[{"title":"Applying Risk Management to Support SLA Provisioning","author":[{"first_name":"Dominic","last_name":"Battre","full_name":"Battre, Dominic"},{"first_name":"Georg","full_name":"Birkenheuer, Georg","last_name":"Birkenheuer"},{"full_name":"Hovestadt, Matthias","last_name":"Hovestadt","first_name":"Matthias"},{"first_name":"Odej","last_name":"Kao","full_name":"Kao, Odej"},{"first_name":"Kerstin","last_name":"Voss","full_name":"Voss, Kerstin"}],"date_created":"2018-04-17T12:50:12Z","user_id":"24135","department":[{"_id":"27"}],"date_updated":"2022-01-06T06:56:02Z","_id":"2387","citation":{"apa":"Battre, D., Birkenheuer, G., Hovestadt, M., Kao, O., &#38; Voss, K. (2008). Applying Risk Management to Support SLA Provisioning. In <i>Proc. Cracow Grid Workshop (CGW)</i>.","bibtex":"@inproceedings{Battre_Birkenheuer_Hovestadt_Kao_Voss_2008, title={Applying Risk Management to Support SLA Provisioning}, booktitle={Proc. Cracow Grid Workshop (CGW)}, author={Battre, Dominic and Birkenheuer, Georg and Hovestadt, Matthias and Kao, Odej and Voss, Kerstin}, year={2008} }","short":"D. Battre, G. Birkenheuer, M. Hovestadt, O. Kao, K. Voss, in: Proc. Cracow Grid Workshop (CGW), 2008.","mla":"Battre, Dominic, et al. “Applying Risk Management to Support SLA Provisioning.” <i>Proc. Cracow Grid Workshop (CGW)</i>, 2008.","ieee":"D. Battre, G. Birkenheuer, M. Hovestadt, O. Kao, and K. Voss, “Applying Risk Management to Support SLA Provisioning,” in <i>Proc. Cracow Grid Workshop (CGW)</i>, 2008.","chicago":"Battre, Dominic, Georg Birkenheuer, Matthias Hovestadt, Odej Kao, and Kerstin Voss. “Applying Risk Management to Support SLA Provisioning.” In <i>Proc. Cracow Grid Workshop (CGW)</i>, 2008.","ama":"Battre D, Birkenheuer G, Hovestadt M, Kao O, Voss K. Applying Risk Management to Support SLA Provisioning. In: <i>Proc. Cracow Grid Workshop (CGW)</i>. ; 2008."},"status":"public","year":"2008","type":"conference","publication":"Proc. Cracow Grid Workshop (CGW)"},{"status":"public","publication":"Proc. Usage of Service Level Agreements in Grids Workshop held in conjunction with International Conference on Grid Computing","type":"conference","department":[{"_id":"27"}],"user_id":"24135","_id":"2388","page":"409-418","citation":{"ieee":"D. Battré, O. Kao, and K. Voss, “Implementing WS-Agreement in a Globus Toolkit 4.0 Environment,” in <i>Proc. Usage of Service Level Agreements in Grids Workshop held in conjunction with International Conference on Grid Computing</i>, 2008, pp. 409–418.","chicago":"Battré, Dominic, Odej Kao, and Kerstin Voss. “Implementing WS-Agreement in a Globus Toolkit 4.0 Environment.” In <i>Proc. Usage of Service Level Agreements in Grids Workshop Held in Conjunction with International Conference on Grid Computing</i>, 409–18. Boston: Springer, 2008. <a href=\"https://doi.org/10.1007/978-0-387-78446-5_28\">https://doi.org/10.1007/978-0-387-78446-5_28</a>.","ama":"Battré D, Kao O, Voss K. Implementing WS-Agreement in a Globus Toolkit 4.0 Environment. In: <i>Proc. Usage of Service Level Agreements in Grids Workshop Held in Conjunction with International Conference on Grid Computing</i>. Boston: Springer; 2008:409-418. doi:<a href=\"https://doi.org/10.1007/978-0-387-78446-5_28\">10.1007/978-0-387-78446-5_28</a>","apa":"Battré, D., Kao, O., &#38; Voss, K. (2008). Implementing