--- _id: '39544' author: - first_name: C full_name: Wiegand, C last_name: Wiegand - first_name: C full_name: Hangmann, C last_name: Hangmann - first_name: C full_name: Hedayat, C last_name: Hedayat - first_name: Ulrich full_name: Hilleringmann, Ulrich id: '20179' last_name: Hilleringmann citation: ama: Wiegand C, Hangmann C, Hedayat C, Hilleringmann U. A Resonance PLL-based Tracking System for Capacitive Sensors-MEMS/NEMS. Smart System Integration SSI 2010. Published online 2010. apa: Wiegand, C., Hangmann, C., Hedayat, C., & Hilleringmann, U. (2010). A Resonance PLL-based Tracking System for Capacitive Sensors-MEMS/NEMS. Smart System Integration SSI 2010. bibtex: '@article{Wiegand_Hangmann_Hedayat_Hilleringmann_2010, title={A Resonance PLL-based Tracking System for Capacitive Sensors-MEMS/NEMS}, journal={Smart System Integration SSI 2010}, author={Wiegand, C and Hangmann, C and Hedayat, C and Hilleringmann, Ulrich}, year={2010} }' chicago: Wiegand, C, C Hangmann, C Hedayat, and Ulrich Hilleringmann. “A Resonance PLL-Based Tracking System for Capacitive Sensors-MEMS/NEMS.” Smart System Integration SSI 2010, 2010. ieee: C. Wiegand, C. Hangmann, C. Hedayat, and U. Hilleringmann, “A Resonance PLL-based Tracking System for Capacitive Sensors-MEMS/NEMS,” Smart System Integration SSI 2010, 2010. mla: Wiegand, C., et al. “A Resonance PLL-Based Tracking System for Capacitive Sensors-MEMS/NEMS.” Smart System Integration SSI 2010, 2010. short: C. Wiegand, C. Hangmann, C. Hedayat, U. Hilleringmann, Smart System Integration SSI 2010 (2010). date_created: 2023-01-24T12:08:49Z date_updated: 2023-03-22T10:18:56Z department: - _id: '59' language: - iso: eng publication: Smart System Integration SSI 2010 status: public title: A Resonance PLL-based Tracking System for Capacitive Sensors-MEMS/NEMS type: journal_article user_id: '20179' year: '2010' ... --- _id: '39558' abstract: - lang: eng text: "Abstract. By the rising complexity and miniaturisation of the device's dimensions, the density of the conductors increases considerably. Referring to this, locally transient interactions between single physical values become apparent. Therefore, for the investigation and optimisation of integrated circuits it is essential to develop suitable models and simulation surroundings which allow for memory and time-efficient calculation of the behaviour. By means of the dynamic reconstruction theory and the radial basis functions nets the so-called black box models are provided. The description of black box models is derived from the input and output behaviour or so-called time series of a dynamic system. Concerning the time series, the black box model adapts its parameters via the extended Kalman filter. This paper provides a modelling approach that enables fast and efficient simulations.\r\n " author: - first_name: C. full_name: Wiegand, C. last_name: Wiegand - first_name: C. full_name: Fischer, C. last_name: Fischer - first_name: R. full_name: Kazemzadeh, R. last_name: Kazemzadeh - first_name: C. full_name: Hedayat, C. last_name: Hedayat - first_name: W. full_name: John, W. last_name: John - first_name: Ulrich full_name: Hilleringmann, Ulrich id: '20179' last_name: Hilleringmann citation: ama: Wiegand C, Fischer C, Kazemzadeh R, Hedayat C, John W, Hilleringmann U. Macro-modelling via radial basis functionen nets. Advances in Radio Science. 2010;6:139-143. doi:10.5194/ars-6-139-2008 apa: Wiegand, C., Fischer, C., Kazemzadeh, R., Hedayat, C., John, W., & Hilleringmann, U. (2010). Macro-modelling via radial basis functionen nets. Advances in Radio Science, 6, 139–143. https://doi.org/10.5194/ars-6-139-2008 bibtex: '@article{Wiegand_Fischer_Kazemzadeh_Hedayat_John_Hilleringmann_2010, title={Macro-modelling via radial basis functionen nets}, volume={6}, DOI={10.5194/ars-6-139-2008}, journal={Advances in Radio Science}, publisher={Copernicus GmbH}, author={Wiegand, C. and Fischer, C. and Kazemzadeh, R. and Hedayat, C. and John, W. and Hilleringmann, Ulrich}, year={2010}, pages={139–143} }' chicago: 'Wiegand, C., C. Fischer, R. Kazemzadeh, C. Hedayat, W. John, and Ulrich Hilleringmann. “Macro-Modelling via Radial Basis Functionen Nets.” Advances in Radio Science 6 (2010): 139–43. https://doi.org/10.5194/ars-6-139-2008.' ieee: 'C. Wiegand, C. Fischer, R. Kazemzadeh, C. Hedayat, W. John, and U. Hilleringmann, “Macro-modelling via radial basis functionen nets,” Advances in Radio Science, vol. 6, pp. 139–143, 2010, doi: 10.5194/ars-6-139-2008.' mla: Wiegand, C., et al. “Macro-Modelling via Radial Basis Functionen Nets.” Advances in Radio Science, vol. 6, Copernicus GmbH, 2010, pp. 139–43, doi:10.5194/ars-6-139-2008. short: C. Wiegand, C. Fischer, R. Kazemzadeh, C. Hedayat, W. John, U. Hilleringmann, Advances in Radio Science 6 (2010) 139–143. date_created: 2023-01-24T12:14:16Z date_updated: 2023-03-22T10:32:22Z department: - _id: '59' doi: 10.5194/ars-6-139-2008 intvolume: ' 6' language: - iso: eng page: 139-143 publication: Advances in Radio Science publication_identifier: issn: - 1684-9973 publication_status: published publisher: Copernicus GmbH status: public title: Macro-modelling via radial basis functionen nets type: journal_article user_id: '20179' volume: 6 year: '2010' ... --- _id: '39547' author: - first_name: Thomas full_name: Becker, Thomas last_name: Becker - first_name: Martin full_name: Kluge, Martin last_name: Kluge - first_name: Josef full_name: Schalk, Josef last_name: Schalk - first_name: Keith full_name: Tiplady, Keith last_name: Tiplady - first_name: Christophe full_name: Paget, Christophe last_name: Paget - first_name: Ulrich full_name: Hilleringmann, Ulrich id: '20179' last_name: Hilleringmann - first_name: Tobias full_name: Otterpohl, Tobias last_name: Otterpohl citation: ama: Becker T, Kluge M, Schalk J, et al. Autonomous Sensor Nodes for Aircraft Structural Health Monitoring. IEEE Sensors Journal. 