[{"abstract":[{"lang":"eng","text":"The textual Object Constraint Language (OCL) is an of-\r\nficial part of the Unified Modeling Language (UML). OCL\r\nis primarily used to formulate restrictions over UML mod-\r\nels, in particular, invariants and operation pre- and post-\r\nconditions in the context of class diagrams. However, OCL\r\nis missing means to specify constraints over the dynamic\r\nbehavior of a UML model. We have therefore developed a\r\ntemporal extension of OCL that enables modelers to specify\r\nbehavioral state-oriented constraints. That work provides\r\nan alternative to the rather cryptic temporal logic formulae\r\nthat are commonly used to specify behavioral system prop-\r\nerties.\r\nThis article now illustrates that our OCL extension al-\r\nlows for specifying all kinds of properties that are regarded\r\nas relevant in practice. We present according temporal OCL\r\nexpressions for property specification patterns that have\r\nbeen identified in the area of formal specification."}],"citation":{"apa":"Flake, S., &#38; Müller, W. (2003). Expressing Property Specification Patterns with OCL. <i>Proceedings of SERP’03</i>.","ieee":"S. Flake and W. Müller, “Expressing Property Specification Patterns with OCL,” 2003.","short":"S. Flake, W. Müller, in: Proceedings of SERP’03, Las Vegas, NV, 2003.","chicago":"Flake, Stephan, and Wolfgang Müller. “Expressing Property Specification Patterns with OCL.” In <i>Proceedings of SERP’03</i>. Las Vegas, NV, 2003.","mla":"Flake, Stephan, and Wolfgang Müller. “Expressing Property Specification Patterns with OCL.” <i>Proceedings of SERP’03</i>, 2003.","ama":"Flake S, Müller W. Expressing Property Specification Patterns with OCL. In: <i>Proceedings of SERP’03</i>. ; 2003.","bibtex":"@inproceedings{Flake_Müller_2003, place={Las Vegas, NV}, title={Expressing Property Specification Patterns with OCL}, booktitle={Proceedings of SERP’03}, author={Flake, Stephan and Müller, Wolfgang}, year={2003} }"},"publication":"Proceedings of SERP'03","department":[{"_id":"672"}],"keyword":["UML","Object Constraint Language","Patterns","Property Specification"],"type":"conference","date_created":"2023-01-24T09:45:49Z","place":"Las Vegas, NV","date_updated":"2023-01-24T09:45:54Z","author":[{"last_name":"Flake","first_name":"Stephan","full_name":"Flake, Stephan"},{"first_name":"Wolfgang","last_name":"Müller","full_name":"Müller, Wolfgang","id":"16243"}],"year":"2003","status":"public","title":"Expressing Property Specification Patterns with OCL","user_id":"5786","language":[{"iso":"eng"}],"_id":"39364"},{"language":[{"iso":"eng"}],"_id":"39366","user_id":"5786","status":"public","title":"Distributed Engineering Environment for the Design of Electronic Systems","year":"2003","author":[{"first_name":"Tim","last_name":"Schattkowsky","full_name":"Schattkowsky, Tim"},{"id":"16243","last_name":"Müller","first_name":"Wolfgang","full_name":"Müller, Wolfgang"}],"date_updated":"2023-01-24T09:49:23Z","date_created":"2023-01-24T09:49:18Z","place":"Poznan Poland","type":"conference","department":[{"_id":"672"}],"publication":"Proceedings of CCE'03","citation":{"mla":"Schattkowsky, Tim, and Wolfgang Müller. “Distributed Engineering Environment for the Design of Electronic Systems.” <i>Proceedings of CCE’03</i>, 2003.","bibtex":"@inproceedings{Schattkowsky_Müller_2003, place={Poznan Poland}, title={Distributed Engineering Environment for the