WS-Agreement in a Globus Toolkit 4.0 Environment. In <i>Proc. Usage of Service Level Agreements in Grids Workshop held in conjunction with International Conference on Grid Computing</i> (pp. 409–418). Boston: Springer. <a href=\"https://doi.org/10.1007/978-0-387-78446-5_28\">https://doi.org/10.1007/978-0-387-78446-5_28</a>","bibtex":"@inproceedings{Battré_Kao_Voss_2008, place={Boston}, title={Implementing WS-Agreement in a Globus Toolkit 4.0 Environment}, DOI={<a href=\"https://doi.org/10.1007/978-0-387-78446-5_28\">10.1007/978-0-387-78446-5_28</a>}, booktitle={Proc. Usage of Service Level Agreements in Grids Workshop held in conjunction with International Conference on Grid Computing}, publisher={Springer}, author={Battré, Dominic and Kao, Odej and Voss, Kerstin}, year={2008}, pages={409–418} }","mla":"Battré, Dominic, et al. “Implementing WS-Agreement in a Globus Toolkit 4.0 Environment.” <i>Proc. Usage of Service Level Agreements in Grids Workshop Held in Conjunction with International Conference on Grid Computing</i>, Springer, 2008, pp. 409–18, doi:<a href=\"https://doi.org/10.1007/978-0-387-78446-5_28\">10.1007/978-0-387-78446-5_28</a>.","short":"D. Battré, O. Kao, K. Voss, in: Proc. Usage of Service Level Agreements in Grids Workshop Held in Conjunction with International Conference on Grid Computing, Springer, Boston, 2008, pp. 409–418."},"year":"2008","place":"Boston","doi":"10.1007/978-0-387-78446-5_28","title":"Implementing WS-Agreement in a Globus Toolkit 4.0 Environment","author":[{"first_name":"Dominic","last_name":"Battré","full_name":"Battré, Dominic"},{"full_name":"Kao, Odej","last_name":"Kao","first_name":"Odej"},{"first_name":"Kerstin","last_name":"Voss","full_name":"Voss, Kerstin"}],"date_created":"2018-04-17T12:50:56Z","date_updated":"2022-01-06T06:56:02Z","publisher":"Springer"},{"abstract":[{"lang":"ger","text":"Dieser Artikel beschreibt eine Methode zur Animation einer großen Anzahl von Objekten zur dynamischen 3D-Visualisierung eines Simulationsmodells mittels der Materialflusssimulation auf Basis von Schlüsselbildern. Die Anzahl zu animierender Objekte ist in komplexen Modellen zu groß, um alle Animationen flüssig darzustellen. Dynamisch abgestuft wählt das entwickelte Verfahren gezielt wichtige Animationen aus, weniger relevante Animationen werden entsprechend seltener animiert. Die Selektion der Animationen erfolgt nach der projizierten Größe der Objekte auf das Ausgabegerät, um einen guten optischen Eindruck beizubehalten. Angepasst an die Leistungsfähigkeit des Rechners wird das Verfahren so geregelt, dass die Visualisierung einer hohen Anzahl von Objekten in Echtzeit möglich bleibt. Das Verfahren ist in einem Editor prototypisch implementiert, mit dem Schlüsselbilder für Objekte erzeugt werden können. Das Gruppieren von Objekten wird erlaubt, so dass eine Hierarchie von Bewegungspfaden definierbar ist. Die Evaluierung der Methode wird mittels Testszenen durchgeführt, die aus mehreren zehntausend animierten Objekten bestehen."