---
_id: '4174'
abstract:
- lang: eng
  text: "A quantum dot molecule doped with a single electron in the presence of diagonal
    and off-diagonal carrierphonon\r\ncouplings is studied by means of a nonperturbative
    quantum kinetic theory. The interaction with acoustic phonons by deformation potential
    and piezoelectric coupling is taken into account. We show that the phonon-mediated
    relaxation is fast on a picosecond time scale and is dominated by the usually
    neglected off-diagonal coupling to the lattice degrees of freedom leading to phonon-assisted
    electron tunneling. We show that in the parameter regime of current electrical
    and optical experiments, the microscopic non-Markovian theory has to be employed."
article_number: '115305'
article_type: original
author:
- first_name: A.
  full_name: Grodecka-Grad, A.
  last_name: Grodecka-Grad
- first_name: Jens
  full_name: Förstner, Jens
  id: '158'
  last_name: Förstner
  orcid: 0000-0001-7059-9862
citation:
  ama: Grodecka-Grad A, Förstner J. Theory of phonon-mediated relaxation in doped
    quantum dot molecules. <i>Physical Review B</i>. 2010;81(11). doi:<a href="https://doi.org/10.1103/physrevb.81.115305">10.1103/physrevb.81.115305</a>
  apa: Grodecka-Grad, A., &#38; Förstner, J. (2010). Theory of phonon-mediated relaxation
    in doped quantum dot molecules. <i>Physical Review B</i>, <i>81</i>(11). <a href="https://doi.org/10.1103/physrevb.81.115305">https://doi.org/10.1103/physrevb.81.115305</a>
  bibtex: '@article{Grodecka-Grad_Förstner_2010, title={Theory of phonon-mediated
    relaxation in doped quantum dot molecules}, volume={81}, DOI={<a href="https://doi.org/10.1103/physrevb.81.115305">10.1103/physrevb.81.115305</a>},
    number={11115305}, journal={Physical Review B}, publisher={American Physical Society
    (APS)}, author={Grodecka-Grad, A. and Förstner, Jens}, year={2010} }'
  chicago: Grodecka-Grad, A., and Jens Förstner. “Theory of Phonon-Mediated Relaxation
    in Doped Quantum Dot Molecules.” <i>Physical Review B</i> 81, no. 11 (2010). <a
    href="https://doi.org/10.1103/physrevb.81.115305">https://doi.org/10.1103/physrevb.81.115305</a>.
  ieee: A. Grodecka-Grad and J. Förstner, “Theory of phonon-mediated relaxation in
    doped quantum dot molecules,” <i>Physical Review B</i>, vol. 81, no. 11, 2010.
  mla: Grodecka-Grad, A., and Jens Förstner. “Theory of Phonon-Mediated Relaxation
    in Doped Quantum Dot Molecules.” <i>Physical Review B</i>, vol. 81, no. 11, 115305,
    American Physical Society (APS), 2010, doi:<a href="https://doi.org/10.1103/physrevb.81.115305">10.1103/physrevb.81.115305</a>.
  short: A. Grodecka-Grad, J. Förstner, Physical Review B 81 (2010).
date_created: 2018-08-28T08:57:24Z
date_updated: 2022-01-06T07:00:29Z
ddc:
- '530'
department:
- _id: '15'
doi: 10.1103/physrevb.81.115305
file:
- access_level: open_access
  content_type: application/pdf
  creator: hclaudia
  date_created: 2018-08-28T08:58:21Z
  date_updated: 2018-09-04T19:58:41Z
  file_id: '4175'
  file_name: 2010 Grodecka-Grad,Förstner_Theory of phonon-mediated relaxation in doped
    quantum dot molecules.pdf
  file_size: 680408
  relation: main_file
file_date_updated: 2018-09-04T19:58:41Z
has_accepted_license: '1'
intvolume: '        81'
issue: '11'
keyword:
- tet_topic_qd
language:
- iso: eng
oa: '1'
publication: Physical Review B
publication_identifier:
  issn:
  - 1098-0121
  - 1550-235X
publication_status: published
publisher: American Physical Society (APS)
status: public
title: Theory of phonon-mediated relaxation in doped quantum dot molecules
type: journal_article
urn: '41740'
user_id: '158'
volume: 81
year: '2010'
...
---
_id: '4194'
abstract:
- lang: eng
  text: A heterojunction field-effect transistor (HFET) was fabricated of nonpolar
    cubic AlGaN/GaN grown on Ar+ implanted 3C–SiC (001) by molecular beam epitaxy.
    The device shows a clear field effect at positive bias voltages with V_th=0.6
    V. The HFET output characteristics were calculated using ATLAS simulation program.
    The electron channel at the cubic AlGaN/GaN interface was detected by room temperature
    capacitance-voltage measurements.
article_number: '253501'
article_type: original
author:
- first_name: E.
  full_name: Tschumak, E.
  last_name: Tschumak
- first_name: R.
  full_name: Granzner, R.
  last_name: Granzner
- first_name: Jörg
  full_name: Lindner, Jörg
  id: '20797'
  last_name: Lindner
- first_name: F.
  full_name: Schwierz, F.
  last_name: Schwierz
- first_name: K.
  full_name: Lischka, K.
  last_name: Lischka
- first_name: H.
  full_name: Nagasawa, H.
  last_name: Nagasawa
- first_name: M.
  full_name: Abe, M.
  last_name: Abe
- first_name: Donald
  full_name: As, Donald
  last_name: As
citation:
  ama: Tschumak E, Granzner R, Lindner J, et al. Nonpolar cubic AlGaN/GaN heterojunction
    field-effect transistor on Ar+ implanted 3C–SiC (001). <i>Applied Physics Letters</i>.
    2010;96(25). doi:<a href="https://doi.org/10.1063/1.3455066">10.1063/1.3455066</a>
  apa: Tschumak, E., Granzner, R., Lindner, J., Schwierz, F., Lischka, K., Nagasawa,
    H., … As, D. (2010). Nonpolar cubic AlGaN/GaN heterojunction field-effect transistor
    on Ar+ implanted 3C–SiC (001). <i>Applied Physics Letters</i>, <i>96</i>(25).
    <a href="https://doi.org/10.1063/1.3455066">https://doi.org/10.1063/1.3455066</a>
  bibtex: '@article{Tschumak_Granzner_Lindner_Schwierz_Lischka_Nagasawa_Abe_As_2010,
    title={Nonpolar cubic AlGaN/GaN heterojunction field-effect transistor on Ar+
    implanted 3C–SiC (001)}, volume={96}, DOI={<a href="https://doi.org/10.1063/1.3455066">10.1063/1.3455066</a>},
    number={25253501}, journal={Applied Physics Letters}, publisher={AIP Publishing},
    author={Tschumak, E. and Granzner, R. and Lindner, Jörg and Schwierz, F. and Lischka,
    K. and Nagasawa, H. and Abe, M. and As, Donald}, year={2010} }'
  chicago: Tschumak, E., R. Granzner, Jörg Lindner, F. Schwierz, K. Lischka, H. Nagasawa,
    M. Abe, and Donald As. “Nonpolar Cubic AlGaN/GaN Heterojunction Field-Effect Transistor
    on Ar+ Implanted 3C–SiC (001).” <i>Applied Physics Letters</i> 96, no. 25 (2010).
    <a href="https://doi.org/10.1063/1.3455066">https://doi.org/10.1063/1.3455066</a>.
  ieee: E. Tschumak <i>et al.</i>, “Nonpolar cubic AlGaN/GaN heterojunction field-effect
    transistor on Ar+ implanted 3C–SiC (001),” <i>Applied Physics Letters</i>, vol.
    96, no. 25, 2010.
  mla: Tschumak, E., et al. “Nonpolar Cubic AlGaN/GaN Heterojunction Field-Effect
    Transistor on Ar+ Implanted 3C–SiC (001).” <i>Applied Physics Letters</i>, vol.
    96, no. 25, 253501, AIP Publishing, 2010, doi:<a href="https://doi.org/10.1063/1.3455066">10.1063/1.3455066</a>.
  short: E. Tschumak, R. Granzner, J. Lindner, F. Schwierz, K. Lischka, H. Nagasawa,
    M. Abe, D. As, Applied Physics Letters 96 (2010).
date_created: 2018-08-28T11:56:08Z
date_updated: 2022-01-06T07:00:33Z
ddc:
- '530'
department:
- _id: '15'
- _id: '286'
doi: 10.1063/1.3455066
file:
- access_level: closed
  content_type: application/pdf
  creator: hclaudia
  date_created: 2018-08-28T11:58:27Z
  date_updated: 2018-08-28T11:58:27Z
  file_id: '4195'
  file_name: Non-polar cubic AlGaN-GaN HFET on Ar+ implanted 3C-SiC 001.pdf
  file_size: 277385
  relation: main_file
  success: 1
file_date_updated: 2018-08-28T11:58:27Z
has_accepted_license: '1'
intvolume: '        96'
issue: '25'
language:
- iso: eng
publication: Applied Physics Letters
publication_identifier:
  issn:
  - 0003-6951
  - 1077-3118
publication_status: published
publisher: AIP Publishing
status: public
title: Nonpolar cubic AlGaN/GaN heterojunction field-effect transistor on Ar+ implanted
  3C–SiC (001)
type: journal_article
user_id: '55706'
volume: 96
year: '2010'
...
---
_id: '4200'
abstract:
- lang: eng
  text: "We studied the Fulde-Ferrell-Larkin-Ovchinnikov-type state established due
    to the proximity effect in superconducting\r\nNb/Cu_41Ni_59 bilayers. Using a
    special wedge-type deposition technique, series of 20–35\r\nsamples could be fabricated
    by magnetron sputtering during one run. The layer thickness of only a few\r\nnanometers,
    the composition of the alloy, and the quality of interfaces were controlled by
    Rutherford backscattering\r\nspectrometry, high-resolution transmission electron
    microscopy, and Auger spectroscopy. The magnetic\r\nproperties of the ferromagnetic
    alloy layer were characterized with superconducting quantum interference\r\ndevice
    magnetometry. These studies yield precise information about the thickness and
    demonstrate the homogeneity\r\nof the alloy composition and magnetic properties
    along the sample series. The dependencies of the\r\ncritical temperature on the
    Nb and Cu41Ni59 layer thickness, T_c(d_S) and T_c(d_F), were investigated for
    constant\r\nthickness d_F of the magnetic alloy layer and d_S of the superconducting
    layer, respectively. All types of\r\nnonmonotonic behaviors of T_c versus d_F
    predicted by the theory could be realized experimentally, from\r\nreentrant superconducting
    behavior with a broad extinction region to a slight suppression of superconductivity\r\nwith
    a shallow minimum. Even a double extinction of superconductivity was observed,
    giving evidence for the\r\nmultiple reentrant behavior predicted by theory. All
    critical temperature curves were fitted with suitable sets of\r\nparameters. Then,
    T_c(d_F) diagrams of a hypothetical ferromagnet/superconductor/ferromagnet spin-switch
    core\r\nstructure were calculated using these parameters. Finally, superconducting
    spin-switch fabrication issues are\r\ndiscussed in detail in view of the achieved
    results."
article_number: '054517'
article_type: original
author:
- first_name: V. I.
  full_name: Zdravkov, V. I.
  last_name: Zdravkov
- first_name: J.
  full_name: Kehrle, J.
  last_name: Kehrle
- first_name: G.
  full_name: Obermeier, G.
  last_name: Obermeier
- first_name: S.
  full_name: Gsell, S.
  last_name: Gsell
- first_name: M.
  full_name: Schreck, M.
  last_name: Schreck
- first_name: C.
  full_name: Müller, C.
  last_name: Müller
- first_name: H.-A.
  full_name: Krug von Nidda, H.-A.
  last_name: Krug von Nidda
- first_name: Jörg
  full_name: Lindner, Jörg
  id: '20797'
  last_name: Lindner
- first_name: J.
  full_name: Moosburger-Will, J.
  last_name: Moosburger-Will
- first_name: E.
  full_name: Nold, E.
  last_name: Nold
- first_name: R.
