TY - CONF AU - Senge, Robin AU - Hüllermeier, Eyke ID - 15119 T2 - in Proceedings WCCI-2010, World Congress on Computational Intelligence, Barcelona, Spain TI - Pattern trees for regression and fuzzy systems modeling ER - TY - JOUR AU - Pfeffer, P. AU - Fober, T. AU - Hüllermeier, Eyke AU - Klebe, G. ID - 16121 IS - 9 JF - Journal of Chemical Information and Modeling TI - GARLig: A fully automated tool for subset selection of large fragment spaces via a self-adaptive genetic algorithm VL - 50 ER - TY - JOUR AU - Hüllermeier, Eyke AU - Vanderlooy, S. ID - 16151 IS - 1 JF - Pattern Recognition TI - Combining predictions in pairwise classification: An optimal adaptive voting strategy and its relation to weighted voting VL - 43 ER - TY - JOUR AU - Hüllermeier, Eyke AU - Fürnkranz, J. ID - 16152 IS - 1 JF - Journal of Computer and System Sciences TI - On predictive accuracy and risk minimization in pairwise label ranking VL - 76 ER - TY - CONF AU - Dembczynski, K. AU - Cheng, W. AU - Hüllermeier, Eyke ED - Fürnkranz, J. ED - Joachims, T. ID - 13589 T2 - in Proceedings ICML-2010, 27th International Conference on Machine Learning, Haifa, Israel TI - Bayes optimal multilabel classification via probalistic classifier chains ER - TY - CONF AU - Cheng, W. AU - Dembczynski, K. AU - Hüllermeier, Eyke ED - Fürnkranz, J. ED - Joachims, T. ID - 13590 T2 - in Proceedings ICML-2010, 27th International Conference on Machine Learning, Haifa, Israel TI - Label ranking based on the Plackett-Luce model ER - TY - CONF AU - Cheng, W. AU - Dembczynski, K. AU - Hüllermeier, Eyke ED - Fürnkranz, J. ED - Joachims, T. ID - 13591 T2 - in Proceedings ICML-2010, 27th International Conference on Machine Learning, Haifa, Israel TI - Graded multi-label classification: The ordinal case ER - TY - CONF AU - Dembczynski, K. AU - Waegeman, W. AU - Cheng, W. AU - Hüllermeier, Eyke ID - 13593 T2 - In Proceedings ECML/PKDD-2010, European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, ,Bareclona, Spain TI - Regret analysis for performance metrics in multi-label classification: The case of Hamming and subset zero-one loss ER - TY - CONF AU - Cheng, W. AU - Rademaker, M. AU - De Beats, B. AU - Hüllermeier, Eyke ID - 13594 T2 - In Proceedings ECML/PKDD-2010, European Conference on Machine Learning and Principles and Practice of Knowledge Discovery in Databases, ,Bareclona, Spain TI - Predicting partial orders: Ranking with abstention ER - TY - CONF AU - Hüllermeier, Eyke ID - 13597 IS - LNCS T2 - in Proceedings SUM 2010, International Conference on Scalable Uncertainty Management TI - Uncertainty in clustering and classification VL - 6379 ER -