    with the detector point spread function. Methods for characterizing key noise
    parameters of typical detectors are described, allowing the noise model to be
    tailored to any EELS detector. Ultimately, a novel deconvolution method enabling
    significant sharpening and denoising of EELS measurements is introduced and demonstrated.
    Its efficiency is further validated on both simulation and experimental data.
    The described advancement offered by the proposed deconvolution method enables
    the extension of current electron microscope capabilities, facilitating analysis
    that would be unfeasible with existing deconvolution techniques.
author:
- first_name: Christian
  full_name: Zietlow, Christian
  id: '77368'
  last_name: Zietlow
  orcid: https://orcid.org/0000-0001-9696-619X
citation:
  ama: Zietlow C. <i>A Novel Lagrangian-Based Method for the Deconvolution of Electron
    Energy-Loss Spectra</i>. Universitätsbibliothek Paderborn; 2025. doi:<a href="https://doi.org/10.17619/UNIPB/1-2438">10.17619/UNIPB/1-2438</a>
  apa: Zietlow, C. (2025). <i>A novel Lagrangian-based method for the deconvolution
    of electron energy-loss spectra</i>. Universitätsbibliothek Paderborn. <a href="https://doi.org/10.17619/UNIPB/1-2438">https://doi.org/10.17619/UNIPB/1-2438</a>
  bibtex: '@book{Zietlow_2025, title={A novel Lagrangian-based method for the deconvolution
    of electron energy-loss spectra}, DOI={<a href="https://doi.org/10.17619/UNIPB/1-2438">10.17619/UNIPB/1-2438</a>},
    publisher={Universitätsbibliothek Paderborn}, author={Zietlow, Christian}, year={2025}
    }'
  chicago: Zietlow, Christian. <i>A Novel Lagrangian-Based Method for the Deconvolution
    of Electron Energy-Loss Spectra</i>. Universitätsbibliothek Paderborn, 2025. <a
    href="https://doi.org/10.17619/UNIPB/1-2438">https://doi.org/10.17619/UNIPB/1-2438</a>.
  ieee: C. Zietlow, <i>A novel Lagrangian-based method for the deconvolution of electron
    energy-loss spectra</i>. Universitätsbibliothek Paderborn, 2025.
  mla: Zietlow, Christian. <i>A Novel Lagrangian-Based Method for the Deconvolution
    of Electron Energy-Loss Spectra</i>. Universitätsbibliothek Paderborn, 2025, doi:<a
    href="https://doi.org/10.17619/UNIPB/1-2438">10.17619/UNIPB/1-2438</a>.
  short: C. Zietlow, A Novel Lagrangian-Based Method for the Deconvolution of Electron
    Energy-Loss Spectra, Universitätsbibliothek Paderborn, 2025.
date_created: 2026-02-04T06:54:14Z
date_updated: 2026-02-04T08:21:39Z
department:
- _id: '15'
doi: 10.17619/UNIPB/1-2438
publisher: Universitätsbibliothek Paderborn
status: public
title: A novel Lagrangian-based method for the deconvolution of electron energy-loss
  spectra
type: research_data
user_id: '77368'
year: '2025'
...
---
_id: '59178'
article_type: original
author:
- first_name: Christian
  full_name: Zietlow, Christian
  id: '77368'
  last_name: Zietlow
  orcid: https://orcid.org/0000-0001-9696-619X
- first_name: Jörg
  full_name: Lindner, Jörg
  id: '20797'
  last_name: Lindner
citation:
  ama: Zietlow C, Lindner J. An applied noise model for scintillation-based CCD detectors
    in transmission electron microscopy. <i>Sci Rep</i>. 2025;15(1):3815. doi:<a href="https://doi.org/10.1038/s41598-025-85982-4">10.1038/s41598-025-85982-4</a>
  apa: Zietlow, C., &#38; Lindner, J. (2025). An applied noise model for scintillation-based
    CCD detectors in transmission electron microscopy. <i>Sci Rep</i>, <i>15</i>(1),
    3815. <a href="https://doi.org/10.1038/s41598-025-85982-4">https://doi.org/10.1038/s41598-025-85982-4</a>
  bibtex: '@article{Zietlow_Lindner_2025, title={An applied noise model for scintillation-based
    CCD detectors in transmission electron microscopy.}, volume={15}, DOI={<a href="https://doi.org/10.1038/s41598-025-85982-4">10.1038/s41598-025-85982-4</a>},
    number={1}, journal={Sci Rep}, author={Zietlow, Christian and Lindner, Jörg},
    year={2025}, pages={3815} }'
  chicago: 'Zietlow, Christian, and Jörg Lindner. “An Applied Noise Model for Scintillation-Based
    CCD Detectors in Transmission Electron Microscopy.” <i>Sci Rep</i> 15, no. 1 (2025):
    3815. <a href="https://doi.org/10.1038/s41598-025-85982-4">https://doi.org/10.1038/s41598-025-85982-4</a>.'