}],"status":"public","publication":"Augmented & Virtual Reality in der Produktentstehung","type":"conference","language":[{"iso":"eng"}],"_id":"18141","department":[{"_id":"63"},{"_id":"26"}],"user_id":"5786","year":"2008","page":"193--206","intvolume":"       232","citation":{"short":"C. Laroque, M. Fischer, B. Eikel, in: Augmented &#38; Virtual Reality in Der Produktentstehung, Verlagsschriftenreihe des Heinz Nixdorf Instituts, Paderborn, 2008, pp. 193--206.","bibtex":"@inproceedings{Laroque_Fischer_Eikel_2008, title={Regelung von Animationen in Simulationen von  hochdynamischen Fabrikszenen }, volume={232}, booktitle={Augmented &#38; Virtual Reality in der Produktentstehung}, publisher={Verlagsschriftenreihe des Heinz Nixdorf Instituts, Paderborn}, author={Laroque, Christoph and Fischer, Matthias and Eikel, Benjamin}, year={2008}, pages={193--206} }","mla":"Laroque, Christoph, et al. “Regelung von Animationen in Simulationen von  Hochdynamischen Fabrikszenen .” <i>Augmented &#38; Virtual Reality in Der Produktentstehung</i>, vol. 232, Verlagsschriftenreihe des Heinz Nixdorf Instituts, Paderborn, 2008, pp. 193--206.","apa":"Laroque, C., Fischer, M., &#38; Eikel, B. (2008). Regelung von Animationen in Simulationen von  hochdynamischen Fabrikszenen . <i>Augmented &#38; Virtual Reality in Der Produktentstehung</i>, <i>232</i>, 193--206.","chicago":"Laroque, Christoph, Matthias Fischer, and Benjamin Eikel. “Regelung von Animationen in Simulationen von  Hochdynamischen Fabrikszenen .” In <i>Augmented &#38; Virtual Reality in Der Produktentstehung</i>, 232:193--206. Verlagsschriftenreihe des Heinz Nixdorf Instituts, Paderborn, 2008.","ieee":"C. Laroque, M. Fischer, and B. Eikel, “Regelung von Animationen in Simulationen von  hochdynamischen Fabrikszenen ,” in <i>Augmented &#38; Virtual Reality in der Produktentstehung</i>, 2008, vol. 232, pp. 193--206.","ama":"Laroque C, Fischer M, Eikel B. Regelung von Animationen in Simulationen von  hochdynamischen Fabrikszenen . In: <i>Augmented &#38; Virtual Reality in Der Produktentstehung</i>. Vol 232. Verlagsschriftenreihe des Heinz Nixdorf Instituts, Paderborn; 2008:193--206."},"title":"Regelung von Animationen in Simulationen von  hochdynamischen Fabrikszenen ","date_updated":"2022-01-06T06:53:26Z","publisher":"Verlagsschriftenreihe des Heinz Nixdorf Instituts, Paderborn","volume":232,"author":[{"last_name":"Laroque","full_name":"Laroque, Christoph","first_name":"Christoph"},{"first_name":"Matthias","id":"146","full_name":"Fischer, Matthias","last_name":"Fischer"},{"first_name":"Benjamin","last_name":"Eikel","full_name":"Eikel, Benjamin"}],"date_created":"2020-08-24T07:56:43Z"},{"publication":"Microelectronics Journal","type":"journal_article","status":"public","abstract":[{"text":"We have investigated the properties of neutral and charged excitons in single CdSe/ZnSe QD photodiodes by μ-photoluminescence spectroscopy. By applying a bias voltage, we have been able to control the number of electrons in a single QD by shifting the energy levels of the QD with respect to the Fermi level in the back contact. Also the quantum-confined Stark effect was observed as a function of the applied electric field.","lang":"eng"}],"department":[{"_id":"15"},{"_id":"230"},{"_id":"35"}],"user_id":"49428","_id":"4554","language":[{"iso":"eng"}],"keyword":["CdSe quantum dots","Photodiode","Stark effect"],"article_type":"original","issue":"2","publication_identifier":{"issn":["0026-2692"]},"publication_status":"published","intvolume":"        40","page":"215-217","citation":{"ama":"de Vasconcellos SM, Pawlis A, Arens C, et al. Exciton spectroscopy on single CdSe/ZnSe quantum dot photodiodes. <i>Microelectronics Journal</i>. 