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(2020). <i>Integrating Score Rendition in the MEI Garage</i>. Music Encoding Conference 2020, Tufts University, Medford, MA, USA.","mla":"Rettinghaus, Klaus, et al. <i>Integrating Score Rendition in the MEI Garage</i>. 2020.","bibtex":"@inproceedings{Rettinghaus_Röwenstrunk_Kepper_2020, title={Integrating Score Rendition in the MEI Garage}, author={Rettinghaus, Klaus and Röwenstrunk, Daniel and Kepper, Johannes}, year={2020} }","short":"K. Rettinghaus, D. Röwenstrunk, J. Kepper, in: 2020."},"title":"Integrating Score Rendition in the MEI Garage","conference":{"location":"Tufts University, Medford, MA, USA","end_date":"2020-05-29","start_date":"2020-05-26","name":"Music Encoding Conference 2020"},"date_updated":"2022-01-06T06:57:40Z","author":[{"full_name":"Rettinghaus, Klaus","last_name":"Rettinghaus","first_name":"Klaus"},{"first_name":"Daniel","full_name":"Röwenstrunk, Daniel","last_name":"Röwenstrunk"},{"first_name":"Johannes","full_name":"Kepper, Johannes","last_name":"Kepper"}],"date_created":"2021-11-15T14:04:57Z"},{"date_updated":"2022-01-06T06:57:43Z","_id":"27642","user_id":"44116","date_created":"2021-11-22T07:12:17Z","author":[{"first_name":"Matthias ","last_name":"Hüttner ","full_name":"Hüttner , Matthias "}],"department":[{"_id":"9"},{"_id":"367"},{"_id":"321"}],"title":"Einfluss umgebungsbedingter Alterung auf das Werkstoffverhalten unverstärkter, kurzfaserverstärkter und gewebeverstärkter Thermoplaste ","language":[{"iso":"eng"}],"type":"dissertation","year":"2020","citation":{"ama":"Hüttner  M. <i>Einfluss Umgebungsbedingter Alterung Auf Das Werkstoffverhalten Unverstärkter, Kurzfaserverstärkter Und Gewebeverstärkter Thermoplaste </i>.; 2020.","chicago":"Hüttner , Matthias . <i>Einfluss Umgebungsbedingter Alterung Auf Das Werkstoffverhalten Unverstärkter, Kurzfaserverstärkter Und Gewebeverstärkter Thermoplaste </i>, 2020.","ieee":"M. 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Heiderich, <i>Modellbasierte Beschreibung und Validierung der Glasfaserverkürzung im Spritzgießplastifizieraggregat mittels analytischer und und diskreter Ansätze </i>. 2020.","ama":"Heiderich G. <i>Modellbasierte Beschreibung Und Validierung Der Glasfaserverkürzung Im Spritzgießplastifizieraggregat Mittels Analytischer Und Und Diskreter Ansätze </i>.; 2020.","apa":"Heiderich, G. (2020). <i>Modellbasierte Beschreibung und Validierung der Glasfaserverkürzung im Spritzgießplastifizieraggregat mittels analytischer und und diskreter Ansätze </i>.","bibtex":"@book{Heiderich_2020, title={Modellbasierte Beschreibung und Validierung der Glasfaserverkürzung im Spritzgießplastifizieraggregat mittels analytischer und und diskreter Ansätze }, author={Heiderich, Gilmar}, year={2020} }","short":"G. Heiderich, Modellbasierte Beschreibung Und Validierung Der Glasfaserverkürzung Im Spritzgießplastifizieraggregat Mittels Analytischer Und Und Diskreter Ansätze , 2020.","mla":"Heiderich, Gilmar. <i>Modellbasierte Beschreibung Und Validierung Der Glasfaserverkürzung Im Spritzgießplastifizieraggregat Mittels Analytischer Und Und Diskreter Ansätze </i>. 2020."},"year":"2020","user_id":"44116","department":[{"_id":"9"},{"_id":"367"},{"_id":"321"}],"_id":"27643","language":[{"iso":"eng"}],"type":"dissertation","status":"public"},{"type":"dissertation","status":"public","_id":"27644","user_id":"44116","department":[{"_id":"9"},{"_id":"367"},{"_id":"321"}],"language":[{"iso":"eng"}],"year":"2020","citation":{"apa":"Bayazian, H. (2020). <i>Evaluation of LLDPE and PLA Films Manufactured with High Speed</i>.","short":"H. Bayazian, Evaluation of LLDPE and PLA Films Manufactured with High Speed, 2020.","bibtex":"@book{Bayazian_2020, title={Evaluation of LLDPE and PLA Films Manufactured with High Speed}, author={Bayazian, Hoda}, year={2020} }","mla":"Bayazian, Hoda. <i>Evaluation of LLDPE and PLA Films Manufactured with High Speed</i>. 2020.","ieee":"H. Bayazian, <i>Evaluation of LLDPE and PLA Films Manufactured with High Speed</i>. 2020.","chicago":"Bayazian, Hoda. <i>Evaluation of LLDPE and PLA Films Manufactured with High Speed</i>, 2020.","ama":"Bayazian H. <i>Evaluation of LLDPE and PLA Films Manufactured with High Speed</i>.; 2020."},"date_updated":"2022-01-06T06:57:43Z","date_created":"2021-11-22T07:16:49Z","author":[{"full_name":"Bayazian, Hoda","last_name":"Bayazian","first_name":"Hoda"}],"title":"Evaluation of LLDPE and PLA Films Manufactured with High Speed"},{"title":"Modellierung der Materialströmung auf gleichläufigen Doppelschneckenextrudern mit Hilfe der Performance Mapping Methode","author":[{"full_name":"Sporkmann, Frederik ","last_name":"Sporkmann","first_name":"Frederik "}],"date_created":"2021-11-22T07:17:59Z","date_updated":"2022-01-06T06:57:43Z","citation":{"ama":"Sporkmann F. <i>Modellierung Der Materialströmung Auf Gleichläufigen Doppelschneckenextrudern Mit Hilfe Der Performance Mapping Methode</i>.; 2020.","ieee":"F. Sporkmann, <i>Modellierung der Materialströmung auf gleichläufigen Doppelschneckenextrudern mit Hilfe der Performance Mapping Methode</i>. 2020.","chicago":"Sporkmann, Frederik . <i>Modellierung Der Materialströmung Auf Gleichläufigen Doppelschneckenextrudern Mit Hilfe Der Performance Mapping Methode</i>, 2020.","apa":"Sporkmann, F. (2020). <i>Modellierung der Materialströmung auf gleichläufigen Doppelschneckenextrudern mit Hilfe der Performance Mapping Methode</i>.","mla":"Sporkmann, Frederik. <i>Modellierung Der Materialströmung Auf Gleichläufigen Doppelschneckenextrudern Mit Hilfe Der Performance Mapping Methode</i>. 2020.","short":"F. Sporkmann, Modellierung Der Materialströmung Auf Gleichläufigen Doppelschneckenextrudern Mit Hilfe Der Performance Mapping Methode, 2020.","bibtex":"@book{Sporkmann_2020, title={Modellierung der Materialströmung auf gleichläufigen Doppelschneckenextrudern mit Hilfe der Performance Mapping Methode}, author={Sporkmann, Frederik }, year={2020} }"},"year":"2020","language":[{"iso":"eng"}],"user_id":"44116","department":[{"_id":"9"},{"_id":"367"},{"_id":"321"}],"_id":"27645","status":"public","type":"dissertation"},{"type":"dissertation","year":"2020","citation":{"short":"V. Resonnek, Entwicklung Einer Zylindertemperatureinstellungsregelung Auf Basis von Fuzzy-Logik , 2020.","mla":"Resonnek, Verena. <i>Entwicklung Einer Zylindertemperatureinstellungsregelung Auf Basis von Fuzzy-Logik </i>. 2020.","bibtex":"@book{Resonnek_2020, title={Entwicklung einer Zylindertemperatureinstellungsregelung auf Basis von Fuzzy-Logik }, author={Resonnek, Verena}, year={2020} }","apa":"Resonnek, V. (2020). <i>Entwicklung einer Zylindertemperatureinstellungsregelung auf Basis von Fuzzy-Logik </i>.","ieee":"V. Resonnek, <i>Entwicklung einer Zylindertemperatureinstellungsregelung auf Basis von Fuzzy-Logik </i>. 