  full_name: Morari, R.
  last_name: Morari
- first_name: V. V.
  full_name: Ryazanov, V. V.
  last_name: Ryazanov
- first_name: A. S.
  full_name: Sidorenko, A. S.
  last_name: Sidorenko
- first_name: S.
  full_name: Horn, S.
  last_name: Horn
- first_name: R.
  full_name: Tidecks, R.
  last_name: Tidecks
- first_name: L. R.
  full_name: Tagirov, L. R.
  last_name: Tagirov
citation:
  ama: Zdravkov VI, Kehrle J, Obermeier G, et al. Reentrant superconductivity in superconductor/ferromagnetic-alloy
    bilayers. <i>Physical Review B</i>. 2010;82(5). doi:<a href="https://doi.org/10.1103/physrevb.82.054517">10.1103/physrevb.82.054517</a>
  apa: Zdravkov, V. I., Kehrle, J., Obermeier, G., Gsell, S., Schreck, M., Müller,
    C., … Tagirov, L. R. (2010). Reentrant superconductivity in superconductor/ferromagnetic-alloy
    bilayers. <i>Physical Review B</i>, <i>82</i>(5). <a href="https://doi.org/10.1103/physrevb.82.054517">https://doi.org/10.1103/physrevb.82.054517</a>
  bibtex: '@article{Zdravkov_Kehrle_Obermeier_Gsell_Schreck_Müller_Krug von Nidda_Lindner_Moosburger-Will_Nold_et
    al._2010, title={Reentrant superconductivity in superconductor/ferromagnetic-alloy
    bilayers}, volume={82}, DOI={<a href="https://doi.org/10.1103/physrevb.82.054517">10.1103/physrevb.82.054517</a>},
    number={5054517}, journal={Physical Review B}, publisher={American Physical Society
    (APS)}, author={Zdravkov, V. I. and Kehrle, J. and Obermeier, G. and Gsell, S.
    and Schreck, M. and Müller, C. and Krug von Nidda, H.-A. and Lindner, Jörg and
    Moosburger-Will, J. and Nold, E. and et al.}, year={2010} }'
  chicago: Zdravkov, V. I., J. Kehrle, G. Obermeier, S. Gsell, M. Schreck, C. Müller,
    H.-A. Krug von Nidda, et al. “Reentrant Superconductivity in Superconductor/Ferromagnetic-Alloy
    Bilayers.” <i>Physical Review B</i> 82, no. 5 (2010). <a href="https://doi.org/10.1103/physrevb.82.054517">https://doi.org/10.1103/physrevb.82.054517</a>.
  ieee: V. I. Zdravkov <i>et al.</i>, “Reentrant superconductivity in superconductor/ferromagnetic-alloy
    bilayers,” <i>Physical Review B</i>, vol. 82, no. 5, 2010.
  mla: Zdravkov, V. I., et al. “Reentrant Superconductivity in Superconductor/Ferromagnetic-Alloy
    Bilayers.” <i>Physical Review B</i>, vol. 82, no. 5, 054517, American Physical
    Society (APS), 2010, doi:<a href="https://doi.org/10.1103/physrevb.82.054517">10.1103/physrevb.82.054517</a>.
  short: V.I. Zdravkov, J. Kehrle, G. Obermeier, S. Gsell, M. Schreck, C. Müller,
    H.-A. Krug von Nidda, J. Lindner, J. Moosburger-Will, E. Nold, R. Morari, V.V.
    Ryazanov, A.S. Sidorenko, S. Horn, R. Tidecks, L.R. Tagirov, Physical Review B
    82 (2010).
date_created: 2018-08-28T12:22:11Z
date_updated: 2022-01-06T07:00:34Z
ddc:
- '530'
department:
- _id: '15'
doi: 10.1103/physrevb.82.054517
extern: '1'
file:
- access_level: closed
  content_type: application/pdf
  creator: hclaudia
  date_created: 2018-08-28T12:23:29Z
  date_updated: 2018-08-28T12:23:29Z
  file_id: '4201'
  file_name: Reentrant superconductivity in superconductor-ferromagnetic-alloy bilayers.pdf
  file_size: 723266
  relation: main_file
  success: 1
file_date_updated: 2018-08-28T12:23:29Z
has_accepted_license: '1'
intvolume: '        82'
issue: '5'
language:
- iso: eng
publication: Physical Review B
publication_identifier:
  issn:
  - 1098-0121
  - 1550-235X
publication_status: published
publisher: American Physical Society (APS)
status: public
title: Reentrant superconductivity in superconductor/ferromagnetic-alloy bilayers
type: journal_article
user_id: '55706'
volume: 82
year: '2010'
...
---
_id: '4202'
abstract:
- lang: eng
  text: "Unintentional doping in nonpolar a-plane \x01112¯0\x02 gallium nitride \x01GaN\x02
    grown on r-plane \x0111¯02\x02\r\nsapphire using a three-dimensional \x013D\x02–two-dimensional
    \x012D\x02 growth method has been\r\ncharacterized. For both 2D only and 3D–2D
    growth, the presence of an unintentionally doped region\r\nadjacent to the GaN/sapphire
    interface is observed by scanning capacitance microscopy \x01SCM\x02. The\r\naverage
    width of this unintentionally doped layer is found to increase with increasing
    3D growth\r\ntime. By using an intentionally doped GaN:Si staircase structure
    for calibration, it is shown that the\r\nunintentionally doped region has an average
    carrier concentration of \x012.5\x010.3\x02\x021018 cm−3. SCM\r\nalso reveals
    the presence of unintentionally doped features extending at 60° from the GaN/sapphire\r\ninterface.
    The observation of decreasing carrier concentration with distance from the GaN/sapphire\r\ninterface
    along these features may suggest that the unintentional doping arises from oxygen\r\ndiffusion
    from the sapphire substrate. Low temperature cathodoluminescence spectra reveal\r\nemission
    peaks at 3.41 and 3.30 eV, which are believed to originate from basal plane stacking
    faults\r\n\x01BSFs\x02 and prismatic stacking faults \x01PSFs\x02, respectively.
    It is shown that the inclined features\r\nextending from the GaN/sapphire interface
    exhibit both enhanced BSF and PSF emission. We\r\nsuggest that enhanced unintentional
    doping occurs in regions around PSFs. Where BSFs intersect\r\nthis doped material
    their emission is also enhanced due to reduced nonradiative recombination.\r\nTransmission
    electron microscopy confirms the presence of PSFs extending through the film at
    60°\r\nfrom the GaN/sapphire interface."
article_number: '023503'
article_type: original
author:
- first_name: Tongtong
  full_name: Zhu, Tongtong
  last_name: Zhu
- first_name: Carol F.
  full_name: Johnston, Carol F.
  last_name: Johnston
- first_name: Maik
  full_name: Häberlen, Maik
  last_name: Häberlen
- first_name: Menno J.
  full_name: Kappers, Menno J.
  last_name: Kappers
- first_name: Rachel A.
  full_name: Oliver, Rachel A.
  last_name: Oliver
citation:
  ama: Zhu T, Johnston CF, Häberlen M, Kappers MJ, Oliver RA. Characterization of
    unintentional doping in nonpolar GaN. <i>Journal of Applied Physics</i>. 2010;107(2).
    doi:<a href="https://doi.org/10.1063/1.3284944">10.1063/1.3284944</a>
  apa: Zhu, T., Johnston, C. F., Häberlen, M., Kappers, M. J., &#38; Oliver, R. A.
    (2010). Characterization of unintentional doping in nonpolar GaN. <i>Journal of
    Applied Physics</i>, <i>107</i>(2). <a href="https://doi.org/10.1063/1.3284944">https://doi.org/10.1063/1.3284944</a>
  bibtex: '@article{Zhu_Johnston_Häberlen_Kappers_Oliver_2010, title={Characterization
    of unintentional doping in nonpolar GaN}, volume={107}, DOI={<a href="https://doi.org/10.1063/1.3284944">10.1063/1.3284944</a>},
    number={2023503}, journal={Journal of Applied Physics}, publisher={AIP Publishing},
    author={Zhu, Tongtong and Johnston, Carol F. and Häberlen, Maik and Kappers, Menno
    J. and Oliver, Rachel A.}, year={2010} }'
  chicago: Zhu, Tongtong, Carol F. Johnston, Maik Häberlen, Menno J. Kappers, and
    Rachel A. Oliver. “Characterization of Unintentional Doping in Nonpolar GaN.”
    <i>Journal of Applied Physics</i> 107, no. 2 (2010). <a href="https://doi.org/10.1063/1.3284944">https://doi.org/10.1063/1.3284944</a>.
  ieee: T. Zhu, C. F. Johnston, M. Häberlen, M. J. Kappers, and R. A. Oliver, “Characterization
    of unintentional doping in nonpolar GaN,” <i>Journal of Applied Physics</i>, vol.
    107, no. 2, 2010.
  mla: Zhu, Tongtong, et al. “Characterization of Unintentional Doping in Nonpolar
    GaN.” <i>Journal of Applied Physics</i>, vol. 107, no. 2, 023503, AIP Publishing,
    2010, doi:<a href="https://doi.org/10.1063/1.3284944">10.1063/1.3284944</a>.
  short: T. Zhu, C.F. Johnston, M. Häberlen, M.J. Kappers, R.A. Oliver, Journal of
    Applied Physics 107 (2010).
date_created: 2018-08-28T12:27:34Z
date_updated: 2022-01-06T07:00:34Z
ddc:
- '530'
department:
- _id: '15'
doi: 10.1063/1.3284944
extern: '1'
file:
- access_level: closed
  content_type: application/pdf
  creator: hclaudia
  date_created: 2018-08-28T12:28:22Z
  date_updated: 2018-08-28T12:28:22Z
  file_id: '4203'
  file_name: Characterization of unintentional doping in nonpolar GaN.pdf
  file_size: 688753
  relation: main_file
  success: 1
file_date_updated: 2018-08-28T12:28:22Z
has_accepted_license: '1'
intvolume: '       107'
issue: '2'
language:
- iso: eng
publication: Journal of Applied Physics
publication_identifier:
  issn:
  - 0021-8979
  - 1089-7550
publication_status: published
publisher: AIP Publishing
status: public
title: Characterization of unintentional doping in nonpolar GaN
type: journal_article
user_id: '55706'
volume: 107
year: '2010'
...
---
_id: '4204'
abstract:
- lang: eng
  text: "A comparative theoretical investigation of carbon interstitials in silicon
    is presented. Calculations using\r\nclassical potentials are compared to first-principles
    density-functional theory calculations of the geometries,\r\nformation, and activation
    energies of the carbon dumbbell interstitial, showing the importance of a quantummechanical\r\ndescription
    of this system. In contrast to previous studies, the present first-principles
    calculations of\r\nthe interstitial carbon migration path yield an activation
    energy that excellently matches the experiment. The\r\nbond-centered interstitial
    configuration shows a net magnetization of two electrons, illustrating the need
    for\r\nspin-polarized calculations."
article_number: '094110'
article_type: original
author:
- first_name: F.
  full_name: Zirkelbach, F.
  last_name: Zirkelbach
- first_name: B.
  full_name: Stritzker, B.
  last_name: Stritzker
- first_name: K.
  full_name: Nordlund, K.
  last_name: Nordlund
- first_name: Jörg
  full_name: Lindner, Jörg
  id: '20797'
  last_name: Lindner
- first_name: W. G.
  full_name: Schmidt, W. G.
  last_name: Schmidt
- first_name: E.
  full_name: Rauls, E.
  last_name: Rauls
citation:
  ama: Zirkelbach F, Stritzker B, Nordlund K, Lindner J, Schmidt WG, Rauls E. Defects
    in carbon implanted silicon calculated by classical potentials and first-principles
    methods. <i>Physical Review B</i>. 2010;82(9). doi:<a href="https://doi.org/10.1103/physrevb.82.094110">10.1103/physrevb.82.094110</a>
  apa: Zirkelbach, F., Stritzker, B., Nordlund, K., Lindner, J., Schmidt, W. G., &#38;
    Rauls, E. (2010). Defects in carbon implanted silicon calculated by classical
    potentials and first-principles methods. <i>Physical Review B</i>, <i>82</i>(9).