2009;9(11):1589-1595. doi:10.1109/jsen.2009.2028775 apa: Becker, T., Kluge, M., Schalk, J., Tiplady, K., Paget, C., Hilleringmann, U., & Otterpohl, T. (2009). Autonomous Sensor Nodes for Aircraft Structural Health Monitoring. IEEE Sensors Journal, 9(11), 1589–1595. https://doi.org/10.1109/jsen.2009.2028775 bibtex: '@article{Becker_Kluge_Schalk_Tiplady_Paget_Hilleringmann_Otterpohl_2009, title={Autonomous Sensor Nodes for Aircraft Structural Health Monitoring}, volume={9}, DOI={10.1109/jsen.2009.2028775}, number={11}, journal={IEEE Sensors Journal}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Becker, Thomas and Kluge, Martin and Schalk, Josef and Tiplady, Keith and Paget, Christophe and Hilleringmann, Ulrich and Otterpohl, Tobias}, year={2009}, pages={1589–1595} }' chicago: 'Becker, Thomas, Martin Kluge, Josef Schalk, Keith Tiplady, Christophe Paget, Ulrich Hilleringmann, and Tobias Otterpohl. “Autonomous Sensor Nodes for Aircraft Structural Health Monitoring.” IEEE Sensors Journal 9, no. 11 (2009): 1589–95. https://doi.org/10.1109/jsen.2009.2028775.' ieee: 'T. Becker et al., “Autonomous Sensor Nodes for Aircraft Structural Health Monitoring,” IEEE Sensors Journal, vol. 9, no. 11, pp. 1589–1595, 2009, doi: 10.1109/jsen.2009.2028775.' mla: Becker, Thomas, et al. “Autonomous Sensor Nodes for Aircraft Structural Health Monitoring.” IEEE Sensors Journal, vol. 9, no. 11, Institute of Electrical and Electronics Engineers (IEEE), 2009, pp. 1589–95, doi:10.1109/jsen.2009.2028775. short: T. Becker, M. Kluge, J. Schalk, K. Tiplady, C. Paget, U. Hilleringmann, T. Otterpohl, IEEE Sensors Journal 9 (2009) 1589–1595. date_created: 2023-01-24T12:09:44Z date_updated: 2023-03-21T10:14:08Z department: - _id: '59' doi: 10.1109/jsen.2009.2028775 intvolume: ' 9' issue: '11' keyword: - Electrical and Electronic Engineering - Instrumentation language: - iso: eng page: 1589-1595 publication: IEEE Sensors Journal publication_identifier: issn: - 1530-437X - 1558-1748 publication_status: published publisher: Institute of Electrical and Electronics Engineers (IEEE) status: public title: Autonomous Sensor Nodes for Aircraft Structural Health Monitoring type: journal_article user_id: '20179' volume: 9 year: '2009' ... --- _id: '39559' author: - first_name: Christian full_name: Reinhold, Christian last_name: Reinhold - first_name: Peter full_name: Scholz, Peter last_name: Scholz - first_name: Werner full_name: John, Werner last_name: John - first_name: Ulrich full_name: Hilleringmann, Ulrich id: '20179' last_name: Hilleringmann citation: ama: Reinhold C, Scholz P, John W, Hilleringmann U. Efficient Antenna Design of Inductive Coupled RFID-Systems with High Power Demand. Journal of Communications. 2009;2(6). doi:10.4304/jcm.2.6.14-23 apa: Reinhold, C., Scholz, P., John, W., & Hilleringmann, U. (2009). Efficient Antenna Design of Inductive Coupled RFID-Systems with High Power Demand. Journal of Communications, 2(6). https://doi.org/10.4304/jcm.2.6.14-23 bibtex: '@article{Reinhold_Scholz_John_Hilleringmann_2009, title={Efficient Antenna Design of Inductive Coupled RFID-Systems with High Power Demand}, volume={2}, DOI={10.4304/jcm.2.6.14-23}, number={6}, journal={Journal of Communications}, publisher={Academy Publisher}, author={Reinhold, Christian and Scholz, Peter and John, Werner and Hilleringmann, Ulrich}, year={2009} }' chicago: Reinhold, Christian, Peter Scholz, Werner John, and Ulrich Hilleringmann. “Efficient Antenna Design of Inductive Coupled RFID-Systems with High Power Demand.” Journal of Communications 2, no. 6 (2009). https://doi.org/10.4304/jcm.2.6.14-23. ieee: 'C. Reinhold, P. Scholz, W. John, and U. Hilleringmann, “Efficient Antenna Design of Inductive Coupled RFID-Systems with High Power Demand,” Journal of Communications, vol. 2, no. 6, 2009, doi: 10.4304/jcm.2.6.14-23.' mla: Reinhold, Christian, et al. “Efficient Antenna Design of Inductive Coupled RFID-Systems with High Power Demand.” Journal of Communications, vol. 2, no. 6, Academy Publisher, 2009, doi:10.4304/jcm.2.6.14-23. short: C. Reinhold, P. Scholz, W. John, U. Hilleringmann, Journal of Communications 2 (2009). date_created: 2023-01-24T12:14:47Z date_updated: 2023-03-21T10:13:10Z department: - _id: '59' doi: 10.4304/jcm.2.6.14-23 intvolume: ' 2' issue: '6' keyword: - Electrical and Electronic Engineering language: - iso: eng publication: Journal of Communications publication_identifier: issn: - 1796-2021 publication_status: published publisher: Academy Publisher status: public title: Efficient Antenna Design of Inductive Coupled RFID-Systems with High Power Demand type: journal_article user_id: '20179' volume: 2 year: '2009' ... --- _id: '39548' author: - first_name: Karsten full_name: Wolff, Karsten last_name: Wolff - first_name: Ulrich full_name: Hilleringmann, Ulrich id: '20179' last_name: Hilleringmann citation: ama: 'Wolff K, Hilleringmann U. N-type single nanoparticle ZnO transistors processed at low temperature. In: 2009 Proceedings of the European Solid State Device Research Conference. IEEE; 2009. doi:10.1109/essderc.2009.5331373' apa: Wolff, K., & Hilleringmann, U. (2009). N-type single nanoparticle ZnO transistors processed at low temperature. 2009 Proceedings of the European Solid State Device Research Conference. https://doi.org/10.1109/essderc.2009.5331373 bibtex: '@inproceedings{Wolff_Hilleringmann_2009, title={N-type single nanoparticle ZnO transistors processed at low temperature}, DOI={10.1109/essderc.2009.5331373}, booktitle={2009 Proceedings of the European Solid State Device Research Conference}, publisher={IEEE}, author={Wolff, Karsten and Hilleringmann, Ulrich}, year={2009} }' chicago: Wolff, Karsten, and Ulrich Hilleringmann. “N-Type Single Nanoparticle ZnO Transistors Processed at Low Temperature.” In 2009 Proceedings of the European Solid State Device Research Conference. IEEE, 2009. https://doi.org/10.1109/essderc.2009.5331373. ieee: 'K. Wolff and U. Hilleringmann, “N-type single nanoparticle ZnO transistors processed at low temperature,” 2009, doi: 10.1109/essderc.2009.5331373.' mla: Wolff, Karsten, and Ulrich Hilleringmann. “N-Type Single Nanoparticle ZnO Transistors Processed at Low Temperature.” 