2008;40(2):215-217. doi:<a href=\"https://doi.org/10.1016/j.mejo.2008.07.055\">10.1016/j.mejo.2008.07.055</a>","chicago":"Vasconcellos, S. Michaelis de, A. Pawlis, C. Arens, M. Panfilova, Artur Zrenner, D. Schikora, and K. Lischka. “Exciton Spectroscopy on Single CdSe/ZnSe Quantum Dot Photodiodes.” <i>Microelectronics Journal</i> 40, no. 2 (2008): 215–17. <a href=\"https://doi.org/10.1016/j.mejo.2008.07.055\">https://doi.org/10.1016/j.mejo.2008.07.055</a>.","ieee":"S. M. de Vasconcellos <i>et al.</i>, “Exciton spectroscopy on single CdSe/ZnSe quantum dot photodiodes,” <i>Microelectronics Journal</i>, vol. 40, no. 2, pp. 215–217, 2008.","bibtex":"@article{de Vasconcellos_Pawlis_Arens_Panfilova_Zrenner_Schikora_Lischka_2008, title={Exciton spectroscopy on single CdSe/ZnSe quantum dot photodiodes}, volume={40}, DOI={<a href=\"https://doi.org/10.1016/j.mejo.2008.07.055\">10.1016/j.mejo.2008.07.055</a>}, number={2}, journal={Microelectronics Journal}, publisher={Elsevier BV}, author={de Vasconcellos, S. Michaelis and Pawlis, A. and Arens, C. and Panfilova, M. and Zrenner, Artur and Schikora, D. and Lischka, K.}, year={2008}, pages={215–217} }","short":"S.M. de Vasconcellos, A. Pawlis, C. Arens, M. Panfilova, A. Zrenner, D. Schikora, K. Lischka, Microelectronics Journal 40 (2008) 215–217.","mla":"de Vasconcellos, S. Michaelis, et al. “Exciton Spectroscopy on Single CdSe/ZnSe Quantum Dot Photodiodes.” <i>Microelectronics Journal</i>, vol. 40, no. 2, Elsevier BV, 2008, pp. 215–17, doi:<a href=\"https://doi.org/10.1016/j.mejo.2008.07.055\">10.1016/j.mejo.2008.07.055</a>.","apa":"de Vasconcellos, S. M., Pawlis, A., Arens, C., Panfilova, M., Zrenner, A., Schikora, D., &#38; Lischka, K. (2008). Exciton spectroscopy on single CdSe/ZnSe quantum dot photodiodes. <i>Microelectronics Journal</i>, <i>40</i>(2), 215–217. <a href=\"https://doi.org/10.1016/j.mejo.2008.07.055\">https://doi.org/10.1016/j.mejo.2008.07.055</a>"},"year":"2008","volume":40,"date_created":"2018-09-20T13:37:03Z","author":[{"first_name":"S. Michaelis","full_name":"de Vasconcellos, S. Michaelis","last_name":"de Vasconcellos"},{"full_name":"Pawlis, A.","last_name":"Pawlis","first_name":"A."},{"full_name":"Arens, C.","last_name":"Arens","first_name":"C."},{"first_name":"M.","last_name":"Panfilova","full_name":"Panfilova, M."},{"first_name":"Artur","id":"606","full_name":"Zrenner, Artur","last_name":"Zrenner","orcid":"0000-0002-5190-0944"},{"first_name":"D.","full_name":"Schikora, D.","last_name":"Schikora"},{"first_name":"K.","last_name":"Lischka","full_name":"Lischka, K."}],"publisher":"Elsevier BV","date_updated":"2022-01-06T07:01:09Z","doi":"10.1016/j.mejo.2008.07.055","title":"Exciton spectroscopy on single CdSe/ZnSe quantum dot photodiodes"},{"publisher":"Elsevier BV","date_created":"2018-09-20T13:39:35Z","title":"Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe microdiscs","issue":"2","year":"2008","keyword":["Raman","Photoluminescence","Microdisc","ZnSe"],"language":[{"iso":"eng"}],"publication":"Microelectronics Journal","abstract":[{"lang":"eng","text":"Semiconductor microdiscs are promising for applications in photonics and quantum-information processing, such as efficient solid-state-based single-photon emitters. Strain in the