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(2002). Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. <i>Journal of Electronic Testing - Theory and Applications (JETTA)</i>, <i>18</i>(2), 157–168.","bibtex":"@article{Hellebrand_Liang_Wunderlich_2002, title={Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST}, volume={18}, number={2}, journal={Journal of Electronic Testing - Theory and Applications (JETTA)}, author={Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim}, year={2002}, pages={157–168} }","mla":"Hellebrand, Sybille, et al. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.” <i>Journal of Electronic Testing - Theory and Applications (JETTA)</i>, vol. 18, no. 2, 2002, pp. 157–68.","short":"S. Hellebrand, H.-G. Liang, H.-J. Wunderlich, Journal of Electronic Testing - Theory and Applications (JETTA) 18 (2002) 157–168.","ama":"Hellebrand S, Liang H-G, Wunderlich H-J. 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