[{"date_updated":"2022-01-06T06:51:27Z","status":"public","year":"1991","title":"Synthese vollständig testbarer Schaltungen","author":[{"id":"209","full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","first_name":"Sybille","last_name":"Hellebrand"}],"publication_identifier":{"isbn":["3257227892"]},"user_id":"659","_id":"13034","series_title":"10","language":[{"iso":"eng"}],"publisher":"Verlag Düsseldorf: VDI Verlag","extern":"1","citation":{"bibtex":"@book{Hellebrand_1991, place={Verlag Düsseldorf: VDI Verlag}, series={10}, title={Synthese vollständig testbarer Schaltungen}, publisher={Verlag Düsseldorf: VDI Verlag}, author={Hellebrand, Sybille}, year={1991}, collection={10} }","chicago":"Hellebrand, Sybille. <i>Synthese Vollständig Testbarer Schaltungen</i>. 10. Verlag Düsseldorf: VDI Verlag: Verlag Düsseldorf: VDI Verlag, 1991.","ama":"Hellebrand S. <i>Synthese Vollständig Testbarer Schaltungen</i>. Verlag Düsseldorf: VDI Verlag: Verlag Düsseldorf: VDI Verlag; 1991.","short":"S. Hellebrand, Synthese Vollständig Testbarer Schaltungen, Verlag Düsseldorf: VDI Verlag, Verlag Düsseldorf: VDI Verlag, 1991.","ieee":"S. Hellebrand, <i>Synthese vollständig testbarer Schaltungen</i>. Verlag Düsseldorf: VDI Verlag: Verlag Düsseldorf: VDI Verlag, 1991.","apa":"Hellebrand, S. (1991). <i>Synthese vollständig testbarer Schaltungen</i>. Verlag Düsseldorf: VDI Verlag: Verlag Düsseldorf: VDI Verlag.","mla":"Hellebrand, Sybille. <i>Synthese Vollständig Testbarer Schaltungen</i>. Verlag Düsseldorf: VDI Verlag, 1991."},"type":"book","department":[{"_id":"48"}],"place":"Verlag Düsseldorf: VDI Verlag","date_created":"2019-08-28T10:37:07Z"},{"user_id":"659","_id":"13103","language":[{"iso":"eng"}],"date_updated":"2022-01-06T06:51:28Z","author":[{"full_name":"Hellebrand, Sybille","first_name":"Sybille","orcid":"0000-0002-3717-3939","last_name":"Hellebrand","id":"209"},{"last_name":"Wunderlich","first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim"},{"full_name":"F. Haberl, Oliver","first_name":"Oliver","last_name":"F. Haberl"}],"status":"public","title":"Generating Pseudo-Exhaustive Vectors for External Testing","year":"1990","department":[{"_id":"48"}],"type":"misc","keyword":["WORKSHOP"],"place":"IEEE Design for Testability Workshop, Vail, CO, USA","date_created":"2019-08-28T12:23:40Z","extern":"1","citation":{"short":"S. Hellebrand, H.-J. Wunderlich, O. F. Haberl, Generating Pseudo-Exhaustive Vectors for External Testing, IEEE Design for Testability Workshop, Vail, CO, USA, 1990.","chicago":"Hellebrand, Sybille, Hans-Joachim Wunderlich, and Oliver F. Haberl. <i>Generating Pseudo-Exhaustive Vectors for External Testing</i>. IEEE Design for Testability Workshop, Vail, CO, USA, 1990.","ieee":"S. Hellebrand, H.-J. Wunderlich, and O. F. Haberl, <i>Generating Pseudo-Exhaustive Vectors for External Testing</i>. IEEE Design for Testability Workshop, Vail, CO, USA, 1990.","apa":"Hellebrand, S., Wunderlich, H.-J., &#38; F. Haberl, O. (1990). <i>Generating Pseudo-Exhaustive Vectors for External Testing</i>. IEEE Design for Testability Workshop, Vail, CO, USA.","bibtex":"@book{Hellebrand_Wunderlich_F. Haberl_1990, place={IEEE Design for Testability Workshop, Vail, CO, USA}, title={Generating Pseudo-Exhaustive Vectors for External Testing}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and F. Haberl, Oliver}, year={1990} }","ama":"Hellebrand S, Wunderlich H-J, F. Haberl O. <i>Generating Pseudo-Exhaustive Vectors for External Testing</i>. IEEE Design for Testability Workshop, Vail, CO, USA; 1990.","mla":"Hellebrand, Sybille, et al. <i>Generating Pseudo-Exhaustive Vectors for External Testing</i>. 