---
_id: '38290'
author:
- first_name: D
  full_name: Sandel, D
  last_name: Sandel
- first_name: V
  full_name: Mirvoda, V
  last_name: Mirvoda
- first_name: F
  full_name: Wust, F
  last_name: Wust
- first_name: Reinhold
  full_name: Noé, Reinhold
  id: '381'
  last_name: Noé
  orcid: https://orcid.org/0000-0002-5839-7616
- first_name: CJ
  full_name: Weiske, CJ
  last_name: Weiske
citation:
  ama: Sandel D, Mirvoda V, Wust F, Noé R, Weiske C. Signed online chromatic dispersion
    detection at 40 Gbit/s based on arrival time detection with 60 attosecond dynamic
    accuracy. <i>ELECTRONICS LETTERS</i>. 2002;38(17):984-986. doi:<a href="https://doi.org/10.1049/el:20020677">10.1049/el:20020677</a>
  apa: Sandel, D., Mirvoda, V., Wust, F., Noé, R., &#38; Weiske, C. (2002). Signed
    online chromatic dispersion detection at 40 Gbit/s based on arrival time detection
    with 60 attosecond dynamic accuracy. <i>ELECTRONICS LETTERS</i>, <i>38</i>(17),
    984–986. <a href="https://doi.org/10.1049/el:20020677">https://doi.org/10.1049/el:20020677</a>
  bibtex: '@article{Sandel_Mirvoda_Wust_Noé_Weiske_2002, title={Signed online chromatic
    dispersion detection at 40 Gbit/s based on arrival time detection with 60 attosecond
    dynamic accuracy}, volume={38}, DOI={<a href="https://doi.org/10.1049/el:20020677">10.1049/el:20020677</a>},
    number={17}, journal={ELECTRONICS LETTERS}, author={Sandel, D and Mirvoda, V and
    Wust, F and Noé, Reinhold and Weiske, CJ}, year={2002}, pages={984–986} }'
  chicago: 'Sandel, D, V Mirvoda, F Wust, Reinhold Noé, and CJ Weiske. “Signed Online
    Chromatic Dispersion Detection at 40 Gbit/s Based on Arrival Time Detection with
    60 Attosecond Dynamic Accuracy.” <i>ELECTRONICS LETTERS</i> 38, no. 17 (2002):
    984–86. <a href="https://doi.org/10.1049/el:20020677">https://doi.org/10.1049/el:20020677</a>.'
  ieee: 'D. Sandel, V. Mirvoda, F. Wust, R. Noé, and C. Weiske, “Signed online chromatic
    dispersion detection at 40 Gbit/s based on arrival time detection with 60 attosecond
    dynamic accuracy,” <i>ELECTRONICS LETTERS</i>, vol. 38, no. 17, pp. 984–986, 2002,
    doi: <a href="https://doi.org/10.1049/el:20020677">10.1049/el:20020677</a>.'
  mla: Sandel, D., et al. “Signed Online Chromatic Dispersion Detection at 40 Gbit/s
    Based on Arrival Time Detection with 60 Attosecond Dynamic Accuracy.” <i>ELECTRONICS
    LETTERS</i>, vol. 38, no. 17, 2002, pp. 984–86, doi:<a href="https://doi.org/10.1049/el:20020677">10.1049/el:20020677</a>.
  short: D. Sandel, V. Mirvoda, F. Wust, R. Noé, C. Weiske, ELECTRONICS LETTERS 38
    (2002) 984–986.
date_created: 2023-01-23T18:11:11Z
date_updated: 2023-01-25T22:57:19Z
department:
- _id: '56'
doi: 10.1049/el:20020677
intvolume: '        38'
issue: '17'
language:
- iso: eng
page: 984-986
publication: ELECTRONICS LETTERS
publication_identifier:
  issn:
  - 0013-5194
status: public
title: Signed online chromatic dispersion detection at 40 Gbit/s based on arrival
  time detection with 60 attosecond dynamic accuracy
type: journal_article
user_id: '14931'
volume: 38
year: '2002'
...
---
_id: '39382'
abstract:
- lang: eng
  text: We present a rigorous but transparent semantics definition of the SpecC language
    that covers the execution of SpecC behaviors and their interaction with the kernel
    process. The semantics include wait, wait for, par, and try statements as they
    are introduced in SpecC. We present our definition in form of distributed abstract
    state machine (ASM) rules strictly following the lines of the SpecC Language Reference
    Manual. We mainly see our formal semantics in three application areas. First,
    it is a concise, unambiguous description for documentation and standardization.
    Second, it applies as a high-level, pseudo code-oriented specification for the
    implementation of a SpecC simulator. Finally, it is a first step for SpecC synthesis
    in order to identify similar concepts with other languages like VHDL and SystemC
    for the definition of common patterns and language subsets.
author:
- first_name: Wolfgang
  full_name: Müller, Wolfgang
  id: '16243'
  last_name: Müller
- first_name: Rainer
  full_name: Dömer, Rainer
  last_name: Dömer
- first_name: Andreas
  full_name: Gerstlauer, Andreas
  last_name: Gerstlauer
citation:
  ama: 'Müller W, Dömer R, Gerstlauer A. The Formal Execution Semantics of SpecC.
    In: <i>Proceedings of the ISSS02</i>. ; 2002. doi:<a href="https://doi.org/10.1145/581199.581234
    ">10.1145/581199.581234 </a>'
  apa: Müller, W., Dömer, R., &#38; Gerstlauer, A. (2002). The Formal Execution Semantics
    of SpecC. <i>Proceedings of the ISSS02</i>. <a href="https://doi.org/10.1145/581199.581234
    ">https://doi.org/10.1145/581199.581234 </a>
  bibtex: '@inproceedings{Müller_Dömer_Gerstlauer_2002, place={Nagoya, Japan}, title={The
    Formal Execution Semantics of SpecC}, DOI={<a href="https://doi.org/10.1145/581199.581234
    ">10.1145/581199.581234 </a>}, booktitle={Proceedings of the ISSS02}, author={Müller,
    Wolfgang and Dömer, Rainer and Gerstlauer, Andreas}, year={2002} }'
  chicago: Müller, Wolfgang, Rainer Dömer, and Andreas Gerstlauer. “The Formal Execution
    Semantics of SpecC.” In <i>Proceedings of the ISSS02</i>. Nagoya, Japan, 2002.
    <a href="https://doi.org/10.1145/581199.581234 ">https://doi.org/10.1145/581199.581234
    </a>.
  ieee: 'W. Müller, R. Dömer, and A. Gerstlauer, “The Formal Execution Semantics of
    SpecC,” 2002, doi: <a href="https://doi.org/10.1145/581199.581234 ">10.1145/581199.581234
    </a>.'
  mla: Müller, Wolfgang, et al. “The Formal Execution Semantics of SpecC.” <i>Proceedings
    of the ISSS02</i>, 2002, doi:<a href="https://doi.org/10.1145/581199.581234 ">10.1145/581199.581234
    </a>.
  short: 'W. Müller, R. Dömer, A. Gerstlauer, in: Proceedings of the ISSS02, Nagoya,
    Japan, 2002.'
date_created: 2023-01-24T10:10:24Z
date_updated: 2023-01-24T10:10:28Z
department:
- _id: '672'
doi: '10.1145/581199.581234 '
keyword:
- Standardization
- Kernel
- Permission
- Formal verification
- Logic functions
- Documentation
- Reasoning about programs
- Specification languages
- Formal specifications
- Software systems
language:
- iso: eng
place: Nagoya, Japan
publication: Proceedings of the ISSS02
publication_identifier:
  isbn:
  - 1-58113-576-9
status: public
title: The Formal Execution Semantics of SpecC
type: conference
user_id: '5786'
year: '2002'
...
---
_id: '39387'
abstract:
- lang: eng
  text: This paper compares the use of three different approaches to transcoding of
    XML [Extensible Markup Language]-based user interface descriptions to other target
    formats. The source is the interface section of the XML-based markup language
    for user interfaces, UIML [User Interface Markup Language], which has been extended
    with a vocabulary for the description of generic user interfaces. Target formats
    used as examples for the comparison are HTML [Hypertext Markup Language], and
    VoiceXML. The compared means for transcoding are XSLT [Extensible Stylesheet Language
    Transformation], the UIML peers section with enhancements for transcoding, and
    RDL/TT [Rule Description Language for Tree Transformation], a Java-like transcoding
    language. Rendered by www.RenderX.com Comparing Transcoding Tools for Use with
    a Generic User Interface Format.
author:
- first_name: Johan
  full_name: Plomp, Johan
  last_name: Plomp
- first_name: Robbie
  full_name: Schäfer, Robbie
  last_name: Schäfer
- first_name: Wolfgang
  full_name: Müller, Wolfgang
  id: '16243'
  last_name: Müller
citation:
  ama: 'Plomp J, Schäfer R, Müller W. Comparing Transcoding Tools for Use with a Generic
    User Interface Format. In: <i>Proceedings of the Extreme Markup Languages 2002</i>.
