@inproceedings{39881,
  author       = {{Horstmann, J.T. and Hilleringmann, Ulrich and Goser, K.}},
  booktitle    = {{2000 26th Annual Conference of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat. No.00CH37141)}},
  publisher    = {{IEEE}},
  title        = {{{Noise analysis of sub-100 nm-MOS-transistors fabricated by a special deposition and etchback technique}}},
  doi          = {{10.1109/iecon.2000.972560}},
  year         = {{2002}},
}

@article{39919,
  author       = {{Hilleringmann, Ulrich and Knospe, K. and Heite, C. and Schumacher, K. and Goser, K.}},
  issn         = {{0167-9317}},
  journal      = {{Microelectronic Engineering}},
  keywords     = {{Electrical and Electronic Engineering, Surfaces, Coatings and Films, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials}},
  number       = {{1-4}},
  pages        = {{289--292}},
  publisher    = {{Elsevier BV}},
  title        = {{{A silicon based technology for monolithic integration of waveguides and VLSI CMOS circuits}}},
  doi          = {{10.1016/0167-9317(91)90231-2}},
  volume       = {{15}},
  year         = {{2002}},
}

@article{39926,
  author       = {{Goser, K. and Hilleringmann, Ulrich and Rueckert, U. and Schumacher, K.}},
  issn         = {{0272-1732}},
  journal      = {{IEEE Micro}},
  keywords     = {{Electrical and Electronic Engineering, Hardware and Architecture, Software}},
  number       = {{6}},
  pages        = {{28--44}},
  publisher    = {{Institute of Electrical and Electronics Engineers (IEEE)}},
  title        = {{{VLSI technologies for artificial neural networks}}},
  doi          = {{10.1109/40.42985}},
  volume       = {{9}},
  year         = {{2002}},
}

@inproceedings{39892,
  author       = {{Blum, F. and Denisenko, A. and Job, R. and Borchert, D. and Weber, W. and Borany, J.V. and Hilleringmann, Ulrich and Fahrner, W.R.}},
  booktitle    = {{IECON '98. Proceedings of the 24th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.98CH36200)}},
  publisher    = {{IEEE}},
  title        = {{{Nuclear radiation detectors on various type diamonds}}},
  doi          = {{10.1109/iecon.1998.724097}},
  year         = {{2002}},
}

@article{39920,
  author       = {{Soennecken, A. and Hilleringmann, Ulrich and Goser, K.}},
  issn         = {{0167-9317}},
  journal      = {{Microelectronic Engineering}},
  keywords     = {{Electrical and Electronic Engineering, Surfaces, Coatings and Films, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials}},
  number       = {{1-4}},
  pages        = {{633--636}},
  publisher    = {{Elsevier BV}},
  title        = {{{Floating gate structures as nonvolatile analog memory cells in 1.0μm-LOCOS-CMOS technology with PZT dielectrica}}},
  doi          = {{10.1016/0167-9317(91)90299-s}},
  volume       = {{15}},
  year         = {{2002}},
}

@article{39915,
  author       = {{Hilleringmann, Ulrich and Goser, K.}},
  issn         = {{0167-9317}},
  journal      = {{Microelectronic Engineering}},
  keywords     = {{Electrical and Electronic Engineering, Surfaces, Coatings and Films, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials}},
  number       = {{1-4}},
  pages        = {{211--214}},
  publisher    = {{Elsevier BV}},
  title        = {{{Results of monolithic integration of optical waveguides, photodiodes and CMOS circuits on silicon}}},
  doi          = {{10.1016/0167-9317(92)90425-q}},
  volume       = {{19}},
  year         = {{2002}},
}

@article{39916,
  author       = {{Adams, S. and Hilleringmann, Ulrich and Goser, K.}},
  issn         = {{0167-9317}},
  journal      = {{Microelectronic Engineering}},
  keywords     = {{Electrical and Electronic Engineering, Surfaces, Coatings and Films, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials}},
  number       = {{1-4}},
  pages        = {{191--194}},
  publisher    = {{Elsevier BV}},
  title        = {{{CMOS compatible micromachining by dry silicon-etching techniques}}},
  doi          = {{10.1016/0167-9317(92)90420-v}},
  volume       = {{19}},
  year         = {{2002}},
}

