@article{13036,
  author       = {{Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}},
  journal      = {{Informacije MIDEM, Ljubljana (Invited Paper)}},
  number       = {{4 (124)}},
  pages        = {{212--219}},
  title        = {{{Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance}}},
  volume       = {{37}},
  year         = {{2007}},
}

@article{13044,
  author       = {{Ali, Muhammad and Hessler, Sven and Welzl, Michael and Hellebrand, Sybille}},
  journal      = {{International Journal on High Performance Systems Architecture}},
  number       = {{2}},
  pages        = {{113--123}},
  title        = {{{An Efficient Fault Tolerant Mechanism to Deal with Permanent and Transient Failures in a Network on Chip}}},
  volume       = {{1}},
  year         = {{2007}},
}

@inproceedings{13040,
  author       = {{Ali, Muhammad and Welzl, Michael and Hessler, Sven and Hellebrand, Sybille}},
  booktitle    = {{4th International Conference on Information Technology: New Generations (ITNG'07)}},
  pages        = {{1027--1032}},
  title        = {{{A Fault Tolerant Mechanism for Handling Permanent and Transient Failures in a Network on Chip}}},
  year         = {{2007}},
}

@inproceedings{13041,
  author       = {{Becker, Bernd and Polian, Ilia and Hellebrand, Sybille and Straube, Bernd and Wunderlich, Hans-Joachim}},
  booktitle    = {{1. GMM/GI/ITG-Fachtagung "Zuverlässigkeit und Entwurf"}},
  title        = {{{Test und Zuverlässigkeit nanoelektronischer Systeme}}},
  year         = {{2007}},
}

@article{13045,
  author       = {{Becker, Bernd and Polian, Ilia and Hellebrand, Sybille and Straube, Bernd and Wunderlich, Hans-Joachim}},
  journal      = {{it - Information Technology}},
  number       = {{5}},
  pages        = {{305--311}},
  title        = {{{DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme}}},
  volume       = {{48}},
  year         = {{2006}},
}

@misc{13046,
  author       = {{Oehler, Philipp and Hellebrand, Sybille}},
  keywords     = {{WORKSHOP}},
  title        = {{{A Low Power Design for Embedded DRAMs with Online Consistency Checking}}},
  year         = {{2005}},
}

@misc{13101,
  author       = {{Ali, Muhammad and Welzl, Michael and Hellebrand, Sybille}},
  keywords     = {{WORKSHOP}},
  title        = {{{Dynamic Routing: A Prerequisite for Reliable NoCs}}},
  year         = {{2005}},
}

@misc{13102,
  author       = {{Oehler, Philipp and Hellebrand, Sybille}},
  keywords     = {{WORKSHOP}},
  title        = {{{Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study}}},
  year         = {{2005}},
}

@inproceedings{12999,
  author       = {{Ali, Muhammad and Welzl, Michael and Zwicknagl, Martin and Hellebrand, Sybille}},
  booktitle    = {{IEEE International Conference on Microelectronics (ICM'05)}},
  publisher    = {{IEEE}},
  title        = {{{Considerations for Fault-Tolerant Networks on Chips}}},
  doi          = {{10.1109/icm.2005.1590063}},
  year         = {{2005}},
}

@inproceedings{13000,
  author       = {{Oehler, Philipp and Hellebrand, Sybille}},
  booktitle    = {{10th IEEE European Test Symposium (ETS'05)}},
  pages        = {{148--153}},
  publisher    = {{IEEE}},
  title        = {{{Low Power Embedded DRAMs with High Quality Error Correcting Capabilities}}},
  doi          = {{10.1109/ets.2005.28}},
  year         = {{2005}},
}

@inproceedings{12998,
  author       = {{Ali, Muhammad and Welzl, Michael and Hellebrand, Sybille}},
  booktitle    = {{23rd IEEE NORCHIP Conference}},
  pages        = {{70--73}},
  publisher    = {{IEEE}},
  title        = {{{A Dynamic Routing Mechanism for Network on Chip}}},
  doi          = {{10.1109/norchp.2005.1596991}},
  year         = {{2005}},
}

@inproceedings{13071,
  author       = {{Liu Jing, Michelle and Ruehrup, Stefan and Schindelhauer, Christian and Volbert, Klaus and Dierkes, Martin and Bellgardt, Andreas and Ibers, Rüdiger and Hilleringmann, Ulrich}},
  booktitle    = {{{GOR/NGB Conference Tilburg 2004}}},
  title        = {{{Sensor Networks with More Features Using Less Hardware}}},
  year         = {{2004}},
}

@misc{13099,
  author       = {{Breu, Ruth and Fahringer, Thomas and Fensel, Dieter and Hellebrand, Sybille and Middeldorp, Aart and Scherzer, Otmar}},
  title        = {{{Im Westen viel Neues - Informatik an der Universität Innsbruck}}},
  year         = {{2004}},
}

@misc{13100,
  author       = {{Hellebrand, Sybille and Wuertenberger, Armin and S. Tautermann, Christofer}},
  keywords     = {{WORKSHOP}},
  title        = {{{Data Compression for Multiple Scan Chains Using Dictionaries with Corrections}}},
  year         = {{2004}},
}

@inproceedings{13001,
  author       = {{Wuertenberger, Armin and S. Tautermann, Christofer and Hellebrand, Sybille}},
  booktitle    = {{IEEE International Test Conference (ITC'04)}},
  pages        = {{926--935}},
  publisher    = {{IEEE}},
  title        = {{{Data Compression for Multiple Scan Chains Using Dictionaries with Corrections}}},
  doi          = {{10.1109/test.2004.1387357}},
  year         = {{2004}},
}

@misc{13098,
  author       = {{Breu, Ruth and Hellebrand, Sybille and Welzl, Michael}},
  title        = {{{Experiences from Teaching Software Development in a Java Environment}}},
  year         = {{2003}},
}

@inproceedings{13002,
  author       = {{Wuertenberger, Armin and S. Tautermann, Christofer and Hellebrand, Sybille}},
  booktitle    = {{IEEE International Test Conference (ITC'03)}},
  pages        = {{451--459}},
  publisher    = {{IEEE}},
  title        = {{{A Hybrid Coding Strategy for Optimized Test Data Compression}}},
  doi          = {{10.1109/test.2003.1270870}},
  year         = {{2003}},
}

@misc{13097,
  author       = {{Hellebrand, Sybille and Wuertenberger, Armin}},
  keywords     = {{WORKSHOP}},
  title        = {{{Alternating Run-Length Coding: A Technique for Improved Test Data Compression}}},
  year         = {{2002}},
}

@article{13003,
  author       = {{Hellebrand, Sybille and Wunderlich, Hans-Joachim and A. Ivaniuk, Alexander and V. Klimets, Yuri and N. Yarmolik, Vyacheslav}},
  journal      = {{IEEE Transactions on Computers}},
  number       = {{7}},
  pages        = {{801--809}},
  publisher    = {{IEEE}},
  title        = {{{Efficient Online and Offline Testing of Embedded DRAMs}}},
  doi          = {{10.1109/tc.2002.1017700}},
  volume       = {{51}},
  year         = {{2002}},
}

@article{13069,
  author       = {{Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim}},
  journal      = {{Journal of Electronic Testing - Theory and Applications (JETTA)}},
  number       = {{2}},
  pages        = {{157--168}},
  title        = {{{Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST}}},
  volume       = {{18}},
  year         = {{2002}},
}