2020.","chicago":"Resonnek, Verena. <i>Entwicklung Einer Zylindertemperatureinstellungsregelung Auf Basis von Fuzzy-Logik </i>, 2020.","ama":"Resonnek V. <i>Entwicklung Einer Zylindertemperatureinstellungsregelung Auf Basis von Fuzzy-Logik </i>.; 2020."},"status":"public","date_updated":"2022-01-06T06:57:43Z","_id":"27646","author":[{"first_name":"Verena","last_name":"Resonnek","full_name":"Resonnek, Verena"}],"date_created":"2021-11-22T07:19:13Z","user_id":"44116","department":[{"_id":"9"},{"_id":"367"},{"_id":"321"}],"title":"Entwicklung einer Zylindertemperatureinstellungsregelung auf Basis von Fuzzy-Logik ","language":[{"iso":"eng"}]},{"status":"public","abstract":[{"lang":"ger","text":"Die additive Fertigung mittels Laser Powderbed Fusion Verfahren (L-PBF) von Metallen wird zunehmend genutzt, um Funktionsbauteile endkonturnah zu fertigen. Die in der vor-liegenden Arbeit untersuchte Parameter- und Prozessoptimierung liefert einen Beitrag zur wirtschaftlichen Nutzung des L-PBF und zeigt, dass höhere Aufbauraten bei der ganzheit-lichen Betrachtung des Prozesses realisierbar sind.\r\nDie Parameter- und Prozessoptimierung erfordert eine Untersuchung des Einflusses der Fertigungs- und Nachbearbeitungsparameter auf das erzeugte Volumen sowie auf die Mikrostruktur und die resultierenden Materialeigenschaften. Das Ziel der vorliegenden Arbeit ist die Entwicklung einer optimierten Prozessführung mit abschließender Bewer-tung der Wirtschaftlichkeit. Mit dem entwickelten Gesamtprozess wird eine um den Faktor 1,6 höhere Aufbaurate erzielt. Des Weiteren wird die Methodik zur Erarbeitung des opti-mierten Prozessfensters beschrieben, sodass die Herangehensweise auf weitere Werk-stoffe angewendet werden kann. Die mechanischen Eigenschaften werden für den stati-schen und dynamischen Lastfall untersucht und mit der Mikrostruktur korreliert. Abschlie-ßend wird die Prozessoptimierung zur Fertigung eines Demonstrators eingesetzt und wirtschaftlich validiert. Die Ergebnisse zeigen, dass durch das hier angewendete Vorge-hen eine Prozesszeitreduktion von 22,5% und eine Kostenreduktion von 11% realisiert werden kann."}],"type":"dissertation","language":[{"iso":"ger"}],"keyword":["Additive Manufacturing","SLM"],"user_id":"11207","series_title":"Forschungsberichte des Direct Manufacturing Research Centers","department":[{"_id":"9"},{"_id":"149"},{"_id":"321"},{"_id":"219"}],"_id":"21209","citation":{"apa":"Ahlers, D. (2020). <i>Parameter- und Prozessoptimierung für den additiven Fertigungsprozess im Pulverbett am Beispiel der Legierung Ti6Al4V </i> (Vol. 19). Shaker.","short":"D. Ahlers, Parameter- und Prozessoptimierung für den additiven Fertigungsprozess im Pulverbett am Beispiel der Legierung Ti6Al4V , Shaker, 2020.","mla":"Ahlers, Dominik. <i>Parameter- und Prozessoptimierung für den additiven Fertigungsprozess im Pulverbett am Beispiel der Legierung Ti6Al4V </i>. Vol. 19, Shaker, 2020.","bibtex":"@book{Ahlers_2020, series={Forschungsberichte des Direct Manufacturing Research Centers}, title={Parameter- und Prozessoptimierung für den additiven Fertigungsprozess im Pulverbett am Beispiel der Legierung Ti6Al4V }, volume={19}, publisher={Shaker}, author={Ahlers, Dominik}, year={2020}, collection={Forschungsberichte des Direct Manufacturing Research Centers} }","ama":"Ahlers D. <i>Parameter- und Prozessoptimierung für den additiven Fertigungsprozess im Pulverbett am Beispiel der Legierung Ti6Al4V </i>. Vol 19. Shaker; 2020.","chicago":"Ahlers, Dominik. <i>Parameter- und Prozessoptimierung für den additiven Fertigungsprozess im Pulverbett am Beispiel der Legierung Ti6Al4V </i>. Vol. 19. Forschungsberichte des Direct Manufacturing Research Centers. Shaker, 2020.","ieee":"D. Ahlers, <i>Parameter- und Prozessoptimierung für den additiven Fertigungsprozess im Pulverbett am Beispiel der Legierung Ti6Al4V </i>, vol. 19. Shaker, 2020."},"page":"137","intvolume":"        19","year":"2020","publication_status":"published","publication_identifier":{"isbn":["978-3844074246","3844074244"]},"title":"Parameter- und Prozessoptimierung für den additiven Fertigungsprozess im Pulverbett am Beispiel der Legierung Ti6Al4V ","date_created":"2021-02-12T09:15:01Z","author":[{"last_name":"Ahlers","full_name":"Ahlers, Dominik","id":"11207","first_name":"Dominik"}],"volume":19,"date_updated":"2022-01-06T06:54:49Z","publisher":"Shaker"},{"department":[{"_id":"233"}],"user_id":"439","_id":"21257","language":[{"iso":"eng"}],"publication":"Research Ideas and Outcomes","type":"journal_article","status":"public","abstract":[{"text":"<jats:p>Digital data on tangible and intangible cultural assets is an essential part of daily life, communication and experience. It has a lasting influence on the perception of cultural identity as well as on the interactions between research, the cultural economy and society. Throughout the last three decades, many cultural heritage institutions have contributed a wealth of digital representations of cultural assets (2D digital reproductions of paintings, sheet music, 3D digital models of sculptures, monuments, rooms, buildings), audio-visual data (music, film, stage performances), and procedural research data such as encoding and annotation formats. The long-term preservation and FAIR availability of research data from the cultural heritage domain is fundamentally important, not only for future academic success in the humanities but also for the cultural identity of individuals and society as a whole. Up to now, no coordinated effort for professional research data management on a national level exists in Germany. NFDI4Culture aims to fill this gap and create a user-centered, research-driven infrastructure that will cover a broad range of research domains from musicology, art history and architecture to performance, theatre, film, and media studies.</jats:p>\r\n          <jats:p>The research landscape addressed by the consortium is characterized by strong institutional differentiation. Research units in the consortium's community of interest comprise university institutes, art colleges, academies, galleries, libraries, archives and museums. This diverse landscape is also characterized by an abundance of research objects, methodologies and a great potential for data-driven research. In a unique effort carried out by the applicant and co-applicants of this proposal and ten academic societies, this community is interconnected for the first time through a federated approach that is ideally suited to the needs of the participating researchers. To promote collaboration within the NFDI, to share knowledge and technology and to provide extensive support for its users have been the guiding principles of the consortium from the beginning and will be at the heart of all workflows and decision-making processes. Thanks to these principles, NFDI4Culture has gathered strong support ranging from individual researchers to high-level cultural heritage organizations such as the UNESCO, the International Council of Museums, the Open Knowledge Foundation and Wikimedia. On this basis, NFDI4Culture will take innovative measures that promote a cultural change towards a more reflective and sustainable handling of research data and at the same time boost qualification and professionalization in data-driven research in the domain of cultural heritage. This will create a long-lasting impact on science, cultural economy and society as a whole.