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Hellebrand, in: IEEE International Test Conference (ITC’04), IEEE, Charlotte, NC, USA, 2004, pp. 926–935.","mla":"Wuertenberger, Armin, et al. “Data Compression for Multiple Scan Chains Using Dictionaries with Corrections.” <i>IEEE International Test Conference (ITC’04)</i>, IEEE, 2004, pp. 926–35, doi:<a href=\"https://doi.org/10.1109/test.2004.1387357\">10.1109/test.2004.1387357</a>.","apa":"Wuertenberger, A., S. Tautermann, C., &#38; Hellebrand, S. (2004). Data Compression for Multiple Scan Chains Using Dictionaries with Corrections. <i>IEEE International Test Conference (ITC’04)</i>, 926–935. <a href=\"https://doi.org/10.1109/test.2004.1387357\">https://doi.org/10.1109/test.2004.1387357</a>","chicago":"Wuertenberger, Armin, Christofer S. Tautermann, and Sybille Hellebrand. “Data Compression for Multiple Scan Chains Using Dictionaries with Corrections.” In <i>IEEE International Test Conference (ITC’04)</i>, 926–35. 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