multilayer structure of those devices has an important influence on their optical properties. We present measurements of the strain distribution in ZnMgSe/ZnSe microdiscs by means of micro-photoluminescence and micro-Raman imaging. Photoluminescence measurements of microdiscs reveal substantially broadened emission lines with a shift to lower energy at the undercut part of microdiscs, indicating local relaxation in this area. The distribution of the strain in the microdiscs is obtained from an imaging micro-Raman analysis, revealing that the freestanding part of the microdiscs is free of defects."}],"date_updated":"2022-01-06T07:01:09Z","volume":40,"author":[{"last_name":"Panfilova","full_name":"Panfilova, M.","first_name":"M."},{"last_name":"Pawlis","full_name":"Pawlis, A.","first_name":"A."},{"full_name":"Arens, C.","last_name":"Arens","first_name":"C."},{"first_name":"S. Michaelis","full_name":"de Vasconcellos, S. Michaelis","last_name":"de Vasconcellos"},{"first_name":"Gerhard","id":"53","full_name":"Berth, Gerhard","last_name":"Berth"},{"first_name":"K.P.","last_name":"Hüsch","full_name":"Hüsch, K.P."},{"first_name":"V.","full_name":"Wiedemeier, V.","last_name":"Wiedemeier"},{"id":"606","full_name":"Zrenner, Artur","orcid":"0000-0002-5190-0944","last_name":"Zrenner","first_name":"Artur"},{"last_name":"Lischka","full_name":"Lischka, K.","first_name":"K."}],"doi":"10.1016/j.mejo.2008.07.056","publication_identifier":{"issn":["0026-2692"]},"publication_status":"published","page":"221-223","intvolume":"        40","citation":{"apa":"Panfilova, M., Pawlis, A., Arens, C., de Vasconcellos, S. M., Berth, G., Hüsch, K. P., … Lischka, K. (2008). Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe microdiscs. <i>Microelectronics Journal</i>, <i>40</i>(2), 221–223. <a href=\"https://doi.org/10.1016/j.mejo.2008.07.056\">https://doi.org/10.1016/j.mejo.2008.07.056</a>","bibtex":"@article{Panfilova_Pawlis_Arens_de Vasconcellos_Berth_Hüsch_Wiedemeier_Zrenner_Lischka_2008, title={Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe microdiscs}, volume={40}, DOI={<a href=\"https://doi.org/10.1016/j.mejo.2008.07.056\">10.1016/j.mejo.2008.07.056</a>}, number={2}, journal={Microelectronics Journal}, publisher={Elsevier BV}, author={Panfilova, M. and Pawlis, A. and Arens, C. and de Vasconcellos, S. Michaelis and Berth, Gerhard and Hüsch, K.P. and Wiedemeier, V. and Zrenner, Artur and Lischka, K.}, year={2008}, pages={221–223} }","short":"M. Panfilova, A. Pawlis, C. Arens, S.M. de Vasconcellos, G. Berth, K.P. Hüsch, V. Wiedemeier, A. Zrenner, K. Lischka, Microelectronics Journal 40 (2008) 221–223.","mla":"Panfilova, M., et al. “Micro-Raman Imaging and Micro-Photoluminescence Measurements of Strain in ZnMgSe/ZnSe Microdiscs.” <i>Microelectronics Journal</i>, vol. 40, no. 2, Elsevier BV, 2008, pp. 221–23, doi:<a href=\"https://doi.org/10.1016/j.mejo.2008.07.056\">10.1016/j.mejo.2008.07.056</a>.","chicago":"Panfilova, M., A. Pawlis, C. Arens, S. Michaelis de Vasconcellos, Gerhard Berth, K.P. Hüsch, V. Wiedemeier, Artur Zrenner, and K. Lischka. “Micro-Raman Imaging and Micro-Photoluminescence Measurements of Strain in ZnMgSe/ZnSe Microdiscs.” <i>Microelectronics Journal</i> 40, no. 2 (2008): 221–23. <a href=\"https://doi.org/10.1016/j.mejo.2008.07.056\">https://doi.org/10.1016/j.mejo.2008.07.056</a>.","ieee":"M. Panfilova <i>et al.