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Noé, ELECTRICAL ENGINEERING 84 (2002) 71–73.","bibtex":"@article{Mirvoda_Sandel_Wust_Hinz_Noé_2002, title={Linear detection of optical polarization mode dispersion by arrival time modulation}, volume={84}, DOI={<a href=\"https://doi.org/10.1007/S00202-001-0112-4\">10.1007/S00202-001-0112-4</a>}, number={2}, journal={ELECTRICAL ENGINEERING}, author={Mirvoda, V and Sandel, D and Wust, F and Hinz, S and Noé, Reinhold}, year={2002}, pages={71–73} }","mla":"Mirvoda, V., et al. “Linear Detection of Optical Polarization Mode Dispersion by Arrival Time Modulation.” <i>ELECTRICAL ENGINEERING</i>, vol. 84, no. 2, 2002, pp. 71–73, doi:<a href=\"https://doi.org/10.1007/S00202-001-0112-4\">10.1007/S00202-001-0112-4</a>.","chicago":"Mirvoda, V, D Sandel, F Wust, S Hinz, and Reinhold Noé. “Linear Detection of Optical Polarization Mode Dispersion by Arrival Time Modulation.” <i>ELECTRICAL ENGINEERING</i> 84, no. 2 (2002): 71–73. <a href=\"https://doi.org/10.1007/S00202-001-0112-4\">https://doi.org/10.1007/S00202-001-0112-4</a>.","ieee":"V. Mirvoda, D. Sandel, F. Wust, S. Hinz, and R. Noé, “Linear detection of optical polarization mode dispersion by arrival time modulation,” <i>ELECTRICAL ENGINEERING</i>, vol. 84, no. 2, pp. 71–73, 2002, doi: <a href=\"https://doi.org/10.1007/S00202-001-0112-4\">10.1007/S00202-001-0112-4</a>.","ama":"Mirvoda V, Sandel D, Wust F, Hinz S, Noé R. Linear detection of optical polarization mode dispersion by arrival time modulation. <i>ELECTRICAL ENGINEERING</i>. 2002;84(2):71-73. doi:<a href=\"https://doi.org/10.1007/S00202-001-0112-4\">10.1007/S00202-001-0112-4</a>"},"intvolume":"        84","page":"71-73","year":"2002","issue":"2","publication_identifier":{"issn":["0948-7921"]},"language":[{"iso":"eng"}],"user_id":"14931","department":[{"_id":"56"}],"_id":"38367","status":"public","type":"journal_article","publication":"ELECTRICAL ENGINEERING"},{"issue":"1-4","publication_status":"published","publication_identifier":{"issn":["0167-9317"]},"citation":{"bibtex":"@article{Horstmann_Hilleringmann_Goser_2002, title={Characterisation of sub-100 nm-MOS-transistors processed by optical lithography and a sidewall-etchback technique}, volume={30}, DOI={<a href=\"https://doi.org/10.1016/0167-9317(95)00280-4\">10.1016/0167-9317(95)00280-4</a>}, number={1–4}, journal={Microelectronic Engineering}, publisher={Elsevier BV}, author={Horstmann, J.T. and Hilleringmann, Ulrich and Goser, K.}, year={2002}, pages={431–434} }","mla":"Horstmann, J. T., et al. “Characterisation of Sub-100 Nm-MOS-Transistors Processed by Optical Lithography and a Sidewall-Etchback Technique.” <i>Microelectronic Engineering</i>, vol. 30, no. 1–4, Elsevier BV, 2002, pp. 431–34, doi:<a href=\"https://doi.org/10.1016/0167-9317(95)00280-4\">10.1016/0167-9317(95)00280-4</a>.","short":"J.T. Horstmann, U. Hilleringmann, K. Goser, Microelectronic Engineering 30 (2002) 431–434.","apa":"Horstmann, J. T., Hilleringmann, U., &#38; Goser, K. (2002). Characterisation of sub-100 nm-MOS-transistors processed by optical lithography and a sidewall-etchback technique. <i>Microelectronic Engineering</i>, <i>30</i>(1–4), 431–434. <a href=\"https://doi.org/10.1016/0167-9317(95)00280-4\">https://doi.org/10.1016/0167-9317(95)00280-4</a>","ama":"Horstmann JT, Hilleringmann U, Goser K. Characterisation of sub-100 nm-MOS-transistors processed by optical lithography and a sidewall-etchback technique. <i>Microelectronic Engineering</i>. 2002;30(1-4):431-434. doi:<a href=\"https://doi.org/10.1016/0167-9317(95)00280-4\">10.1016/0167-9317(95)00280-4</a>","chicago":"Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “Characterisation of Sub-100 Nm-MOS-Transistors Processed by Optical Lithography and a Sidewall-Etchback Technique.” <i>Microelectronic Engineering</i> 30, no. 1–4 (2002): 431–34. <a href=\"https://doi.org/10.1016/0167-9317(95)00280-4\">https://doi.org/10.1016/0167-9317(95)00280-4</a>.","ieee":"J. T. Horstmann, U. Hilleringmann, and K. Goser, “Characterisation of sub-100 nm-MOS-transistors processed by optical lithography and a sidewall-etchback technique,” <i>Microelectronic Engineering</i>, vol. 30, no. 1–4, pp. 431–434, 2002, doi: <a href=\"https://doi.org/10.1016/0167-9317(95)00280-4\">10.1016/0167-9317(95)00280-4</a>."