Design of Electronic Systems}, booktitle={Proceedings of CCE’03}, author={Schattkowsky, Tim and Müller, Wolfgang}, year={2003} }","ama":"Schattkowsky T, Müller W. Distributed Engineering Environment for the Design of Electronic Systems. In: <i>Proceedings of CCE’03</i>. ; 2003.","ieee":"T. Schattkowsky and W. Müller, “Distributed Engineering Environment for the Design of Electronic Systems,” 2003.","apa":"Schattkowsky, T., &#38; Müller, W. (2003). Distributed Engineering Environment for the Design of Electronic Systems. <i>Proceedings of CCE’03</i>.","chicago":"Schattkowsky, Tim, and Wolfgang Müller. “Distributed Engineering Environment for the Design of Electronic Systems.” In <i>Proceedings of CCE’03</i>. Poznan Poland, 2003.","short":"T. Schattkowsky, W. Müller, in: Proceedings of CCE’03, Poznan Poland, 2003."},"abstract":[{"lang":"eng","text":"Computer supported collaborative work (CSCW) is currently of growing interest for application industrial context. Integrated workflow systems are available to allow the integration of globally distributed teams. However, in many areas (i.e. in electronic design automation), tool integration remains to be a critical issue since existing legacy tools have to be integrated into distributed workflows. By integrating tools based on the operational semantics, dynamic assignment and replacement of tools in the workflows becomes possible. We present a middleware for secure collaborative engineering that enables flexible tool management and overcomes existing networking problems through a peer-to-peer based network infrastructure."}]},{"citation":{"ieee":"J. Wang and W. Müller, “SmartCard for Secure Collaborative Engineering,” 2003.","apa":"Wang, J., &#38; Müller, W. (2003). SmartCard for Secure Collaborative Engineering. <i>Proceedings of CCE’03</i>.","short":"J. Wang, W. Müller, in: Proceedings of CCE’03, Poznan Poland, 2003.","chicago":"Wang, J., and Wolfgang Müller. “SmartCard for Secure Collaborative Engineering.” In <i>Proceedings of CCE’03</i>. Poznan Poland, 2003.","mla":"Wang, J., and Wolfgang Müller. “SmartCard for Secure Collaborative Engineering.” <i>Proceedings of CCE’03</i>, 2003.","bibtex":"@inproceedings{Wang_Müller_2003, place={Poznan Poland}, title={SmartCard for Secure Collaborative Engineering}, booktitle={Proceedings of CCE’03}, author={Wang, J. and Müller, Wolfgang}, year={2003} }","ama":"Wang J, Müller W. SmartCard for Secure Collaborative Engineering. In: <i>Proceedings of CCE’03</i>. ; 2003."},"publication":"Proceedings of CCE'03","abstract":[{"lang":"eng","text":"Confidentiality and security in data access and transmission over multiple open networks are of utmost importance for most collaborative engineering environments. In this article, we review smart card based security technologies for their application in computer-based collaborative engineering environments. We focus on most recent microprocessor-based smart cards and on JavaCard as a development infrastructure and operating system. Since JavaCard supports the integration of multiple applications on one card, it enables smart cards to integrate large sets of additional applications. In that context, we identify and discuss three potential key applications: authentication with biometrics, certification, and advanced profile management."