@article{13070,
  author       = {{Liang, Huaguo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  journal      = {{Journal on Computer Science and Technology}},
  number       = {{2}},
  pages        = {{203--212}},
  title        = {{{A Mixed-Mode BIST Scheme Based on Folding Compression}}},
  volume       = {{17}},
  year         = {{2002}},
}

@misc{13096,
  author       = {{Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  keywords     = {{WORKSHOP}},
  title        = {{{Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST}}},
  year         = {{2001}},
}

@inproceedings{13004,
  author       = {{Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  booktitle    = {{IEEE International Test Conference (ITC'01)}},
  pages        = {{894--902}},
  publisher    = {{IEEE}},
  title        = {{{Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST}}},
  doi          = {{10.1109/test.2001.966712}},
  year         = {{2001}},
}

@article{13047,
  author       = {{Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  journal      = {{Journal of Computer Research and Development, (Jisuanji Yanjiu yu Fazhan)}},
  number       = {{8}},
  pages        = {{931}},
  title        = {{{Deterministic BIST Scheme Based on Reseeding of Folding Counters}}},
  volume       = {{38}},
  year         = {{2001}},
}

@article{13068,
  author       = {{Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim}},
  journal      = {{Journal of Electronic Testing - Theory and Applications (JETTA)}},
  number       = {{3/4}},
  pages        = {{341--349}},
  title        = {{{A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters}}},
  volume       = {{17}},
  year         = {{2001}},
}

@misc{13094,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  title        = {{{Hardwarepraktikum im Diplomstudiengang Informatik}}},
  year         = {{2000}},
}

@misc{13095,
  author       = {{Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim}},
  keywords     = {{WORKSHOP}},
  title        = {{{A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters}}},
  year         = {{2000}},
}

@inproceedings{13005,
  author       = {{Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim}},
  booktitle    = {{IEEE International Test Conference (ITC'00)}},
  pages        = {{778--784}},
  publisher    = {{IEEE}},
  title        = {{{A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters}}},
  doi          = {{10.1109/test.2000.894274}},
  year         = {{2000}},
}

@book{13065,
  author       = {{Hellebrand, Sybille}},
  isbn         = {{3257227892}},
  publisher    = {{Verlag Dr. Kovac, Hamburg}},
  title        = {{{Selbsttestbare Steuerwerke - Strukturen und Syntheseverfahren}}},
  year         = {{1999}},
}

@misc{13093,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim and N. Yarmolik, Vyacheslav}},
  keywords     = {{WORKSHOP}},
  title        = {{{Exploiting Symmetries to Speed Up Transparent BIST}}},
  year         = {{1999}},
}

@inproceedings{13006,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim and A. Ivaniuk, Alexander and V. Klimets, Yuri and N. Yarmolik, Vyacheslav}},
  booktitle    = {{17th IEEE VLSI Test Symposium (VTS'99)}},
  pages        = {{384--390}},
  publisher    = {{IEEE}},
  title        = {{{Error Detecting Refreshment for Embedded DRAMs}}},
  doi          = {{10.1109/vtest.1999.766693}},
  year         = {{1999}},
}

@inproceedings{13066,
  author       = {{N. Yarmolik, Vyacheslav and V. Bykov, Iuri and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  booktitle    = {{Third European Dependable Computing Conference (EDCC-3)}},
  title        = {{{Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms}}},
  year         = {{1999}},
}

@inproceedings{13067,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim and N. Yarmolik, Vyacheslav}},
  booktitle    = {{Design Automation and Test in Europe (DATE'99)}},
  pages        = {{702--707}},
  title        = {{{Symmetric Transparent BIST for RAMs}}},
  year         = {{1999}},
}

@techreport{13029,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  title        = {{{Test und Synthese schneller eingebetteter Systeme}}},
  year         = {{1998}},
}

@misc{13091,
  author       = {{N. Yarmolik, Vyacheslav and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  keywords     = {{WORKSHOP}},
  title        = {{{Efficient Consistency Checking for Embedded Memories}}},
  year         = {{1998}},
}

@misc{13092,
  author       = {{N. Yarmolik, Vyacheslav and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  keywords     = {{WORKSHOP}},
  title        = {{{Efficient Consistency Checking for Embedded Memories}}},
  year         = {{1998}},
}

@inbook{13060,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre}},
  booktitle    = {{Mixed-Mode BIST Using Embedded Processors}},
  publisher    = {{Kluwer Academic Publishers}},
  title        = {{{Mixed-Mode BIST Using Embedded Processors}}},
  year         = {{1998}},
}

@article{13061,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim and Hertwig, Andre}},
  journal      = {{Journal of Electronic Testing Theory and Applications - JETTA}},
  number       = {{1/2}},
  pages        = {{127--138}},
  title        = {{{Mixed-Mode BIST Using Embedded Processors}}},
  volume       = {{12}},
  year         = {{1998}},
}

@article{13064,
  author       = {{Hellebrand, Sybille and Hertwig, Andre and Wunderlich, Hans-Joachim}},
  journal      = {{IEEE Design and Test}},
  number       = {{4}},
  pages        = {{36--41}},
  publisher    = {{IEEE}},
  title        = {{{Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications}}},
  volume       = {{15}},
  year         = {{1998}},
}

@inproceedings{13007,
  author       = {{Hertwig, Andre and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  booktitle    = {{16th IEEE VLSI Test Symposium (VTS'98)}},
  pages        = {{296--302}},
  publisher    = {{IEEE}},
  title        = {{{Fast Self-Recovering Controllers}}},
  doi          = {{10.1109/vtest.1998.670883}},
  year         = {{1998}},
}