[{"doi":"10.1109/vts.2008.34","place":"San Diego, CA, USA","author":[{"last_name":"Amgalan","first_name":"Uranmandakh","full_name":"Amgalan, Uranmandakh"},{"full_name":"Hachmann, Christian","first_name":"Christian","last_name":"Hachmann"},{"orcid":"0000-0002-3717-3939","id":"209","last_name":"Hellebrand","first_name":"Sybille","full_name":"Hellebrand, Sybille"},{"last_name":"Wunderlich","first_name":"Hans-Joachim","full_name":"Wunderlich, Hans-Joachim"}],"title":"Signature Rollback - A Technique for Testing Robust Circuits","department":[{"_id":"48"}],"user_id":"209","citation":{"short":"U. Amgalan, C. Hachmann, S. Hellebrand, H.-J. Wunderlich, in: 26th IEEE VLSI Test Symposium (VTS’08), IEEE, San Diego, CA, USA, 2008, pp. 125–130.","mla":"Amgalan, Uranmandakh, et al. “Signature Rollback - A Technique for Testing Robust Circuits.” <i>26th IEEE VLSI Test Symposium (VTS’08)</i>, IEEE, 2008, pp. 125–30, doi:<a href=\"https://doi.org/10.1109/vts.2008.34\">10.1109/vts.2008.34</a>.","bibtex":"@inproceedings{Amgalan_Hachmann_Hellebrand_Wunderlich_2008, place={San Diego, CA, USA}, title={Signature Rollback - A Technique for Testing Robust Circuits}, DOI={<a href=\"https://doi.org/10.1109/vts.2008.34\">10.1109/vts.2008.34</a>}, booktitle={26th IEEE VLSI Test Symposium (VTS’08)}, publisher={IEEE}, author={Amgalan, Uranmandakh and Hachmann, Christian and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2008}, pages={125–130} }","chicago":"Amgalan, Uranmandakh, Christian Hachmann, Sybille Hellebrand, and Hans-Joachim Wunderlich. “Signature Rollback - A Technique for Testing Robust Circuits.” In <i>26th IEEE VLSI Test Symposium (VTS’08)</i>, 125–30. San Diego, CA, USA: IEEE, 2008. <a href=\"https://doi.org/10.1109/vts.2008.34\">https://doi.org/10.1109/vts.2008.34</a>.","ieee":"U. Amgalan, C. Hachmann, S. Hellebrand, and H.-J. Wunderlich, “Signature Rollback - A Technique for Testing Robust Circuits,” in <i>26th IEEE VLSI Test Symposium (VTS’08)</i>, 2008, pp. 125–130, doi: <a href=\"https://doi.org/10.1109/vts.2008.34\">10.1109/vts.2008.34</a>.","apa":"Amgalan, U., Hachmann, C., Hellebrand, S., &#38; Wunderlich, H.-J. (2008). Signature Rollback - A Technique for Testing Robust Circuits. <i>26th IEEE VLSI Test Symposium (VTS’08)</i>, 125–130. <a href=\"https://doi.org/10.1109/vts.2008.34\">https://doi.org/10.1109/vts.2008.34</a>","ama":"Amgalan U, Hachmann C, Hellebrand S, Wunderlich H-J. Signature Rollback - A Technique for Testing Robust Circuits. In: <i>26th IEEE VLSI Test Symposium (VTS’08)</i>. IEEE; 2008:125-130. doi:<a href=\"https://doi.org/10.1109/vts.2008.34\">10.1109/vts.2008.34</a>"},"status":"public","language":[{"iso":"eng"}],"type":"conference","year":"2008","publisher":"IEEE","date_created":"2019-08-28T10:18:56Z","publication":"26th IEEE VLSI Test Symposium (VTS'08)","date_updated":"2022-05-11T16:30:36Z","_id":"12994","page":"125-130"},{"department":[{"_id":"48"}],"user_id":"209","citation":{"short":"M. Hunger, S. Hellebrand, in: 14th IEEE International On-Line Testing Symposium (IOLTS’08), IEEE, Rhodos, Greece, 2008.","mla":"Hunger, Marc, and Sybille Hellebrand. “Verification and Analysis of Self-Checking Properties through ATPG.” <i>14th IEEE International On-Line Testing Symposium (IOLTS’08)</i>, IEEE, 2008, doi:<a href=\"https://doi.org/10.1109/iolts.2008.32\">10.1109/iolts.2008.32</a>.","bibtex":"@inproceedings{Hunger_Hellebrand_2008, place={Rhodos, Greece}, title={Verification and Analysis of Self-Checking Properties through ATPG}, DOI={<a href=\"https://doi.org/10.1109/iolts.2008.32\">10.1109/iolts.2008.32</a>}, booktitle={14th IEEE International On-Line Testing Symposium (IOLTS’08)}, publisher={IEEE}, author={Hunger, Marc and Hellebrand, Sybille}, year={2008} }","chicago":"Hunger, Marc, and Sybille Hellebrand. “Verification and Analysis of Self-Checking Properties through ATPG.” In <i>14th IEEE International On-Line Testing Symposium (IOLTS’08)</i>. Rhodos, Greece: IEEE, 2008. <a href=\"https://doi.org/10.1109/iolts.2008.32\">https://doi.org/10.1109/iolts.2008.32</a>.","ieee":"M. Hunger and S. Hellebrand, “Verification and Analysis of Self-Checking Properties through ATPG,” 2008, doi: <a href=\"https://doi.org/10.1109/iolts.2008.32\">10.1109/iolts.2008.32</a>.","ama":"Hunger M, Hellebrand S. Verification and Analysis of Self-Checking Properties through ATPG. In: <i>14th IEEE International On-Line Testing Symposium (IOLTS’08)</i>. IEEE; 2008. doi:<a href=\"https://doi.org/10.1109/iolts.2008.32\">10.1109/iolts.2008.32</a>","apa":"Hunger, M., &#38; Hellebrand, S. (2008). Verification and Analysis of Self-Checking Properties through ATPG. <i>14th IEEE International On-Line Testing Symposium (IOLTS’08)</i>. <a href=\"https://doi.org/10.1109/iolts.2008.32\">https://doi.org/10.1109/iolts.2008.32</a>"},"doi":"10.1109/iolts.2008.32","place":"Rhodos, Greece","author":[{"last_name":"Hunger","first_name":"Marc","full_name":"Hunger, Marc"},{"orcid":"0000-0002-3717-3939","last_name":"Hellebrand","id":"209","full_name":"Hellebrand, Sybille","first_name":"Sybille"}],"title":"Verification and Analysis of Self-Checking Properties through ATPG","date_updated":"2022-05-11T16:29:56Z","_id":"12993","status":"public","type":"conference","year":"2008","language":[{"iso":"eng"}],"publisher":"IEEE","publication":"14th IEEE International On-Line Testing Symposium (IOLTS'08)","date_created":"2019-08-28T10:18:11Z"},{"_id":"13031","date_updated":"2022-05-11T16:31:25Z","date_created":"2019-08-28T10:35:49Z","publication":"2. GMM/GI/ITG-Fachtagung \"Zuverlässigkeit und Entwurf\"","status":"public","language":[{"iso":"eng"}],"year":"2008","type":"conference","user_id":"209","citation":{"chicago":"Hunger, Marc, and Sybille Hellebrand. “Analyse Selbstprüfender Schaltungen – Nachweis von Fehlersicherheit Und Selbsttestbarkeit Mit ATPG.” In <i>2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.”</i> Ingolstadt, Germany, 2008.","short":"M. Hunger, S. Hellebrand, in: 2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” Ingolstadt, Germany, 2008.","ieee":"M. Hunger and S. Hellebrand, “Analyse selbstprüfender Schaltungen – Nachweis von Fehlersicherheit und Selbsttestbarkeit mit ATPG,” 2008.","mla":"Hunger, Marc, and Sybille Hellebrand. “Analyse Selbstprüfender Schaltungen – Nachweis von Fehlersicherheit Und Selbsttestbarkeit Mit ATPG.” <i>2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,”</i> 2008.","ama":"Hunger M, Hellebrand S. Analyse selbstprüfender Schaltungen – Nachweis von Fehlersicherheit und Selbsttestbarkeit mit ATPG. In: <i>2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.”</i> ; 2008.","bibtex":"@inproceedings{Hunger_Hellebrand_2008, place={Ingolstadt, Germany}, title={Analyse selbstprüfender Schaltungen – Nachweis von Fehlersicherheit und Selbsttestbarkeit mit ATPG}, booktitle={2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, author={Hunger, Marc and Hellebrand, Sybille}, year={2008} }","apa":"Hunger, M., &#38; Hellebrand, S. (2008). Analyse selbstprüfender Schaltungen – Nachweis von Fehlersicherheit und Selbsttestbarkeit mit ATPG. <i>2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.”