}],"place":"Poznan Poland","date_created":"2023-01-24T09:51:15Z","department":[{"_id":"672"}],"type":"conference","author":[{"full_name":"Wang, J.","first_name":"J.","last_name":"Wang"},{"full_name":"Müller, Wolfgang","last_name":"Müller","first_name":"Wolfgang","id":"16243"}],"status":"public","year":"2003","title":"SmartCard for Secure Collaborative Engineering","date_updated":"2023-01-24T09:51:20Z","_id":"39367","language":[{"iso":"eng"}],"user_id":"5786"},{"publication":"Proceedings of FDL'03","citation":{"apa":"Krupp, A., &#38; Müller, W. (2003). Combining Formal Refinement and Model Checking for Analysis of Realtime Systems. <i>Proceedings of FDL’03</i>.","ieee":"A. Krupp and W. Müller, “Combining Formal Refinement and Model Checking for Analysis of Realtime Systems,” 2003.","chicago":"Krupp, Alexander, and Wolfgang Müller. “Combining Formal Refinement and Model Checking for Analysis of Realtime Systems.” In <i>Proceedings of FDL’03</i>. Frankfurt, Germany, 2003.","short":"A. Krupp, W. Müller, in: Proceedings of FDL’03, Frankfurt, Germany, 2003.","mla":"Krupp, Alexander, and Wolfgang Müller. “Combining Formal Refinement and Model Checking for Analysis of Realtime Systems.” <i>Proceedings of FDL’03</i>, 2003.","ama":"Krupp A, Müller W. Combining Formal Refinement and Model Checking for Analysis of Realtime Systems. In: <i>Proceedings of FDL’03</i>. ; 2003.","bibtex":"@inproceedings{Krupp_Müller_2003, place={Frankfurt, Germany}, title={Combining Formal Refinement and Model Checking for Analysis of Realtime Systems}, booktitle={Proceedings of FDL’03}, author={Krupp, Alexander and Müller, Wolfgang}, year={2003} }"},"place":"Frankfurt, Germany","date_created":"2023-01-24T09:53:01Z","type":"conference","department":[{"_id":"672"}],"title":"Combining Formal Refinement and Model Checking for Analysis of Realtime Systems","year":"2003","status":"public","author":[{"full_name":"Krupp, Alexander","last_name":"Krupp","first_name":"Alexander"},{"full_name":"Müller, Wolfgang","last_name":"Müller","first_name":"Wolfgang","id":"16243"}],"date_updated":"2023-01-24T09:53:06Z","_id":"39368","language":[{"iso":"eng"}],"user_id":"5786"},{"publication":"Synthetic Metals","issue":"3","date_created":"2023-01-25T12:06:23Z","type":"journal_article","keyword":["Materials Chemistry","Metals and Alloys","Mechanical Engineering","Mechanics of Materials","Condensed Matter Physics","Electronic","Optical and Magnetic Materials"],"department":[{"_id":"313"},{"_id":"638"}],"year":"2003","title":"Morphology and fluorescence quenching in photovoltaic samples containing fullerene and poly(p-phenylene-vinylene) derivatives","publication_identifier":{"issn":["0379-6779"]},"author":[{"full_name":"Röder, T","first_name":"T","last_name":"Röder"},{"id":"254","first_name":"Heinz-Siegfried","last_name":"Kitzerow","full_name":"Kitzerow, Heinz-Siegfried"},{"full_name":"Hummelen, J.C","last_name":"Hummelen","first_name":"J.C"}],"date_updated":"2023-01-25T12:09:38Z","publication_status":"published","intvolume":"       141","language":[{"iso":"eng"}],"doi":"10.1016/s0379-6779(03)00412-0","citation":{"mla":"Röder, T., et al. “Morphology and Fluorescence Quenching in Photovoltaic Samples Containing Fullerene and Poly(p-Phenylene-Vinylene) Derivatives.” <i>Synthetic Metals</i>, vol. 141, no. 3, Elsevier BV, 2003, pp. 271–75, doi:<a href=\"https://doi.org/10.1016/s0379-6779(03)00412-0\">10.1016/s0379-6779(03)00412-0</a>.","ama":"Röder T, Kitzerow H-S, Hummelen JC. Morphology and fluorescence quenching in photovoltaic samples containing fullerene and poly(p-phenylene-vinylene) derivatives. <i>Synthetic Metals</i>. 