2009 Proceedings of the European Solid State Device Research Conference, IEEE, 2009, doi:10.1109/essderc.2009.5331373. short: 'K. Wolff, U. Hilleringmann, in: 2009 Proceedings of the European Solid State Device Research Conference, IEEE, 2009.' date_created: 2023-01-24T12:10:08Z date_updated: 2023-03-21T10:14:23Z department: - _id: '59' doi: 10.1109/essderc.2009.5331373 language: - iso: eng publication: 2009 Proceedings of the European Solid State Device Research Conference publication_status: published publisher: IEEE status: public title: N-type single nanoparticle ZnO transistors processed at low temperature type: conference user_id: '20179' year: '2009' ... --- _id: '39552' author: - first_name: C full_name: Wiegand, C last_name: Wiegand - first_name: C full_name: Hedayat, C last_name: Hedayat - first_name: Ulrich full_name: Hilleringmann, Ulrich id: '20179' last_name: Hilleringmann citation: ama: Wiegand C, Hedayat C, Hilleringmann U. Lock Detection for Charge-Pump Phase-Locked Loops. Sophia Antipolis Microelectronics SAME. Published online 2009. apa: Wiegand, C., Hedayat, C., & Hilleringmann, U. (2009). Lock Detection for Charge-Pump Phase-Locked Loops. Sophia Antipolis Microelectronics SAME. bibtex: '@article{Wiegand_Hedayat_Hilleringmann_2009, title={Lock Detection for Charge-Pump Phase-Locked Loops}, journal={Sophia Antipolis Microelectronics SAME}, author={Wiegand, C and Hedayat, C and Hilleringmann, Ulrich}, year={2009} }' chicago: Wiegand, C, C Hedayat, and Ulrich Hilleringmann. “Lock Detection for Charge-Pump Phase-Locked Loops.” Sophia Antipolis Microelectronics SAME, 2009. ieee: C. Wiegand, C. Hedayat, and U. Hilleringmann, “Lock Detection for Charge-Pump Phase-Locked Loops,” Sophia Antipolis Microelectronics SAME, 2009. mla: Wiegand, C., et al. “Lock Detection for Charge-Pump Phase-Locked Loops.” Sophia Antipolis Microelectronics SAME, 2009. short: C. Wiegand, C. Hedayat, U. Hilleringmann, Sophia Antipolis Microelectronics SAME (2009). date_created: 2023-01-24T12:11:38Z date_updated: 2023-03-21T10:14:36Z department: - _id: '59' language: - iso: eng publication: Sophia Antipolis Microelectronics SAME status: public title: Lock Detection for Charge-Pump Phase-Locked Loops type: journal_article user_id: '20179' year: '2009' ... --- _id: '39556' author: - first_name: T. full_name: Diekmann, T. last_name: Diekmann - first_name: C. full_name: Pannemann, C. last_name: Pannemann - first_name: Ulrich full_name: Hilleringmann, Ulrich id: '20179' last_name: Hilleringmann citation: ama: Diekmann T, Pannemann C, Hilleringmann U. Dielectric layers for organic field effect transistors as gate dielectric and surface passivation. physica status solidi (a). 2008;205(3):564-577. doi:10.1002/pssa.200723406 apa: Diekmann, T., Pannemann, C., & Hilleringmann, U. (2008). Dielectric layers for organic field effect transistors as gate dielectric and surface passivation. Physica Status Solidi (a), 205(3), 564–577. https://doi.org/10.1002/pssa.200723406 bibtex: '@article{Diekmann_Pannemann_Hilleringmann_2008, title={Dielectric layers for organic field effect transistors as gate dielectric and surface passivation}, volume={205}, DOI={10.1002/pssa.200723406}, number={3}, journal={physica status solidi (a)}, publisher={Wiley}, author={Diekmann, T. and Pannemann, C. and Hilleringmann, Ulrich}, year={2008}, pages={564–577} }' chicago: 'Diekmann, T., C. Pannemann, and Ulrich Hilleringmann. “Dielectric Layers for Organic Field Effect Transistors as Gate Dielectric and Surface Passivation.” Physica Status Solidi (a) 205, no. 3 (2008): 564–77. https://doi.org/10.1002/pssa.200723406.' ieee: 'T. Diekmann, C. Pannemann, and U. Hilleringmann, “Dielectric layers for organic field effect transistors as gate dielectric and surface passivation,” physica status solidi (a), vol. 205, no. 3, pp. 564–577, 2008, doi: 10.1002/pssa.200723406.' mla: Diekmann, T., et al. “Dielectric Layers for Organic Field Effect Transistors as Gate Dielectric and Surface Passivation.” Physica Status Solidi (a), vol. 205, no. 3, Wiley, 2008, pp. 564–77, doi:10.1002/pssa.200723406. short: T. Diekmann, C. Pannemann, U. Hilleringmann, Physica Status Solidi (a) 205 (2008) 564–577. date_created: 2023-01-24T12:13:48Z date_updated: 2023-03-21T09:38:46Z department: - _id: '59' doi: 10.1002/pssa.200723406 intvolume: ' 205' issue: '3' keyword: - Materials Chemistry - Electrical and Electronic Engineering - Surfaces - Coatings and Films - Surfaces and Interfaces - Condensed Matter Physics - Electronic - Optical and Magnetic Materials language: - iso: eng page: 564-577 publication: physica status solidi (a) publication_identifier: issn: - 1862-6300 - 1862-6319 publication_status: published publisher: Wiley status: public title: Dielectric layers for organic field effect transistors as gate dielectric and surface passivation type: journal_article user_id: '20179' volume: 205 year: '2008' ... --- _id: '39568' author: - first_name: M. full_name: Taki, M. last_name: Taki - first_name: W. full_name: John, W. last_name: John - first_name: C. full_name: Hedayat, C. last_name: Hedayat - first_name: Ulrich full_name: Hilleringmann, Ulrich id: '20179' last_name: Hilleringmann citation: ama: 'Taki M, John W, Hedayat C, Hilleringmann U. Noise propagation for induced fast transient impulses on PCB-level. In: 2007 18th International Zurich Symposium on Electromagnetic Compatibility. IEEE; 2008. doi:10.1109/emczur.2007.4388195' apa: Taki, M., John, W., Hedayat, C., & Hilleringmann, U. (2008). Noise propagation for induced fast transient impulses on PCB-level. 2007 18th International Zurich Symposium on Electromagnetic Compatibility. https://doi.org/10.1109/emczur.2007.4388195 bibtex: '@inproceedings{Taki_John_Hedayat_Hilleringmann_2008, title={Noise propagation for induced fast transient impulses on PCB-level}, DOI={10.1109/emczur.2007.4388195}, booktitle={2007 18th International Zurich Symposium on Electromagnetic Compatibility}, publisher={IEEE}, author={Taki, M. and John, W. and Hedayat, C. and Hilleringmann, Ulrich}, year={2008} }' chicago: Taki, M., W. John, C. Hedayat, and Ulrich Hilleringmann. “Noise Propagation for Induced Fast Transient Impulses on PCB-Level.” In 2007 18th International Zurich Symposium on Electromagnetic Compatibility. IEEE, 2008. https://doi.org/10.1109/emczur.2007.4388195. ieee: 'M. Taki, W. John, C. Hedayat, and U. Hilleringmann, “Noise propagation for induced fast transient impulses on PCB-level,” 2008, doi: 10.1109/emczur.2007.4388195.' mla: Taki, M., et al. “Noise Propagation for Induced Fast Transient Impulses on PCB-Level.” 