1990."}},{"_id":"13018","publisher":"IEEE","language":[{"iso":"eng"}],"page":"13-17","doi":"10.1109/edac.1990.136612","user_id":"209","author":[{"id":"209","last_name":"Hellebrand","first_name":"Sybille","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille"},{"full_name":"Wunderlich, Hans-Joachim","first_name":"Hans-Joachim","last_name":"Wunderlich"}],"status":"public","year":"1990","title":"Tools and Devices Supporting the Pseudo-Exhaustive Test","date_updated":"2022-05-11T16:24:46Z","place":"Glasgow, UK","date_created":"2019-08-28T10:29:16Z","department":[{"_id":"48"}],"type":"conference","citation":{"short":"S. Hellebrand, H.-J. Wunderlich, in: European Design Automation Conference (EDAC’90), IEEE, Glasgow, UK, 1990, pp. 13–17.","chicago":"Hellebrand, Sybille, and Hans-Joachim Wunderlich. “Tools and Devices Supporting the Pseudo-Exhaustive Test.” In <i>European Design Automation Conference (EDAC’90)</i>, 13–17. Glasgow, UK: IEEE, 1990. <a href=\"https://doi.org/10.1109/edac.1990.136612\">https://doi.org/10.1109/edac.1990.136612</a>.","apa":"Hellebrand, S., &#38; Wunderlich, H.-J. (1990). Tools and Devices Supporting the Pseudo-Exhaustive Test. <i>European Design Automation Conference (EDAC’90)</i>, 13–17. <a href=\"https://doi.org/10.1109/edac.1990.136612\">https://doi.org/10.1109/edac.1990.136612</a>","ieee":"S. Hellebrand and H.-J. Wunderlich, “Tools and Devices Supporting the Pseudo-Exhaustive Test,” in <i>European Design Automation Conference (EDAC’90)</i>, 1990, pp. 13–17, doi: <a href=\"https://doi.org/10.1109/edac.1990.136612\">10.1109/edac.1990.136612</a>.","ama":"Hellebrand S, Wunderlich H-J. Tools and Devices Supporting the Pseudo-Exhaustive Test. In: <i>European Design Automation Conference (EDAC’90)</i>. IEEE; 1990:13-17. doi:<a href=\"https://doi.org/10.1109/edac.1990.136612\">10.1109/edac.1990.136612</a>","bibtex":"@inproceedings{Hellebrand_Wunderlich_1990, place={Glasgow, UK}, title={Tools and Devices Supporting the Pseudo-Exhaustive Test}, DOI={<a href=\"https://doi.org/10.1109/edac.1990.136612\">10.1109/edac.1990.136612</a>}, booktitle={European Design Automation Conference (EDAC’90)}, publisher={IEEE}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1990}, pages={13–17} }","mla":"Hellebrand, Sybille, and Hans-Joachim Wunderlich. “Tools and Devices Supporting the Pseudo-Exhaustive Test.” <i>European Design Automation Conference (EDAC’90)</i>, IEEE, 1990, pp. 13–17, doi:<a href=\"https://doi.org/10.1109/edac.1990.136612\">10.1109/edac.1990.136612</a>."},"publication":"European Design Automation Conference (EDAC'90)","extern":"1"},{"date_updated":"2022-05-11T16:59:33Z","author":[{"id":"209","first_name":"Sybille","orcid":"0000-0002-3717-3939","last_name":"Hellebrand","full_name":"Hellebrand, Sybille"},{"first_name":"Hans-Joachim","last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim"},{"last_name":"F. Haberl","first_name":"Oliver","full_name":"F. Haberl, Oliver"}],"title":"Generating Pseudo-Exhaustive Vectors for External Testing","status":"public","year":"1990","doi":"10.1109/test.1990.114082","user_id":"209","language":[{"iso":"eng"}],"_id":"13019","publisher":"IEEE","page":"670-679","extern":"1","citation":{"ieee":"S. Hellebrand, H.-J. Wunderlich, and O. F. Haberl, “Generating Pseudo-Exhaustive Vectors for External Testing,” in <i>IEEE International Test Conference (ITC’90)</i>, 1990, pp. 670–679, doi: <a href=\"https://doi.org/10.1109/test.1990.114082\">10.1109/test.1990.114082</a>.","apa":"Hellebrand, S., Wunderlich, H.