</i>"},"department":[{"_id":"48"}],"author":[{"first_name":"Marc","full_name":"Hunger, Marc","last_name":"Hunger"},{"orcid":"0000-0002-3717-3939","id":"209","last_name":"Hellebrand","full_name":"Hellebrand, Sybille","first_name":"Sybille"}],"title":"Analyse selbstprüfender Schaltungen – Nachweis von Fehlersicherheit und Selbsttestbarkeit mit ATPG","place":"Ingolstadt, Germany"},{"author":[{"first_name":"Philipp","full_name":"Oehler, Philipp","last_name":"Oehler"},{"last_name":"Bosio","full_name":"Bosio, Alberto","first_name":"Alberto"},{"first_name":"Giorgio","full_name":"Di Natale, Giorgio","last_name":"Di Natale"},{"orcid":"0000-0002-3717-3939","id":"209","last_name":"Hellebrand","full_name":"Hellebrand, Sybille","first_name":"Sybille"}],"title":"Modularer Selbsttest und optimierte Reparaturanalyse","place":"Ingolstadt, Germany","user_id":"209","citation":{"short":"P. Oehler, A. Bosio, G. Di Natale, S. Hellebrand, in: 2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” Ingolstadt, Germany, 2008.","bibtex":"@inproceedings{Oehler_Bosio_Di Natale_Hellebrand_2008, place={Ingolstadt, Germany}, title={Modularer Selbsttest und optimierte Reparaturanalyse}, booktitle={2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, author={Oehler, Philipp and Bosio, Alberto and Di Natale, Giorgio and Hellebrand, Sybille}, year={2008} }","mla":"Oehler, Philipp, et al. “Modularer Selbsttest Und Optimierte Reparaturanalyse.” <i>2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,”</i> 2008.","ieee":"P. Oehler, A. Bosio, G. Di Natale, and S. Hellebrand, “Modularer Selbsttest und optimierte Reparaturanalyse,” 2008.","chicago":"Oehler, Philipp, Alberto Bosio, Giorgio Di Natale, and Sybille Hellebrand. “Modularer Selbsttest Und Optimierte Reparaturanalyse.” In <i>2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.”</i> Ingolstadt, Germany, 2008.","apa":"Oehler, P., Bosio, A., Di Natale, G., &#38; Hellebrand, S. (2008). Modularer Selbsttest und optimierte Reparaturanalyse. <i>2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.”</i>","ama":"Oehler P, Bosio A, Di Natale G, Hellebrand S. Modularer Selbsttest und optimierte Reparaturanalyse. In: <i>2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf.”</i> ; 2008."},"department":[{"_id":"48"}],"date_created":"2019-08-28T10:35:50Z","publication":"2. GMM/GI/ITG-Fachtagung \"Zuverlässigkeit und Entwurf\"","status":"public","language":[{"iso":"eng"}],"year":"2008","type":"conference","_id":"13032","date_updated":"2022-05-11T16:34:03Z"},{"type":"journal_article","year":"2008","language":[{"iso":"fre"}],"status":"public","publication":"Zeitschrift für französische Sprache und Literatur 118, 3 ","date_created":"2022-08-09T17:57:19Z","date_updated":"2022-09-30T01:02:30Z","_id":"32655","page":"237-257","title":"L’Oiconomie des plaisirs: La praxéologie de l’amour galant: à propos de la „Clélie“","author":[{"full_name":"Steigerwald, Jörn","first_name":"Jörn","id":"37947","last_name":"Steigerwald"}],"extern":"1","department":[{"_id":"5"},{"_id":"116"}],"citation":{"ama":"Steigerwald J. L’Oiconomie des plaisirs: La praxéologie de l’amour galant: à propos de la „Clélie“. <i>Zeitschrift für französische Sprache und Literatur 118, 3 </i>. Published online 2008:237-257.","apa":"Steigerwald, J. (2008). L’Oiconomie des plaisirs: La praxéologie de l’amour galant: à propos de la „Clélie“. <i>Zeitschrift für französische Sprache und Literatur 118, 3 </i>, 237–257.","chicago":"Steigerwald, Jörn. “L’Oiconomie des plaisirs: La praxéologie de l’amour galant: à propos de la „Clélie“.” <i>Zeitschrift für französische Sprache und Literatur 118, 3 </i>, 2008, 237–57.","ieee":"J. Steigerwald, “L’Oiconomie des plaisirs: La praxéologie de l’amour galant: à propos de la „Clélie“,” <i>Zeitschrift für französische Sprache und Literatur 118, 3 </i>, pp. 237–257, 