    <a href="https://doi.org/10.1103/physrevb.82.094110">https://doi.org/10.1103/physrevb.82.094110</a>
  bibtex: '@article{Zirkelbach_Stritzker_Nordlund_Lindner_Schmidt_Rauls_2010, title={Defects
    in carbon implanted silicon calculated by classical potentials and first-principles
    methods}, volume={82}, DOI={<a href="https://doi.org/10.1103/physrevb.82.094110">10.1103/physrevb.82.094110</a>},
    number={9094110}, journal={Physical Review B}, publisher={American Physical Society
    (APS)}, author={Zirkelbach, F. and Stritzker, B. and Nordlund, K. and Lindner,
    Jörg and Schmidt, W. G. and Rauls, E.}, year={2010} }'
  chicago: Zirkelbach, F., B. Stritzker, K. Nordlund, Jörg Lindner, W. G. Schmidt,
    and E. Rauls. “Defects in Carbon Implanted Silicon Calculated by Classical Potentials
    and First-Principles Methods.” <i>Physical Review B</i> 82, no. 9 (2010). <a href="https://doi.org/10.1103/physrevb.82.094110">https://doi.org/10.1103/physrevb.82.094110</a>.
  ieee: F. Zirkelbach, B. Stritzker, K. Nordlund, J. Lindner, W. G. Schmidt, and E.
    Rauls, “Defects in carbon implanted silicon calculated by classical potentials
    and first-principles methods,” <i>Physical Review B</i>, vol. 82, no. 9, 2010.
  mla: Zirkelbach, F., et al. “Defects in Carbon Implanted Silicon Calculated by Classical
    Potentials and First-Principles Methods.” <i>Physical Review B</i>, vol. 82, no.
    9, 094110, American Physical Society (APS), 2010, doi:<a href="https://doi.org/10.1103/physrevb.82.094110">10.1103/physrevb.82.094110</a>.
  short: F. Zirkelbach, B. Stritzker, K. Nordlund, J. Lindner, W.G. Schmidt, E. Rauls,
    Physical Review B 82 (2010).
date_created: 2018-08-28T12:30:15Z
date_updated: 2022-01-06T07:00:35Z
ddc:
- '530'
department:
- _id: '15'
- _id: '286'
doi: 10.1103/physrevb.82.094110
file:
- access_level: closed
  content_type: application/pdf
  creator: hclaudia
  date_created: 2018-08-28T12:31:01Z
  date_updated: 2018-08-28T12:31:01Z
  file_id: '4205'
  file_name: Defects in Carbon implanted Silicon calculated by classical potentials
    and first principles methods.pdf
  file_size: 238023
  relation: main_file
  success: 1
file_date_updated: 2018-08-28T12:31:01Z
has_accepted_license: '1'
intvolume: '        82'
issue: '9'
language:
- iso: eng
publication: Physical Review B
publication_identifier:
  issn:
  - 1098-0121
  - 1550-235X
publication_status: published
publisher: American Physical Society (APS)
status: public
title: Defects in carbon implanted silicon calculated by classical potentials and
  first-principles methods
type: journal_article
user_id: '55706'
volume: 82
year: '2010'
...
---
_id: '4206'
author:
- first_name: Jörg
  full_name: Lindner, Jörg
  id: '20797'
  last_name: Lindner
citation:
  ama: 'Lindner J. Advanced topics and applications of Transmission Electron Microscopy,
    Part I-II. In: ; 2010.'
  apa: Lindner, J. (2010). Advanced topics and applications of Transmission Electron
    Microscopy, Part I-II. Presented at the Guest Lectures at Departamento de Fisica
    Applicada, Master de Materiales Avanzados y Nanotecnologias , Universidad Autónoma
    de Madrid (Spain).
  bibtex: '@inproceedings{Lindner_2010, title={Advanced topics and applications of
    Transmission Electron Microscopy, Part I-II}, author={Lindner, Jörg}, year={2010}
    }'
  chicago: Lindner, Jörg. “Advanced Topics and Applications of Transmission Electron
    Microscopy, Part I-II,” 2010.
  ieee: J. Lindner, “Advanced topics and applications of Transmission Electron Microscopy,
    Part I-II,” presented at the Guest Lectures at Departamento de Fisica Applicada,
    Master de Materiales Avanzados y Nanotecnologias , Universidad Autónoma de Madrid
    (Spain), 2010.
  mla: Lindner, Jörg. <i>Advanced Topics and Applications of Transmission Electron
    Microscopy, Part I-II</i>. 2010.
  short: 'J. Lindner, in: 2010.'
conference:
  end_date: 2010-04-16
  location: Universidad Autónoma de Madrid (Spain)
  name: 'Guest Lectures at Departamento de Fisica Applicada, Master de Materiales
    Avanzados y Nanotecnologias '
  start_date: 2010-04-14
date_created: 2018-08-28T12:34:11Z
date_updated: 2022-01-06T07:00:35Z
department:
- _id: '15'
- _id: '286'
status: public
title: Advanced topics and applications of Transmission Electron Microscopy, Part
  I-II
type: conference_abstract
user_id: '55706'
year: '2010'
...
---
_id: '4207'
citation:
  ama: Ila D, Kishimoto N, Lindner J, Baglin J, eds. <i>Ion Beams and Nano-Engineering</i>.
    Vol 1181. MRS Symposium Proceedings ; 2010.
  apa: 'Ila, D., Kishimoto, N., Lindner, J., &#38; Baglin, J. (Eds.). (2010). <i>Ion
    Beams and Nano-Engineering</i> (Vol. 1181). Presented at the MRS Spring Meeting
    2009, San Francisco (USA): MRS Symposium Proceedings .'
  bibtex: '@book{Ila_Kishimoto_Lindner_Baglin_2010, title={Ion Beams and Nano-Engineering},
    volume={1181}, publisher={MRS Symposium Proceedings }, year={2010} }'
  chicago: Ila, D., N.  Kishimoto, Jörg Lindner, and J. Baglin, eds. <i>Ion Beams
    and Nano-Engineering</i>. Vol. 1181. MRS Symposium Proceedings , 2010.
  ieee: D. Ila, N. Kishimoto, J. Lindner, and J. Baglin, Eds., <i>Ion Beams and Nano-Engineering</i>,
    vol. 1181. MRS Symposium Proceedings , 2010.
  mla: Ila, D., et al., editors. <i>Ion Beams and Nano-Engineering</i>. Vol. 1181,
    MRS Symposium Proceedings , 2010.
  short: D. Ila, N. Kishimoto, J. Lindner, J. Baglin, eds., Ion Beams and Nano-Engineering,
    MRS Symposium Proceedings , 2010.
conference:
  location: San Francisco (USA)
  name: MRS Spring Meeting 2009
date_created: 2018-08-28T12:38:16Z
date_updated: 2022-01-06T07:00:35Z
department:
- _id: '15'
- _id: '286'
editor:
- first_name: D.
  full_name: Ila, D.
  last_name: Ila
- first_name: 'N. '
  full_name: 'Kishimoto, N. '
  last_name: Kishimoto
- first_name: Jörg
  full_name: Lindner, Jörg
  id: '20797'
  last_name: Lindner
- first_name: J.
  full_name: Baglin, J.
  last_name: Baglin
intvolume: '      1181'
language:
- iso: eng
publication_identifier:
  isbn:
  - 978-1-60511-154-4
publication_status: published
publisher: 'MRS Symposium Proceedings '
status: public
title: Ion Beams and Nano-Engineering
type: book_editor
user_id: '55706'
volume: 1181
year: '2010'
...
---
_id: '4208'
abstract:
- lang: eng
  text: Growth of GaN on Si(111) potentially enables cost efficient manufacturing
    of optoelectronic devices due to the possibility of using cheap large area substrates.
    However, GaN layers grown on Si(111) substrates suffer from high tensile stress
    that can lead to cracking at layer thicknesses exceeding 1 μm. Another challenge
    is the high dislocation density of GaN layers grown on Si(111) which is detrimental
    to device performance. In this paper we show that a step graded AlGaN buffer layer
    can compensate tensile stress, avoiding cracking, and at the same time reduce
    the dislocation density. An additional SiNx interlayer in the GaN layer is shown
    to further reduce the dislocation density down to the high 108 /cm². Weak beam
    dark field TEM was used to study the dislocation reduction in cross sectional
    samples and for comparison of the step graded AlGaN buffer layer structure to
    a continuously graded one. STEM ADF was used to determine the exact location of
    dislocation bending with respect to the position of the interface.
article_number: '012017'
article_type: original
author:
- first_name: M
  full_name: Häberlen, M
  last_name: Häberlen
- first_name: D
  full_name: Zhu, D
  last_name: Zhu
- first_name: C
  full_name: McAleese, C
  last_name: McAleese
- first_name: M J
  full_name: Kappers, M J
  last_name: Kappers
- first_name: C J
  full_name: Humphreys, C J
  last_name: Humphreys
citation:
  ama: 'Häberlen M, Zhu D, McAleese C, Kappers MJ, Humphreys CJ. Dislocation reduction
    in MOVPE grown GaN layers on (111)Si using SiNxand AlGaN layers. <i>Journal of
    Physics: Conference Series</i>. 2010;209. doi:<a href="https://doi.org/10.1088/1742-6596/209/1/012017">10.1088/1742-6596/209/1/012017</a>'
  apa: 'Häberlen, M., Zhu, D., McAleese, C., Kappers, M. J., &#38; Humphreys, C. J.
    (2010). Dislocation reduction in MOVPE grown GaN layers on (111)Si using SiNxand
    AlGaN layers. <i>Journal of Physics: Conference Series</i>, <i>209</i>. <a href="https://doi.org/10.1088/1742-6596/209/1/012017">https://doi.org/10.1088/1742-6596/209/1/012017</a>'
  bibtex: '@article{Häberlen_Zhu_McAleese_Kappers_Humphreys_2010, title={Dislocation
    reduction in MOVPE grown GaN layers on (111)Si using SiNxand AlGaN layers}, volume={209},
    DOI={<a href="https://doi.org/10.1088/1742-6596/209/1/012017">10.1088/1742-6596/209/1/012017</a>},
    number={012017}, journal={Journal of Physics: Conference Series}, publisher={IOP
    Publishing}, author={Häberlen, M and Zhu, D and McAleese, C and Kappers, M J and
    Humphreys, C J}, year={2010} }'
  chicago: 'Häberlen, M, D Zhu, C McAleese, M J Kappers, and C J Humphreys. “Dislocation
    Reduction in MOVPE Grown GaN Layers on (111)Si Using SiNxand AlGaN Layers.” <i>Journal
    of Physics: Conference Series</i> 209 (2010). <a href="https://doi.org/10.1088/1742-6596/209/1/012017">https://doi.org/10.1088/1742-6596/209/1/012017</a>.'
  ieee: 'M. Häberlen, D. Zhu, C. McAleese, M. J. Kappers, and C. J. Humphreys, “Dislocation
    reduction in MOVPE grown GaN layers on (111)Si using SiNxand AlGaN layers,” <i>Journal
    of Physics: Conference Series</i>, vol. 209, 2010.'
  mla: 'Häberlen, M., et al. “Dislocation Reduction in MOVPE Grown GaN Layers on (111)Si
    Using SiNxand AlGaN Layers.” <i>Journal of Physics: Conference Series</i>, vol.
