[{"author":[{"first_name":"Sybille","id":"209","full_name":"Hellebrand, Sybille","orcid":"0000-0002-3717-3939","last_name":"Hellebrand"}],"date_created":"2019-08-28T09:16:51Z","publisher":"IEEE","date_updated":"2022-01-06T06:51:27Z","doi":"10.1109/latw.2013.6562662","title":"Analyzing and Quantifying Fault Tolerance Properties","citation":{"short":"S. Hellebrand, in: 14th IEEE Latin American Test Workshop - (LATW’13), IEEE, Cordoba, Argentina, 2013.","mla":"Hellebrand, Sybille. “Analyzing and Quantifying Fault Tolerance Properties.” <i>14th IEEE Latin American Test Workshop - (LATW’13)</i>, IEEE, 2013, doi:<a href=\"https://doi.org/10.1109/latw.2013.6562662\">10.1109/latw.2013.6562662</a>.","bibtex":"@inproceedings{Hellebrand_2013, place={Cordoba, Argentina}, title={Analyzing and Quantifying Fault Tolerance Properties}, DOI={<a href=\"https://doi.org/10.1109/latw.2013.6562662\">10.1109/latw.2013.6562662</a>}, booktitle={14th IEEE Latin American Test Workshop - (LATW’13)}, publisher={IEEE}, author={Hellebrand, Sybille}, year={2013} }","apa":"Hellebrand, S. (2013). Analyzing and Quantifying Fault Tolerance Properties. In <i>14th IEEE Latin American Test Workshop - (LATW’13)</i>. Cordoba, Argentina: IEEE. <a href=\"https://doi.org/10.1109/latw.2013.6562662\">https://doi.org/10.1109/latw.2013.6562662</a>","chicago":"Hellebrand, Sybille. “Analyzing and Quantifying Fault Tolerance Properties.” In <i>14th IEEE Latin American Test Workshop - (LATW’13)</i>. Cordoba, Argentina: IEEE, 2013. <a href=\"https://doi.org/10.1109/latw.2013.6562662\">https://doi.org/10.1109/latw.2013.6562662</a>.","ieee":"S. Hellebrand, “Analyzing and Quantifying Fault Tolerance Properties,” in <i>14th IEEE Latin American Test Workshop - (LATW’13)</i>, 2013.","ama":"Hellebrand S. Analyzing and Quantifying Fault Tolerance Properties. In: <i>14th IEEE Latin American Test Workshop - (LATW’13)</i>. Cordoba, Argentina: IEEE; 2013. doi:<a href=\"https://doi.org/10.1109/latw.2013.6562662\">10.1109/latw.2013.6562662</a>"},"year":"2013","place":"Cordoba, Argentina","user_id":"209","department":[{"_id":"48"}],"_id":"12979","language":[{"iso":"eng"}],"type":"conference","publication":"14th IEEE Latin American Test Workshop - (LATW'13)","status":"public"},{"title":"Adaptive Test and Diagnosis of Intermittent Faults","author":[{"last_name":"Cook","full_name":"Cook, Alejandro","first_name":"Alejandro"},{"first_name":"Laura","full_name":"Rodriguez Gomez, Laura","last_name":"Rodriguez Gomez"},{"orcid":"0000-0002-3717-3939","last_name":"Hellebrand","full_name":"Hellebrand, Sybille","id":"209","first_name":"Sybille"},{"first_name":"Thomas","last_name":"Indlekofer","full_name":"Indlekofer, Thomas"},{"last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim","first_name":"Hans-Joachim"}],"date_created":"2019-08-28T12:04:38Z","date_updated":"2022-01-06T06:51:28Z","citation":{"apa":"Cook, A., Rodriguez Gomez, L., Hellebrand, S., Indlekofer, T., &#38; Wunderlich, H.-J. (2013). <i>Adaptive Test and Diagnosis of Intermittent Faults</i>. 14th Latin American Test Workshop, Cordoba, Argentina.","short":"A. Cook, L. Rodriguez Gomez, S. Hellebrand, T. Indlekofer, H.-J. Wunderlich, Adaptive Test and Diagnosis of Intermittent Faults, 14th Latin American Test Workshop, Cordoba, Argentina, 2013.","mla":"Cook, Alejandro, et al. <i>Adaptive Test and Diagnosis of Intermittent Faults</i>. 2013.","bibtex":"@book{Cook_Rodriguez Gomez_Hellebrand_Indlekofer_Wunderlich_2013, place={14th Latin American Test Workshop, Cordoba, Argentina}, title={Adaptive Test and Diagnosis of Intermittent Faults}, author={Cook, Alejandro and Rodriguez Gomez, Laura and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}, year={2013} }","ama":"Cook A, Rodriguez Gomez L, Hellebrand S, Indlekofer T, Wunderlich H-J. <i>Adaptive Test and Diagnosis of Intermittent Faults</i>. 14th Latin American Test Workshop, Cordoba, Argentina; 2013.","ieee":"A. Cook, L. Rodriguez Gomez, S. Hellebrand, T. Indlekofer, and H.-J. Wunderlich, <i>Adaptive Test and Diagnosis of Intermittent Faults</i>. 14th Latin American Test Workshop, Cordoba, Argentina, 2013.","chicago":"Cook, Alejandro, Laura Rodriguez Gomez, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. <i>Adaptive Test and Diagnosis of Intermittent Faults</i>. 14th Latin American Test Workshop, Cordoba, Argentina, 2013."},"year":"2013","place":"14th Latin American Test Workshop, Cordoba, Argentina","language":[{"iso":"eng"}],"keyword":["WORKSHOP"],"user_id":"659","department":[{"_id":"48"}],"_id":"13075","status":"public","type":"misc"},{"date_created":"2023-08-02T11:20:19Z","author":[{"first_name":"Somayeh","full_name":"Sadeghi-Kohan, Somayeh","id":"78614","orcid":"https://orcid.org/0000-0001-7246-0610","last_name":"Sadeghi-Kohan"},{"first_name":"Majid","last_name":"Namaki-Shoushtari","full_name":"Namaki-Shoushtari, Majid"},{"first_name":"Fatemeh","last_name":"Javaheri","full_name":"Javaheri, Fatemeh"},{"first_name":"Zainalabedin","last_name":"Navabi","full_name":"Navabi, Zainalabedin"}],"publisher":"IEEE","date_updated":"2023-08-02T11:33:26Z","doi":"10.1109/test.2012.6401583","title":"BS 1149.1 extensions for an online interconnect fault detection and recovery","publication_status":"published","citation":{"ieee":"S. Sadeghi-Kohan, M. Namaki-Shoushtari, F. Javaheri, and Z. Navabi, “BS 1149.1 extensions for an online interconnect fault detection and recovery,” 2013, doi: <a href=\"https://doi.org/10.1109/test.2012.6401583\">10.1109/test.2012.6401583</a>.","chicago":"Sadeghi-Kohan, Somayeh, Majid Namaki-Shoushtari, Fatemeh Javaheri, and Zainalabedin Navabi. “BS 1149.1 Extensions for an Online Interconnect Fault Detection and Recovery.” In <i>2012 IEEE International Test Conference</i>. IEEE, 2013. <a href=\"https://doi.org/10.1109/test.2012.6401583\">https://doi.org/10.1109/test.2012.6401583</a>.","apa":"Sadeghi-Kohan, S., Namaki-Shoushtari, M., Javaheri, F., &#38; Navabi, Z. (2013). BS 1149.1 extensions for an online interconnect fault detection and recovery. <i>2012 IEEE International Test Conference</i>. <a href=\"https://doi.org/10.1109/test.2012.6401583\">https://doi.org/10.1109/test.2012.6401583</a>","ama":"Sadeghi-Kohan S, Namaki-Shoushtari M, Javaheri F, Navabi Z. BS 1149.1 extensions for an online interconnect fault