[{"publication":"{IEEE} {T}rans.\\ {S}ignal\\ {P}rocess.","date_created":"2023-01-30T11:52:08Z","type":"journal_article","year":"2003","status":"public","_id":"40899","page":"3071–3079","volume":51,"date_updated":"2023-01-30T11:54:03Z","issue":"12","title":"Stochastic time-frequency analysis using the analytic signal: why the complementary distribution matters","author":[{"last_name":"Schreier","full_name":"Schreier, Peter J.","first_name":"Peter J."},{"first_name":"Louis L.","full_name":"Scharf, Louis L.","last_name":"Scharf"}],"doi":"10.1109/TSP.2003.818911","intvolume":"        51","abstract":[{"text":"We challenge the perception that we live in a “proper world”, where complex random signals can always be assumed to be proper (also called circularly symmetric). Rather, we stress the fact that the analytic signal constructed from a nonstationary real signal is, in general, improper, which means that its complementary correlation function is nonzero. We explore the consequences of this finding in the context of stochastic time-frequency analysis in Cohen’s class. There, the analytic signal plays a prominent role because it reduces interference terms. However, the usual time-frequency representation (TFR) based on the analytic signal gives only an incomplete signal description. It must be augmented by a complementary TFR whose properties we develop in detail. We show why it is still advantageous to use the pair of standard and complementary TFRs of the analytic signal rather than the TFR of the corresponding real signal.","lang":"eng"}],"citation":{"short":"P.J. Schreier, L.L. Scharf, {IEEE} {T}rans.\\ {S}ignal\\ {P}rocess. 51 (2003) 3071–3079.","bibtex":"@article{Schreier_Scharf_2003, title={Stochastic time-frequency analysis using the analytic signal: why the complementary distribution matters}, volume={51}, DOI={<a href=\"https://doi.org/10.1109/TSP.2003.818911\">10.1109/TSP.2003.818911</a>}, number={12}, journal={{IEEE} {T}rans.\\ {S}ignal\\ {P}rocess.}, author={Schreier, Peter J. and Scharf, Louis L.}, year={2003}, pages={3071–3079} }","mla":"Schreier, Peter J., and Louis L. Scharf. “Stochastic Time-Frequency Analysis Using the Analytic Signal: Why the Complementary Distribution Matters.” <i>{IEEE} {T}rans.\\ {S}ignal\\ {P}rocess.</i>, vol. 51, no. 12, 2003, pp. 3071–3079, doi:<a href=\"https://doi.org/10.1109/TSP.2003.818911\">10.1109/TSP.2003.818911</a>.","ieee":"P. J. Schreier and L. L. Scharf, “Stochastic time-frequency analysis using the analytic signal: why the complementary distribution matters,” <i>{IEEE} {T}rans.\\ {S}ignal\\ {P}rocess.</i>, vol. 51, no. 12, pp. 3071–3079, 2003, doi: <a href=\"https://doi.org/10.1109/TSP.2003.818911\">10.1109/TSP.2003.818911</a>.","chicago":"Schreier, Peter J., and Louis L. Scharf. “Stochastic Time-Frequency Analysis Using the Analytic Signal: Why the Complementary Distribution Matters.” <i>{IEEE} {T}rans.\\ {S}ignal\\ {P}rocess.</i> 51, no. 12 (2003): 3071–3079. <a href=\"https://doi.org/10.1109/TSP.2003.818911\">https://doi.org/10.1109/TSP.2003.818911</a>.","apa":"Schreier, P. J., &#38; Scharf, L. L. (2003). Stochastic time-frequency analysis using the analytic signal: why the complementary distribution matters. <i>{IEEE} {T}rans.\\ {S}ignal\\ {P}rocess.</i>, <i>51</i>(12), 3071–3079. <a href=\"https://doi.org/10.1109/TSP.2003.818911\">https://doi.org/10.1109/TSP.2003.818911</a>","ama":"Schreier PJ, Scharf LL. Stochastic time-frequency analysis using the analytic signal: why the complementary distribution matters. <i>{IEEE} {T}rans\\ {S}ignal\\ {P}rocess</i>. 