2008.","mla":"Steigerwald, Jörn. “L’Oiconomie des plaisirs: La praxéologie de l’amour galant: à propos de la „Clélie“.” <i>Zeitschrift für französische Sprache und Literatur 118, 3 </i>, 2008, pp. 237–57.","bibtex":"@article{Steigerwald_2008, title={L’Oiconomie des plaisirs: La praxéologie de l’amour galant: à propos de la „Clélie“}, journal={Zeitschrift für französische Sprache und Literatur 118, 3 }, author={Steigerwald, Jörn}, year={2008}, pages={237–257} }","short":"J. Steigerwald, Zeitschrift für französische Sprache und Literatur 118, 3  (2008) 237–257."},"user_id":"49063"},{"date_created":"2022-10-18T11:19:31Z","publisher":"Springer Verlag","year":"2008","publication_identifier":{"isbn":["978-3-540-70929-9"]},"language":[{"iso":"eng"}],"status":"public","_id":"33815","date_updated":"2022-10-18T11:20:02Z","author":[{"last_name":"Großmann","full_name":"Großmann, Jürgen","first_name":"Jürgen"},{"full_name":"Fey, Ines","first_name":"Ines","last_name":"Fey"},{"full_name":"Krupp, Alexander","first_name":"Alexander","last_name":"Krupp"},{"full_name":"Conrad, Mirko","first_name":"Mirko","last_name":"Conrad"},{"first_name":"Christian","full_name":"Wewetzer, Christian","last_name":"Wewetzer"},{"id":"16243","last_name":"Müller","first_name":"Wolfgang","full_name":"Müller, Wolfgang"}],"editor":[{"full_name":"Broy, Manfred","first_name":"Manfred","last_name":"Broy"},{"last_name":"Krüger","first_name":"Ingolf H.","full_name":"Krüger, Ingolf H."},{"first_name":"Michael","full_name":"Meisinger, Michael","last_name":"Meisinger"}],"place":"Berlin, Heidelberg","citation":{"chicago":"Großmann, Jürgen, Ines Fey, Alexander Krupp, Mirko Conrad, Christian Wewetzer, and Wolfgang Müller. “TestML – A Test Exchange Language for Model-Based Testing of Embedded Software.” In <i>ASWSD 2006: Model-Driven Development of Reliable Automotive Services</i>, edited by Manfred Broy, Ingolf H. Krüger, and Michael Meisinger, 98–117. Berlin, Heidelberg: Springer Verlag, 2008. <a href=\"https://doi.org/10.1007/978-3-540-70930-5_7\">https://doi.org/10.1007/978-3-540-70930-5_7</a>.","ieee":"J. Großmann, I. Fey, A. Krupp, M. Conrad, C. Wewetzer, and W. Müller, “TestML – A Test Exchange Language for Model-based Testing of Embedded Software,” in <i>ASWSD 2006: Model-Driven Development of Reliable Automotive Services</i>, M. Broy, I. H. Krüger, and M. Meisinger, Eds. Berlin, Heidelberg: Springer Verlag, 2008, pp. 98–117.","ama":"Großmann J, Fey I, Krupp A, Conrad M, Wewetzer C, Müller W. TestML – A Test Exchange Language for Model-based Testing of Embedded Software. In: Broy M, Krüger IH, Meisinger M, eds. <i>ASWSD 2006: Model-Driven Development of Reliable Automotive Services</i>. Springer Verlag; 2008:98-117. doi:<a href=\"https://doi.org/10.1007/978-3-540-70930-5_7\">10.1007/978-3-540-70930-5_7</a>","apa":"Großmann, J., Fey, I., Krupp, A., Conrad, M., Wewetzer, C., &#38; Müller, W. (2008). TestML – A Test Exchange Language for Model-based Testing of Embedded Software. In M. Broy, I. H. Krüger, &#38; M. Meisinger (Eds.), <i>ASWSD 2006: Model-Driven Development of Reliable Automotive Services</i> (pp. 98–117). Springer Verlag. <a href=\"https://doi.org/10.1007/978-3-540-70930-5_7\">https://doi.org/10.1007/978-3-540-70930-5_7</a>","short":"J. Großmann, I. Fey, A. Krupp, M. Conrad, C. Wewetzer, W. Müller, in: M. Broy, I.H. Krüger, M. Meisinger (Eds.), ASWSD 2006: Model-Driven Development of Reliable Automotive Services, Springer Verlag, Berlin, Heidelberg, 2008, pp. 98–117.","mla":"Großmann, Jürgen, et al. “TestML – A Test Exchange Language for Model-Based Testing of Embedded Software.” <i>ASWSD 2006: Model-Driven Development of Reliable Automotive