-J., &#38; F. Haberl, O. (1990). Generating Pseudo-Exhaustive Vectors for External Testing. <i>IEEE International Test Conference (ITC’90)</i>, 670–679. <a href=\"https://doi.org/10.1109/test.1990.114082\">https://doi.org/10.1109/test.1990.114082</a>","chicago":"Hellebrand, Sybille, Hans-Joachim Wunderlich, and Oliver F. Haberl. “Generating Pseudo-Exhaustive Vectors for External Testing.” In <i>IEEE International Test Conference (ITC’90)</i>, 670–79. Washington, DC, USA: IEEE, 1990. <a href=\"https://doi.org/10.1109/test.1990.114082\">https://doi.org/10.1109/test.1990.114082</a>.","short":"S. Hellebrand, H.-J. Wunderlich, O. F. Haberl, in: IEEE International Test Conference (ITC’90), IEEE, Washington, DC, USA, 1990, pp. 670–679.","mla":"Hellebrand, Sybille, et al. “Generating Pseudo-Exhaustive Vectors for External Testing.” <i>IEEE International Test Conference (ITC’90)</i>, IEEE, 1990, pp. 670–79, doi:<a href=\"https://doi.org/10.1109/test.1990.114082\">10.1109/test.1990.114082</a>.","bibtex":"@inproceedings{Hellebrand_Wunderlich_F. Haberl_1990, place={Washington, DC, USA}, title={Generating Pseudo-Exhaustive Vectors for External Testing}, DOI={<a href=\"https://doi.org/10.1109/test.1990.114082\">10.1109/test.1990.114082</a>}, booktitle={IEEE International Test Conference (ITC’90)}, publisher={IEEE}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and F. Haberl, Oliver}, year={1990}, pages={670–679} }","ama":"Hellebrand S, Wunderlich H-J, F. Haberl O. Generating Pseudo-Exhaustive Vectors for External Testing. In: <i>IEEE International Test Conference (ITC’90)</i>. IEEE; 1990:670-679. doi:<a href=\"https://doi.org/10.1109/test.1990.114082\">10.1109/test.1990.114082</a>"},"publication":"IEEE International Test Conference (ITC'90)","department":[{"_id":"48"}],"type":"conference","place":"Washington, DC, USA","date_created":"2019-08-28T10:29:17Z"},{"doi":"10.1109/test.1989.82273","user_id":"209","page":"19-27","publisher":"IEEE","_id":"13020","language":[{"iso":"eng"}],"date_updated":"2022-05-11T17:00:08Z","status":"public","year":"1989","title":"The Pseudo-Exhaustive Test of Sequential Circuits","author":[{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"},{"id":"209","full_name":"Hellebrand, Sybille","last_name":"Hellebrand","first_name":"Sybille","orcid":"0000-0002-3717-3939"}],"type":"conference","department":[{"_id":"48"}],"place":"Washington, DC, USA","date_created":"2019-08-28T10:30:16Z","extern":"1","publication":"IEEE International Test Conference (ITC'89)","citation":{"ieee":"H.-J. Wunderlich and S. Hellebrand, “The Pseudo-Exhaustive Test of Sequential Circuits,” in <i>IEEE International Test Conference (ITC’89)</i>, 1989, pp. 19–27, doi: <a href=\"https://doi.org/10.1109/test.1989.82273\">10.1109/test.1989.82273</a>.","apa":"Wunderlich, H.-J., &#38; Hellebrand, S. (1989). The Pseudo-Exhaustive Test of Sequential Circuits. <i>IEEE International Test Conference (ITC’89)</i>, 19–27. <a href=\"https://doi.org/10.1109/test.1989.82273\">https://doi.org/10.1109/test.1989.82273</a>","mla":"Wunderlich, Hans-Joachim, and Sybille Hellebrand. “The Pseudo-Exhaustive Test of Sequential Circuits.” <i>IEEE International Test Conference (ITC’89)</i>, IEEE, 1989, pp. 19–27, doi:<a href=\"https://doi.org/10.1109/test.1989.82273\">10.1109/test.1989.82273</a>.","bibtex":"@inproceedings{Wunderlich_Hellebrand_1989, place={Washington, DC, USA}, title={The Pseudo-Exhaustive Test of Sequential Circuits}, DOI={<a href=\"https://doi.org/10.1109/test.1989.82273\">10.1109/test.1989.82273</a>}, booktitle={IEEE International Test Conference (ITC’89)}, publisher={IEEE}, author={Wunderlich, Hans-Joachim and Hellebrand, Sybille}, year={1989}, pages={19–27} }","ama":"Wunderlich H-J, Hellebrand S. The Pseudo-Exhaustive Test of Sequential Circuits. In: <i>IEEE International Test Conference (ITC’89)</i>. IEEE; 1989:19-27. doi:<a href=\"https://doi.org/10.1109/test.1989.82273\">10.1109/test.1989.82273</a>","short":"H.