2003;51(12):3071–3079. doi:<a href=\"https://doi.org/10.1109/TSP.2003.818911\">10.1109/TSP.2003.818911</a>"},"user_id":"43497","department":[{"_id":"263"}]},{"_id":"39957","date_updated":"2023-01-26T17:44:10Z","date_created":"2023-01-25T10:17:51Z","publisher":"American Mathematical Society (AMS)","language":[{"iso":"eng"}],"year":"2003","status":"public","citation":{"ama":"Rösler M. A positive radial product formula for the Dunkl kernel. <i>Transactions of the American Mathematical Society</i>. 2003;355(6):2413–2438. doi:<a href=\"https://doi.org/10.48550/ARXIV.MATH/0210137\">10.48550/ARXIV.MATH/0210137</a>","apa":"Rösler, M. (2003). A positive radial product formula for the Dunkl kernel. <i>Transactions of the American Mathematical Society</i>, <i>355</i>(6), 2413–2438. <a href=\"https://doi.org/10.48550/ARXIV.MATH/0210137\">https://doi.org/10.48550/ARXIV.MATH/0210137</a>","ieee":"M. Rösler, “A positive radial product formula for the Dunkl kernel,” <i>Transactions of the American Mathematical Society</i>, vol. 355, no. 6, pp. 2413–2438, 2003, doi: <a href=\"https://doi.org/10.48550/ARXIV.MATH/0210137\">10.48550/ARXIV.MATH/0210137</a>.","chicago":"Rösler, Margit. “A Positive Radial Product Formula for the Dunkl Kernel.” <i>Transactions of the American Mathematical Society</i> 355, no. 6 (2003): 2413–2438. <a href=\"https://doi.org/10.48550/ARXIV.MATH/0210137\">https://doi.org/10.48550/ARXIV.MATH/0210137</a>.","bibtex":"@article{Rösler_2003, title={A positive radial product formula for the Dunkl kernel}, volume={355}, DOI={<a href=\"https://doi.org/10.48550/ARXIV.MATH/0210137\">10.48550/ARXIV.MATH/0210137</a>}, number={6}, journal={Transactions of the American Mathematical Society}, publisher={American Mathematical Society (AMS)}, author={Rösler, Margit}, year={2003}, pages={2413–2438} }","mla":"Rösler, Margit. “A Positive Radial Product Formula for the Dunkl Kernel.” <i>Transactions of the American Mathematical Society</i>, vol. 355, no. 6, American Mathematical Society (AMS), 2003, pp. 2413–2438, doi:<a href=\"https://doi.org/10.48550/ARXIV.MATH/0210137\">10.48550/ARXIV.MATH/0210137</a>.","short":"M. Rösler, Transactions of the American Mathematical Society 355 (2003) 2413–2438."},"publication_status":"published","department":[{"_id":"555"}],"author":[{"last_name":"Rösler","id":"37390","first_name":"Margit","full_name":"Rösler, Margit"}],"intvolume":"       355","page":"2413–2438","volume":355,"issue":"6","publication":"Transactions of the American Mathematical Society","type":"journal_article","user_id":"93826","title":"A positive radial product formula for the Dunkl kernel","extern":"1","doi":"10.48550/ARXIV.MATH/0210137","abstract":[{"lang":"eng","text":"It is an open conjecture that generalized Bessel functions associated with root systems have a positive product formula for non-negative multiplicity parameters of the associated Dunkl operators. In this paper, a partial result towards this conjecture is proven, namely a positive radial product formula for the non-symmetric counterpart of the generalized Bessel function, the Dunkl kernel. Radial hereby means that one of the factors in the product formula is replaced by its mean over a sphere. The key to this product formula is a positivity result for the Dunkl-type spherical mean operator. It can also be interpreted in the sense that the Dunkl-type generalized translation of radial functions is positivity-preserving. As an application, we construct Dunkl-type homogeneous Markov processes associated with radial probability distributions."}]},{"department":[{"_id":"263"}],"citation":{"short":"P.J. Schreier, L.L. Scharf, {IEEE} {T}rans.