</jats:p>","lang":"eng"}],"author":[{"first_name":"Reinhard","full_name":"Altenhöner, Reinhard","last_name":"Altenhöner"},{"first_name":"Ina","last_name":"Blümel","full_name":"Blümel, Ina"},{"full_name":"Boehm, Franziska","last_name":"Boehm","first_name":"Franziska"},{"first_name":"Jens","full_name":"Bove, Jens","last_name":"Bove"},{"first_name":"Katrin","full_name":"Bicher, Katrin","last_name":"Bicher"},{"last_name":"Bracht","full_name":"Bracht, Christian","first_name":"Christian"},{"first_name":"Ortrun","last_name":"Brand","full_name":"Brand, Ortrun"},{"first_name":"Lisa","full_name":"Dieckmann, Lisa","last_name":"Dieckmann"},{"full_name":"Effinger, Maria","last_name":"Effinger","first_name":"Maria"},{"last_name":"Hagener","full_name":"Hagener, Malte","first_name":"Malte"},{"first_name":"Andrea","last_name":"Hammes","full_name":"Hammes, Andrea"},{"full_name":"Heller, Lambert","last_name":"Heller","first_name":"Lambert"},{"last_name":"Kailus","full_name":"Kailus, Angela","first_name":"Angela"},{"first_name":"Hubertus","last_name":"Kohle","full_name":"Kohle, Hubertus"},{"last_name":"Ludwig","full_name":"Ludwig, Jens","first_name":"Jens"},{"last_name":"Münzmay","full_name":"Münzmay, Andreas","first_name":"Andreas"},{"first_name":"Sarah","full_name":"Pittroff, Sarah","last_name":"Pittroff"},{"last_name":"Razum","full_name":"Razum, Matthias","first_name":"Matthias"},{"orcid":"https://orcid.org/0000-0001-6271-2095","last_name":"Röwenstrunk","full_name":"Röwenstrunk, Daniel","id":"439","first_name":"Daniel"},{"full_name":"Sack, Harald","last_name":"Sack","first_name":"Harald"},{"full_name":"Simon, Holger","last_name":"Simon","first_name":"Holger"},{"first_name":"Dörte","last_name":"Schmidt","full_name":"Schmidt, Dörte"},{"last_name":"Schrade","full_name":"Schrade, Torsten","first_name":"Torsten"},{"first_name":"Annika-Valeska","full_name":"Walzel, Annika-Valeska","last_name":"Walzel"},{"full_name":"Wiermann, Barbara","last_name":"Wiermann","first_name":"Barbara"}],"date_created":"2021-02-17T15:20:47Z","date_updated":"2022-01-06T06:54:51Z","doi":"10.3897/rio.6.e57036","title":"NFDI4Culture - Consortium for research data on material and immaterial cultural heritage","publication_identifier":{"issn":["2367-7163"]},"publication_status":"published","citation":{"ama":"Altenhöner R, Blümel I, Boehm F, et al. NFDI4Culture - Consortium for research data on material and immaterial cultural heritage. <i>Research Ideas and Outcomes</i>. 2020. doi:<a href=\"https://doi.org/10.3897/rio.6.e57036\">10.3897/rio.6.e57036</a>","ieee":"R. Altenhöner <i>et al.</i>, “NFDI4Culture - Consortium for research data on material and immaterial cultural heritage,” <i>Research Ideas and Outcomes</i>, 2020.","chicago":"Altenhöner, Reinhard, Ina Blümel, Franziska Boehm, Jens Bove, Katrin Bicher, Christian Bracht, Ortrun Brand, et al. “NFDI4Culture - Consortium for Research Data on Material and Immaterial Cultural Heritage.” <i>Research Ideas and Outcomes</i>, 2020. <a href=\"https://doi.org/10.3897/rio.6.e57036\">https://doi.org/10.3897/rio.6.e57036</a>.","mla":"Altenhöner, Reinhard, et al. “NFDI4Culture - Consortium for Research Data on Material and Immaterial Cultural Heritage.” <i>Research Ideas and Outcomes</i>, 2020, doi:<a href=\"https://doi.org/10.3897/rio.6.e57036\">10.3897/rio.6.e57036</a>.","bibtex":"@article{Altenhöner_Blümel_Boehm_Bove_Bicher_Bracht_Brand_Dieckmann_Effinger_Hagener_et al._2020, title={NFDI4Culture - Consortium for research data on material and immaterial cultural heritage}, DOI={<a href=\"https://doi.org/10.3897/rio.6.e57036\">10.3897/rio.6.e57036</a>}, journal={Research Ideas and Outcomes}, author={Altenhöner, Reinhard and Blümel, Ina and Boehm, Franziska and Bove, Jens and Bicher, Katrin and Bracht, Christian and Brand, Ortrun and Dieckmann, Lisa and Effinger, Maria and Hagener, Malte and et al.}, year={2020} }","short":"R. Altenhöner, I. Blümel, F. Boehm, J. Bove, K. Bicher, C. Bracht, O. Brand, L. Dieckmann, M. Effinger, M. Hagener, A. Hammes, L. Heller, A. Kailus, H. Kohle, J. Ludwig, A. Münzmay, S. Pittroff, M. Razum, D. Röwenstrunk, H. Sack, H. Simon, D. Schmidt, T. Schrade, A.-V. Walzel, B. Wiermann, Research Ideas and Outcomes (2020).","apa":"Altenhöner, R., Blümel, I., Boehm, F., Bove, J., Bicher, K., Bracht, C., … Wiermann, B. (2020). NFDI4Culture - Consortium for research data on material and immaterial cultural heritage. <i>Research Ideas and Outcomes</i>. <a href=\"https://doi.org/10.3897/rio.6.e57036\">https://doi.org/10.3897/rio.6.e57036</a>"},"year":"2020"},{"author":[{"first_name":"Anthony","full_name":"Anjorin, Anthony","last_name":"Anjorin"},{"first_name":"Nils","last_name":"Weidmann","full_name":"Weidmann, Nils","id":"53103"},{"first_name":"Robin","last_name":"Oppermann","full_name":"Oppermann, Robin"},{"first_name":"Lars","full_name":"Fritsche, Lars","last_name":"Fritsche"},{"full_name":"Schürr, Andy","last_name":"Schürr","first_name":"Andy"}],"date_created":"2021-03-13T19:17:43Z","publisher":"ACM","date_updated":"2022-01-06T06:55:00Z","conference":{"name":"ACM/IEEE 23rd International Conference on Model Driven Engineering Languages and Systems, MODELS 2020","start_date":"2020-10-18","end_date":"2020-10-23","location":"Virtual Event, Canada"},"doi":"10.1145/3365438.3410991","title":"Automating test schedule generation with domain-specific languages","publication_status":"published","publication_identifier":{"isbn":["9781450370196"]},"citation":{"bibtex":"@inproceedings{Anjorin_Weidmann_Oppermann_Fritsche_Schürr_2020, title={Automating test schedule generation with domain-specific languages}, DOI={<a href=\"https://doi.org/10.1145/3365438.3410991\">10.1145/3365438.3410991</a>}, booktitle={Proceedings of the 23rd ACM/IEEE International Conference on Model Driven Engineering Languages and Systems, MODELS 2020}, publisher={ACM}, author={Anjorin, Anthony and Weidmann, Nils and Oppermann, Robin and Fritsche, Lars and Schürr, Andy}, editor={Syriani, Eugene and Sahraoui, Houari and de Lara, Juan and Abrahao, SilviaEditors}, year={2020} }","short":"A. Anjorin, N. Weidmann, R. Oppermann, L. Fritsche, A. Schürr, in: E. Syriani, H. Sahraoui, J. de Lara, S. Abrahao (Eds.), Proceedings of the 23rd ACM/IEEE International Conference on Model Driven Engineering Languages and Systems, MODELS 2020, ACM, 