detection and recovery. In: <i>2012 IEEE International Test Conference</i>. IEEE; 2013. doi:<a href=\"https://doi.org/10.1109/test.2012.6401583\">10.1109/test.2012.6401583</a>","bibtex":"@inproceedings{Sadeghi-Kohan_Namaki-Shoushtari_Javaheri_Navabi_2013, title={BS 1149.1 extensions for an online interconnect fault detection and recovery}, DOI={<a href=\"https://doi.org/10.1109/test.2012.6401583\">10.1109/test.2012.6401583</a>}, booktitle={2012 IEEE International Test Conference}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Namaki-Shoushtari, Majid and Javaheri, Fatemeh and Navabi, Zainalabedin}, year={2013} }","short":"S. Sadeghi-Kohan, M. Namaki-Shoushtari, F. Javaheri, Z. Navabi, in: 2012 IEEE International Test Conference, IEEE, 2013.","mla":"Sadeghi-Kohan, Somayeh, et al. “BS 1149.1 Extensions for an Online Interconnect Fault Detection and Recovery.” <i>2012 IEEE International Test Conference</i>, IEEE, 2013, doi:<a href=\"https://doi.org/10.1109/test.2012.6401583\">10.1109/test.2012.6401583</a>."},"year":"2013","user_id":"78614","department":[{"_id":"48"}],"_id":"46271","extern":"1","language":[{"iso":"eng"}],"type":"conference","publication":"2012 IEEE International Test Conference","status":"public"},{"title":"A new structure for interconnect offline testing","doi":"10.1109/ewdts.2013.6673207","date_updated":"2023-08-02T11:33:58Z","publisher":"IEEE","author":[{"full_name":"Sadeghi-Kohan, Somayeh","id":"78614","orcid":"https://orcid.org/0000-0001-7246-0610","last_name":"Sadeghi-Kohan","first_name":"Somayeh"},{"full_name":"Keshavarz, Shahrzad","last_name":"Keshavarz","first_name":"Shahrzad"},{"full_name":"Zokaee, Farzaneh","last_name":"Zokaee","first_name":"Farzaneh"},{"last_name":"Farahmandi","full_name":"Farahmandi, Farimah","first_name":"Farimah"},{"first_name":"Zainalabedin","full_name":"Navabi, Zainalabedin","last_name":"Navabi"}],"date_created":"2023-08-02T11:19:36Z","year":"2013","citation":{"chicago":"Sadeghi-Kohan, Somayeh, Shahrzad Keshavarz, Farzaneh Zokaee, Farimah Farahmandi, and Zainalabedin Navabi. “A New Structure for Interconnect Offline Testing.” In <i>East-West Design &#38;amp; Test Symposium (EWDTS 2013)</i>. IEEE, 2013. <a href=\"https://doi.org/10.1109/ewdts.2013.6673207\">https://doi.org/10.1109/ewdts.2013.6673207</a>.","ieee":"S. Sadeghi-Kohan, S. Keshavarz, F. Zokaee, F. Farahmandi, and Z. Navabi, “A new structure for interconnect offline testing,” 2013, doi: <a href=\"https://doi.org/10.1109/ewdts.2013.6673207\">10.1109/ewdts.2013.6673207</a>.","short":"S. Sadeghi-Kohan, S. Keshavarz, F. Zokaee, F. Farahmandi, Z. Navabi, in: East-West Design &#38;amp; Test Symposium (EWDTS 2013), IEEE, 2013.","bibtex":"@inproceedings{Sadeghi-Kohan_Keshavarz_Zokaee_Farahmandi_Navabi_2013, title={A new structure for interconnect offline testing}, DOI={<a href=\"https://doi.org/10.1109/ewdts.2013.6673207\">10.1109/ewdts.2013.6673207</a>}, booktitle={East-West Design &#38;amp; Test Symposium (EWDTS 2013)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Keshavarz, Shahrzad and Zokaee, Farzaneh and Farahmandi, Farimah and Navabi, Zainalabedin}, year={2013} }","mla":"Sadeghi-Kohan, Somayeh, et al. “A New Structure for Interconnect Offline Testing.” <i>East-West Design &#38;amp; Test Symposium (EWDTS 2013)</i>, IEEE, 2013, doi:<a href=\"https://doi.org/10.1109/ewdts.2013.6673207\">10.1109/ewdts.2013.6673207</a>.","apa":"Sadeghi-Kohan, S., Keshavarz, S., Zokaee, F., Farahmandi, F., &#38; Navabi, Z. (2013). A new structure for interconnect offline testing. <i>East-West Design &#38;amp; Test Symposium (EWDTS 2013)</i>. <a href=\"https://doi.org/10.1109/ewdts.2013.6673207\">https://doi.org/10.1109/ewdts.2013.6673207</a>","ama":"Sadeghi-Kohan S, Keshavarz S, Zokaee F, Farahmandi F, Navabi Z. A new structure for interconnect offline testing. In: <i>East-West Design &#38;amp; Test Symposium (EWDTS 2013)</i>. IEEE; 2013. doi:<a href=\"https://doi.org/10.1109/ewdts.2013.6673207\">10.1109/ewdts.2013.6673207</a>"},"publication_status":"published","language":[{"iso":"eng"}],"extern":"1","_id":"46270","user_id":"78614","department":[{"_id":"48"}],"status":"public","type":"conference","publication":"East-West Design &amp; Test Symposium (EWDTS 2013)"},{"language":[{"iso":"eng"}],"department":[{"_id":"48"}],"user_id":"209","_id":"12980","status":"public","publication":"13th IEEE Latin American Test Workshop (LATW'12)","type":"conference","doi":"10.1109/latw.2012.6261229","title":"Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test","author":[{"first_name":"Alejandro","full_name":"Cook, Alejandro","last_name":"Cook"},{"first_name":"Sybille","orcid":"0000-0002-3717-3939","last_name":"Hellebrand","full_name":"Hellebrand, Sybille","id":"209"},{"first_name":"Michael","last_name":"E. Imhof","full_name":"E. Imhof, Michael"},{"full_name":"Mumtaz, Abdullah","last_name":"Mumtaz","first_name":"Abdullah"},{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"}],"date_created":"2019-08-28T09:16:53Z","publisher":"IEEE","date_updated":"2022-01-06T06:51:27Z","page":"1-4","citation":{"short":"A. Cook, S. Hellebrand, M. E. Imhof, A. Mumtaz, H.-J. Wunderlich, in: 13th IEEE Latin American Test Workshop (LATW’12), IEEE, Quito, Ecuador, 2012, pp. 1–4.","bibtex":"@inproceedings{Cook_Hellebrand_E. Imhof_Mumtaz_Wunderlich_2012, place={Quito, Ecuador}, title={Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test}, DOI={<a href=\"https://doi.org/10.1109/latw.2012.6261229\">10.1109/latw.2012.6261229</a>}, booktitle={13th IEEE Latin American Test Workshop (LATW’12)}, publisher={IEEE}, author={Cook, Alejandro and Hellebrand, Sybille and E. Imhof, Michael and Mumtaz, Abdullah and Wunderlich, Hans-Joachim}, year={2012}, pages={1–4} }","mla":"Cook, Alejandro, et al. “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test.” <i>13th IEEE Latin American Test Workshop (LATW’12)</i>, IEEE, 2012, pp. 1–4, doi:<a href=\"https://doi.org/10.1109/latw.2012.6261229\">10.1109/latw.2012.6261229</a>.","apa":"Cook, A., Hellebrand, S., E. Imhof, M., Mumtaz, A., &#38; Wunderlich, H.-J. (2012). Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test. In <i>13th IEEE Latin American Test Workshop (LATW’12)</i> (pp. 1–4). Quito, Ecuador: IEEE. <a href=\"https://doi.org/10.1109/latw.2012.6261229\">https://doi.org/10.1109/latw.2012.6261229</a>","ama":"Cook A, Hellebrand S, E. Imhof M, Mumtaz A, Wunderlich H-J. Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test. In: <i>13th IEEE Latin American Test Workshop (LATW’12)</i>. Quito, Ecuador: IEEE; 2012:1-4. doi:<a href=\"https://doi.org/10.1109/latw.2012.6261229\">10.1109/latw.2012.6261229</a>","chicago":"Cook, Alejandro, Sybille Hellebrand, Michael E. Imhof, Abdullah Mumtaz, and Hans-Joachim Wunderlich. “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test.” In <i>13th IEEE Latin American Test Workshop (LATW’12)</i>, 1–4. Quito, Ecuador: IEEE, 2012. <a href=\"https://doi.org/10.1109/latw.2012.6261229\">https://doi.org/10.1109/latw.2012.6261229</a>.","ieee":"A. Cook, S. Hellebrand, M. E. Imhof, A. Mumtaz, and H.-J. Wunderlich, “Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test,” in <i>13th IEEE Latin American Test Workshop (LATW’12)</i>, 2012, pp. 1–4."},"year":"2012","place":"Quito, Ecuador"},{"citation":{"ama":"Cook A, Hellebrand S, Wunderlich H-J. Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test. In: <i>17th IEEE European Test Symposium (ETS’12)</i>. Annecy, France: IEEE; 2012:1-6. doi:<a href=\"https://doi.org/10.1109/ets.2012.6233025\">10.1109/ets.2012.6233025</a>","chicago":"Cook, Alejandro, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test.” In <i>17th IEEE European Test Symposium (ETS’12)</i>, 1–6. Annecy, France: IEEE, 2012. <a href=\"https://doi.org/10.1109/ets.2012.6233025\">https://doi.org/10.1109/ets.2012.6233025</a>.","ieee":"A. Cook, S. Hellebrand, and H.-J. Wunderlich, “Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test,” in <i>17th IEEE European Test Symposium (ETS’12)</i>, 2012, pp. 1–6.","bibtex":"@inproceedings{Cook_Hellebrand_Wunderlich_2012, place={Annecy, France}, title={Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test}, DOI={<a href=\"https://doi.org/10.1109/ets.2012.6233025\">10.1109/ets.2012.6233025</a>}, booktitle={17th IEEE European Test Symposium (ETS’12)}, publisher={IEEE}, author={Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2012}, pages={1–6} }","mla":"Cook, Alejandro, et al. “Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test.” <i>17th IEEE European Test Symposium (ETS’12)</i>, IEEE, 2012, pp. 1–6, doi:<a href=\"https://doi.org/10.1109/ets.2012.6233025\">10.1109/ets.2012.6233025</a>.","short":"A. Cook, S. Hellebrand, H.-J. Wunderlich, in: 17th IEEE European Test Symposium (ETS’12), IEEE, Annecy, France, 2012, pp. 1–6.","apa":"Cook, A., Hellebrand, S., &#38; Wunderlich, H.-J. (2012). Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test. In <i>17th IEEE European Test Symposium (ETS’12)</i> (pp. 1–6). Annecy, France: IEEE. <a href=\"https://doi.org/10.1109/ets.2012.6233025\">https://doi.org/10.1109/ets.2012.6233025</a>"},"page":"1-6","year":"2012","place":"Annecy, France","author":[{"first_name":"Alejandro","last_name":"Cook","full_name":"Cook, Alejandro"},{"first_name":"Sybille","id":"209","full_name":"Hellebrand, Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939"},{"first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich"}],"date_created":"2019-08-28T09:19:20Z","publisher":"IEEE","date_updated":"2022-01-06T06:51:27Z","doi":"10.1109/ets.2012.6233025","title":"Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test","type":"conference","publication":"17th IEEE European Test Symposium (ETS'12)","status":"public","user_id":"209","department":[{"_id":"48"}],"_id":"12981","language":[{"iso":"eng"}]},{"language":[{"iso":"eng"}],"keyword":["WORKSHOP"],"user_id":"659","department":[{"_id":"48"}],"_id":"13074","status":"public","type":"misc","title":"Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern","author":[{"first_name":"Alejandro","last_name":"Cook","full_name":"Cook, Alejandro"},{"first_name":"Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","id":"209"},{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"}],"date_created":"2019-08-28T12:02:54Z","date_updated":"2022-01-06T06:51:28Z","citation":{"apa":"Cook, A., Hellebrand, S., &#38; Wunderlich, H.-J. (2012). <i>Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern</i>. 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany.","bibtex":"@book{Cook_Hellebrand_Wunderlich_2012, place={24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany}, title={Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern}, author={Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2012} }","mla":"Cook, Alejandro, et al. <i>Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern</i>. 2012.","short":"A. Cook, S. Hellebrand, H.-J. Wunderlich, Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern, 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany, 2012.","ieee":"A. Cook, S. Hellebrand, and H.-J. Wunderlich, <i>Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern</i>. 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany, 2012.","chicago":"Cook, Alejandro, Sybille Hellebrand, and Hans-Joachim Wunderlich. <i>Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern</i>. 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany, 2012.","ama":"Cook A, Hellebrand S, Wunderlich H-J. <i>Eingebaute Selbstdiagnose Mit Zufälligen Und Deterministischen Mustern</i>. 24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany; 2012."},"year":"2012","place":"24. Workshop \"Testmethoden und Zuverlässigkeit von Schaltungen und Systemen\" (TuZ'12), Cottbus, Germany"},{"type":"conference","publication":"20th IEEE Asian Test Symposium (ATS'11)","status":"public","_id":"12982","user_id":"209","department":[{"_id":"48"}],"language":[{"iso":"eng"}],"place":"New Delhi, India","year":"2011","citation":{"apa":"Cook, A., Hellebrand, S., Indlekofer, T., &#38; Wunderlich, H.-J. (2011). Diagnostic Test of Robust Circuits. In <i>20th IEEE Asian Test Symposium (ATS’11)</i> (pp. 285–290). New Delhi, India: IEEE. <a href=\"https://doi.org/10.1109/ats.2011.55\">https://doi.org/10.1109/ats.2011.55</a>","short":"A. Cook, S. Hellebrand, T. Indlekofer, H.