2003;141(3):271-275. doi:<a href=\"https://doi.org/10.1016/s0379-6779(03)00412-0\">10.1016/s0379-6779(03)00412-0</a>","bibtex":"@article{Röder_Kitzerow_Hummelen_2003, title={Morphology and fluorescence quenching in photovoltaic samples containing fullerene and poly(p-phenylene-vinylene) derivatives}, volume={141}, DOI={<a href=\"https://doi.org/10.1016/s0379-6779(03)00412-0\">10.1016/s0379-6779(03)00412-0</a>}, number={3}, journal={Synthetic Metals}, publisher={Elsevier BV}, author={Röder, T and Kitzerow, Heinz-Siegfried and Hummelen, J.C}, year={2003}, pages={271–275} }","apa":"Röder, T., Kitzerow, H.-S., &#38; Hummelen, J. C. (2003). Morphology and fluorescence quenching in photovoltaic samples containing fullerene and poly(p-phenylene-vinylene) derivatives. <i>Synthetic Metals</i>, <i>141</i>(3), 271–275. <a href=\"https://doi.org/10.1016/s0379-6779(03)00412-0\">https://doi.org/10.1016/s0379-6779(03)00412-0</a>","ieee":"T. Röder, H.-S. Kitzerow, and J. C. Hummelen, “Morphology and fluorescence quenching in photovoltaic samples containing fullerene and poly(p-phenylene-vinylene) derivatives,” <i>Synthetic Metals</i>, vol. 141, no. 3, pp. 271–275, 2003, doi: <a href=\"https://doi.org/10.1016/s0379-6779(03)00412-0\">10.1016/s0379-6779(03)00412-0</a>.","short":"T. Röder, H.-S. Kitzerow, J.C. Hummelen, Synthetic Metals 141 (2003) 271–275.","chicago":"Röder, T, Heinz-Siegfried Kitzerow, and J.C Hummelen. “Morphology and Fluorescence Quenching in Photovoltaic Samples Containing Fullerene and Poly(p-Phenylene-Vinylene) Derivatives.” <i>Synthetic Metals</i> 141, no. 3 (2003): 271–75. <a href=\"https://doi.org/10.1016/s0379-6779(03)00412-0\">https://doi.org/10.1016/s0379-6779(03)00412-0</a>."},"status":"public","page":"271-275","publisher":"Elsevier BV","_id":"39985","user_id":"254","volume":141},{"department":[{"_id":"9"},{"_id":"154"}],"type":"journal_article","date_created":"2021-12-14T11:58:15Z","quality_controlled":"1","citation":{"mla":"Mahnken, Rolf. “Creep Simulation of Asymmetric Effects by Use of Stress Mode Dependent Weighting Functions.” <i>International Journal of Solids and Structures</i>, 2003, pp. 6189–209, doi:<a href=\"https://doi.org/10.1016/s0020-7683(03)00388-3\">10.1016/s0020-7683(03)00388-3</a>.","ama":"Mahnken R. Creep simulation of asymmetric effects by use of stress mode dependent weighting functions. <i>International Journal of Solids and Structures</i>. Published online 2003:6189-6209. doi:<a href=\"https://doi.org/10.1016/s0020-7683(03)00388-3\">10.1016/s0020-7683(03)00388-3</a>","bibtex":"@article{Mahnken_2003, title={Creep simulation of asymmetric effects by use of stress mode dependent weighting functions}, DOI={<a href=\"https://doi.org/10.1016/s0020-7683(03)00388-3\">10.1016/s0020-7683(03)00388-3</a>}, journal={International Journal of Solids and Structures}, author={Mahnken, Rolf}, year={2003}, pages={6189–6209} }","apa":"Mahnken, R. (2003). Creep simulation of asymmetric effects by use of stress mode dependent weighting functions. <i>International Journal of Solids and Structures</i>, 6189–6209. <a href=\"https://doi.org/10.1016/s0020-7683(03)00388-3\">https://doi.org/10.1016/s0020-7683(03)00388-3</a>","ieee":"R. Mahnken, “Creep simulation of asymmetric effects by use of stress mode dependent weighting