---
_id: '18632'
abstract:
- lang: eng
  text: "We present measurements of the effective electron mass in biaxial tensile
    strained silicon on insulator (SSOI) material with 1.2 GPa stress and in unstrained
    SOI. Hall-bar metal oxide semiconductor field effect transistors on 60 nm SSOI
    and SOI were fabricated and Shubnikov–de Haas oscillations in the temperature
    range of T=0.4–4 K for magnetic fields of B=0–10 T were measured. The effective
    electron mass in SSOI and SOI samples was determined as mt=(0.20±0.01)m0. This
    result is in excellent agreement with first-principles calculations of the\r\neffective
    electron mass in the presence of strain."
article_number: '182101'
article_type: original
author:
- first_name: Sebastian F.
  full_name: Feste, Sebastian F.
  last_name: Feste
- first_name: Thomas
  full_name: Schäpers, Thomas
  last_name: Schäpers
- first_name: Dan
  full_name: Buca, Dan
  last_name: Buca
- first_name: Qing Tai
  full_name: Zhao, Qing Tai
  last_name: Zhao
- first_name: Joachim
  full_name: Knoch, Joachim
  last_name: Knoch
- first_name: Mohammed
  full_name: Bouhassoune, Mohammed
  last_name: Bouhassoune
- first_name: Arno
  full_name: Schindlmayr, Arno
  id: '458'
  last_name: Schindlmayr
  orcid: 0000-0002-4855-071X
- first_name: Siegfried
  full_name: Mantl, Siegfried
  last_name: Mantl
citation:
  ama: Feste SF, Schäpers T, Buca D, et al. Measurement of effective electron mass
    in biaxial tensile strained silicon on insulator. <i>Applied Physics Letters</i>.
    2009;95(18). doi:<a href="https://doi.org/10.1063/1.3254330">10.1063/1.3254330</a>
  apa: Feste, S. F., Schäpers, T., Buca, D., Zhao, Q. T., Knoch, J., Bouhassoune,
    M., Schindlmayr, A., &#38; Mantl, S. (2009). Measurement of effective electron
    mass in biaxial tensile strained silicon on insulator. <i>Applied Physics Letters</i>,
    <i>95</i>(18), Article 182101. <a href="https://doi.org/10.1063/1.3254330">https://doi.org/10.1063/1.3254330</a>
  bibtex: '@article{Feste_Schäpers_Buca_Zhao_Knoch_Bouhassoune_Schindlmayr_Mantl_2009,
    title={Measurement of effective electron mass in biaxial tensile strained silicon
    on insulator}, volume={95}, DOI={<a href="https://doi.org/10.1063/1.3254330">10.1063/1.3254330</a>},
    number={18182101}, journal={Applied Physics Letters}, publisher={American Institute
    of Physics}, author={Feste, Sebastian F. and Schäpers, Thomas and Buca, Dan and
    Zhao, Qing Tai and Knoch, Joachim and Bouhassoune, Mohammed and Schindlmayr, Arno
    and Mantl, Siegfried}, year={2009} }'
  chicago: Feste, Sebastian F., Thomas Schäpers, Dan Buca, Qing Tai Zhao, Joachim
    Knoch, Mohammed Bouhassoune, Arno Schindlmayr, and Siegfried Mantl. “Measurement
    of Effective Electron Mass in Biaxial Tensile Strained Silicon on Insulator.”
    <i>Applied Physics Letters</i> 95, no. 18 (2009). <a href="https://doi.org/10.1063/1.3254330">https://doi.org/10.1063/1.3254330</a>.
  ieee: 'S. F. Feste <i>et al.</i>, “Measurement of effective electron mass in biaxial
    tensile strained silicon on insulator,” <i>Applied Physics Letters</i>, vol. 95,
    no. 18, Art. no. 182101, 2009, doi: <a href="https://doi.org/10.1063/1.3254330">10.1063/1.3254330</a>.'
  mla: Feste, Sebastian F., et al. “Measurement of Effective Electron Mass in Biaxial
    Tensile Strained Silicon on Insulator.” <i>Applied Physics Letters</i>, vol. 95,
    no. 18, 182101, American Institute of Physics, 2009, doi:<a href="https://doi.org/10.1063/1.3254330">10.1063/1.3254330</a>.
  short: S.F. Feste, T. Schäpers, D. Buca, Q.T. Zhao, J. Knoch, M. Bouhassoune, A.
    Schindlmayr, S. Mantl, Applied Physics Letters 95 (2009).
date_created: 2020-08-28T22:24:30Z
date_updated: 2025-12-16T08:10:54Z
ddc:
- '530'
department:
- _id: '296'
- _id: '170'
- _id: '230'
doi: 10.1063/1.3254330
external_id:
  isi:
  - '000271666800034'
file:
- access_level: open_access
  content_type: application/pdf
  creator: schindlm
  date_created: 2020-08-28T22:28:31Z
  date_updated: 2020-08-30T15:29:43Z
  description: © 2009 American Institute of Physics
  file_id: '18633'
  file_name: 1.3254330.pdf
  file_size: 198836
  relation: main_file
  title: Measurement of effective electron mass in biaxial tensile strained silicon
    on insulator
file_date_updated: 2020-08-30T15:29:43Z
has_accepted_license: '1'
intvolume: '        95'
isi: '1'
issue: '18'
language:
- iso: eng
oa: '1'
publication: Applied Physics Letters
publication_identifier:
  eissn:
  - 1077-3118
  issn:
  - 0003-6951
publication_status: published
publisher: American Institute of Physics
quality_controlled: '1'
status: public
title: Measurement of effective electron mass in biaxial tensile strained silicon
  on insulator
type: journal_article
user_id: '16199'
volume: 95
year: '2009'
...