-J. Wunderlich, in: 20th IEEE Asian Test Symposium (ATS’11), IEEE, New Delhi, India, 2011, pp. 285–290.","bibtex":"@inproceedings{Cook_Hellebrand_Indlekofer_Wunderlich_2011, place={New Delhi, India}, title={Diagnostic Test of Robust Circuits}, DOI={<a href=\"https://doi.org/10.1109/ats.2011.55\">10.1109/ats.2011.55</a>}, booktitle={20th IEEE Asian Test Symposium (ATS’11)}, publisher={IEEE}, author={Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}, year={2011}, pages={285–290} }","mla":"Cook, Alejandro, et al. “Diagnostic Test of Robust Circuits.” <i>20th IEEE Asian Test Symposium (ATS’11)</i>, IEEE, 2011, pp. 285–90, doi:<a href=\"https://doi.org/10.1109/ats.2011.55\">10.1109/ats.2011.55</a>.","ama":"Cook A, Hellebrand S, Indlekofer T, Wunderlich H-J. Diagnostic Test of Robust Circuits. In: <i>20th IEEE Asian Test Symposium (ATS’11)</i>. New Delhi, India: IEEE; 2011:285-290. doi:<a href=\"https://doi.org/10.1109/ats.2011.55\">10.1109/ats.2011.55</a>","ieee":"A. Cook, S. Hellebrand, T. Indlekofer, and H.-J. Wunderlich, “Diagnostic Test of Robust Circuits,” in <i>20th IEEE Asian Test Symposium (ATS’11)</i>, 2011, pp. 285–290.","chicago":"Cook, Alejandro, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. “Diagnostic Test of Robust Circuits.” In <i>20th IEEE Asian Test Symposium (ATS’11)</i>, 285–90. New Delhi, India: IEEE, 2011. <a href=\"https://doi.org/10.1109/ats.2011.55\">https://doi.org/10.1109/ats.2011.55</a>."},"page":"285-290","publisher":"IEEE","date_updated":"2022-01-06T06:51:27Z","author":[{"first_name":"Alejandro","last_name":"Cook","full_name":"Cook, Alejandro"},{"first_name":"Sybille","orcid":"0000-0002-3717-3939","last_name":"Hellebrand","full_name":"Hellebrand, Sybille","id":"209"},{"full_name":"Indlekofer, Thomas","last_name":"Indlekofer","first_name":"Thomas"},{"first_name":"Hans-Joachim","last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim"}],"date_created":"2019-08-28T09:19:22Z","title":"Diagnostic Test of Robust Circuits","doi":"10.1109/ats.2011.55"},{"title":"Towards Variation-Aware Test Methods","doi":"10.1109/ets.2011.51","publisher":"IEEE","date_updated":"2022-01-06T06:51:27Z","author":[{"first_name":"Ilia","last_name":"Polian","full_name":"Polian, Ilia"},{"last_name":"Becker","full_name":"Becker, Bernd","first_name":"Bernd"},{"last_name":"Hellebrand","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","id":"209","first_name":"Sybille"},{"last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim","first_name":"Hans-Joachim"},{"last_name":"Maxwell","full_name":"Maxwell, Peter","first_name":"Peter"}],"date_created":"2019-08-28T09:20:52Z","place":"Trondheim, Norway","year":"2011","citation":{"short":"I. Polian, B. Becker, S. Hellebrand, H.-J. Wunderlich, P. Maxwell, in: 16th IEEE European Test Symposium Trondheim (ETS’11), IEEE, Trondheim, Norway, 2011.","bibtex":"@inproceedings{Polian_Becker_Hellebrand_Wunderlich_Maxwell_2011, place={Trondheim, Norway}, title={Towards Variation-Aware Test Methods}, DOI={<a href=\"https://doi.org/10.1109/ets.2011.51\">10.1109/ets.2011.51</a>}, booktitle={16th IEEE European Test Symposium Trondheim (ETS’11)}, publisher={IEEE}, author={Polian, Ilia and Becker, Bernd and Hellebrand, Sybille and Wunderlich, Hans-Joachim and Maxwell, Peter}, year={2011} }","mla":"Polian, Ilia, et al. “Towards Variation-Aware Test Methods.” <i>16th IEEE European Test Symposium Trondheim (ETS’11)</i>, IEEE, 2011, doi:<a href=\"https://doi.org/10.1109/ets.2011.51\">10.1109/ets.2011.51</a>.","apa":"Polian, I., Becker, B., Hellebrand, S., Wunderlich, H.-J., &#38; Maxwell, P. (2011). Towards Variation-Aware Test Methods. In <i>16th IEEE European Test Symposium Trondheim (ETS’11)</i>. Trondheim, Norway: IEEE. <a href=\"https://doi.org/10.1109/ets.2011.51\">https://doi.org/10.1109/ets.2011.51</a>","ama":"Polian I, Becker B, Hellebrand S, Wunderlich H-J, Maxwell P. Towards Variation-Aware Test Methods. In: <i>16th IEEE European Test Symposium Trondheim (ETS’11)</i>. Trondheim, Norway: IEEE; 2011. doi:<a href=\"https://doi.org/10.1109/ets.2011.51\">10.1109/ets.2011.51</a>","chicago":"Polian, Ilia, Bernd Becker, Sybille Hellebrand, Hans-Joachim Wunderlich, and Peter Maxwell. “Towards Variation-Aware Test Methods.” In <i>16th IEEE European Test Symposium Trondheim (ETS’11)</i>. Trondheim, Norway: IEEE, 2011. <a href=\"https://doi.org/10.1109/ets.2011.51\">https://doi.org/10.1109/ets.2011.51</a>.","ieee":"I. Polian, B. Becker, S. Hellebrand, H.-J. Wunderlich, and P. Maxwell, “Towards Variation-Aware Test Methods,” in <i>16th IEEE European Test Symposium Trondheim (ETS’11)</i>, 2011."},"alternative_title":["Embedded Tutorial"],"language":[{"iso":"eng"}],"_id":"12984","user_id":"209","department":[{"_id":"48"}],"status":"public","type":"conference","publication":"16th IEEE European Test Symposium Trondheim (ETS'11)"},{"_id":"13053","department":[{"_id":"48"}],"user_id":"209","language":[{"iso":"eng"}],"publication":"5. GMM/GI/ITG Fachtagung \"Zuverlässigkeit und Entwurf\"","type":"conference","status":"public","date_updated":"2022-01-06T06:51:27Z","date_created":"2019-08-28T11:47:35Z","author":[{"last_name":"Cook","full_name":"Cook, Alejandro","first_name":"Alejandro"},{"first_name":"Sybille","orcid":"0000-0002-3717-3939","last_name":"Hellebrand","id":"209","full_name":"Hellebrand, Sybille"},{"first_name":"Thomas","last_name":"Indlekofer","full_name":"Indlekofer, Thomas"},{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"}],"title":"Robuster Selbsttest mit Diagnose","year":"2011","place":"Hamburg, Germany","page":"48-53","citation":{"short":"A. Cook, S. Hellebrand, T. Indlekofer, H.-J. Wunderlich, in: 5. GMM/GI/ITG Fachtagung “Zuverlässigkeit Und Entwurf,” Hamburg, Germany, 2011, pp. 48–53.","bibtex":"@inproceedings{Cook_Hellebrand_Indlekofer_Wunderlich_2011, place={Hamburg, Germany}, title={Robuster Selbsttest mit Diagnose}, booktitle={5. GMM/GI/ITG Fachtagung “Zuverlässigkeit und Entwurf”}, author={Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}, year={2011}, pages={48–53} }","mla":"Cook, Alejandro, et al. “Robuster Selbsttest Mit Diagnose.” <i>5. GMM/GI/ITG Fachtagung “Zuverlässigkeit Und Entwurf,”</i> 2011, pp. 48–53.","apa":"Cook, A., Hellebrand, S., Indlekofer, T., &#38; Wunderlich, H.-J. (2011). Robuster Selbsttest mit Diagnose. In <i>5. GMM/GI/ITG Fachtagung “Zuverlässigkeit und Entwurf”</i> (pp. 48–53). Hamburg, Germany.","ama":"Cook A, Hellebrand S, Indlekofer T, Wunderlich H-J. Robuster Selbsttest mit Diagnose. In: <i>5. GMM/GI/ITG Fachtagung “Zuverlässigkeit Und Entwurf.”