2007 18th International Zurich Symposium on Electromagnetic Compatibility, IEEE, 2008, doi:10.1109/emczur.2007.4388195. short: 'M. Taki, W. John, C. Hedayat, U. Hilleringmann, in: 2007 18th International Zurich Symposium on Electromagnetic Compatibility, IEEE, 2008.' date_created: 2023-01-24T12:19:27Z date_updated: 2023-03-22T10:35:09Z department: - _id: '59' doi: 10.1109/emczur.2007.4388195 language: - iso: eng publication: 2007 18th International Zurich Symposium on Electromagnetic Compatibility publication_status: published publisher: IEEE status: public title: Noise propagation for induced fast transient impulses on PCB-level type: conference user_id: '20179' year: '2008' ... --- _id: '39555' author: - first_name: Th. full_name: Becker, Th. last_name: Becker - first_name: M. full_name: Kluge, M. last_name: Kluge - first_name: J. full_name: Schalk, J. last_name: Schalk - first_name: T. full_name: Otterpohl, T. last_name: Otterpohl - first_name: Ulrich full_name: Hilleringmann, Ulrich id: '20179' last_name: Hilleringmann citation: ama: 'Becker Th, Kluge M, Schalk J, Otterpohl T, Hilleringmann U. Power management for thermal energy harvesting in aircrafts. In: 2008 IEEE Sensors. IEEE; 2008. doi:10.1109/icsens.2008.4716533' apa: Becker, Th., Kluge, M., Schalk, J., Otterpohl, T., & Hilleringmann, U. (2008). Power management for thermal energy harvesting in aircrafts. 2008 IEEE Sensors. https://doi.org/10.1109/icsens.2008.4716533 bibtex: '@inproceedings{Becker_Kluge_Schalk_Otterpohl_Hilleringmann_2008, title={Power management for thermal energy harvesting in aircrafts}, DOI={10.1109/icsens.2008.4716533}, booktitle={2008 IEEE Sensors}, publisher={IEEE}, author={Becker, Th. and Kluge, M. and Schalk, J. and Otterpohl, T. and Hilleringmann, Ulrich}, year={2008} }' chicago: Becker, Th., M. Kluge, J. Schalk, T. Otterpohl, and Ulrich Hilleringmann. “Power Management for Thermal Energy Harvesting in Aircrafts.” In 2008 IEEE Sensors. IEEE, 2008. https://doi.org/10.1109/icsens.2008.4716533. ieee: 'Th. Becker, M. Kluge, J. Schalk, T. Otterpohl, and U. Hilleringmann, “Power management for thermal energy harvesting in aircrafts,” 2008, doi: 10.1109/icsens.2008.4716533.' mla: Becker, Th., et al. “Power Management for Thermal Energy Harvesting in Aircrafts.” 2008 IEEE Sensors, IEEE, 2008, doi:10.1109/icsens.2008.4716533. short: 'Th. Becker, M. Kluge, J. Schalk, T. Otterpohl, U. Hilleringmann, in: 2008 IEEE Sensors, IEEE, 2008.' date_created: 2023-01-24T12:12:47Z date_updated: 2023-03-21T10:13:53Z department: - _id: '59' doi: 10.1109/icsens.2008.4716533 language: - iso: eng publication: 2008 IEEE Sensors publication_status: published publisher: IEEE status: public title: Power management for thermal energy harvesting in aircrafts type: conference user_id: '20179' year: '2008' ... --- _id: '39562' author: - first_name: Peter full_name: Scholz, Peter last_name: Scholz - first_name: Christian full_name: Reinhold, Christian last_name: Reinhold - first_name: Werner full_name: John, Werner last_name: John - first_name: Ulrich full_name: Hilleringmann, Ulrich id: '20179' last_name: Hilleringmann citation: ama: 'Scholz P, Reinhold C, John W, Hilleringmann U. Analysis of Energy Transmission for Inductive Coupled RFID Tags. In: 2007 IEEE International Conference on RFID. IEEE; 2008. doi:10.1109/rfid.2007.346167' apa: Scholz, P., Reinhold, C., John, W., & Hilleringmann, U. (2008). Analysis of Energy Transmission for Inductive Coupled RFID Tags. 2007 IEEE International Conference on RFID. https://doi.org/10.1109/rfid.2007.346167 bibtex: '@inproceedings{Scholz_Reinhold_John_Hilleringmann_2008, title={Analysis of Energy Transmission for Inductive Coupled RFID Tags}, DOI={10.1109/rfid.2007.346167}, booktitle={2007 IEEE International Conference on RFID}, publisher={IEEE}, author={Scholz, Peter and Reinhold, Christian and John, Werner and Hilleringmann, Ulrich}, year={2008} }' chicago: Scholz, Peter, Christian Reinhold, Werner John, and Ulrich Hilleringmann. “Analysis of Energy Transmission for Inductive Coupled RFID Tags.” In 2007 IEEE International Conference on RFID. IEEE, 2008. https://doi.org/10.1109/rfid.2007.346167. ieee: 'P. Scholz, C. Reinhold, W. John, and U. Hilleringmann, “Analysis of Energy Transmission for Inductive Coupled RFID Tags,” 2008, doi: 10.1109/rfid.2007.346167.' mla: Scholz, Peter, et al. “Analysis of Energy Transmission for Inductive Coupled RFID Tags.” 2007 IEEE International Conference on RFID, IEEE, 2008, doi:10.1109/rfid.2007.346167. short: 'P. Scholz, C. Reinhold, W. John, U. Hilleringmann, in: 2007 IEEE International Conference on RFID, IEEE, 2008.' date_created: 2023-01-24T12:15:50Z date_updated: 2023-03-22T10:32:37Z department: - _id: '59' doi: 10.1109/rfid.2007.346167 language: - iso: eng publication: 2007 IEEE International Conference on RFID publication_status: published publisher: IEEE status: public title: Analysis of Energy Transmission for Inductive Coupled RFID Tags type: conference user_id: '20179' year: '2008' ... --- _id: '39570' author: - first_name: P full_name: Scholz, P last_name: Scholz - first_name: C full_name: Reinhold, C last_name: Reinhold - first_name: W full_name: John, W last_name: John - first_name: Ulrich full_name: Hilleringmann, Ulrich id: '20179' last_name: Hilleringmann citation: ama: 'Scholz P, Reinhold C, John W, Hilleringmann U. Antenna design of HF-RFID tags with high power requirement. In: ; 2007.' apa: Scholz, P., Reinhold, C., John, W., & Hilleringmann, U. (2007). Antenna design of HF-RFID tags with high power requirement. bibtex: '@inproceedings{Scholz_Reinhold_John_Hilleringmann_2007, title={Antenna design of HF-RFID tags with high power requirement}, author={Scholz, P and Reinhold, C and John, W and Hilleringmann, Ulrich}, year={2007} }' chicago: Scholz, P, C Reinhold, W John, and Ulrich Hilleringmann. “Antenna Design of HF-RFID Tags with High Power Requirement,” 2007. ieee: P. Scholz, C. Reinhold, W. John, and U. Hilleringmann, “Antenna design of HF-RFID tags with high power requirement,” 2007. mla: Scholz, P., et al. Antenna Design of HF-RFID Tags with High Power Requirement. 2007. short: 'P. Scholz, C. Reinhold, W. John, U. Hilleringmann, in: 2007.' date_created: 2023-01-24T12:19:49Z date_updated: 2023-03-22T10:34:53Z department: - _id: '59' language: - iso: eng status: public title: Antenna design of HF-RFID tags with high power requirement type: conference user_id: '20179' year: '2007' ... --- _id: '39561' article_number: '013501' author: - first_name: M. full_name: Scharnberg, M. last_name: Scharnberg - first_name: V. full_name: Zaporojtchenko, V. last_name: Zaporojtchenko - first_name: R. full_name: Adelung, R. last_name: Adelung - first_name: F. full_name: Faupel, F. last_name: Faupel - first_name: C. full_name: Pannemann, C. last_name: Pannemann - first_name: T. full_name: Diekmann, T. last_name: Diekmann - first_name: Ulrich full_name: Hilleringmann, Ulrich id: '20179' last_name: Hilleringmann citation: ama: Scharnberg M, Zaporojtchenko V, Adelung R, et al. Tuning the threshold voltage of organic field-effect transistors by an electret encapsulating layer. Applied Physics Letters. 