Services</i>, edited by Manfred Broy et al., Springer Verlag, 2008, pp. 98–117, doi:<a href=\"https://doi.org/10.1007/978-3-540-70930-5_7\">10.1007/978-3-540-70930-5_7</a>.","bibtex":"@inbook{Großmann_Fey_Krupp_Conrad_Wewetzer_Müller_2008, place={Berlin, Heidelberg}, title={TestML – A Test Exchange Language for Model-based Testing of Embedded Software}, DOI={<a href=\"https://doi.org/10.1007/978-3-540-70930-5_7\">10.1007/978-3-540-70930-5_7</a>}, booktitle={ASWSD 2006: Model-Driven Development of Reliable Automotive Services}, publisher={Springer Verlag}, author={Großmann, Jürgen and Fey, Ines and Krupp, Alexander and Conrad, Mirko and Wewetzer, Christian and Müller, Wolfgang}, editor={Broy, Manfred and Krüger, Ingolf H. and Meisinger, Michael}, year={2008}, pages={98–117} }"},"department":[{"_id":"672"}],"publication":"ASWSD 2006: Model-Driven Development of Reliable Automotive Services","type":"book_chapter","page":"98-117","title":"TestML – A Test Exchange Language for Model-based Testing of Embedded Software","doi":"10.1007/978-3-540-70930-5_7","abstract":[{"text":"Test processes in the automotive industry are tool-intensive and affected by technologically heterogeneous test infrastructures. In the industrial practice a product has to pass tests at several levels of abstraction such as Model-in-the-Loop (MIL), Software-in-the-Loop (SIL) and Hardware-in-the-Loop (HIL) tests. Different test systems are applied for this purpose (e.g. dSPACE MTest, dSPACE Automation Desk, National Instruments Teststand) and almost each test system requests its own proprietary test description language. The exchange of tests between different test systems and the reuse of tests between different test levels is normally not possible. Efforts to integrate these heterogeneous test environments, to address test exchange in a general manner and to standardize and harmonize the existing language environment are still at the beginning and not tailored towards the requirements of the automotive domain. To keep the whole development and test process efficient and manageable, the definition of an integrated and seamless approach is required. TestML – the test exchange language we present in this article – is defined to overcome the technological obstacles (different test language syntax and semantics, different data formats and interface descriptions) that almost automatically accompany the application of heterogeneous test tools and test infrastructures. TestML supports the exchange of tests between different test notations in a heterogeneous tool environment. In this paper, we introduce the XML schema of TestML and demonstrate the efficiency of the interchange format by giving examples from the model-based development of electronic control units. Tool support is illustrated by an application with Simulink/Stateflow.","lang":"eng"}],"user_id":"5786","keyword":["Test Behavior","Test Exchange","System Under Test","Hybrid Automaton","Test Execution"]},{"page":"81-87","volume":63,"issue":"1-2","quality_controlled":"1","publication":"Zeitschrift für Naturforschung A","type":"journal_article","user_id":"466","keyword":["Physical and Theoretical Chemistry","General Physics and Astronomy","Mathematical Physics"],"title":"Manifestation of Berry’s Phase in Nuclear Quadrupole Resonance Spectra of Rotating Powder Samples","doi":"10.1515/zna-2008-1-214","abstract":[{"lang":"eng","text":"<jats:p>The effect of Berry’s phase on the nuclear quadrupole resonance (NQR) spectra of rotating powder samples is studied experimentally, and its application for the determination of the electric field gradient asymmetry η is demonstrated. The NQR