functions,” <i>International Journal of Solids and Structures</i>, pp. 6189–6209, 2003, doi: <a href=\"https://doi.org/10.1016/s0020-7683(03)00388-3\">10.1016/s0020-7683(03)00388-3</a>.","short":"R. Mahnken, International Journal of Solids and Structures (2003) 6189–6209.","chicago":"Mahnken, Rolf. “Creep Simulation of Asymmetric Effects by Use of Stress Mode Dependent Weighting Functions.” <i>International Journal of Solids and Structures</i>, 2003, 6189–6209. <a href=\"https://doi.org/10.1016/s0020-7683(03)00388-3\">https://doi.org/10.1016/s0020-7683(03)00388-3</a>."},"publication":"International Journal of Solids and Structures","doi":"10.1016/s0020-7683(03)00388-3","user_id":"335","language":[{"iso":"eng"}],"_id":"28783","page":"6189-6209","date_updated":"2023-01-25T14:34:22Z","publication_status":"published","author":[{"full_name":"Mahnken, Rolf","last_name":"Mahnken","first_name":"Rolf","id":"335"}],"publication_identifier":{"issn":["0020-7683"]},"title":"Creep simulation of asymmetric effects by use of stress mode dependent weighting functions","status":"public","year":"2003"},{"date_created":"2022-12-23T09:53:23Z","keyword":["Algebra and Number Theory"],"type":"journal_article","department":[{"_id":"102"}],"publication":"Journal of Number Theory","issue":"2","abstract":[{"text":"We apply class field theory to the computation of the minimal discriminants for certain solvable groups. In particular, we apply our techniques to small Frobenius groups and all imprimitive degree 8 groups such that the corresponding fields have only a degree 2 and no degree 4 subfield.","lang":"eng"}],"language":[{"iso":"eng"}],"doi":"10.1016/s0022-314x(02)00071-9","title":"Minimal discriminants for fields with small Frobenius groups as Galois groups","year":"2003","author":[{"last_name":"Fieker","first_name":"Claus","full_name":"Fieker, Claus"},{"id":"21202","first_name":"Jürgen","last_name":"Klüners","full_name":"Klüners, Jürgen"}],"publication_identifier":{"issn":["0022-314X"]},"date_updated":"2023-03-06T09:19:16Z","publication_status":"published","intvolume":"        99","citation":{"ieee":"C. Fieker and J. Klüners, “Minimal discriminants for fields with small Frobenius groups as Galois groups,” <i>Journal of Number Theory</i>, vol. 99, no. 2, pp. 318–337, 2003, doi: <a href=\"https://doi.org/10.1016/s0022-314x(02)00071-9\">10.1016/s0022-314x(02)00071-9</a>.","apa":"Fieker, C., &#38; Klüners, J. (2003). Minimal discriminants for fields with small Frobenius groups as Galois groups. <i>Journal of Number Theory</i>, <i>99</i>(2), 318–337. <a href=\"https://doi.org/10.1016/s0022-314x(02)00071-9\">https://doi.org/10.1016/s0022-314x(02)00071-9</a>","chicago":"Fieker, Claus, and Jürgen Klüners. “Minimal Discriminants for Fields with Small Frobenius Groups as Galois Groups.” <i>Journal of Number Theory</i> 99, no. 2 (2003): 318–37. <a href=\"https://doi.org/10.1016/s0022-314x(02)00071-9\">https://doi.org/10.1016/s0022-314x(02)00071-9</a>.","short":"C. Fieker, J. Klüners, Journal of Number Theory 99 (2003) 318–337.","mla":"Fieker, Claus, and Jürgen Klüners. “Minimal Discriminants for Fields with Small Frobenius Groups as Galois Groups.” <i>Journal of Number Theory</i>, vol. 99, no. 2, Elsevier BV, 2003, pp. 318–37, doi:<a href=\"https://doi.org/10.1016/s0022-314x(02)00071-9\">10.1016/s0022-314x(02)00071-9</a>.","bibtex":"@article{Fieker_Klüners_2003, title={Minimal discriminants for fields with small Frobenius groups as Galois groups}, volume={99}, DOI={<a href=\"https://doi.org/10.1016/s0022-314x(02)00071-9\">10.1016/s0022-314x(02)00071-9</a>}, number={2}, journal={Journal of Number Theory}, publisher={Elsevier BV}, author={Fieker, Claus and Klüners, Jürgen}, year={2003}, pages={318–337} }","ama":"Fieker C, Klüners J. Minimal discriminants for fields with small Frobenius groups as Galois groups. <i>Journal of Number Theory</i>. 