    209, 012017, IOP Publishing, 2010, doi:<a href="https://doi.org/10.1088/1742-6596/209/1/012017">10.1088/1742-6596/209/1/012017</a>.'
  short: 'M. Häberlen, D. Zhu, C. McAleese, M.J. Kappers, C.J. Humphreys, Journal
    of Physics: Conference Series 209 (2010).'
date_created: 2018-08-28T12:39:31Z
date_updated: 2022-01-06T07:00:36Z
ddc:
- '530'
department:
- _id: '15'
doi: 10.1088/1742-6596/209/1/012017
file:
- access_level: closed
  content_type: application/pdf
  creator: hclaudia
  date_created: 2018-08-28T12:40:20Z
  date_updated: 2018-08-28T12:40:20Z
  file_id: '4209'
  file_name: Dislocation reduction in MOVPE grown GaN layers on (111)Si using SiNx
    and AlGaN layers.pdf
  file_size: 13011359
  relation: main_file
  success: 1
file_date_updated: 2018-08-28T12:40:20Z
has_accepted_license: '1'
intvolume: '       209'
language:
- iso: eng
publication: 'Journal of Physics: Conference Series'
publication_identifier:
  issn:
  - 1742-6596
publication_status: published
publisher: IOP Publishing
status: public
title: Dislocation reduction in MOVPE grown GaN layers on (111)Si using SiNxand AlGaN
  layers
type: journal_article
user_id: '55706'
volume: 209
year: '2010'
...
---
_id: '4210'
abstract:
- lang: eng
  text: "In this paper we demonstrate a strain-driven GaN interlayer method to reduce
    dislocation densities in GaN grown on (111) oriented silicon by metal organic
    vapour phase epitaxy (MOVPE). In order to achieve crack-free GaN layers of\r\nreasonable
    thicknesses and dislocation densities it is crucial to integrate both dislocation
    reduction and strain management layers. In contrast to techniques like FACELO
    or nanoELO we show the in situ formation of GaN islands directly on the AlN nucleation
    layer without the need to deposit a SiO2 or SiNx mask. A graded AlGaN layer for
    strain management can be grown on top of this dislocation reducing 3D GaN inter-layer
    in order to achieve crack-free GaN layers grown on top of the AlGaN strain management
    layer. Furthermore, an additional SiNx layer for subsequent dislocation reduction
    can also be incorporated into the structure and is shown to efficiently reduce
    the dislocation density down to the low 10^9 cm^2. The structural properties of
    the 3D GaN island buffer layer and overgrown\r\nsamples are studied by means of
    SEM, cross-sectional, and plan view TEM. Cathodoluminiscence in an SEM is employed
    to correlate the dislocation microstructure as observed by plan view TEM with
    luminescent properties."
article_type: original
author:
- first_name: Maik
  full_name: Häberlen, Maik
  last_name: Häberlen
- first_name: Dandan
  full_name: Zhu, Dandan
  last_name: Zhu
- first_name: Clifford
  full_name: McAleese, Clifford
  last_name: McAleese
- first_name: Tongtong
  full_name: Zhu, Tongtong
  last_name: Zhu
- first_name: Menno J.
  full_name: Kappers, Menno J.
  last_name: Kappers
- first_name: Colin J.
  full_name: Humphreys, Colin J.
  last_name: Humphreys
citation:
  ama: Häberlen M, Zhu D, McAleese C, Zhu T, Kappers MJ, Humphreys CJ. Dislocation
    reduction in GaN grown on Si(111) using a strain-driven 3D GaN interlayer. <i>physica
    status solidi (b)</i>. 2010;247(7):1753-1756. doi:<a href="https://doi.org/10.1002/pssb.200983537">10.1002/pssb.200983537</a>
  apa: Häberlen, M., Zhu, D., McAleese, C., Zhu, T., Kappers, M. J., &#38; Humphreys,
    C. J. (2010). Dislocation reduction in GaN grown on Si(111) using a strain-driven
    3D GaN interlayer. <i>Physica Status Solidi (B)</i>, <i>247</i>(7), 1753–1756.
    <a href="https://doi.org/10.1002/pssb.200983537">https://doi.org/10.1002/pssb.200983537</a>
  bibtex: '@article{Häberlen_Zhu_McAleese_Zhu_Kappers_Humphreys_2010, title={Dislocation
    reduction in GaN grown on Si(111) using a strain-driven 3D GaN interlayer}, volume={247},
    DOI={<a href="https://doi.org/10.1002/pssb.200983537">10.1002/pssb.200983537</a>},
    number={7}, journal={physica status solidi (b)}, publisher={Wiley}, author={Häberlen,
    Maik and Zhu, Dandan and McAleese, Clifford and Zhu, Tongtong and Kappers, Menno
    J. and Humphreys, Colin J.}, year={2010}, pages={1753–1756} }'
  chicago: 'Häberlen, Maik, Dandan Zhu, Clifford McAleese, Tongtong Zhu, Menno J.
    Kappers, and Colin J. Humphreys. “Dislocation Reduction in GaN Grown on Si(111)
    Using a Strain-Driven 3D GaN Interlayer.” <i>Physica Status Solidi (B)</i> 247,
    no. 7 (2010): 1753–56. <a href="https://doi.org/10.1002/pssb.200983537">https://doi.org/10.1002/pssb.200983537</a>.'
  ieee: M. Häberlen, D. Zhu, C. McAleese, T. Zhu, M. J. Kappers, and C. J. Humphreys,
    “Dislocation reduction in GaN grown on Si(111) using a strain-driven 3D GaN interlayer,”
    <i>physica status solidi (b)</i>, vol. 247, no. 7, pp. 1753–1756, 2010.
  mla: Häberlen, Maik, et al. “Dislocation Reduction in GaN Grown on Si(111) Using
    a Strain-Driven 3D GaN Interlayer.” <i>Physica Status Solidi (B)</i>, vol. 247,
    no. 7, Wiley, 2010, pp. 1753–56, doi:<a href="https://doi.org/10.1002/pssb.200983537">10.1002/pssb.200983537</a>.
  short: M. Häberlen, D. Zhu, C. McAleese, T. Zhu, M.J. Kappers, C.J. Humphreys, Physica
    Status Solidi (B) 247 (2010) 1753–1756.
date_created: 2018-08-28T12:42:58Z
date_updated: 2022-01-06T07:00:36Z
ddc:
- '530'
department:
- _id: '15'
doi: 10.1002/pssb.200983537
file:
- access_level: closed
  content_type: application/pdf
  creator: hclaudia
  date_created: 2018-08-28T12:43:31Z
  date_updated: 2018-08-28T12:43:31Z
  file_id: '4211'
  file_name: Dislocation reduction in GaN grown on Si(111) using a strain-driven 3D
    GaN interlayer.pdf
  file_size: 911931
  relation: main_file
  success: 1
file_date_updated: 2018-08-28T12:43:31Z
has_accepted_license: '1'
intvolume: '       247'
issue: '7'
language:
- iso: eng
page: 1753-1756
publication: physica status solidi (b)
publication_identifier:
  issn:
  - 0370-1972
  - 1521-3951
publication_status: published
publisher: Wiley
status: public
title: Dislocation reduction in GaN grown on Si(111) using a strain-driven 3D GaN
  interlayer
type: journal_article
user_id: '55706'
volume: 247
year: '2010'
...
---
_id: '4212'
abstract:
- lang: eng
  text: "Low temperature cathodo- and photoluminescence has been performed on nonpolar
    a-plane GaN films grown using epitaxial lateral overgrowth. In films overgrown
    at a low V–III ratio, the emission spectrum is dominated by “yellow” and “blue”
    luminescence bands, attributed to recombination at point defects or impurities.
    The intensity of this emission is observed to decrease steadily across the window
    region along the −c direction, possibly due to asymmetric diffusion of a point
    defect/impurity species. When overgrown at a higher V–III ratio, the near band
    edge and basal-plane stacking fault emission intensity increases by orders of
    magnitude and a donor–acceptor pair band is observed. Using monochromatic cathodoluminescence
    imaging, the various emission features are correlated with the microstructure
    of the film. In particular, the peak energy of the basal-plane stacking fault
    emission is seen to be blueshifted by \x0415 meV in the wing relative to the window
    region, which may be related to the different strain states in the respective
    regions."
article_number: '033523'
article_type: original
author:
- first_name: M.
  full_name: Häberlen, M.
  last_name: Häberlen
- first_name: T. J.
  full_name: Badcock, T. J.
  last_name: Badcock
- first_name: M. A.
  full_name: Moram, M. A.
  last_name: Moram
- first_name: J. L.
  full_name: Hollander, J. L.
  last_name: Hollander
- first_name: M. J.
  full_name: Kappers, M. J.
  last_name: Kappers
- first_name: P.
  full_name: Dawson, P.
  last_name: Dawson
- first_name: C. J.
  full_name: Humphreys, C. J.
  last_name: Humphreys
- first_name: R. A.
  full_name: Oliver, R. A.
  last_name: Oliver
citation:
  ama: Häberlen M, Badcock TJ, Moram MA, et al. Low temperature photoluminescence
    and cathodoluminescence studies of nonpolar GaN grown using epitaxial lateral
    overgrowth. <i>Journal of Applied Physics</i>. 2010;108(3). doi:<a href="https://doi.org/10.1063/1.3460641">10.1063/1.3460641</a>
  apa: Häberlen, M., Badcock, T. J., Moram, M. A., Hollander, J. L., Kappers, M. J.,
    Dawson, P., … Oliver, R. A. (2010). Low temperature photoluminescence and cathodoluminescence
    studies of nonpolar GaN grown using epitaxial lateral overgrowth. <i>Journal of
    Applied Physics</i>, <i>108</i>(3). <a href="https://doi.org/10.1063/1.3460641">https://doi.org/10.1063/1.3460641</a>
  bibtex: '@article{Häberlen_Badcock_Moram_Hollander_Kappers_Dawson_Humphreys_Oliver_2010,
    title={Low temperature photoluminescence and cathodoluminescence studies of nonpolar
    GaN grown using epitaxial lateral overgrowth}, volume={108}, DOI={<a href="https://doi.org/10.1063/1.3460641">10.1063/1.3460641</a>},
    number={3033523}, journal={Journal of Applied Physics}, publisher={AIP Publishing},
    author={Häberlen, M. and Badcock, T. J. and Moram, M. A. and Hollander, J. L.
    and Kappers, M. J. and Dawson, P. and Humphreys, C. J. and Oliver, R. A.}, year={2010}
    }'
  chicago: Häberlen, M., T. J. Badcock, M. A. Moram, J. L. Hollander, M. J. Kappers,
    P. Dawson, C. J. Humphreys, and R. A. Oliver. “Low Temperature Photoluminescence
    and Cathodoluminescence Studies of Nonpolar GaN Grown Using Epitaxial Lateral
    Overgrowth.” <i>Journal of Applied Physics</i> 108, no. 3 (2010). <a href="https://doi.org/10.1063/1.3460641">https://doi.org/10.1063/1.3460641</a>.
  ieee: M. Häberlen <i>et al.</i>, “Low temperature photoluminescence and cathodoluminescence
    studies of nonpolar GaN grown using epitaxial lateral overgrowth,” <i>Journal
    of Applied Physics</i>, vol. 108, no. 3, 2010.
  mla: Häberlen, M., et al. “Low Temperature Photoluminescence and Cathodoluminescence
    Studies of Nonpolar GaN Grown Using Epitaxial Lateral Overgrowth.” <i>Journal
    of Applied Physics</i>, vol. 108, no. 3, 033523, AIP Publishing, 2010, doi:<a
    href="https://doi.org/10.1063/1.3460641">10.1063/1.3460641</a>.
  short: M. Häberlen, T.J. Badcock, M.A. Moram, J.L. Hollander, M.J. Kappers, P. Dawson,
    C.J. Humphreys, R.A. Oliver, Journal of Applied Physics 108 (2010).
date_created: 2018-08-28T12:46:49Z
date_updated: 2022-01-06T07:00:37Z
ddc:
- '530'
department:
- _id: '15'
doi: 10.1063/1.3460641
file:
- access_level: closed
  content_type: application/pdf
  creator: hclaudia
  date_created: 2018-08-28T12:47:23Z
  date_updated: 2018-08-28T12:47:23Z
  file_id: '4213'
  file_name: Low temperature photoluminescence and cathodoluminescence studies of
    non-polar GaN grown using epitaxial lateral overgrowth.pdf
  file_size: 2391054
  relation: main_file
  success: 1
file_date_updated: 2018-08-28T12:47:23Z
has_accepted_license: '1'
intvolume: '       108'
issue: '3'
language:
- iso: eng
publication: Journal of Applied Physics
publication_identifier:
  issn:
  - 0021-8979
  - 1089-7550
publication_status: published
publisher: AIP Publishing
status: public
title: Low temperature photoluminescence and cathodoluminescence studies of nonpolar
  GaN grown using epitaxial lateral overgrowth
type: journal_article
user_id: '55706'
volume: 108
year: '2010'
...