  ieee: 'C. Zietlow and J. Lindner, “An applied noise model for scintillation-based
    CCD detectors in transmission electron microscopy.,” <i>Sci Rep</i>, vol. 15,
    no. 1, p. 3815, 2025, doi: <a href="https://doi.org/10.1038/s41598-025-85982-4">10.1038/s41598-025-85982-4</a>.'
  mla: Zietlow, Christian, and Jörg Lindner. “An Applied Noise Model for Scintillation-Based
    CCD Detectors in Transmission Electron Microscopy.” <i>Sci Rep</i>, vol. 15, no.
    1, 2025, p. 3815, doi:<a href="https://doi.org/10.1038/s41598-025-85982-4">10.1038/s41598-025-85982-4</a>.
  short: C. Zietlow, J. Lindner, Sci Rep 15 (2025) 3815.
date_created: 2025-03-28T07:03:45Z
date_updated: 2026-02-04T07:49:19Z
department:
- _id: '15'
doi: 10.1038/s41598-025-85982-4
external_id:
  pmid:
  - '39885260'
intvolume: '        15'
issue: '1'
language:
- iso: eng
main_file_link:
- open_access: '1'
oa: '1'
page: '3815'
pmid: '1'
publication: Sci Rep
publication_identifier:
  issn:
  - 2045-2322
publication_status: published
quality_controlled: '1'
status: public
title: An applied noise model for scintillation-based CCD detectors in transmission
  electron microscopy.
type: journal_article
user_id: '77368'
volume: 15
year: '2025'
...
---
_id: '60001'
article_type: original
author:
- first_name: Christian
  full_name: Zietlow, Christian
  id: '77368'
  last_name: Zietlow
  orcid: https://orcid.org/0000-0001-9696-619X
- first_name: Jörg
  full_name: Lindner, Jörg
  id: '20797'
  last_name: Lindner
citation:
  ama: Zietlow C, Lindner J. An unbiased ADMM-TGV algorithm for the deconvolution
    of STEM-EELS maps. <i>Ultramicroscopy</i>. 2025;(275). doi:<a href="https://doi.org/10.1016/j.ultramic.2025.114159">10.1016/j.ultramic.2025.114159</a>
  apa: Zietlow, C., &#38; Lindner, J. (2025). An unbiased ADMM-TGV algorithm for the
    deconvolution of STEM-EELS maps. <i>Ultramicroscopy</i>, <i>275</i>. <a href="https://doi.org/10.1016/j.ultramic.2025.114159">https://doi.org/10.1016/j.ultramic.2025.114159</a>
  bibtex: '@article{Zietlow_Lindner_2025, title={An unbiased ADMM-TGV algorithm for
    the deconvolution of STEM-EELS maps}, DOI={<a href="https://doi.org/10.1016/j.ultramic.2025.114159">10.1016/j.ultramic.2025.114159</a>},
    number={275}, journal={Ultramicroscopy}, publisher={Elsevier}, author={Zietlow,
    Christian and Lindner, Jörg}, year={2025} }'
  chicago: Zietlow, Christian, and Jörg Lindner. “An Unbiased ADMM-TGV Algorithm for
    the Deconvolution of STEM-EELS Maps.” <i>Ultramicroscopy</i>, no. 275 (2025).
