---
_id: '2392'
author:
- first_name: Matthias
  full_name: Woehrle, Matthias
  last_name: Woehrle
- first_name: Christian
  full_name: Plessl, Christian
  id: '16153'
  last_name: Plessl
  orcid: 0000-0001-5728-9982
- first_name: Jan
  full_name: Beutel, Jan
  last_name: Beutel
- first_name: Lothar
  full_name: Thiele, Lothar
  last_name: Thiele
citation:
  ama: 'Woehrle M, Plessl C, Beutel J, Thiele L. Increasing the Reliability of Wireless
    Sensor Networks with a Distributed Testing Framework. In: <i>Proc. Workshop on
    Embedded Networked Sensors (EmNets)</i>. ACM; 2007:93-97. doi:<a href="https://doi.org/10.1145/1278972.1278996">10.1145/1278972.1278996</a>'
  apa: Woehrle, M., Plessl, C., Beutel, J., &#38; Thiele, L. (2007). Increasing the
    Reliability of Wireless Sensor Networks with a Distributed Testing Framework.
    <i>Proc. Workshop on Embedded Networked Sensors (EmNets)</i>, 93–97. <a href="https://doi.org/10.1145/1278972.1278996">https://doi.org/10.1145/1278972.1278996</a>
  bibtex: '@inproceedings{Woehrle_Plessl_Beutel_Thiele_2007, place={New York, NY,
    USA}, title={Increasing the Reliability of Wireless Sensor Networks with a Distributed
    Testing Framework}, DOI={<a href="https://doi.org/10.1145/1278972.1278996">10.1145/1278972.1278996</a>},
    booktitle={Proc. Workshop on Embedded Networked Sensors (EmNets)}, publisher={ACM},
    author={Woehrle, Matthias and Plessl, Christian and Beutel, Jan and Thiele, Lothar},
    year={2007}, pages={93–97} }'
  chicago: 'Woehrle, Matthias, Christian Plessl, Jan Beutel, and Lothar Thiele. “Increasing
    the Reliability of Wireless Sensor Networks with a Distributed Testing Framework.”
    In <i>Proc. Workshop on Embedded Networked Sensors (EmNets)</i>, 93–97. New York,
    NY, USA: ACM, 2007. <a href="https://doi.org/10.1145/1278972.1278996">https://doi.org/10.1145/1278972.1278996</a>.'
  ieee: 'M. Woehrle, C. Plessl, J. Beutel, and L. Thiele, “Increasing the Reliability
    of Wireless Sensor Networks with a Distributed Testing Framework,” in <i>Proc.
    Workshop on Embedded Networked Sensors (EmNets)</i>, 2007, pp. 93–97, doi: <a
    href="https://doi.org/10.1145/1278972.1278996">10.1145/1278972.1278996</a>.'
  mla: Woehrle, Matthias, et al. “Increasing the Reliability of Wireless Sensor Networks
    with a Distributed Testing Framework.” <i>Proc. Workshop on Embedded Networked
    Sensors (EmNets)</i>, ACM, 2007, pp. 93–97, doi:<a href="https://doi.org/10.1145/1278972.1278996">10.1145/1278972.1278996</a>.
  short: 'M. Woehrle, C. Plessl, J. Beutel, L. Thiele, in: Proc. Workshop on Embedded
    Networked Sensors (EmNets), ACM, New York, NY, USA, 2007, pp. 93–97.'
date_created: 2018-04-17T13:34:42Z
date_updated: 2023-09-26T14:00:38Z
department:
- _id: '27'
- _id: '518'
doi: 10.1145/1278972.1278996
keyword:
- WSN
- testing
- distributed
- embedded
language:
- iso: eng
page: 93-97
place: New York, NY, USA
publication: Proc. Workshop on Embedded Networked Sensors (EmNets)
publication_identifier:
  isbn:
  - 978-1-59593-694-3
publisher: ACM
quality_controlled: '1'
status: public
title: Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing
  Framework
type: conference
user_id: '15278'
year: '2007'
...