    ; 2002.'
  apa: Plomp, J., Schäfer, R., &#38; Müller, W. (2002). Comparing Transcoding Tools
    for Use with a Generic User Interface Format. <i>Proceedings of the Extreme Markup
    Languages 2002</i>.
  bibtex: '@inproceedings{Plomp_Schäfer_Müller_2002, place={Montreal, Canada}, title={Comparing
    Transcoding Tools for Use with a Generic User Interface Format}, booktitle={Proceedings
    of the Extreme Markup Languages 2002}, author={Plomp, Johan and Schäfer, Robbie
    and Müller, Wolfgang}, year={2002} }'
  chicago: Plomp, Johan, Robbie Schäfer, and Wolfgang Müller. “Comparing Transcoding
    Tools for Use with a Generic User Interface Format.” In <i>Proceedings of the
    Extreme Markup Languages 2002</i>. Montreal, Canada, 2002.
  ieee: J. Plomp, R. Schäfer, and W. Müller, “Comparing Transcoding Tools for Use
    with a Generic User Interface Format,” 2002.
  mla: Plomp, Johan, et al. “Comparing Transcoding Tools for Use with a Generic User
    Interface Format.” <i>Proceedings of the Extreme Markup Languages 2002</i>, 2002.
  short: 'J. Plomp, R. Schäfer, W. Müller, in: Proceedings of the Extreme Markup Languages
    2002, Montreal, Canada, 2002.'
date_created: 2023-01-24T10:12:41Z
date_updated: 2023-01-24T10:12:45Z
department:
- _id: '672'
language:
- iso: eng
place: Montreal, Canada
publication: Proceedings of the Extreme Markup Languages 2002
status: public
title: Comparing Transcoding Tools for Use with a Generic User Interface Format
type: conference
user_id: '5786'
year: '2002'
...
---
_id: '39403'
abstract:
- lang: eng
  text: The Unified Modeling Language (UML) has received wide acceptance as a standard
    language in the field of software specification by means of different diagram
    types. In a recent version of UML, the textual Object Constraint Language (OCL)
    was introduced to support specification of constraints for UML models. But OCL
    currently does not provide sufficient means to specify constraints over the dynamic
    behavior of a model. This article presents an OCL extension that is consistent
    with current OCL and enables modelers to specify state-related time-bounded constraints.
    We consider the case study of a flexible manufacturing system and identify typical
    real-time constraints. The constraints are presented in our temporal OCL extension
    as well as in temporal logic formulae. For general application, we define a semantics
    of our OCL extension by means of a time-bounded temporal logic based on Computational
    Tree Logic (CTL).
author:
- first_name: Stephan
  full_name: Flake, Stephan
  last_name: Flake
- first_name: Wolfgang
  full_name: Müller, Wolfgang
  id: '16243'
  last_name: Müller
citation:
  ama: 'Flake S, Müller W. Specification of Real-Time Properties for UML Models. In:
    <i>Proceedings of HICSS-35</i>. ; 2002. doi:<a href="https://doi.org/10.1109/HICSS.2002.994469">10.1109/HICSS.2002.994469</a>'
  apa: Flake, S., &#38; Müller, W. (2002). Specification of Real-Time Properties for
    UML Models. <i>Proceedings of HICSS-35</i>. Proceedings of the 35th Annual Hawaii
    International Conference on System Sciences, Big Island, HI, USA . <a href="https://doi.org/10.1109/HICSS.2002.994469">https://doi.org/10.1109/HICSS.2002.994469</a>
  bibtex: '@inproceedings{Flake_Müller_2002, place={Big Island, HI, USA }, title={Specification
    of Real-Time Properties for UML Models}, DOI={<a href="https://doi.org/10.1109/HICSS.2002.994469">10.1109/HICSS.2002.994469</a>},
    booktitle={Proceedings of HICSS-35}, author={Flake, Stephan and Müller, Wolfgang},
    year={2002} }'
  chicago: Flake, Stephan, and Wolfgang Müller. “Specification of Real-Time Properties
    for UML Models.” In <i>Proceedings of HICSS-35</i>. Big Island, HI, USA , 2002.
    <a href="https://doi.org/10.1109/HICSS.2002.994469">https://doi.org/10.1109/HICSS.2002.994469</a>.
  ieee: 'S. Flake and W. Müller, “Specification of Real-Time Properties for UML Models,”
    presented at the Proceedings of the 35th Annual Hawaii International Conference
    on System Sciences, Big Island, HI, USA , 2002, doi: <a href="https://doi.org/10.1109/HICSS.2002.994469">10.1109/HICSS.2002.994469</a>.'
  mla: Flake, Stephan, and Wolfgang Müller. “Specification of Real-Time Properties
    for UML Models.” <i>Proceedings of HICSS-35</i>, 2002, doi:<a href="https://doi.org/10.1109/HICSS.2002.994469">10.1109/HICSS.2002.994469</a>.
  short: 'S. Flake, W. Müller, in: Proceedings of HICSS-35, Big Island, HI, USA ,
    2002.'
conference:
  location: 'Big Island, HI, USA '
  name: Proceedings of the 35th Annual Hawaii International Conference on System Sciences
date_created: 2023-01-24T10:22:12Z
date_updated: 2023-01-24T10:22:16Z
department:
- _id: '672'
doi: 10.1109/HICSS.2002.994469
keyword:
- Unified modeling language
- Logic
- Formal verification
- Real time systems
- Programming profession
- Vehicle dynamics
- Software standards
- Flexible manufacturing systems
- Electronics industry
- Protocols
language:
- iso: eng
place: 'Big Island, HI, USA '
publication: Proceedings of HICSS-35
publication_identifier:
  isbn:
  - 0-7695-1435-9
status: public
title: Specification of Real-Time Properties for UML Models
type: conference
user_id: '5786'
year: '2002'
...
---
_id: '39402'
abstract:
- lang: eng
  text: Die Object Constraint Language (OCL) wurde entwickelt, um Modelleinschränkungen
    beim objektorientierten Softwareentwurf mit der UML [14] ausdrücken zu können.
    Sie wird hauptsächlich benutzt, um Invarianten für Objekte sowie Vor-und Nachbedingungen
    von Operationen zu spezifizieren. Zurzeit bieten OCL und Echtzeiterweiterungen
    der UML nur bedingt geeignete Mittel, um temporale zeitbehaftete Modelleigenschaften
    zu beschreiben. Insbesondere kann man mit OCL keine Einschränkunge uber das dynamische
    Verhalten eines UML-Modells formulieren, die die Reihenfolge von Objektzuständen
    und Zustandsübergängen betreffen. Um ein korrektes Systemverhalten zu garantieren,
    ist es jedoch insbesondere bei zeitkritischen Anwendungen notwendig, solche zustandsbasierten
    zeitbehafteten Einschränkungen in einer formalen Art und Weise ausdrücken zu können.
    Es sind daher verschiedene Vorschläge veröffentlicht worden, in denen die OCL
    erweitert worden ist, um Modellierern die Möglichkeit zu geben, temporale Einschränkungen
    zu formulieren. Dieser Artikel gibt eine Überblick über die zurzeit bekannten
    Vorschläge und zeigt Ansätze für weitere Entwicklungen in diesem Bereich auf.
author:
- first_name: Stephan
  full_name: Flake, Stephan
  last_name: Flake
- first_name: Wolfgang
  full_name: Müller, Wolfgang
  id: '16243'
  last_name: Müller
citation:
  ama: Flake S, Müller W. Temporale Erweiterungen der OCL - Überblick und Aussichten.
    Published online 2002.
  apa: Flake, S., &#38; Müller, W. (2002). <i>Temporale Erweiterungen der OCL - Überblick
    und Aussichten</i>.
  bibtex: '@article{Flake_Müller_2002, place={Halle(Saale), Germany}, series={Tagungsband:
    2. Workshop “Ablaufmodellierung in ingenieurwissenschaftlichen Anwendungen”},
    title={Temporale Erweiterungen der OCL - Überblick und Aussichten}, author={Flake,
    Stephan and Müller, Wolfgang}, year={2002}, collection={Tagungsband: 2. Workshop
    “Ablaufmodellierung in ingenieurwissenschaftlichen Anwendungen”} }'
  chicago: 'Flake, Stephan, and Wolfgang Müller. “Temporale Erweiterungen Der OCL
    - Überblick Und Aussichten.” Tagungsband: 2. Workshop “Ablaufmodellierung in Ingenieurwissenschaftlichen
    Anwendungen.” Halle(Saale), Germany, 2002.'
  ieee: S. Flake and W. Müller, “Temporale Erweiterungen der OCL - Überblick und Aussichten.”
    Halle(Saale), Germany, 2002.
  mla: Flake, Stephan, and Wolfgang Müller. <i>Temporale Erweiterungen Der OCL - Überblick
    Und Aussichten</i>. 2002.
  short: S. Flake, W. Müller, (2002).
date_created: 2023-01-24T10:19:57Z
date_updated: 2023-01-24T10:20:03Z
department:
- _id: '672'
language:
- iso: eng
place: Halle(Saale), Germany
series_title: 'Tagungsband: 2. Workshop "Ablaufmodellierung in ingenieurwissenschaftlichen
  Anwendungen"'
status: public
title: Temporale Erweiterungen der OCL - Überblick und Aussichten
type: conference
user_id: '5786'
year: '2002'
...