@article{39348,
  author       = {{Horstmann, J.T. and Hilleringmann, Ulrich and Goser, K.F.}},
  issn         = {{0018-9383}},
  journal      = {{IEEE Transactions on Electron Devices}},
  keywords     = {{Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials}},
  number       = {{1}},
  pages        = {{299--306}},
  publisher    = {{Institute of Electrical and Electronics Engineers (IEEE)}},
  title        = {{{Matching analysis of deposition defined 50-nm MOSFET's}}},
  doi          = {{10.1109/16.658845}},
  volume       = {{45}},
  year         = {{2002}},
}

@inproceedings{39923,
  author       = {{Goser, K. and Hilleringmann, Ulrich and Rueckert, U.}},
  booktitle    = {{[1991] Proceedings, Advanced Computer Technology, Reliable Systems and Applications}},
  publisher    = {{IEEE Comput. Soc. Press}},
  title        = {{{Applications and implementations of neural networks in microelectronics-overview and status}}},
  doi          = {{10.1109/cmpeur.1991.257442}},
  year         = {{2002}},
}

@article{39889,
  author       = {{Mankowski, V. and Hilleringmann, Ulrich and Schumacher, K.}},
  issn         = {{0167-9317}},
  journal      = {{Microelectronic Engineering}},
  keywords     = {{Electrical and Electronic Engineering, Surfaces, Coatings and Films, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials}},
  number       = {{1-4}},
  pages        = {{413--417}},
  publisher    = {{Elsevier BV}},
  title        = {{{12 kV low current cascaded light triggered switch on one silicon chip}}},
  doi          = {{10.1016/s0167-9317(99)00122-7}},
  volume       = {{46}},
  year         = {{2002}},
}

@article{39891,
  author       = {{Horstmann, J.T. and Hilleringmann, Ulrich and Goser, K.F.}},
  issn         = {{0018-9383}},
  journal      = {{IEEE Transactions on Electron Devices}},
  keywords     = {{Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials}},
  number       = {{1}},
  pages        = {{299--306}},
  publisher    = {{Institute of Electrical and Electronics Engineers (IEEE)}},
  title        = {{{Matching analysis of deposition defined 50-nm MOSFET's}}},
  doi          = {{10.1109/16.658845}},
  volume       = {{45}},
  year         = {{2002}},
}

@article{39886,
  author       = {{Wirth, G and Hilleringmann, Ulrich and Horstmann, J.T and Goser, K}},
  issn         = {{0038-1101}},
  journal      = {{Solid-State Electronics}},
  keywords     = {{Materials Chemistry, Electrical and Electronic Engineering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials}},
  number       = {{7}},
  pages        = {{1245--1250}},
  publisher    = {{Elsevier BV}},
  title        = {{{Mesoscopic transport phenomena in ultrashort channel MOSFETs}}},
  doi          = {{10.1016/s0038-1101(99)00060-x}},
  volume       = {{43}},
  year         = {{2002}},
}

@article{39876,
  author       = {{Otterbach, R. and Hilleringmann, Ulrich and Horstmann, T.J. and Goser, K.}},
  issn         = {{0925-9635}},
  journal      = {{Diamond and Related Materials}},
  keywords     = {{Electrical and Electronic Engineering, Materials Chemistry, Mechanical Engineering, General Chemistry, Electronic, Optical and Magnetic Materials}},
  number       = {{3-7}},
  pages        = {{511--514}},
  publisher    = {{Elsevier BV}},
  title        = {{{Structures with a minimum feature size of less than 100 nm in CVD-diamond for sensor applications}}},
  doi          = {{10.1016/s0925-9635(01)00373-9}},
  volume       = {{10}},
  year         = {{2002}},
}

@article{39877,
  author       = {{Hilleringmann, Ulrich and Vieregge, T. and Horstmann, J.T.}},
  issn         = {{0167-9317}},
  journal      = {{Microelectronic Engineering}},
  keywords     = {{Electrical and Electronic Engineering, Surfaces, Coatings and Films, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials}},
  number       = {{1-4}},
  pages        = {{569--572}},
  publisher    = {{Elsevier BV}},
  title        = {{{A structure definition technique for 25 nm lines of silicon and related materials}}},
  doi          = {{10.1016/s0167-9317(00)00380-4}},
  volume       = {{53}},
  year         = {{2002}},
}