2020.","mla":"Anjorin, Anthony, et al. “Automating Test Schedule Generation with Domain-Specific Languages.” <i>Proceedings of the 23rd ACM/IEEE International Conference on Model Driven Engineering Languages and Systems, MODELS 2020</i>, edited by Eugene Syriani et al., ACM, 2020, doi:<a href=\"https://doi.org/10.1145/3365438.3410991\">10.1145/3365438.3410991</a>.","apa":"Anjorin, A., Weidmann, N., Oppermann, R., Fritsche, L., &#38; Schürr, A. (2020). Automating test schedule generation with domain-specific languages. In E. Syriani, H. Sahraoui, J. de Lara, &#38; S. Abrahao (Eds.), <i>Proceedings of the 23rd ACM/IEEE International Conference on Model Driven Engineering Languages and Systems, MODELS 2020</i>. Virtual Event, Canada: ACM. <a href=\"https://doi.org/10.1145/3365438.3410991\">https://doi.org/10.1145/3365438.3410991</a>","ieee":"A. Anjorin, N. Weidmann, R. Oppermann, L. Fritsche, and A. Schürr, “Automating test schedule generation with domain-specific languages,” in <i>Proceedings of the 23rd ACM/IEEE International Conference on Model Driven Engineering Languages and Systems, MODELS 2020</i>, Virtual Event, Canada, 2020.","chicago":"Anjorin, Anthony, Nils Weidmann, Robin Oppermann, Lars Fritsche, and Andy Schürr. “Automating Test Schedule Generation with Domain-Specific Languages.” In <i>Proceedings of the 23rd ACM/IEEE International Conference on Model Driven Engineering Languages and Systems, MODELS 2020</i>, edited by Eugene Syriani, Houari Sahraoui, Juan de Lara, and Silvia Abrahao. ACM, 2020. <a href=\"https://doi.org/10.1145/3365438.3410991\">https://doi.org/10.1145/3365438.3410991</a>.","ama":"Anjorin A, Weidmann N, Oppermann R, Fritsche L, Schürr A. Automating test schedule generation with domain-specific languages. In: Syriani E, Sahraoui H, de Lara J, Abrahao S, eds. <i>Proceedings of the 23rd ACM/IEEE International Conference on Model Driven Engineering Languages and Systems, MODELS 2020</i>. ACM; 2020. doi:<a href=\"https://doi.org/10.1145/3365438.3410991\">10.1145/3365438.3410991</a>"},"year":"2020","user_id":"53103","department":[{"_id":"28"},{"_id":"66"},{"_id":"534"}],"_id":"21480","language":[{"iso":"eng"}],"type":"conference","publication":"Proceedings of the 23rd ACM/IEEE International Conference on Model Driven Engineering Languages and Systems, MODELS 2020","status":"public","editor":[{"first_name":"Eugene","last_name":"Syriani","full_name":"Syriani, Eugene"},{"first_name":"Houari","full_name":"Sahraoui, Houari","last_name":"Sahraoui"},{"last_name":"de Lara","full_name":"de Lara, Juan","first_name":"Juan"},{"last_name":"Abrahao","full_name":"Abrahao, Silvia","first_name":"Silvia"}]},{"type":"conference","publication":"Proceedings of the 13th ACM SIGPLAN International Conference on Software Language Engineering, SLE 2020","status":"public","editor":[{"first_name":"Ralf","last_name":"Lämmel","full_name":"Lämmel, Ralf"},{"first_name":"Laurcence","last_name":"Tratt","full_name":"Tratt, Laurcence"},{"last_name":"de Lara","full_name":"de Lara, Juan","first_name":"Juan"}],"user_id":"53103","department":[{"_id":"28"},{"_id":"66"},{"_id":"534"}],"_id":"21481","language":[{"iso":"eng"}],"publication_status":"published","publication_identifier":{"isbn":["9781450381765"]},"citation":{"short":"N. Weidmann, L. Fritsche, A. Anjorin, in: R. Lämmel, L. Tratt, J. de Lara (Eds.), Proceedings of the 13th ACM SIGPLAN International Conference on Software Language Engineering, SLE 2020, ACM, 2020.","bibtex":"@inproceedings{Weidmann_Fritsche_Anjorin_2020, title={A search-based and fault-tolerant approach to concurrent model synchronisation}, DOI={<a href=\"https://doi.org/10.1145/3426425.3426932\">10.1145/3426425.3426932</a>}, booktitle={Proceedings of the 13th ACM SIGPLAN International Conference on Software Language Engineering, SLE 2020}, publisher={ACM}, author={Weidmann, Nils and Fritsche, Lars and Anjorin, Anthony}, editor={Lämmel, Ralf and Tratt, Laurcence and de Lara, JuanEditors}, year={2020} }","mla":"Weidmann, Nils, et al. “A Search-Based and Fault-Tolerant Approach to Concurrent Model Synchronisation.” <i>Proceedings of the 13th ACM SIGPLAN International Conference on Software Language Engineering, SLE 2020</i>, edited by Ralf Lämmel et al., ACM, 2020, doi:<a href=\"https://doi.org/10.1145/3426425.3426932\">10.1145/3426425.3426932</a>.","apa":"Weidmann, N., Fritsche, L., &#38; Anjorin, A. (2020). A search-based and fault-tolerant approach to concurrent model synchronisation. In R. Lämmel, L. Tratt, &#38; J. de Lara (Eds.), <i>Proceedings of the 13th ACM SIGPLAN International Conference on Software Language Engineering, SLE 2020</i>. Virtual Event, USA: ACM. <a href=\"https://doi.org/10.1145/3426425.3426932\">https://doi.org/10.1145/3426425.3426932</a>","chicago":"Weidmann, Nils, Lars Fritsche, and Anthony Anjorin. “A Search-Based and Fault-Tolerant Approach to Concurrent Model Synchronisation.” In <i>Proceedings of the 13th ACM SIGPLAN International Conference on Software Language Engineering, SLE 2020</i>, edited by Ralf Lämmel, Laurcence Tratt, and Juan de Lara. ACM, 2020. <a href=\"https://doi.org/10.1145/3426425.3426932\">https://doi.org/10.1145/3426425.3426932</a>.","ieee":"N. Weidmann, L. Fritsche, and A. Anjorin, “A search-based and fault-tolerant approach to concurrent model synchronisation,” in <i>Proceedings of the 13th ACM SIGPLAN International Conference on Software Language Engineering, SLE 2020</i>, Virtual Event, USA, 2020.","ama":"Weidmann N, Fritsche L, Anjorin A. A search-based and fault-tolerant approach to concurrent model synchronisation. In: Lämmel R, Tratt L, de Lara J, eds. <i>Proceedings of the 13th ACM SIGPLAN International Conference on Software Language Engineering, SLE 2020</i>. ACM; 2020. doi:<a href=\"https://doi.org/10.1145/3426425.3426932\">10.1145/3426425.3426932</a>"},"year":"2020","date_created":"2021-03-13T19:19:27Z","author":[{"last_name":"Weidmann","full_name":"Weidmann, Nils","id":"53103","first_name":"Nils"},{"full_name":"Fritsche, Lars","last_name":"Fritsche","first_name":"Lars"},{"full_name":"Anjorin, Anthony","last_name":"Anjorin","first_name":"Anthony"}],"date_updated":"2022-01-06T06:55:01Z","publisher":"ACM","conference":{"end_date":"2020-11-17","location":"Virtual Event, USA","name":"13th ACM SIGPLAN International Conference on Software Language Engineering, SLE 2020","start_date":"2020-11-16"},"doi":"10.1145/3426425.3426932","title":"A search-based and fault-tolerant approach to concurrent model synchronisation"},{"publication_identifier":{"issn":["2075-2180"]},"publication_status":"published","year":"2020","page":"1-12","citation":{"apa":"Weidmann, N., Anjorin, A., &#38; Cheney, J. (2020). VICToRy: Visual Interactive Consistency Management in Tolerant Rule-based Systems. In B. Hoffmann &#38; M. Minas (Eds.), <i>Proceedings of the Eleventh International