---
_id: '10576'
author:
- first_name: Matthias
  full_name: Kampmann, Matthias
  id: '10935'
  last_name: Kampmann
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
citation:
  ama: 'Kampmann M, Hellebrand S. Design-for-FAST: Supporting X-tolerant compaction
    during Faster-than-at-Speed Test. In: <i>20th IEEE International Symposium on
    Design &#38; Diagnostics of Electronic Circuits &#38; Systems (DDECS’17)</i>.
    IEEE; 2017. doi:<a href="https://doi.org/10.1109/ddecs.2017.7934564">10.1109/ddecs.2017.7934564</a>'
  apa: 'Kampmann, M., &#38; Hellebrand, S. (2017). Design-for-FAST: Supporting X-tolerant
    compaction during Faster-than-at-Speed Test. <i>20th IEEE International Symposium
    on Design &#38; Diagnostics of Electronic Circuits &#38; Systems (DDECS’17)</i>.
    <a href="https://doi.org/10.1109/ddecs.2017.7934564">https://doi.org/10.1109/ddecs.2017.7934564</a>'
  bibtex: '@inproceedings{Kampmann_Hellebrand_2017, title={Design-for-FAST: Supporting
    X-tolerant compaction during Faster-than-at-Speed Test}, DOI={<a href="https://doi.org/10.1109/ddecs.2017.7934564">10.1109/ddecs.2017.7934564</a>},
    booktitle={20th IEEE International Symposium on Design &#38; Diagnostics of Electronic
    Circuits &#38; Systems (DDECS’17)}, publisher={IEEE}, author={Kampmann, Matthias
    and Hellebrand, Sybille}, year={2017} }'
  chicago: 'Kampmann, Matthias, and Sybille Hellebrand. “Design-for-FAST: Supporting
    X-Tolerant Compaction during Faster-than-at-Speed Test.” In <i>20th IEEE International
    Symposium on Design &#38; Diagnostics of Electronic Circuits &#38; Systems (DDECS’17)</i>.
    IEEE, 2017. <a href="https://doi.org/10.1109/ddecs.2017.7934564">https://doi.org/10.1109/ddecs.2017.7934564</a>.'
  ieee: 'M. Kampmann and S. Hellebrand, “Design-for-FAST: Supporting X-tolerant compaction
    during Faster-than-at-Speed Test,” 2017, doi: <a href="https://doi.org/10.1109/ddecs.2017.7934564">10.1109/ddecs.2017.7934564</a>.'
  mla: 'Kampmann, Matthias, and Sybille Hellebrand. “Design-for-FAST: Supporting X-Tolerant
    Compaction during Faster-than-at-Speed Test.” <i>20th IEEE International Symposium
    on Design &#38; Diagnostics of Electronic Circuits &#38; Systems (DDECS’17)</i>,
    IEEE, 2017, doi:<a href="https://doi.org/10.1109/ddecs.2017.7934564">10.1109/ddecs.2017.7934564</a>.'
  short: 'M. Kampmann, S. Hellebrand, in: 20th IEEE International Symposium on Design
    &#38; Diagnostics of Electronic Circuits &#38; Systems (DDECS’17), IEEE, 2017.'
date_created: 2019-07-05T08:23:56Z
date_updated: 2022-05-11T17:14:51Z
department:
- _id: '48'
doi: 10.1109/ddecs.2017.7934564
language:
- iso: eng
publication: 20th IEEE International Symposium on Design & Diagnostics of Electronic
  Circuits & Systems (DDECS'17)
publication_identifier:
  isbn:
  - '9781538604724'
publication_status: published
publisher: IEEE
status: public
title: 'Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed
  Test'
type: conference
user_id: '209'
year: '2017'
...