---
_id: '38367'
author:
- first_name: V
  full_name: Mirvoda, V
  last_name: Mirvoda
- first_name: D
  full_name: Sandel, D
  last_name: Sandel
- first_name: F
  full_name: Wust, F
  last_name: Wust
- first_name: S
  full_name: Hinz, S
  last_name: Hinz
- first_name: Reinhold
  full_name: Noé, Reinhold
  id: '381'
  last_name: Noé
  orcid: https://orcid.org/0000-0002-5839-7616
citation:
  ama: Mirvoda V, Sandel D, Wust F, Hinz S, Noé R. Linear detection of optical polarization
    mode dispersion by arrival time modulation. <i>ELECTRICAL ENGINEERING</i>. 2002;84(2):71-73.
    doi:<a href="https://doi.org/10.1007/S00202-001-0112-4">10.1007/S00202-001-0112-4</a>
  apa: Mirvoda, V., Sandel, D., Wust, F., Hinz, S., &#38; Noé, R. (2002). Linear detection
    of optical polarization mode dispersion by arrival time modulation. <i>ELECTRICAL
    ENGINEERING</i>, <i>84</i>(2), 71–73. <a href="https://doi.org/10.1007/S00202-001-0112-4">https://doi.org/10.1007/S00202-001-0112-4</a>
  bibtex: '@article{Mirvoda_Sandel_Wust_Hinz_Noé_2002, title={Linear detection of
    optical polarization mode dispersion by arrival time modulation}, volume={84},
    DOI={<a href="https://doi.org/10.1007/S00202-001-0112-4">10.1007/S00202-001-0112-4</a>},
    number={2}, journal={ELECTRICAL ENGINEERING}, author={Mirvoda, V and Sandel, D
    and Wust, F and Hinz, S and Noé, Reinhold}, year={2002}, pages={71–73} }'
  chicago: 'Mirvoda, V, D Sandel, F Wust, S Hinz, and Reinhold Noé. “Linear Detection
    of Optical Polarization Mode Dispersion by Arrival Time Modulation.” <i>ELECTRICAL
    ENGINEERING</i> 84, no. 2 (2002): 71–73. <a href="https://doi.org/10.1007/S00202-001-0112-4">https://doi.org/10.1007/S00202-001-0112-4</a>.'
  ieee: 'V. Mirvoda, D. Sandel, F. Wust, S. Hinz, and R. Noé, “Linear detection of
    optical polarization mode dispersion by arrival time modulation,” <i>ELECTRICAL
    ENGINEERING</i>, vol. 84, no. 2, pp. 71–73, 2002, doi: <a href="https://doi.org/10.1007/S00202-001-0112-4">10.1007/S00202-001-0112-4</a>.'
  mla: Mirvoda, V., et al. “Linear Detection of Optical Polarization Mode Dispersion
    by Arrival Time Modulation.” <i>ELECTRICAL ENGINEERING</i>, vol. 84, no. 2, 2002,
    pp. 71–73, doi:<a href="https://doi.org/10.1007/S00202-001-0112-4">10.1007/S00202-001-0112-4</a>.
  short: V. Mirvoda, D. Sandel, F. Wust, S. Hinz, R. Noé, ELECTRICAL ENGINEERING 84
    (2002) 71–73.
date_created: 2023-01-23T18:17:15Z
date_updated: 2023-01-25T16:23:05Z
department:
- _id: '56'
doi: 10.1007/S00202-001-0112-4
intvolume: '        84'
issue: '2'
language:
- iso: eng
page: 71-73
publication: ELECTRICAL ENGINEERING
publication_identifier:
  issn:
  - 0948-7921
status: public
title: Linear detection of optical polarization mode dispersion by arrival time modulation
type: journal_article
user_id: '14931'
volume: 84
year: '2002'
...
---
_id: '39959'
author:
- first_name: Margit
  full_name: Rösler, Margit
  id: '37390'
  last_name: Rösler
- first_name: Marcel
  full_name: de Jeu, Marcel
  last_name: de Jeu
citation:
  ama: Rösler M, de Jeu M. Asymptotic Analysis for the Dunkl Kernel. <i>Journal of
    Approximation Theory</i>. 2002;119(1):110-126. doi:<a href="https://doi.org/10.1006/jath.2002.3722">10.1006/jath.2002.3722</a>
  apa: Rösler, M., &#38; de Jeu, M. (2002). Asymptotic Analysis for the Dunkl Kernel.
    <i>Journal of Approximation Theory</i>, <i>119</i>(1), 110–126. <a href="https://doi.org/10.1006/jath.2002.3722">https://doi.org/10.1006/jath.2002.3722</a>
  bibtex: '@article{Rösler_de Jeu_2002, title={Asymptotic Analysis for the Dunkl Kernel},
    volume={119}, DOI={<a href="https://doi.org/10.1006/jath.2002.3722">10.1006/jath.2002.3722</a>},
    number={1}, journal={Journal of Approximation Theory}, publisher={Elsevier BV},
    author={Rösler, Margit and de Jeu, Marcel}, year={2002}, pages={110–126} }'
  chicago: 'Rösler, Margit, and Marcel de Jeu. “Asymptotic Analysis for the Dunkl
    Kernel.” <i>Journal of Approximation Theory</i> 119, no. 1 (2002): 110–26. <a
    href="https://doi.org/10.1006/jath.2002.3722">https://doi.org/10.1006/jath.2002.3722</a>.'
  ieee: 'M. Rösler and M. de Jeu, “Asymptotic Analysis for the Dunkl Kernel,” <i>Journal
    of Approximation Theory</i>, vol. 119, no. 1, pp. 110–126, 2002, doi: <a href="https://doi.org/10.1006/jath.2002.3722">10.1006/jath.2002.3722</a>.'
  mla: Rösler, Margit, and Marcel de Jeu. “Asymptotic Analysis for the Dunkl Kernel.”
    <i>Journal of Approximation Theory</i>, vol. 119, no. 1, Elsevier BV, 2002, pp.
    110–26, doi:<a href="https://doi.org/10.1006/jath.2002.3722">10.1006/jath.2002.3722</a>.
  short: M. Rösler, M. de Jeu, Journal of Approximation Theory 119 (2002) 110–126.
date_created: 2023-01-25T10:20:13Z
date_updated: 2023-01-26T17:44:02Z
department:
- _id: '555'
doi: 10.1006/jath.2002.3722
extern: '1'
intvolume: '       119'
issue: '1'
keyword:
- Applied Mathematics
- General Mathematics
- Numerical Analysis
- Analysis
language:
- iso: eng
page: 110-126
publication: Journal of Approximation Theory
publication_identifier:
  issn:
  - 0021-9045
publication_status: published
publisher: Elsevier BV
status: public
title: Asymptotic Analysis for the Dunkl Kernel
type: journal_article
user_id: '93826'
volume: 119
year: '2002'
...
---
_id: '40905'
abstract:
- lang: eng
  text: The analytic signal is commonly used in stochastic time-frequency analysis
    in Cohen’s class to reduce interference terms. However, we show that the usual
    time-frequency representation (TFR) based on the analytic signal gives only an
    incomplete signal description. This is because the analytic signal constructed
    from a non-stationary real signal is in general improper, which means that it
    has non-zero complementary correlation. We show how to augment the standard TFR
    by a complementary TFR to obtain a complete second-order characterization of the
    signal while still reducing interference terms compared to the TFR of the real
    signal.
author:
- first_name: Peter J.
  full_name: Schreier, Peter J.
  last_name: Schreier
- first_name: Louis L.
  full_name: Scharf, Louis L.
  last_name: Scharf
citation:
  ama: 'Schreier PJ, Scharf LL. Reducing interference in stochastic time-frequency
    analysis without losing information. In: <i>Proc. 36th\ Asilomar Conf.\ Signals
    Syst.\ Computers</i>. Vol 2. ; 2002:1565–1570. doi:<a href="https://doi.org/10.1109/ACSSC.2002.1197041">10.1109/ACSSC.2002.1197041</a>'
  apa: Schreier, P. J., &#38; Scharf, L. L. (2002). Reducing interference in stochastic
    time-frequency analysis without losing information. <i>Proc. 36th\ Asilomar Conf.\
    Signals Syst.\ Computers</i>, <i>2</i>, 1565–1570. <a href="https://doi.org/10.1109/ACSSC.2002.1197041">https://doi.org/10.1109/ACSSC.2002.1197041</a>
  bibtex: '@inproceedings{Schreier_Scharf_2002, title={Reducing interference in stochastic
    time-frequency analysis without losing information}, volume={2}, DOI={<a href="https://doi.org/10.1109/ACSSC.2002.1197041">10.1109/ACSSC.2002.1197041</a>},
    booktitle={Proc. 36th\ Asilomar Conf.\ Signals Syst.\ Computers}, author={Schreier,
    Peter J. and Scharf, Louis L.}, year={2002}, pages={1565–1570} }'
  chicago: Schreier, Peter J., and Louis L. Scharf. “Reducing Interference in Stochastic
    Time-Frequency Analysis without Losing Information.” In <i>Proc. 36th\ Asilomar
    Conf.\ Signals Syst.\ Computers</i>, 2:1565–1570, 2002. <a href="https://doi.org/10.1109/ACSSC.2002.1197041">https://doi.org/10.1109/ACSSC.2002.1197041</a>.