Workshop on Graph Computation Models, GCM@STAF 2020</i> (pp. 1–12). Online-Workshop: EPTCS. <a href=\"https://doi.org/10.4204/eptcs.330.1\">https://doi.org/10.4204/eptcs.330.1</a>","bibtex":"@inproceedings{Weidmann_Anjorin_Cheney_2020, title={VICToRy: Visual Interactive Consistency Management in Tolerant Rule-based Systems}, DOI={<a href=\"https://doi.org/10.4204/eptcs.330.1\">10.4204/eptcs.330.1</a>}, booktitle={Proceedings of the Eleventh International Workshop on Graph Computation Models, GCM@STAF 2020}, publisher={EPTCS}, author={Weidmann, Nils and Anjorin, Anthony and Cheney, James}, editor={Hoffmann, Berthold and Minas, MarkEditors}, year={2020}, pages={1–12} }","short":"N. Weidmann, A. Anjorin, J. Cheney, in: B. Hoffmann, M. Minas (Eds.), Proceedings of the Eleventh International Workshop on Graph Computation Models, GCM@STAF 2020, EPTCS, 2020, pp. 1–12.","mla":"Weidmann, Nils, et al. “VICToRy: Visual Interactive Consistency Management in Tolerant Rule-Based Systems.” <i>Proceedings of the Eleventh International Workshop on Graph Computation Models, GCM@STAF 2020</i>, edited by Berthold Hoffmann and Mark Minas, EPTCS, 2020, pp. 1–12, doi:<a href=\"https://doi.org/10.4204/eptcs.330.1\">10.4204/eptcs.330.1</a>.","ama":"Weidmann N, Anjorin A, Cheney J. VICToRy: Visual Interactive Consistency Management in Tolerant Rule-based Systems. In: Hoffmann B, Minas M, eds. <i>Proceedings of the Eleventh International Workshop on Graph Computation Models, GCM@STAF 2020</i>. EPTCS; 2020:1-12. doi:<a href=\"https://doi.org/10.4204/eptcs.330.1\">10.4204/eptcs.330.1</a>","ieee":"N. Weidmann, A. Anjorin, and J. Cheney, “VICToRy: Visual Interactive Consistency Management in Tolerant Rule-based Systems,” in <i>Proceedings of the Eleventh International Workshop on Graph Computation Models, GCM@STAF 2020</i>, Online-Workshop, 2020, pp. 1–12.","chicago":"Weidmann, Nils, Anthony Anjorin, and James Cheney. “VICToRy: Visual Interactive Consistency Management in Tolerant Rule-Based Systems.” In <i>Proceedings of the Eleventh International Workshop on Graph Computation Models, GCM@STAF 2020</i>, edited by Berthold Hoffmann and Mark Minas, 1–12. EPTCS, 2020. <a href=\"https://doi.org/10.4204/eptcs.330.1\">https://doi.org/10.4204/eptcs.330.1</a>."},"date_updated":"2022-01-06T06:55:01Z","publisher":"EPTCS","date_created":"2021-03-13T19:20:04Z","author":[{"first_name":"Nils","last_name":"Weidmann","full_name":"Weidmann, Nils","id":"53103"},{"first_name":"Anthony","full_name":"Anjorin, Anthony","last_name":"Anjorin"},{"first_name":"James","full_name":"Cheney, James","last_name":"Cheney"}],"title":"VICToRy: Visual Interactive Consistency Management in Tolerant Rule-based Systems","conference":{"end_date":"2020-06-24","location":"Online-Workshop","name":"Eleventh International Workshop on Graph Computation Models","start_date":"2020-06-24"},"doi":"10.4204/eptcs.330.1","publication":"Proceedings of the Eleventh International Workshop on Graph Computation Models, GCM@STAF 2020","type":"conference","editor":[{"last_name":"Hoffmann","full_name":"Hoffmann, Berthold","first_name":"Berthold"},{"full_name":"Minas, Mark","last_name":"Minas","first_name":"Mark"}],"status":"public","_id":"21482","department":[{"_id":"28"},{"_id":"66"},{"_id":"534"}],"user_id":"53103","language":[{"iso":"eng"}]},{"language":[{"iso":"eng"}],"_id":"21483","user_id":"53103","department":[{"_id":"28"},{"_id":"66"},{"_id":"534"}],"editor":[{"last_name":"Babur","full_name":"Babur, Önder","first_name":"Önder"},{"last_name":"Denil","full_name":"Denil, Joachim","first_name":"Joachim"},{"first_name":"Birgit","full_name":"Vogel-Heuser, Birgit","last_name":"Vogel-Heuser"}],"status":"public","type":"conference","publication":"Proceedings of the First International Conference on Systems Modelling and Management, ICSMM 2020 ","title":"A Model-Driven Mutation Framework for Validation of Test Case Migration","conference":{"end_date":"2020-06-26","location":"Bergen, Norway","name":"First International Conference on Systems Modelling and Management, ICSMM 2020","start_date":"2020-06-25"},"doi":"10.1007/978-3-030-58167-1_2","date_updated":"2022-01-06T06:55:01Z","publisher":"Springer","author":[{"first_name":"Ivan","last_name":"Jovanovikj","orcid":"https://orcid.org/0000-0002-1838-794X","full_name":"Jovanovikj, Ivan","id":"39187"},{"first_name":"Nils","id":"53103","full_name":"Weidmann, Nils","last_name":"Weidmann"},{"last_name":"Yigitbas","orcid":"0000-0002-5967-833X","full_name":"Yigitbas, Enes","id":"8447","first_name":"Enes"},{"last_name":"Anjorin","full_name":"Anjorin, Anthony","first_name":"Anthony"},{"last_name":"Sauer","full_name":"Sauer, Stefan","id":"447","first_name":"Stefan"},{"first_name":"Gregor","last_name":"Engels","id":"107","full_name":"Engels, Gregor"}],"date_created":"2021-03-13T19:20:55Z","year":"2020","place":"Cham","citation":{"chicago":"Jovanovikj, Ivan, Nils Weidmann, Enes Yigitbas, Anthony Anjorin, Stefan Sauer, and Gregor Engels. “A Model-Driven Mutation Framework for Validation of Test Case Migration.” In <i>Proceedings of the First International Conference on Systems Modelling and Management, ICSMM 2020 </i>, edited by Önder Babur, Joachim Denil, and Birgit Vogel-Heuser. Cham: Springer, 2020. <a href=\"https://doi.org/10.1007/978-3-030-58167-1_2\">https://doi.org/10.1007/978-3-030-58167-1_2</a>.","ieee":"I. Jovanovikj, N. Weidmann, E. Yigitbas, A. Anjorin, S. Sauer, and G. Engels, “A Model-Driven Mutation Framework for Validation of Test Case Migration,” in <i>Proceedings of the First International Conference on Systems Modelling and Management, ICSMM 2020 </i>, Bergen, Norway, 2020.","ama":"Jovanovikj I, Weidmann N, Yigitbas E, Anjorin A, Sauer S, Engels G. A Model-Driven Mutation Framework for Validation of Test Case Migration. In: Babur Ö, Denil J, Vogel-Heuser B, eds. <i>Proceedings of the First International Conference on Systems Modelling and Management, ICSMM 2020 </i>. Cham: Springer; 2020. doi:<a href=\"https://doi.org/10.1007/978-3-030-58167-1_2\">10.1007/978-3-030-58167-1_2</a>","bibtex":"@inproceedings{Jovanovikj_Weidmann_Yigitbas_Anjorin_Sauer_Engels_2020, place={Cham}, title={A Model-Driven Mutation Framework for Validation of Test Case Migration}, DOI={<a href=\"https://doi.org/10.1007/978-3-030-58167-1_2\">10.1007/978-3-030-58167-1_2</a>}, booktitle={Proceedings of the First International Conference on Systems Modelling and Management, ICSMM 2020 }, publisher={Springer}, author={Jovanovikj, Ivan and Weidmann, Nils and Yigitbas, Enes and Anjorin, Anthony and Sauer, Stefan and Engels, Gregor}, editor={Babur, Önder and Denil, Joachim and Vogel-Heuser, BirgitEditors}, year={2020} }","mla":"Jovanovikj, Ivan, et al. “A Model-Driven Mutation Framework for Validation of Test Case Migration.” <i>Proceedings of the First International Conference on Systems Modelling