---
_id: '4214'
abstract:
- lang: eng
  text: "Non-polar a -plane (1 1 2 ̄ 0) GaN films were grown on r-plane sapphire by
    metal–organic vapor phase epitaxy and were subsequently annealed for 90 min at
    1070°C. Most dislocations were partial\r\ndislocations, which terminated basal
    plane stacking faults. Prior to annealing, these dislocations were\r\nrandomly
    distributed. After annealing, these dislocations moved into arrays oriented along
    the [0 0 0 1]\r\ndirection and aligned perpendicular to the film–substrate interface
    throughout their length, although\r\nthe total dislocation density remained unchanged.
    These changes were accompanied by broadening of\r\nthe symmetric X-ray diffraction
    1 1 2 ̄ 0 w-scan widths. The mechanism of movement was identified as\r\ndislocation
    glide, occurring due to highly anisotropic stresses (confirmed by X-ray diffraction
    lattice\r\nparameter measurements) and evidenced by macroscopic slip bands observed
    on the sample surface.\r\nThere was also an increase in the density of unintentionally
    n-type doped electrically conductive\r\ninclined features present at the film–substrate
    interface (as observed in cross-section using scanning\r\ncapacitance microscopy),
    suggesting out-diffusion of impurities from the substrate along with prismatic\r\nstacking
    faults. These data suggest that annealing processes performed close to film growth\r\ntemperatures
    can affect both the microstructure and the electrical properties of non-polar
    GaN films."
article_type: original
author:
- first_name: Rui
  full_name: Hao, Rui
  last_name: Hao
- first_name: T.
  full_name: Zhu, T.
  last_name: Zhu
- first_name: M.
  full_name: Häberlen, M.
  last_name: Häberlen
- first_name: T.Y.
  full_name: Chang, T.Y.
  last_name: Chang
- first_name: M.J.
  full_name: Kappers, M.J.
  last_name: Kappers
- first_name: R.A.
  full_name: Oliver, R.A.
  last_name: Oliver
- first_name: C.J.
  full_name: Humphreys, C.J.
  last_name: Humphreys
- first_name: M.A.
  full_name: Moram, M.A.
  last_name: Moram
citation:
  ama: Hao R, Zhu T, Häberlen M, et al. The effects of annealing on non-polar (112¯0)
    a-plane GaN films. <i>Journal of Crystal Growth</i>. 2010;312(23):3536-3543. doi:<a
    href="https://doi.org/10.1016/j.jcrysgro.2010.08.041">10.1016/j.jcrysgro.2010.08.041</a>
  apa: Hao, R., Zhu, T., Häberlen, M., Chang, T. Y., Kappers, M. J., Oliver, R. A.,
    … Moram, M. A. (2010). The effects of annealing on non-polar (112¯0) a-plane GaN
    films. <i>Journal of Crystal Growth</i>, <i>312</i>(23), 3536–3543. <a href="https://doi.org/10.1016/j.jcrysgro.2010.08.041">https://doi.org/10.1016/j.jcrysgro.2010.08.041</a>
  bibtex: '@article{Hao_Zhu_Häberlen_Chang_Kappers_Oliver_Humphreys_Moram_2010, title={The
    effects of annealing on non-polar (112¯0) a-plane GaN films}, volume={312}, DOI={<a
    href="https://doi.org/10.1016/j.jcrysgro.2010.08.041">10.1016/j.jcrysgro.2010.08.041</a>},
    number={23}, journal={Journal of Crystal Growth}, publisher={Elsevier BV}, author={Hao,
    Rui and Zhu, T. and Häberlen, M. and Chang, T.Y. and Kappers, M.J. and Oliver,
    R.A. and Humphreys, C.J. and Moram, M.A.}, year={2010}, pages={3536–3543} }'
  chicago: 'Hao, Rui, T. Zhu, M. Häberlen, T.Y. Chang, M.J. Kappers, R.A. Oliver,
    C.J. Humphreys, and M.A. Moram. “The Effects of Annealing on Non-Polar (112¯0)
    a-Plane GaN Films.” <i>Journal of Crystal Growth</i> 312, no. 23 (2010): 3536–43.
    <a href="https://doi.org/10.1016/j.jcrysgro.2010.08.041">https://doi.org/10.1016/j.jcrysgro.2010.08.041</a>.'
  ieee: R. Hao <i>et al.</i>, “The effects of annealing on non-polar (112¯0) a-plane
    GaN films,” <i>Journal of Crystal Growth</i>, vol. 312, no. 23, pp. 3536–3543,
    2010.
  mla: Hao, Rui, et al. “The Effects of Annealing on Non-Polar (112¯0) a-Plane GaN
    Films.” <i>Journal of Crystal Growth</i>, vol. 312, no. 23, Elsevier BV, 2010,
    pp. 3536–43, doi:<a href="https://doi.org/10.1016/j.jcrysgro.2010.08.041">10.1016/j.jcrysgro.2010.08.041</a>.
  short: R. Hao, T. Zhu, M. Häberlen, T.Y. Chang, M.J. Kappers, R.A. Oliver, C.J.
    Humphreys, M.A. Moram, Journal of Crystal Growth 312 (2010) 3536–3543.
date_created: 2018-08-28T12:49:39Z
date_updated: 2022-01-06T07:00:37Z
ddc:
- '530'
department:
- _id: '15'
doi: 10.1016/j.jcrysgro.2010.08.041
file:
- access_level: closed
  content_type: application/pdf
  creator: hclaudia
  date_created: 2018-08-28T12:50:07Z
  date_updated: 2018-08-28T12:50:07Z
  file_id: '4215'
  file_name: The effects of annealing on non-polar (11-20) a-plane GaN films.pdf
  file_size: 1218752
  relation: main_file
  success: 1
file_date_updated: 2018-08-28T12:50:07Z
has_accepted_license: '1'
intvolume: '       312'
issue: '23'
language:
- iso: eng
page: 3536-3543
publication: Journal of Crystal Growth
publication_identifier:
  issn:
  - 0022-0248
publication_status: published
publisher: Elsevier BV
status: public
title: The effects of annealing on non-polar (112¯0) a-plane GaN films
type: journal_article
user_id: '55706'
volume: 312
year: '2010'
...
---
_id: '4216'
abstract:
- lang: eng
  text: "In non-annealed 6H-SiC samples that were electron irradiated at room temperature,
    a new\r\nEPR signal due to a S=1 defect center with exceptionally large zero-field
    splitting (D = +652·10-4\r\ncm-1) has been observed under illumination. A positive
    sign of D demonstrates that the spin-orbit\r\ncontribution to the zero-field splitting
    exceeds by far that of the spin-spin interaction. A principal\r\naxis of the fine
    structure tilted by 59° against the crystal c-axis as well as the exceptionally
    high\r\nzero-field splitting D can be qualitatively understood by the occurrence
    of additional close-lying\r\ndefect levels in defect clusters resulting in comparatively
    large second-order spin-orbit coupling. A\r\ntentative assignment to vacancy clusters
    is supported by the observed annealing behavior."
article_type: original
author:
- first_name: Andreas
  full_name: Scholle, Andreas
  last_name: Scholle
- first_name: Siegmund
  full_name: Greulich-Weber, Siegmund
  last_name: Greulich-Weber
- first_name: Eva
  full_name: Rauls, Eva
  last_name: Rauls
- first_name: Wolf Gero
  full_name: Schmidt, Wolf Gero
  last_name: Schmidt
- first_name: Uwe
  full_name: Gerstmann, Uwe
  last_name: Gerstmann
citation:
  ama: Scholle A, Greulich-Weber S, Rauls E, Schmidt WG, Gerstmann U. Fine Structure
    of Triplet Centers in Room Temperature Irradiated 6H-SiC. <i>Materials Science
    Forum</i>. 2010;645-648:403-406. doi:<a href="https://doi.org/10.4028/www.scientific.net/msf.645-648.403">10.4028/www.scientific.net/msf.645-648.403</a>
  apa: Scholle, A., Greulich-Weber, S., Rauls, E., Schmidt, W. G., &#38; Gerstmann,
    U. (2010). Fine Structure of Triplet Centers in Room Temperature Irradiated 6H-SiC.
    <i>Materials Science Forum</i>, <i>645</i>–<i>648</i>, 403–406. <a href="https://doi.org/10.4028/www.scientific.net/msf.645-648.403">https://doi.org/10.4028/www.scientific.net/msf.645-648.403</a>
  bibtex: '@article{Scholle_Greulich-Weber_Rauls_Schmidt_Gerstmann_2010, title={Fine
    Structure of Triplet Centers in Room Temperature Irradiated 6H-SiC}, volume={645–648},
    DOI={<a href="https://doi.org/10.4028/www.scientific.net/msf.645-648.403">10.4028/www.scientific.net/msf.645-648.403</a>},
    journal={Materials Science Forum}, publisher={Trans Tech Publications}, author={Scholle,
    Andreas and Greulich-Weber, Siegmund and Rauls, Eva and Schmidt, Wolf Gero and
    Gerstmann, Uwe}, year={2010}, pages={403–406} }'
  chicago: 'Scholle, Andreas, Siegmund Greulich-Weber, Eva Rauls, Wolf Gero Schmidt,
    and Uwe Gerstmann. “Fine Structure of Triplet Centers in Room Temperature Irradiated
    6H-SiC.” <i>Materials Science Forum</i> 645–648 (2010): 403–6. <a href="https://doi.org/10.4028/www.scientific.net/msf.645-648.403">https://doi.org/10.4028/www.scientific.net/msf.645-648.403</a>.'
  ieee: A. Scholle, S. Greulich-Weber, E. Rauls, W. G. Schmidt, and U. Gerstmann,
    “Fine Structure of Triplet Centers in Room Temperature Irradiated 6H-SiC,” <i>Materials
    Science Forum</i>, vol. 645–648, pp. 403–406, 2010.
  mla: Scholle, Andreas, et al. “Fine Structure of Triplet Centers in Room Temperature
    Irradiated 6H-SiC.” <i>Materials Science Forum</i>, vol. 645–648, Trans Tech Publications,
    2010, pp. 403–06, doi:<a href="https://doi.org/10.4028/www.scientific.net/msf.645-648.403">10.4028/www.scientific.net/msf.645-648.403</a>.
  short: A. Scholle, S. Greulich-Weber, E. Rauls, W.G. Schmidt, U. Gerstmann, Materials
    Science Forum 645–648 (2010) 403–406.
date_created: 2018-08-28T12:53:50Z
date_updated: 2022-01-06T07:00:38Z
ddc:
- '530'
department:
- _id: '15'
doi: 10.4028/www.scientific.net/msf.645-648.403
file:
- access_level: closed
  content_type: application/pdf
  creator: hclaudia
  date_created: 2018-08-28T12:54:26Z
  date_updated: 2018-08-28T12:54:26Z
  file_id: '4217'
  file_name: Fine structure of triplet centers in room temperature irradiated 6H-SiC.pdf
  file_size: 583484
  relation: main_file
  success: 1
file_date_updated: 2018-08-28T12:54:26Z
has_accepted_license: '1'
language:
- iso: eng
page: 403-406
publication: Materials Science Forum
publication_identifier:
  issn:
  - 1662-9752
publication_status: published
publisher: Trans Tech Publications
status: public
title: Fine Structure of Triplet Centers in Room Temperature Irradiated 6H-SiC
type: journal_article
user_id: '55706'
volume: 645-648
year: '2010'
...