},"intvolume":"        30","page":"431-434","year":"2002","date_created":"2023-01-25T09:20:20Z","author":[{"last_name":"Horstmann","full_name":"Horstmann, J.T.","first_name":"J.T."},{"id":"20179","full_name":"Hilleringmann, Ulrich","last_name":"Hilleringmann","first_name":"Ulrich"},{"full_name":"Goser, K.","last_name":"Goser","first_name":"K."}],"volume":30,"publisher":"Elsevier BV","date_updated":"2023-03-21T09:53:55Z","doi":"10.1016/0167-9317(95)00280-4","title":"Characterisation of sub-100 nm-MOS-transistors processed by optical lithography and a sidewall-etchback technique","type":"journal_article","publication":"Microelectronic Engineering","status":"public","user_id":"20179","department":[{"_id":"59"}],"_id":"39899","language":[{"iso":"eng"}],"keyword":["Electrical and Electronic Engineering","Surfaces","Coatings and Films","Condensed Matter Physics","Atomic and Molecular Physics","and Optics","Electronic","Optical and Magnetic Materials"]},{"abstract":[{"lang":"eng","text":"The influence of coherent photoexcited excitons on the absorption spectra and the Four Wave Mixing response of ZnSe/ZnMgSSe quantum wells is investigated for various polarization configurations. For purely resonant excitation at the heavy-hole-exciton a blue shift and an increasing homogeneous line width of the exciton absorption peak is found. The clear and stable blue shift shows a linear dependence on excitation fluence both in experiment and theory with different slopes for the different pump and probe polarization configurations. The equivalence of pump and probe, and Four Wave Mixing results is shown experimentally."}],"publication":"Physica B: Condensed Matter","language":[{"iso":"eng"}],"year":"2002","issue":"1-4","title":"Excitation induced shift and broadening of the exciton resonance","publisher":"North-Holland","date_created":"2023-04-02T13:26:07Z","status":"public","type":"journal_article","extern":"1","_id":"43295","user_id":"49063","department":[{"_id":"293"}],"citation":{"bibtex":"@article{Meier_Wachter_Maute_Kalt_Galbraith_Sieh_Koch_2002, title={Excitation induced shift and broadening of the exciton resonance}, volume={314}, DOI={<a href=\"https://doi.org/10.1016/S0921-4526(01)01400-4\">10.1016/S0921-4526(01)01400-4</a>}, number={1–4}, journal={Physica B: Condensed Matter}, publisher={North-Holland}, author={Meier, Torsten and Wachter, S. and Maute, M. and Kalt, H. and Galbraith, I. and Sieh, C. and Koch, S.W.}, year={2002}, pages={309–313} }","mla":"Meier, Torsten, et al. “Excitation Induced Shift and Broadening of the Exciton Resonance.” <i>Physica B: Condensed Matter</i>, vol. 314, no. 1–4, North-Holland, 2002, pp. 309–13, doi:<a href=\"https://doi.org/10.1016/S0921-4526(01)01400-4\">10.1016/S0921-4526(01)01400-4</a>.","short":"T. Meier, S. Wachter, M. Maute, H. Kalt, I. Galbraith, C. Sieh, S.W. Koch, Physica B: Condensed Matter 314 (2002) 309–313.","apa":"Meier, T., Wachter, S., Maute, M., Kalt, H., Galbraith, I., Sieh, C., &#38; Koch, S. W. (2002). Excitation induced shift and broadening of the exciton resonance. <i>Physica B: Condensed Matter</i>, <i>314</i>(1–4), 309–313. <a href=\"https://doi.org/10.1016/S0921-4526(01)01400-4\">https://doi.org/10.1016/S0921-4526(01)01400-4</a>","ieee":"T. Meier <i>et al.</i>, “Excitation induced shift and broadening of the exciton resonance,” <i>Physica B: Condensed Matter</i>, vol. 314, no. 1–4, pp. 309–313, 2002, doi: <a href=\"https://doi.org/10.1016/S0921-4526(01)01400-4\">10.1016/S0921-4526(01)01400-4</a>.","chicago":"Meier, Torsten, S. Wachter, M. Maute, H. Kalt, I. Galbraith, C. Sieh, and S.W. Koch. “Excitation Induced Shift and Broadening of the Exciton Resonance.” <i>Physica B: Condensed Matter</i> 314, no. 1–4 (2002): 309–13. <a href=\"https://doi.org/10.1016/S0921-4526(01)01400-4\">https://doi.org/10.1016/S0921-4526(01)01400-4</a>.","ama":"Meier T, Wachter S, Maute M, et al. Excitation induced shift and broadening of the exciton resonance. <i>Physica B: Condensed Matter</i>. 