  ieee: 'P. J. Schreier and L. L. Scharf, “Reducing interference in stochastic time-frequency
    analysis without losing information,” in <i>Proc. 36th\ Asilomar Conf.\ Signals
    Syst.\ Computers</i>, 2002, vol. 2, pp. 1565–1570, doi: <a href="https://doi.org/10.1109/ACSSC.2002.1197041">10.1109/ACSSC.2002.1197041</a>.'
  mla: Schreier, Peter J., and Louis L. Scharf. “Reducing Interference in Stochastic
    Time-Frequency Analysis without Losing Information.” <i>Proc. 36th\ Asilomar Conf.\
    Signals Syst.\ Computers</i>, vol. 2, 2002, pp. 1565–1570, doi:<a href="https://doi.org/10.1109/ACSSC.2002.1197041">10.1109/ACSSC.2002.1197041</a>.
  short: 'P.J. Schreier, L.L. Scharf, in: Proc. 36th\ Asilomar Conf.\ Signals Syst.\
    Computers, 2002, pp. 1565–1570.'
date_created: 2023-01-30T11:52:09Z
date_updated: 2023-01-30T11:52:58Z
department:
- _id: '263'
doi: 10.1109/ACSSC.2002.1197041
intvolume: '         2'
page: 1565–1570
publication: Proc. 36th\ Asilomar Conf.\ Signals Syst.\ Computers
status: public
title: Reducing interference in stochastic time-frequency analysis without losing
  information
type: conference
user_id: '43497'
volume: 2
year: '2002'
...
---
_id: '40906'
abstract:
- lang: eng
  text: 'We consider the problem of minimum mean squared error (MMSE) estimation of
    complex random vectors in the improper case. Accounting for the information present
    in the complementary covariance requires the use of widely linear transformations.
    Based on these, we present the eigenanalysis of improper complex random vectors.
    This paves the way for a study of two different rank-reduced implementations of
    the complex Wiener Filter that make use of canonical coordinates: one that is
    optimum with respect to maximizing mutual information and one that minimizes mean
    squared error.'
author:
- first_name: Peter J.
  full_name: Schreier, Peter J.
  last_name: Schreier
- first_name: Louis L.
  full_name: Scharf, Louis L.
  last_name: Scharf
citation:
  ama: 'Schreier PJ, Scharf LL. Canonical coordinates for reduced-rank estimation
    of improper complex random vectors. In: <i>Proc.\ IEEE Int.\ Conf.\ Acoustics,
    Speech and Signal Process.</i> Vol 2. ; 2002:1153–1156. doi:<a href="https://doi.org/10.1109/ICASSP.2002.5744004">10.1109/ICASSP.2002.5744004</a>'
  apa: Schreier, P. J., &#38; Scharf, L. L. (2002). Canonical coordinates for reduced-rank
    estimation of improper complex random vectors. <i>Proc.\ IEEE Int.\ Conf.\ Acoustics,
    Speech and Signal Process.</i>, <i>2</i>, 1153–1156. <a href="https://doi.org/10.1109/ICASSP.2002.5744004">https://doi.org/10.1109/ICASSP.2002.5744004</a>
  bibtex: '@inproceedings{Schreier_Scharf_2002, title={Canonical coordinates for reduced-rank
    estimation of improper complex random vectors}, volume={2}, DOI={<a href="https://doi.org/10.1109/ICASSP.2002.5744004">10.1109/ICASSP.2002.5744004</a>},
    booktitle={Proc.\ IEEE Int.\ Conf.\ Acoustics, Speech and Signal Process.}, author={Schreier,
    Peter J. and Scharf, Louis L.}, year={2002}, pages={1153–1156} }'
  chicago: Schreier, Peter J., and Louis L. Scharf. “Canonical Coordinates for Reduced-Rank
    Estimation of Improper Complex Random Vectors.” In <i>Proc.\ IEEE Int.\ Conf.\
    Acoustics, Speech and Signal Process.</i>, 2:1153–1156, 2002. <a href="https://doi.org/10.1109/ICASSP.2002.5744004">https://doi.org/10.1109/ICASSP.2002.5744004</a>.
  ieee: 'P. J. Schreier and L. L. Scharf, “Canonical coordinates for reduced-rank
    estimation of improper complex random vectors,” in <i>Proc.\ IEEE Int.\ Conf.\
    Acoustics, Speech and Signal Process.</i>, 2002, vol. 2, pp. 1153–1156, doi: <a
    href="https://doi.org/10.1109/ICASSP.2002.5744004">10.1109/ICASSP.2002.5744004</a>.'
  mla: Schreier, Peter J., and Louis L. Scharf. “Canonical Coordinates for Reduced-Rank
    Estimation of Improper Complex Random Vectors.” <i>Proc.\ IEEE Int.\ Conf.\ Acoustics,
    Speech and Signal Process.</i>, vol. 2, 2002, pp. 1153–1156, doi:<a href="https://doi.org/10.1109/ICASSP.2002.5744004">10.1109/ICASSP.2002.5744004</a>.
  short: 'P.J. Schreier, L.L. Scharf, in: Proc.\ IEEE Int.\ Conf.\ Acoustics, Speech
    and Signal Process., 2002, pp. 1153–1156.'
date_created: 2023-01-30T11:52:09Z
date_updated: 2023-01-30T11:53:01Z
department:
- _id: '263'
doi: 10.1109/ICASSP.2002.5744004
intvolume: '         2'
page: 1153–1156
publication: Proc.\ IEEE Int.\ Conf.\ Acoustics, Speech and Signal Process.
status: public
title: Canonical coordinates for reduced-rank estimation of improper complex random
  vectors
type: conference
user_id: '43497'
volume: 2
year: '2002'
...
---
_id: '35954'
abstract:
- lang: eng
  text: 'Let {\ASIE K}\,/{\small \ℚ}({\ASIE t \!}) be a finite extension. We describe
    algorithms for computing subfields and automorphisms of {\ASIE K}\,/{\small \ℚ}({\ASIE
    t }\!). As an application we give an algorithm for finding decompositions of rational
    functions in {\small \ℚ(α)}. We also present an algorithm which decides if an
    extension {\ASIE L}\,/{\small \ℚ}({\ASIE t \!}) is a subfield of {\ASIE K}. In
    case [{\ASIE K : \;}{\small\ℚ}({\ASIE t \!})] = [{\ASIE L : \;}{\small \ℚ}({\ASIE
    t \!})] we obtain a {\small \ℚ}({\ASIE t \!})-isomorphism test. Furthermore, we
    describe an algorithm which computes subfields of the normal closure of {\ASIE
    K}\,/{\small \ℚ}({\ASIE t \!}).'
author:
- first_name: Jürgen
  full_name: Klüners, Jürgen
  id: '21202'
  last_name: Klüners
citation:
  ama: Klüners J. Algorithms for function fields. <i>Experiment Math </i>. 2002;11(2):171-181.
  apa: Klüners, J. (2002). Algorithms for function fields. <i>Experiment. Math. </i>,
    <i>11</i>(2), 171–181.
  bibtex: '@article{Klüners_2002, title={Algorithms for function fields}, volume={11},
    number={2}, journal={Experiment. Math. }, publisher={Elsevier BV}, author={Klüners,
    Jürgen}, year={2002}, pages={171–181} }'
  chicago: 'Klüners, Jürgen. “Algorithms for Function Fields.” <i>Experiment. Math.
    </i> 11, no. 2 (2002): 171–81.'
  ieee: J. Klüners, “Algorithms for function fields,” <i>Experiment. Math. </i>, vol.
    11, no. 2, pp. 171–181, 2002.
  mla: Klüners, Jürgen. “Algorithms for Function Fields.” <i>Experiment. Math. </i>,
    vol. 11, no. 2, Elsevier BV, 2002, pp. 171–81.
  short: J. Klüners, Experiment. Math.  11 (2002) 171–181.
date_created: 2023-01-11T09:45:40Z
date_updated: 2023-03-06T10:26:58Z
department:
- _id: '102'
intvolume: '        11'
issue: '2'
keyword:
- algorithms
- decompositions
- Galois groups
- subfields
language:
- iso: eng
page: 171-181
publication: 'Experiment. Math. '
publication_status: published
publisher: Elsevier BV
related_material:
  link:
  - relation: confirmation
    url: https://projecteuclid.org/journals/experimental-mathematics/volume-11/issue-2/Algorithms-for-function-fields/em/1062621213.full
status: public
title: Algorithms for function fields
type: journal_article
user_id: '93826'
volume: 11
year: '2002'
...