</i>, “Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe microdiscs,” <i>Microelectronics Journal</i>, vol. 40, no. 2, pp. 221–223, 2008.","ama":"Panfilova M, Pawlis A, Arens C, et al. Micro-Raman imaging and micro-photoluminescence measurements of strain in ZnMgSe/ZnSe microdiscs. <i>Microelectronics Journal</i>. 2008;40(2):221-223. doi:<a href=\"https://doi.org/10.1016/j.mejo.2008.07.056\">10.1016/j.mejo.2008.07.056</a>"},"_id":"4555","department":[{"_id":"15"},{"_id":"230"},{"_id":"35"}],"user_id":"49428","article_type":"original","type":"journal_article","status":"public"},{"language":[{"iso":"eng"}],"abstract":[{"lang":"eng","text":"The optical properties of semiconductor quantum dots are in many respects similar to those of atoms. Since quantum dots can be defined by state-of-the-art semiconductor technologies, they exhibit long-term stability and allow for well-controlled and efficient interactions with both optical and electrical fields. Resonant ps excitation of single quantum dot photodiodes leads to new classes of coherent optoelectronic functions and devices, which exhibit precise state preparation, phase-sensitive optical manipulations and the control of quantum states by electrical fields."}],"publication":"Journal of Physics: Condensed Matter","title":"Coherent optoelectronics with single quantum dots","date_created":"2018-09-20T13:51:11Z","publisher":"IOP Publishing","year":"2008","issue":"45","article_type":"original","article_number":"454210","department":[{"_id":"15"},{"_id":"230"},{"_id":"35"}],"user_id":"49428","_id":"4557","status":"public","type":"journal_article","doi":"10.1088/0953-8984/20/45/454210","volume":20,"author":[{"last_name":"Zrenner","orcid":"0000-0002-5190-0944","id":"606","full_name":"Zrenner, Artur","first_name":"Artur"},{"last_name":"Ester","full_name":"Ester, P","first_name":"P"},{"full_name":"Michaelis de Vasconcellos, S","last_name":"Michaelis de Vasconcellos","first_name":"S"},{"full_name":"Hübner, M C","last_name":"Hübner","first_name":"M C"},{"last_name":"Lackmann","full_name":"Lackmann, L","first_name":"L"},{"full_name":"Stufler, S","last_name":"Stufler","first_name":"S"},{"last_name":"Bichler","full_name":"Bichler, M","first_name":"M"}],"date_updated":"2022-01-06T07:01:09Z","intvolume":"        20","citation":{"chicago":"Zrenner, Artur, P Ester, S Michaelis de Vasconcellos, M C Hübner, L Lackmann, S Stufler, and M Bichler. “Coherent Optoelectronics with Single Quantum Dots.” <i>Journal of Physics: Condensed Matter</i> 20, no. 45 (2008). <a href=\"https://doi.org/10.1088/0953-8984/20/45/454210\">https://doi.org/10.1088/0953-8984/20/45/454210</a>.","ieee":"A. Zrenner <i>et al.</i>, “Coherent optoelectronics with single quantum dots,” <i>Journal of Physics: Condensed Matter</i>, vol. 20, no. 45, 2008.","ama":"Zrenner A, Ester P, Michaelis de Vasconcellos S, et al. Coherent optoelectronics with single quantum dots. <i>Journal of Physics: Condensed Matter</i>. 