2007;90(1). doi:10.1063/1.2426926 apa: Scharnberg, M., Zaporojtchenko, V., Adelung, R., Faupel, F., Pannemann, C., Diekmann, T., & Hilleringmann, U. (2007). Tuning the threshold voltage of organic field-effect transistors by an electret encapsulating layer. Applied Physics Letters, 90(1), Article 013501. https://doi.org/10.1063/1.2426926 bibtex: '@article{Scharnberg_Zaporojtchenko_Adelung_Faupel_Pannemann_Diekmann_Hilleringmann_2007, title={Tuning the threshold voltage of organic field-effect transistors by an electret encapsulating layer}, volume={90}, DOI={10.1063/1.2426926}, number={1013501}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Scharnberg, M. and Zaporojtchenko, V. and Adelung, R. and Faupel, F. and Pannemann, C. and Diekmann, T. and Hilleringmann, Ulrich}, year={2007} }' chicago: Scharnberg, M., V. Zaporojtchenko, R. Adelung, F. Faupel, C. Pannemann, T. Diekmann, and Ulrich Hilleringmann. “Tuning the Threshold Voltage of Organic Field-Effect Transistors by an Electret Encapsulating Layer.” Applied Physics Letters 90, no. 1 (2007). https://doi.org/10.1063/1.2426926. ieee: 'M. Scharnberg et al., “Tuning the threshold voltage of organic field-effect transistors by an electret encapsulating layer,” Applied Physics Letters, vol. 90, no. 1, Art. no. 013501, 2007, doi: 10.1063/1.2426926.' mla: Scharnberg, M., et al. “Tuning the Threshold Voltage of Organic Field-Effect Transistors by an Electret Encapsulating Layer.” Applied Physics Letters, vol. 90, no. 1, 013501, AIP Publishing, 2007, doi:10.1063/1.2426926. short: M. Scharnberg, V. Zaporojtchenko, R. Adelung, F. Faupel, C. Pannemann, T. Diekmann, U. Hilleringmann, Applied Physics Letters 90 (2007). date_created: 2023-01-24T12:15:22Z date_updated: 2023-03-21T10:15:06Z department: - _id: '59' doi: 10.1063/1.2426926 intvolume: ' 90' issue: '1' keyword: - Physics and Astronomy (miscellaneous) language: - iso: eng publication: Applied Physics Letters publication_identifier: issn: - 0003-6951 - 1077-3118 publication_status: published publisher: AIP Publishing status: public title: Tuning the threshold voltage of organic field-effect transistors by an electret encapsulating layer type: journal_article user_id: '20179' volume: 90 year: '2007' ... --- _id: '39563' author: - first_name: Jianliang full_name: Jiang, Jianliang last_name: Jiang - first_name: Ulrich full_name: Hilleringmann, Ulrich id: '20179' last_name: Hilleringmann - first_name: Xiaoping full_name: Shui, Xiaoping last_name: Shui citation: ama: 'Jiang J, Hilleringmann U, Shui X. Electro-thermo-mechanical analytical modeling of multilayer cantilever microactuator. Sensors and Actuators A: Physical. 2007;137(2):302-307. doi:10.1016/j.sna.2007.03.012' apa: 'Jiang, J., Hilleringmann, U., & Shui, X. (2007). Electro-thermo-mechanical analytical modeling of multilayer cantilever microactuator. Sensors and Actuators A: Physical, 137(2), 302–307. https://doi.org/10.1016/j.sna.2007.03.012' bibtex: '@article{Jiang_Hilleringmann_Shui_2007, title={Electro-thermo-mechanical analytical modeling of multilayer cantilever microactuator}, volume={137}, DOI={10.1016/j.sna.2007.03.012}, number={2}, journal={Sensors and Actuators A: Physical}, publisher={Elsevier BV}, author={Jiang, Jianliang and Hilleringmann, Ulrich and Shui, Xiaoping}, year={2007}, pages={302–307} }' chicago: 'Jiang, Jianliang, Ulrich Hilleringmann, and Xiaoping Shui. “Electro-Thermo-Mechanical Analytical Modeling of Multilayer Cantilever Microactuator.” Sensors and Actuators A: Physical 137, no. 2 (2007): 302–7. https://doi.org/10.1016/j.sna.2007.03.012.' ieee: 'J. Jiang, U. Hilleringmann, and X. Shui, “Electro-thermo-mechanical analytical modeling of multilayer cantilever microactuator,” Sensors and Actuators A: Physical, vol. 137, no. 2, pp. 302–307, 2007, doi: 10.1016/j.sna.2007.03.012.' mla: 'Jiang, Jianliang, et al. “Electro-Thermo-Mechanical Analytical Modeling of Multilayer Cantilever Microactuator.” Sensors and Actuators A: Physical, vol. 137, no. 2, Elsevier BV, 2007, pp. 302–07, doi:10.1016/j.sna.2007.03.012.' short: 'J. Jiang, U. Hilleringmann, X. Shui, Sensors and Actuators A: Physical 137 (2007) 302–307.' date_created: 2023-01-24T12:16:12Z date_updated: 2023-03-21T10:12:55Z department: - _id: '59' doi: 10.1016/j.sna.2007.03.012 intvolume: ' 137' issue: '2' keyword: - Electrical and Electronic Engineering - Metals and Alloys - Surfaces - Coatings and Films - Condensed Matter Physics - Instrumentation - Electronic - Optical and Magnetic Materials language: - iso: eng page: 302-307 publication: 'Sensors and Actuators A: Physical' publication_identifier: issn: - 0924-4247 publication_status: published publisher: Elsevier BV status: public title: Electro-thermo-mechanical analytical modeling of multilayer cantilever microactuator type: journal_article user_id: '20179' volume: 137 year: '2007' ... --- _id: '39567' author: - first_name: C. full_name: Wiegand, C. last_name: Wiegand - first_name: C. full_name: Hedayat, C. last_name: Hedayat - first_name: W. full_name: John, W. last_name: John - first_name: Lj. full_name: Radic-Weissenfeld, Lj. last_name: Radic-Weissenfeld - first_name: Ulrich full_name: Hilleringmann, Ulrich id: '20179' last_name: Hilleringmann citation: ama: 'Wiegand C, Hedayat C, John W, Radic-Weissenfeld Lj, Hilleringmann U. Nonlinear Identification of Complex Systems Using Radial Basis Function Networks and Model Order Reduction. In: 2007 IEEE International Symposium on Electromagnetic Compatibility. IEEE; 2007. doi:10.1109/isemc.2007.145' apa: Wiegand, C., Hedayat, C., John, W., Radic-Weissenfeld, Lj., & Hilleringmann, U. (2007). Nonlinear Identification of Complex Systems Using Radial Basis Function Networks and Model Order Reduction. 