</i> Hamburg, Germany; 2011:48-53.","ieee":"A. Cook, S. Hellebrand, T. Indlekofer, and H.-J. Wunderlich, “Robuster Selbsttest mit Diagnose,” in <i>5. GMM/GI/ITG Fachtagung “Zuverlässigkeit und Entwurf,”</i> 2011, pp. 48–53.","chicago":"Cook, Alejandro, Sybille Hellebrand, Thomas Indlekofer, and Hans-Joachim Wunderlich. “Robuster Selbsttest Mit Diagnose.” In <i>5. GMM/GI/ITG Fachtagung “Zuverlässigkeit Und Entwurf,”</i> 48–53. Hamburg, Germany, 2011."}},{"type":"journal_article","publication":"SCIENCE CHINA Information Sciences, Science China Press, co-published with Springer","status":"public","_id":"13052","user_id":"209","department":[{"_id":"48"}],"language":[{"iso":"eng"}],"issue":"4","year":"2011","citation":{"apa":"Hopsch, F., Becker, B., Hellebrand, S., Polian, I., Straube, B., Vermeiren, W., &#38; Wunderlich, H.-J. (2011). Variation-Aware Fault Modeling. <i>SCIENCE CHINA Information Sciences, Science China Press, Co-Published with Springer</i>, <i>54</i>(4), 1813–1826.","short":"F. Hopsch, B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H.-J. Wunderlich, SCIENCE CHINA Information Sciences, Science China Press, Co-Published with Springer 54 (2011) 1813–1826.","bibtex":"@article{Hopsch_Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2011, title={Variation-Aware Fault Modeling}, volume={54}, number={4}, journal={SCIENCE CHINA Information Sciences, Science China Press, co-published with Springer}, author={Hopsch, Fabian and Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2011}, pages={1813–1826} }","mla":"Hopsch, Fabian, et al. “Variation-Aware Fault Modeling.” <i>SCIENCE CHINA Information Sciences, Science China Press, Co-Published with Springer</i>, vol. 54, no. 4, 2011, pp. 1813–26.","ama":"Hopsch F, Becker B, Hellebrand S, et al. Variation-Aware Fault Modeling. <i>SCIENCE CHINA Information Sciences, Science China Press, co-published with Springer</i>. 2011;54(4):1813-1826.","chicago":"Hopsch, Fabian, Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Variation-Aware Fault Modeling.” <i>SCIENCE CHINA Information Sciences, Science China Press, Co-Published with Springer</i> 54, no. 4 (2011): 1813–26.","ieee":"F. Hopsch <i>et al.</i>, “Variation-Aware Fault Modeling,” <i>SCIENCE CHINA Information Sciences, Science China Press, co-published with Springer</i>, vol. 54, no. 4, pp. 1813–1826, 2011."},"intvolume":"        54","page":"1813-1826","date_updated":"2022-05-11T16:19:14Z","date_created":"2019-08-28T11:47:14Z","author":[{"first_name":"Fabian","full_name":"Hopsch, Fabian","last_name":"Hopsch"},{"first_name":"Bernd","full_name":"Becker, Bernd","last_name":"Becker"},{"first_name":"Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","id":"209"},{"first_name":"Ilia","last_name":"Polian","full_name":"Polian, Ilia"},{"full_name":"Straube, Bernd","last_name":"Straube","first_name":"Bernd"},{"last_name":"Vermeiren","full_name":"Vermeiren, Wolfgang","first_name":"Wolfgang"},{"full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich","first_name":"Hans-Joachim"}],"volume":54,"title":"Variation-Aware Fault Modeling"},{"publication":"2010 East-West Design &amp; Test Symposium (EWDTS)","type":"conference","status":"public","department":[{"_id":"48"}],"user_id":"78614","_id":"46272","extern":"1","language":[{"iso":"eng"}],"publication_status":"published","citation":{"ama":"Kamran A, Nemati N, Sadeghi-Kohan S, Navabi Z. Virtual tester development using HDL/PLI. In: <i>2010 East-West Design &#38;amp; Test Symposium (EWDTS)</i>. IEEE; 2011. doi:<a href=\"https://doi.org/10.1109/ewdts.2010.5742156\">10.1109/ewdts.2010.5742156</a>","ieee":"A. Kamran, N. Nemati, S. Sadeghi-Kohan, and Z. Navabi, “Virtual tester development using HDL/PLI,” 2011, doi: <a href=\"https://doi.org/10.1109/ewdts.2010.5742156\">10.1109/ewdts.2010.5742156</a>.","chicago":"Kamran, Arezoo, Nastaran Nemati, Somayeh Sadeghi-Kohan, and Zainalabedin Navabi. “Virtual Tester Development Using HDL/PLI.” In <i>2010 East-West Design &#38;amp; Test Symposium (EWDTS)</i>. IEEE, 2011. <a href=\"https://doi.org/10.1109/ewdts.2010.5742156\">https://doi.org/10.1109/ewdts.2010.5742156</a>.","bibtex":"@inproceedings{Kamran_Nemati_Sadeghi-Kohan_Navabi_2011, title={Virtual tester development using HDL/PLI}, DOI={<a href=\"https://doi.org/10.1109/ewdts.2010.5742156\">10.1109/ewdts.2010.5742156</a>}, booktitle={2010 East-West Design &#38;amp; Test Symposium (EWDTS)}, publisher={IEEE}, author={Kamran, Arezoo and Nemati, Nastaran and Sadeghi-Kohan, Somayeh and Navabi, Zainalabedin}, year={2011} }","short":"A. Kamran, N. Nemati, S. Sadeghi-Kohan, Z. Navabi, in: 2010 East-West Design &#38;amp; Test Symposium (EWDTS), IEEE, 2011.","mla":"Kamran, Arezoo, et al. “Virtual Tester Development Using HDL/PLI.” <i>2010 East-West Design &#38;amp; Test Symposium (EWDTS)</i>, IEEE, 2011, doi:<a href=\"https://doi.org/10.1109/ewdts.2010.5742156\">10.1109/ewdts.2010.5742156</a>.","apa":"Kamran, A., Nemati, N., Sadeghi-Kohan, S., &#38; Navabi, Z. (2011). Virtual tester development using HDL/PLI. <i>2010 East-West Design &#38;amp; Test Symposium (EWDTS)</i>. <a href=\"https://doi.org/10.1109/ewdts.2010.5742156\">https://doi.org/10.1109/ewdts.2010.5742156</a>"},"year":"2011","date_created":"2023-08-02T11:21:02Z","author":[{"first_name":"Arezoo","last_name":"Kamran","full_name":"Kamran, Arezoo"},{"full_name":"Nemati, Nastaran","last_name":"Nemati","first_name":"Nastaran"},{"first_name":"Somayeh","orcid":"https://orcid.org/0000-0001-7246-0610","last_name":"Sadeghi-Kohan","full_name":"Sadeghi-Kohan, Somayeh","id":"78614"},{"first_name":"Zainalabedin","full_name":"Navabi, Zainalabedin","last_name":"Navabi"}],"date_updated":"2023-08-02T11:33:46Z","publisher":"IEEE","doi":"10.1109/ewdts.2010.5742156","title":"Virtual tester development using HDL/PLI"},{"title":"Testdatenkompression mit Hilfe der Netzwerkinfrastruktur","date_updated":"2022-01-06T06:50:49Z","author":[{"first_name":"Viktor","last_name":"Fröse","full_name":"Fröse, Viktor"},{"full_name":"Ibers, Rüdiger","id":"659","last_name":"Ibers","first_name":"Rüdiger"},{"last_name":"Hellebrand","orcid":"0000-0002-3717-3939","id":"209","full_name":"Hellebrand, Sybille","first_name":"Sybille"}],"date_created":"2019-07-10T11:17:36Z","year":"2010","place":"22. Workshop \"Testmethoden und Zuverlässigkeit von Schaltungen und Systemen\" (TuZ'10), Paderborn, Germany","citation":{"short":"V. Fröse, R. Ibers, S. Hellebrand, Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur, 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, 2010.","bibtex":"@book{Fröse_Ibers_Hellebrand_2010, place={22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany}, title={Testdatenkompression mit Hilfe der Netzwerkinfrastruktur}, author={Fröse, Viktor and Ibers, Rüdiger and Hellebrand, Sybille}, year={2010} }","mla":"Fröse, Viktor, et al. <i>Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur</i>. 