---
_id: '6619'
abstract:
- lang: ger
  text: Strömungsbasierte Mischprozesse sind grundlegender Bestandteil vieler chemischer
    Prozesse. Realisierbare Mischzeiten reichen von einigen Millisekunden bis zu Sekunden,
    wobei die vollständige Homogenisierung oft nicht sichergestellt ist. Werden kinetische
    Parameter chemischer Reaktionen dieses Zeitskalenbereichs ohne Berücksichtigung
    der Mischprozesse bestimmt, sind sie mischungsmaskiert und geben die inhärente
    chemische Kinetik nicht wieder. In dieser Arbeit wird die Validierung und Anwendung
    einer Methode zur Bestimmung inhärenter chemischer Kinetiken von in Flüssigphase
    ablaufenden chemischen Reaktionen im stationären, laminaren Flachbettmikroreaktor
    vorgestellt. Der verfolgte Ansatz basiert auf der mechanistischen Modellierung
    der Molmengen unter Berücksichtigung von Konvektion, Diffusion und Reaktion und
    der Bestimmung der unbekannten Parameter durch Anpassung des Modells an experimentell
    ermittelte Konzentrationsverläufe.
article_type: original
author:
- first_name: H.-J.
  full_name: Warnecke, H.-J.
  last_name: Warnecke
- first_name: D.
  full_name: Bothe, D.
  last_name: Bothe
- first_name: Artur
  full_name: Zrenner, Artur
  id: '606'
  last_name: Zrenner
  orcid: 0000-0002-5190-0944
- first_name: Gerhard
  full_name: Berth, Gerhard
  id: '53'
  last_name: Berth
- first_name: K.-P.
  full_name: Hüsch, K.-P.
  last_name: Hüsch
citation:
  ama: Warnecke H-J, Bothe D, Zrenner A, Berth G, Hüsch K-P. Modellbasierte Bestimmung
    lokal gültiger Kinetiken chemischer Reaktionen in Flüssigphase mittels Flachbettmikroreaktor*.
    <i>Chemie Ingenieur Technik</i>. 2010;82(3):251-258. doi:<a href="https://doi.org/10.1002/cite.200900169">10.1002/cite.200900169</a>
  apa: Warnecke, H.-J., Bothe, D., Zrenner, A., Berth, G., &#38; Hüsch, K.-P. (2010).
    Modellbasierte Bestimmung lokal gültiger Kinetiken chemischer Reaktionen in Flüssigphase
    mittels Flachbettmikroreaktor*. <i>Chemie Ingenieur Technik</i>, <i>82</i>(3),
    251–258. <a href="https://doi.org/10.1002/cite.200900169">https://doi.org/10.1002/cite.200900169</a>
  bibtex: '@article{Warnecke_Bothe_Zrenner_Berth_Hüsch_2010, title={Modellbasierte
    Bestimmung lokal gültiger Kinetiken chemischer Reaktionen in Flüssigphase mittels
    Flachbettmikroreaktor*}, volume={82}, DOI={<a href="https://doi.org/10.1002/cite.200900169">10.1002/cite.200900169</a>},
    number={3}, journal={Chemie Ingenieur Technik}, publisher={Wiley}, author={Warnecke,
    H.-J. and Bothe, D. and Zrenner, Artur and Berth, Gerhard and Hüsch, K.-P.}, year={2010},
    pages={251–258} }'
  chicago: 'Warnecke, H.-J., D. Bothe, Artur Zrenner, Gerhard Berth, and K.-P. Hüsch.
    “Modellbasierte Bestimmung lokal gültiger Kinetiken chemischer Reaktionen in Flüssigphase
    mittels Flachbettmikroreaktor*.” <i>Chemie Ingenieur Technik</i> 82, no. 3 (2010):
    251–58. <a href="https://doi.org/10.1002/cite.200900169">https://doi.org/10.1002/cite.200900169</a>.'
  ieee: H.-J. Warnecke, D. Bothe, A. Zrenner, G. Berth, and K.-P. Hüsch, “Modellbasierte
    Bestimmung lokal gültiger Kinetiken chemischer Reaktionen in Flüssigphase mittels
    Flachbettmikroreaktor*,” <i>Chemie Ingenieur Technik</i>, vol. 82, no. 3, pp.
    251–258, 2010.
  mla: Warnecke, H. J., et al. “Modellbasierte Bestimmung lokal gültiger Kinetiken
    chemischer Reaktionen in Flüssigphase mittels Flachbettmikroreaktor*.” <i>Chemie
    Ingenieur Technik</i>, vol. 82, no. 3, Wiley, 2010, pp. 251–58, doi:<a href="https://doi.org/10.1002/cite.200900169">10.1002/cite.200900169</a>.
  short: H.-J. Warnecke, D. Bothe, A. Zrenner, G. Berth, K.-P. Hüsch, Chemie Ingenieur
    Technik 82 (2010) 251–258.
date_created: 2019-01-10T10:13:09Z
date_updated: 2022-01-06T07:03:13Z
department:
- _id: '15'
- _id: '230'
- _id: '35'
doi: 10.1002/cite.200900169
intvolume: '        82'
issue: '3'
language:
- iso: ger
page: 251-258
publication: Chemie Ingenieur Technik
publication_identifier:
  issn:
  - 0009-286X
  - 1522-2640
publication_status: published
publisher: Wiley
status: public
title: Modellbasierte Bestimmung lokal gültiger Kinetiken chemischer Reaktionen in
  Flüssigphase mittels Flachbettmikroreaktor*
type: journal_article
user_id: '49428'
volume: 82
year: '2010'
...
---
_id: '35345'
article_type: original
author:
- first_name: Javier
  full_name: Pérez Quiñones, Javier
  last_name: Pérez Quiñones
- first_name: Richard
  full_name: Szopko, Richard
  last_name: Szopko
- first_name: Claudia
  full_name: Schmidt, Claudia
  id: '466'
  last_name: Schmidt
  orcid: 0000-0003-3179-9997
- first_name: Carlos
  full_name: Peniche Covas, Carlos
  last_name: Peniche Covas
citation:
  ama: 'Pérez Quiñones J, Szopko R, Schmidt C, Peniche Covas C. Novel drug delivery
    systems: Chitosan conjugates covalently attached to steroids with potential anticancer
    and agrochemical activity. <i>Carbohydrate Polymers</i>. 2010;84(3):858-864. doi:<a
    href="https://doi.org/10.1016/j.carbpol.2010.12.007">10.1016/j.carbpol.2010.12.007</a>'
  apa: 'Pérez Quiñones, J., Szopko, R., Schmidt, C., &#38; Peniche Covas, C. (2010).
    Novel drug delivery systems: Chitosan conjugates covalently attached to steroids
    with potential anticancer and agrochemical activity. <i>Carbohydrate Polymers</i>,
    <i>84</i>(3), 858–864. <a href="https://doi.org/10.1016/j.carbpol.2010.12.007">https://doi.org/10.1016/j.carbpol.2010.12.007</a>'
  bibtex: '@article{Pérez Quiñones_Szopko_Schmidt_Peniche Covas_2010, title={Novel
    drug delivery systems: Chitosan conjugates covalently attached to steroids with
    potential anticancer and agrochemical activity}, volume={84}, DOI={<a href="https://doi.org/10.1016/j.carbpol.2010.12.007">10.1016/j.carbpol.2010.12.007</a>},
    number={3}, journal={Carbohydrate Polymers}, publisher={Elsevier BV}, author={Pérez
    Quiñones, Javier and Szopko, Richard and Schmidt, Claudia and Peniche Covas, Carlos},
    year={2010}, pages={858–864} }'
  chicago: 'Pérez Quiñones, Javier, Richard Szopko, Claudia Schmidt, and Carlos Peniche
    Covas. “Novel Drug Delivery Systems: Chitosan Conjugates Covalently Attached to
    Steroids with Potential Anticancer and Agrochemical Activity.” <i>Carbohydrate
    Polymers</i> 84, no. 3 (2010): 858–64. <a href="https://doi.org/10.1016/j.carbpol.2010.12.007">https://doi.org/10.1016/j.carbpol.2010.12.007</a>.'
  ieee: 'J. Pérez Quiñones, R. Szopko, C. Schmidt, and C. Peniche Covas, “Novel drug
    delivery systems: Chitosan conjugates covalently attached to steroids with potential
    anticancer and agrochemical activity,” <i>Carbohydrate Polymers</i>, vol. 84,
    no. 3, pp. 858–864, 2010, doi: <a href="https://doi.org/10.1016/j.carbpol.2010.12.007">10.1016/j.carbpol.2010.12.007</a>.'
  mla: 'Pérez Quiñones, Javier, et al. “Novel Drug Delivery Systems: Chitosan Conjugates
    Covalently Attached to Steroids with Potential Anticancer and Agrochemical Activity.”
    <i>Carbohydrate Polymers</i>, vol. 84, no. 3, Elsevier BV, 2010, pp. 858–64, doi:<a
    href="https://doi.org/10.1016/j.carbpol.2010.12.007">10.1016/j.carbpol.2010.12.007</a>.'
  short: J. Pérez Quiñones, R. Szopko, C. Schmidt, C. Peniche Covas, Carbohydrate
    Polymers 84 (2010) 858–864.
date_created: 2023-01-06T13:10:01Z
date_updated: 2023-01-07T11:31:00Z
department:
- _id: '2'
- _id: '315'
doi: 10.1016/j.carbpol.2010.12.007
intvolume: '        84'
issue: '3'
keyword:
- Materials Chemistry
- Polymers and Plastics
- Organic Chemistry
language:
- iso: eng
page: 858-864
publication: Carbohydrate Polymers
publication_identifier:
  issn:
  - 0144-8617
publication_status: published
publisher: Elsevier BV
quality_controlled: '1'
status: public
title: 'Novel drug delivery systems: Chitosan conjugates covalently attached to steroids
  with potential anticancer and agrochemical activity'
type: journal_article
user_id: '466'
volume: 84
year: '2010'
...
---
_id: '35348'
article_type: original
author:
- first_name: B.
  full_name: Medronho, B.
  last_name: Medronho
- first_name: Claudia
  full_name: Schmidt, Claudia
  id: '466'
  last_name: Schmidt
  orcid: 0000-0003-3179-9997
- first_name: U.
  full_name: Olsson, U.
  last_name: Olsson
- first_name: M. G.
  full_name: Miguel, M. G.
  last_name: Miguel
citation:
  ama: Medronho B, Schmidt C, Olsson U, Miguel MG. Size Determination of Shear-Induced
    Multilamellar Vesicles by Rheo-NMR Spectroscopy. <i>Langmuir</i>. 2010;26(3):1477-1481.
    doi:<a href="https://doi.org/10.1021/la903682p">10.1021/la903682p</a>
  apa: Medronho, B., Schmidt, C., Olsson, U., &#38; Miguel, M. G. (2010). Size Determination
    of Shear-Induced Multilamellar Vesicles by Rheo-NMR Spectroscopy. <i>Langmuir</i>,
    <i>26</i>(3), 1477–1481. <a href="https://doi.org/10.1021/la903682p">https://doi.org/10.1021/la903682p</a>
  bibtex: '@article{Medronho_Schmidt_Olsson_Miguel_2010, title={Size Determination
    of Shear-Induced Multilamellar Vesicles by Rheo-NMR Spectroscopy}, volume={26},
    DOI={<a href="https://doi.org/10.1021/la903682p">10.1021/la903682p</a>}, number={3},
    journal={Langmuir}, publisher={American Chemical Society (ACS)}, author={Medronho,
    B. and Schmidt, Claudia and Olsson, U. and Miguel, M. G.}, year={2010}, pages={1477–1481}
    }'
  chicago: 'Medronho, B., Claudia Schmidt, U. Olsson, and M. G. Miguel. “Size Determination
    of Shear-Induced Multilamellar Vesicles by Rheo-NMR Spectroscopy.” <i>Langmuir</i>
    26, no. 3 (2010): 1477–81. <a href="https://doi.org/10.1021/la903682p">https://doi.org/10.1021/la903682p</a>.'
  ieee: 'B. Medronho, C. Schmidt, U. Olsson, and M. G. Miguel, “Size Determination
    of Shear-Induced Multilamellar Vesicles by Rheo-NMR Spectroscopy,” <i>Langmuir</i>,
    vol. 26, no. 3, pp. 1477–1481, 2010, doi: <a href="https://doi.org/10.1021/la903682p">10.1021/la903682p</a>.'
  mla: Medronho, B., et al. “Size Determination of Shear-Induced Multilamellar Vesicles
    by Rheo-NMR Spectroscopy.” <i>Langmuir</i>, vol. 26, no. 3, American Chemical
    Society (ACS), 2010, pp. 1477–81, doi:<a href="https://doi.org/10.1021/la903682p">10.1021/la903682p</a>.
  short: B. Medronho, C. Schmidt, U. Olsson, M.G. Miguel, Langmuir 26 (2010) 1477–1481.
date_created: 2023-01-06T13:11:12Z
date_updated: 2023-01-07T11:29:31Z
department:
- _id: '2'
- _id: '315'
doi: 10.1021/la903682p
intvolume: '        26'
issue: '3'
keyword:
- Electrochemistry
- Spectroscopy
- Surfaces and Interfaces
- Condensed Matter Physics
- General Materials Science
language:
- iso: eng
page: 1477-1481
publication: Langmuir
publication_identifier:
  issn:
  - 0743-7463
  - 1520-5827
publication_status: published
publisher: American Chemical Society (ACS)
quality_controlled: '1'
status: public
title: Size Determination of Shear-Induced Multilamellar Vesicles by Rheo-NMR Spectroscopy
type: journal_article
user_id: '466'
volume: 26
year: '2010'
...