2008;20(45). doi:<a href=\"https://doi.org/10.1088/0953-8984/20/45/454210\">10.1088/0953-8984/20/45/454210</a>","short":"A. Zrenner, P. Ester, S. Michaelis de Vasconcellos, M.C. Hübner, L. Lackmann, S. Stufler, M. Bichler, Journal of Physics: Condensed Matter 20 (2008).","mla":"Zrenner, Artur, et al. “Coherent Optoelectronics with Single Quantum Dots.” <i>Journal of Physics: Condensed Matter</i>, vol. 20, no. 45, 454210, IOP Publishing, 2008, doi:<a href=\"https://doi.org/10.1088/0953-8984/20/45/454210\">10.1088/0953-8984/20/45/454210</a>.","bibtex":"@article{Zrenner_Ester_Michaelis de Vasconcellos_Hübner_Lackmann_Stufler_Bichler_2008, title={Coherent optoelectronics with single quantum dots}, volume={20}, DOI={<a href=\"https://doi.org/10.1088/0953-8984/20/45/454210\">10.1088/0953-8984/20/45/454210</a>}, number={45454210}, journal={Journal of Physics: Condensed Matter}, publisher={IOP Publishing}, author={Zrenner, Artur and Ester, P and Michaelis de Vasconcellos, S and Hübner, M C and Lackmann, L and Stufler, S and Bichler, M}, year={2008} }","apa":"Zrenner, A., Ester, P., Michaelis de Vasconcellos, S., Hübner, M. C., Lackmann, L., Stufler, S., &#38; Bichler, M. (2008). Coherent optoelectronics with single quantum dots. <i>Journal of Physics: Condensed Matter</i>, <i>20</i>(45). <a href=\"https://doi.org/10.1088/0953-8984/20/45/454210\">https://doi.org/10.1088/0953-8984/20/45/454210</a>"},"publication_identifier":{"issn":["0953-8984","1361-648X"]},"publication_status":"published"},{"language":[{"iso":"eng"}],"user_id":"20798","department":[{"_id":"15"},{"_id":"35"},{"_id":"230"},{"_id":"287"}],"_id":"7500","status":"public","type":"book_chapter","publication":"Advances in Solid State Physics","doi":"10.1007/978-3-540-85859-1_7","title":"Silicon Nanoparticles: Excitonic Fine Structure and Oscillator Strength","date_created":"2019-02-04T14:48:51Z","author":[{"full_name":"Meier, Cedrik","id":"20798","orcid":"https://orcid.org/0000-0002-3787-3572","last_name":"Meier","first_name":"Cedrik"},{"first_name":"Stephan","full_name":"Lüttjohann, Stephan","last_name":"Lüttjohann"},{"first_name":"Matthias","last_name":"Offer","full_name":"Offer, Matthias"},{"first_name":"Hartmut","full_name":"Wiggers, Hartmut","last_name":"Wiggers"},{"full_name":"Lorke, Axel","last_name":"Lorke","first_name":"Axel"}],"date_updated":"2022-01-06T07:03:39Z","publisher":"Springer Berlin Heidelberg","citation":{"ama":"Meier C, Lüttjohann S, Offer M, Wiggers H, Lorke A. Silicon Nanoparticles: Excitonic Fine Structure and Oscillator Strength. In: <i>Advances in Solid State Physics</i>. Berlin, Heidelberg: Springer Berlin Heidelberg; 2008:79-90. doi:<a href=\"https://doi.org/10.1007/978-3-540-85859-1_7\">10.1007/978-3-540-85859-1_7</a>","chicago":"Meier, Cedrik, Stephan Lüttjohann, Matthias Offer, Hartmut Wiggers, and Axel Lorke. “Silicon Nanoparticles: Excitonic Fine Structure and Oscillator Strength.” In <i>Advances in Solid State Physics</i>, 79–90. Berlin, Heidelberg: Springer Berlin Heidelberg, 2008. <a href=\"https://doi.org/10.1007/978-3-540-85859-1_7\">https://doi.org/10.1007/978-3-540-85859-1_7</a>.","ieee":"C. Meier, S. Lüttjohann, M. Offer, H. Wiggers, and A. Lorke, “Silicon Nanoparticles: Excitonic Fine Structure and Oscillator Strength,” in <i>Advances in Solid State Physics</i>, Berlin, Heidelberg: Springer Berlin Heidelberg, 2008, pp. 79–90.","apa":"Meier, C., Lüttjohann, S., Offer, M., Wiggers, H., &#38; Lorke, A. (2008). Silicon Nanoparticles: Excitonic Fine Structure and Oscillator Strength. In <i>Advances in Solid State Physics</i> (pp. 79–90). 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