2010.","apa":"Fröse, V., Ibers, R., &#38; Hellebrand, S. (2010). <i>Testdatenkompression mit Hilfe der Netzwerkinfrastruktur</i>. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany.","chicago":"Fröse, Viktor, Rüdiger Ibers, and Sybille Hellebrand. <i>Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur</i>. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, 2010.","ieee":"V. Fröse, R. Ibers, and S. Hellebrand, <i>Testdatenkompression mit Hilfe der Netzwerkinfrastruktur</i>. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany, 2010.","ama":"Fröse V, Ibers R, Hellebrand S. <i>Testdatenkompression Mit Hilfe Der Netzwerkinfrastruktur</i>. 22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany; 2010."},"keyword":["WORKSHOP"],"language":[{"iso":"eng"}],"_id":"10670","user_id":"659","department":[{"_id":"48"}],"status":"public","type":"misc"},{"doi":"10.1109/dsnw.2010.5542612","title":"Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits","author":[{"last_name":"Becker","full_name":"Becker, Bernd","first_name":"Bernd"},{"orcid":"0000-0002-3717-3939","last_name":"Hellebrand","full_name":"Hellebrand, Sybille","id":"209","first_name":"Sybille"},{"first_name":"Ilia","last_name":"Polian","full_name":"Polian, Ilia"},{"last_name":"Straube","full_name":"Straube, Bernd","first_name":"Bernd"},{"first_name":"Wolfgang","full_name":"Vermeiren, Wolfgang","last_name":"Vermeiren"},{"first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim","last_name":"Wunderlich"}],"date_created":"2019-08-28T09:22:53Z","date_updated":"2022-01-06T06:51:27Z","publisher":"IEEE","citation":{"bibtex":"@inproceedings{Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place={Chicago, IL, USA}, title={Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits}, DOI={<a href=\"https://doi.org/10.1109/dsnw.2010.5542612\">10.1109/dsnw.2010.5542612</a>}, booktitle={40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10)}, publisher={IEEE}, author={Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2010} }","mla":"Becker, Bernd, et al. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” <i>40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10)</i>, IEEE, 2010, doi:<a href=\"https://doi.org/10.1109/dsnw.2010.5542612\">10.1109/dsnw.2010.5542612</a>.","short":"B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H.-J. Wunderlich, in: 40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10), IEEE, Chicago, IL, USA, 2010.","apa":"Becker, B., Hellebrand, S., Polian, I., Straube, B., Vermeiren, W., &#38; Wunderlich, H.-J. (2010). Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits. In <i>40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10)</i>. Chicago, IL, USA: IEEE. <a href=\"https://doi.org/10.1109/dsnw.2010.5542612\">https://doi.org/10.1109/dsnw.2010.5542612</a>","ama":"Becker B, Hellebrand S, Polian I, Straube B, Vermeiren W, Wunderlich H-J. Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits. In: <i>40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10)</i>. Chicago, IL, USA: IEEE; 2010. doi:<a href=\"https://doi.org/10.1109/dsnw.2010.5542612\">10.1109/dsnw.2010.5542612</a>","ieee":"B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, and H.-J. Wunderlich, “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits,” in <i>40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10)</i>, 2010.","chicago":"Becker, Bernd, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” In <i>40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10)</i>. Chicago, IL, USA: IEEE, 2010. <a href=\"https://doi.org/10.1109/dsnw.2010.5542612\">https://doi.org/10.1109/dsnw.2010.5542612</a>."},"place":"Chicago, IL, USA","year":"2010","language":[{"iso":"eng"}],"department":[{"_id":"48"}],"user_id":"209","_id":"12987","status":"public","publication":"40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W'10)","type":"conference"},{"department":[{"_id":"48"}],"user_id":"659","_id":"13051","language":[{"iso":"eng"}],"publication":"4. GMM/GI/ITG-Fachtagung \"Zuverlässigkeit und Entwurf\"","type":"conference","status":"public","date_created":"2019-08-28T11:46:41Z","author":[{"first_name":"Marc","full_name":"Hunger, Marc","last_name":"Hunger"},{"first_name":"Sybille","orcid":"0000-0002-3717-3939","last_name":"Hellebrand","full_name":"Hellebrand, Sybille","id":"209"}],"date_updated":"2022-01-06T06:51:27Z","title":"Ausbeute und Fehlertoleranz bei dreifach modularer Redundanz","page":"81-88","citation":{"bibtex":"@inproceedings{Hunger_Hellebrand_2010, place={Wildbad Kreuth, Germany}, title={Ausbeute und Fehlertoleranz bei dreifach modularer Redundanz}, booktitle={4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, author={Hunger, Marc and Hellebrand, Sybille}, year={2010}, pages={81–88} }","short":"M. Hunger, S. Hellebrand, in: 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” Wildbad Kreuth, Germany, 2010, pp. 81–88.","mla":"Hunger, Marc, and Sybille Hellebrand. “Ausbeute Und Fehlertoleranz Bei Dreifach Modularer Redundanz.” <i>4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,”</i> 2010, pp. 81–88.","apa":"Hunger, M., &#38; Hellebrand, S. (2010). Ausbeute und Fehlertoleranz bei dreifach modularer Redundanz. In <i>4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”</i> (pp. 81–88). Wildbad Kreuth, Germany.","ama":"Hunger M, Hellebrand S. Ausbeute und Fehlertoleranz bei dreifach modularer Redundanz. In: <i>4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.”