-J. Wunderlich, S. Hellebrand, in: IEEE International Test Conference (ITC’89), IEEE, Washington, DC, USA, 1989, pp. 19–27.","chicago":"Wunderlich, Hans-Joachim, and Sybille Hellebrand. “The Pseudo-Exhaustive Test of Sequential Circuits.” In <i>IEEE International Test Conference (ITC’89)</i>, 19–27. Washington, DC, USA: IEEE, 1989. <a href=\"https://doi.org/10.1109/test.1989.82273\">https://doi.org/10.1109/test.1989.82273</a>."}},{"place":"Tokyo, Japan","date_created":"2019-08-28T10:30:18Z","department":[{"_id":"48"}],"type":"conference","citation":{"chicago":"Wunderlich, Hans-Joachim, and Sybille Hellebrand. “Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits.” In <i>18th International Symposium on Fault-Tolerant Computing, FTCS-18</i>, 36–45. Tokyo, Japan, 1988. <a href=\"https://doi.org/10.1109/ftcs.1988.5294\">https://doi.org/10.1109/ftcs.1988.5294</a>.","short":"H.-J. Wunderlich, S. Hellebrand, in: 18th International Symposium on Fault-Tolerant Computing, FTCS-18, Tokyo, Japan, 1988, pp. 36–45.","apa":"Wunderlich, H.-J., &#38; Hellebrand, S. (1988). Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits. <i>18th International Symposium on Fault-Tolerant Computing, FTCS-18</i>, 36–45. <a href=\"https://doi.org/10.1109/ftcs.1988.5294\">https://doi.org/10.1109/ftcs.1988.5294</a>","ieee":"H.-J. Wunderlich and S. Hellebrand, “Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits,” in <i>18th International Symposium on Fault-Tolerant Computing, FTCS-18</i>, 1988, pp. 36–45, doi: <a href=\"https://doi.org/10.1109/ftcs.1988.5294\">10.1109/ftcs.1988.5294</a>.","ama":"Wunderlich H-J, Hellebrand S. Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits. In: <i>18th International Symposium on Fault-Tolerant Computing, FTCS-18</i>. ; 1988:36-45. doi:<a href=\"https://doi.org/10.1109/ftcs.1988.5294\">10.1109/ftcs.1988.5294</a>","bibtex":"@inproceedings{Wunderlich_Hellebrand_1988, place={Tokyo, Japan}, title={Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits}, DOI={<a href=\"https://doi.org/10.1109/ftcs.1988.5294\">10.1109/ftcs.1988.5294</a>}, booktitle={18th International Symposium on Fault-Tolerant Computing, FTCS-18}, author={Wunderlich, Hans-Joachim and Hellebrand, Sybille}, year={1988}, pages={36–45} }","mla":"Wunderlich, Hans-Joachim, and Sybille Hellebrand. “Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits.” <i>18th International Symposium on Fault-Tolerant Computing, FTCS-18</i>, 1988, pp. 36–45, doi:<a href=\"https://doi.org/10.1109/ftcs.1988.5294\">10.1109/ftcs.1988.5294</a>."},"publication":"18th International Symposium on Fault-Tolerant Computing, FTCS-18","extern":"1","_id":"13021","language":[{"iso":"eng"}],"page":"36-45","doi":"10.1109/ftcs.1988.5294","user_id":"209","author":[{"full_name":"Wunderlich, Hans-Joachim","first_name":"Hans-Joachim","last_name":"Wunderlich"},{"id":"209","last_name":"Hellebrand","first_name":"Sybille","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille"}],"year":"1988","title":"Generating Pattern Sequences for the Pseudo-Exhaustive Test of MOS-Circuits","status":"public","date_updated":"2022-05-11T17:01:49Z"},{"department":[{"_id":"48"}],"type":"conference","place":"Amsterdam, The Netherlands","date_created":"2019-08-28T11:49:46Z","citation":{"bibtex":"@inproceedings{Schmid_Wunderlich_Feldbusch_Hellebrand_Holzinger_Kunzmann_1988, place={Amsterdam, The Netherlands}, title={Integrated Tools for Automatic Design for Testability}, booktitle={Tool Integration and Design Environments, F.J. Rammig (Editor)}, publisher={Amsterdam: Elsevier Science Publishers B.V.