2007 IEEE International Symposium on Electromagnetic Compatibility. https://doi.org/10.1109/isemc.2007.145 bibtex: '@inproceedings{Wiegand_Hedayat_John_Radic-Weissenfeld_Hilleringmann_2007, title={Nonlinear Identification of Complex Systems Using Radial Basis Function Networks and Model Order Reduction}, DOI={10.1109/isemc.2007.145}, booktitle={2007 IEEE International Symposium on Electromagnetic Compatibility}, publisher={IEEE}, author={Wiegand, C. and Hedayat, C. and John, W. and Radic-Weissenfeld, Lj. and Hilleringmann, Ulrich}, year={2007} }' chicago: Wiegand, C., C. Hedayat, W. John, Lj. Radic-Weissenfeld, and Ulrich Hilleringmann. “Nonlinear Identification of Complex Systems Using Radial Basis Function Networks and Model Order Reduction.” In 2007 IEEE International Symposium on Electromagnetic Compatibility. IEEE, 2007. https://doi.org/10.1109/isemc.2007.145. ieee: 'C. Wiegand, C. Hedayat, W. John, Lj. Radic-Weissenfeld, and U. Hilleringmann, “Nonlinear Identification of Complex Systems Using Radial Basis Function Networks and Model Order Reduction,” 2007, doi: 10.1109/isemc.2007.145.' mla: Wiegand, C., et al. “Nonlinear Identification of Complex Systems Using Radial Basis Function Networks and Model Order Reduction.” 2007 IEEE International Symposium on Electromagnetic Compatibility, IEEE, 2007, doi:10.1109/isemc.2007.145. short: 'C. Wiegand, C. Hedayat, W. John, Lj. Radic-Weissenfeld, U. Hilleringmann, in: 2007 IEEE International Symposium on Electromagnetic Compatibility, IEEE, 2007.' date_created: 2023-01-24T12:18:39Z date_updated: 2023-03-22T10:33:14Z department: - _id: '59' doi: 10.1109/isemc.2007.145 language: - iso: eng publication: 2007 IEEE International Symposium on Electromagnetic Compatibility publication_status: published publisher: IEEE status: public title: Nonlinear Identification of Complex Systems Using Radial Basis Function Networks and Model Order Reduction type: conference user_id: '20179' year: '2007' ... --- _id: '39573' author: - first_name: P. full_name: Scholz, P. last_name: Scholz - first_name: M. full_name: Dierkes, M. last_name: Dierkes - first_name: Ulrich full_name: Hilleringmann, Ulrich id: '20179' last_name: Hilleringmann citation: ama: 'Scholz P, Dierkes M, Hilleringmann U. 6I-3 Low-Cost Transceiver Unit for SAW-Sensors Using Customized Hardware Components. In: 2006 IEEE Ultrasonics Symposium. IEEE; 2007. doi:10.1109/ultsym.2006.223' apa: Scholz, P., Dierkes, M., & Hilleringmann, U. (2007). 6I-3 Low-Cost Transceiver Unit for SAW-Sensors Using Customized Hardware Components. 2006 IEEE Ultrasonics Symposium. https://doi.org/10.1109/ultsym.2006.223 bibtex: '@inproceedings{Scholz_Dierkes_Hilleringmann_2007, title={6I-3 Low-Cost Transceiver Unit for SAW-Sensors Using Customized Hardware Components}, DOI={10.1109/ultsym.2006.223}, booktitle={2006 IEEE Ultrasonics Symposium}, publisher={IEEE}, author={Scholz, P. and Dierkes, M. and Hilleringmann, Ulrich}, year={2007} }' chicago: Scholz, P., M. Dierkes, and Ulrich Hilleringmann. “6I-3 Low-Cost Transceiver Unit for SAW-Sensors Using Customized Hardware Components.” In 2006 IEEE Ultrasonics Symposium. IEEE, 2007. https://doi.org/10.1109/ultsym.2006.223. ieee: 'P. Scholz, M. Dierkes, and U. Hilleringmann, “6I-3 Low-Cost Transceiver Unit for SAW-Sensors Using Customized Hardware Components,” 2007, doi: 10.1109/ultsym.2006.223.' mla: Scholz, P., et al. “6I-3 Low-Cost Transceiver Unit for SAW-Sensors Using Customized Hardware Components.” 2006 IEEE Ultrasonics Symposium, IEEE, 2007, doi:10.1109/ultsym.2006.223. short: 'P. Scholz, M. Dierkes, U. Hilleringmann, in: 2006 IEEE Ultrasonics Symposium, IEEE, 2007.' date_created: 2023-01-24T12:21:26Z date_updated: 2023-03-22T10:33:30Z department: - _id: '59' doi: 10.1109/ultsym.2006.223 language: - iso: eng publication: 2006 IEEE Ultrasonics Symposium publication_status: published publisher: IEEE status: public title: 6I-3 Low-Cost Transceiver Unit for SAW-Sensors Using Customized Hardware Components type: conference user_id: '20179' year: '2007' ... --- _id: '39842' author: - first_name: C. full_name: Pannemann, C. last_name: Pannemann - first_name: T. full_name: Diekmann, T. last_name: Diekmann - first_name: Ulrich full_name: Hilleringmann, Ulrich id: '20179' last_name: Hilleringmann - first_name: U. full_name: Schurmann, U. last_name: Schurmann - first_name: M. full_name: Scharnberg, M. last_name: Scharnberg - first_name: V. full_name: Zaporojtchenko, V. last_name: Zaporojtchenko - first_name: R. full_name: Adelung, R. last_name: Adelung - first_name: F. full_name: Faupel, F. last_name: Faupel citation: ama: 'Pannemann C, Diekmann T, Hilleringmann U, et al. Encapsulating the active Layer of organic Thin-Film Transistors. In: Polytronic 2005 - 5th International Conference on Polymers and Adhesives in Microelectronics and Photonics. IEEE; 2006. doi:10.1109/polytr.2005.1596488' apa: Pannemann, C., Diekmann, T., Hilleringmann, U., Schurmann, U., Scharnberg, M., Zaporojtchenko, V., Adelung, R., & Faupel, F. (2006). Encapsulating the active Layer of organic Thin-Film Transistors. Polytronic 2005 - 5th International Conference on Polymers and Adhesives in Microelectronics and Photonics. https://doi.org/10.1109/polytr.2005.1596488 bibtex: '@inproceedings{Pannemann_Diekmann_Hilleringmann_Schurmann_Scharnberg_Zaporojtchenko_Adelung_Faupel_2006, title={Encapsulating the active Layer of organic Thin-Film Transistors}, DOI={10.1109/polytr.2005.1596488}, booktitle={Polytronic 2005 - 5th International Conference on Polymers and Adhesives in Microelectronics and Photonics}, publisher={IEEE}, author={Pannemann, C. and Diekmann, T. and Hilleringmann, Ulrich and Schurmann, U. and Scharnberg, M. and Zaporojtchenko, V. and Adelung, R. and Faupel, F.