\\ {S}ignal\\ {P}rocess. 51 (2003) 714–725.","bibtex":"@article{Schreier_Scharf_2003, title={Second-order analysis of improper complex random vectors and processes}, volume={51}, DOI={<a href=\"https://doi.org/10.1109/TSP.2002.808085\">10.1109/TSP.2002.808085</a>}, number={3}, journal={{IEEE} {T}rans.\\ {S}ignal\\ {P}rocess.}, author={Schreier, Peter J. and Scharf, Louis L.}, year={2003}, pages={714–725} }","mla":"Schreier, Peter J., and Louis L. Scharf. “Second-Order Analysis of Improper Complex Random Vectors and Processes.” <i>{IEEE} {T}rans.\\ {S}ignal\\ {P}rocess.</i>, vol. 51, no. 3, 2003, pp. 714–725, doi:<a href=\"https://doi.org/10.1109/TSP.2002.808085\">10.1109/TSP.2002.808085</a>.","ieee":"P. J. Schreier and L. L. Scharf, “Second-order analysis of improper complex random vectors and processes,” <i>{IEEE} {T}rans.\\ {S}ignal\\ {P}rocess.</i>, vol. 51, no. 3, pp. 714–725, 2003, doi: <a href=\"https://doi.org/10.1109/TSP.2002.808085\">10.1109/TSP.2002.808085</a>.","chicago":"Schreier, Peter J., and Louis L. Scharf. “Second-Order Analysis of Improper Complex Random Vectors and Processes.” <i>{IEEE} {T}rans.\\ {S}ignal\\ {P}rocess.</i> 51, no. 3 (2003): 714–725. <a href=\"https://doi.org/10.1109/TSP.2002.808085\">https://doi.org/10.1109/TSP.2002.808085</a>.","ama":"Schreier PJ, Scharf LL. Second-order analysis of improper complex random vectors and processes. <i>{IEEE} {T}rans\\ {S}ignal\\ {P}rocess</i>. 2003;51(3):714–725. doi:<a href=\"https://doi.org/10.1109/TSP.2002.808085\">10.1109/TSP.2002.808085</a>","apa":"Schreier, P. J., &#38; Scharf, L. L. (2003). Second-order analysis of improper complex random vectors and processes. <i>{IEEE} {T}rans.\\ {S}ignal\\ {P}rocess.</i>, <i>51</i>(3), 714–725. <a href=\"https://doi.org/10.1109/TSP.2002.808085\">https://doi.org/10.1109/TSP.2002.808085</a>"},"user_id":"43497","doi":"10.1109/TSP.2002.808085","abstract":[{"lang":"eng","text":"We present a comprehensive treatment of the second-order theory of complex random vectors and wide-sense stationary (WSS) signals. The main focus is on the improper case, in which the complementary covariance does not vanish. Accounting for the information present in the complementary covariance requires the use of widely linear transformations. Based on these, we present the eigenanalysis of complex vectors and apply it to the problem of rank reduction through principal components. We also investigate joint properties of two complex vectors by introducing canonical correlations, which paves the way for a discussion of the Wiener filter and its rank-reduced version. We link the concepts of propriety and joint propriety to eigenanalysis and canonical correlation analysis, respectively. Our treatment is extended to WSS signals. In particular, we give a result on the asymptotic distribution of eigenvalues and examine the connection between WSS, proper, and analytic signals."}],"intvolume":"        51","title":"Second-order analysis of improper complex random vectors and processes","author":[{"first_name":"Peter J.","full_name":"Schreier, Peter J.","last_name":"Schreier"},{"full_name":"Scharf, Louis L.","first_name":"Louis L.","last_name":"Scharf"}],"date_updated":"2023-01-30T11:52:55Z","issue":"3","page":"714–725","_id":"40904","volume":51,"type":"journal_article","year":"2003","status":"public","publication":"{IEEE} {T}rans.