frequency splittings, which are observed for the spin 3/2 nucleus of <jats:sup>35</jats:sup>Cl in powder samples of p-dichlorobenzene (C<jats:sub>6</jats:sub>H<jats:sub>4</jats:sub>Cl<jats:sub>2</jats:sub>) and cyanuric chloride (C<jats:sub>3</jats:sub>N<jats:sub>3</jats:sub>Cl<jats:sub>3</jats:sub>), are interpreted as a manifestation of Berry’s phase, associated with the adiabatically changing Hamiltonian due to sample rotation. The accumulation of Berry’s phase during the rotation process is responsible for the observed dependence of the NQR line shape on the rotation frequency and the asymmetry parameter. The proposed method for the determination of η involves the analysis of the NQR powder patterns of the rotating samples.</jats:p>"}],"_id":"35349","date_updated":"2023-01-07T11:28:10Z","date_created":"2023-01-06T13:11:39Z","publisher":"Walter de Gruyter GmbH","year":"2008","publication_identifier":{"issn":["1865-7109","0932-0784"]},"language":[{"iso":"eng"}],"status":"public","citation":{"short":"N. Sinyavsky, M. Maćkowiak, C. Schmidt, Zeitschrift Für Naturforschung A 63 (2008) 81–87.","mla":"Sinyavsky, Nikolay, et al. “Manifestation of Berry’s Phase in Nuclear Quadrupole Resonance Spectra of Rotating Powder Samples.” <i>Zeitschrift Für Naturforschung A</i>, vol. 63, no. 1–2, Walter de Gruyter GmbH, 2008, pp. 81–87, doi:<a href=\"https://doi.org/10.1515/zna-2008-1-214\">10.1515/zna-2008-1-214</a>.","bibtex":"@article{Sinyavsky_Maćkowiak_Schmidt_2008, title={Manifestation of Berry’s Phase in Nuclear Quadrupole Resonance Spectra of Rotating Powder Samples}, volume={63}, DOI={<a href=\"https://doi.org/10.1515/zna-2008-1-214\">10.1515/zna-2008-1-214</a>}, number={1–2}, journal={Zeitschrift für Naturforschung A}, publisher={Walter de Gruyter GmbH}, author={Sinyavsky, Nikolay and Maćkowiak, Mariusz and Schmidt, Claudia}, year={2008}, pages={81–87} }","chicago":"Sinyavsky, Nikolay, Mariusz Maćkowiak, and Claudia Schmidt. “Manifestation of Berry’s Phase in Nuclear Quadrupole Resonance Spectra of Rotating Powder Samples.” <i>Zeitschrift Für Naturforschung A</i> 63, no. 1–2 (2008): 81–87. <a href=\"https://doi.org/10.1515/zna-2008-1-214\">https://doi.org/10.1515/zna-2008-1-214</a>.","ieee":"N. Sinyavsky, M. Maćkowiak, and C. Schmidt, “Manifestation of Berry’s Phase in Nuclear Quadrupole Resonance Spectra of Rotating Powder Samples,” <i>Zeitschrift für Naturforschung A</i>, vol. 63, no. 1–2, pp. 81–87, 2008, doi: <a href=\"https://doi.org/10.1515/zna-2008-1-214\">10.1515/zna-2008-1-214</a>.","ama":"Sinyavsky N, Maćkowiak M, Schmidt C. Manifestation of Berry’s Phase in Nuclear Quadrupole Resonance Spectra of Rotating Powder Samples. <i>Zeitschrift für Naturforschung A</i>. 2008;63(1-2):81-87. doi:<a href=\"https://doi.org/10.1515/zna-2008-1-214\">10.1515/zna-2008-1-214</a>","apa":"Sinyavsky, N., Maćkowiak, M., &#38; Schmidt, C. (2008). Manifestation of Berry’s Phase in Nuclear Quadrupole Resonance Spectra of Rotating Powder Samples. <i>Zeitschrift Für Naturforschung A</i>, <i>63</i>(1–2), 81–87. <a href=\"https://doi.org/10.1515/zna-2008-1-214\">https://doi.org/10.1515/zna-2008-1-214</a>"},"publication_status":"published","department":[{"_id":"2"},{"_id":"315"}],"article_type":"original","author":[{"full_name":"Sinyavsky, Nikolay","first_name":"Nikolay","last_name":"Sinyavsky"},{"first_name":"Mariusz","full_name":"Maćkowiak, Mariusz","last_name":"Maćkowiak"},{"orcid":"0000-0003-3179-9997","id":"466","last_name":"Schmidt","first_name":"Claudia","full_name":"Schmidt, Claudia"}],"intvolume":"        63"},{"citation":{"short":"E. Fischer, M. Heger, D. 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