2003;99(2):318-337. doi:<a href=\"https://doi.org/10.1016/s0022-314x(02)00071-9\">10.1016/s0022-314x(02)00071-9</a>"},"page":"318-337","publisher":"Elsevier BV","_id":"34896","user_id":"93826","volume":99,"status":"public"},{"page":"109-118","_id":"43639","language":[{"iso":"eng"}],"user_id":"480","title":"9. Sonntag nach Trinitatis. Mt 25,14-30: Die Angst vorm Verlieren verlieren","status":"public","year":"2003","author":[{"id":"480","last_name":"Schroeter-Wittke","first_name":"Harald","full_name":"Schroeter-Wittke, Harald"},{"first_name":"Inge","last_name":"Kirsner","full_name":"Kirsner, Inge"}],"date_updated":"2023-04-15T21:27:11Z","date_created":"2023-04-15T21:27:07Z","type":"journal_article","publication":"Predigtstudien I/2","citation":{"ama":"Schroeter-Wittke H, Kirsner I. 9. Sonntag nach Trinitatis. Mt 25,14-30: Die Angst vorm Verlieren verlieren. <i>Predigtstudien I/2</i>. Published online 2003:109-118.","bibtex":"@article{Schroeter-Wittke_Kirsner_2003, title={9. Sonntag nach Trinitatis. Mt 25,14-30: Die Angst vorm Verlieren verlieren}, journal={Predigtstudien I/2}, author={Schroeter-Wittke, Harald and Kirsner, Inge}, year={2003}, pages={109–118} }","mla":"Schroeter-Wittke, Harald, and Inge Kirsner. “9. Sonntag Nach Trinitatis. Mt 25,14-30: Die Angst Vorm Verlieren Verlieren.” <i>Predigtstudien I/2</i>, 2003, pp. 109–18.","short":"H. Schroeter-Wittke, I. Kirsner, Predigtstudien I/2 (2003) 109–118.","chicago":"Schroeter-Wittke, Harald, and Inge Kirsner. “9. Sonntag Nach Trinitatis. Mt 25,14-30: Die Angst Vorm Verlieren Verlieren.” <i>Predigtstudien I/2</i>, 2003, 109–18.","apa":"Schroeter-Wittke, H., &#38; Kirsner, I. (2003). 9. Sonntag nach Trinitatis. Mt 25,14-30: Die Angst vorm Verlieren verlieren. <i>Predigtstudien I/2</i>, 109–118.","ieee":"H. Schroeter-Wittke and I. Kirsner, “9. Sonntag nach Trinitatis. Mt 25,14-30: Die Angst vorm Verlieren verlieren,” <i>Predigtstudien I/2</i>, pp. 109–118, 2003."}},{"volume":"67-68","user_id":"20179","doi":"10.1016/s0167-9317(03)00146-1","_id":"39851","publisher":"Elsevier BV","language":[{"iso":"eng"}],"page":"845-852","publication_status":"published","date_updated":"2023-03-21T10:04:43Z","author":[{"full_name":"Pannemann, Ch.","first_name":"Ch.","last_name":"Pannemann"},{"full_name":"Diekmann, T.","first_name":"T.","last_name":"Diekmann"},{"id":"20179","first_name":"Ulrich","last_name":"Hilleringmann","full_name":"Hilleringmann, Ulrich"}],"publication_identifier":{"issn":["0167-9317"]},"year":"2003","status":"public","title":"Nanometer scale organic thin film transistors with Pentacene","department":[{"_id":"59"}],"keyword":["Electrical and Electronic Engineering","Surfaces","Coatings and Films","Condensed Matter Physics","Atomic and Molecular Physics","and Optics","Electronic","Optical and Magnetic Materials"],"type":"journal_article","date_created":"2023-01-25T08:39:40Z","citation":{"short":"Ch. Pannemann, T. Diekmann, U. Hilleringmann, Microelectronic