@article{38290,
  author       = {{Sandel, D and Mirvoda, V and Wust, F and Noé, Reinhold and Weiske, CJ}},
  issn         = {{0013-5194}},
  journal      = {{ELECTRONICS LETTERS}},
  number       = {{17}},
  pages        = {{984--986}},
  title        = {{{Signed online chromatic dispersion detection at 40 Gbit/s based on arrival time detection with 60 attosecond dynamic accuracy}}},
  doi          = {{10.1049/el:20020677}},
  volume       = {{38}},
  year         = {{2002}},
}

@inproceedings{39382,
  abstract     = {{We present a rigorous but transparent semantics definition of the SpecC language that covers the execution of SpecC behaviors and their interaction with the kernel process. The semantics include wait, wait for, par, and try statements as they are introduced in SpecC. We present our definition in form of distributed abstract state machine (ASM) rules strictly following the lines of the SpecC Language Reference Manual. We mainly see our formal semantics in three application areas. First, it is a concise, unambiguous description for documentation and standardization. Second, it applies as a high-level, pseudo code-oriented specification for the implementation of a SpecC simulator. Finally, it is a first step for SpecC synthesis in order to identify similar concepts with other languages like VHDL and SystemC for the definition of common patterns and language subsets.}},
  author       = {{Müller, Wolfgang and Dömer, Rainer and Gerstlauer, Andreas}},
  booktitle    = {{Proceedings of the ISSS02}},
  isbn         = {{1-58113-576-9}},
  keywords     = {{Standardization, Kernel, Permission, Formal verification, Logic functions, Documentation, Reasoning about programs, Specification languages, Formal specifications, Software systems}},
  title        = {{{The Formal Execution Semantics of SpecC}}},
  doi          = {{10.1145/581199.581234 }},
  year         = {{2002}},
}

@inproceedings{39387,
  abstract     = {{This paper compares the use of three different approaches to transcoding of XML [Extensible Markup Language]-based user interface descriptions to other target formats. The source is the interface section of the XML-based markup language for user interfaces, UIML [User Interface Markup Language], which has been extended with a vocabulary for the description of generic user interfaces. Target formats used as examples for the comparison are HTML [Hypertext Markup Language], and VoiceXML. The compared means for transcoding are XSLT [Extensible Stylesheet Language Transformation], the UIML peers section with enhancements for transcoding, and RDL/TT [Rule Description Language for Tree Transformation], a Java-like transcoding language. Rendered by www.RenderX.com Comparing Transcoding Tools for Use with a Generic User Interface Format.}},
  author       = {{Plomp, Johan and Schäfer, Robbie and Müller, Wolfgang}},
  booktitle    = {{Proceedings of the Extreme Markup Languages 2002}},
  title        = {{{Comparing Transcoding Tools for Use with a Generic User Interface Format}}},
  year         = {{2002}},
}

@inproceedings{39403,
  abstract     = {{The Unified Modeling Language (UML) has received wide acceptance as a standard language in the field of software specification by means of different diagram types. In a recent version of UML, the textual Object Constraint Language (OCL) was introduced to support specification of constraints for UML models. But OCL currently does not provide sufficient means to specify constraints over the dynamic behavior of a model. This article presents an OCL extension that is consistent with current OCL and enables modelers to specify state-related time-bounded constraints. We consider the case study of a flexible manufacturing system and identify typical real-time constraints. The constraints are presented in our temporal OCL extension as well as in temporal logic formulae. For general application, we define a semantics of our OCL extension by means of a time-bounded temporal logic based on Computational Tree Logic (CTL).}},
  author       = {{Flake, Stephan and Müller, Wolfgang}},
  booktitle    = {{Proceedings of HICSS-35}},
  isbn         = {{0-7695-1435-9}},
  keywords     = {{Unified modeling language, Logic, Formal verification, Real time systems, Programming profession, Vehicle dynamics, Software standards, Flexible manufacturing systems, Electronics industry, Protocols}},
  location     = {{Big Island, HI, USA }},
  title        = {{{Specification of Real-Time Properties for UML Models}}},
  doi          = {{10.1109/HICSS.2002.994469}},
  year         = {{2002}},
}

