---
_id: '24263'
abstract:
- lang: eng
  text: The design of safety critical systems requires an efficient methodology for
    an effective fault effect simulation for analog and digital circuits where analog
    fault injection and fault effect simulation is currently a field of active research
    and commercial tools are not available yet. This article begins by discussing
    fault injection strategies for analog circuits applied on a case study with two
    topologies of a Voltage Controlled Oscillator (VCO). In the second part it performs
    on the basis of the example of a Wireless Sensor Network (WSN) node, how far different
    mixed level implementations with Verilog-A and SPICE can affect the simulation
    time and points out which component consumes the major part of the simulation
    time.
author:
- first_name: Saed
  full_name: Abughannam, Saed
  id: '37628'
  last_name: Abughannam
- first_name: Liang
  full_name: Wu, Liang
  id: '30401'
  last_name: Wu
- first_name: Wolfgang
  full_name: Müller, Wolfgang
  id: '16243'
  last_name: Müller
- first_name: Christoph
  full_name: Scheytt, Christoph
  id: '37144'
  last_name: Scheytt
- first_name: Wolfgang
  full_name: Ecker, Wolfgang
  last_name: Ecker
- first_name: Christiano
  full_name: Novello, Christiano
  last_name: Novello
citation:
  ama: 'Abughannam S, Wu L, Müller W, Scheytt C, Ecker W, Novello C. Fault Injection
    and Mixed-Level Simulation for Analog Circuits - A Case Study. In: <i>Analog 2016
    - VDE</i>. ; 2016.'
  apa: Abughannam, S., Wu, L., Müller, W., Scheytt, C., Ecker, W., &#38; Novello,
    C. (2016). Fault Injection and Mixed-Level Simulation for Analog Circuits - A
    Case Study. <i>Analog 2016 - VDE</i>.
  bibtex: '@inproceedings{Abughannam_Wu_Müller_Scheytt_Ecker_Novello_2016, title={Fault
    Injection and Mixed-Level Simulation for Analog Circuits - A Case Study}, booktitle={Analog
    2016 - VDE}, author={Abughannam, Saed and Wu, Liang and Müller, Wolfgang and Scheytt,
    Christoph and Ecker, Wolfgang and Novello, Christiano}, year={2016} }'
  chicago: Abughannam, Saed, Liang Wu, Wolfgang Müller, Christoph Scheytt, Wolfgang
    Ecker, and Christiano Novello. “Fault Injection and Mixed-Level Simulation for
    Analog Circuits - A Case Study.” In <i>Analog 2016 - VDE</i>, 2016.
  ieee: S. Abughannam, L. Wu, W. Müller, C. Scheytt, W. Ecker, and C. Novello, “Fault
    Injection and Mixed-Level Simulation for Analog Circuits - A Case Study,” 2016.
  mla: Abughannam, Saed, et al. “Fault Injection and Mixed-Level Simulation for Analog
    Circuits - A Case Study.” <i>Analog 2016 - VDE</i>, 2016.
  short: 'S. Abughannam, L. Wu, W. Müller, C. Scheytt, W. Ecker, C. Novello, in: Analog
    2016 - VDE, 2016.'
conference:
  end_date: 2016.09.14
  start_date: 2016.09.12
date_created: 2021-09-13T09:44:29Z
date_updated: 2022-02-17T13:58:08Z
department:
- _id: '58'
language:
- iso: eng
publication: Analog 2016 - VDE
publication_identifier:
  isbn:
  - 978-3-8007-4265-3
related_material:
  link:
  - relation: confirmation
    url: https://ieeexplore.ieee.org/document/7584296/
status: public
title: Fault Injection and Mixed-Level Simulation for Analog Circuits - A Case Study
type: conference
user_id: '15931'
year: '2016'
...