}, year={2006} }' chicago: Pannemann, C., T. Diekmann, Ulrich Hilleringmann, U. Schurmann, M. Scharnberg, V. Zaporojtchenko, R. Adelung, and F. Faupel. “Encapsulating the Active Layer of Organic Thin-Film Transistors.” In Polytronic 2005 - 5th International Conference on Polymers and Adhesives in Microelectronics and Photonics. IEEE, 2006. https://doi.org/10.1109/polytr.2005.1596488. ieee: 'C. Pannemann et al., “Encapsulating the active Layer of organic Thin-Film Transistors,” 2006, doi: 10.1109/polytr.2005.1596488.' mla: Pannemann, C., et al. “Encapsulating the Active Layer of Organic Thin-Film Transistors.” Polytronic 2005 - 5th International Conference on Polymers and Adhesives in Microelectronics and Photonics, IEEE, 2006, doi:10.1109/polytr.2005.1596488. short: 'C. Pannemann, T. Diekmann, U. Hilleringmann, U. Schurmann, M. Scharnberg, V. Zaporojtchenko, R. Adelung, F. Faupel, in: Polytronic 2005 - 5th International Conference on Polymers and Adhesives in Microelectronics and Photonics, IEEE, 2006.' date_created: 2023-01-25T08:35:55Z date_updated: 2023-03-22T10:35:28Z department: - _id: '59' doi: 10.1109/polytr.2005.1596488 language: - iso: eng publication: Polytronic 2005 - 5th International Conference on Polymers and Adhesives in Microelectronics and Photonics publication_status: published publisher: IEEE status: public title: Encapsulating the active Layer of organic Thin-Film Transistors type: conference user_id: '20179' year: '2006' ... --- _id: '39846' abstract: - lang: eng text: This article reports degradation experiments on organic thin film transistors using the small organic molecule pentacene as the semiconducting material. Starting with degradation inert p-type silicon wafers as the substrate and SiO2 as the gate dielectric, we show the influence of temperature and exposure to ambient air on the charge carrier field-effect mobility, on-off-ratio, and threshold-voltage. The devices were found to have unambiguously degraded over 3 orders of magnitude in maximum on-current and charge carrier field-effect mobility, but they still operated after a period of 9 months in ambient air conditions. A thermal treatment was carried out in vacuum conditions and revealed a degradation of the charge carrier field-effect mobility, maximum on-current, and threshold voltage. author: - first_name: Ch. full_name: Pannemann, Ch. last_name: Pannemann - first_name: T. full_name: Diekmann, T. last_name: Diekmann - first_name: Ulrich full_name: Hilleringmann, Ulrich id: '20179' last_name: Hilleringmann citation: ama: Pannemann Ch, Diekmann T, Hilleringmann U. Degradation of organic field-effect transistors made of pentacene. Journal of Materials Research. 2005;19(7):1999-2002. doi:10.1557/jmr.2004.0267 apa: Pannemann, Ch., Diekmann, T., & Hilleringmann, U. (2005). Degradation of organic field-effect transistors made of pentacene. Journal of Materials Research, 19(7), 1999–2002. https://doi.org/10.1557/jmr.2004.0267 bibtex: '@article{Pannemann_Diekmann_Hilleringmann_2005, title={Degradation of organic field-effect transistors made of pentacene}, volume={19}, DOI={10.1557/jmr.2004.0267}, number={7}, journal={Journal of Materials Research}, publisher={Springer Science and Business Media LLC}, author={Pannemann, Ch. and Diekmann, T. and Hilleringmann, Ulrich}, year={2005}, pages={1999–2002} }' chicago: 'Pannemann, Ch., T. Diekmann, and Ulrich Hilleringmann. “Degradation of Organic Field-Effect Transistors Made of Pentacene.” Journal of Materials Research 19, no. 7 (2005): 1999–2002. https://doi.org/10.1557/jmr.2004.0267.' ieee: 'Ch. Pannemann, T. Diekmann, and U. Hilleringmann, “Degradation of organic field-effect transistors made of pentacene,” Journal of Materials Research, vol. 19, no. 7, pp. 1999–2002, 2005, doi: 10.1557/jmr.2004.0267.' mla: Pannemann, Ch., et al. “Degradation of Organic Field-Effect Transistors Made of Pentacene.” Journal of Materials Research, vol. 19, no. 7, Springer Science and Business Media LLC, 2005, pp. 1999–2002, doi:10.1557/jmr.2004.0267. short: Ch. Pannemann, T. Diekmann, U. Hilleringmann, Journal of Materials Research 19 (2005) 1999–2002. date_created: 2023-01-25T08:37:47Z date_updated: 2023-03-21T10:06:18Z department: - _id: '59' doi: 10.1557/jmr.2004.0267 intvolume: ' 19' issue: '7' keyword: - Mechanical Engineering - Mechanics of Materials - Condensed Matter Physics - General Materials Science language: - iso: eng page: 1999-2002 publication: Journal of Materials Research publication_identifier: issn: - 0884-2914 - 2044-5326 publication_status: published publisher: Springer Science and Business Media LLC status: public title: Degradation of organic field-effect transistors made of pentacene type: journal_article user_id: '20179' volume: 19 year: '2005' ... --- _id: '39848' author: - first_name: Ch. full_name: Pannemann, Ch. last_name: Pannemann - first_name: T. full_name: Diekmann, T. last_name: Diekmann - first_name: Ulrich full_name: Hilleringmann, Ulrich id: '20179' last_name: Hilleringmann citation: ama: 'Pannemann Ch, Diekmann T, Hilleringmann U. On the degradation of organic field-effect transistors. In: Proceedings. The 16th International Conference on Microelectronics, 2004. ICM 2004. IEEE; 2005. doi:10.1109/icm.2004.1434210' apa: Pannemann, Ch., Diekmann, T., & Hilleringmann, U. (2005). On the degradation of organic field-effect transistors. Proceedings. The 16th International Conference on Microelectronics, 2004. ICM 2004. https://doi.org/10.1109/icm.2004.1434210 bibtex: '@inproceedings{Pannemann_Diekmann_Hilleringmann_2005, title={On the degradation of organic field-effect transistors}, DOI={10.1109/icm.2004.1434210}, booktitle={Proceedings. The 16th International Conference on Microelectronics, 2004. ICM 2004.}, publisher={IEEE}, author={Pannemann, Ch. and Diekmann, T. and Hilleringmann, Ulrich}, year={2005} }' chicago: Pannemann, Ch., T. Diekmann, and Ulrich Hilleringmann. “On the Degradation of Organic Field-Effect Transistors.” In Proceedings. The 16th International Conference on Microelectronics, 2004. ICM 2004. IEEE, 2005. https://doi.org/10.1109/icm.2004.1434210. ieee: 'Ch. Pannemann, T. Diekmann, and U. Hilleringmann, “On the degradation of organic field-effect transistors,” 2005, doi: 10.1109/icm.2004.1434210.' mla: Pannemann, Ch., et al. “On the Degradation of Organic Field-Effect Transistors.” Proceedings. The 16th International Conference on Microelectronics, 2004. ICM 2004., IEEE, 2005, doi:10.1109/icm.2004.1434210. short: 'Ch. Pannemann, T. Diekmann, U. Hilleringmann, in: Proceedings. The 16th International Conference on Microelectronics, 2004. ICM 2004., IEEE, 2005.' date_created: 2023-01-25T08:38:15Z date_updated: 2023-03-22T10:36:03Z department: - _id: '59' doi: 10.1109/icm.2004.1434210 language: - iso: eng publication: Proceedings. The 16th International Conference on Microelectronics, 2004. ICM 2004. publication_status: published publisher: IEEE status: public title: On the degradation of organic field-effect transistors type: conference user_id: '20179' year: '2005' ... --- _id: '39349' abstract: - lang: eng text: This article reports degradation experiments on organic thin film transistors using the small organic molecule pentacene as the semiconducting material. Starting with degradation inert p-type silicon wafers