Engineering 67–68 (2003) 845–852.","chicago":"Pannemann, Ch., T. Diekmann, and Ulrich Hilleringmann. “Nanometer Scale Organic Thin Film Transistors with Pentacene.” <i>Microelectronic Engineering</i> 67–68 (2003): 845–52. <a href=\"https://doi.org/10.1016/s0167-9317(03)00146-1\">https://doi.org/10.1016/s0167-9317(03)00146-1</a>.","apa":"Pannemann, Ch., Diekmann, T., &#38; Hilleringmann, U. (2003). Nanometer scale organic thin film transistors with Pentacene. <i>Microelectronic Engineering</i>, <i>67–68</i>, 845–852. <a href=\"https://doi.org/10.1016/s0167-9317(03)00146-1\">https://doi.org/10.1016/s0167-9317(03)00146-1</a>","ieee":"Ch. Pannemann, T. Diekmann, and U. Hilleringmann, “Nanometer scale organic thin film transistors with Pentacene,” <i>Microelectronic Engineering</i>, vol. 67–68, pp. 845–852, 2003, doi: <a href=\"https://doi.org/10.1016/s0167-9317(03)00146-1\">10.1016/s0167-9317(03)00146-1</a>.","ama":"Pannemann Ch, Diekmann T, Hilleringmann U. Nanometer scale organic thin film transistors with Pentacene. <i>Microelectronic Engineering</i>. 2003;67-68:845-852. doi:<a href=\"https://doi.org/10.1016/s0167-9317(03)00146-1\">10.1016/s0167-9317(03)00146-1</a>","bibtex":"@article{Pannemann_Diekmann_Hilleringmann_2003, title={Nanometer scale organic thin film transistors with Pentacene}, volume={67–68}, DOI={<a href=\"https://doi.org/10.1016/s0167-9317(03)00146-1\">10.1016/s0167-9317(03)00146-1</a>}, journal={Microelectronic Engineering}, publisher={Elsevier BV}, author={Pannemann, Ch. and Diekmann, T. and Hilleringmann, Ulrich}, year={2003}, pages={845–852} }","mla":"Pannemann, Ch., et al. “Nanometer Scale Organic Thin Film Transistors with Pentacene.” <i>Microelectronic Engineering</i>, vol. 67–68, Elsevier BV, 2003, pp. 845–52, doi:<a href=\"https://doi.org/10.1016/s0167-9317(03)00146-1\">10.1016/s0167-9317(03)00146-1</a>."},"publication":"Microelectronic Engineering"},{"doi":"10.1002/3527600116.ch11","user_id":"335","_id":"45415","language":[{"iso":"eng"}],"publisher":"Wiley-VCH Verlag GmbH","date_updated":"2023-05-31T12:01:42Z","publication_status":"published","author":[{"first_name":"Erwin","last_name":"Stein","full_name":"Stein, Erwin"},{"first_name":"Genbao","last_name":"Zhang","full_name":"Zhang, Genbao"},{"first_name":"Yuejun","last_name":"Huang","full_name":"Huang, Yuejun"},{"id":"335","full_name":"Mahnken, Rolf","last_name":"Mahnken","first_name":"Rolf"},{"full_name":"Wiechmann, Karin","last_name":"Wiechmann","first_name":"Karin"}],"status":"public","title":"Theoretical and Computational Shakedown Analysis of Non-Linear Kinematic Hardening Material and Transition to Ductile Fracture","year":"2003","department":[{"_id":"9"},{"_id":"154"}],"type":"book_chapter","place":"Weinheim, FRG","date_created":"2023-05-31T12:01:01Z","quality_controlled":"1","citation":{"bibtex":"@inbook{Stein_Zhang_Huang_Mahnken_Wiechmann_2003, place={Weinheim, FRG}, title={Theoretical and Computational Shakedown Analysis of Non-Linear Kinematic Hardening Material and Transition to Ductile Fracture}, DOI={<a href=\"https://doi.org/10.1002/3527600116.ch11\">10.1002/3527600116.ch11</a>}, booktitle={Plasticity of Metals}, publisher={Wiley-VCH Verlag GmbH}, author={Stein, Erwin and Zhang, Genbao and Huang, Yuejun and Mahnken, Rolf and Wiechmann, Karin}, year={2003} }","ama":"Stein E, Zhang G, Huang Y, Mahnken R, Wiechmann K. 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