@inproceedings{12977, author = {{Hellebrand, Sybille and Indlekofer, Thomas and Kampmann, Matthias and A. Kochte, Michael and Liu, Chang and Wunderlich, Hans-Joachim}}, booktitle = {{IEEE International Test Conference (ITC'14)}}, publisher = {{IEEE}}, title = {{{FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects}}}, doi = {{10.1109/test.2014.7035360}}, year = {{2014}}, } @article{13054, author = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim}}, journal = {{DeGruyter Journal on Information Technology (it)}}, number = {{4}}, pages = {{165--172}}, publisher = {{DeGruyter}}, title = {{{SAT-Based ATPG beyond Stuck-at Fault Testing}}}, volume = {{56}}, year = {{2014}}, } @article{13055, author = {{Rodriguez Gomez, Laura and Cook, Alejandro and Indlekofer, Thomas and Hellebrand, Sybille and Wunderlich, Hans-Joachim}}, journal = {{Journal of Electronic Testing - Theory and Applications (JETTA)}}, number = {{5}}, pages = {{527--540}}, publisher = {{Springer}}, title = {{{Adaptive Bayesian Diagnosis of Intermittent Faults}}}, volume = {{30}}, year = {{2014}}, } @article{46266, author = {{Alizadeh, Bijan and Behnam, Payman and Sadeghi-Kohan, Somayeh}}, issn = {{0018-9340}}, journal = {{IEEE Transactions on Computers}}, keywords = {{Computational Theory and Mathematics, Hardware and Architecture, Theoretical Computer Science, Software}}, pages = {{1--1}}, publisher = {{Institute of Electrical and Electronics Engineers (IEEE)}}, title = {{{A Scalable Formal Debugging Approach with Auto-Correction Capability based on Static Slicing and Dynamic Ranking for RTL Datapath Designs}}}, doi = {{10.1109/tc.2014.2329687}}, year = {{2014}}, } @inproceedings{46268, author = {{Mohammadi, Marzieh and Sadeghi-Kohan, Somayeh and Masoumi, Nasser and Navabi, Zainalabedin}}, booktitle = {{2014 19th IEEE European Test Symposium (ETS)}}, publisher = {{IEEE}}, title = {{{An off-line MDSI interconnect BIST incorporated in BS 1149.1}}}, doi = {{10.1109/ets.2014.6847847}}, year = {{2014}}, } @inproceedings{46267, author = {{Sadeghi-Kohan, Somayeh and Behnam, Payman and Alizadeh, Bijan and Fujita, Masahiro and Navabi, Zainalabedin}}, booktitle = {{2014 19th IEEE European Test Symposium (ETS)}}, publisher = {{IEEE}}, title = {{{Improving polynomial datapath debugging with HEDs}}}, doi = {{10.1109/ets.2014.6847797}}, year = {{2014}}, } @inproceedings{12979, author = {{Hellebrand, Sybille}}, booktitle = {{14th IEEE Latin American Test Workshop - (LATW'13)}}, publisher = {{IEEE}}, title = {{{Analyzing and Quantifying Fault Tolerance Properties}}}, doi = {{10.1109/latw.2013.6562662}}, year = {{2013}}, } @misc{13075, author = {{Cook, Alejandro and Rodriguez Gomez, Laura and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}}, keywords = {{WORKSHOP}}, title = {{{Adaptive Test and Diagnosis of Intermittent Faults}}}, year = {{2013}}, } @inproceedings{46271, author = {{Sadeghi-Kohan, Somayeh and Namaki-Shoushtari, Majid and Javaheri, Fatemeh and Navabi, Zainalabedin}}, booktitle = {{2012 IEEE International Test Conference}}, publisher = {{IEEE}}, title = {{{BS 1149.1 extensions for an online interconnect fault detection and recovery}}}, doi = {{10.1109/test.2012.6401583}}, year = {{2013}}, } @inproceedings{46270, author = {{Sadeghi-Kohan, Somayeh and Keshavarz, Shahrzad and Zokaee, Farzaneh and Farahmandi, Farimah and Navabi, Zainalabedin}}, booktitle = {{East-West Design & Test Symposium (EWDTS 2013)}}, publisher = {{IEEE}}, title = {{{A new structure for interconnect offline testing}}}, doi = {{10.1109/ewdts.2013.6673207}}, year = {{2013}}, } @inproceedings{12980, author = {{Cook, Alejandro and Hellebrand, Sybille and E. Imhof, Michael and Mumtaz, Abdullah and Wunderlich, Hans-Joachim}}, booktitle = {{13th IEEE Latin American Test Workshop (LATW'12)}}, pages = {{1--4}}, publisher = {{IEEE}}, title = {{{Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test}}}, doi = {{10.1109/latw.2012.6261229}}, year = {{2012}}, } @inproceedings{12981, author = {{Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim}}, booktitle = {{17th IEEE European Test Symposium (ETS'12)}}, pages = {{1--6}}, publisher = {{IEEE}}, title = {{{Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test}}}, doi = {{10.1109/ets.2012.6233025}}, year = {{2012}}, } @misc{13074, author = {{Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim}}, keywords = {{WORKSHOP}}, title = {{{Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern}}}, year = {{2012}}, } @inproceedings{12982, author = {{Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}}, booktitle = {{20th IEEE Asian Test Symposium (ATS'11)}}, pages = {{285--290}}, publisher = {{IEEE}}, title = {{{Diagnostic Test of Robust Circuits}}}, doi = {{10.1109/ats.2011.55}}, year = {{2011}}, } @inproceedings{12984, author = {{Polian, Ilia and Becker, Bernd and Hellebrand, Sybille and Wunderlich, Hans-Joachim and Maxwell, Peter}}, booktitle = {{16th IEEE European Test Symposium Trondheim (ETS'11)}}, publisher = {{IEEE}}, title = {{{Towards Variation-Aware Test Methods}}}, doi = {{10.1109/ets.2011.51}}, year = {{2011}}, } @inproceedings{13053, author = {{Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}}, booktitle = {{5. GMM/GI/ITG Fachtagung "Zuverlässigkeit und Entwurf"}}, pages = {{48--53}}, title = {{{Robuster Selbsttest mit Diagnose}}}, year = {{2011}}, } @article{13052, author = {{Hopsch, Fabian and Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}}, journal = {{SCIENCE CHINA Information Sciences, Science China Press, co-published with Springer}}, number = {{4}}, pages = {{1813--1826}}, title = {{{Variation-Aware Fault Modeling}}}, volume = {{54}}, year = {{2011}}, } @inproceedings{46272, author = {{Kamran, Arezoo and Nemati, Nastaran and Sadeghi-Kohan, Somayeh and Navabi, Zainalabedin}}, booktitle = {{2010 East-West Design & Test Symposium (EWDTS)}}, publisher = {{IEEE}}, title = {{{Virtual tester development using HDL/PLI}}}, doi = {{10.1109/ewdts.2010.5742156}}, year = {{2011}}, } @misc{10670, author = {{Fröse, Viktor and Ibers, Rüdiger and Hellebrand, Sybille}}, keywords = {{WORKSHOP}}, title = {{{Testdatenkompression mit Hilfe der Netzwerkinfrastruktur}}}, year = {{2010}}, } @inproceedings{12987, author = {{Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}}, booktitle = {{40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W'10)}}, publisher = {{IEEE}}, title = {{{Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits}}}, doi = {{10.1109/dsnw.2010.5542612}}, year = {{2010}}, }