[{"date_updated":"2023-09-26T14:00:38Z","title":"Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework","status":"public","year":"2007","publication_identifier":{"isbn":["978-1-59593-694-3"]},"author":[{"full_name":"Woehrle, Matthias","last_name":"Woehrle","first_name":"Matthias"},{"id":"16153","full_name":"Plessl, Christian","last_name":"Plessl","orcid":"0000-0001-5728-9982","first_name":"Christian"},{"full_name":"Beutel, Jan","first_name":"Jan","last_name":"Beutel"},{"full_name":"Thiele, Lothar","first_name":"Lothar","last_name":"Thiele"}],"doi":"10.1145/1278972.1278996","user_id":"15278","page":"93-97","_id":"2392","language":[{"iso":"eng"}],"publisher":"ACM","quality_controlled":"1","publication":"Proc. Workshop on Embedded Networked Sensors (EmNets)","citation":{"short":"M. Woehrle, C. Plessl, J. Beutel, L. Thiele, in: Proc. Workshop on Embedded Networked Sensors (EmNets), ACM, New York, NY, USA, 2007, pp. 93–97.","chicago":"Woehrle, Matthias, Christian Plessl, Jan Beutel, and Lothar Thiele. “Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework.” In <i>Proc. Workshop on Embedded Networked Sensors (EmNets)</i>, 93–97. New York, NY, USA: ACM, 2007. <a href=\"https://doi.org/10.1145/1278972.1278996\">https://doi.org/10.1145/1278972.1278996</a>.","ieee":"M. Woehrle, C. Plessl, J. Beutel, and L. Thiele, “Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework,” in <i>Proc. Workshop on Embedded Networked Sensors (EmNets)</i>, 2007, pp. 93–97, doi: <a href=\"https://doi.org/10.1145/1278972.1278996\">10.1145/1278972.1278996</a>.","apa":"Woehrle, M., Plessl, C., Beutel, J., &#38; Thiele, L. (2007). Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework. <i>Proc. Workshop on Embedded Networked Sensors (EmNets)</i>, 93–97. <a href=\"https://doi.org/10.1145/1278972.1278996\">https://doi.org/10.1145/1278972.1278996</a>","bibtex":"@inproceedings{Woehrle_Plessl_Beutel_Thiele_2007, place={New York, NY, USA}, title={Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework}, DOI={<a href=\"https://doi.org/10.1145/1278972.1278996\">10.1145/1278972.1278996</a>}, booktitle={Proc. Workshop on Embedded Networked Sensors (EmNets)}, publisher={ACM}, author={Woehrle, Matthias and Plessl, Christian and Beutel, Jan and Thiele, Lothar}, year={2007}, pages={93–97} }","ama":"Woehrle M, Plessl C, Beutel J, Thiele L. Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework. In: <i>Proc. Workshop on Embedded Networked Sensors (EmNets)</i>. ACM; 2007:93-97. doi:<a href=\"https://doi.org/10.1145/1278972.1278996\">10.1145/1278972.1278996</a>","mla":"Woehrle, Matthias, et al. “Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework.” <i>Proc. Workshop on Embedded Networked Sensors (EmNets)</i>, ACM, 2007, pp. 93–97, doi:<a href=\"https://doi.org/10.1145/1278972.1278996\">10.1145/1278972.1278996</a>."},"keyword":["WSN","testing","distributed","embedded"],"type":"conference","department":[{"_id":"27"},{"_id":"518"}],"place":"New York, NY, USA","date_created":"2018-04-17T13:34:42Z"}]