\\ {S}ignal\\ {P}rocess.","date_created":"2023-01-30T11:52:09Z"},{"intvolume":"        99","author":[{"last_name":"Fieker","first_name":"Claus","full_name":"Fieker, Claus"},{"id":"21202","last_name":"Klüners","full_name":"Klüners, Jürgen","first_name":"Jürgen"}],"department":[{"_id":"102"}],"citation":{"apa":"Fieker, C., &#38; Klüners, J. (2003). Minimal discriminants for fields with small Frobenius groups as Galois groups. <i>Journal of Number Theory</i>, <i>99</i>(2), 318–337. <a href=\"https://doi.org/10.1016/s0022-314x(02)00071-9\">https://doi.org/10.1016/s0022-314x(02)00071-9</a>","ama":"Fieker C, Klüners J. Minimal discriminants for fields with small Frobenius groups as Galois groups. <i>Journal of Number Theory</i>. 2003;99(2):318-337. doi:<a href=\"https://doi.org/10.1016/s0022-314x(02)00071-9\">10.1016/s0022-314x(02)00071-9</a>","ieee":"C. Fieker and J. Klüners, “Minimal discriminants for fields with small Frobenius groups as Galois groups,” <i>Journal of Number Theory</i>, vol. 99, no. 2, pp. 318–337, 2003, doi: <a href=\"https://doi.org/10.1016/s0022-314x(02)00071-9\">10.1016/s0022-314x(02)00071-9</a>.","chicago":"Fieker, Claus, and Jürgen Klüners. “Minimal Discriminants for Fields with Small Frobenius Groups as Galois Groups.” <i>Journal of Number Theory</i> 99, no. 2 (2003): 318–37. <a href=\"https://doi.org/10.1016/s0022-314x(02)00071-9\">https://doi.org/10.1016/s0022-314x(02)00071-9</a>.","bibtex":"@article{Fieker_Klüners_2003, title={Minimal discriminants for fields with small Frobenius groups as Galois groups}, volume={99}, DOI={<a href=\"https://doi.org/10.1016/s0022-314x(02)00071-9\">10.1016/s0022-314x(02)00071-9</a>}, number={2}, journal={Journal of Number Theory}, publisher={Elsevier BV}, author={Fieker, Claus and Klüners, Jürgen}, year={2003}, pages={318–337} }","mla":"Fieker, Claus, and Jürgen Klüners. “Minimal Discriminants for Fields with Small Frobenius Groups as Galois Groups.” <i>Journal of Number Theory</i>, vol. 99, no. 2, Elsevier BV, 2003, pp. 318–37, doi:<a href=\"https://doi.org/10.1016/s0022-314x(02)00071-9\">10.1016/s0022-314x(02)00071-9</a>.","short":"C. Fieker, J. Klüners, Journal of Number Theory 99 (2003) 318–337."},"publication_status":"published","year":"2003","publication_identifier":{"issn":["0022-314X"]},"language":[{"iso":"eng"}],"status":"public","date_created":"2022-12-23T09:53:23Z","publisher":"Elsevier BV","date_updated":"2023-03-06T09:19:16Z","_id":"34896","abstract":[{"lang":"eng","text":"We apply class field theory to the computation of the minimal discriminants for certain solvable groups. In particular, we apply our techniques to small Frobenius groups and all imprimitive degree 8 groups such that the corresponding fields have only a degree 2 and no degree 4 subfield."}],"doi":"10.1016/s0022-314x(02)00071-9","title":"Minimal discriminants for fields with small Frobenius groups as Galois groups","user_id":"93826","keyword":["Algebra and Number Theory"],"type":"journal_article","publication":"Journal of Number Theory","issue":"2","page":"318-337","volume":99},{"author":[{"last_name":"Hilleringmann","id":"20179","first_name":"Ulrich","full_name":"Hilleringmann, Ulrich"},{"last_name":"Vieregge","first_name":"T.","full_name":"Vieregge, T."