@inproceedings{39402,
  abstract     = {{Die Object Constraint Language (OCL) wurde entwickelt, um Modelleinschränkungen beim objektorientierten Softwareentwurf mit der UML [14] ausdrücken zu können. Sie wird hauptsächlich benutzt, um Invarianten für Objekte sowie Vor-und Nachbedingungen von Operationen zu spezifizieren. Zurzeit bieten OCL und Echtzeiterweiterungen der UML nur bedingt geeignete Mittel, um temporale zeitbehaftete Modelleigenschaften zu beschreiben. Insbesondere kann man mit OCL keine Einschränkunge uber das dynamische Verhalten eines UML-Modells formulieren, die die Reihenfolge von Objektzuständen und Zustandsübergängen betreffen. Um ein korrektes Systemverhalten zu garantieren, ist es jedoch insbesondere bei zeitkritischen Anwendungen notwendig, solche zustandsbasierten zeitbehafteten Einschränkungen in einer formalen Art und Weise ausdrücken zu können. Es sind daher verschiedene Vorschläge veröffentlicht worden, in denen die OCL erweitert worden ist, um Modellierern die Möglichkeit zu geben, temporale Einschränkungen zu formulieren. Dieser Artikel gibt eine Überblick über die zurzeit bekannten Vorschläge und zeigt Ansätze für weitere Entwicklungen in diesem Bereich auf.}},
  author       = {{Flake, Stephan and Müller, Wolfgang}},
  title        = {{{Temporale Erweiterungen der OCL - Überblick und Aussichten}}},
  year         = {{2002}},
}

@article{38367,
  author       = {{Mirvoda, V and Sandel, D and Wust, F and Hinz, S and Noé, Reinhold}},
  issn         = {{0948-7921}},
  journal      = {{ELECTRICAL ENGINEERING}},
  number       = {{2}},
  pages        = {{71--73}},
  title        = {{{Linear detection of optical polarization mode dispersion by arrival time modulation}}},
  doi          = {{10.1007/S00202-001-0112-4}},
  volume       = {{84}},
  year         = {{2002}},
}

@article{39959,
  author       = {{Rösler, Margit and de Jeu, Marcel}},
  issn         = {{0021-9045}},
  journal      = {{Journal of Approximation Theory}},
  keywords     = {{Applied Mathematics, General Mathematics, Numerical Analysis, Analysis}},
  number       = {{1}},
  pages        = {{110--126}},
  publisher    = {{Elsevier BV}},
  title        = {{{Asymptotic Analysis for the Dunkl Kernel}}},
  doi          = {{10.1006/jath.2002.3722}},
  volume       = {{119}},
  year         = {{2002}},
}

@inproceedings{40905,
  abstract     = {{The analytic signal is commonly used in stochastic time-frequency analysis in Cohen’s class to reduce interference terms. However, we show that the usual time-frequency representation (TFR) based on the analytic signal gives only an incomplete signal description. This is because the analytic signal constructed from a non-stationary real signal is in general improper, which means that it has non-zero complementary correlation. We show how to augment the standard TFR by a complementary TFR to obtain a complete second-order characterization of the signal while still reducing interference terms compared to the TFR of the real signal.}},
  author       = {{Schreier, Peter J. and Scharf, Louis L.}},
  booktitle    = {{Proc. 36th\ Asilomar Conf.\ Signals Syst.\ Computers}},
  pages        = {{1565–1570}},
  title        = {{{Reducing interference in stochastic time-frequency analysis without losing information}}},
  doi          = {{10.1109/ACSSC.2002.1197041}},
  volume       = {{2}},
  year         = {{2002}},
}

