@inproceedings{13001, author = {{Wuertenberger, Armin and S. Tautermann, Christofer and Hellebrand, Sybille}}, booktitle = {{IEEE International Test Conference (ITC'04)}}, pages = {{926--935}}, publisher = {{IEEE}}, title = {{{Data Compression for Multiple Scan Chains Using Dictionaries with Corrections}}}, doi = {{10.1109/test.2004.1387357}}, year = {{2004}}, } @misc{13098, author = {{Breu, Ruth and Hellebrand, Sybille and Welzl, Michael}}, title = {{{Experiences from Teaching Software Development in a Java Environment}}}, year = {{2003}}, } @inproceedings{13002, author = {{Wuertenberger, Armin and S. Tautermann, Christofer and Hellebrand, Sybille}}, booktitle = {{IEEE International Test Conference (ITC'03)}}, pages = {{451--459}}, publisher = {{IEEE}}, title = {{{A Hybrid Coding Strategy for Optimized Test Data Compression}}}, doi = {{10.1109/test.2003.1270870}}, year = {{2003}}, } @misc{13097, author = {{Hellebrand, Sybille and Wuertenberger, Armin}}, keywords = {{WORKSHOP}}, title = {{{Alternating Run-Length Coding: A Technique for Improved Test Data Compression}}}, year = {{2002}}, } @article{13003, author = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim and A. Ivaniuk, Alexander and V. Klimets, Yuri and N. Yarmolik, Vyacheslav}}, journal = {{IEEE Transactions on Computers}}, number = {{7}}, pages = {{801--809}}, publisher = {{IEEE}}, title = {{{Efficient Online and Offline Testing of Embedded DRAMs}}}, doi = {{10.1109/tc.2002.1017700}}, volume = {{51}}, year = {{2002}}, } @article{13069, author = {{Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim}}, journal = {{Journal of Electronic Testing - Theory and Applications (JETTA)}}, number = {{2}}, pages = {{157--168}}, title = {{{Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST}}}, volume = {{18}}, year = {{2002}}, } @article{13070, author = {{Liang, Huaguo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}}, journal = {{Journal on Computer Science and Technology}}, number = {{2}}, pages = {{203--212}}, title = {{{A Mixed-Mode BIST Scheme Based on Folding Compression}}}, volume = {{17}}, year = {{2002}}, } @misc{13096, author = {{Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}}, keywords = {{WORKSHOP}}, title = {{{Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST}}}, year = {{2001}}, } @inproceedings{13004, author = {{Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}}, booktitle = {{IEEE International Test Conference (ITC'01)}}, pages = {{894--902}}, publisher = {{IEEE}}, title = {{{Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST}}}, doi = {{10.1109/test.2001.966712}}, year = {{2001}}, } @article{13047, author = {{Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}}, journal = {{Journal of Computer Research and Development, (Jisuanji Yanjiu yu Fazhan)}}, number = {{8}}, pages = {{931}}, title = {{{Deterministic BIST Scheme Based on Reseeding of Folding Counters}}}, volume = {{38}}, year = {{2001}}, } @article{13068, author = {{Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim}}, journal = {{Journal of Electronic Testing - Theory and Applications (JETTA)}}, number = {{3/4}}, pages = {{341--349}}, title = {{{A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters}}}, volume = {{17}}, year = {{2001}}, } @misc{13094, author = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim}}, title = {{{Hardwarepraktikum im Diplomstudiengang Informatik}}}, year = {{2000}}, } @misc{13095, author = {{Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim}}, keywords = {{WORKSHOP}}, title = {{{A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters}}}, year = {{2000}}, } @inproceedings{13005, author = {{Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim}}, booktitle = {{IEEE International Test Conference (ITC'00)}}, pages = {{778--784}}, publisher = {{IEEE}}, title = {{{A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters}}}, doi = {{10.1109/test.2000.894274}}, year = {{2000}}, } @book{13065, author = {{Hellebrand, Sybille}}, isbn = {{3257227892}}, publisher = {{Verlag Dr. Kovac, Hamburg}}, title = {{{Selbsttestbare Steuerwerke - Strukturen und Syntheseverfahren}}}, year = {{1999}}, } @misc{13093, author = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim and N. Yarmolik, Vyacheslav}}, keywords = {{WORKSHOP}}, title = {{{Exploiting Symmetries to Speed Up Transparent BIST}}}, year = {{1999}}, } @inproceedings{13006, author = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim and A. Ivaniuk, Alexander and V. Klimets, Yuri and N. Yarmolik, Vyacheslav}}, booktitle = {{17th IEEE VLSI Test Symposium (VTS'99)}}, pages = {{384--390}}, publisher = {{IEEE}}, title = {{{Error Detecting Refreshment for Embedded DRAMs}}}, doi = {{10.1109/vtest.1999.766693}}, year = {{1999}}, } @inproceedings{13066, author = {{N. Yarmolik, Vyacheslav and V. Bykov, Iuri and Hellebrand, Sybille and Wunderlich, Hans-Joachim}}, booktitle = {{Third European Dependable Computing Conference (EDCC-3)}}, title = {{{Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms}}}, year = {{1999}}, } @inproceedings{13067, author = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim and N. Yarmolik, Vyacheslav}}, booktitle = {{Design Automation and Test in Europe (DATE'99)}}, pages = {{702--707}}, title = {{{Symmetric Transparent BIST for RAMs}}}, year = {{1999}}, } @techreport{13029, author = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim}}, title = {{{Test und Synthese schneller eingebetteter Systeme}}}, year = {{1998}}, } @misc{13091, author = {{N. Yarmolik, Vyacheslav and Hellebrand, Sybille and Wunderlich, Hans-Joachim}}, keywords = {{WORKSHOP}}, title = {{{Efficient Consistency Checking for Embedded Memories}}}, year = {{1998}}, } @misc{13092, author = {{N. Yarmolik, Vyacheslav and Hellebrand, Sybille and Wunderlich, Hans-Joachim}}, keywords = {{WORKSHOP}}, title = {{{Efficient Consistency Checking for Embedded Memories}}}, year = {{1998}}, } @inbook{13060, author = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre}}, booktitle = {{Mixed-Mode BIST Using Embedded Processors}}, publisher = {{Kluwer Academic Publishers}}, title = {{{Mixed-Mode BIST Using Embedded Processors}}}, year = {{1998}}, } @article{13061, author = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre}}, journal = {{Journal of Electronic Testing Theory and Applications - JETTA}}, number = {{1/2}}, pages = {{127--138}}, title = {{{Mixed-Mode BIST Using Embedded Processors}}}, volume = {{12}}, year = {{1998}}, } @article{13064, author = {{Hellebrand, Sybille and Hertwig, Andre and Wunderlich, Hans-Joachim}}, journal = {{IEEE Design and Test}}, number = {{4}}, pages = {{36--41}}, publisher = {{IEEE}}, title = {{{Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications}}}, volume = {{15}}, year = {{1998}}, } @inproceedings{13007, author = {{Hertwig, Andre and Hellebrand, Sybille and Wunderlich, Hans-Joachim}}, booktitle = {{16th IEEE VLSI Test Symposium (VTS'98)}}, pages = {{296--302}}, publisher = {{IEEE}}, title = {{{Fast Self-Recovering Controllers}}}, doi = {{10.1109/vtest.1998.670883}}, year = {{1998}}, } @inproceedings{13008, author = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim and N. Yarmolik, Vyacheslav}}, booktitle = {{Design Automation and Test in Europe (DATE'98)}}, pages = {{173--179}}, title = {{{Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs}}}, doi = {{10.1109/date.1998.655853}}, year = {{1998}}, } @inproceedings{13063, author = {{N. Yarmolik, Vyacheslav and V. Klimets, Yuri and Hellebrand, Sybille and Wunderlich, Hans-Joachim}}, booktitle = {{Design & Diagnostics of Electronic Circuits & Systems (DDECS'98)}}, pages = {{27--33}}, title = {{{New Transparent RAM BIST Based on Self-Adjusting Output Data Compression}}}, year = {{1998}}, } @misc{13089, author = {{Tsai, Kun-Han and Hellebrand, Sybille and Rajski, Janusz and Marek-Sadowska, Malgorzata}}, keywords = {{WORKSHOP}}, title = {{{STARBIST: Scan Autocorrelated Random Pattern Generation}}}, year = {{1997}}, } @misc{13090, author = {{Hertwig, Andre and Hellebrand, Sybille and Wunderlich, Hans-Joachim}}, keywords = {{WORKSHOP}}, title = {{{Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications}}}, year = {{1997}}, } @inproceedings{13009, author = {{Tsai, Kun-Han and Hellebrand, Sybille and Marek-Sadowska, Malgorzata and Rajski, Janusz}}, booktitle = {{34th ACM/IEEE Design Automation Conference (DAC'97)}}, publisher = {{IEEE}}, title = {{{STARBIST: Scan Autocorrelated Random Pattern Generation}}}, doi = {{10.1109/dac.1997.597194}}, year = {{1997}}, } @misc{13087, author = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim}}, keywords = {{WORKSHOP}}, title = {{{Using Embedded Processors for BIST}}}, year = {{1996}}, } @misc{13088, author = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre}}, keywords = {{WORKSHOP}}, title = {{{Mixed-Mode BIST Using Embedded Processors}}}, year = {{1996}}, } @inproceedings{13010, author = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre}}, booktitle = {{IEEE International Test Conference (ITC'96)}}, pages = {{195--204}}, publisher = {{IEEE}}, title = {{{Mixed-Mode BIST Using Embedded Processors}}}, doi = {{10.1109/test.1996.556962}}, year = {{1996}}, } @techreport{13026, author = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim}}, title = {{{Synthesis Procedures for Self-Testable Controllers}}}, year = {{1995}}, } @techreport{13027, author = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim and Goncalves, F. and Paulo Teixeira, Joao}}, title = {{{Evaluation of Self-Testable Controller Architectures Based on Realistic Fault Analysis}}}, year = {{1995}}, } @techreport{13028, author = {{Hellebrand, Sybille and Herzog, Maik and Wunderlich, Hans-Joachim}}, title = {{{Partitioning of CMOS-Circuits for On-Chip IDDQ-Testing}}}, year = {{1995}}, } @misc{13086, author = {{Hellebrand, Sybille and Reeb, Birgit and Tarnick, Steffen and Wunderlich, Hans-Joachim}}, keywords = {{WORKSHOP}}, title = {{{Pattern Generation for a Deterministic BIST Scheme}}}, year = {{1995}}, } @article{13011, author = {{Hellebrand, Sybille and Rajski, Janusz and Tarnick, Steffen and Venkataraman, Srikanth and Courtois, B.}}, journal = {{IEEE Transactions on Computers}}, number = {{2}}, pages = {{223--233}}, publisher = {{IEEE}}, title = {{{Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers}}}, doi = {{10.1109/12.364534}}, volume = {{44}}, year = {{1995}}, } @inproceedings{13012, author = {{Hellebrand, Sybille and Reeb, Birgit and Tarnick, Steffen and Wunderlich, Hans-Joachim}}, booktitle = {{ACM/IEEE International Conference on Computer Aided Design (ICCAD'95)}}, pages = {{88--94}}, publisher = {{IEEE}}, title = {{{Pattern Generation for a Deterministic BIST Scheme}}}, doi = {{10.1109/iccad.1995.479997}}, year = {{1995}}, } @techreport{13024, author = {{Hellebrand, Sybille and Juergensen, Arne and Wunderlich, Hans-Joachim}}, title = {{{Synthesis for Off-line Testability}}}, year = {{1994}}, } @techreport{13025, author = {{Hellebrand, Sybille and Juergensen, Arne and Stroele, Albrecht and Wunderlich, Hans-Joachim}}, title = {{{Chip Level Test Planning for Controlling the Tradeoff between Hardware Overhead and Test Time}}}, year = {{1994}}, } @misc{13083, author = {{Venkataraman, Srikanth and Rajski, Janusz and Hellebrand, Sybille and Tarnick, Steffen}}, keywords = {{WORKSHOP}}, title = {{{Effiziente Testsatzkodierung für Prüfpfad-basierte Selbsttestarchitekturen}}}, year = {{1994}}, } @misc{13084, author = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim}}, keywords = {{WORKSHOP}}, title = {{{Ein Verfahren zur testfreundlichen Steuerwerkssynthese}}}, year = {{1994}}, } @misc{13085, author = {{Hellebrand, Sybille and Paulo Teixeira, Joao and Wunderlich, Hans-Joachim}}, keywords = {{WORKSHOP}}, title = {{{Synthesis for Testability - the ARCHIMEDES Approach}}}, year = {{1994}}, } @inproceedings{13014, author = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim}}, booktitle = {{ACM/IEEE International Conference on Computer-Aided Design (ICCAD'94)}}, pages = {{110--116}}, publisher = {{IEEE}}, title = {{{An Efficient Procedure for the Synthesis of Fast Self-Testable Controller Structures}}}, doi = {{10.1109/iccad.1994.629752}}, year = {{1994}}, } @inproceedings{13059, author = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim}}, booktitle = {{Tagungsband der GI/GME/ITG-Fachtagung \& Rechnergestützter Entwurf und Architektur mikroelektronischer Systeme}}, pages = {{3--11}}, title = {{{Synthese schneller selbsttestbarer Steuerwerke}}}, year = {{1994}}, } @inproceedings{13013, author = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim}}, booktitle = {{European Design and Test Conference (EDAC/ETC/EUROASIC)}}, pages = {{580--585}}, title = {{{Synthesis of Self-Testable Controllers}}}, doi = {{10.1109/edtc.1994.326815}}, year = {{1994}}, } @misc{13081, author = {{Hellebrand, Sybille and Tarnick, Steffen and Rajski, Janusz and Courtois, Bernard}}, keywords = {{WORKSHOP}}, title = {{{Effiziente Erzeugung deterministischer Muster im Selbsttest}}}, year = {{1993}}, } @misc{13082, author = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim}}, keywords = {{WORKSHOP}}, title = {{{Synthesis of Self-Testable Controllers}}}, year = {{1993}}, }