},{"first_name":"J.T.","full_name":"Horstmann, J.T.","last_name":"Horstmann"}],"title":"Masking and etching of silicon and related materials for geometries down to 25 nm","doi":"10.1109/iecon.1999.822171","user_id":"20179","publication_status":"published","citation":{"mla":"Hilleringmann, Ulrich, et al. “Masking and Etching of Silicon and Related Materials for Geometries down to 25 Nm.” <i>IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029)</i>, IEEE, 2003, doi:<a href=\"https://doi.org/10.1109/iecon.1999.822171\">10.1109/iecon.1999.822171</a>.","apa":"Hilleringmann, U., Vieregge, T., &#38; Horstmann, J. T. (2003). Masking and etching of silicon and related materials for geometries down to 25 nm. <i>IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029)</i>. <a href=\"https://doi.org/10.1109/iecon.1999.822171\">https://doi.org/10.1109/iecon.1999.822171</a>","ama":"Hilleringmann U, Vieregge T, Horstmann JT. Masking and etching of silicon and related materials for geometries down to 25 nm. In: <i>IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029)</i>. IEEE; 2003. doi:<a href=\"https://doi.org/10.1109/iecon.1999.822171\">10.1109/iecon.1999.822171</a>","bibtex":"@inproceedings{Hilleringmann_Vieregge_Horstmann_2003, title={Masking and etching of silicon and related materials for geometries down to 25 nm}, DOI={<a href=\"https://doi.org/10.1109/iecon.1999.822171\">10.1109/iecon.1999.822171</a>}, booktitle={IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029)}, publisher={IEEE}, author={Hilleringmann, Ulrich and Vieregge, T. and Horstmann, J.T.}, year={2003} }","chicago":"Hilleringmann, Ulrich, T. Vieregge, and J.T. Horstmann. “Masking and Etching of Silicon and Related Materials for Geometries down to 25 Nm.” In <i>IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029)</i>. IEEE, 2003. <a href=\"https://doi.org/10.1109/iecon.1999.822171\">https://doi.org/10.1109/iecon.1999.822171</a>.","short":"U. Hilleringmann, T. Vieregge, J.T. Horstmann, in: IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029), IEEE, 2003.","ieee":"U. Hilleringmann, T. Vieregge, and J. T. Horstmann, “Masking and etching of silicon and related materials for geometries down to 25 nm,” 2003, doi: <a href=\"https://doi.org/10.1109/iecon.1999.822171\">10.1109/iecon.1999.822171</a>."},"department":[{"_id":"59"}],"publisher":"IEEE","publication":"IECON'99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029)","date_created":"2023-01-25T09:12:16Z","status":"public","year":"2003","type":"conference","language":[{"iso":"eng"}],"_id":"39887","date_updated":"2023-03-21T09:59:07Z"},{"user_id":"20179","publication_status":"published","citation":{"ieee":"J. T. Horstmann, U. Hilleringmann, and K. Goser, “Matching analysis of NMOS-transistors with a channel length down to 30 nm,” 2003, doi: <a href=\"https://doi.org/10.1109/iecon.1999.822163\">10.1109/iecon.1999.822163</a>.","short":"J.T. Horstmann, U. Hilleringmann, K. Goser, in: IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029), IEEE, 2003.","chicago":"Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “Matching Analysis of NMOS-Transistors with a Channel Length down to 30 Nm.” In <i>IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029)</i>. IEEE, 2003. <a href=\"https://doi.org/10.1109/iecon.1999.822163\">https://doi.org/10.1109/iecon.1999.822163</a>.","ama":"Horstmann JT, Hilleringmann U, Goser K. Matching analysis of NMOS-transistors with a channel length down to 30 nm. In: <i>IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029)</i>. IEEE; 2003. doi:<a href=\"https://doi.org/10.1109/iecon.1999.822163\">10.1109/iecon.1999.822163</a>","bibtex":"@inproceedings{Horstmann_Hilleringmann_Goser_2003, title={Matching analysis of NMOS-transistors with a channel length down to 30 nm}, DOI={<a href=\"https://doi.org/10.1109/iecon.1999.822163\">10.1109/iecon.1999.822163</a>}, booktitle={IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029)}, publisher={IEEE}, author={Horstmann, J.T. and Hilleringmann, Ulrich and Goser, K.