@inproceedings{40906,
  abstract     = {{We consider the problem of minimum mean squared error (MMSE) estimation of complex random vectors in the improper case. Accounting for the information present in the complementary covariance requires the use of widely linear transformations. Based on these, we present the eigenanalysis of improper complex random vectors. This paves the way for a study of two different rank-reduced implementations of the complex Wiener Filter that make use of canonical coordinates: one that is optimum with respect to maximizing mutual information and one that minimizes mean squared error.}},
  author       = {{Schreier, Peter J. and Scharf, Louis L.}},
  booktitle    = {{Proc.\ IEEE Int.\ Conf.\ Acoustics, Speech and Signal Process.}},
  pages        = {{1153–1156}},
  title        = {{{Canonical coordinates for reduced-rank estimation of improper complex random vectors}}},
  doi          = {{10.1109/ICASSP.2002.5744004}},
  volume       = {{2}},
  year         = {{2002}},
}

@article{35954,
  abstract     = {{Let {\ASIE K}\,/{\small \ℚ}({\ASIE t \!}) be a finite extension. We describe algorithms for computing subfields and automorphisms of {\ASIE K}\,/{\small \ℚ}({\ASIE t }\!). As an application we give an algorithm for finding decompositions of rational functions in {\small \ℚ(α)}. We also present an algorithm which decides if an extension {\ASIE L}\,/{\small \ℚ}({\ASIE t \!}) is a subfield of {\ASIE K}. In case [{\ASIE K : \;}{\small\ℚ}({\ASIE t \!})] = [{\ASIE L : \;}{\small \ℚ}({\ASIE t \!})] we obtain a {\small \ℚ}({\ASIE t \!})-isomorphism test. Furthermore, we describe an algorithm which computes subfields of the normal closure of {\ASIE K}\,/{\small \ℚ}({\ASIE t \!}).}},
  author       = {{Klüners, Jürgen}},
  journal      = {{Experiment. Math. }},
  keywords     = {{algorithms, decompositions, Galois groups, subfields}},
  number       = {{2}},
  pages        = {{171--181}},
  publisher    = {{Elsevier BV}},
  title        = {{{Algorithms for function fields}}},
  volume       = {{11}},
  year         = {{2002}},
}

@article{39904,
  author       = {{Hilleringmann, Ulrich and Goser, K.}},
  issn         = {{0018-9383}},
  journal      = {{IEEE Transactions on Electron Devices}},
  keywords     = {{Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials}},
  number       = {{5}},
  pages        = {{841--846}},
  publisher    = {{Institute of Electrical and Electronics Engineers (IEEE)}},
  title        = {{{Optoelectronic system integration on silicon: waveguides, photodetectors, and VLSI CMOS circuits on one chip}}},
  doi          = {{10.1109/16.381978}},
  volume       = {{42}},
  year         = {{2002}},
}

@article{39912,
  author       = {{Schönstein, I. and Müller, J. and Hilleringmann, Ulrich and Goser, K.}},
  issn         = {{0167-9317}},
  journal      = {{Microelectronic Engineering}},
  keywords     = {{Electrical and Electronic Engineering, Surfaces, Coatings and Films, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials}},
  number       = {{1-4}},
  pages        = {{363--366}},
  publisher    = {{Elsevier BV}},
  title        = {{{Characterization of submicron NMOS devices due to visible light emission}}},
  doi          = {{10.1016/0167-9317(93)90092-j}},
  volume       = {{21}},
  year         = {{2002}},
}

@article{39914,
  author       = {{Hilleringmann, Ulrich and Goser, K.}},
  issn         = {{0167-9317}},
  journal      = {{Microelectronic Engineering}},
  keywords     = {{Electrical and Electronic Engineering, Surfaces, Coatings and Films, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials}},
  number       = {{1-4}},
  pages        = {{211--214}},
  publisher    = {{Elsevier BV}},
  title        = {{{Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon}}},
  doi          = {{10.1016/0167-9317(92)90425-q}},
  volume       = {{19}},
  year         = {{2002}},
}