</i> Wildbad Kreuth, Germany; 2010:81-88.","chicago":"Hunger, Marc, and Sybille Hellebrand. “Ausbeute Und Fehlertoleranz Bei Dreifach Modularer Redundanz.” In <i>4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,”</i> 81–88. Wildbad Kreuth, Germany, 2010.","ieee":"M. Hunger and S. Hellebrand, “Ausbeute und Fehlertoleranz bei dreifach modularer Redundanz,” in <i>4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf,”</i> 2010, pp. 81–88."},"year":"2010","place":"Wildbad Kreuth, Germany"},{"language":[{"iso":"eng"}],"_id":"13073","department":[{"_id":"48"}],"user_id":"659","status":"public","type":"misc","title":"Nano-Electronic Systems","date_updated":"2022-01-06T06:51:28Z","date_created":"2019-08-28T12:01:06Z","author":[{"first_name":"Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939","full_name":"Hellebrand, Sybille","id":"209"}],"place":"Editorial, it 4/2010, pp. 179-180","year":"2010","citation":{"ama":"Hellebrand S. <i>Nano-Electronic Systems</i>. Editorial, it 4/2010, pp. 179-180; 2010.","ieee":"S. Hellebrand, <i>Nano-Electronic Systems</i>. Editorial, it 4/2010, pp. 179-180, 2010.","chicago":"Hellebrand, Sybille. <i>Nano-Electronic Systems</i>. Editorial, it 4/2010, pp. 179-180, 2010.","apa":"Hellebrand, S. (2010). <i>Nano-Electronic Systems</i>. Editorial, it 4/2010, pp. 179-180.","short":"S. Hellebrand, Nano-Electronic Systems, Editorial, it 4/2010, pp. 179-180, 2010.","mla":"Hellebrand, Sybille. <i>Nano-Electronic Systems</i>. 2010.","bibtex":"@book{Hellebrand_2010, place={Editorial, it 4/2010, pp. 179-180}, title={Nano-Electronic Systems}, author={Hellebrand, Sybille}, year={2010} }"}},{"publication":"19th IEEE Asian Test Symposium (ATS'10)","type":"conference","status":"public","department":[{"_id":"48"}],"user_id":"209","_id":"12983","language":[{"iso":"eng"}],"page":"87-93","citation":{"chicago":"Hopsch, Fabian, Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, and Hans-Joachim Wunderlich. “Variation-Aware Fault Modeling.” In <i>19th IEEE Asian Test Symposium (ATS’10)</i>, 87–93. Shanghai, China: IEEE, 2010. <a href=\"https://doi.org/10.1109/ats.2010.24\">https://doi.org/10.1109/ats.2010.24</a>.","ieee":"F. Hopsch <i>et al.</i>, “Variation-Aware Fault Modeling,” in <i>19th IEEE Asian Test Symposium (ATS’10)</i>, 2010, pp. 87–93, doi: <a href=\"https://doi.org/10.1109/ats.2010.24\">10.1109/ats.2010.24</a>.","ama":"Hopsch F, Becker B, Hellebrand S, et al. Variation-Aware Fault Modeling. In: <i>19th IEEE Asian Test Symposium (ATS’10)</i>. IEEE; 2010:87-93. doi:<a href=\"https://doi.org/10.1109/ats.2010.24\">10.1109/ats.2010.24</a>","apa":"Hopsch, F., Becker, B., Hellebrand, S., Polian, I., Straube, B., Vermeiren, W., &#38; Wunderlich, H.-J. (2010). Variation-Aware Fault Modeling. <i>19th IEEE Asian Test Symposium (ATS’10)</i>, 87–93. <a href=\"https://doi.org/10.1109/ats.2010.24\">https://doi.org/10.1109/ats.2010.24</a>","bibtex":"@inproceedings{Hopsch_Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place={Shanghai, China}, title={Variation-Aware Fault Modeling}, DOI={<a href=\"https://doi.org/10.1109/ats.2010.24\">10.1109/ats.2010.24</a>}, booktitle={19th IEEE Asian Test Symposium (ATS’10)}, publisher={IEEE}, author={Hopsch, Fabian and Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2010}, pages={87–93} }","mla":"Hopsch, Fabian, et al. “Variation-Aware Fault Modeling.” <i>19th IEEE Asian Test Symposium (ATS’10)</i>, IEEE, 2010, pp. 87–93, doi:<a href=\"https://doi.org/10.1109/ats.2010.24\">10.1109/ats.2010.24</a>.","short":"F. Hopsch, B. Becker, S. Hellebrand, I. Polian, B. Straube, W. Vermeiren, H.-J. Wunderlich, in: 19th IEEE Asian Test Symposium (ATS’10), IEEE, Shanghai, China, 2010, pp. 87–93."},"year":"2010","place":"Shanghai, China","date_created":"2019-08-28T09:20:51Z","author":[{"first_name":"Fabian","full_name":"Hopsch, Fabian","last_name":"Hopsch"},{"last_name":"Becker","full_name":"Becker, Bernd","first_name":"Bernd"},{"first_name":"Sybille","orcid":"0000-0002-3717-3939","last_name":"Hellebrand","full_name":"Hellebrand, Sybille","id":"209"},{"first_name":"Ilia","last_name":"Polian","full_name":"Polian, Ilia"},{"last_name":"Straube","full_name":"Straube, Bernd","first_name":"Bernd"},{"first_name":"Wolfgang","full_name":"Vermeiren, Wolfgang","last_name":"Vermeiren"},{"first_name":"Hans-Joachim","last_name":"Wunderlich","full_name":"Wunderlich, Hans-Joachim"}],"publisher":"IEEE","date_updated":"2022-05-11T16:20:07Z","doi":"10.1109/ats.2010.24","title":"Variation-Aware Fault Modeling"},{"place":"Amsterdam, The Netherlands","year":"2010","citation":{"apa":"Indlekofer, T., Schnittger, M., &#38; Hellebrand, S. (2010). Efficient Test Response Compaction for Robust BIST Using Parity Sequences. <i>28th IEEE International Conference on Computer Design (ICCD’10)</i>, 480–485. <a href=\"https://doi.org/10.1109/iccd.2010.5647648\">https://doi.org/10.1109/iccd.2010.5647648</a>","bibtex":"@inproceedings{Indlekofer_Schnittger_Hellebrand_2010, place={Amsterdam, The Netherlands}, title={Efficient Test Response Compaction for Robust BIST Using Parity Sequences}, DOI={<a href=\"https://doi.org/10.1109/iccd.2010.5647648\">10.1109/iccd.2010.5647648</a>}, booktitle={28th IEEE International Conference on Computer Design (ICCD’10)}, publisher={IEEE}, author={Indlekofer, Thomas and Schnittger, Michael and Hellebrand, Sybille}, year={2010}, pages={480–485} }","short":"T. Indlekofer, M. Schnittger, S. Hellebrand, in: 28th IEEE International Conference on Computer Design (ICCD’10), IEEE, Amsterdam, The Netherlands, 2010, pp. 480–485.","mla":"Indlekofer, Thomas, et al. “Efficient Test Response Compaction for Robust BIST Using Parity Sequences.” <i>28th IEEE International Conference on Computer Design (ICCD’10)</i>, IEEE, 2010, pp. 480–85, doi:<a href=\"https://doi.org/10.1109/iccd.2010.5647648\">10.1109/iccd.2010.5647648</a>.","ama":"Indlekofer T, Schnittger M, Hellebrand S. Efficient Test Response Compaction for Robust BIST Using Parity Sequences. In: <i>28th IEEE International Conference on Computer Design (ICCD’10)</i>. IEEE; 2010:480-485. doi:<a href=\"https://doi.org/10.1109/iccd.2010.5647648\">10.1109/iccd.2010.5647648</a>","chicago":"Indlekofer, Thomas, Michael Schnittger, and Sybille Hellebrand. “Efficient Test Response Compaction for Robust BIST Using Parity Sequences.” In <i>28th IEEE International Conference on Computer Design (ICCD’10)</i>, 480–85. Amsterdam, The Netherlands: IEEE, 2010. <a href=\"https://doi.org/10.1109/iccd.2010.5647648\">https://doi.org/10.1109/iccd.2010.5647648</a>.","ieee":"T. Indlekofer, M. Schnittger, and S. Hellebrand, “Efficient Test Response Compaction for Robust BIST Using Parity Sequences,” in <i>28th IEEE International Conference on Computer Design (ICCD’10)</i>, 2010, pp. 480–485, doi: <a href=\"https://doi.org/10.1109/iccd.2010.5647648\">10.1109/iccd.2010.5647648</a>."