    <a href="https://doi.org/10.1016/j.ultramic.2025.114159">https://doi.org/10.1016/j.ultramic.2025.114159</a>.
  ieee: 'C. Zietlow and J. Lindner, “An unbiased ADMM-TGV algorithm for the deconvolution
    of STEM-EELS maps,” <i>Ultramicroscopy</i>, no. 275, 2025, doi: <a href="https://doi.org/10.1016/j.ultramic.2025.114159">10.1016/j.ultramic.2025.114159</a>.'
  mla: Zietlow, Christian, and Jörg Lindner. “An Unbiased ADMM-TGV Algorithm for the
    Deconvolution of STEM-EELS Maps.” <i>Ultramicroscopy</i>, no. 275, Elsevier, 2025,
    doi:<a href="https://doi.org/10.1016/j.ultramic.2025.114159">10.1016/j.ultramic.2025.114159</a>.
  short: C. Zietlow, J. Lindner, Ultramicroscopy (2025).
date_created: 2025-05-20T11:33:24Z
date_updated: 2026-02-04T07:50:40Z
department:
- _id: '286'
- _id: '15'
doi: 10.1016/j.ultramic.2025.114159
external_id:
  pmid:
  - '40398071'
issue: '275'
language:
- iso: eng
main_file_link:
- open_access: '1'
oa: '1'
pmid: '1'
publication: Ultramicroscopy
publication_status: published
publisher: Elsevier
quality_controlled: '1'
status: public
title: An unbiased ADMM-TGV algorithm for the deconvolution of STEM-EELS maps
type: journal_article
user_id: '77368'
year: '2025'
...
---
_id: '63856'
abstract:
- lang: eng
  text: Electron energy-loss spectroscopy (EELS) is an advanced analytical technique
    in transmission electron microscopy, as it provides insights into material characteristics,
    such as electronic properties or elemental composition, at the atomic scale. The
    precision of every EELS analysis, however, is inherently limited by noises and
    blur. This thesis offers a comprehensive understanding of the noise, which is
    particularly valuable at low dwell times necessary for beam sensitive materials
    and for electron-matter interactions with low frequency of occurrence, where the
    noise dominates the measurement. Additionally, correlations encountered in the
    noise of an EELS measurement are described from both a theoretical and experimental
    perspective. These correlations are caused by a convolution of the noisy signal
    with the detector point spread function. Methods for characterizing key noise
    parameters of typical detectors are described, allowing the noise model to be
    tailored to any EELS detector. Ultimately, a novel deconvolution method enabling
    significant sharpening and denoising of EELS measurements is introduced and demonstrated.
    Its efficiency is further validated on both simulation and experimental data.
    The described advancement offered by the proposed deconvolution method enables
    the extension of current electron microscope capabilities, facilitating analysis
    that would be unfeasible with existing deconvolution techniques.
author:
- first_name: Christian
  full_name: Zietlow, Christian
  id: '77368'
  last_name: Zietlow
  orcid: https://orcid.org/0000-0001-9696-619X
citation:
  ama: Zietlow C. <i>A Novel Lagrangian-Based Method for the Deconvolution of Electron
    Energy-Loss Spectra</i>. Universitätsbibliothek Paderborn; 2025. doi:<a href="https://doi.org/10.17619/UNIPB/1-2438">10.17619/UNIPB/1-2438</a>
  apa: Zietlow, C. (2025). <i>A novel Lagrangian-based method for the deconvolution
    of electron energy-loss spectra</i>. Universitätsbibliothek Paderborn. <a href="https://doi.org/10.17619/UNIPB/1-2438">https://doi.org/10.17619/UNIPB/1-2438</a>
  bibtex: '@book{Zietlow_2025, title={A novel Lagrangian-based method for the deconvolution
    of electron energy-loss spectra}, DOI={<a href="https://doi.org/10.17619/UNIPB/1-2438">10.17619/UNIPB/1-2438</a>},
    publisher={Universitätsbibliothek Paderborn}, author={Zietlow, Christian}, year={2025}
    }'
  chicago: Zietlow, Christian. <i>A Novel Lagrangian-Based Method for the Deconvolution
    of Electron Energy-Loss Spectra</i>. Universitätsbibliothek Paderborn, 2025. <a
    href="https://doi.org/10.17619/UNIPB/1-2438">https://doi.org/10.17619/UNIPB/1-2438</a>.
  ieee: C. Zietlow, <i>A novel Lagrangian-based method for the deconvolution of electron
    energy-loss spectra</i>. Universitätsbibliothek Paderborn, 2025.
  mla: Zietlow, Christian. <i>A Novel Lagrangian-Based Method for the Deconvolution
    of Electron Energy-Loss Spectra</i>. Universitätsbibliothek Paderborn, 2025, doi:<a
    href="https://doi.org/10.17619/UNIPB/1-2438">10.17619/UNIPB/1-2438</a>.