and Management, ICSMM 2020 </i>, edited by Önder Babur et al., Springer, 2020, doi:<a href=\"https://doi.org/10.1007/978-3-030-58167-1_2\">10.1007/978-3-030-58167-1_2</a>.","short":"I. Jovanovikj, N. Weidmann, E. Yigitbas, A. Anjorin, S. Sauer, G. Engels, in: Ö. Babur, J. Denil, B. Vogel-Heuser (Eds.), Proceedings of the First International Conference on Systems Modelling and Management, ICSMM 2020 , Springer, Cham, 2020.","apa":"Jovanovikj, I., Weidmann, N., Yigitbas, E., Anjorin, A., Sauer, S., &#38; Engels, G. (2020). A Model-Driven Mutation Framework for Validation of Test Case Migration. In Ö. Babur, J. Denil, &#38; B. Vogel-Heuser (Eds.), <i>Proceedings of the First International Conference on Systems Modelling and Management, ICSMM 2020 </i>. Cham: Springer. <a href=\"https://doi.org/10.1007/978-3-030-58167-1_2\">https://doi.org/10.1007/978-3-030-58167-1_2</a>"},"publication_status":"published","publication_identifier":{"issn":["1865-0929","1865-0937"],"isbn":["9783030581664","9783030581671"]}},{"year":"2020","title":"Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000","publisher":"IEEE","date_created":"2021-03-18T13:43:53Z","abstract":[{"text":"In this publication, the near-field to far-field transformation using the self-built near-field scanner NFS3000 is examined with regard to its geometry. This device allows to measure electric and magnetic fields in small distances to the DUT (Device under Test) with high geometric precision and high sensitivity. Leading to a fast examination of EMC (Electromagnetic Compatibility) problems, because the electromagnetic properties are better understandable and therefore easier to solve than e.g. measurements in a far-field chamber. In addition, it is possible to extrapolate the near-fields into the far-field and to determine the radiation pattern of antennas and emitting objects. For this purpose, this paper deals with the basis of this transformation, the so-called surface equivalence theorem. This principle is then adapted to the measurement of near-field scanners and implemented accordingly. Due to the non-ideal design of the near-field scanner, the effects on a far-field transformation are finally presented and discussed.","lang":"eng"}],"publication":"2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE","keyword":["Near-Field Scanner","Near-Field to Far-Field Transformation","Directivity","Surface Equivalence Theorem","Huygens’ Box"],"language":[{"iso":"eng"}],"citation":{"apa":"Lange, S., Schroder, D., Hedayat, C., Hangmann, C., Otto, T., &#38; Hilleringmann, U. (2020). Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000. In <i>2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE</i>. Rome, Italy : IEEE. <a href=\"https://doi.org/10.1109/emceurope48519.2020.9245697\">https://doi.org/10.1109/emceurope48519.2020.9245697</a>","short":"S. Lange, D. Schroder, C. Hedayat, C. Hangmann, T. Otto, U. Hilleringmann, in: 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE, IEEE, 2020.","bibtex":"@inproceedings{Lange_Schroder_Hedayat_Hangmann_Otto_Hilleringmann_2020, title={Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000}, DOI={<a href=\"https://doi.org/10.1109/emceurope48519.2020.9245697\">10.1109/emceurope48519.2020.9245697</a>}, booktitle={2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE}, publisher={IEEE}, author={Lange, Sven and Schroder, Dominik and Hedayat, Christian and Hangmann, Christian and Otto, Thomas and Hilleringmann, Ulrich}, year={2020} }","mla":"Lange, Sven, et al. “Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000.” <i>2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE</i>, IEEE, 2020, doi:<a href=\"https://doi.org/10.1109/emceurope48519.2020.9245697\">10.1109/emceurope48519.2020.9245697</a>.","chicago":"Lange, Sven, Dominik Schroder, Christian Hedayat, Christian Hangmann, Thomas Otto, and Ulrich Hilleringmann. “Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000.” In <i>2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE</i>. IEEE, 2020. <a href=\"https://doi.org/10.1109/emceurope48519.2020.9245697\">https://doi.org/10.1109/emceurope48519.2020.9245697</a>.","ieee":"S. Lange, D. Schroder, C. Hedayat, C. Hangmann, T. Otto, and U. Hilleringmann, “Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000,” in <i>2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE</i>, Rome, Italy , 2020.","ama":"Lange S, Schroder D, Hedayat C, Hangmann C, Otto T, Hilleringmann U. Investigation of the Surface Equivalence Principle on a Metal Surface for a Near-Field to Far-Field Transformation by the NFS3000. In: <i>2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE</i>. IEEE; 2020. doi:<a href=\"https://doi.org/10.1109/emceurope48519.2020.9245697\">10.1109/emceurope48519.2020.9245697</a>"},"publication_status":"published","publication_identifier":{"eisbn":["978-1-7281-5579-1"],"issn":["2325-0364 "],"isbn":["978-1-7281-5580-7"]},"related_material":{"record":[{"status":"public","id":"21541","relation":"original"}]},"main_file_link":[{"url":"https://ieeexplore.ieee.org/document/9245697"}],"doi":"10.1109/emceurope48519.2020.9245697","conference":{"name":"2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE","start_date":"2020-09-23","end_date":"2020-09-25","location":"Rome, Italy "},"date_updated":"2022-01-06T06:55:03Z","author":[{"last_name":"Lange","id":"38240","full_name":"Lange, Sven","first_name":"Sven"},{"first_name":"Dominik","last_name":"Schroder","full_name":"Schroder, Dominik"},{"last_name":"Hedayat","full_name":"Hedayat, Christian","first_name":"Christian"},{"full_name":"Hangmann, Christian","last_name":"Hangmann","first_name":"Christian"},{"full_name":"Otto, Thomas","last_name":"Otto","first_name":"Thomas"},{"first_name":"Ulrich","last_name":"Hilleringmann","full_name":"Hilleringmann, Ulrich"}],"status":"public","type":"conference","project":[{"_id":"52","name":"Computing Resources Provided by the Paderborn Center for Parallel Computing"}],"_id":"21541","user_id":"38240","department":[{"_id":"59"},{"_id":"485"}]},{"year":"2020","edition":"1","title":"Far-field prediction combining simulations with near-field measurements for EMI assessment of PCBs","date_created":"2021-03-18T13:49:49Z","publisher":" The Institution of Engineering and Technology (IET)","abstract":[{"text":"Using near-field (NF) scan data to predict the far-field (FF) behaviour of radiating electronic systems represents a novel method to accompany the whole RF design process. This approach involves so-called Huygens' box as an efficient radiation model inside an electromagnetic (EM) simulation tool and then transforms the scanned NF measured data into the FF. For this, the basic idea of the Huygens'box principle and the NF-to-FF transformation are briefly presented. The NF is measured on the Huygens' box around a device under test using anNF