---
_id: '4575'
author:
- first_name: Alexander
  full_name: Sprenger, Alexander
  id: '22707'
  last_name: Sprenger
- first_name: Sybille
  full_name: Hellebrand, Sybille
  id: '209'
  last_name: Hellebrand
  orcid: 0000-0002-3717-3939
citation:
  ama: 'Sprenger A, Hellebrand S. Tuning Stochastic Space Compaction to Faster-than-at-Speed
    Test. In: <i>2018 IEEE 21st International Symposium on Design and Diagnostics
    of Electronic Circuits &#38; Systems (DDECS)</i>. IEEE; 2018. doi:<a href="https://doi.org/10.1109/ddecs.2018.00020">10.1109/ddecs.2018.00020</a>'
  apa: Sprenger, A., &#38; Hellebrand, S. (2018). Tuning Stochastic Space Compaction
    to Faster-than-at-Speed Test. <i>2018 IEEE 21st International Symposium on Design
    and Diagnostics of Electronic Circuits &#38; Systems (DDECS)</i>. <a href="https://doi.org/10.1109/ddecs.2018.00020">https://doi.org/10.1109/ddecs.2018.00020</a>
  bibtex: '@inproceedings{Sprenger_Hellebrand_2018, place={Budapest, Hungary}, title={Tuning
    Stochastic Space Compaction to Faster-than-at-Speed Test}, DOI={<a href="https://doi.org/10.1109/ddecs.2018.00020">10.1109/ddecs.2018.00020</a>},
    booktitle={2018 IEEE 21st International Symposium on Design and Diagnostics of
    Electronic Circuits &#38; Systems (DDECS)}, publisher={IEEE}, author={Sprenger,
    Alexander and Hellebrand, Sybille}, year={2018} }'
  chicago: 'Sprenger, Alexander, and Sybille Hellebrand. “Tuning Stochastic Space
    Compaction to Faster-than-at-Speed Test.” In <i>2018 IEEE 21st International Symposium
    on Design and Diagnostics of Electronic Circuits &#38; Systems (DDECS)</i>. Budapest,
    Hungary: IEEE, 2018. <a href="https://doi.org/10.1109/ddecs.2018.00020">https://doi.org/10.1109/ddecs.2018.00020</a>.'
  ieee: 'A. Sprenger and S. Hellebrand, “Tuning Stochastic Space Compaction to Faster-than-at-Speed
    Test,” 2018, doi: <a href="https://doi.org/10.1109/ddecs.2018.00020">10.1109/ddecs.2018.00020</a>.'
  mla: Sprenger, Alexander, and Sybille Hellebrand. “Tuning Stochastic Space Compaction
    to Faster-than-at-Speed Test.” <i>2018 IEEE 21st International Symposium on Design
    and Diagnostics of Electronic Circuits &#38; Systems (DDECS)</i>, IEEE, 2018,
    doi:<a href="https://doi.org/10.1109/ddecs.2018.00020">10.1109/ddecs.2018.00020</a>.
  short: 'A. Sprenger, S. Hellebrand, in: 2018 IEEE 21st International Symposium on
    Design and Diagnostics of Electronic Circuits &#38; Systems (DDECS), IEEE, Budapest,
    Hungary, 2018.'
date_created: 2018-10-02T12:18:46Z
date_updated: 2022-05-11T17:10:37Z
department:
- _id: '48'
doi: 10.1109/ddecs.2018.00020
language:
- iso: eng
place: Budapest, Hungary
project:
- _id: '52'
  name: Computing Resources Provided by the Paderborn Center for Parallel Computing
publication: 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic
  Circuits & Systems (DDECS)
publication_identifier:
  isbn:
  - '9781538657546'
publication_status: published
publisher: IEEE
status: public
title: Tuning Stochastic Space Compaction to Faster-than-at-Speed Test
type: conference
user_id: '209'
year: '2018'
...