  short: C. Zietlow, A Novel Lagrangian-Based Method for the Deconvolution of Electron
    Energy-Loss Spectra, Universitätsbibliothek Paderborn, 2025.
date_created: 2026-02-04T06:57:14Z
date_updated: 2026-02-04T12:28:17Z
department:
- _id: '15'
doi: 10.17619/UNIPB/1-2438
language:
- iso: eng
main_file_link:
- open_access: '1'
oa: '1'
publication_status: published
publisher: Universitätsbibliothek Paderborn
related_material:
  link:
  - relation: software
    url: https://doi.org/10.17619/UNIPB/1-2438
status: public
supervisor:
- first_name: Jörg K. N.
  full_name: Lindner, Jörg K. N.
  id: '20797'
  last_name: Lindner
title: A novel Lagrangian-based method for the deconvolution of electron energy-loss
  spectra
type: dissertation
user_id: '77368'
year: '2025'
...
---
_id: '59179'
article_type: original
author:
- first_name: Christian
  full_name: Zietlow, Christian
  id: '77368'
  last_name: Zietlow
  orcid: https://orcid.org/0000-0001-9696-619X
- first_name: Jörg
  full_name: Lindner, Jörg
  id: '20797'
  last_name: Lindner
citation:
  ama: Zietlow C, Lindner J. ADMM-TGV image restoration for scientific applications
    with unbiased parameter choice. <i>Numerical Algorithms</i>. 2024;97(4):1481-1512.
    doi:<a href="https://doi.org/10.1007/s11075-024-01759-2">10.1007/s11075-024-01759-2</a>
  apa: Zietlow, C., &#38; Lindner, J. (2024). ADMM-TGV image restoration for scientific
    applications with unbiased parameter choice. <i>Numerical Algorithms</i>, <i>97</i>(4),
    1481–1512. <a href="https://doi.org/10.1007/s11075-024-01759-2">https://doi.org/10.1007/s11075-024-01759-2</a>
  bibtex: '@article{Zietlow_Lindner_2024, title={ADMM-TGV image restoration for scientific
    applications with unbiased parameter choice}, volume={97}, DOI={<a href="https://doi.org/10.1007/s11075-024-01759-2">10.1007/s11075-024-01759-2</a>},
    number={4}, journal={Numerical Algorithms}, publisher={Springer Science and Business
    Media LLC}, author={Zietlow, Christian and Lindner, Jörg}, year={2024}, pages={1481–1512}
    }'
  chicago: 'Zietlow, Christian, and Jörg Lindner. “ADMM-TGV Image Restoration for
    Scientific Applications with Unbiased Parameter Choice.” <i>Numerical Algorithms</i>
    97, no. 4 (2024): 1481–1512. <a href="https://doi.org/10.1007/s11075-024-01759-2">https://doi.org/10.1007/s11075-024-01759-2</a>.'
  ieee: 'C. Zietlow and J. Lindner, “ADMM-TGV image restoration for scientific applications
    with unbiased parameter choice,” <i>Numerical Algorithms</i>, vol. 97, no. 4,
    pp. 1481–1512, 2024, doi: <a href="https://doi.org/10.1007/s11075-024-01759-2">10.1007/s11075-024-01759-2</a>.'
  mla: Zietlow, Christian, and Jörg Lindner. “ADMM-TGV Image Restoration for Scientific
    Applications with Unbiased Parameter Choice.” <i>Numerical Algorithms</i>, vol.
    97, no. 4, Springer Science and Business Media LLC, 2024, pp. 1481–512, doi:<a
    href="https://doi.org/10.1007/s11075-024-01759-2">10.1007/s11075-024-01759-2</a>.
  short: C. Zietlow, J. Lindner, Numerical Algorithms 97 (2024) 1481–1512.
date_created: 2025-03-28T07:10:05Z
date_updated: 2026-02-04T07:54:06Z
doi: 10.1007/s11075-024-01759-2
intvolume: '        97'
issue: '4'
language:
- iso: eng
main_file_link:
- open_access: '1'
oa: '1'
page: 1481-1512
publication: Numerical Algorithms
publication_identifier:
  issn:
  - 1017-1398
  - 1572-9265
publication_status: published
publisher: Springer Science and Business Media LLC
quality_controlled: '1'
status: public
title: ADMM-TGV image restoration for scientific applications with unbiased parameter
  choice
type: journal_article
user_id: '77368'
volume: 97
year: '2024'
...