@article{39906,
  author       = {{Brass, E. and Hilleringmann, Ulrich and Schumacher, K.}},
  issn         = {{0018-9200}},
  journal      = {{IEEE Journal of Solid-State Circuits}},
  keywords     = {{Electrical and Electronic Engineering}},
  number       = {{8}},
  pages        = {{1006--1010}},
  publisher    = {{Institute of Electrical and Electronics Engineers (IEEE)}},
  title        = {{{System integration of optical devices and analog CMOS amplifiers}}},
  doi          = {{10.1109/4.297714}},
  volume       = {{29}},
  year         = {{2002}},
}

@article{39907,
  author       = {{Brass, E. and Hilleringmann, Ulrich and Schumacher, K.}},
  issn         = {{0018-9200}},
  journal      = {{IEEE Journal of Solid-State Circuits}},
  keywords     = {{Electrical and Electronic Engineering}},
  number       = {{8}},
  pages        = {{1006--1010}},
  publisher    = {{Institute of Electrical and Electronics Engineers (IEEE)}},
  title        = {{{System integration of optical devices and analog CMOS amplifiers}}},
  doi          = {{10.1109/4.297714}},
  volume       = {{29}},
  year         = {{2002}},
}

@article{39899,
  author       = {{Horstmann, J.T. and Hilleringmann, Ulrich and Goser, K.}},
  issn         = {{0167-9317}},
  journal      = {{Microelectronic Engineering}},
  keywords     = {{Electrical and Electronic Engineering, Surfaces, Coatings and Films, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials}},
  number       = {{1-4}},
  pages        = {{431--434}},
  publisher    = {{Elsevier BV}},
  title        = {{{Characterisation of sub-100 nm-MOS-transistors processed by optical lithography and a sidewall-etchback technique}}},
  doi          = {{10.1016/0167-9317(95)00280-4}},
  volume       = {{30}},
  year         = {{2002}},
}

@article{39925,
  author       = {{Goser, K. and Hilleringmann, Ulrich and Rueckert, U. and Schumacher, K.}},
  issn         = {{0272-1732}},
  journal      = {{IEEE Micro}},
  keywords     = {{Electrical and Electronic Engineering, Hardware and Architecture, Software}},
  number       = {{6}},
  pages        = {{28--44}},
  publisher    = {{Institute of Electrical and Electronics Engineers (IEEE)}},
  title        = {{{VLSI technologies for artificial neural networks}}},
  doi          = {{10.1109/40.42985}},
  volume       = {{9}},
  year         = {{2002}},
}

@article{39882,
  author       = {{Mankowski, V. and Hilleringmann, Ulrich and Schumacher, K.}},
  issn         = {{0167-9317}},
  journal      = {{Microelectronic Engineering}},
  keywords     = {{Electrical and Electronic Engineering, Surfaces, Coatings and Films, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials}},
  number       = {{1-4}},
  pages        = {{525--528}},
  publisher    = {{Elsevier BV}},
  title        = {{{A novel insulation technique for smart power switching devices and very high voltage ICs above 10 kV}}},
  doi          = {{10.1016/s0167-9317(00)00370-1}},
  volume       = {{53}},
  year         = {{2002}},
}

@article{39879,
  author       = {{Horstmann, J.T. and Hilleringmann, Ulrich and Goser, K.}},
  issn         = {{0167-9317}},
  journal      = {{Microelectronic Engineering}},
  keywords     = {{Electrical and Electronic Engineering, Surfaces, Coatings and Films, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials}},
  number       = {{1-4}},
  pages        = {{213--216}},
  publisher    = {{Elsevier BV}},
  title        = {{{1/f-Noise of sub-100 nm-MOS-transistors fabricated by a special deposition and etchback technique}}},
  doi          = {{10.1016/s0167-9317(00)00299-9}},
  volume       = {{53}},
  year         = {{2002}},
}

@inproceedings{39880,
  author       = {{Horstmann, J.T. and Hilleringmann, Ulrich and Goser, K.}},
  booktitle    = {{2000 26th Annual Conference of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat. No.00CH37141)}},
  publisher    = {{IEEE}},
  title        = {{{Noise analysis of sub-100 nm-MOS-transistors fabricated by a special deposition and etchback technique}}},
  doi          = {{10.1109/iecon.2000.972560}},
  year         = {{2002}},
}