}, year={2003} }","apa":"Horstmann, J. T., Hilleringmann, U., &#38; Goser, K. (2003). Matching analysis of NMOS-transistors with a channel length down to 30 nm. <i>IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029)</i>. <a href=\"https://doi.org/10.1109/iecon.1999.822163\">https://doi.org/10.1109/iecon.1999.822163</a>","mla":"Horstmann, J. T., et al. “Matching Analysis of NMOS-Transistors with a Channel Length down to 30 Nm.” <i>IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029)</i>, IEEE, 2003, doi:<a href=\"https://doi.org/10.1109/iecon.1999.822163\">10.1109/iecon.1999.822163</a>."},"department":[{"_id":"59"}],"author":[{"last_name":"Horstmann","first_name":"J.T.","full_name":"Horstmann, J.T."},{"last_name":"Hilleringmann","id":"20179","first_name":"Ulrich","full_name":"Hilleringmann, Ulrich"},{"full_name":"Goser, K.","first_name":"K.","last_name":"Goser"}],"title":"Matching analysis of NMOS-transistors with a channel length down to 30 nm","doi":"10.1109/iecon.1999.822163","_id":"39888","date_updated":"2023-03-21T09:58:50Z","publisher":"IEEE","publication":"IECON'99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029)","date_created":"2023-01-25T09:12:46Z","status":"public","year":"2003","type":"conference","language":[{"iso":"eng"}]},{"publisher":"IEEE","date_created":"2023-01-25T09:11:30Z","publication":"IECON'99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029)","status":"public","language":[{"iso":"eng"}],"type":"conference","year":"2003","_id":"39885","date_updated":"2023-03-21T09:59:36Z","author":[{"last_name":"Wirth","first_name":"G.","full_name":"Wirth, G."},{"id":"20179","last_name":"Hilleringmann","first_name":"Ulrich","full_name":"Hilleringmann, Ulrich"},{"last_name":"Horstmann","first_name":"J.T.","full_name":"Horstmann, J.T."},{"last_name":"Goser","full_name":"Goser, K.","first_name":"K."}],"title":"Negative differential resistance in ultrashort bulk MOSFETs","doi":"10.1109/iecon.1999.822164","publication_status":"published","user_id":"20179","citation":{"ieee":"G. Wirth, U. Hilleringmann, J. T. Horstmann, and K. Goser, “Negative differential resistance in ultrashort bulk MOSFETs,” 2003, doi: <a href=\"https://doi.org/10.1109/iecon.1999.822164\">10.1109/iecon.1999.822164</a>.","chicago":"Wirth, G., Ulrich Hilleringmann, J.T. Horstmann, and K. Goser. “Negative Differential Resistance in Ultrashort Bulk MOSFETs.” In <i>IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029)</i>. IEEE, 2003. <a href=\"https://doi.org/10.1109/iecon.1999.822164\">https://doi.org/10.1109/iecon.1999.822164</a>.","apa":"Wirth, G., Hilleringmann, U., Horstmann, J. T., &#38; Goser, K. (2003). Negative differential resistance in ultrashort bulk MOSFETs. <i>IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029)</i>. <a href=\"https://doi.org/10.1109/iecon.1999.822164\">https://doi.org/10.1109/iecon.1999.822164</a>","ama":"Wirth G, Hilleringmann U, Horstmann JT, Goser K. Negative differential resistance in ultrashort bulk MOSFETs. In: <i>IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029)</i>. IEEE; 2003. doi:<a href=\"https://doi.org/10.1109/iecon.1999.822164\">10.1109/iecon.1999.822164</a>","short":"G. Wirth, U. Hilleringmann, J.T. Horstmann, K. Goser, in: IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029), IEEE, 2003.","bibtex":"@inproceedings{Wirth_Hilleringmann_Horstmann_Goser_2003, title={Negative differential resistance in ultrashort bulk MOSFETs}, DOI={<a href=\"https://doi.org/10.1109/iecon.1999.822164\">10.1109/iecon.1999.822164</a>}, booktitle={IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. 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