---
_id: '2977'
author:
- first_name: Johannes
  full_name: Blömer, Johannes
  id: '23'
  last_name: Blömer
- first_name: Kathrin
  full_name: Bujna, Kathrin
  last_name: Bujna
- first_name: Daniel
  full_name: Kuntze, Daniel
  last_name: Kuntze
citation:
  ama: 'Blömer J, Bujna K, Kuntze D. A Theoretical and Experimental Comparison of
    the EM and SEM Algorithm. In: <i>2014 22nd International Conference on Pattern
    Recognition</i>. IEEE; 2014. doi:<a href="https://doi.org/10.1109/icpr.2014.253">10.1109/icpr.2014.253</a>'
  apa: Blömer, J., Bujna, K., &#38; Kuntze, D. (2014). A Theoretical and Experimental
    Comparison of the EM and SEM Algorithm. In <i>2014 22nd International Conference
    on Pattern Recognition</i>. IEEE. <a href="https://doi.org/10.1109/icpr.2014.253">https://doi.org/10.1109/icpr.2014.253</a>
  bibtex: '@inproceedings{Blömer_Bujna_Kuntze_2014, title={A Theoretical and Experimental
    Comparison of the EM and SEM Algorithm}, DOI={<a href="https://doi.org/10.1109/icpr.2014.253">10.1109/icpr.2014.253</a>},
    booktitle={2014 22nd International Conference on Pattern Recognition}, publisher={IEEE},
    author={Blömer, Johannes and Bujna, Kathrin and Kuntze, Daniel}, year={2014} }'
  chicago: Blömer, Johannes, Kathrin Bujna, and Daniel Kuntze. “A Theoretical and
    Experimental Comparison of the EM and SEM Algorithm.” In <i>2014 22nd International
    Conference on Pattern Recognition</i>. IEEE, 2014. <a href="https://doi.org/10.1109/icpr.2014.253">https://doi.org/10.1109/icpr.2014.253</a>.
  ieee: J. Blömer, K. Bujna, and D. Kuntze, “A Theoretical and Experimental Comparison
    of the EM and SEM Algorithm,” in <i>2014 22nd International Conference on Pattern
    Recognition</i>, 2014.
  mla: Blömer, Johannes, et al. “A Theoretical and Experimental Comparison of the
    EM and SEM Algorithm.” <i>2014 22nd International Conference on Pattern Recognition</i>,
    IEEE, 2014, doi:<a href="https://doi.org/10.1109/icpr.2014.253">10.1109/icpr.2014.253</a>.
  short: 'J. Blömer, K. Bujna, D. Kuntze, in: 2014 22nd International Conference on
    Pattern Recognition, IEEE, 2014.'
date_created: 2018-06-05T07:29:15Z
date_updated: 2022-01-06T06:58:49Z
department:
- _id: '64'
doi: 10.1109/icpr.2014.253
publication: 2014 22nd International Conference on Pattern Recognition
publication_identifier:
  isbn:
  - '9781479952090'
publication_status: published
publisher: IEEE
status: public
title: A Theoretical and Experimental Comparison of the EM and SEM Algorithm
type: conference
user_id: '25078'
year: '2014'
...