@article{39874,
  author       = {{Otterbach, R. and Hilleringmann, Ulrich}},
  issn         = {{0925-9635}},
  journal      = {{Diamond and Related Materials}},
  keywords     = {{Electrical and Electronic Engineering, Materials Chemistry, Mechanical Engineering, General Chemistry, Electronic, Optical and Magnetic Materials}},
  number       = {{3-6}},
  pages        = {{841--844}},
  publisher    = {{Elsevier BV}},
  title        = {{{Reactive ion etching of CVD-diamond for piezoresistive pressure sensors}}},
  doi          = {{10.1016/s0925-9635(01)00703-8}},
  volume       = {{11}},
  year         = {{2002}},
}

@inbook{39875,
  abstract     = {{Die Metallisierung stellt den elektrischen Kontakt zu den dotierten Gebieten der integrierten Schaltungselemente her und verbindet die einzelnen Komponenten eines Chips durch Leiterbahnen. Sie führt die Anschlüsse über weitere Leiterbahnen zum Rand des Chips und wird dort zu Kontaktflecken (“Pads”) aufgeweitet, die als Anschluss für die Verbindungsdrähte zwischen Chip und Gehäuse oder zum Aufsetzen von Messsonden für die Parametererfassung zum Schaltungstest auf ungesägten Scheiben dienen.}},
  author       = {{Hilleringmann, Ulrich}},
  booktitle    = {{Silizium-Halbleitertechnologie}},
  isbn         = {{978-3-322-94119-0}},
  pages        = {{131–151}},
  publisher    = {{Vieweg+Teubner Verlag}},
  title        = {{{Metallisierung und Kontakte}}},
  doi          = {{10.1007/978-3-322-94119-0_8}},
  year         = {{2002}},
}

@inproceedings{44535,
  author       = {{Burban, Igor and Drozd, Yu.}},
  booktitle    = {{ Ukrainian mathematical congress 2001. Algebraic structures and their applications. Proceedings of the third international algebraic conference held in framework of the Ukrainian mathematical congress}},
  location     = {{Kiev, Ukraine}},
  pages        = {{201--211}},
  publisher    = {{Instytut Matematyky NAN Ukrainy}},
  title        = {{{Derived categories and matrix problems}}},
  year         = {{2002}},
}

@article{44358,
  author       = {{Burban, Igor and Freiermuth, H. -G.}},
  journal      = {{Le Matematiche}},
  pages        = {{265–283}},
  title        = {{{Geometrical properties of sections of Buchsbaum- Rim sheaves}}},
  volume       = {{LVII}},
  year         = {{2002}},
}

@inbook{56907,
  author       = {{Biehler, Rolf}},
  booktitle    = {{Beiträge zum Mathematikunterricht 2002}},
  editor       = {{Peschek, W.}},
  pages        = {{115--118}},
  publisher    = {{Franzbecker}},
  title        = {{{Alternativen zu CAS und EXCEL - Interaktiv dynamisches Mathematiklernen mit innovativer Werk-zeugsoftware}}},
  year         = {{2002}},
}

@article{64541,
  author       = {{Hofmann, Martin and Gerhardt, Nils Christopher and Wagner, Anke and Ellmers, Christoph and Höhnsdorf, Falko and Koch, Jörg and Stolz, Wolfgang and Koch, Stephan W. and Rühle, Wolfgang W. and Hader, Jörg and Moloney, Jerome V. and O‘Reilly, E. P. and Borchert, Bernd and Egorov, A. Yu and Riechert, Henning and Schneider, Hans Christian and Chow, Weng W.}},
  journal      = {{IEEE journal of quantum electronics / Institute of Electrical and Electronics Engineers}},
  number       = {{2}},
  pages        = {{213 -- 221}},
  title        = {{{Emission dynamics and optical gain of 1.3 \mum (GaIn)(NAs)/GaAs Lasers}}},
  doi          = {{10.1109/3.980275}},
  volume       = {{38}},
  year         = {{2002}},
}