---
_id: '38784'
abstract:
- lang: eng
  text: This article presents the classification tree method for functional verification
    to close the gap from the specification of a test plan to SystemVerilog (Chandra
    and Chakrabarty, 2001) test bench generation. Our method supports the systematic
    development of test configurations and is based on the classification tree method
    for embedded systems (CTM/ES) (Chakrabarty et al., 2000) extending CTM/ES for
    random test generation as well as for functional coverage and property specification
author:
- first_name: Alexander
  full_name: Krupp, Alexander
  last_name: Krupp
- first_name: Wolfgang
  full_name: Müller, Wolfgang
  id: '16243'
  last_name: Müller
citation:
  ama: 'Krupp A, Müller W. Classification Trees for Functional Coverage and Random
    Test Generation. In: <i>Proceedings of the Design Automation &#38; Test in Europe
    Conference</i>. IEEE; 2006. doi:<a href="https://doi.org/10.1109/DATE.2006.243902">10.1109/DATE.2006.243902</a>'
  apa: Krupp, A., &#38; Müller, W. (2006). Classification Trees for Functional Coverage
    and Random Test Generation. <i>Proceedings of the Design Automation &#38; Test
    in Europe Conference</i>. <a href="https://doi.org/10.1109/DATE.2006.243902">https://doi.org/10.1109/DATE.2006.243902</a>
  bibtex: '@inproceedings{Krupp_Müller_2006, place={Munich, Germany}, title={Classification
    Trees for Functional Coverage and Random Test Generation}, DOI={<a href="https://doi.org/10.1109/DATE.2006.243902">10.1109/DATE.2006.243902</a>},
    booktitle={Proceedings of the Design Automation &#38; Test in Europe Conference},
    publisher={IEEE}, author={Krupp, Alexander and Müller, Wolfgang}, year={2006}
    }'
  chicago: 'Krupp, Alexander, and Wolfgang Müller. “Classification Trees for Functional
    Coverage and Random Test Generation.” In <i>Proceedings of the Design Automation
    &#38; Test in Europe Conference</i>. Munich, Germany: IEEE, 2006. <a href="https://doi.org/10.1109/DATE.2006.243902">https://doi.org/10.1109/DATE.2006.243902</a>.'
  ieee: 'A. Krupp and W. Müller, “Classification Trees for Functional Coverage and
    Random Test Generation,” 2006, doi: <a href="https://doi.org/10.1109/DATE.2006.243902">10.1109/DATE.2006.243902</a>.'
  mla: Krupp, Alexander, and Wolfgang Müller. “Classification Trees for Functional
    Coverage and Random Test Generation.” <i>Proceedings of the Design Automation
    &#38; Test in Europe Conference</i>, IEEE, 2006, doi:<a href="https://doi.org/10.1109/DATE.2006.243902">10.1109/DATE.2006.243902</a>.
  short: 'A. Krupp, W. Müller, in: Proceedings of the Design Automation &#38; Test
    in Europe Conference, IEEE, Munich, Germany, 2006.'
date_created: 2023-01-24T08:06:09Z
date_updated: 2023-01-24T08:06:14Z
department:
- _id: '672'
doi: 10.1109/DATE.2006.243902
keyword:
- Classification tree analysis
- System testing
- Embedded system
- Safety
- Automatic testing
- Automation
language:
- iso: eng
place: Munich, Germany
publication: Proceedings of the Design Automation & Test in Europe Conference
publication_identifier:
  isbn:
  - 3-9810801-1-4
publisher: IEEE
status: public
title: Classification Trees for Functional Coverage and Random Test Generation
type: conference
user_id: '5786'
year: '2006'
...