---
_id: '35347'
article_type: original
author:
- first_name: B.
  full_name: Medronho, B.
  last_name: Medronho
- first_name: M.
  full_name: Rodrigues, M.
  last_name: Rodrigues
- first_name: M. G.
  full_name: Miguel, M. G.
  last_name: Miguel
- first_name: U.
  full_name: Olsson, U.
  last_name: Olsson
- first_name: Claudia
  full_name: Schmidt, Claudia
  id: '466'
  last_name: Schmidt
  orcid: 0000-0003-3179-9997
citation:
  ama: Medronho B, Rodrigues M, Miguel MG, Olsson U, Schmidt C. Shear-Induced Defect
    Formation in a Nonionic Lamellar Phase. <i>Langmuir</i>. 2010;26(13):11304-11313.
    doi:<a href="https://doi.org/10.1021/la100627z">10.1021/la100627z</a>
  apa: Medronho, B., Rodrigues, M., Miguel, M. G., Olsson, U., &#38; Schmidt, C. (2010).
    Shear-Induced Defect Formation in a Nonionic Lamellar Phase. <i>Langmuir</i>,
    <i>26</i>(13), 11304–11313. <a href="https://doi.org/10.1021/la100627z">https://doi.org/10.1021/la100627z</a>
  bibtex: '@article{Medronho_Rodrigues_Miguel_Olsson_Schmidt_2010, title={Shear-Induced
    Defect Formation in a Nonionic Lamellar Phase}, volume={26}, DOI={<a href="https://doi.org/10.1021/la100627z">10.1021/la100627z</a>},
    number={13}, journal={Langmuir}, publisher={American Chemical Society (ACS)},
    author={Medronho, B. and Rodrigues, M. and Miguel, M. G. and Olsson, U. and Schmidt,
    Claudia}, year={2010}, pages={11304–11313} }'
  chicago: 'Medronho, B., M. Rodrigues, M. G. Miguel, U. Olsson, and Claudia Schmidt.
    “Shear-Induced Defect Formation in a Nonionic Lamellar Phase.” <i>Langmuir</i>
    26, no. 13 (2010): 11304–13. <a href="https://doi.org/10.1021/la100627z">https://doi.org/10.1021/la100627z</a>.'
  ieee: 'B. Medronho, M. Rodrigues, M. G. Miguel, U. Olsson, and C. Schmidt, “Shear-Induced
    Defect Formation in a Nonionic Lamellar Phase,” <i>Langmuir</i>, vol. 26, no.
    13, pp. 11304–11313, 2010, doi: <a href="https://doi.org/10.1021/la100627z">10.1021/la100627z</a>.'
  mla: Medronho, B., et al. “Shear-Induced Defect Formation in a Nonionic Lamellar
    Phase.” <i>Langmuir</i>, vol. 26, no. 13, American Chemical Society (ACS), 2010,
    pp. 11304–13, doi:<a href="https://doi.org/10.1021/la100627z">10.1021/la100627z</a>.
  short: B. Medronho, M. Rodrigues, M.G. Miguel, U. Olsson, C. Schmidt, Langmuir 26
    (2010) 11304–11313.
date_created: 2023-01-06T13:10:51Z
date_updated: 2023-01-07T11:28:41Z
department:
- _id: '2'
- _id: '315'
doi: 10.1021/la100627z
intvolume: '        26'
issue: '13'
keyword:
- Electrochemistry
- Spectroscopy
- Surfaces and Interfaces
- Condensed Matter Physics
- General Materials Science
language:
- iso: eng
page: 11304-11313
publication: Langmuir
publication_identifier:
  issn:
  - 0743-7463
  - 1520-5827
publication_status: published
publisher: American Chemical Society (ACS)
quality_controlled: '1'
status: public
title: Shear-Induced Defect Formation in a Nonionic Lamellar Phase
type: journal_article
user_id: '466'
volume: 26
year: '2010'
...
---
_id: '7993'
author:
- first_name: Karoline A.
  full_name: Piegdon, Karoline A.
  last_name: Piegdon
- first_name: Matthias
  full_name: Offer, Matthias
  last_name: Offer
- first_name: Axel
  full_name: Lorke, Axel
  last_name: Lorke
- first_name: Martin
  full_name: Urbanski, Martin
  last_name: Urbanski
- first_name: Andreas
  full_name: Hoischen, Andreas
  last_name: Hoischen
- first_name: Heinz-Siegfried
  full_name: Kitzerow, Heinz-Siegfried
  id: '254'
  last_name: Kitzerow
- first_name: Stefan
  full_name: Declair, Stefan
  last_name: Declair
- first_name: Jens
  full_name: Förstner, Jens
  last_name: Förstner
- first_name: Torsten
  full_name: Meier, Torsten
  last_name: Meier
- first_name: Dirk
  full_name: Reuter, Dirk
  id: '37763'
  last_name: Reuter
- first_name: Andreas D.
  full_name: Wieck, Andreas D.
  last_name: Wieck
- first_name: Cedrik
  full_name: Meier, Cedrik
  last_name: Meier
citation:
  ama: 'Piegdon KA, Offer M, Lorke A, et al. Self-assembled quantum dots in a liquid-crystal-tunable
    microdisk resonator. <i>Physica E: Low-dimensional Systems and Nanostructures</i>.
    2010;42(10):2552-2555. doi:<a href="https://doi.org/10.1016/j.physe.2009.12.051">10.1016/j.physe.2009.12.051</a>'
  apa: 'Piegdon, K. A., Offer, M., Lorke, A., Urbanski, M., Hoischen, A., Kitzerow,
    H.-S., Declair, S., Förstner, J., Meier, T., Reuter, D., Wieck, A. D., &#38; Meier,
    C. (2010). Self-assembled quantum dots in a liquid-crystal-tunable microdisk resonator.
    <i>Physica E: Low-Dimensional Systems and Nanostructures</i>, <i>42</i>(10), 2552–2555.
    <a href="https://doi.org/10.1016/j.physe.2009.12.051">https://doi.org/10.1016/j.physe.2009.12.051</a>'
  bibtex: '@article{Piegdon_Offer_Lorke_Urbanski_Hoischen_Kitzerow_Declair_Förstner_Meier_Reuter_et
    al._2010, title={Self-assembled quantum dots in a liquid-crystal-tunable microdisk
    resonator}, volume={42}, DOI={<a href="https://doi.org/10.1016/j.physe.2009.12.051">10.1016/j.physe.2009.12.051</a>},
    number={10}, journal={Physica E: Low-dimensional Systems and Nanostructures},
    publisher={Elsevier BV}, author={Piegdon, Karoline A. and Offer, Matthias and
    Lorke, Axel and Urbanski, Martin and Hoischen, Andreas and Kitzerow, Heinz-Siegfried
    and Declair, Stefan and Förstner, Jens and Meier, Torsten and Reuter, Dirk and
    et al.}, year={2010}, pages={2552–2555} }'
  chicago: 'Piegdon, Karoline A., Matthias Offer, Axel Lorke, Martin Urbanski, Andreas
    Hoischen, Heinz-Siegfried Kitzerow, Stefan Declair, et al. “Self-Assembled Quantum
    Dots in a Liquid-Crystal-Tunable Microdisk Resonator.” <i>Physica E: Low-Dimensional
    Systems and Nanostructures</i> 42, no. 10 (2010): 2552–55. <a href="https://doi.org/10.1016/j.physe.2009.12.051">https://doi.org/10.1016/j.physe.2009.12.051</a>.'
  ieee: 'K. A. Piegdon <i>et al.</i>, “Self-assembled quantum dots in a liquid-crystal-tunable
    microdisk resonator,” <i>Physica E: Low-dimensional Systems and Nanostructures</i>,
    vol. 42, no. 10, pp. 2552–2555, 2010, doi: <a href="https://doi.org/10.1016/j.physe.2009.12.051">10.1016/j.physe.2009.12.051</a>.'
  mla: 'Piegdon, Karoline A., et al. “Self-Assembled Quantum Dots in a Liquid-Crystal-Tunable
    Microdisk Resonator.” <i>Physica E: Low-Dimensional Systems and Nanostructures</i>,
    vol. 42, no. 10, Elsevier BV, 2010, pp. 2552–55, doi:<a href="https://doi.org/10.1016/j.physe.2009.12.051">10.1016/j.physe.2009.12.051</a>.'
  short: 'K.A. Piegdon, M. Offer, A. Lorke, M. Urbanski, A. Hoischen, H.-S. Kitzerow,
    S. Declair, J. Förstner, T. Meier, D. Reuter, A.D. Wieck, C. Meier, Physica E:
    Low-Dimensional Systems and Nanostructures 42 (2010) 2552–2555.'
date_created: 2019-02-21T14:43:30Z
date_updated: 2023-01-10T13:59:58Z
department:
- _id: '15'
- _id: '230'
- _id: '313'
doi: 10.1016/j.physe.2009.12.051
intvolume: '        42'
issue: '10'
language:
- iso: eng
page: 2552-2555
publication: 'Physica E: Low-dimensional Systems and Nanostructures'
publication_identifier:
  issn:
  - 1386-9477
publication_status: published
publisher: Elsevier BV
status: public
title: Self-assembled quantum dots in a liquid-crystal-tunable microdisk resonator
type: journal_article
user_id: '254'
volume: 42
year: '2010'
...
---
_id: '36036'
author:
- first_name: Kirsten
  full_name: Schlegel-Matthies, Kirsten
  id: '459'
  last_name: Schlegel-Matthies
citation:
  ama: 'Schlegel-Matthies K. Überschuldung - Bildungsbezogene Perspektive. In: Müller
    C, Schulz F, Thien U, eds. <i>Auf dem Weg zum Jugendintegrationskonzept. Grundlagen
    und Herausforderungen angesichts veränderter Lebenslagen junger Menschen</i>.
    Lit-Verlag; 2010:247-250.'
  apa: Schlegel-Matthies, K. (2010). Überschuldung - Bildungsbezogene Perspektive.
    In C. Müller, F. Schulz, &#38; U. Thien (Eds.), <i>Auf dem Weg zum Jugendintegrationskonzept.
    Grundlagen und Herausforderungen angesichts veränderter Lebenslagen junger Menschen</i>
    (pp. 247–250). Lit-Verlag.
  bibtex: '@inbook{Schlegel-Matthies_2010, place={Münster, Berlin}, title={Überschuldung
    - Bildungsbezogene Perspektive}, booktitle={Auf dem Weg zum Jugendintegrationskonzept.