},"page":"480-485","title":"Efficient Test Response Compaction for Robust BIST Using Parity Sequences","doi":"10.1109/iccd.2010.5647648","date_updated":"2022-05-11T16:21:12Z","publisher":"IEEE","author":[{"full_name":"Indlekofer, Thomas","last_name":"Indlekofer","first_name":"Thomas"},{"last_name":"Schnittger","full_name":"Schnittger, Michael","first_name":"Michael"},{"first_name":"Sybille","id":"209","full_name":"Hellebrand, Sybille","last_name":"Hellebrand","orcid":"0000-0002-3717-3939"}],"date_created":"2019-08-28T09:21:55Z","status":"public","type":"conference","publication":"28th IEEE International Conference on Computer Design (ICCD'10)","language":[{"iso":"eng"}],"_id":"12985","user_id":"209","department":[{"_id":"48"}]},{"place":"Kyoto, Japan","year":"2010","citation":{"apa":"Hunger, M., &#38; Hellebrand, S. (2010). The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems. <i>25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10)</i>, 101–108. <a href=\"https://doi.org/10.1109/dft.2010.19\">https://doi.org/10.1109/dft.2010.19</a>","bibtex":"@inproceedings{Hunger_Hellebrand_2010, place={Kyoto, Japan}, title={The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems}, DOI={<a href=\"https://doi.org/10.1109/dft.2010.19\">10.1109/dft.2010.19</a>}, booktitle={25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10)}, publisher={IEEE}, author={Hunger, Marc and Hellebrand, Sybille}, year={2010}, pages={101–108} }","short":"M. Hunger, S. Hellebrand, in: 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), IEEE, Kyoto, Japan, 2010, pp. 101–108.","mla":"Hunger, Marc, and Sybille Hellebrand. “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems.” <i>25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10)</i>, IEEE, 2010, pp. 101–08, doi:<a href=\"https://doi.org/10.1109/dft.2010.19\">10.1109/dft.2010.19</a>.","ama":"Hunger M, Hellebrand S. The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems. In: <i>25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10)</i>. IEEE; 2010:101-108. doi:<a href=\"https://doi.org/10.1109/dft.2010.19\">10.1109/dft.2010.19</a>","ieee":"M. Hunger and S. Hellebrand, “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems,” in <i>25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10)</i>, 2010, pp. 101–108, doi: <a href=\"https://doi.org/10.1109/dft.2010.19\">10.1109/dft.2010.19</a>.","chicago":"Hunger, Marc, and Sybille Hellebrand. “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems.” In <i>25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10)</i>, 101–8. Kyoto, Japan: IEEE, 2010. <a href=\"https://doi.org/10.1109/dft.2010.19\">https://doi.org/10.1109/dft.2010.19</a>."},"page":"101-108","title":"The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems","doi":"10.1109/dft.2010.19","date_updated":"2022-05-11T16:21:52Z","publisher":"IEEE","author":[{"first_name":"Marc","last_name":"Hunger","full_name":"Hunger, Marc"},{"first_name":"Sybille","orcid":"0000-0002-3717-3939","last_name":"Hellebrand","id":"209","full_name":"Hellebrand, Sybille"}],"date_created":"2019-08-28T09:21:57Z","status":"public","type":"conference","publication":"25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'10)","language":[{"iso":"eng"}],"_id":"12986","user_id":"209","department":[{"_id":"48"}]},{"page":"227-231","citation":{"chicago":"Froese, Viktor, Rüdiger Ibers, and Sybille Hellebrand. “Reusing NoC-Infrastructure for Test Data Compression.” In <i>28th IEEE VLSI Test Symposium (VTS’10)</i>, 227–31. Santa Cruz, CA, USA: IEEE, 2010. <a href=\"https://doi.org/10.1109/vts.2010.5469570\">https://doi.org/10.1109/vts.2010.5469570</a>.","ieee":"V. Froese, R. Ibers, and S. Hellebrand, “Reusing NoC-Infrastructure for Test Data Compression,” in <i>28th IEEE VLSI Test Symposium (VTS’10)</i>, 2010, pp. 227–231, doi: <a href=\"https://doi.org/10.1109/vts.2010.5469570\">10.1109/vts.2010.5469570</a>.","ama":"Froese V, Ibers R, Hellebrand S. Reusing NoC-Infrastructure for Test Data Compression. In: <i>28th IEEE VLSI Test Symposium (VTS’10)</i>. IEEE; 2010:227-231. doi:<a href=\"https://doi.org/10.1109/vts.2010.5469570\">10.1109/vts.2010.5469570</a>","apa":"Froese, V., Ibers, R., &#38; Hellebrand, S. (2010). Reusing NoC-Infrastructure for Test Data Compression. <i>28th IEEE VLSI Test Symposium (VTS’10)</i>, 227–231. <a href=\"https://doi.org/10.1109/vts.2010.5469570\">https://doi.org/10.1109/vts.2010.5469570</a>","mla":"Froese, Viktor, et al. “Reusing NoC-Infrastructure for Test Data Compression.” <i>28th IEEE VLSI Test Symposium (VTS’10)</i>, IEEE, 2010, pp. 227–31, doi:<a href=\"https://doi.org/10.1109/vts.2010.5469570\">10.1109/vts.2010.5469570</a>.","bibtex":"@inproceedings{Froese_Ibers_Hellebrand_2010, place={Santa Cruz, CA, USA}, title={Reusing NoC-Infrastructure for Test Data Compression}, DOI={<a href=\"https://doi.org/10.1109/vts.2010.5469570\">10.1109/vts.2010.5469570</a>}, booktitle={28th IEEE VLSI Test Symposium (VTS’10)}, publisher={IEEE}, author={Froese, Viktor and Ibers, Rüdiger and Hellebrand, Sybille}, year={2010}, pages={227–231} }","short":"V. Froese, R. Ibers, S. Hellebrand, in: 28th IEEE VLSI Test Symposium (VTS’10), IEEE, Santa Cruz, CA, USA, 2010, pp. 227–231."},"place":"Santa Cruz, CA, USA","year":"2010","author":[{"full_name":"Froese, Viktor","last_name":"Froese","first_name":"Viktor"},{"last_name":"Ibers","id":"659","full_name":"Ibers, Rüdiger","first_name":"Rüdiger"},{"full_name":"Hellebrand, Sybille","id":"209","orcid":"0000-0002-3717-3939","last_name":"Hellebrand","first_name":"Sybille"}],"date_created":"2019-08-28T09:22:54Z","publisher":"IEEE","date_updated":"2022-05-11T16:22:36Z","doi":"10.1109/vts.2010.5469570","title":"Reusing NoC-Infrastructure for Test Data Compression","publication":"28th IEEE VLSI Test Symposium (VTS'10)","type":"conference","status":"public","department":[{"_id":"48"}],"user_id":"209","_id":"12988","language":[{"iso":"eng"}]}]