2002;314(1-4):309-313. doi:<a href=\"https://doi.org/10.1016/S0921-4526(01)01400-4\">10.1016/S0921-4526(01)01400-4</a>"},"page":"309-313","intvolume":"       314","publication_status":"published","main_file_link":[{"url":"https://www.sciencedirect.com/science/article/abs/pii/S0921452601014004"}],"doi":"10.1016/S0921-4526(01)01400-4","date_updated":"2023-04-02T13:26:10Z","author":[{"first_name":"Torsten","id":"344","full_name":"Meier, Torsten","orcid":"0000-0001-8864-2072","last_name":"Meier"},{"first_name":"S.","full_name":"Wachter, S.","last_name":"Wachter"},{"full_name":"Maute, M.","last_name":"Maute","first_name":"M."},{"last_name":"Kalt","full_name":"Kalt, H.","first_name":"H."},{"first_name":"I.","last_name":"Galbraith","full_name":"Galbraith, I."},{"last_name":"Sieh","full_name":"Sieh, C.","first_name":"C."},{"full_name":"Koch, S.W.","last_name":"Koch","first_name":"S.W."}],"volume":314},{"publication_identifier":{"isbn":["978-3-89129-671-4"]},"publication_status":"published","place":"München","page":"32","citation":{"ama":"Müller I. ars memoriae. Intertextuelle Referenzen in Kathrin Schmidts \"Gunnar-Lennefsen-Expedition zu Grass’ Roman “Der Butt.” In: Platen E, ed. <i>Perspektivensuche</i>. Zur Darstellung von Zeitgeschichte in deutschsprachiger Gegenwartsliteratur, Bd. 2. iudicium Verlag; 2002:32.","chicago":"Müller, Inez. “ars memoriae. Intertextuelle Referenzen in Kathrin Schmidts \"Gunnar-Lennefsen-Expedition zu Grass’ Roman ‘Der Butt.’” In <i>Perspektivensuche</i>, edited by Edgar Platen, 32. Zur Darstellung von Zeitgeschichte in deutschsprachiger Gegenwartsliteratur, Bd. 2. München: iudicium Verlag, 2002.","ieee":"I. Müller, “ars memoriae. Intertextuelle Referenzen in Kathrin Schmidts \"Gunnar-Lennefsen-Expedition zu Grass’ Roman ‘Der Butt,’” in <i>Perspektivensuche</i>, Universität Göteborg, 2002, p. 32.","apa":"Müller, I. (2002). ars memoriae. Intertextuelle Referenzen in Kathrin Schmidts \"Gunnar-Lennefsen-Expedition zu Grass’ Roman “Der Butt.” In E. Platen (Ed.), <i>Perspektivensuche</i> (p. 32). iudicium Verlag.","short":"I. Müller, in: E. Platen (Ed.), Perspektivensuche, iudicium Verlag, München, 2002, p. 32.","mla":"Müller, Inez. “ars memoriae. Intertextuelle Referenzen in Kathrin Schmidts \"Gunnar-Lennefsen-Expedition zu Grass’ Roman ‘Der Butt.’” <i>Perspektivensuche</i>, edited by Edgar Platen, iudicium Verlag, 2002, p. 32.","bibtex":"@inproceedings{Müller_2002, place={München}, series={Zur Darstellung von Zeitgeschichte in deutschsprachiger Gegenwartsliteratur, Bd. 2}, title={ars memoriae. Intertextuelle Referenzen in Kathrin Schmidts \"Gunnar-Lennefsen-Expedition zu Grass’ Roman “Der Butt”}, booktitle={Perspektivensuche}, publisher={iudicium Verlag}, author={Müller, Inez}, editor={Platen, Edgar}, year={2002}, pages={32}, collection={Zur Darstellung von Zeitgeschichte in deutschsprachiger Gegenwartsliteratur, Bd. 2} }"},"date_updated":"2023-04-26T09:34:49Z","author":[{"last_name":"Müller","full_name":"Müller, Inez","id":"26755","first_name":"Inez"}],"conference":{"location":"Universität Göteborg"},"type":"conference","editor":[{"first_name":"Edgar","last_name":"Platen","full_name":"Platen, Edgar"}],"status":"public","_id":"44190","department":[{"_id":"5"}],"user_id":"26755","series_title":"Zur Darstellung von Zeitgeschichte in deutschsprachiger Gegenwartsliteratur, Bd. 2","extern":"1","year":"2002","publisher":"iudicium Verlag","date_created":"2023-04-26T09:34:38Z","title":"ars memoriae. 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A structure definition technique for 25 nm lines of silicon and related materials. <i>Microelectronic Engineering</i>, <i>53</i>(1–4), 569–572. <a href=\"https://doi.org/10.1016/s0167-9317(00)00380-4\">https://doi.org/10.1016/s0167-9317(00)00380-4</a>","mla":"Hilleringmann, Ulrich, et al. “A Structure Definition Technique for 25 Nm Lines of Silicon and Related Materials.” <i>Microelectronic Engineering</i>, vol. 53, no. 1–4, Elsevier BV, 2002, pp. 569–72, doi:<a href=\"https://doi.org/10.1016/s0167-9317(00)00380-4\">10.1016/s0167-9317(00)00380-4</a>.","short":"U. Hilleringmann, T. Vieregge, J.T. 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