    Grundlagen und Herausforderungen angesichts veränderter Lebenslagen junger Menschen},
    publisher={Lit-Verlag}, author={Schlegel-Matthies, Kirsten}, editor={Müller, Christine
    and Schulz, Franziska and Thien, Ulrich}, year={2010}, pages={247–250} }'
  chicago: 'Schlegel-Matthies, Kirsten. “Überschuldung - Bildungsbezogene Perspektive.”
    In <i>Auf dem Weg zum Jugendintegrationskonzept. Grundlagen und Herausforderungen
    angesichts veränderter Lebenslagen junger Menschen</i>, edited by Christine Müller,
    Franziska Schulz, and Ulrich Thien, 247–50. Münster, Berlin: Lit-Verlag, 2010.'
  ieee: 'K. Schlegel-Matthies, “Überschuldung - Bildungsbezogene Perspektive,” in
    <i>Auf dem Weg zum Jugendintegrationskonzept. Grundlagen und Herausforderungen
    angesichts veränderter Lebenslagen junger Menschen</i>, C. Müller, F. Schulz,
    and U. Thien, Eds. Münster, Berlin: Lit-Verlag, 2010, pp. 247–250.'
  mla: Schlegel-Matthies, Kirsten. “Überschuldung - Bildungsbezogene Perspektive.”
    <i>Auf dem Weg zum Jugendintegrationskonzept. Grundlagen und Herausforderungen
    angesichts veränderter Lebenslagen junger Menschen</i>, edited by Christine Müller
    et al., Lit-Verlag, 2010, pp. 247–50.
  short: 'K. Schlegel-Matthies, in: C. Müller, F. Schulz, U. Thien (Eds.), Auf dem
    Weg zum Jugendintegrationskonzept. Grundlagen und Herausforderungen angesichts
    veränderter Lebenslagen junger Menschen, Lit-Verlag, Münster, Berlin, 2010, pp.
    247–250.'
date_created: 2023-01-11T11:13:01Z
date_updated: 2023-01-11T11:25:57Z
department:
- _id: '35'
- _id: '17'
- _id: '22'
- _id: '396'
editor:
- first_name: Christine
  full_name: Müller, Christine
  last_name: Müller
- first_name: Franziska
  full_name: Schulz, Franziska
  last_name: Schulz
- first_name: Ulrich
  full_name: Thien, Ulrich
  last_name: Thien
language:
- iso: ger
page: 247 - 250
place: Münster, Berlin
publication: Auf dem Weg zum Jugendintegrationskonzept. Grundlagen und Herausforderungen
  angesichts veränderter Lebenslagen junger Menschen
publication_identifier:
  isbn:
  - '9783643105103'
publication_status: published
publisher: Lit-Verlag
status: public
title: Überschuldung - Bildungsbezogene Perspektive
type: book_chapter
user_id: '459'
year: '2010'
...
---
_id: '51034'
author:
- first_name: Christian
  full_name: Dux, Christian
  last_name: Dux
- first_name: Marco
  full_name: Klassen, Marco
  last_name: Klassen
- first_name: Marc
  full_name: Kukuk, Marc
  id: '290'
  last_name: Kukuk
- first_name: Udo
  full_name: Liebert, Udo
  last_name: Liebert
- first_name: Bennett
  full_name: Follmert, Bennett
  last_name: Follmert
citation:
  ama: Dux C, Klassen M, Kukuk M, Liebert U, Follmert B. Fördern im vertrauten Umfeld.
    <i>Der Handballschiedsrichter</i>. 2010;4:8-11.
  apa: Dux, C., Klassen, M., Kukuk, M., Liebert, U., &#38; Follmert, B. (2010). Fördern
    im vertrauten Umfeld. <i>Der Handballschiedsrichter</i>, <i>4</i>, 8–11.
  bibtex: '@article{Dux_Klassen_Kukuk_Liebert_Follmert_2010, title={Fördern im vertrauten
    Umfeld}, volume={4}, journal={Der Handballschiedsrichter}, author={Dux, Christian
    and Klassen, Marco and Kukuk, Marc and Liebert, Udo and Follmert, Bennett}, year={2010},
    pages={8–11} }'
  chicago: 'Dux, Christian, Marco Klassen, Marc Kukuk, Udo Liebert, and Bennett Follmert.
    “Fördern im vertrauten Umfeld.” <i>Der Handballschiedsrichter</i> 4 (2010): 8–11.'
  ieee: C. Dux, M. Klassen, M. Kukuk, U. Liebert, and B. Follmert, “Fördern im vertrauten
    Umfeld,” <i>Der Handballschiedsrichter</i>, vol. 4, pp. 8–11, 2010.
  mla: Dux, Christian, et al. “Fördern im vertrauten Umfeld.” <i>Der Handballschiedsrichter</i>,
    vol. 4, 2010, pp. 8–11.
  short: C. Dux, M. Klassen, M. Kukuk, U. Liebert, B. Follmert, Der Handballschiedsrichter
    4 (2010) 8–11.
date_created: 2024-01-30T13:20:03Z
date_updated: 2024-02-27T11:07:10Z
department:
- _id: '175'
intvolume: '         4'
language:
- iso: ger
page: 8-11
publication: Der Handballschiedsrichter
publication_status: published
status: public
title: Fördern im vertrauten Umfeld
type: journal_article
user_id: '290'
volume: 4
year: '2010'
...
---
_id: '54942'
abstract:
- lang: eng
  text: Loss-of-function mutations of the epithelial sodium channel (ENaC) may contribute
    to pulmonary symptoms resembling those of patients with atypical cystic fibrosis
    (CF). Recently, we identified a loss-of-function mutation in the alpha-subunit
    of ENaC (alphaF61L) in an atypical CF patient without mutations in CFTR. To investigate
    the functional effect of this mutation, we expressed human wild-type alpha beta
    gamma-ENaC or mutant alpha(F61L) beta gamma-ENaC in Xenopus laevis oocytes. The
    alphaF61L mutation reduced the ENaC mediated whole-cell currents by approximately
    90%. In contrast, the mutation decreased channel surface expression only by approximately
    40% and did not alter the single-channel conductance. These findings indicate
    that the major effect of the mutation is a reduction of the average channel open
    probability (P(o)). This was confirmed by experiments using the betaS520C mutant
    ENaC which can be converted to a channel with a P(o) of nearly one, and by experiments
    using chymotrypsin to proteolytically activate the channel. These experiments
    revealed that the mutation reduced the average P(o) of ENaC by approximately 75%.
    Na(+) self inhibition of the mutant channel was significantly enhanced, but the
    observed effect was too small to account for the large reduction in average channel
    P(o). The ENaC-activator S3969 partially rescued the loss-of-function phenotype
    of the alphaF61L mutation. We conclude that the alphaF61L mutation may contribute
    to respiratory symptoms in atypical CF patients.
author:
- first_name: Regina
  full_name: Huber, Regina
  last_name: Huber
- first_name: Bettina
  full_name: Krueger, Bettina
  id: '49428'
  last_name: Krueger
  orcid: 0000-0001-5351-1785
- first_name: Alexei
  full_name: Diakov, Alexei
  last_name: Diakov
- first_name: Judit
  full_name: Korbmacher, Judit
  last_name: Korbmacher
- first_name: Silke
  full_name: Haerteis, Silke
  last_name: Haerteis
- first_name: Jürgen
  full_name: Einsiedel, Jürgen
  last_name: Einsiedel
- first_name: Peter
  full_name: Gmeiner, Peter
  last_name: Gmeiner
- first_name: Abul
  full_name: Azad, Abul
  last_name: Azad
- first_name: Harry
  full_name: Cuppens, Harry
  last_name: Cuppens
- first_name: Jean-Jaques
  full_name: Cassiman, Jean-Jaques
  last_name: Cassiman
- first_name: Christoph
  full_name: Korbmacher, Christoph
  last_name: Korbmacher
- first_name: Robert
  full_name: Rauh, Robert
  last_name: Rauh
citation:
  ama: Huber R, Krueger B, Diakov A, et al. Functional Characterization of a Partial
    Loss-of-Function Mutation of the Epithelial Sodium Channel (ENaC) Associated with
    Atypical Cystic Fibrosis. <i>Cellular Physiology and Biochemistry</i>. 2010;25(001):145–158.
    doi:<a href="https://doi.org/10.1159/000272059">10.1159/000272059</a>
  apa: Huber, R., Krueger, B., Diakov, A., Korbmacher, J., Haerteis, S., Einsiedel,
    J., Gmeiner, P., Azad, A., Cuppens, H., Cassiman, J.-J., Korbmacher, C., &#38;
    Rauh, R. (2010). Functional Characterization of a Partial Loss-of-Function Mutation
    of the Epithelial Sodium Channel (ENaC) Associated with Atypical Cystic Fibrosis.
    <i>Cellular Physiology and Biochemistry</i>, <i>25</i>(001), 145–158. <a href="https://doi.org/10.1159/000272059">https://doi.org/10.1159/000272059</a>
  bibtex: '@article{Huber_Krueger_Diakov_Korbmacher_Haerteis_Einsiedel_Gmeiner_Azad_Cuppens_Cassiman_et
    al._2010, title={Functional Characterization of a Partial Loss-of-Function Mutation
    of the Epithelial Sodium Channel (ENaC) Associated with Atypical Cystic Fibrosis},
    volume={25}, DOI={<a href="https://doi.org/10.1159/000272059">10.1159/000272059</a>},
    number={001}, journal={Cellular Physiology and Biochemistry}, publisher={S. Karger
    AG}, author={Huber, Regina and Krueger, Bettina and Diakov, Alexei and Korbmacher,
    Judit and Haerteis, Silke and Einsiedel, Jürgen and Gmeiner, Peter and Azad, Abul
    and Cuppens, Harry and Cassiman, Jean-Jaques and et al.}, year={2010}, pages={145–158}
    }'
  chicago: 'Huber, Regina, Bettina Krueger, Alexei Diakov, Judit Korbmacher, Silke
    Haerteis, Jürgen Einsiedel, Peter Gmeiner, et al. “Functional Characterization
    of a Partial Loss-of-Function Mutation of the Epithelial Sodium Channel (ENaC)
    Associated with Atypical Cystic Fibrosis.” <i>Cellular Physiology and Biochemistry</i>
    25, no. 001 (2010): 145–158. <a href="https://doi.org/10.1159/000272059">https://doi.org/10.1159/000272059</a>.'
  ieee: 'R. Huber <i>et al.</i>, “Functional Characterization of a Partial Loss-of-Function
    Mutation of the Epithelial Sodium Channel (ENaC) Associated with Atypical Cystic
    Fibrosis,” <i>Cellular Physiology and Biochemistry</i>, vol. 25, no. 001, pp.
    145–158, 2010, doi: <a href="https://doi.org/10.1159/000272059">10.1159/000272059</a>.'
  mla: Huber, Regina, et al. “Functional Characterization of a Partial Loss-of-Function
    Mutation of the Epithelial Sodium Channel (ENaC) Associated with Atypical Cystic
    Fibrosis.” <i>Cellular Physiology and Biochemistry</i>, vol. 25, no. 001, S. Karger
    AG, 2010, pp. 145–158, doi:<a href="https://doi.org/10.1159/000272059">10.1159/000272059</a>.
  short: R. Huber, B. Krueger, A. Diakov, J. Korbmacher, S. Haerteis, J. Einsiedel,
    P. Gmeiner, A. Azad, H. Cuppens, J.-J. Cassiman, C. Korbmacher, R. Rauh, Cellular
    Physiology and Biochemistry 25 (2010) 145–158.
date_created: 2024-06-30T13:56:57Z
date_updated: 2024-06-30T13:57:07Z
department:
- _id: '35'
- _id: '22'
doi: 10.1159/000272059
intvolume: '        25'
issue: '001'
language:
- iso: eng
page: 145–158
publication: Cellular Physiology and Biochemistry
publisher: S. Karger AG
status: public
title: Functional Characterization of a Partial Loss-of-Function Mutation of the Epithelial
  Sodium Channel (ENaC) Associated with Atypical Cystic Fibrosis
type: journal_article
user_id: '49428'
volume: 25
year: '2010'
...