---
_id: '39904'
author:
- first_name: Ulrich
  full_name: Hilleringmann, Ulrich
  id: '20179'
  last_name: Hilleringmann
- first_name: K.
  full_name: Goser, K.
  last_name: Goser
citation:
  ama: 'Hilleringmann U, Goser K. Optoelectronic system integration on silicon: waveguides,
    photodetectors, and VLSI CMOS circuits on one chip. <i>IEEE Transactions on Electron
    Devices</i>. 2002;42(5):841-846. doi:<a href="https://doi.org/10.1109/16.381978">10.1109/16.381978</a>'
  apa: 'Hilleringmann, U., &#38; Goser, K. (2002). Optoelectronic system integration
    on silicon: waveguides, photodetectors, and VLSI CMOS circuits on one chip. <i>IEEE
    Transactions on Electron Devices</i>, <i>42</i>(5), 841–846. <a href="https://doi.org/10.1109/16.381978">https://doi.org/10.1109/16.381978</a>'
  bibtex: '@article{Hilleringmann_Goser_2002, title={Optoelectronic system integration
    on silicon: waveguides, photodetectors, and VLSI CMOS circuits on one chip}, volume={42},
    DOI={<a href="https://doi.org/10.1109/16.381978">10.1109/16.381978</a>}, number={5},
    journal={IEEE Transactions on Electron Devices}, publisher={Institute of Electrical
    and Electronics Engineers (IEEE)}, author={Hilleringmann, Ulrich and Goser, K.},
    year={2002}, pages={841–846} }'
  chicago: 'Hilleringmann, Ulrich, and K. Goser. “Optoelectronic System Integration
    on Silicon: Waveguides, Photodetectors, and VLSI CMOS Circuits on One Chip.” <i>IEEE
    Transactions on Electron Devices</i> 42, no. 5 (2002): 841–46. <a href="https://doi.org/10.1109/16.381978">https://doi.org/10.1109/16.381978</a>.'
  ieee: 'U. Hilleringmann and K. Goser, “Optoelectronic system integration on silicon:
    waveguides, photodetectors, and VLSI CMOS circuits on one chip,” <i>IEEE Transactions
    on Electron Devices</i>, vol. 42, no. 5, pp. 841–846, 2002, doi: <a href="https://doi.org/10.1109/16.381978">10.1109/16.381978</a>.'
  mla: 'Hilleringmann, Ulrich, and K. Goser. “Optoelectronic System Integration on
    Silicon: Waveguides, Photodetectors, and VLSI CMOS Circuits on One Chip.” <i>IEEE
    Transactions on Electron Devices</i>, vol. 42, no. 5, Institute of Electrical
    and Electronics Engineers (IEEE), 2002, pp. 841–46, doi:<a href="https://doi.org/10.1109/16.381978">10.1109/16.381978</a>.'
  short: U. Hilleringmann, K. Goser, IEEE Transactions on Electron Devices 42 (2002)
    841–846.
date_created: 2023-01-25T09:22:34Z
date_updated: 2023-03-21T09:51:52Z
department:
- _id: '59'
doi: 10.1109/16.381978
intvolume: '        42'
issue: '5'
keyword:
- Electrical and Electronic Engineering
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
page: 841-846
publication: IEEE Transactions on Electron Devices
publication_identifier:
  issn:
  - 0018-9383
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
status: public
title: 'Optoelectronic system integration on silicon: waveguides, photodetectors,
  and VLSI CMOS circuits on one chip'
type: journal_article
user_id: '20179'
volume: 42
year: '2002'
...
---
_id: '39912'
author:
- first_name: I.
  full_name: Schönstein, I.
  last_name: Schönstein
- first_name: J.
  full_name: Müller, J.
  last_name: Müller
- first_name: Ulrich
  full_name: Hilleringmann, Ulrich
  id: '20179'
  last_name: Hilleringmann
- first_name: K.
  full_name: Goser, K.
  last_name: Goser
citation:
  ama: Schönstein I, Müller J, Hilleringmann U, Goser K. Characterization of submicron
    NMOS devices due to visible light emission. <i>Microelectronic Engineering</i>.
    2002;21(1-4):363-366. doi:<a href="https://doi.org/10.1016/0167-9317(93)90092-j">10.1016/0167-9317(93)90092-j</a>
  apa: Schönstein, I., Müller, J., Hilleringmann, U., &#38; Goser, K. (2002). Characterization
    of submicron NMOS devices due to visible light emission. <i>Microelectronic Engineering</i>,
    <i>21</i>(1–4), 363–366. <a href="https://doi.org/10.1016/0167-9317(93)90092-j">https://doi.org/10.1016/0167-9317(93)90092-j</a>
  bibtex: '@article{Schönstein_Müller_Hilleringmann_Goser_2002, title={Characterization
    of submicron NMOS devices due to visible light emission}, volume={21}, DOI={<a
    href="https://doi.org/10.1016/0167-9317(93)90092-j">10.1016/0167-9317(93)90092-j</a>},
    number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV},
    author={Schönstein, I. and Müller, J. and Hilleringmann, Ulrich and Goser, K.},
    year={2002}, pages={363–366} }'
  chicago: 'Schönstein, I., J. Müller, Ulrich Hilleringmann, and K. Goser. “Characterization
    of Submicron NMOS Devices Due to Visible Light Emission.” <i>Microelectronic Engineering</i>
    21, no. 1–4 (2002): 363–66. <a href="https://doi.org/10.1016/0167-9317(93)90092-j">https://doi.org/10.1016/0167-9317(93)90092-j</a>.'
  ieee: 'I. Schönstein, J. Müller, U. Hilleringmann, and K. Goser, “Characterization
    of submicron NMOS devices due to visible light emission,” <i>Microelectronic Engineering</i>,
    vol. 21, no. 1–4, pp. 363–366, 2002, doi: <a href="https://doi.org/10.1016/0167-9317(93)90092-j">10.1016/0167-9317(93)90092-j</a>.'
  mla: Schönstein, I., et al. “Characterization of Submicron NMOS Devices Due to Visible
    Light Emission.” <i>Microelectronic Engineering</i>, vol. 21, no. 1–4, Elsevier
    BV, 2002, pp. 363–66, doi:<a href="https://doi.org/10.1016/0167-9317(93)90092-j">10.1016/0167-9317(93)90092-j</a>.
  short: I. Schönstein, J. Müller, U. Hilleringmann, K. Goser, Microelectronic Engineering
    21 (2002) 363–366.
date_created: 2023-01-25T09:26:21Z
date_updated: 2023-03-21T09:50:03Z
department:
- _id: '59'
doi: 10.1016/0167-9317(93)90092-j
intvolume: '        21'
issue: 1-4
keyword:
- Electrical and Electronic Engineering
- Surfaces
- Coatings and Films
- Condensed Matter Physics
- Atomic and Molecular Physics
- and Optics
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
page: 363-366
publication: Microelectronic Engineering
publication_identifier:
  issn:
  - 0167-9317
publication_status: published
publisher: Elsevier BV
status: public
title: Characterization of submicron NMOS devices due to visible light emission
type: journal_article
user_id: '20179'
volume: 21
year: '2002'
...
---
_id: '39914'
author:
- first_name: Ulrich
  full_name: Hilleringmann, Ulrich
  id: '20179'
  last_name: Hilleringmann
- first_name: K.
  full_name: Goser, K.
  last_name: Goser
citation:
  ama: Hilleringmann U, Goser K. Results of monolithic integration of optical waveguides,
    photodiodes and CMOS circuits on silicon. <i>Microelectronic Engineering</i>.
    2002;19(1-4):211-214. doi:<a href="https://doi.org/10.1016/0167-9317(92)90425-q">10.1016/0167-9317(92)90425-q</a>
  apa: Hilleringmann, U., &#38; Goser, K. (2002). Results of monolithic integration
    of optical waveguides, photodiodes and CMOS circuits on silicon. <i>Microelectronic
    Engineering</i>, <i>19</i>(1–4), 211–214. <a href="https://doi.org/10.1016/0167-9317(92)90425-q">https://doi.org/10.1016/0167-9317(92)90425-q</a>
  bibtex: '@article{Hilleringmann_Goser_2002, title={Results of monolithic integration
    of optical waveguides, photodiodes and CMOS circuits on silicon}, volume={19},
    DOI={<a href="https://doi.org/10.1016/0167-9317(92)90425-q">10.1016/0167-9317(92)90425-q</a>},
    number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV},
    author={Hilleringmann, Ulrich and Goser, K.}, year={2002}, pages={211–214} }'
  chicago: 'Hilleringmann, Ulrich, and K. Goser. “Results of Monolithic Integration
    of Optical Waveguides, Photodiodes and CMOS Circuits on Silicon.” <i>Microelectronic
    Engineering</i> 19, no. 1–4 (2002): 211–14. <a href="https://doi.org/10.1016/0167-9317(92)90425-q">https://doi.org/10.1016/0167-9317(92)90425-q</a>.'
