---
_id: '24264'
abstract:
- lang: eng
  text: Electronic systems, like they are embedded in road vehicles, have to be compliant
    to functional safety standards like ISO 26262 [1], which limit the impacts of
    malfunctions for safety critical systems. ISO 26262, for instance, defines different
    safety levels for road vehicles, which require different means and measures for
    a safety compliant system and its development process like risk analysis and fault
    effect simulation. For fault effect simulation it is important to investigate
    the impact of physical and hardware related effects to the correct function of
    a system. This article first studies code and model mutations for fault injection
    in the context of fault effect simulation through different system abstraction
    levels. It demonstrates how high level mutations correlate to bit flips of software
    binaries by examples from the TriCore™ instruction set and finally presents a
    virtual platform based implementation for automated injection of bit flip based
    mutations into software binaries. Experimental results demonstrate the efficiency
    of the implemented approach.
author:
- first_name: Peer
  full_name: Adelt, Peer
  id: '5603'
  last_name: Adelt
- first_name: Bastian
  full_name: Koppelmann, Bastian
  id: '25260'
  last_name: Koppelmann
- first_name: Wolfgang
  full_name: Müller, Wolfgang
  id: '16243'
  last_name: Müller
- first_name: Markus
  full_name: Becker, Markus
  last_name: Becker
- first_name: Bernd
  full_name: Kleinjohann, Bernd
  last_name: Kleinjohann
- first_name: Christoph
  full_name: Scheytt, Christoph
  id: '37144'
  last_name: Scheytt
citation:
  ama: 'Adelt P, Koppelmann B, Müller W, Becker M, Kleinjohann B, Scheytt C. Fast
    Dynamic Fault Injection for Virtual Microcontroller Platforms. In: <i>Proceedings
    of the IEEE/IFIP International Conference on VLSI (VLSI-SOC)</i>. ; 2016. doi:<a
    href="https://doi.org/10.1109/VLSI-SoC.2016.7753545">10.1109/VLSI-SoC.2016.7753545</a>'
  apa: Adelt, P., Koppelmann, B., Müller, W., Becker, M., Kleinjohann, B., &#38; Scheytt,
    C. (2016). Fast Dynamic Fault Injection for Virtual Microcontroller Platforms.
    <i>Proceedings of the IEEE/IFIP International Conference on VLSI (VLSI-SOC)</i>.
    <a href="https://doi.org/10.1109/VLSI-SoC.2016.7753545">https://doi.org/10.1109/VLSI-SoC.2016.7753545</a>
  bibtex: '@inproceedings{Adelt_Koppelmann_Müller_Becker_Kleinjohann_Scheytt_2016,
    place={Tallin, Estonia}, title={Fast Dynamic Fault Injection for Virtual Microcontroller
    Platforms}, DOI={<a href="https://doi.org/10.1109/VLSI-SoC.2016.7753545">10.1109/VLSI-SoC.2016.7753545</a>},
    booktitle={Proceedings of the IEEE/IFIP International Conference on VLSI (VLSI-SOC)},
    author={Adelt, Peer and Koppelmann, Bastian and Müller, Wolfgang and Becker, Markus
    and Kleinjohann, Bernd and Scheytt, Christoph}, year={2016} }'
  chicago: Adelt, Peer, Bastian Koppelmann, Wolfgang Müller, Markus Becker, Bernd
    Kleinjohann, and Christoph Scheytt. “Fast Dynamic Fault Injection for Virtual
    Microcontroller Platforms.” In <i>Proceedings of the IEEE/IFIP International Conference
    on VLSI (VLSI-SOC)</i>. Tallin, Estonia, 2016. <a href="https://doi.org/10.1109/VLSI-SoC.2016.7753545">https://doi.org/10.1109/VLSI-SoC.2016.7753545</a>.
  ieee: 'P. Adelt, B. Koppelmann, W. Müller, M. Becker, B. Kleinjohann, and C. Scheytt,
    “Fast Dynamic Fault Injection for Virtual Microcontroller Platforms,” 2016, doi:
    <a href="https://doi.org/10.1109/VLSI-SoC.2016.7753545">10.1109/VLSI-SoC.2016.7753545</a>.'
  mla: Adelt, Peer, et al. “Fast Dynamic Fault Injection for Virtual Microcontroller
    Platforms.” <i>Proceedings of the IEEE/IFIP International Conference on VLSI (VLSI-SOC)</i>,
    2016, doi:<a href="https://doi.org/10.1109/VLSI-SoC.2016.7753545">10.1109/VLSI-SoC.2016.7753545</a>.
  short: 'P. Adelt, B. Koppelmann, W. Müller, M. Becker, B. Kleinjohann, C. Scheytt,
    in: Proceedings of the IEEE/IFIP International Conference on VLSI (VLSI-SOC),
    Tallin, Estonia, 2016.'
conference:
  end_date: 2016.09.28
  start_date: 2016.09.26
date_created: 2021-09-13T09:44:30Z
date_updated: 2022-02-17T13:57:45Z
department:
- _id: '58'
doi: 10.1109/VLSI-SoC.2016.7753545
language:
- iso: eng
place: Tallin, Estonia
publication: Proceedings of the IEEE/IFIP International Conference on VLSI (VLSI-SOC)
publication_identifier:
  eissn:
  - 2324-8440
related_material:
  link:
  - relation: confirmation
    url: https://ieeexplore.ieee.org/document/7753545
status: public
title: Fast Dynamic Fault Injection for Virtual Microcontroller Platforms
type: conference
user_id: '15931'
year: '2016'
...