(North Holland), IFIP}, author={Schmid, Detlef and Wunderlich, Hans-Joachim and Feldbusch, Fridtjof and Hellebrand, Sybille and Holzinger, Juergen and Kunzmann, Arno}, year={1988}, pages={233–258} }","chicago":"Schmid, Detlef, Hans-Joachim Wunderlich, Fridtjof Feldbusch, Sybille Hellebrand, Juergen Holzinger, and Arno Kunzmann. “Integrated Tools for Automatic Design for Testability.” In <i>Tool Integration and Design Environments, F.J. Rammig (Editor)</i>, 233–58. Amsterdam, The Netherlands: Amsterdam: Elsevier Science Publishers B.V.(North Holland), IFIP, 1988.","ama":"Schmid D, Wunderlich H-J, Feldbusch F, Hellebrand S, Holzinger J, Kunzmann A. Integrated Tools for Automatic Design for Testability. In: <i>Tool Integration and Design Environments, F.J. Rammig (Editor)</i>. Amsterdam: Elsevier Science Publishers B.V.(North Holland), IFIP; 1988:233-258.","short":"D. Schmid, H.-J. Wunderlich, F. Feldbusch, S. Hellebrand, J. Holzinger, A. Kunzmann, in: Tool Integration and Design Environments, F.J. Rammig (Editor), Amsterdam: Elsevier Science Publishers B.V.(North Holland), IFIP, Amsterdam, The Netherlands, 1988, pp. 233–258.","ieee":"D. Schmid, H.-J. Wunderlich, F. Feldbusch, S. Hellebrand, J. Holzinger, and A. Kunzmann, “Integrated Tools for Automatic Design for Testability,” in <i>Tool Integration and Design Environments, F.J. Rammig (Editor)</i>, 1988, pp. 233–258.","apa":"Schmid, D., Wunderlich, H.-J., Feldbusch, F., Hellebrand, S., Holzinger, J., &#38; Kunzmann, A. (1988). Integrated Tools for Automatic Design for Testability. <i>Tool Integration and Design Environments, F.J. Rammig (Editor)</i>, 233–258.","mla":"Schmid, Detlef, et al. “Integrated Tools for Automatic Design for Testability.” <i>Tool Integration and Design Environments, F.J. Rammig (Editor)</i>, Amsterdam: Elsevier Science Publishers B.V.(North Holland), IFIP, 1988, pp. 233–58."},"publication":"Tool Integration and Design Environments, F.J. Rammig (Editor)","user_id":"209","_id":"13058","publisher":"Amsterdam: Elsevier Science Publishers B.V.(North Holland), IFIP","language":[{"iso":"eng"}],"page":"233-258","date_updated":"2022-05-11T17:02:35Z","author":[{"full_name":"Schmid, Detlef","last_name":"Schmid","first_name":"Detlef"},{"full_name":"Wunderlich, Hans-Joachim","first_name":"Hans-Joachim","last_name":"Wunderlich"},{"first_name":"Fridtjof","last_name":"Feldbusch","full_name":"Feldbusch, Fridtjof"},{"id":"209","full_name":"Hellebrand, Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","first_name":"Sybille"},{"full_name":"Holzinger, Juergen","first_name":"Juergen","last_name":"Holzinger"},{"first_name":"Arno","last_name":"Kunzmann","full_name":"Kunzmann, Arno"}],"title":"Integrated Tools for Automatic Design for Testability","year":"1988","status":"public"},{"publication":"GI - 18. Jahrestagung II, Hamburg, 1988, Informatik-Fachberichte 188","citation":{"mla":"Hellebrand, Sybille, and Hans-Joachim Wunderlich. “Automatisierung Des Entwurfs Vollständig Testbarer Schaltungen.” <i>GI - 18. Jahrestagung II, Hamburg, 1988, Informatik-Fachberichte 188</i>, Springer Verlag, 1988, pp. 145–59.","ama":"Hellebrand S, Wunderlich