  ieee: 'U. Hilleringmann and K. Goser, “Results of monolithic integration of optical
    waveguides, photodiodes and CMOS circuits on silicon,” <i>Microelectronic Engineering</i>,
    vol. 19, no. 1–4, pp. 211–214, 2002, doi: <a href="https://doi.org/10.1016/0167-9317(92)90425-q">10.1016/0167-9317(92)90425-q</a>.'
  mla: Hilleringmann, Ulrich, and K. Goser. “Results of Monolithic Integration of
    Optical Waveguides, Photodiodes and CMOS Circuits on Silicon.” <i>Microelectronic
    Engineering</i>, vol. 19, no. 1–4, Elsevier BV, 2002, pp. 211–14, doi:<a href="https://doi.org/10.1016/0167-9317(92)90425-q">10.1016/0167-9317(92)90425-q</a>.
  short: U. Hilleringmann, K. Goser, Microelectronic Engineering 19 (2002) 211–214.
date_created: 2023-01-25T09:27:23Z
date_updated: 2023-03-21T09:49:25Z
department:
- _id: '59'
doi: 10.1016/0167-9317(92)90425-q
intvolume: '        19'
issue: 1-4
keyword:
- Electrical and Electronic Engineering
- Surfaces
- Coatings and Films
- Condensed Matter Physics
- Atomic and Molecular Physics
- and Optics
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
page: 211-214
publication: Microelectronic Engineering
publication_identifier:
  issn:
  - 0167-9317
publication_status: published
publisher: Elsevier BV
status: public
title: Results of monolithic integration of optical waveguides, photodiodes and CMOS
  circuits on silicon
type: journal_article
user_id: '20179'
volume: 19
year: '2002'
...
---
_id: '39906'
author:
- first_name: E.
  full_name: Brass, E.
  last_name: Brass
- first_name: Ulrich
  full_name: Hilleringmann, Ulrich
  id: '20179'
  last_name: Hilleringmann
- first_name: K.
  full_name: Schumacher, K.
  last_name: Schumacher
citation:
  ama: Brass E, Hilleringmann U, Schumacher K. System integration of optical devices
    and analog CMOS amplifiers. <i>IEEE Journal of Solid-State Circuits</i>. 2002;29(8):1006-1010.
    doi:<a href="https://doi.org/10.1109/4.297714">10.1109/4.297714</a>
  apa: Brass, E., Hilleringmann, U., &#38; Schumacher, K. (2002). System integration
    of optical devices and analog CMOS amplifiers. <i>IEEE Journal of Solid-State
    Circuits</i>, <i>29</i>(8), 1006–1010. <a href="https://doi.org/10.1109/4.297714">https://doi.org/10.1109/4.297714</a>
  bibtex: '@article{Brass_Hilleringmann_Schumacher_2002, title={System integration
    of optical devices and analog CMOS amplifiers}, volume={29}, DOI={<a href="https://doi.org/10.1109/4.297714">10.1109/4.297714</a>},
    number={8}, journal={IEEE Journal of Solid-State Circuits}, publisher={Institute
    of Electrical and Electronics Engineers (IEEE)}, author={Brass, E. and Hilleringmann,
    Ulrich and Schumacher, K.}, year={2002}, pages={1006–1010} }'
  chicago: 'Brass, E., Ulrich Hilleringmann, and K. Schumacher. “System Integration
    of Optical Devices and Analog CMOS Amplifiers.” <i>IEEE Journal of Solid-State
    Circuits</i> 29, no. 8 (2002): 1006–10. <a href="https://doi.org/10.1109/4.297714">https://doi.org/10.1109/4.297714</a>.'
  ieee: 'E. Brass, U. Hilleringmann, and K. Schumacher, “System integration of optical
    devices and analog CMOS amplifiers,” <i>IEEE Journal of Solid-State Circuits</i>,
    vol. 29, no. 8, pp. 1006–1010, 2002, doi: <a href="https://doi.org/10.1109/4.297714">10.1109/4.297714</a>.'
  mla: Brass, E., et al. “System Integration of Optical Devices and Analog CMOS Amplifiers.”
    <i>IEEE Journal of Solid-State Circuits</i>, vol. 29, no. 8, Institute of Electrical
    and Electronics Engineers (IEEE), 2002, pp. 1006–10, doi:<a href="https://doi.org/10.1109/4.297714">10.1109/4.297714</a>.
  short: E. Brass, U. Hilleringmann, K. Schumacher, IEEE Journal of Solid-State Circuits
    29 (2002) 1006–1010.
date_created: 2023-01-25T09:23:36Z
date_updated: 2023-03-21T09:51:19Z
department:
- _id: '59'
doi: 10.1109/4.297714
intvolume: '        29'
issue: '8'
keyword:
- Electrical and Electronic Engineering
language:
- iso: eng
page: 1006-1010
publication: IEEE Journal of Solid-State Circuits
publication_identifier:
  issn:
  - 0018-9200
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
status: public
title: System integration of optical devices and analog CMOS amplifiers
type: journal_article
user_id: '20179'
volume: 29
year: '2002'
...
---
_id: '39907'
author:
- first_name: E.
  full_name: Brass, E.
  last_name: Brass
- first_name: Ulrich
  full_name: Hilleringmann, Ulrich
  id: '20179'
  last_name: Hilleringmann
- first_name: K.
  full_name: Schumacher, K.
  last_name: Schumacher
citation:
  ama: Brass E, Hilleringmann U, Schumacher K. System integration of optical devices
    and analog CMOS amplifiers. <i>IEEE Journal of Solid-State Circuits</i>. 2002;29(8):1006-1010.
    doi:<a href="https://doi.org/10.1109/4.297714">10.1109/4.297714</a>
  apa: Brass, E., Hilleringmann, U., &#38; Schumacher, K. (2002). System integration
    of optical devices and analog CMOS amplifiers. <i>IEEE Journal of Solid-State
    Circuits</i>, <i>29</i>(8), 1006–1010. <a href="https://doi.org/10.1109/4.297714">https://doi.org/10.1109/4.297714</a>
  bibtex: '@article{Brass_Hilleringmann_Schumacher_2002, title={System integration
    of optical devices and analog CMOS amplifiers}, volume={29}, DOI={<a href="https://doi.org/10.1109/4.297714">10.1109/4.297714</a>},
    number={8}, journal={IEEE Journal of Solid-State Circuits}, publisher={Institute
    of Electrical and Electronics Engineers (IEEE)}, author={Brass, E. and Hilleringmann,
    Ulrich and Schumacher, K.}, year={2002}, pages={1006–1010} }'
  chicago: 'Brass, E., Ulrich Hilleringmann, and K. Schumacher. “System Integration
    of Optical Devices and Analog CMOS Amplifiers.” <i>IEEE Journal of Solid-State
    Circuits</i> 29, no. 8 (2002): 1006–10. <a href="https://doi.org/10.1109/4.297714">https://doi.org/10.1109/4.297714</a>.'
  ieee: 'E. Brass, U. Hilleringmann, and K. Schumacher, “System integration of optical
    devices and analog CMOS amplifiers,” <i>IEEE Journal of Solid-State Circuits</i>,
    vol. 29, no. 8, pp. 1006–1010, 2002, doi: <a href="https://doi.org/10.1109/4.297714">10.1109/4.297714</a>.'
  mla: Brass, E., et al. “System Integration of Optical Devices and Analog CMOS Amplifiers.”
    <i>IEEE Journal of Solid-State Circuits</i>, vol. 29, no. 8, Institute of Electrical
    and Electronics Engineers (IEEE), 2002, pp. 1006–10, doi:<a href="https://doi.org/10.1109/4.297714">10.1109/4.297714</a>.
  short: E. Brass, U. Hilleringmann, K. Schumacher, IEEE Journal of Solid-State Circuits
    29 (2002) 1006–1010.
date_created: 2023-01-25T09:24:15Z
date_updated: 2023-03-21T09:51:33Z
department:
- _id: '59'
doi: 10.1109/4.297714
intvolume: '        29'
issue: '8'
keyword:
- Electrical and Electronic Engineering
language:
- iso: eng
page: 1006-1010
publication: IEEE Journal of Solid-State Circuits
publication_identifier:
  issn:
  - 0018-9200
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
status: public
title: System integration of optical devices and analog CMOS amplifiers
type: journal_article
user_id: '20179'
volume: 29
year: '2002'
...