scanner, recording the magnitude and phase of the site-related magnetic and electric components. A comparison between a fullwave simulation and the measurement results shows a good similarity in both the NF and the simulated and transformed FF.Thus, this method is applicable to predict the FF behaviour of any electronic system by measuring the NF. With this knowledge, the RF design can be improved due to allowing a significant reduction of EM compatibility failure at the end of the development flow. In addition, the very efficient FF radiation model can be used for detailed investigations in various environments and the impact of such an equivalent radiation source on other electronic systems can be assessed.","lang":"eng"}],"publication":"Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis","language":[{"iso":"eng"}],"keyword":["Huygens' box","NF-to-FF transformation","efficient FF radiation model","FF behaviour","EMI assessment","PCB","near-field measurements","efficient radiation model","far-field behaviour","RF design process","far-field prediction","Huygens'box principle","fullwave simulation","electronic system radiation","equivalent radiation source","electromagnetic simulation tool","near-field scan data","EM compatibility failure reduction"],"page":"315-346 (32)","citation":{"bibtex":"@inbook{Schröder_Lange_Hangmann_Hedayat_2020, place={Croyton, UK}, edition={1}, title={Far-field prediction combining simulations with near-field measurements for EMI assessment of PCBs}, DOI={<a href=\"https://doi.org/10.1049/pbcs072e_ch14\">10.1049/pbcs072e_ch14</a>}, booktitle={Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis}, publisher={ The Institution of Engineering and Technology (IET)}, author={Schröder, Dominik and Lange, Sven and Hangmann, Christian and Hedayat, Christian}, year={2020}, pages={315-346 (32)} }","short":"D. Schröder, S. Lange, C. Hangmann, C. Hedayat, in: Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis, 1st ed.,  The Institution of Engineering and Technology (IET), Croyton, UK, 2020, pp. 315-346 (32).","mla":"Schröder, Dominik, et al. “Far-Field Prediction Combining Simulations with near-Field Measurements for EMI Assessment of PCBs.” <i>Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis</i>, 1st ed.,  The Institution of Engineering and Technology (IET), 2020, pp. 315-346 (32), doi:<a href=\"https://doi.org/10.1049/pbcs072e_ch14\">10.1049/pbcs072e_ch14</a>.","apa":"Schröder, D., Lange, S., Hangmann, C., &#38; Hedayat, C. (2020). Far-field prediction combining simulations with near-field measurements for EMI assessment of PCBs. In <i>Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis</i> (1st ed., pp. 315-346 (32)). Croyton, UK:  The Institution of Engineering and Technology (IET). <a href=\"https://doi.org/10.1049/pbcs072e_ch14\">https://doi.org/10.1049/pbcs072e_ch14</a>","ama":"Schröder D, Lange S, Hangmann C, Hedayat C. Far-field prediction combining simulations with near-field measurements for EMI assessment of PCBs. In: <i>Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis</i>. 1st ed. Croyton, UK:  The Institution of Engineering and Technology (IET); 2020:315-346 (32). doi:<a href=\"https://doi.org/10.1049/pbcs072e_ch14\">10.1049/pbcs072e_ch14</a>","ieee":"D. Schröder, S. Lange, C. Hangmann, and C. Hedayat, “Far-field prediction combining simulations with near-field measurements for EMI assessment of PCBs,” in <i>Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis</i>, 1st ed., Croyton, UK:  The Institution of Engineering and Technology (IET), 2020, pp. 315-346 (32).","chicago":"Schröder, Dominik, Sven Lange, Christian Hangmann, and Christian Hedayat. “Far-Field Prediction Combining Simulations with near-Field Measurements for EMI Assessment of PCBs.” In <i>Tensorial Analysis of Networks (TAN) Modelling for PCB Signal Integrity and EMC Analysis</i>, 1st ed., 315-346 (32). Croyton, UK:  The Institution of Engineering and Technology (IET), 2020. <a href=\"https://doi.org/10.1049/pbcs072e_ch14\">https://doi.org/10.1049/pbcs072e_ch14</a>."},"place":"Croyton, UK","related_material":{"record":[{"relation":"other","id":"21542","status":"public"}]},"publication_identifier":{"isbn":["9781839530494","9781839530500"]},"publication_status":"published","doi":"10.1049/pbcs072e_ch14","main_file_link":[{"url":"https://digital-library.theiet.org/content/books/10.1049/pbcs072e_ch14"}],"author":[{"first_name":"Dominik","last_name":"Schröder","full_name":"Schröder, Dominik"},{"full_name":"Lange, Sven","id":"38240","last_name":"Lange","first_name":"Sven"},{"last_name":"Hangmann","full_name":"Hangmann, Christian","first_name":"Christian"},{"last_name":"Hedayat","full_name":"Hedayat, Christian","first_name":"Christian"}],"date_updated":"2022-01-06T06:55:03Z","status":"public","type":"book_chapter","department":[{"_id":"485"}],"user_id":"38240","_id":"21542","project":[{"name":"Computing Resources Provided by the Paderborn Center for Parallel Computing","_id":"52"}]},{"_id":"17331","department":[{"_id":"25"},{"_id":"137"}],"user_id":"14931","language":[{"iso":"ger"}],"publication":"Forschungsperspektiven auf Digitalisierung in Hochschulen, Zeitschrift für Hochschulentwicklung","type":"journal_article","status":"public","date_updated":"2022-01-06T06:53:08Z","volume":15,"date_created":"2020-06-26T06:47:31Z","author":[{"first_name":"Marcel","full_name":"Graf-Schlattmann, Marcel","last_name":"Graf-Schlattmann"},{"first_name":"Dorothee M.","full_name":"Meister, Dorothee M.","id":"346","last_name":"Meister"},{"first_name":"Gudrun","last_name":"Oevel","orcid":"https://orcid.org/0000-0002-6396-9535","id":"14924","full_name":"Oevel, Gudrun"},{"first_name":"Melanie","full_name":"Wilde, Melanie","last_name":"Wilde"}],"title":"Kollektive Veränderungsbereitschaft als zentraler Erfolgsfaktor von Digitalisierungsprozessen an Hochschulen","related_material":{"link":[{"relation":"confirmation","url":"https://www.zfhe.at/index.php/zfhe/issue/view/65"}]},"issue":"1","year":"2020","intvolume":"        15","citation":{"apa":"Graf-Schlattmann, M., Meister, D. M., Oevel, G., &#38; Wilde, M. (2020). Kollektive Veränderungsbereitschaft als zentraler Erfolgsfaktor von Digitalisierungsprozessen an Hochschulen. <i>Forschungsperspektiven auf Digitalisierung in Hochschulen, Zeitschrift für Hochschulentwicklung</i>, <i>15</i>(1).","mla":"Graf-Schlattmann, Marcel, et al. “Kollektive Veränderungsbereitschaft als zentraler Erfolgsfaktor von Digitalisierungsprozessen an Hochschulen.” <i>Forschungsperspektiven auf Digitalisierung in Hochschulen, Zeitschrift für Hochschulentwicklung</i>, vol. 15, no. 1, 2020.","bibtex":"@article{Graf-Schlattmann_Meister_Oevel_Wilde_2020, title={Kollektive Veränderungsbereitschaft als zentraler Erfolgsfaktor von Digitalisierungsprozessen an Hochschulen}, volume={15}, number={1}, journal={Forschungsperspektiven auf Digitalisierung in Hochschulen, Zeitschrift für Hochschulentwicklung}, author={Graf-Schlattmann, Marcel and Meister, Dorothee M. and Oevel, Gudrun and Wilde, Melanie}, year={2020} }","short":"M. Graf-Schlattmann, D.M. Meister, G. Oevel, M. Wilde, Forschungsperspektiven auf Digitalisierung in Hochschulen, Zeitschrift für Hochschulentwicklung 15 (2020).","ama":"Graf-Schlattmann M, Meister DM, Oevel G, Wilde M. Kollektive Veränderungsbereitschaft als zentraler Erfolgsfaktor von Digitalisierungsprozessen an Hochschulen. <i>Forschungsperspektiven auf Digitalisierung in Hochschulen, Zeitschrift für Hochschulentwicklung</i>. 