as the substrate and SiO2 as the gate dielectric, we show the influence of temperature and exposure to ambient air on the charge carrier field-effect mobility, on-off-ratio, and threshold-voltage. The devices were found to have unambiguously degraded over 3 orders of magnitude in maximum on-current and charge carrier field-effect mobility, but they still operated after a period of 9 months in ambient air conditions. A thermal treatment was carried out in vacuum conditions and revealed a degradation of the charge carrier field-effect mobility, maximum on-current, and threshold voltage. author: - first_name: Ch. full_name: Pannemann, Ch. last_name: Pannemann - first_name: T. full_name: Diekmann, T. last_name: Diekmann - first_name: Ulrich full_name: Hilleringmann, Ulrich id: '20179' last_name: Hilleringmann citation: ama: Pannemann Ch, Diekmann T, Hilleringmann U. Degradation of organic field-effect transistors made of pentacene. Journal of Materials Research. 2005;19(7):1999-2002. doi:10.1557/jmr.2004.0267 apa: Pannemann, Ch., Diekmann, T., & Hilleringmann, U. (2005). Degradation of organic field-effect transistors made of pentacene. Journal of Materials Research, 19(7), 1999–2002. https://doi.org/10.1557/jmr.2004.0267 bibtex: '@article{Pannemann_Diekmann_Hilleringmann_2005, title={Degradation of organic field-effect transistors made of pentacene}, volume={19}, DOI={10.1557/jmr.2004.0267}, number={7}, journal={Journal of Materials Research}, publisher={Springer Science and Business Media LLC}, author={Pannemann, Ch. and Diekmann, T. and Hilleringmann, Ulrich}, year={2005}, pages={1999–2002} }' chicago: 'Pannemann, Ch., T. Diekmann, and Ulrich Hilleringmann. “Degradation of Organic Field-Effect Transistors Made of Pentacene.” Journal of Materials Research 19, no. 7 (2005): 1999–2002. https://doi.org/10.1557/jmr.2004.0267.' ieee: 'Ch. Pannemann, T. Diekmann, and U. Hilleringmann, “Degradation of organic field-effect transistors made of pentacene,” Journal of Materials Research, vol. 19, no. 7, pp. 1999–2002, 2005, doi: 10.1557/jmr.2004.0267.' mla: Pannemann, Ch., et al. “Degradation of Organic Field-Effect Transistors Made of Pentacene.” Journal of Materials Research, vol. 19, no. 7, Springer Science and Business Media LLC, 2005, pp. 1999–2002, doi:10.1557/jmr.2004.0267. short: Ch. Pannemann, T. Diekmann, U. Hilleringmann, Journal of Materials Research 19 (2005) 1999–2002. date_created: 2023-01-24T09:24:41Z date_updated: 2023-03-22T10:38:56Z department: - _id: '59' doi: 10.1557/jmr.2004.0267 intvolume: ' 19' issue: '7' keyword: - Mechanical Engineering - Mechanics of Materials - Condensed Matter Physics - General Materials Science language: - iso: eng page: 1999-2002 publication: Journal of Materials Research publication_identifier: issn: - 0884-2914 - 2044-5326 publication_status: published publisher: Springer Science and Business Media LLC status: public title: Degradation of organic field-effect transistors made of pentacene type: journal_article user_id: '20179' volume: 19 year: '2005' ... --- _id: '39574' article_number: '024104' author: - first_name: M. full_name: Scharnberg, M. last_name: Scharnberg - first_name: J. full_name: Hu, J. last_name: Hu - first_name: J. full_name: Kanzow, J. last_name: Kanzow - first_name: K. full_name: Rätzke, K. last_name: Rätzke - first_name: R. full_name: Adelung, R. last_name: Adelung - first_name: F. full_name: Faupel, F. last_name: Faupel - first_name: C. full_name: Pannemann, C. last_name: Pannemann - first_name: Ulrich full_name: Hilleringmann, Ulrich id: '20179' last_name: Hilleringmann - first_name: S. full_name: Meyer, S. last_name: Meyer - first_name: J. full_name: Pflaum, J. last_name: Pflaum citation: ama: Scharnberg M, Hu J, Kanzow J, et al. Radiotracer measurements as a sensitive tool for the detection of metal penetration in molecular-based organic electronics. Applied Physics Letters. 2005;86(2). doi:10.1063/1.1849845 apa: Scharnberg, M., Hu, J., Kanzow, J., Rätzke, K., Adelung, R., Faupel, F., Pannemann, C., Hilleringmann, U., Meyer, S., & Pflaum, J. (2005). Radiotracer measurements as a sensitive tool for the detection of metal penetration in molecular-based organic electronics. Applied Physics Letters, 86(2), Article 024104. https://doi.org/10.1063/1.1849845 bibtex: '@article{Scharnberg_Hu_Kanzow_Rätzke_Adelung_Faupel_Pannemann_Hilleringmann_Meyer_Pflaum_2005, title={Radiotracer measurements as a sensitive tool for the detection of metal penetration in molecular-based organic electronics}, volume={86}, DOI={10.1063/1.1849845}, number={2024104}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Scharnberg, M. and Hu, J. and Kanzow, J. and Rätzke, K. and Adelung, R. and Faupel, F. and Pannemann, C. and Hilleringmann, Ulrich and Meyer, S. and Pflaum, J.}, year={2005} }' chicago: Scharnberg, M., J. Hu, J. Kanzow, K. Rätzke, R. Adelung, F. Faupel, C. Pannemann, Ulrich Hilleringmann, S. Meyer, and J. Pflaum. “Radiotracer Measurements as a Sensitive Tool for the Detection of Metal Penetration in Molecular-Based Organic Electronics.” Applied Physics Letters 86, no. 2 (2005). https://doi.org/10.1063/1.1849845. ieee: 'M. Scharnberg et al., “Radiotracer measurements as a sensitive tool for the detection of metal penetration in molecular-based organic electronics,” Applied Physics Letters, vol. 86, no. 2, Art. no. 024104, 2005, doi: 10.1063/1.1849845.' mla: Scharnberg, M., et al. “Radiotracer Measurements as a Sensitive Tool for the Detection of Metal Penetration in Molecular-Based Organic Electronics.” Applied Physics Letters, vol. 86, no. 2, 024104, AIP Publishing, 2005, doi:10.1063/1.1849845. short: M. Scharnberg, J. Hu, J. Kanzow, K. Rätzke, R. Adelung, F. Faupel, C. Pannemann, U. Hilleringmann, S. Meyer, J. Pflaum, Applied Physics Letters 86 (2005). date_created: 2023-01-24T12:21:59Z date_updated: 2023-03-22T10:34:05Z department: - _id: '59' doi: 10.1063/1.1849845 intvolume: ' 86' issue: '2' keyword: - Physics and Astronomy (miscellaneous) language: - iso: eng publication: Applied Physics Letters publication_identifier: issn: - 0003-6951 - 1077-3118 publication_status: published publisher: AIP Publishing status: public title: Radiotracer measurements as a sensitive tool for the detection of metal penetration in molecular-based organic electronics type: journal_article user_id: '20179' volume: 86 year: '2005' ...