H-J. Automatisierung des Entwurfs vollständig testbarer Schaltungen. In: <i>GI - 18. Jahrestagung II, Hamburg, 1988, Informatik-Fachberichte 188</i>. Springer Verlag; 1988:145-159.","bibtex":"@inproceedings{Hellebrand_Wunderlich_1988, place={Hamburg, Germany}, title={Automatisierung des Entwurfs vollständig testbarer Schaltungen}, booktitle={GI - 18. Jahrestagung II, Hamburg, 1988, Informatik-Fachberichte 188}, publisher={Springer Verlag}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={1988}, pages={145–159} }","apa":"Hellebrand, S., &#38; Wunderlich, H.-J. (1988). Automatisierung des Entwurfs vollständig testbarer Schaltungen. <i>GI - 18. Jahrestagung II, Hamburg, 1988, Informatik-Fachberichte 188</i>, 145–159.","ieee":"S. Hellebrand and H.-J. Wunderlich, “Automatisierung des Entwurfs vollständig testbarer Schaltungen,” in <i>GI - 18. Jahrestagung II, Hamburg, 1988, Informatik-Fachberichte 188</i>, 1988, pp. 145–159.","chicago":"Hellebrand, Sybille, and Hans-Joachim Wunderlich. “Automatisierung Des Entwurfs Vollständig Testbarer Schaltungen.” In <i>GI - 18. Jahrestagung II, Hamburg, 1988, Informatik-Fachberichte 188</i>, 145–59. Hamburg, Germany: Springer Verlag, 1988.","short":"S. Hellebrand, H.-J. Wunderlich, in: GI - 18. Jahrestagung II, Hamburg, 1988, Informatik-Fachberichte 188, Springer Verlag, Hamburg, Germany, 1988, pp. 145–159."},"extern":"1","place":"Hamburg, Germany","date_created":"2019-08-28T11:54:29Z","type":"conference","department":[{"_id":"48"}],"title":"Automatisierung des Entwurfs vollständig testbarer Schaltungen","status":"public","year":"1988","author":[{"id":"209","full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","first_name":"Sybille","last_name":"Hellebrand"},{"first_name":"Hans-Joachim","last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim"}],"date_updated":"2022-05-11T17:03:06Z","page":"145-159","language":[{"iso":"eng"}],"_id":"13062","publisher":"Springer Verlag","user_id":"209"},{"department":[{"_id":"48"}],"type":"report","place":"Universität Regensburg, Fakultät für Mathematik, Regensburg, Germany","date_created":"2019-08-28T10:30:19Z","extern":"1","citation":{"mla":"Hellebrand, Sybille. <i>Deformation Dicker Punkte Und Netze von Quadriken</i>. 1986.","ama":"Hellebrand S. <i>Deformation Dicker Punkte Und Netze von Quadriken</i>. Universität Regensburg, Fakultät für Mathematik, Regensburg, Germany; 1986.","bibtex":"@book{Hellebrand_1986, place={Universität Regensburg, Fakultät für Mathematik, Regensburg, Germany}, title={Deformation dicker Punkte und Netze von Quadriken}, author={Hellebrand, Sybille}, year={1986} }","apa":"Hellebrand, S. (1986). <i>Deformation dicker Punkte und Netze von Quadriken</i>. Universität Regensburg, Fakultät für Mathematik, Regensburg, Germany.","ieee":"S. Hellebrand, <i>Deformation dicker Punkte und Netze von Quadriken</i>. Universität Regensburg, Fakultät für Mathematik, Regensburg, Germany, 1986.","short":"S. Hellebrand, Deformation Dicker Punkte Und Netze von Quadriken, Universität Regensburg, Fakultät für Mathematik, Regensburg, Germany, 1986.","chicago":"Hellebrand, Sybille. <i>Deformation Dicker Punkte Und Netze von Quadriken</i>. Universität Regensburg, Fakultät für Mathematik, Regensburg, Germany, 1986."},"user_id":"659","_id":"13022","language":[{"iso":"eng"}],"date_updated":"2022-01-06T06:51:27Z","author":[{"full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","first_name":"Sybille","last_name":"Hellebrand","id":"209"}],"title":"Deformation dicker Punkte und Netze von Quadriken","status":"public","year":"1986"}]