---
_id: '39899'
author:
- first_name: J.T.
  full_name: Horstmann, J.T.
  last_name: Horstmann
- first_name: Ulrich
  full_name: Hilleringmann, Ulrich
  id: '20179'
  last_name: Hilleringmann
- first_name: K.
  full_name: Goser, K.
  last_name: Goser
citation:
  ama: Horstmann JT, Hilleringmann U, Goser K. Characterisation of sub-100 nm-MOS-transistors
    processed by optical lithography and a sidewall-etchback technique. <i>Microelectronic
    Engineering</i>. 2002;30(1-4):431-434. doi:<a href="https://doi.org/10.1016/0167-9317(95)00280-4">10.1016/0167-9317(95)00280-4</a>
  apa: Horstmann, J. T., Hilleringmann, U., &#38; Goser, K. (2002). Characterisation
    of sub-100 nm-MOS-transistors processed by optical lithography and a sidewall-etchback
    technique. <i>Microelectronic Engineering</i>, <i>30</i>(1–4), 431–434. <a href="https://doi.org/10.1016/0167-9317(95)00280-4">https://doi.org/10.1016/0167-9317(95)00280-4</a>
  bibtex: '@article{Horstmann_Hilleringmann_Goser_2002, title={Characterisation of
    sub-100 nm-MOS-transistors processed by optical lithography and a sidewall-etchback
    technique}, volume={30}, DOI={<a href="https://doi.org/10.1016/0167-9317(95)00280-4">10.1016/0167-9317(95)00280-4</a>},
    number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV},
    author={Horstmann, J.T. and Hilleringmann, Ulrich and Goser, K.}, year={2002},
    pages={431–434} }'
  chicago: 'Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “Characterisation
    of Sub-100 Nm-MOS-Transistors Processed by Optical Lithography and a Sidewall-Etchback
    Technique.” <i>Microelectronic Engineering</i> 30, no. 1–4 (2002): 431–34. <a
    href="https://doi.org/10.1016/0167-9317(95)00280-4">https://doi.org/10.1016/0167-9317(95)00280-4</a>.'
  ieee: 'J. T. Horstmann, U. Hilleringmann, and K. Goser, “Characterisation of sub-100
    nm-MOS-transistors processed by optical lithography and a sidewall-etchback technique,”
    <i>Microelectronic Engineering</i>, vol. 30, no. 1–4, pp. 431–434, 2002, doi:
    <a href="https://doi.org/10.1016/0167-9317(95)00280-4">10.1016/0167-9317(95)00280-4</a>.'
  mla: Horstmann, J. T., et al. “Characterisation of Sub-100 Nm-MOS-Transistors Processed
    by Optical Lithography and a Sidewall-Etchback Technique.” <i>Microelectronic
    Engineering</i>, vol. 30, no. 1–4, Elsevier BV, 2002, pp. 431–34, doi:<a href="https://doi.org/10.1016/0167-9317(95)00280-4">10.1016/0167-9317(95)00280-4</a>.
  short: J.T. Horstmann, U. Hilleringmann, K. Goser, Microelectronic Engineering 30
    (2002) 431–434.
date_created: 2023-01-25T09:20:20Z
date_updated: 2023-03-21T09:53:55Z
department:
- _id: '59'
doi: 10.1016/0167-9317(95)00280-4
intvolume: '        30'
issue: 1-4
keyword:
- Electrical and Electronic Engineering
- Surfaces
- Coatings and Films
- Condensed Matter Physics
- Atomic and Molecular Physics
- and Optics
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
page: 431-434
publication: Microelectronic Engineering
publication_identifier:
  issn:
  - 0167-9317
publication_status: published
publisher: Elsevier BV
status: public
title: Characterisation of sub-100 nm-MOS-transistors processed by optical lithography
  and a sidewall-etchback technique
type: journal_article
user_id: '20179'
volume: 30
year: '2002'
...
---
_id: '39925'
author:
- first_name: K.
  full_name: Goser, K.
  last_name: Goser
- first_name: Ulrich
  full_name: Hilleringmann, Ulrich
  id: '20179'
  last_name: Hilleringmann
- first_name: U.
  full_name: Rueckert, U.
  last_name: Rueckert
- first_name: K.
  full_name: Schumacher, K.
  last_name: Schumacher
citation:
  ama: Goser K, Hilleringmann U, Rueckert U, Schumacher K. VLSI technologies for artificial
    neural networks. <i>IEEE Micro</i>. 2002;9(6):28-44. doi:<a href="https://doi.org/10.1109/40.42985">10.1109/40.42985</a>
  apa: Goser, K., Hilleringmann, U., Rueckert, U., &#38; Schumacher, K. (2002). VLSI
    technologies for artificial neural networks. <i>IEEE Micro</i>, <i>9</i>(6), 28–44.
    <a href="https://doi.org/10.1109/40.42985">https://doi.org/10.1109/40.42985</a>
  bibtex: '@article{Goser_Hilleringmann_Rueckert_Schumacher_2002, title={VLSI technologies
    for artificial neural networks}, volume={9}, DOI={<a href="https://doi.org/10.1109/40.42985">10.1109/40.42985</a>},
    number={6}, journal={IEEE Micro}, publisher={Institute of Electrical and Electronics
    Engineers (IEEE)}, author={Goser, K. and Hilleringmann, Ulrich and Rueckert, U.
    and Schumacher, K.}, year={2002}, pages={28–44} }'
  chicago: 'Goser, K., Ulrich Hilleringmann, U. Rueckert, and K. Schumacher. “VLSI
    Technologies for Artificial Neural Networks.” <i>IEEE Micro</i> 9, no. 6 (2002):
    28–44. <a href="https://doi.org/10.1109/40.42985">https://doi.org/10.1109/40.42985</a>.'
  ieee: 'K. Goser, U. Hilleringmann, U. Rueckert, and K. Schumacher, “VLSI technologies
    for artificial neural networks,” <i>IEEE Micro</i>, vol. 9, no. 6, pp. 28–44,
    2002, doi: <a href="https://doi.org/10.1109/40.42985">10.1109/40.42985</a>.'
  mla: Goser, K., et al. “VLSI Technologies for Artificial Neural Networks.” <i>IEEE
    Micro</i>, vol. 9, no. 6, Institute of Electrical and Electronics Engineers (IEEE),
    2002, pp. 28–44, doi:<a href="https://doi.org/10.1109/40.42985">10.1109/40.42985</a>.
  short: K. Goser, U. Hilleringmann, U. Rueckert, K. Schumacher, IEEE Micro 9 (2002)
    28–44.
date_created: 2023-01-25T09:33:18Z
date_updated: 2023-03-21T09:57:17Z
department:
- _id: '59'
doi: 10.1109/40.42985
intvolume: '         9'
issue: '6'
keyword:
- Electrical and Electronic Engineering
- Hardware and Architecture
- Software
language:
- iso: eng
page: 28-44
publication: IEEE Micro
publication_identifier:
  issn:
  - 0272-1732
publication_status: published
publisher: Institute of Electrical and Electronics Engineers (IEEE)
status: public
title: VLSI technologies for artificial neural networks
type: journal_article
user_id: '20179'
volume: 9
year: '2002'
...
---
_id: '39882'
author:
- first_name: V.
  full_name: Mankowski, V.
  last_name: Mankowski
- first_name: Ulrich
  full_name: Hilleringmann, Ulrich
  id: '20179'
  last_name: Hilleringmann
- first_name: K.
  full_name: Schumacher, K.
  last_name: Schumacher
citation:
  ama: Mankowski V, Hilleringmann U, Schumacher K. A novel insulation technique for
    smart power switching devices and very high voltage ICs above 10 kV. <i>Microelectronic
    Engineering</i>. 2002;53(1-4):525-528. doi:<a href="https://doi.org/10.1016/s0167-9317(00)00370-1">10.1016/s0167-9317(00)00370-1</a>
  apa: Mankowski, V., Hilleringmann, U., &#38; Schumacher, K. (2002). A novel insulation
    technique for smart power switching devices and very high voltage ICs above 10
    kV. <i>Microelectronic Engineering</i>, <i>53</i>(1–4), 525–528. <a href="https://doi.org/10.1016/s0167-9317(00)00370-1">https://doi.org/10.1016/s0167-9317(00)00370-1</a>
  bibtex: '@article{Mankowski_Hilleringmann_Schumacher_2002, title={A novel insulation
    technique for smart power switching devices and very high voltage ICs above 10
    kV}, volume={53}, DOI={<a href="https://doi.org/10.1016/s0167-9317(00)00370-1">10.1016/s0167-9317(00)00370-1</a>},
    number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV},
    author={Mankowski, V. and Hilleringmann, Ulrich and Schumacher, K.}, year={2002},
    pages={525–528} }'
  chicago: 'Mankowski, V., Ulrich Hilleringmann, and K. Schumacher. “A Novel Insulation
    Technique for Smart Power Switching Devices and Very High Voltage ICs above 10
    KV.” <i>Microelectronic Engineering</i> 53, no. 1–4 (2002): 525–28. <a href="https://doi.org/10.1016/s0167-9317(00)00370-1">https://doi.org/10.1016/s0167-9317(00)00370-1</a>.'
  ieee: 'V. Mankowski, U. Hilleringmann, and K. Schumacher, “A novel insulation technique
    for smart power switching devices and very high voltage ICs above 10 kV,” <i>Microelectronic
    Engineering</i>, vol. 53, no. 1–4, pp. 525–528, 2002, doi: <a href="https://doi.org/10.1016/s0167-9317(00)00370-1">10.1016/s0167-9317(00)00370-1</a>.'
  mla: Mankowski, V., et al. “A Novel Insulation Technique for Smart Power Switching
    Devices and Very High Voltage ICs above 10 KV.” <i>Microelectronic Engineering</i>,
    vol. 53, no. 1–4, Elsevier BV, 2002, pp. 525–28, doi:<a href="https://doi.org/10.1016/s0167-9317(00)00370-1">10.1016/s0167-9317(00)00370-1</a>.
  short: V. Mankowski, U. Hilleringmann, K. Schumacher, Microelectronic Engineering
    53 (2002) 525–528.
date_created: 2023-01-25T09:10:13Z
date_updated: 2023-03-21T10:00:06Z
department:
- _id: '59'
doi: 10.1016/s0167-9317(00)00370-1
intvolume: '        53'
issue: 1-4
keyword:
- Electrical and Electronic Engineering
- Surfaces
- Coatings and Films
- Condensed Matter Physics
- Atomic and Molecular Physics
- and Optics
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
page: 525-528
publication: Microelectronic Engineering
publication_identifier:
  issn:
  - 0167-9317
publication_status: published
publisher: Elsevier BV
status: public
title: A novel insulation technique for smart power switching devices and very high
  voltage ICs above 10 kV
type: journal_article
user_id: '20179'
volume: 53
year: '2002'
...
