[{"year":"2007","title":"Chemical and Magnetic Interface Properties of Tunnel Junctions With Co$_2$MnSi/Co$_2$FeSi Multilayer Electrode Showing Large Tunneling Magnetoresistance","author":[{"full_name":"Schmalhorst, Jan","last_name":"Schmalhorst","first_name":"Jan"},{"first_name":"Daniel","last_name":"Ebke","full_name":"Ebke, Daniel"},{"id":"26883","full_name":"Sacher, Marc","first_name":"Marc","orcid":"0000-0001-6217-336X","last_name":"Sacher"},{"full_name":"Liu, Ning-Ning","first_name":"Ning-Ning","last_name":"Liu"},{"full_name":"Thomas, Andy","first_name":"Andy","last_name":"Thomas"},{"first_name":"Gnter","last_name":"Reiss","full_name":"Reiss, Gnter"},{"full_name":"Htten, Andreas","first_name":"Andreas","last_name":"Htten"},{"first_name":"Elke","last_name":"Arenholz","full_name":"Arenholz, Elke"}],"publication_identifier":{"issn":["0018-9464"]},"publication_status":"published","date_updated":"2024-04-23T12:19:34Z","intvolume":"        43","language":[{"iso":"eng"}],"doi":"10.1109/tmag.2007.893475","publication":"IEEE Transactions on Magnetics","issue":"6","extern":"1","date_created":"2022-01-31T10:13:16Z","keyword":["Electrical and Electronic Engineering","Electronic","Optical and Magnetic Materials"],"type":"journal_article","department":[{"_id":"15"}],"status":"public","page":"2806-2808","_id":"29679","publisher":"Institute of Electrical and Electronics Engineers (IEEE)","user_id":"26883","volume":43,"citation":{"short":"J. Schmalhorst, D. Ebke, M. Sacher, N.-N. Liu, A. Thomas, G. Reiss, A. Htten, E. Arenholz, IEEE Transactions on Magnetics 43 (2007) 2806–2808.","chicago":"Schmalhorst, Jan, Daniel Ebke, Marc Sacher, Ning-Ning Liu, Andy Thomas, Gnter Reiss, Andreas Htten, and Elke Arenholz. “Chemical and Magnetic Interface Properties of Tunnel Junctions With Co$_2$MnSi/Co$_2$FeSi Multilayer Electrode Showing Large Tunneling Magnetoresistance.” <i>IEEE Transactions on Magnetics</i> 43, no. 6 (2007): 2806–8. <a href=\"https://doi.org/10.1109/tmag.2007.893475\">https://doi.org/10.1109/tmag.2007.893475</a>.","ieee":"J. Schmalhorst <i>et al.</i>, “Chemical and Magnetic Interface Properties of Tunnel Junctions With Co$_2$MnSi/Co$_2$FeSi Multilayer Electrode Showing Large Tunneling Magnetoresistance,” <i>IEEE Transactions on Magnetics</i>, vol. 43, no. 6, pp. 2806–2808, 2007, doi: <a href=\"https://doi.org/10.1109/tmag.2007.893475\">10.1109/tmag.2007.893475</a>.","apa":"Schmalhorst, J., Ebke, D., Sacher, M., Liu, N.-N., Thomas, A., Reiss, G., Htten, A., &#38; Arenholz, E. (2007). Chemical and Magnetic Interface Properties of Tunnel Junctions With Co$_2$MnSi/Co$_2$FeSi Multilayer Electrode Showing Large Tunneling Magnetoresistance. <i>IEEE Transactions on Magnetics</i>, <i>43</i>(6), 2806–2808. <a href=\"https://doi.org/10.1109/tmag.2007.893475\">https://doi.org/10.1109/tmag.2007.893475</a>","bibtex":"@article{Schmalhorst_Ebke_Sacher_Liu_Thomas_Reiss_Htten_Arenholz_2007, title={Chemical and Magnetic Interface Properties of Tunnel Junctions With Co$_2$MnSi/Co$_2$FeSi Multilayer Electrode Showing Large Tunneling Magnetoresistance}, volume={43}, DOI={<a href=\"https://doi.org/10.1109/tmag.2007.893475\">10.1109/tmag.2007.893475</a>}, number={6}, journal={IEEE Transactions on Magnetics}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Schmalhorst, Jan and Ebke, Daniel and Sacher, Marc and Liu, Ning-Ning and Thomas, Andy and Reiss, Gnter and Htten, Andreas and Arenholz, Elke}, year={2007}, pages={2806–2808} }","ama":"Schmalhorst J, Ebke D, Sacher M, et al. Chemical and Magnetic Interface Properties of Tunnel Junctions With Co$_2$MnSi/Co$_2$FeSi Multilayer Electrode Showing Large Tunneling Magnetoresistance. <i>IEEE Transactions on Magnetics</i>. 2007;43(6):2806-2808. doi:<a href=\"https://doi.org/10.1109/tmag.2007.893475\">10.1109/tmag.2007.893475</a>","mla":"Schmalhorst, Jan, et al. “Chemical and Magnetic Interface Properties of Tunnel Junctions With Co$_2$MnSi/Co$_2$FeSi Multilayer Electrode Showing Large Tunneling Magnetoresistance.” <i>IEEE Transactions on Magnetics</i>, vol. 43, no. 6, Institute of Electrical and Electronics Engineers (IEEE), 2007, pp. 2806–08, doi:<a href=\"https://doi.org/10.1109/tmag.2007.893475\">10.1109/tmag.2007.893475</a>."}}]