@inproceedings{13049,
  author       = {{Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}},
  booktitle    = {{4th Workshop on Dependable and Secure Nanocomputing (WDSN'10), (Invited Paper)}},
  title        = {{{Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits}}},
  year         = {{2010}},
}

@inproceedings{13050,
  author       = {{Indlekofer, Thomas and Schnittger, Michael and Hellebrand, Sybille}},
  booktitle    = {{4. GMM/GI/ITG-Fachtagung "Zuverlässigkeit und Entwurf"}},
  pages        = {{17--24}},
  title        = {{{Robuster Selbsttest mit extremer Kompaktierung}}},
  year         = {{2010}},
}

@inproceedings{12991,
  author       = {{Hunger, Marc and Hellebrand, Sybille and Czutro, Alejandro and Polian, Ilia and Becker, Bernd}},
  booktitle    = {{15th IEEE International On-Line Testing Symposium (IOLTS'09}},
  publisher    = {{IEEE}},
  title        = {{{ATPG-Based Grading of Strong Fault-Secureness}}},
  doi          = {{10.1109/iolts.2009.5196027}},
  year         = {{2009}},
}

@inproceedings{12990,
  author       = {{Hellebrand, Sybille and Hunger, Marc}},
  booktitle    = {{24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'09), (Invited Talk)}},
  pages        = {{77}},
  publisher    = {{IEEE}},
  title        = {{{Are Robust Circuits Really Robust?}}},
  doi          = {{10.1109/dft.2009.28}},
  year         = {{2009}},
}

@inproceedings{13030,
  author       = {{Hunger, Marc and Hellebrand, Sybille and Czutro, Alexander and Polian, Ilia and Becker, Bernd}},
  booktitle    = {{3. GMM/GI/ITG-Fachtagung "Zuverlässigkeit und Entwurf"}},
  title        = {{{Robustheitsanalyse stark fehlersicherer Schaltungen mit SAT-basierter Testmustererzeugung}}},
  year         = {{2009}},
}

@misc{13033,
  author       = {{Coym, Torsten and Hellebrand, Sybille and Ludwig, Stefan and Straube, Bernd and Wunderlich, Hans-Joachim and G. Zoellin, Christian}},
  keywords     = {{WORKSHOP}},
  title        = {{{Ein verfeinertes elektrisches Modell für Teilchentreffer und dessen Auswirkung auf die Bewertung der Schaltungsempfindlichkeit}}},
  year         = {{2008}},
}

@misc{13035,
  author       = {{Amgalan, Uranmandakh and Hachmann, Christian and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  keywords     = {{WORKSHOP}},
  title        = {{{Testen mit Rücksetzpunkten - ein Ansatz zur Verbesserung der Ausbeute bei robusten Schaltungen}}},
  year         = {{2008}},
}

@inproceedings{12992,
  author       = {{Oehler, Philipp and Bosio, Alberto and di Natale, Giorgio and Hellebrand, Sybille}},
  booktitle    = {{14th IEEE International On-Line Testing Symposium (IOLTS'08), (Poster)}},
  publisher    = {{IEEE}},
  title        = {{{A Modular Memory BIST for Optimized Memory Repair}}},
  doi          = {{10.1109/iolts.2008.30}},
  year         = {{2008}},
}

@inproceedings{12994,
  author       = {{Amgalan, Uranmandakh and Hachmann, Christian and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  booktitle    = {{26th IEEE VLSI Test Symposium (VTS'08)}},
  pages        = {{125--130}},
  publisher    = {{IEEE}},
  title        = {{{Signature Rollback - A Technique for Testing Robust Circuits}}},
  doi          = {{10.1109/vts.2008.34}},
  year         = {{2008}},
}

@inproceedings{12993,
  author       = {{Hunger, Marc and Hellebrand, Sybille}},
  booktitle    = {{14th IEEE International On-Line Testing Symposium (IOLTS'08)}},
  publisher    = {{IEEE}},
  title        = {{{Verification and Analysis of Self-Checking Properties through ATPG}}},
  doi          = {{10.1109/iolts.2008.32}},
  year         = {{2008}},
}

@inproceedings{13031,
  author       = {{Hunger, Marc and Hellebrand, Sybille}},
  booktitle    = {{2. GMM/GI/ITG-Fachtagung "Zuverlässigkeit und Entwurf"}},
  title        = {{{Analyse selbstprüfender Schaltungen – Nachweis von Fehlersicherheit und Selbsttestbarkeit mit ATPG}}},
  year         = {{2008}},
}

@inproceedings{13032,
  author       = {{Oehler, Philipp and Bosio, Alberto and Di Natale, Giorgio and Hellebrand, Sybille}},
  booktitle    = {{2. GMM/GI/ITG-Fachtagung "Zuverlässigkeit und Entwurf"}},
  title        = {{{Modularer Selbsttest und optimierte Reparaturanalyse}}},
  year         = {{2008}},
}

@misc{13038,
  author       = {{Hellebrand, Sybille}},
  keywords     = {{WORKSHOP}},
  title        = {{{Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing}}},
  year         = {{2007}},
}

@misc{13039,
  author       = {{Ali, Muhammad and Welzl, Michael and Hessler, Sven and Hellebrand, Sybille}},
  keywords     = {{WORKSHOP}},
  title        = {{{An End-to-End Reliability Protocol to Address Transient Faults in Network on Chips}}},
  year         = {{2007}},
}

@misc{13042,
  author       = {{Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  keywords     = {{WORKSHOP}},
  title        = {{{An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy}}},
  year         = {{2007}},
}

@misc{13043,
  author       = {{Hellebrand, Sybille}},
  title        = {{{Qualitätssicherung für Nanochips - Wie IT-Produkte zuverlässig werden}}},
  year         = {{2007}},
}

@inproceedings{12995,
  author       = {{Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}},
  booktitle    = {{22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT'07)}},
  pages        = {{50--58}},
  publisher    = {{IEEE}},
  title        = {{{A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction}}},
  doi          = {{10.1109/dft.2007.43}},
  year         = {{2007}},
}

@inproceedings{12996,
  author       = {{Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  booktitle    = {{10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS'07)}},
  pages        = {{185--190}},
  publisher    = {{IEEE}},
  title        = {{{Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair}}},
  doi          = {{10.1109/ddecs.2007.4295278}},
  year         = {{2007}},
}

@inproceedings{12997,
  author       = {{Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim}},
  booktitle    = {{12th IEEE European Test Symposium (ETS'07)}},
  pages        = {{91--96}},
  publisher    = {{IEEE}},
  title        = {{{An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy}}},
  doi          = {{10.1109/ets.2007.10}},
  year         = {{2007}},
}

@inproceedings{13037,
  author       = {{Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}},
  booktitle    = {{43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM'07), (Invited Paper)}},
  title        = {{{Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance}}},
  year         = {{2007}},
}