---
_id: '39879'
author:
- first_name: J.T.
  full_name: Horstmann, J.T.
  last_name: Horstmann
- first_name: Ulrich
  full_name: Hilleringmann, Ulrich
  id: '20179'
  last_name: Hilleringmann
- first_name: K.
  full_name: Goser, K.
  last_name: Goser
citation:
  ama: Horstmann JT, Hilleringmann U, Goser K. 1/f-Noise of sub-100 nm-MOS-transistors
    fabricated by a special deposition and etchback technique. <i>Microelectronic
    Engineering</i>. 2002;53(1-4):213-216. doi:<a href="https://doi.org/10.1016/s0167-9317(00)00299-9">10.1016/s0167-9317(00)00299-9</a>
  apa: Horstmann, J. T., Hilleringmann, U., &#38; Goser, K. (2002). 1/f-Noise of sub-100
    nm-MOS-transistors fabricated by a special deposition and etchback technique.
    <i>Microelectronic Engineering</i>, <i>53</i>(1–4), 213–216. <a href="https://doi.org/10.1016/s0167-9317(00)00299-9">https://doi.org/10.1016/s0167-9317(00)00299-9</a>
  bibtex: '@article{Horstmann_Hilleringmann_Goser_2002, title={1/f-Noise of sub-100
    nm-MOS-transistors fabricated by a special deposition and etchback technique},
    volume={53}, DOI={<a href="https://doi.org/10.1016/s0167-9317(00)00299-9">10.1016/s0167-9317(00)00299-9</a>},
    number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV},
    author={Horstmann, J.T. and Hilleringmann, Ulrich and Goser, K.}, year={2002},
    pages={213–216} }'
  chicago: 'Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “1/f-Noise of Sub-100
    Nm-MOS-Transistors Fabricated by a Special Deposition and Etchback Technique.”
    <i>Microelectronic Engineering</i> 53, no. 1–4 (2002): 213–16. <a href="https://doi.org/10.1016/s0167-9317(00)00299-9">https://doi.org/10.1016/s0167-9317(00)00299-9</a>.'
  ieee: 'J. T. Horstmann, U. Hilleringmann, and K. Goser, “1/f-Noise of sub-100 nm-MOS-transistors
    fabricated by a special deposition and etchback technique,” <i>Microelectronic
    Engineering</i>, vol. 53, no. 1–4, pp. 213–216, 2002, doi: <a href="https://doi.org/10.1016/s0167-9317(00)00299-9">10.1016/s0167-9317(00)00299-9</a>.'
  mla: Horstmann, J. T., et al. “1/f-Noise of Sub-100 Nm-MOS-Transistors Fabricated
    by a Special Deposition and Etchback Technique.” <i>Microelectronic Engineering</i>,
    vol. 53, no. 1–4, Elsevier BV, 2002, pp. 213–16, doi:<a href="https://doi.org/10.1016/s0167-9317(00)00299-9">10.1016/s0167-9317(00)00299-9</a>.
  short: J.T. Horstmann, U. Hilleringmann, K. Goser, Microelectronic Engineering 53
    (2002) 213–216.
date_created: 2023-01-25T09:08:36Z
date_updated: 2023-03-21T10:02:46Z
department:
- _id: '59'
doi: 10.1016/s0167-9317(00)00299-9
intvolume: '        53'
issue: 1-4
keyword:
- Electrical and Electronic Engineering
- Surfaces
- Coatings and Films
- Condensed Matter Physics
- Atomic and Molecular Physics
- and Optics
- Electronic
- Optical and Magnetic Materials
language:
- iso: eng
page: 213-216
publication: Microelectronic Engineering
publication_identifier:
  issn:
  - 0167-9317
publication_status: published
publisher: Elsevier BV
status: public
title: 1/f-Noise of sub-100 nm-MOS-transistors fabricated by a special deposition
  and etchback technique
type: journal_article
user_id: '20179'
volume: 53
year: '2002'
...
---
_id: '39880'
author:
- first_name: J.T.
  full_name: Horstmann, J.T.
  last_name: Horstmann
- first_name: Ulrich
  full_name: Hilleringmann, Ulrich
  id: '20179'
  last_name: Hilleringmann
- first_name: K.
  full_name: Goser, K.
  last_name: Goser
citation:
  ama: 'Horstmann JT, Hilleringmann U, Goser K. Noise analysis of sub-100 nm-MOS-transistors
    fabricated by a special deposition and etchback technique. In: <i>2000 26th Annual
    Conference of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International
    Conference on Industrial Electronics, Control and Instrumentation. 21st Century
    Technologies and Industrial Opportunities (Cat. No.00CH37141)</i>. IEEE; 2002.
    doi:<a href="https://doi.org/10.1109/iecon.2000.972560">10.1109/iecon.2000.972560</a>'
  apa: Horstmann, J. T., Hilleringmann, U., &#38; Goser, K. (2002). Noise analysis
    of sub-100 nm-MOS-transistors fabricated by a special deposition and etchback
    technique. <i>2000 26th Annual Conference of the IEEE Industrial Electronics Society.
    IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control
    and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat.
    No.00CH37141)</i>. <a href="https://doi.org/10.1109/iecon.2000.972560">https://doi.org/10.1109/iecon.2000.972560</a>
  bibtex: '@inproceedings{Horstmann_Hilleringmann_Goser_2002, title={Noise analysis
    of sub-100 nm-MOS-transistors fabricated by a special deposition and etchback
    technique}, DOI={<a href="https://doi.org/10.1109/iecon.2000.972560">10.1109/iecon.2000.972560</a>},
    booktitle={2000 26th Annual Conference of the IEEE Industrial Electronics Society.
    IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control
    and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat.
    No.00CH37141)}, publisher={IEEE}, author={Horstmann, J.T. and Hilleringmann, Ulrich
    and Goser, K.}, year={2002} }'
  chicago: Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “Noise Analysis of
    Sub-100 Nm-MOS-Transistors Fabricated by a Special Deposition and Etchback Technique.”
    In <i>2000 26th Annual Conference of the IEEE Industrial Electronics Society.
    IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control
    and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat.
    No.00CH37141)</i>. IEEE, 2002. <a href="https://doi.org/10.1109/iecon.2000.972560">https://doi.org/10.1109/iecon.2000.972560</a>.
  ieee: 'J. T. Horstmann, U. Hilleringmann, and K. Goser, “Noise analysis of sub-100
    nm-MOS-transistors fabricated by a special deposition and etchback technique,”
    2002, doi: <a href="https://doi.org/10.1109/iecon.2000.972560">10.1109/iecon.2000.972560</a>.'
  mla: Horstmann, J. T., et al. “Noise Analysis of Sub-100 Nm-MOS-Transistors Fabricated
    by a Special Deposition and Etchback Technique.” <i>2000 26th Annual Conference
    of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International
    Conference on Industrial Electronics, Control and Instrumentation. 21st Century
    Technologies and Industrial Opportunities (Cat. No.00CH37141)</i>, IEEE, 2002,
    doi:<a href="https://doi.org/10.1109/iecon.2000.972560">10.1109/iecon.2000.972560</a>.
  short: 'J.T. Horstmann, U. Hilleringmann, K. Goser, in: 2000 26th Annual Conference
    of the IEEE Industrial Electronics Society. IECON 2000. 2000 IEEE International
    Conference on Industrial Electronics, Control and Instrumentation. 21st Century
    Technologies and Industrial Opportunities (Cat. No.00CH37141), IEEE, 2002.'
date_created: 2023-01-25T09:09:18Z
date_updated: 2023-03-21T10:02:30Z
department:
- _id: '59'
doi: 10.1109/iecon.2000.972560
language:
- iso: eng
publication: 2000 26th Annual Conference of the IEEE Industrial Electronics Society.
  IECON 2000. 2000 IEEE International Conference on Industrial Electronics, Control
  and Instrumentation. 21st Century Technologies and Industrial Opportunities (Cat.
  No.00CH37141)
publication_status: published
publisher: IEEE
status: public
title: Noise analysis of sub-100 nm-MOS-transistors fabricated by a special deposition
  and etchback technique
type: conference
user_id: '20179'
year: '2002'
...