2020;15(1).","ieee":"M. Graf-Schlattmann, D. M. Meister, G. Oevel, and M. Wilde, “Kollektive Veränderungsbereitschaft als zentraler Erfolgsfaktor von Digitalisierungsprozessen an Hochschulen,” <i>Forschungsperspektiven auf Digitalisierung in Hochschulen, Zeitschrift für Hochschulentwicklung</i>, vol. 15, no. 1, 2020.","chicago":"Graf-Schlattmann, Marcel, Dorothee M. Meister, Gudrun Oevel, and Melanie Wilde. “Kollektive Veränderungsbereitschaft als zentraler Erfolgsfaktor von Digitalisierungsprozessen an Hochschulen.” <i>Forschungsperspektiven auf Digitalisierung in Hochschulen, Zeitschrift für Hochschulentwicklung</i> 15, no. 1 (2020)."}},{"status":"public","type":"journal_article","article_type":"original","_id":"17390","user_id":"30525","department":[{"_id":"15"},{"_id":"230"},{"_id":"289"}],"citation":{"apa":"Chantakit, T., Schlickriede, C., Sain, B., Meyer, F., Weiss, T., Chattham, N., &#38; Zentgraf, T. (2020). All-dielectric silicon metalens for two-dimensional particle manipulation in optical tweezers. <i>Photonics Research</i>, <i>8</i>(9), 1435–1440. <a href=\"https://doi.org/10.1364/prj.389200\">https://doi.org/10.1364/prj.389200</a>","bibtex":"@article{Chantakit_Schlickriede_Sain_Meyer_Weiss_Chattham_Zentgraf_2020, title={All-dielectric silicon metalens for two-dimensional particle manipulation in optical tweezers}, volume={8}, DOI={<a href=\"https://doi.org/10.1364/prj.389200\">10.1364/prj.389200</a>}, number={9}, journal={Photonics Research}, publisher={OSA}, author={Chantakit, Teanchai and Schlickriede, Christian and Sain, Basudeb and Meyer, Fabian and Weiss, Thomas and Chattham, Nattaporn and Zentgraf, Thomas}, year={2020}, pages={1435–1440} }","mla":"Chantakit, Teanchai, et al. “All-Dielectric Silicon Metalens for Two-Dimensional Particle Manipulation in Optical Tweezers.” <i>Photonics Research</i>, vol. 8, no. 9, OSA, 2020, pp. 1435–40, doi:<a href=\"https://doi.org/10.1364/prj.389200\">10.1364/prj.389200</a>.","short":"T. Chantakit, C. Schlickriede, B. Sain, F. Meyer, T. Weiss, N. Chattham, T. Zentgraf, Photonics Research 8 (2020) 1435–1440.","chicago":"Chantakit, Teanchai, Christian Schlickriede, Basudeb Sain, Fabian Meyer, Thomas Weiss, Nattaporn Chattham, and Thomas Zentgraf. “All-Dielectric Silicon Metalens for Two-Dimensional Particle Manipulation in Optical Tweezers.” <i>Photonics Research</i> 8, no. 9 (2020): 1435–40. <a href=\"https://doi.org/10.1364/prj.389200\">https://doi.org/10.1364/prj.389200</a>.","ieee":"T. Chantakit <i>et al.</i>, “All-dielectric silicon metalens for two-dimensional particle manipulation in optical tweezers,” <i>Photonics Research</i>, vol. 8, no. 9, pp. 1435–1440, 2020.","ama":"Chantakit T, Schlickriede C, Sain B, et al. All-dielectric silicon metalens for two-dimensional particle manipulation in optical tweezers. <i>Photonics Research</i>. 2020;8(9):1435-1440. doi:<a href=\"https://doi.org/10.1364/prj.389200\">10.1364/prj.389200</a>"},"page":"1435-1440","intvolume":"         8","publication_status":"published","publication_identifier":{"issn":["2327-9125"]},"main_file_link":[{"open_access":"1"}],"doi":"10.1364/prj.389200","date_updated":"2022-01-06T06:53:10Z","oa":"1","author":[{"full_name":"Chantakit, Teanchai","last_name":"Chantakit","first_name":"Teanchai"},{"first_name":"Christian","last_name":"Schlickriede","full_name":"Schlickriede, Christian","id":"59792"},{"first_name":"Basudeb","last_name":"Sain","full_name":"Sain, Basudeb"},{"last_name":"Meyer","full_name":"Meyer, Fabian","first_name":"Fabian"},{"full_name":"Weiss, Thomas","last_name":"Weiss","first_name":"Thomas"},{"full_name":"Chattham, Nattaporn","last_name":"Chattham","first_name":"Nattaporn"},{"first_name":"Thomas","id":"30525","full_name":"Zentgraf, Thomas","orcid":"0000-0002-8662-1101","last_name":"Zentgraf"}],"volume":8,"publication":"Photonics Research","language":[{"iso":"eng"}],"year":"2020","quality_controlled":"1","issue":"9","title":"All-dielectric silicon metalens for two-dimensional particle manipulation in optical tweezers","publisher":"OSA","date_created":"2020-07-16T07:35:01Z"},{"title":"Extreme Algorithm Selection with Dyadic Feature Representation","conference":{"name":"Discovery Science 2020"},"date_updated":"2022-01-06T06:53:10Z","author":[{"full_name":"Tornede, Alexander","id":"38209","last_name":"Tornede","first_name":"Alexander"},{"first_name":"Marcel Dominik","last_name":"Wever","orcid":" https://orcid.org/0000-0001-9782-6818","id":"33176","full_name":"Wever, Marcel Dominik"},{"full_name":"Hüllermeier, Eyke","id":"48129","last_name":"Hüllermeier","first_name":"Eyke"}],"date_created":"2020-07-21T10:06:51Z","year":"2020","citation":{"mla":"Tornede, Alexander, et al. “Extreme Algorithm Selection with Dyadic Feature Representation.” <i>Discovery Science</i>, 2020.","short":"A. Tornede, M.D. Wever, E. Hüllermeier, in: Discovery Science, 2020.","bibtex":"@inproceedings{Tornede_Wever_Hüllermeier_2020, title={Extreme Algorithm Selection with Dyadic Feature Representation}, booktitle={Discovery Science}, author={Tornede, Alexander and Wever, Marcel Dominik and Hüllermeier, Eyke}, year={2020} }","apa":"Tornede, A., Wever, M. D., &#38; Hüllermeier, E. (2020). Extreme Algorithm Selection with Dyadic Feature Representation. <i>Discovery Science</i>. Discovery Science 2020.","ama":"Tornede A, Wever MD, Hüllermeier E. Extreme Algorithm Selection with Dyadic Feature Representation. In: <i>Discovery Science</i>. ; 2020.","ieee":"A. Tornede, M. D. Wever, and E. Hüllermeier, “Extreme Algorithm Selection with Dyadic Feature Representation,” presented at the Discovery Science 2020, 2020.","chicago":"Tornede, Alexander, Marcel Dominik Wever, and Eyke Hüllermeier. “Extreme Algorithm Selection with Dyadic Feature Representation.” In <i>Discovery Science</i>, 2020."},"language":[{"iso":"eng"}],"project":[{"_id":"1","name":"SFB 901"},{"name":"SFB 901 - Project Area B","_id":"3"},{"name":"SFB 901 - Subproject B2","_id":"10"},{"_id":"52","name":"Computing Resources Provided by the Paderborn Center for Parallel Computing"}],"_id":"17407","user_id":"5786","department":[{"_id":"34"},{"_id":"355"},{"_id":"26"}],"status":"public","type":"conference","publication":"Discovery Science"}]